A battery testing platform
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-11
- Publication Date
- 2026-08-14
AI Technical Summary
[0004]第一:体积过大,空间利用率低,操作不便利
[0026]本申请涉及电池测试技术领域,具体公开了一种电池测试台,包括:基座,基座上具有用于放置待测样品的放置台,放置台上具有一吸附通道,吸附通道的第一端朝向待测样品,吸附通道的第二端用于与负压源相连,以将待测样品吸附于放置台;调温模块,设置在基座上,用于对放置台进行温度调节,以调节待测样品在测试时的环境温度;至多两种测试装置,均可调节地设置在基座上,且在同一时刻存在至少一种测试装置与待测样品接触,用以通过其一待测装置对待测样品进行电学表征测试,并且在不使用待测样品放置台进行电学表征测试时,可额外增加测试装置与待测样品接触。本申请通过基座、调温模块以及至少一种测试装置的配合,集成电学表征测试、吸附功能、温度调节于一体,减少了测试中的误差,提高了温度调节精度,并且还提供了多种测试方式以适用多类型的待测样品。
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Figure CN224636563U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of battery testing technology, specifically to a battery testing platform. Background Technology
[0002] With the continuous development of photovoltaic technology, new battery technologies such as crystalline silicon cells, perovskite cells, and tandem cells are emerging. These cells each have their own performance advantages, but also face different testing challenges. To accurately evaluate the performance of these cells, battery testing equipment is needed to test different types of cells.
[0003] However, existing battery testing equipment still has the following drawbacks:
[0004] First, the size is too large, the space utilization is low, and the operation is inconvenient. Currently, the test benches for crystalline silicon, perovskite, and tandem solar cells on the market are all assembled from a temperature control console and a test bench. The split design takes up a lot of space in the test environment, and each part needs to be operated separately during the test, which is very inconvenient.
[0005] Second: Poor compatibility and limited scalability. Some test benches only support testing one type of battery, one class of batteries, or batteries of a specified size, and cannot test other types of batteries properly.
[0006] Third: Low integration and incomplete functionality. Existing test benches have limited functionality and cannot provide perfect test solutions and conditions.
[0007] Fourth: Existing test benches cannot meet the temperature requirements for some battery tests. Utility Model Content
[0008] To overcome the shortcomings of the prior art, this application provides a battery testing platform, the specific technical solution of which is as follows:
[0009] A battery testing platform, comprising:
[0010] The base has a placement platform for placing the sample to be tested. The placement platform has an adsorption channel. The first end of the adsorption channel faces the sample to be tested, and the second end of the adsorption channel is used to connect to a negative pressure source to adsorb the sample to be tested onto the placement platform.
[0011] A temperature control module, mounted on the base, is used to adjust the temperature of the placement platform to regulate the ambient temperature of the sample under test during testing.
[0012] Up to two testing devices are adjustablely mounted on the base, and at least one of the testing devices is in contact with the sample under test at any given time, for performing electrical characterization tests on the sample under test through one of the testing devices.
[0013] In one specific embodiment, at most two of the test devices include:
[0014] The first testing device is disposed on the base and located on the outer periphery of the placement stage, and is used to contact the sample to be tested and perform electrical characterization tests.
[0015] The second testing device is disposed above the placement stage and is detachably connected to the placement stage, and is used to contact the sample to be tested and perform electrical characterization tests.
[0016] In one specific embodiment, the first testing device includes at least one probe holder, which is disposed on the base and located on the outer periphery of the placement stage; the probe holder is provided with a test probe, which is adjusted by the probe holder to contact the sample to be tested, for cooperating with the placement stage to perform electrical characterization tests.
[0017] In one specific embodiment, the second testing device includes a cover plate, the center of which is hollow, and a plurality of contact pieces are provided on the cover plate. The plurality of contact pieces are arranged in a circumferential manner at intervals and all extend toward the center of the cover plate.
[0018] The cover plate is magnetically connected to the placement stage. The contact piece at one end toward the center is in contact with the sample to be tested and conducts electrical communication with the placement stage to perform electrical characterization tests on the sample to be tested.
[0019] In one specific embodiment, the placement stage has a conductive or insulating function, and there are multiple probe holders. The multiple probe holders cooperate with the placement stage in a non-conductive or insulating state to perform electrical characterization tests. At this time, the placement stage is only used to adjust the temperature of the sample to be tested.
[0020] In one specific embodiment, the cover plate includes a magnetic cover plate, the placement platform has a magnetic hole, a magnet is provided in the magnetic hole, and the magnetic cover plate is magnetically connected to the magnet.
[0021] In one specific embodiment, the second testing device further includes a limiting plate located between the placement stage and the cover plate, the limiting plate having a limiting groove in the middle, the limiting groove being used to limit the position of the sample to be tested.
[0022] In one specific embodiment, the base has a plurality of heat dissipation holes on its sidewall, and the heat dissipation holes are located in the area close to the temperature control module.
[0023] In one specific embodiment, the temperature control module includes an air-cooled semiconductor refrigeration device or a water-cooled semiconductor refrigeration device.
[0024] In one embodiment, the system further includes a circuit board located inside the base, the circuit board having an output interface that protrudes from the surface of the base.
[0025] This application has at least the following beneficial effects:
[0026] This application relates to the field of battery testing technology, specifically disclosing a battery testing platform, comprising: a base, a placement stage on the base for placing a sample to be tested, an adsorption channel on the placement stage, a first end of the adsorption channel facing the sample to be tested, and a second end of the adsorption channel for connecting to a negative pressure source to adsorb the sample to be tested onto the placement stage; a temperature control module, disposed on the base, for adjusting the temperature of the placement stage to regulate the ambient temperature of the sample to be tested during testing; and up to two testing devices, both adjustablely disposed on the base, with at least one testing device in contact with the sample to be tested at any given time, for performing electrical characterization tests on the sample to be tested through one of the testing devices, and additional testing devices can be added to contact the sample to be tested when the sample placement stage is not used for electrical characterization tests. This application integrates electrical characterization testing, adsorption function, and temperature control into one unit through the cooperation of the base, temperature control module, and at least one testing device, reducing testing errors, improving temperature control accuracy, and providing multiple testing methods applicable to various types of samples to be tested. Attached Figure Description
[0027] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0028] Figure 1 Schematic diagram of a battery testing platform Figure 1 ;
[0029] Figure 2 Schematic diagram of a battery testing platform Figure 2 ;
[0030] Figure 3 A schematic diagram of a battery test bench using the first test device;
[0031] Figure 4 This is a schematic diagram of a battery test bench using the second testing device.
[0032] Figure 5 This is a schematic diagram of the base of the battery testing platform;
[0033] Figure 6This is an exploded view of the battery test platform, the second test device, and the sample to be tested.
[0034] Figure 7 This is a cross-sectional view of the battery test bench when using the second testing device.
[0035] Figure label:
[0036] 1-Base; 2-Temperature control module; 3-First testing device; 4-Second testing device; 5-Negative pressure source; 6-Circuit board; 7-Output interface; 8-Bottom electrode; 9-Adsorption switch; 10-Sample to be tested;
[0037] 11-Placement platform; 12-Adsorption channel; 13-Magnetic suction hole; 14-Positioning hole; 15-Heat dissipation hole;
[0038] 121 - First end of the adsorption channel; 122 - Second end of the adsorption channel;
[0039] 151 - First heat dissipation area; 152 - Second heat dissipation area;
[0040] 31-Probe holder; 32-Test probe; 33-Connector;
[0041] 41-Cover plate; 42-Contact piece; 43-Limiting plate;
[0042] 431 - Limiting groove;
[0043] 21-Heat-generating part; 22-Heat-dissipating part;
[0044] 101-Electrode. Detailed Implementation
[0045] Various embodiments of this application will be described more fully below. This application may have various embodiments, and adjustments and changes may be made therein. However, it should be understood that there is no intention to limit the various embodiments of this application to the specific embodiments disclosed herein, but rather this application should be understood to cover all adjustments, equivalents, and / or alternatives falling within the spirit and scope of the various embodiments of this application.
[0046] In the following, the terms “comprising” or “may include” as used in the various embodiments of this application indicate the presence of the disclosed functions, operations, or elements, and do not limit the addition of one or more functions, operations, or elements. Furthermore, as used in the various embodiments of this application, the terms “comprising,” “having,” and their cognates are intended only to indicate a particular feature, number, step, operation, element, component, or combination of the foregoing, and should not be construed as primarily excluding the presence of one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing, or the possibility of adding one or more combinations of features, numbers, steps, operations, elements, components, or combinations of the foregoing.
[0047] In various embodiments of this application, the expression "or" or "at least one of A and / or B" includes any combination or all combinations of the words listed simultaneously. For example, the expression "A or B" or "at least one of A and / or B" may include A, may include B, or may include both A and B.
[0048] The terms used in the various embodiments of this application (such as "first," "second," etc.) may modify various constituent elements in the various embodiments, but do not limit the corresponding constituent elements. For example, the above terms do not limit the order and / or importance of the elements. The above terms are only used for the purpose of distinguishing one element from other elements. For example, a first user device and a second user device refer to different user devices, although both are user devices. For example, without departing from the scope of the various embodiments of this application, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element.
[0049] like Figure 1 , 2 As shown, a battery testing platform includes:
[0050] The base 1 has a placement stage 11 for placing the sample 10 to be tested. The placement stage 11 can be connected to the bottom electrode of the sample or can be insulated according to actual needs. The placement stage 11 has an adsorption channel 12. The first end 121 of the adsorption channel faces the sample 10 to be tested, and the second end 122 of the adsorption channel is used to connect to the negative pressure source 5 to adsorb the sample 10 to be tested onto the placement stage 11.
[0051] Temperature control module 2, set on base 1, is used to adjust the temperature of placement stage 11 to regulate the ambient temperature of sample 10 during testing.
[0052] Up to two test devices are adjustablely mounted on the base 1, and at least one test device is in contact with the sample 10 at the same time to perform electrical characterization tests on the sample 10 through one of the test devices. When the sample placement stage 11 is not used for electrical characterization tests, additional test devices can be added to contact the sample.
[0053] This application integrates electrical characterization testing, adsorption function, and temperature regulation into one unit through the cooperation of base 1, temperature regulation module 2, and up to two testing devices. It effectively avoids testing errors caused by sample movement or shaking during the testing process, improves temperature regulation accuracy, and provides multiple testing methods to be applicable to various types of test samples 10, thereby effectively improving the accuracy, efficiency, and flexibility of battery testing.
[0054] like Figure 1-6 As shown, at most two test devices include:
[0055] The first testing device 3 is set on the base 1 and located on the outer periphery of the placement stage 11, and is used to contact the sample 10 to be tested and perform electrical characterization tests.
[0056] The second testing device 4 is positioned above the placement stage 11 and is detachably connected to the placement stage 11. It is used to contact the sample 10 to be tested and perform electrical characterization tests.
[0057] This application expands the testing methods by using two testing devices, the first testing device 3 and the second testing device 4, to test the sample 10 under test. This makes the test applicable to a variety of types of samples 10 under test. Furthermore, the different positions of the first testing device 3 and the second testing device 4 make the layout more reasonable and allow for easier switching between any two testing devices to test the sample 10 under test.
[0058] like Figure 3 As shown, the first testing device 3 includes at least one probe holder 3, at least one probe holder 31 is disposed on the base 1 and located on the outer periphery of the placement stage 11, and a test probe 32 is provided on the probe holder 31. The test probe 32 is adjusted by the probe holder 31 to contact the sample 10 to be tested, and is used to cooperate with the placement stage 11 to perform electrical characterization tests.
[0059] This application provides stable support for the test probe 32 by fixing the probe holder 31 to the outer periphery of the base 1, ensuring accurate positioning and reducing test errors. The probe holder 31 can be one or more, and the placement stage 11 can be selected to cooperate with a single probe holder 31 or multiple probe holders 31 according to actual test needs, thereby improving test flexibility. Furthermore, the test probe 32 can be adjusted to contact or move away from the sample 10 under test via the probe holder 31, and its position and angle can be flexibly adjusted according to different batteries and test points during contact, making the structure safer and more reliable.
[0060] Specifically, such as Figure 3 , 4 As shown, the probe holder 31 is provided with a connector 33. One end of the connector 33 is slidably connected to the probe holder 31 and locked with a screw, while the other end of the connector 33 is connected to the test probe 32. When using the first testing device 3 for testing, the connector 33 moves downward on the probe holder 31 so that the end of the test probe 32 contacts the electrode 101 of the sample 10 to be tested, thereby realizing the testing of the sample 10. Before using the second testing device 4 for testing, the connector 33 moves upward on the probe holder 31 so that the end of the test probe 32 is moved away from the electrode 101 of the sample 10 to facilitate subsequent testing using the second testing device 4.
[0061] like Figure 5 , 6 As shown, the second testing device 4 includes a cover plate 41, which is hollow in the middle. The cover plate 41 is provided with a plurality of contact pieces 42, which are arranged in a circumferential manner at intervals and all extend toward the center of the cover plate 41.
[0062] The cover plate 41 is magnetically connected to the placement stage 11, and the contact piece 42 is in contact with the sample 10 to be tested at one end towards the center and is in cooperation with the placement stage 11 to perform electrical characterization tests on the sample 10 to be tested.
[0063] This application uses a cover plate 41 to magnetically connect to the placement platform 11, making installation and disassembly simple and quick. When facing different types of batteries or test items, it can quickly switch between the first test device 3 and the second test device 4. The cover plate 41 is hollow in the middle, and one end of the contact piece 42 is connected to the cover plate 41, while the other end extends towards the center. Multiple contact pieces 42 are arranged in a ring around each other at intervals, so that the contact pieces 42 can contact the sample 10 to be tested from different directions, ensuring stable contact with the battery electrode 101, reducing contact resistance, avoiding test errors caused by poor contact, and ensuring the accuracy of test data.
[0064] The placement stage 11 has a conductive or insulating function, and there are multiple probe holders 31. The multiple probe holders cooperate with the placement stage in a non-conductive or insulating state to perform electrical characterization tests. At this time, the placement stage is only used to adjust the temperature of the sample to be tested.
[0065] When the placement stage is conductive and in a conductive state, it can be connected to the bottom electrode of the sample to be tested.
[0066] The cover plate 41 includes a magnetic cover plate 41, and the placement platform 11 has a magnetic hole 13 with a magnet inside the magnetic hole 13. The magnetic cover plate 41 is magnetically connected to the magnet. This application uses the magnetic connection between the magnetic cover plate 41 and the magnet on the placement platform 11, making operation simple and quick, and enabling a stable connection between the two to be achieved rapidly. Furthermore, this magnetic connection method does not require complex mechanical structures or tools, allowing testers to easily install and remove the cover plate 41.
[0067] like Figure 6 As shown, the second testing device 4 also includes a limiting plate 43, which is located between the placement stage 11 and the cover plate 41. The limiting plate 43 has a limiting groove 431 in the middle, which is used to limit the position of the sample 10 to be tested. By setting the limiting plate 43 between the placement stage 11 and the cover plate 41, the limiting groove 431 can accurately limit the position of the sample 10 to be tested, thereby ensuring that the contact piece 42 of the second testing device 4 can accurately contact the electrode 101 of the sample 10 to be tested during testing, reducing the contact resistance and error caused by position deviation, and obtaining more accurate and reliable electrical characterization test data.
[0068] In this embodiment, the sample to be tested 10 is a square sample to be tested 10. The wall of the limiting groove 431 contacts the four corners of the sample to be tested 10 to limit the position of the sample to be tested 10. The electrode 101 of the sample to be tested 10 is located in the middle of the edge. The end of the contact piece 42 faces the bottom of the sample to be tested 10 and contacts the electrode 101 of the sample to be tested 10, thereby performing electrical characterization tests on the sample to be tested 10.
[0069] Specifically, the positioning structure between the limiting plate 43 and the placement stage 11 includes multiple positioning holes 14 on both the limiting plate 43 and the placement stage 11. The positioning holes 14 on the limiting plate 43 correspond one-to-one with the positioning holes 14 on the placement stage 11. Fasteners are passed through the positioning holes 14 on the limiting plate 43 and the placement stage 11 to position the limiting plate 43 on the placement stage 11, thereby facilitating the subsequent positioning of the sample 10 to be tested by the limiting plate 43.
[0070] like Figure 1-7As shown, the temperature control module 2 is located inside the base 1. The temperature control module 2 has a heating element 21 and a heat dissipation element 22. One end of the heating element 21 faces the placement stage 11, and the other end of the heating element 21 is connected to the heat dissipation element 22. By placing the temperature control module 2 inside the base 1, with one end of the heating element 21 facing the placement stage 11, the temperature of the placement stage 11 and the sample 10 under test can be adjusted at close range. This reduces heat loss during transmission, making temperature adjustment faster and more accurate. It can quickly adjust the ambient temperature of the sample 10 under test to the required value, ensuring that the electrical characterization tests of the battery under different temperature conditions can be performed in a stable and accurate temperature environment, greatly improving the reliability and validity of the test data. The other end of the heating element 21 is connected to the heat dissipation element 22. This design forms an effective thermal circulation system. When the heating element 21 generates heat, the heat dissipation element 22 can dissipate excess heat in a timely manner, preventing the temperature control module 2 from being damaged due to overheating, ensuring long-term stable operation of the temperature control module 2, extending the service life of the equipment, and reducing equipment maintenance and replacement costs.
[0071] In this embodiment, the heating element 21 includes a heating semiconductor, and the heat dissipation element 22 includes a plurality of spaced heat dissipation fins disposed below the heating semiconductor.
[0072] like Figure 1-3 As shown, the base 1 has multiple heat dissipation holes 15 on its side wall, which are located near the temperature control module 2. By placing the heat dissipation holes 15 near the temperature control module 2, this application can accelerate air circulation, quickly dissipate heat from the base 1, avoid excessive internal temperature, ensure stable operation of the temperature control module 2 and electronic components at a suitable temperature, reduce malfunctions and downtime caused by overheating, and extend the service life of the equipment.
[0073] The cross-sectional shape of the heat dissipation hole 15 includes a circle or a strip.
[0074] Multiple heat dissipation holes 15 are distributed on the base 1 to form a first heat dissipation area 151 and a second heat dissipation area 152. The first heat dissipation area 151 and the second heat dissipation area 152 are located on two opposite sides of the base 1, thereby realizing air convection, accelerating air circulation, quickly dissipating heat from the base 1, avoiding excessive internal temperature, ensuring stable operation of the temperature control module 2 and electronic components at a suitable temperature, reducing malfunctions and shutdowns caused by overheating, and extending the service life of the equipment.
[0075] Temperature control module 2 includes an air-cooled semiconductor refrigeration device or a water-cooled semiconductor refrigeration device.
[0076] In this embodiment, the temperature control module 2 includes an air-cooled semiconductor refrigeration device. This device eliminates the need for a complex water system, resulting in a simpler overall structure, significantly reducing installation time and complexity, and lowering installation costs. Furthermore, the absence of a water system eliminates the risks of water pipe aging, blockages, and leaks, reducing maintenance work caused by water system issues. Moreover, the air-cooled semiconductor refrigeration device allows for rapid adjustment of cooling or heating power, enabling flexible control of the ambient temperature of the sample 10 under test.
[0077] In other embodiments, the temperature control module 2 includes a water-cooled semiconductor refrigeration device. Compared with an air-cooled device, the water-cooled semiconductor refrigeration device can reduce the temperature more efficiently at the same power, and the water-cooling system can provide a more stable cooling effect and reduce temperature fluctuations.
[0078] like Figure 2 , 7 As shown, the battery test bench of this application also includes a circuit board 6, which is located inside the base 1. The circuit board 6 is provided with an output interface 7, which is exposed on the surface of the base 1.
[0079] In this embodiment, the output interface 7 includes a power supply interface and a temperature control interface, which are used to connect an external power supply and an external temperature control device.
[0080] like Figure 1-7 As shown, the battery test station of this application also includes a bottom electrode 1018 and an adsorption switch 9, both of which are exposed on the surface of the base 1.
[0081] The bottom electrode 1018 and the adsorption switch 9 are located on the same surface of the base 1, and the output interface 7 is located on the surface opposite to the bottom electrode 1018 and the adsorption switch 9.
[0082] It should be noted that, in this application, unless otherwise explicitly specified and defined, terms such as "installation," "connection," and "fixation" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0083] In this application, those skilled in the art should understand that the terms indicating orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings and are only for the purpose of describing this application and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0084] The terminology used in the various embodiments of this application is for the purpose of describing particular embodiments only and is not intended to limit the various embodiments of this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of this application pertain. The terms (such as those defined in a generally used dictionary) are to be interpreted as having the same meaning as in the context of the relevant technical field and are not to be interpreted as having an idealized or overly formal meaning, unless clearly defined in the various embodiments of this application.
[0085] Those skilled in the art will understand that the accompanying drawings are merely schematic diagrams of a preferred embodiment, and the modules or processes shown in the drawings are not necessarily essential for implementing this application.
[0086] Those skilled in the art will understand that the modules in the apparatus of the implementation scenario can be distributed within the apparatus of the implementation scenario as described, or they can be located in one or more apparatuses different from this implementation scenario, with corresponding changes. The modules of the above-described implementation scenario can be combined into one module, or they can be further divided into multiple sub-modules.
[0087] The serial numbers in this application are for descriptive purposes only and do not represent the superiority or inferiority of the implementation scenario.
[0088] The above description is only a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.
Claims
1. A battery test stand, characterized by, include: The base has a placement platform for placing the sample to be tested. The placement platform has an adsorption channel. The first end of the adsorption channel faces the sample to be tested, and the second end of the adsorption channel is used to connect to a negative pressure source to adsorb the sample to be tested onto the placement platform. A temperature control module, mounted on the base, is used to adjust the temperature of the placement platform to regulate the ambient temperature of the sample under test during testing. Up to two testing devices are adjustablely mounted on the base, and at least one of the testing devices is in contact with the sample under test at any given time, for performing electrical characterization tests on the sample under test by means of one of the testing devices.
2. The battery test stand of claim 1, wherein, At most two of the aforementioned test apparatuses include: The first testing device is disposed on the base and located on the outer periphery of the placement stage, and is used to contact the sample to be tested and perform electrical characterization tests. The second testing device is disposed above the placement stage and is detachably connected to the placement stage, and is used to contact the sample to be tested and perform electrical characterization tests.
3. The battery test stand of claim 2, wherein, The first testing device includes at least one probe holder, which is disposed on the base and located on the outer periphery of the placement stage; the probe holder is provided with a test probe, which is adjusted by the probe holder to contact the sample to be tested, and is used to cooperate with the placement stage to perform electrical characterization tests.
4. The battery test stand of claim 2, wherein, The second testing device includes a cover plate, the center of which is hollow, and a plurality of contact pieces are provided on the cover plate. The plurality of contact pieces are arranged in a circumferential manner at intervals and all extend toward the center of the cover plate. The cover plate is magnetically connected to the placement stage. The contact piece at one end toward the center is in contact with the sample to be tested and conducts electrical communication with the placement stage to perform electrical characterization tests on the sample to be tested.
5. The battery test stand of claim 3, wherein, The placement stage has a conductive or insulating function, and there are multiple probe holders. The multiple probe holders cooperate with the placement stage in a non-conductive or insulating state to perform electrical characterization tests. At this time, the placement stage is only used to adjust the temperature of the sample to be tested.
6. The battery test stand of claim 4, wherein, The cover plate includes a magnetic cover plate, the placement platform has a magnetic hole, a magnet is provided in the magnetic hole, and the magnetic cover plate is magnetically connected to the magnet.
7. The battery test stand of claim 4, wherein, The second testing device further includes a limiting plate located between the placement stage and the cover plate. The limiting plate has a limiting groove in the middle, which is used to limit the position of the sample to be tested.
8. The battery testing stand according to claim 1, characterized in that, The base has multiple heat dissipation holes on its side wall, which are located in the area close to the temperature control module.
9. The battery test stand of claim 1, wherein, The temperature control module includes an air-cooled semiconductor refrigeration device or a water-cooled semiconductor refrigeration device.
10. The battery test stand of claim 1, wherein, It also includes a circuit board located inside the base, the circuit board having an output interface that protrudes from the surface of the base.