Air circulation structure of chip aging test chamber

Abstract

This invention provides an air circulation structure for a chip aging test chamber, including an outer chamber, an inner chamber, a fan, and an evaporator. The inner chamber is disposed inside the outer chamber, forming a sandwich between them. The sandwich includes a first side channel, a bottom channel, and a second side channel connected to each other. The inner chamber has an air inlet and an air outlet on its two symmetrical sides, connecting the sandwich to the interior of the inner chamber. Air circulates counterclockwise within the test chamber along the inner chamber, the first side channel, the bottom channel, the second side channel, and back to the inner chamber. The fan and evaporator are respectively arranged in the bottom channel. When the evaporator is installed in the bottom channel, the condensate generated on its surface only remains in the bottom channel, while the first and second side channels remain clean. Due to the low-position installation of the evaporator, the condensate never comes into contact with the samples inside the inner chamber, preventing sample contamination.

Description

Technical Field

[0001] This utility model relates to an environmental simulation test device, and more particularly to an air circulation structure for a chip aging test chamber. Background Technology

[0002] Test chambers are a general term for testing equipment in the environmental testing industry that simulates natural climatic environments. The main types include high and low temperature test chambers, constant temperature and humidity test chambers, xenon lamp aging test chambers, ultraviolet aging test chambers, and rain chambers, with temperature ranges covering -80℃ to +180℃ and humidity ranges from 10%RH to 100%RH. They are widely used for weather resistance testing of electronic components, automotive parts, and aerospace products, involving scenarios such as temperature cycling, damp heat aging, and corrosion testing. In chip aging testing, by simulating the temperature and humidity of the chip's operating environment, the surface state and test parameters of the chip at different times are observed and detected to determine the chip's aging rate and calculate its lifespan.

[0003] As attached Figure 1 As shown, the air circulation structure of the current chip aging test chamber is the same as that of most environmental simulation test chambers. Following the previous practice, the evaporator and fan are installed on the top of the interlayer between the inner and outer chambers. Although this makes it convenient to install the motor and evaporator after the inner chamber, the air will condense on the surface of the evaporator due to the temperature difference when circulating between the inner chamber and the interlayer. The condensate dripping will contaminate the test sample.

[0004] By changing the air circulation structure, the problem of condensation contaminating the sample can be avoided. Summary of the Invention

[0005] To address the shortcomings of existing technologies, the technical solution adopted by this utility model is as follows: An air circulation structure for a chip aging test chamber, characterized in that it includes: outer box; An inner box is disposed inside the outer box and forms a sandwich between the inner box and the outer box, the sandwich including a first side channel, a bottom channel and a second side channel connected to each other; The fan and evaporator are respectively arranged in the bottom channel; A drain outlet is located at the bottom of the outer casing and communicates with the bottom channel. The inner box has an air inlet and an air outlet on its two symmetrical sides, which connect the interlayer to the interior of the inner box.

[0006] Furthermore, the top of the inner box is welded and sealed to the inner wall of the outer box.

[0007] Furthermore, an air vent is provided on the side wall of the inner casing corresponding to the air inlet.

[0008] The advantages of this utility model are as follows: By changing the installation position of the fan and evaporator from the top of the inner casing to the bottom of the inner casing, and opening the bottom of the outer casing for installation and maintenance of the fan and evaporator, on the one hand, it avoids condensate dripping from the evaporator surface and contaminating the sample; on the other hand, the path of condensate draining from the interlayer is shortened, avoiding contamination of the side wall of the inner casing. The fan and evaporator are exposed by opening the bottom cover of the outer casing, which overcomes the disadvantage of difficulty in maintenance when the equipment is installed at the bottom of the inner casing. Attached Figure Description

[0009] Figure 1 This is a diagram of the void circulation structure of an existing test chamber.

[0010] Figure 2 This is a schematic diagram of the structural composition of this utility model.

[0011] In the diagram: 100 - outer casing, 200 - inner casing, 300 - first side channel, 400 - bottom channel, 500 - second side channel, 600 - fan, 700 - evaporator, 800 - drain outlet. Detailed Implementation

[0012] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this utility model and are not intended to limit this utility model.

[0013] Please see the appendix Figure 2 This application proposes an air circulation structure for a chip aging test chamber, including an outer chamber 100, an inner chamber 200, a fan 600, and an evaporator 700. The temperature and humidity control system inside the test chamber refers to the disclosed prior art, and temperature control is achieved by circulating air within the test chamber.

[0014] The inner casing 200 of this application is disposed inside the outer casing 100 and forms a sandwich between the inner casing 100 and the outer casing 100. The sandwich includes a first side channel 300, a bottom channel 400 and a second side channel 500 connected to each other. The inner casing 200 has an air inlet and an air outlet respectively on two symmetrical sides, which connect the sandwich to the interior of the inner casing 200.

[0015] Generally, the first side channel 300 and the second side channel 500 are distributed on the left and right sides of the inner chamber. Air enters the inner chamber 200 through the air inlet and exits through the air outlet. The circulating air exchanges heat with the product inside the inner chamber 200 and then with the refrigerant in the equipment in the interlayer. Through multiple heat exchanges, the internal temperature of the inner chamber 200 is maintained within a certain range. In this specific embodiment, air enters from the right side and exits from the left side of the inner chamber 200. The air circulates counterclockwise within the test chamber along the inner chamber 200, the first side channel 300, the bottom channel 400, the second side channel 500, and the inner chamber 200.

[0016] In this application, the fan 600 and evaporator 700 are respectively arranged within the bottom channel 400. Both the fan 600 and the evaporator 700 are installed below the inner casing 200. On one hand, the fan 600, installed below the inner casing 200 and on the bottom side of the outer casing 100, brings the vibrations generated by the fan 600 closer to the support below the outer casing 100, sharing a vibration damping system with the support. On the other hand, the fan 600 serves as the power source for air circulation. When the evaporator 700 is installed within the bottom channel 400, the condensate generated on its surface only remains in the bottom channel 400. The first side channel 300 and the second side channel 500 remain clean. Due to the low-position installation of the evaporator 700, the condensate never comes into contact with the sample inside the inner casing 200, preventing sample contamination.

[0017] In one embodiment, a removable cover is provided at the bottom of the outer casing 100, the evaporator 700 is mounted on the cover, and the fan 600 is mounted on the side wall or the cover of the outer casing 100. Removing the cover exposes the fan 600 and the evaporator 700, facilitating maintenance of these components.

[0018] As is easily conceivable, referring to the test chambers in the existing technology, the wiring layout of each electrical device extends along the wall of the outer interlayer to the rear of the inner chamber 200 before connecting, and the wiring harness does not pass through the side wall of the inner chamber 200, so as not to interfere with the air inlet and outlet on both sides of the inner chamber 200.

[0019] This application provides a drain outlet 800 at the bottom of the outer casing 100, communicating with the bottom channel 400; condensate is discharged through the drain outlet 800 to prevent condensate accumulation. In one embodiment, a water pipe and valve are connected to the drain outlet 800 to facilitate the diversion of condensate.

[0020] To prevent the recirculated air from leaking out, the top of the inner housing 200 is welded to the inner wall of the outer housing 100 to form a seal; thus, the upper interlayer formed between the upper part of the inner housing 200 and the outer housing 100 is in a sealed state, and other equipment required for the system can be installed in the upper interlayer by opening the cover plate on the upper part of the outer housing 100 without affecting the air circulation.

[0021] In one embodiment, to further control the airflow direction into the inner casing 200, a vent is provided on the side wall of the inner casing 200 corresponding to the air inlet. The airflow direction is controlled by a fixed fan blade angle on the vent, and the airflow direction can be changed by replacing the vent with a different fan blade angle.

[0022] Finally, it should be noted that the above specific embodiments are only used to illustrate the technical solution of this utility model and not to limit it. Although this utility model has been described in detail with reference to examples, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solution of this utility model without departing from the spirit and scope of the technical solution of this utility model, and all such modifications and substitutions should be covered within the scope of the claims of this utility model.

Claims

1. An air circulation structure of a chip burn-in test chamber, characterized by, include: outer box(100); The inner box (200) is disposed inside the outer box (100) and forms a sandwich between the inner box (100) and the outer box (100), the sandwich including a first side channel (300), a bottom channel (400) and a second side channel (500) connected to each other. The fan (600) and the evaporator (700) are respectively arranged in the bottom channel (400); A drain outlet (800) is located at the bottom of the outer casing (100) and communicates with the bottom channel (400); The inner box (200) has an air inlet and an air outlet on its two symmetrical sides, which connect the interlayer to the interior of the inner box (200).

2. The air circulation structure of a chip burn-in test chamber according to claim 1, wherein: The top of the inner box (200) is welded and sealed to the inner wall of the outer box (100).

3. The air circulation structure of a chip burn-in test chamber according to claim 1, wherein: A vent is provided on the side wall of the inner casing (200) corresponding to the air inlet.

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