Pin card and chip testing system
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-29
- Publication Date
- 2026-08-14
Smart Images
Figure CN224636581U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip testing technology, and in particular to a pin card and chip testing system. Background Technology
[0002] In the semiconductor manufacturing process, before wafers are diced into packaged chips, a chip testing system is used to perform electrical performance tests on the chips on the wafer. Defective chips are marked and discarded before the subsequent packaging process. This testing step is crucial as it confirms chip performance for chip selection, thereby reducing packaging costs.
[0003] A chip testing system typically includes a tester, a pin card, and a probe station. The tester is an automated tester capable of rapidly, accurately, and repeatedly measuring sub-microampere currents and millivolt-level voltages on the test structure. The probe station's main function is to load and unload the chip under test (DUT), and to precisely position the DUT and the probes on the pin card. The pin card, serving as the interface between the automated tester and the DUT, is usually a circuit board with numerous probes. The current entering and exiting the solder joints of the device's test structure is transferred through the contact between these probes and the DUT.
[0004] Currently, there are many types of DMOS products. Each product has different sizes and appearances, and each requires a pin card with a different arrangement structure. In other words, each product needs to be equipped with a single-channel pin card for high-current testing when introducing new products.
[0005] However, existing pin cards have the following problems:
[0006] (1) Limiting current testing will shorten probe life;
[0007] (2) Existing pin cards are only applicable to a single product and cannot be used for multiple products;
[0008] (3) Existing needle cards are left idle for a long time after being used once, which will result in a waste of costs;
[0009] (4) If the probes of the existing needle card are damaged, they need to be returned to the factory for reinstallation, which is costly and time-consuming.
[0010] It should be noted that the information disclosed in the background section of this utility model is intended only to enhance the understanding of the general background of this utility model, and should not be regarded as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Utility Model Content
[0011] The purpose of this invention is to provide a pin card and chip testing system that is applicable to different products and allows for free replacement of probes, eliminating the need for factory repairs when probes are damaged, thereby effectively reducing costs.
[0012] To achieve the above objectives, this utility model provides a pin clip, which includes a base plate and multiple sets of probe assemblies, multiple main signal terminals, and a signal input terminal disposed on the base plate. The main signal terminals are electrically connected to the signal input terminals. Each set of probe assemblies includes a chassis, a probe arm, a probe, an adjustment unit, and a probe terminal. The chassis is disposed on the base plate. The probe is electrically connected to the probe terminal via a first wire, and the probe terminal can be electrically connected to any of the main signal terminals via a second wire. The probe arm is movably connected to the chassis via the adjustment unit. The probe arm can move towards the center of the base plate and away from the center of the base plate, and the probe arm can rotate relative to the base plate. The probe and the side of the probe arm closest to the center of the base plate are detachably connected.
[0013] Optionally, the probe arm has an elongated through hole along its length, and the adjustment unit includes at least one fixing knob. The fixing knob includes a first cap and a first screw connected together. The first screw passes through the through hole and is threaded to the chassis. The diameter of the first cap is greater than the width of the through hole, and the bottom of the first cap can abut against the probe arm.
[0014] Optionally, the adjustment unit further includes a fine-tuning knob, which includes a second cap and a second screw connected together. A fixing member is provided on the side of the probe arm away from the center of the substrate. The second screw passes through the fixing member and is threadedly connected to the fixing member. The end of the second screw away from the second cap can abut against the first screw.
[0015] Optionally, a mounting block is provided on one side of the probe arm near the center of the substrate. The probe is detachably connected to the mounting block, which is made of a conductive material. The first wire is electrically connected to the mounting block.
[0016] Optionally, the mounting block is provided with a socket for mounting the probe, and the socket is inclined downward toward the center of the substrate.
[0017] Optionally, each probe assembly further includes a locking member. The mounting block has a threaded hole that communicates with the insertion hole. The locking member is threadedly connected to the mounting block through the threaded hole, and the locking member can abut against the probe.
[0018] Optionally, the probe arm is provided with multiple scale lines spaced apart along its length.
[0019] Optionally, one of the scale lines is provided in a protruding manner, and a pre-calibrated mark is provided on the chassis. When the probe is located at the center of the substrate, the protruding scale line can be aligned with the mark.
[0020] Optionally, the probe arm is provided with a wire channel for the first wire to pass through, and the wire channel extends along the length direction of the probe arm.
[0021] To achieve the above objectives, this utility model also provides a chip testing system, which includes a tester, a probe station, and the pin card described in any of the above items.
[0022] Compared with the prior art, the pin card and chip testing system provided by this utility model has the following advantages:
[0023] The pin clip provided by this utility model includes a base plate and multiple sets of probe assemblies, multiple main signal terminals, and a signal input terminal disposed on the base plate. The main signal terminals are electrically connected to the signal input terminals. Each set of probe assemblies includes a chassis, a probe arm, a probe, an adjustment unit, and a probe terminal. The chassis is disposed on the base plate. The probe is electrically connected to the probe terminal via a first wire. The probe terminal can be electrically connected to any of the main signal terminals via a second wire. The probe arm is movably connected to the chassis via the adjustment unit. The probe arm can move towards the center of the base plate and away from the center of the base plate, and the probe arm can rotate relative to the base plate. The probe and the side of the probe arm near the center of the base plate are detachably connected. Since the probe arm is movably connected to the chassis via the adjustment unit, the position of the probe arm and the probes mounted on it can be adjusted using the adjustment unit. This allows for flexible adjustment of the probe position according to the pad position and size of different products, eliminating the need to manufacture a dedicated single-channel pin card for each product. This significantly reduces the types and inventory of pin cards, effectively solving the problem of traditional pin cards having fixed probe positions that can only match the pad layout of specific products, resulting in long-term idleness after one use. Furthermore, since the probes are detachably connected to the probe arm, they can be freely replaced without needing to return them for repair when damaged. This effectively avoids the problem of the entire pin card being scrapped due to probe damage, thus effectively solving the pain point of cumbersome pin card repair. Additionally, since the probes are electrically connected to the probe terminals via a first wire, and the probe terminals can be electrically connected to any of the main signal terminals via a second wire, each probe can selectively connect to the required main signal terminals to further adapt to products of different shapes.
[0024] Furthermore, by configuring the adjustment unit as a fixed knob consisting of a first cap and a first screw, and a fine-tuning knob consisting of a second cap and a second screw, this invention can achieve universal adjustment of the probe position while minimizing the volume of the adjustment unit compared to the XYZ three-axis adjustment mechanism in the prior art.
[0025] Furthermore, by providing a mounting block at one end of the probe arm near the center of the substrate, and providing an insertion hole on the mounting block that is inclined downward toward the center of the substrate, the present invention allows the probe to be inserted into the mounting block from bottom to top and to press against the mounting block, thereby ensuring that the height of all probes is consistent, avoiding Z-axis adjustment, and making it easier to freely replace probes.
[0026] Furthermore, by providing the locking element on the mounting block, the present invention can firmly fix the probe in the insertion hole of the mounting block, effectively preventing the probe from shaking during the test, thereby effectively improving the stability of the chip testing process. Attached Figure Description
[0027] Figure 1 This is a schematic diagram of the overall structure of the pin clip provided in one embodiment of the present utility model;
[0028] Figure 2 This is a top view of the probe assembly in a needle card according to one embodiment of the present invention;
[0029] Figure 3 This is a front view of the probe assembly in a needle card provided according to one embodiment of the present invention.
[0030] The reference numerals in the attached figures are explained as follows:
[0031] Substrate-100; Hole-110; Fastener-120;
[0032] Probe assembly - 200; Chassis - 210; Marker - 211; Probe arm - 220; Through hole - 221; Fixing element - 222; Scale line - 223; 223A; Probe - 230; Adjustment unit - 240; Fixing knob - 241; First cap - 2411; First screw - 2412; Fine adjustment knob - 242; Second cap - 2421; Second screw - 2422; Probe terminal - 250; Mounting block - 260; Locking element - 270;
[0033] Main signal terminal -300;
[0034] Signal input terminal -400;
[0035] First conductor -510; Second conductor -520. Detailed Implementation
[0036] The following detailed description of the pin card and chip testing system proposed by this utility model, in conjunction with the accompanying drawings and specific embodiments, will further clarify its advantages and features. The advantages and features of this utility model will become clearer from the following description. Please refer to the accompanying drawings for a clearer understanding of the purpose, features, and advantages of this utility model. It should be noted that the structures, proportions, sizes, etc., depicted in the accompanying drawings are only for illustrative purposes and to enable those skilled in the art to understand and read the content disclosed herein. They are not intended to limit the implementation conditions of this utility model. Any modifications to the structure, changes in proportions, or adjustments to the size, provided they produce the same or similar effects and achieve the same purpose as this utility model, should still fall within the scope of the technical content disclosed herein. Specific design features of this utility model disclosed herein, including, for example, specific dimensions, orientations, positions, and shapes, will be determined in part by the specific application and usage environment. Furthermore, in the embodiments described below, the same reference numerals are sometimes used across different drawings to denote the same parts or parts having the same function, omitting repeated descriptions. In this specification, similar reference numerals and letters are used to denote similar items, so once an item is defined in one figure, it does not need to be discussed further in subsequent figures.
[0037] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations, nor should they be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element. The singular forms “a,” “one,” and “the” include plural objects. The term “or” is generally used to mean “and / or.” The term “several” is generally used to mean “at least one.” The term “at least two” is generally used to mean “two or more.” The term “multiple” is generally used to mean “at least two.”
[0038] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "axial," "radial," and "circumferential," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description. They do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. In the description of this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances. Furthermore, in this utility model, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Moreover, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0039] The core idea of this utility model is to provide a pin card and chip testing system that is not only applicable to different products, but also allows for free replacement of probes, eliminating the need for factory repairs when probes are damaged, thereby effectively reducing costs.
[0040] To achieve the above-mentioned idea, this utility model provides a pin clip, please refer to it. Figures 1 to 3 ,in, Figure 1 This is a schematic diagram of the overall structure of the pin clip provided in one embodiment of the present utility model; Figure 2 This is a top view of the probe assembly in a needle card according to one embodiment of the present invention; Figure 3 This is a front view of the probe assembly in a pin card according to one embodiment of the present invention. Please refer to... Figures 1 to 3 ,like Figures 1 to 3As shown, the pin clip provided by this utility model includes a base plate 100 and multiple sets of probe assemblies 200, multiple main signal terminals 300, and a signal input terminal 400 disposed on the base plate 100. The main signal terminals 300 are electrically connected to the signal input terminal 400. Each set of probe assemblies 200 includes a chassis 210, a probe arm 220, a probe 230, an adjustment unit 240, and a probe terminal 250. The chassis 210 is disposed on the base plate 100, and the probe 230 is connected to the probe terminal 250 via a first wire 510. 50 Electrical connection, the probe terminal 250 can be electrically connected to any of the main signal terminals 300 via the second wire 520; the probe arm 220 is movably connected to the chassis 210 via the adjustment unit 240, the probe arm 220 can move toward the center of the substrate 100 and away from the center of the substrate 100, and the probe arm 220 can rotate relative to the substrate 100; the probe 230 is detachably connected to the side of the probe arm 220 near the center of the substrate 100.
[0041] Since the probe arm 220 is movably connected to the chassis 210 via the adjustment unit 240, the positions of the probe arm 220 and the probes 230 mounted on it can be adjusted via the adjustment unit 240. This allows for flexible adjustment of the probe 230 position according to the pad positions and sizes of different products, eliminating the need to manufacture a dedicated single-channel pin card for each product. This significantly reduces the types and inventory of pin cards, effectively solving the problem of traditional pin cards having fixed probe 230 positions, which can only match the pad layout of specific products and thus remain idle for a long period after a single use. Furthermore, since the probe 230 is detachably connected to the probe arm 220, it can be freely replaced without needing to return it for repair if damaged. This effectively avoids the problem of the entire pin card being scrapped due to probe 230 damage, thus effectively solving the pain point of cumbersome pin card repair. In addition, since the probe 230 is electrically connected to the probe terminal 250 via the first wire 510, the probe terminal 250 can be electrically connected to any of the main signal terminals 300 via the second wire 520. Thus, each probe 230 can selectively connect to the required main signal terminals 300 to further adapt to products of different shapes.
[0042] It should be noted that, although Figure 1This description uses the pin card, which includes four main signal terminals 300: GF (gate input), GS (gate output), DF (drain input), and DS (drain output). However, as those skilled in the art will understand, this does not constitute a limitation of the present invention. In other embodiments, the main signal terminals 300 can be other signal terminals besides GF, GS, DF, and DS, depending on the actual testing requirements. It should also be noted that, as those skilled in the art will understand, on the back of the pin card, the main signal terminals 300 and the signal input terminal 400 are connected via a PCB board circuit. Furthermore, it should be noted that, as those skilled in the art will understand, the signal input terminal 400 is used to connect to a testing instrument.
[0043] Please continue to refer to this. Figure 1 ,like Figure 1 As shown, in some exemplary embodiments, the multiple sets of probe assemblies 200 are uniformly arranged in a ring array on the substrate 100. Therefore, by arranging the multiple sets of probe assemblies 200 uniformly in a ring array on the substrate 100, it is easier to calculate and adjust the position of the probes 230.
[0044] Please continue to refer to this. Figure 1 ,like Figure 1 As shown, in some exemplary embodiments, eight sets of probe assemblies 200 are uniformly disposed on the substrate 100, and the eight sets of probe assemblies 200 are uniformly disposed in a ring array on the substrate 100. Thus, by distributing the eight sets of probe assemblies 200 evenly on the substrate 100 at a 45° angle, it can be ensured that probes 230 cover all directions, thereby better adapting to irregularly shaped chips.
[0045] It should also be noted that, although Figure 1 The description is based on the example of the needle card including eight sets of probe components 200. However, as those skilled in the art will understand, this does not constitute a limitation of the present invention. In other embodiments, five, six, seven, nine or more sets of probe components 200 may be provided on the substrate 100. The specific number of probe components 200 can be set according to actual needs.
[0046] Please continue to refer to this. Figure 2 ,like Figure 2As shown, in some exemplary embodiments, the chassis 210 is secured to the base plate 100 by a plurality of fasteners 120. Therefore, by using a plurality of fasteners 120 to secure the chassis 210 to the base plate 100, it is easier to install the chassis 210 onto the base plate 100. It should be noted that, as those skilled in the art will understand, the fasteners 120 can be, but are not limited to, screws.
[0047] Please continue to refer to this. Figure 2 ,like Figure 2 As shown, in some exemplary embodiments, the probe arm 220 has an elongated through hole 221 along its length, and the adjustment unit 240 includes at least one fixing knob 241. The fixing knob 241 includes a first cap 2411 and a first screw 2412 connected together. The first screw 2412 passes through the through hole 221 and is threadedly connected to the base 210. The diameter of the first cap 2411 is larger than the width of the through hole 221, and the bottom of the first cap 2411 can abut against the probe arm 220. Therefore, when it is necessary to move the probe 230, all the fixing knobs 241 can be loosened first, so that the first cap 2411 moves above the probe arm 220 and disengages from the probe arm 220. At this time, the probe arm 220 can be moved back and forth. When the probe 230 is moved to the desired position, all the fixing knobs 241 can be tightened, so that the first cap 2411 moves downward until it presses against the probe arm 220, thereby locking the probe arm 220 onto the chassis 210. It should be noted that, as those skilled in the art will understand, by loosening the fixing knobs 241, coarse adjustment of the probe 230's position can be achieved.
[0048] Please continue to refer to this. Figure 2 and Figure 3 ,like Figure 2 and Figure 3 As shown, the adjustment unit 240 includes two spaced-apart fixed knobs 241. Therefore, by providing two fixed knobs 241, the probe arm 220 can be firmly locked onto the chassis 210. This restricts the rotation of the probe arm 220 while allowing it to withstand greater force, thereby further extending the service life of the needle holder provided by this invention. It should be noted that, as those skilled in the art will understand, when it is necessary to rotate the probe arm 220, one of the fixed knobs 241 can be loosened, and then the probe arm 220 can be rotated freely.
[0049] Please continue to refer to this. Figure 2 ,like Figure 2As shown, in some exemplary embodiments, the adjustment unit 240 further includes a fine-tuning knob 242, which includes a connected second cap 2421 and a second screw 2422. A fixing member 222 is provided on the side of the probe arm 220 away from the center of the substrate 100. The second screw 2422 passes through the fixing member 222 and is threadedly connected to it. The end of the second screw 2422 away from the second cap 2421 can abut against the first screw 2412. Thus, the probe arm 220 can be finely adjusted unidirectionally using the fine-tuning knob 242, thereby achieving fine adjustment of the probe 230 position. Specifically, when fine adjustment of the position of probe 230 is required, the fine adjustment knob 242 can be fixed to the fixing member 222 first, and all the fixing knobs 241 can be loosened. Then, the fine adjustment knob 242 can be rotated in the same direction so that the second screw 2422 of the fine adjustment knob 242 abuts against the first screw 2412 of the fixing knob 241 closest to it. If the fine adjustment knob 242 is rotated in the same direction, unidirectional fine adjustment (unidirectional precision adjustment) of probe arm 220 and probe 230 can be achieved.
[0050] In summary, by configuring the adjustment unit 240 into a structure comprising a fixed knob 241 consisting of a first cap 2411 and a first screw 2412, and a fine-tuning knob 242 consisting of a second cap 2421 and a second screw 2422, this utility model, compared to the XYZ three-axis adjustment mechanism in the prior art, can achieve universal adjustment of the probe 230 position while minimizing the volume of the adjustment unit 240.
[0051] Please continue to refer to this. Figure 2 and Figure 3 ,like Figure 2 and Figure 3 As shown, in some exemplary embodiments, a mounting block 260 is provided on the side of the probe arm 220 near the center of the substrate 100, and the probe 230 is detachably connected to the mounting block 260. Therefore, by providing the mounting block 260 on the side of the probe arm 220 near the center of the substrate 100, it is easier to achieve a detachable connection between the probe 230 and the probe arm 220.
[0052] Please continue to refer to this. Figure 2 ,like Figure 2As shown, in some exemplary embodiments, the mounting block 260 is made of a conductive material, and the first wire 510 is electrically connected to the mounting block 260. Therefore, by using a conductive material to make the mounting block 260 and electrically connecting the first wire 510 to it, it is possible to ensure that after the probe 230 is mounted on the mounting block 260, an electrical connection between the probe 230 and the probe terminal 250 can be achieved, thus facilitating easier replacement of the probe 230. It should be noted that, as those skilled in the art will understand, the mounting block 260 can be made of, but is not limited to, metallic copper. It should also be noted that, as those skilled in the art will understand, the first end of the first wire 510 can be soldered to the mounting block 260, and the end of the second wire 520 can be soldered to the probe terminal 250.
[0053] Please continue to refer to this. Figure 2 and Figure 3 ,like Figure 2 and Figure 3 As shown, in some exemplary embodiments, the mounting block 260 is provided with a socket (not shown) for mounting the probe 230, and the socket is inclined downward toward the center of the substrate 100. Therefore, by providing a socket on the mounting block 260, a detachable connection between the mounting block 260 and the probe 230 can be more easily achieved. Furthermore, by setting the socket to be inclined downward toward the center of the substrate 100, the probe 230 can be inserted into the mounting block 260 from bottom to top and hold against the mounting block 260, thereby ensuring that the height of all probes 230 is consistent, avoiding Z-axis adjustment, and thus facilitating free replacement of the probe 230. It should be noted that, as those skilled in the art will understand, the socket is a blind hole, that is, the socket only penetrates the bottom end of the mounting block 260.
[0054] Please continue to refer to this. Figure 1 ,like Figure 1 As shown, in some exemplary embodiments, the substrate 100 has a centrally located hole 110. Therefore, by providing a centrally located hole 110 in the substrate 100, it is easier to insert the probe 230 from bottom to top into the insertion hole of the mounting block 260 through the hole 110. It should be noted that, although... Figure 1 The example given is a circular through hole 110. However, as those skilled in the art will understand, this does not constitute a limitation on the present invention. In other embodiments, the hole 110 may also be a square hole or other through holes of any shape, which can be set according to actual needs.
[0055] Please continue to refer to this. Figure 3 ,like Figure 3 As shown, in some exemplary embodiments, each probe assembly 200 further includes a locking member 270. The mounting block 260 has a threaded hole (not shown) communicating with the insertion hole. The locking member 270 is threadedly connected to the mounting block 260 through the threaded hole, and the locking member 270 can abut against the probe 230. Therefore, by providing the locking member 270 on the mounting block 260, this invention can firmly fix the probe 230 within the insertion hole of the mounting block 260, effectively preventing the probe 230 from shaking during testing, thereby effectively improving the stability of the chip testing process.
[0056] It should be noted that, as those skilled in the art will understand, in some other embodiments, other locking methods may also be used to firmly lock the probe 230 into the socket. For specific details, please refer to the relevant content known to those skilled in the art for an adaptive understanding, which will not be listed here.
[0057] Please continue to refer to this. Figure 2 ,like Figure 2 As shown, in some exemplary embodiments, the probe arm 220 is provided with multiple scale lines 223 spaced apart along its length. Therefore, by providing multiple scale lines 223 spaced apart along the length of the probe arm 220, the movement distance of the probe arm 220 and the probe 230 can be converted into a visual numerical value, allowing the operator to directly position the probe 230 to the target position using the scale lines 223, avoiding the drawbacks of repeated manual adjustments based on experience. It should be noted that, as those skilled in the art will understand, for different product die layouts, the scale values corresponding to the optimal probe 230 position can be pre-recorded. When changing products, the positions of the probe arm 220 and the probe 230 can be directly adjusted according to the marked scale values, significantly shortening the adjustment time.
[0058] Please continue to refer to this. Figure 2 ,like Figure 2As shown, in some exemplary embodiments, one of the scale lines 223A is protruding, and a pre-calibrated mark 211 is provided on the chassis 210. When the probe 230 is located at the center of the substrate 100, the protruding scale line 223A can be aligned with the mark 211. Therefore, by making one scale line 223A protrude and providing a pre-calibrated mark 211 on the chassis 210, when the probe 230 is located at the center of the substrate 100, the protruding scale line 223A can be aligned with the mark 211. This protruding scale line 223A can thus serve as a visual indicator of the probe 230's centered position, effectively preventing the probe 230 from shifting off-center due to misoperation and avoiding chip damage during testing due to probe misalignment.
[0059] It should be noted that, as those skilled in the art will understand, the prominent setting of the scale line 223A includes, but is not limited to, thickening, lengthening, and color setting. For example, the scale line 223A aligned with the mark 211 when the probe 230 is located at the center of the substrate 100 can be set to red.
[0060] Please continue to refer to this. Figure 2 ,like Figure 2 As shown, in some exemplary embodiments, the probe arm 220 is provided with a wire channel (not shown) for the first wire 510 to pass through, the wire channel extending along the length of the probe arm 220. Thus, by providing a wire channel on the probe arm 220, one end of the first wire 510 can be soldered to the mounting block 260, and the other end of the first wire 510 can be passed through the wire channel and connected to the probe terminal 250, thereby facilitating the wiring of the first wire 510.
[0061] To achieve the above-mentioned goals, this utility model also provides a chip testing system, which includes a tester, a probe station, and the aforementioned pin card. Since the chip testing system provided by this utility model includes the pin card provided by this utility model, it at least includes all the beneficial effects of the pin card provided by this utility model. For details, please refer to the relevant descriptions of the beneficial effects of the pin card provided by this utility model above; therefore, the beneficial effects of the chip testing system provided by this utility model will not be elaborated upon here.
[0062] It should be noted that this utility model does not limit the specific structure and working principle of the tester and the probe station. The specific structure and working principle of the tester and the probe station can be adapted by referring to the relevant content known to those skilled in the art, and will not be described in detail here.
[0063] In summary, compared with the prior art, the pin card and chip testing system provided by this utility model has the following beneficial effects:
[0064] (1) The pin clip provided by this utility model includes a base plate 100 and multiple sets of probe assemblies 200 and multiple main signal terminals 300 disposed on the base plate 100; each set of probe assemblies 200 includes a chassis 210, a probe arm 220, a probe 230, an adjustment unit 240 and a probe terminal 250. The chassis 210 is disposed on the base plate 100. The probe 230 is electrically connected to the probe terminal 250 through a first wire 510. The probe terminal 250 can be electrically connected to any of the main signal terminals 300 through a second wire 520. The probe arm 220 is movably connected to the chassis 210 through the adjustment unit 240. The probe arm 220 can move toward the center of the base plate 100 and away from the center of the base plate 100 and can rotate relative to the base plate 100. The probe 230 is detachably connected to the side of the probe arm 220 near the center of the base plate 100. Since the probe arm 220 is movably connected to the chassis 210 via the adjustment unit 240, the positions of the probe arm 220 and the probes 230 mounted on it can be adjusted via the adjustment unit 240. This allows for flexible adjustment of the probe 230 position according to the pad positions and sizes of different products, eliminating the need to manufacture a dedicated single-channel pin card for each product. This significantly reduces the types and inventory of pin cards, effectively solving the problem of traditional pin cards having fixed probe 230 positions, which can only match the pad layout of specific products and thus remain idle for a long period after a single use. Furthermore, since the probe 230 is detachably connected to the probe arm 220, it can be freely replaced without needing to return it for repair if damaged. This effectively avoids the problem of the entire pin card being scrapped due to probe 230 damage, thus effectively solving the pain point of cumbersome pin card repair. In addition, since the probe 230 is electrically connected to the probe terminal 250 via the first wire 510, the probe terminal 250 can be electrically connected to any of the main signal terminals 300 via the second wire 520. Thus, each probe 230 can selectively connect to the required main signal terminals 300 to further adapt to products of different shapes.
[0065] (2) By setting the adjustment unit 240 to include a fixed knob 241 consisting of a first cap 2411 and a first screw 2412 and a fine adjustment knob 242 consisting of a second cap 2421 and a second screw 2422, this utility model can achieve universal adjustment of the probe 230 position while minimizing the volume of the adjustment unit 240 compared to the XYZ three-axis adjustment mechanism in the prior art.
[0066] (3) By providing a mounting block 260 at one end of the probe arm 220 near the center of the substrate 100, and providing an insertion hole on the mounting block 260 that is inclined downward toward the center of the substrate 100, the present invention allows the probe 230 to be inserted into the mounting block 260 from bottom to top and to press against the mounting block 260, thereby ensuring that the height of all probes 230 is consistent, avoiding Z-axis adjustment, and making it easier to freely replace the probe 230.
[0067] (4) By setting the locking member 270 on the mounting block 260, the present invention can firmly fix the probe 230 in the insertion hole of the mounting block 260, effectively preventing the probe 230 from shaking during the test, thereby effectively improving the stability of the chip test process.
[0068] It should be noted that in the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this utility model. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.
[0069] It should also be noted that the above description is only a description of the preferred embodiment of this utility model and is not intended to limit the scope of this utility model in any way. Any changes or modifications made by those skilled in the art based on the above disclosure are within the protection scope of this utility model. Obviously, those skilled in the art can make various modifications and variations to the utility model without departing from the spirit and scope of this utility model. Therefore, if these modifications and variations fall within the scope of this utility model and its equivalents, this utility model also intends to include these modifications and variations.
Claims
1. A needle card, characterized in that, The device includes a substrate and multiple sets of probe assemblies, multiple main signal terminals and a signal input terminal disposed on the substrate, wherein the main signal terminals are electrically connected to the signal input terminal. Each probe assembly includes a chassis, a probe arm, a probe, an adjustment unit, and a probe terminal. The chassis is mounted on the substrate. The probe is electrically connected to the probe terminal via a first wire. The probe terminal can be electrically connected to any of the main signal terminals via a second wire. The probe arm is movably connected to the chassis via the adjustment unit. The probe arm can move toward the center of the substrate and away from the center of the substrate, and the probe arm can rotate relative to the substrate. The probe is detachably connected to the side of the probe arm near the center of the substrate.
2. The needle clamp of claim 1, wherein The probe arm has an elongated through hole along its length. The adjustment unit includes at least one fixed knob. The fixed knob includes a first cap and a first screw connected together. The first screw passes through the through hole and is threaded to the chassis. The diameter of the first cap is greater than the width of the through hole, and the bottom of the first cap can abut against the probe arm.
3. The needle clamp of claim 2, wherein, The adjustment unit also includes a fine-tuning knob, which includes a second cap and a second screw connected together. A fixing member is provided on the side of the probe arm away from the center of the substrate. The second screw passes through the fixing member and is threadedly connected to the fixing member. The end of the second screw away from the second cap can abut against the first screw.
4. The needle clamp of claim 1, wherein A mounting block is provided on the side of the probe arm near the center of the substrate. The probe is detachably connected to the mounting block. The mounting block is made of a conductive material. The first wire is electrically connected to the mounting block.
5. The pin clip according to claim 4, characterized in that, The mounting block is provided with a socket for mounting the probe, and the socket is inclined downward toward the center of the substrate.
6. The needle clamp of claim 5, wherein, Each probe assembly also includes a locking element. The mounting block has a threaded hole that communicates with the insertion hole. The locking element is threadedly connected to the mounting block through the threaded hole, and the locking element can abut against the probe.
7. The needle clamp of claim 1, wherein, The probe arm has multiple scale lines spaced apart along its length.
8. The needle clamp of claim 7, wherein, One of the scale lines is protruding, and a pre-calibrated mark is provided on the chassis. When the probe is located at the center of the substrate, the protruding scale line can be aligned with the mark.
9. The needle clamp of claim 1, wherein, The probe arm is provided with a wire channel for the first wire to pass through, and the wire channel extends along the length of the probe arm.
10. A chip testing system, characterized by comprising: It includes a tester, a probe station, and a pin card as described in any one of claims 1 to 9.