Semiconductor Slide Test Holder

Abstract

This utility model provides a semiconductor slide test holder, relating to the field of semiconductor testing technology. It includes: a base plate; a positioning plate mounted on top of the base plate; a test holder mounted inside the positioning plate; a guide seat mounted above the test holder; and a product mounted inside the test holder. The guide seat has a set of friction protrusions on both sides. Bolt mounting holes are formed at the edges of the base plate, positioning plate, and test holder. The flared slide of the guide seat cooperates with the guide holes, and combined with the lateral locking of the positioning block and vertical positioning bolts, achieves precise positioning of the product from the insertion point to the testing position. This ensures stable contact between the test piece and the product pins, effectively avoiding contact failure issues, improving test yield, extending the lifespan of the test piece, and thus saving on the amount of test pieces used, significantly reducing material costs.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, and in particular to a semiconductor slide test holder. Background Technology

[0002] With the rapid development of domestic semiconductor technology, semiconductor packaging and testing equipment is being updated and iterated at an accelerated pace. Domestic substitution has been successfully completed in the sorting machine field. In the field of semiconductor device production and testing, test sockets are key equipment for testing the electrical performance of products, such as chips and diodes. Their positioning accuracy and ease of operation directly affect testing efficiency and result accuracy. However, existing semiconductor test sockets have the following shortcomings in practical applications:

[0003] Traditional test sockets rely heavily on manual alignment of the test port during product testing. The product needs to be pressed into the test port during testing. During installation, the product is prone to misalignment of the pins and test pieces due to operational errors. The misalignment of the pins can cause poor contact, and poor contact can easily lead to high current and arcing of the test piece. It may also generate instantaneous high voltage due to loose pin connections, burning out the test piece or the product. The test piece replacement frequency is high, which increases production and maintenance costs and reduces production efficiency. Utility Model Content

[0004] This utility model relates to a semiconductor slide test fixture. The basic framework is constructed by the stable assembly of a base plate, a positioning plate, and a test fixture. The guide seat's flared slide and positioning structure enable precise product insertion. The elastic clamping mechanism of the pressure plate ensures stable contact during product testing. At the same time, the elastic reset function of the push rod and the support spring inside the test fixture simplifies product handling and equipment maintenance. The whole system forms a semiconductor slide test system that is precise in positioning, easy to operate, and highly adaptable, and can efficiently complete the mechanical positioning and testing process of semiconductor products.

[0005] This utility model provides a semiconductor chute test fixture, specifically including: a base plate, a positioning plate installed on the upper part of the base plate, a test fixture installed on the inner side of the positioning plate, a guide seat installed on the upper part of the test fixture, a product installed on the inner side of the test fixture, a set of friction protrusions on both sides of the guide seat, the friction protrusions having an arc structure, and a set of bolt mounting holes opened on the edges of the base plate, the positioning plate, and the test fixture.

[0006] Furthermore, a vertical sliding hole is opened in the middle of the base plate, and a push rod is installed on the inner side of the sliding hole. The push rod has a cylindrical stepped structure, and a support spring is installed on the outer side of the push rod at the step.

[0007] Furthermore, a mounting hole is formed in the middle of the positioning plate. The mounting hole has a rectangular stepped structure, and the test seat is installed inside the mounting hole.

[0008] Furthermore, a threaded hole is opened on each side of the test seat. The threaded hole has a cylindrical stepped structure, and a support spring is installed at the large diameter position of the threaded hole.

[0009] Furthermore, a vertical sliding hole is opened on one side of the guide seat. The sliding hole has a cylindrical structure. A vertical positioning bolt is inserted inside the sliding hole. The bottom of the vertical positioning bolt is connected to the small-diameter thread of the threaded hole. A support spring is installed on the outer side of the vertical positioning bolt. A guide hole is opened in the middle of the guide seat. The guide hole corresponds to the product. A groove is provided above the guide hole. The groove is funnel-shaped.

[0010] Furthermore, one side of the guide seat has a positioning block at the bottom position that corresponds to the small diameter of the threaded hole, and the positioning block extends into the small diameter of another threaded hole.

[0011] Furthermore, a horizontal positioning bolt is installed on each side of the guide seat, and a set of sliding grooves is opened at the bottom of the guide seat. The sliding grooves are U-shaped structures, and a clamping plate is installed on the inner side of each sliding groove. The sliding grooves and clamping plates correspond to each other. The guide seat, horizontal positioning bolts, clamping plates, vertical positioning bolts, and positioning blocks cooperate with each other to form a guide structure.

[0012] Furthermore, a sliding hole is provided at the upper position of the clamping plate, a transverse positioning bolt passes through the inside of the sliding hole, a support spring is installed at the outer position of the transverse positioning bolt, the support spring pushes the clamping plate to move inward, and an inclined surface is provided at the upper position of the clamping plate.

[0013] This utility model provides a semiconductor groove test fixture, which has the following beneficial effects:

[0014] In this utility model, the flared groove of the guide seat cooperates with the guide hole, and combined with the horizontal locking of the positioning block and the vertical positioning bolt, it realizes the precise positioning of the product from the introduction to the test position, ensures stable contact between the test piece and the product pin, effectively avoids the problem of poor product contact, improves the test yield, increases the service life of the test piece, thereby saving the amount of test pieces used and greatly saving material costs.

[0015] The clamping plate, together with the inclined plane and the support spring, automatically and elastically clamps the product, ensuring that the product remains stable during testing and preventing test deviations caused by product displacement. This ensures accurate electrical performance test data, and the elastic clamping mechanism of the clamping plate ensures stable contact during product testing.

[0016] The push rod's elastic reset design assists in product handling without complicated operations; the guide seat's pull-up and rotate structure facilitates quick product changes, adapts to batch testing scenarios, and improves operational efficiency.

[0017] The support spring inside the threaded hole of the test seat automatically pops up the test seat after the bolts are removed, making it more convenient to inspect the test seat and replace the test piece. Attached Figure Description

[0018] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings of the embodiments will be briefly described below.

[0019] The accompanying drawings described below are only related to some embodiments of the present invention and are not intended to limit the scope of the present invention.

[0020] In the attached diagram:

[0021] Figure 1 This diagram shows the axial side structure of the slide test seat after assembly according to the present invention;

[0022] Figure 2 This invention provides a schematic diagram of the axial side structure of the slide test seat cross-section of the present invention.

[0023] Figure 3 This utility model illustrates Figure 2 Front view structural diagram;

[0024] Figure 4 A schematic diagram of the axial structure of the guide structure of this utility model after rotation is shown;

[0025] Figure 5 The diagram shows an axial side view of the positioning plate and test seat cross-section of this utility model.

[0026] Figure 6 The diagram shows an axial side view of the test seat and guide structure of this utility model.

[0027] List of reference numerals

[0028] 1. Base plate; 101. Push rod;

[0029] 2. Positioning plate;

[0030] 3. Test socket; 301. Threaded hole;

[0031] 4. Guide structure; 401. Guide seat; 402. Horizontal positioning bolt; 403. Pressure plate; 404. Vertical positioning bolt; 405. Positioning block;

[0032] 5. Products. Detailed Implementation

[0033] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. Based on the described embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0034] Example 1: Please refer to Figures 1 to 6 :

[0035] This utility model proposes a semiconductor slide test base, including: a base plate 1, a positioning plate 2 installed on the upper part of the base plate 1, a test base 3 installed on the inner side of the positioning plate 2, an installation hole with a rectangular stepped structure in the middle of the positioning plate 2, the test base 3 being installed on the inner side of the installation hole, specifically, the rectangular stepped installation hole provides a precise installation positioning space for the test base 3, the stepped structure can limit the test base 3 axially and radially, ensuring that the test base 3 is accurately and stably installed in the positioning plate 2, and a threaded hole 301 is opened on each side of the test base 3, the threaded hole 301 having a cylindrical stepped structure, a support spring installed at the large diameter position of the threaded hole 301, when the bolts of the test base 3 are removed, the support spring elastically supports the test base 3 upward, specifically, the support spring at the large diameter position can automatically spring the test base 3 upward after the fixing bolts are removed, facilitating the inspection and replacement of the test base 3, and improving the maintenance convenience of the test base 3;

[0036] In this embodiment, a guide seat 401 is installed on the upper part of the test seat 3, and a product 5 is installed on the inner side of the test seat 3. A set of friction protrusions is provided on each side of the guide seat 401. The friction protrusions have an arc structure, and the guide seat 401 can be easily pushed and pulled by pinching the friction protrusions on both sides. A set of bolt mounting holes is opened on the edges of the base plate 1, the positioning plate 2, and the test seat 3. Matching bolts are installed according to actual needs at the positions of the bolt mounting holes. After the bolts are installed, the base plate 1, the positioning plate 2, and the test seat 3 are securely connected, and the test unit inside the test seat 3 is secured. The plate is selected according to the corresponding product 5. A vertical sliding hole is opened in the middle of the base plate 1. A push rod 101 is installed inside the sliding hole. The push rod 101 has a cylindrical stepped structure. The sliding hole is positioned with the horizontal groove of the push rod 101. A support spring is installed on the outer side of the push rod 101 at the stepped part. The support spring elastically supports the push rod 101 upward. Specifically, the sliding hole and the stepped structure of the push rod 101 cooperate to achieve precise guidance and positioning of the vertical sliding of the push rod 101; the support spring gives the push rod 101 elastic restoring ability. In subsequent testing, the product 5 can be pushed away from the testing position to facilitate its placement and removal, improving operational convenience. A vertical sliding hole is provided on one side of the guide seat 401. The sliding hole is cylindrical, and a vertical positioning bolt 404 is inserted inside. The bottom of the vertical positioning bolt 404 is connected to the small-diameter thread of the threaded hole 301. The thread pitch is machined according to actual needs. A support spring is installed on the outer side of the vertical positioning bolt 404, which elastically presses the guide seat 401 downwards. A [missing information - likely a design element] is provided in the middle of the guide seat 401. Each guide hole corresponds to product 5. Above the guide hole is a flared groove. The vertical sliding hole provides installation and sliding space for the horizontal and vertical positioning bolts 404. The vertical positioning bolts 404 connect to the threaded hole 301 to achieve the initial connection between the guide seat 401 and the test seat 3. The support spring presses the guide seat 401 downward to make the guide seat 401 fit more tightly with the test seat 3. The flared groove facilitates the quick and accurate insertion of product 5 into the guide hole, achieving the initial positioning of product 5 and improving the placement efficiency and alignment accuracy of product 5.

[0037] In this embodiment, a positioning block 405 corresponding to the small diameter of the threaded hole 301 is provided at the bottom position on one side of the guide seat 401. The positioning block 405 extends into the small diameter of another threaded hole 301. The positioning block 405, together with the threaded hole 301 and the vertical positioning bolt 404, locks the guide seat 401 laterally, realizing the rapid positioning of the guide seat 401, preventing the guide seat 401 from lateral displacement during the test, ensuring the stability of the guide seat 401 in positioning the product 5, and thus improving the test accuracy. After the guide seat 401 is pulled upward, the guide seat 401 is moved to one side. Rotation facilitates the installation and removal of product 5. A transverse positioning bolt 402 is installed on each side of the guide seat 401. The threaded connection position and pitch of the transverse positioning bolt 402 are machined according to existing technology, ensuring that the transverse positioning bolt 402 can be stably installed on both sides of the guide seat 401. A set of sliding grooves is formed at the bottom of the guide seat 401. The sliding grooves have a U-shaped structure. A clamping plate 403 is installed on the inner side of each sliding groove. The sliding grooves and clamping plates 403 correspond to each other. The guide seat 401, transverse positioning bolts 402, clamping plates 403, and vertical... The positioning bolts 404 and positioning blocks 405 cooperate to form the guide structure 4. Specifically, the transverse positioning bolts 402 are threadedly installed on both sides of the guide seat 401, providing a foundation for the installation and power transmission of the clamping plate 403. The U-shaped sliding groove provides sliding guide space for the clamping plate 403, allowing it to slide stably along the groove, ensuring stable clamping of the product 5. A sliding hole is formed at the top of the clamping plate 403, through which the transverse positioning bolts 402 pass. A positioning block 405 is installed on the outer side of the transverse positioning bolts 402. The support spring has a support force that can be selected according to actual needs. The support spring pushes the pressure plate 403 to move inward. The pressure plate 403 has an inclined surface at its upper position. After the product 5 is positioned by the guide seat 401, the product 5 is pressed down until the pressure plate 403 presses the product 5 tightly. Specifically, the sliding hole cooperates with the transverse positioning bolt 402 to realize the connection and sliding guidance between the pressure plate 403 and the guide seat 401; to ensure that the product 5 is fixed in position during the test, to avoid the problem of poor test contact caused by the displacement of the product 5, and to improve the stability and accuracy of the test.

[0038] Example 2, based on Example 1, such as Figures 1-6 As shown, a power cord is installed between the base plate 1 and the positioning plate 2 according to existing conventional procedures, and the power cord is electrically connected to the test piece inside the test holder 3. The other end of the power cord is connected to the hole controller and the test body according to existing conventional procedures.

[0039] The working principle of this embodiment:

[0040] Based on the size and pin specifications of the semiconductor product 5 to be tested, select the corresponding test socket 3 and confirm that the test chip inside the test socket 3 is compatible.

[0041] Install the guide seat 401 above the test seat 3, rotate the vertical positioning bolt 404 to tighten its bottom into the threaded end of the threaded hole 301, pull the guide seat 401 upward to compress the support spring on the outside of the vertical positioning bolt 404, align the positioning block 405 with the threaded end of the threaded hole 301 of the test seat 3, release the guide seat 401, the positioning block 405 is inserted into the threaded hole 301, the support spring presses the guide seat 401 downward to complete the positioning of the guide seat 401; the positioning block 405 locks the guide seat 401 laterally.

[0042] The semiconductor product 5 is aligned with the trumpet-shaped groove of the guide seat 401 and slides down the groove to the guide hole. The guide effect of the groove is used to make the product 5 accurately enter the test area of ​​the test seat 3.

[0043] Continue pressing down on product 5. The bottom of product 5 contacts the inclined surface of the clamping plate 403. Through the inclined surface, the vertical pressure is converted into a horizontal force, pushing the clamping plate 403 to slide outward along the U-shaped sliding groove, compressing the support spring on the outside of the horizontal positioning bolt 402. When product 5 reaches the test position, the support spring pushes the clamping plate 403 in the opposite direction to move inward, firmly clamping product 5 and ensuring good contact between the product 5 pins and the test piece.

[0044] In the second embodiment, the power line between the base plate 1 and the positioning plate 2 is connected to the test piece, controller and detection body inside the test base 3. After the pin of product 5 contacts the test piece, the electrical signal is transmitted through the power line to realize the acquisition and processing of test signals.

[0045] The testing unit is started according to the existing routine procedures, and the electrical performance of product 5 is tested according to the preset test program. The test data is transmitted to the controller for recording and analysis in real time.

[0046] Pull the guide seat 401 upward to release the clamping of product 5; then rotate the guide seat 401, push the rod 101 to pop out product 5, remove product 5 to complete the test.

Claims

1. A semiconductor slide test fixture, comprising: The base plate (1), test seat (3) and guide seat (401) are provided. A positioning plate (2) is installed on the upper part of the base plate (1), and a test seat (3) is installed on the inner side of the positioning plate (2). The test seat (3) is characterized in that a guide seat (401) is installed on the upper part of the test seat (3), a transverse positioning bolt (402) is installed on each side of the guide seat (401), a product (5) is installed on the inner side of the test seat (3), a set of friction protrusions are provided on each side of the guide seat (401), and a set of bolt mounting holes are opened on the edges of the base plate (1), the positioning plate (2) and the test seat (3).

2. The semiconductor groove test holder according to claim 1, characterized in that, A vertical sliding hole is opened in the middle of the base plate (1), and a push rod (101) is installed on the inner side of the sliding hole. The push rod (101) has a cylindrical stepped structure, and a support spring is installed on the outer side of the push rod (101) at the step.

3. The semiconductor groove test holder according to claim 1, characterized in that, A mounting hole is opened in the middle of the positioning plate (2), and the test seat (3) is installed inside the mounting hole.

4. The semiconductor groove test holder according to claim 1, characterized in that, A threaded hole (301) is opened on each side of the test seat (3), and a support spring is installed at the large diameter position of the threaded hole (301).

5. The semiconductor groove test holder according to claim 1, characterized in that, A vertical sliding hole is opened on one side of the guide seat (401), and a vertical positioning bolt (404) is inserted inside the sliding hole. The bottom of the vertical positioning bolt (404) is connected to the small diameter thread of the threaded hole (301). A support spring is installed on the outer side of the vertical positioning bolt (404). A guide hole is opened in the middle of the guide seat (401), and the guide hole corresponds to the product (5). A groove is provided above the guide hole.

6. The semiconductor groove test holder according to claim 1, characterized in that, The guide seat (401) has a positioning block (405) at the bottom position on one side, which corresponds to the small diameter of the threaded hole (301). The positioning block (405) extends into the small diameter of another threaded hole (301).

7. The semiconductor groove test holder according to claim 1, characterized in that, A set of sliding grooves is opened at the bottom of the guide seat (401), and a pressure plate (403) is installed on the inner side of the sliding groove. The sliding groove and the pressure plate (403) correspond to each other. The guide seat (401), the horizontal positioning bolt (402), the pressure plate (403), the vertical positioning bolt (404), and the positioning block (405) cooperate with each other to form the guide structure (4).

8. The semiconductor groove test holder according to claim 7, characterized in that, A sliding hole is opened at the upper position of the clamping plate (403), and a transverse positioning bolt (402) passes through the inside of the sliding hole. A support spring is installed at the outer position of the transverse positioning bolt (402). The support spring pushes the clamping plate (403) to move inward. An inclined surface is provided at the upper position of the clamping plate (403).

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