A high and low temperature test tool for patch type tantalum capacitor

Abstract

This utility model discloses a high and low temperature testing fixture for surface-mount tantalum capacitors. It includes a circuit board and a test socket. The test socket is mounted on the circuit board and electrically connected to it. A test connector is provided at the bottom of the circuit board. The test socket includes a base and a cover that fits over the base. The base has a device placement groove, and multiple elastic telescopic probes are vertically arranged within the groove. The upper ends of the probes elastically abut against the pads of the surface-mount tantalum capacitor, and the lower ends are electrically connected to the circuit board. After the surface-mount tantalum capacitor is placed in the groove, it is pressed firmly by the cover. This utility model places the surface-mount tantalum capacitor under test inside the test socket. After placement, the cover is placed over the capacitor, eliminating the need for surface-mount wiring. The test socket has external connecting wires for continuous monitoring of the capacitor's electrical performance. This solves the problems of exposed surface-mount tantalum capacitors easily frost over, leading to failure, and the difficulty of surface-mount wiring, significantly improving testing efficiency.

Description

Technical Field

[0001] This utility model relates to a high and low temperature testing fixture for surface mount tantalum capacitors, belonging to the technical field of high and low temperature testing fixtures for surface mount tantalum capacitors. Background Technology

[0002] Each time a surface-mount tantalum capacitor under test is subjected to high and low temperature testing, it needs to be surface-mounted and connected to the PCB board before being placed in the high and low temperature chamber. The surface-mount tantalum capacitor under test is directly exposed, and after high and low temperature testing, it is prone to frost formation, which will cause it to be scrapped. Summary of the Invention

[0003] The technical problem to be solved by this utility model is to provide a high and low temperature testing fixture for surface mount tantalum capacitors, which can prevent the surface mount tantalum capacitors under test from frosting and becoming unusable.

[0004] The technical solution adopted by this utility model is as follows: a high and low temperature testing fixture for surface mount tantalum capacitors, including a circuit board and a test socket. The test socket is installed on the circuit board and is electrically connected to it. A test connector is provided at the bottom of the circuit board. The test socket includes a base and a cover that covers the base. A device placement groove is provided on the base. Multiple elastic telescopic probes are vertically arranged in the device placement groove. The upper ends of the multiple elastic telescopic probes can elastically abut against the pads of the surface mount tantalum capacitor, and the lower ends are electrically connected to the circuit board. After the surface mount tantalum capacitor is placed in the device placement groove, it is pressed tightly by the cover.

[0005] Furthermore, the rear bottom side of the aforementioned seat cover is hinged to the rear top side of the base via a hinge shaft. The hinge shaft is fitted with a torsion spring, which can keep the seat cover in an open state. A latch is provided at the front end of the seat cover, which can engage with a slot on the base to lock the seat cover.

[0006] Furthermore, four support pillars are installed at the bottom of the aforementioned circuit board. Furthermore, notches are provided on the front and rear sides of the groove where the above-mentioned device is placed.

[0007] The beneficial effects of this utility model are as follows: Compared with the prior art, this utility model places the surface-mount tantalum capacitor under test inside the test socket. After placement, the socket cover is used to cover the surface-mount tantalum capacitor under test. There is no need for surface-mount wiring. The test socket is connected to external wires to monitor the electrical performance of the surface-mount tantalum capacitor at all times. This solves the problems of surface-mount tantalum capacitors under test being easily exposed and frosted, leading to scrapping, and the difficulty of surface-mount wiring. The testing efficiency is greatly improved. Attached Figure Description

[0008] Figure 1 This is a schematic diagram of the left-hand structure of a high and low temperature testing fixture for surface-mount tantalum capacitors; Figure 2 This is a top view of the base structure. Detailed Implementation

[0009] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0010] Example 1: As Figure 1-2 As shown, a high and low temperature testing fixture for surface-mount tantalum capacitors includes a circuit board 1 and a test socket 2. The test socket 2 is mounted on the circuit board 1 and electrically connected to it. A test connector 3 is provided at the bottom of the circuit board 1. The test socket 2 includes a base 201 and a cover 202 that covers the base 201. A device placement groove 203 is provided on the base 201. Multiple elastic telescopic probes 204 are vertically arranged in the device placement groove 203. The upper ends of the multiple elastic telescopic probes 204 can elastically abut against the pads of the surface-mount tantalum capacitor 4, and the lower ends are electrically connected to the circuit board 1. After the surface-mount tantalum capacitor 4 is placed in the device placement groove 203, it is pressed tightly by the seat cover 202. The device placement groove 203 is used to limit the device under test and ensure that the pads of the device under test are correctly connected to the elastic telescopic probe. This utility model places the surface-mount tantalum capacitor under test in the placement area inside the test holder. After placement, the seat cover covers the surface-mount tantalum capacitor under test. There is no need for surface-mount wiring. This test holder has external connecting wires to constantly monitor the electrical performance of the surface-mount tantalum capacitor. It solves the problems of surface-mount tantalum capacitors under test being easily frosted due to exposure, leading to scrapping, and the difficulty of surface-mount wiring, greatly improving the testing efficiency.

[0011] For ease of operation and stable cover closure, the bottom rear side of the cover 202 is hinged to the top rear side of the base 201 via a hinge shaft 208. A torsion spring is fitted onto the hinge shaft 208, which keeps the cover 202 open. A latch 205 is provided at the front end of the cover 202. The latch 205 is rotatably connected to a hinge seat at the front end of the cover 202 via the hinge shaft, which is equipped with a torsion spring to ensure the latch remains closed. The latch 205 can engage with a slot 206 on the base 201 to lock the cover. The use of a torsion spring ensures that the cover automatically remains open after opening, and also provides stable closure stability under torsional force after closing. The latch and slot locking method is convenient, quick, and reliable. For even higher reliability, a spring plate is provided at the bottom of the cover 202. The spring plate bends downward to form an arch, which rests against the top surface of the device under test, improving the stability of the electrical connection and increasing testing accuracy during testing.

[0012] To facilitate wiring at the bottom of the circuit board, four support pillars 5 are installed at the bottom of the circuit board 1. The support pillars suspend the circuit board in the air, which facilitates the arrangement of the bottom connectors and the connection of the circuit. To facilitate the removal of the device under test, notches 207 are provided on the front and back sides of the device placement groove 203 to facilitate the placement and removal of the device under test by tweezers. A recessed groove 210 is provided in the middle of the device placement groove 203 to reduce the finishing of the device support surface and reduce processing costs. Process round holes 209 are provided at the four corners of the device placement groove 203 to facilitate stable placement of the device.

[0013] Test principle: Use tweezers to place the device under test into the device placement groove, close the box cover, start the test circuit and place it in the oven and adjust to the appropriate temperature for testing. After the test is completed, open the box cover and use tweezers to remove the device under test.

[0014] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the protection scope of the claims.

Claims

1. A high and low temperature testing fixture for surface-mount tantalum capacitors, characterized in that, The test socket (2) includes a circuit board (1) and a test base (2). The test base (2) is mounted on the circuit board (1) and is electrically connected to it. The bottom of the circuit board (1) is provided with a test connector (3). The test base (2) includes a base (201) and a cover (202) covering the base (201). The base (201) is provided with a device placement groove (203). Multiple elastic telescopic probes (204) are vertically arranged in the device placement groove (203). The upper ends of the multiple elastic telescopic probes (204) can elastically abut against the pads of the surface mount tantalum capacitor (4), and the lower ends are electrically connected to the circuit board (1). After the surface mount tantalum capacitor (4) is placed in the device placement groove (203), it is pressed by the cover (202).

2. The high and low temperature testing fixture for surface mount tantalum capacitors according to claim 1, characterized in that, The bottom rear side of the seat cover (202) is hinged to the top rear side of the base (201) via a hinge shaft. The hinge shaft is fitted with a torsion spring, and the torsion spring can keep the seat cover (202) in an open state. The front end of the seat cover (202) is provided with a latch, which can be engaged with the slot on the base (201) to lock the seat cover.

3. The high and low temperature testing fixture for surface mount tantalum capacitors according to claim 1, characterized in that: The circuit board (1) has four support pillars (5) at the bottom.

4. The high and low temperature testing fixture for surface mount tantalum capacitors according to claim 1, characterized in that: Notches (207) are provided on the front and back sides of the device placement groove (203).

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