Microscope eyepiece testing stage

Abstract

The utility model discloses a microscope eyepiece detection platform relates to microscope detection correction equipment field. Including base, the object table and test platform, the base, the object table and test platform place from below to top in height direction and the base, the object table and test platform are supported through the support column between, the object table is used for placing the variable multiple body of waiting to be measured, the perforation is set up on the object table and is equipped with the positioning assembly in the perforation, the positioning assembly moves in the perforation, when the positioning assembly moves to the upper end of perforation one end of the positioning assembly protrudes the upper end surface of the object table, when the positioning assembly moves to the lower end of the perforation the other end of the positioning assembly protrudes the lower end surface of the object table, the variable multiple body of waiting to be measured is equipped with the positioning hole of adapting with the positioning assembly, when the variable multiple body of waiting to be measured is placed on the object table the positioning assembly corresponds and inserts in the positioning hole. The present application has the advantages of being convenient and fast to detect.

Description

Technical Field

[0001] This utility model relates to the field of microscope inspection and calibration equipment, and in particular to a microscope eyepiece inspection stage. Background Technology

[0002] The zoom lens is a component of the eyepiece in a dental microscope. After production, it generally requires magnification testing and calibration. Due to different mounting positions of the zoom lens within the dental microscope, its horizontal calibration plane will vary, and this horizontal calibration plane is a crucial reference standard during the testing and calibration process. Generally, different zoom lenses have different horizontal calibration plane positions, broadly categorized into upper and lower horizontal calibration planes. The upper horizontal calibration plane is located on top of the zoom lens; the lower horizontal calibration plane uses the lower end face of the zoom lens as its horizontal calibration plane. During testing, to accommodate different horizontal calibration plane positions, corresponding positioning devices are required on the horizontal reference surface of the testing apparatus. This means that to handle different horizontal calibration plane positions, two sets of positioning devices need to be prepared for the testing apparatus at different locations, or two different horizontal reference surfaces need to be prepared. During testing, the testing apparatus needs to be constantly disassembled, reassembled, and adjusted for different zoom lenses, affecting testing efficiency. Utility Model Content

[0003] In order to overcome the shortcomings of the prior art, this utility model provides a microscope eyepiece inspection stage.

[0004] The present invention is achieved by the following technical solution: a microscope eyepiece inspection stage, comprising a base, a stage and a test stage, wherein the base, stage and test stage are placed from bottom to top along the height direction and are supported by a support column; The platform is used to place the varistor to be tested. A perforation is formed on the platform, and a positioning component is provided in the perforation. The positioning component moves within the perforation. When the positioning component moves to the upper end of the perforation, one end of the positioning component protrudes from the upper surface of the platform. When the positioning component moves to the lower end of the perforation, the other end of the positioning component protrudes from the lower surface of the platform. The varistor to be tested has a positioning hole that matches the positioning component. When the varistor to be tested is placed on the platform, the positioning component is inserted into the corresponding positioning hole.

[0005] The positioning component includes a sliding shaft, with a positioning post fixed at each end of the sliding shaft, and the sliding shaft is inserted into the through hole and slides within the through hole; The perforation includes a straight section and two gradually expanding sections. The two gradually expanding sections are respectively located at both ends of the straight section and are connected to the straight section. The gradually expanding sections gradually expand from the end of the perforation towards the straight section. The positioning post slides back and forth within the gradually expanding sections. The sliding shaft is inserted into the straight section and moves within the straight section. The sliding shaft is provided with a limiting ball, and the diameter of the limiting ball is larger than the diameter of the sliding shaft.

[0006] The base is provided with a light-passing hole, and the platform is provided with a test hole. The light-passing hole and the test hole are coaxial. A collimator is provided in the light-passing hole. One end of the lens of the zoom lens is inserted into the test hole and faces the collimator. The test bench is equipped with a camera, the lens of which faces the other end of the varistor under test. A collimator emits a light beam that passes through the varistor under test and is captured by the camera. The camera is connected to a test computer and transmits the captured image to the test computer.

[0007] Several fixing holes are made around the test hole. When the variable magnification body to be tested is placed on the platform, fixing bolts pass through the fixing holes to fix the variable magnification body to be tested on the platform.

[0008] The support column includes studs and adjusting bolts. Adjustment holes are provided around the platform and the test platform. The studs pass through the adjustment holes and the adjusting bolts are sleeved on the studs and abut against the end faces of the test platform and the platform.

[0009] Compared to existing technologies, this invention allows for convenient and accurate fixation of the varistor on the stage regardless of whether its horizontal reference plane is above or below. Specifically, when the reference plane of the varistor is above, it needs to be fixed to the lower end of the stage. In this case, one protruding end of the positioning post can be manually pushed to slide it, causing the other end of the positioning post on the sliding shaft to protrude from the lower end of the stage, thus providing positioning for placing and fixing the varistor. When testing a varistor with its horizontal reference plane below, the same method is used to push it back, causing the other end of the positioning post to protrude again from the upper end of the stage. This means that only one testing device is needed to conveniently and quickly test different varistor models. Attached Figure Description

[0010] Figure 1 This is a schematic diagram of the microscope eyepiece inspection stage in use according to the present invention; Figure 2 This is a schematic diagram of the microscope eyepiece inspection stage in this utility model; Figure 3 This is a schematic diagram of the placement stage structure of the microscope eyepiece inspection stage in this utility model; Figure 4 This is a schematic diagram of the cross-sectional structure of the microscope eyepiece inspection stage in this utility model. In the diagram: 1. Base; 11. Support column; 111. Stud; 112. Adjusting bolt; 113. Adjusting hole; 12. Light passage hole; 13. Collimator; 2. Stage; 21. Perforation; 22. Positioning assembly; 221. Sliding shaft; 222. Positioning column; 223. Diverging section; 224. Straight section; 225. Limiting ball; 23. Test hole; 24. Fixing hole; 3. Test stage; 31. Acquisition camera; 32. Test computer; 4. Variable magnification body to be tested. Detailed Implementation

[0011] The present invention will now be further described in conjunction with the accompanying drawings and specific embodiments. It should be noted that, without conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0012] Reference Figure 1-4 A microscope eyepiece inspection stage includes a base 1, a stage 2, and a testing stage 3. The base 1, stage 2, and testing stage 3 are placed from bottom to top along the height direction and are supported by support columns 11. In this embodiment, the support column 11 includes studs 111 and adjusting bolts 112. Adjustment holes 113 are formed around the stage 2 and testing stage 3. The studs pass through the adjustment holes, and the adjusting bolts are fitted onto the studs and pressed against the end faces of the testing stage 3 and stage 2. The stage 2 is in direct contact with the horizontal reference plane of the zoom lens, therefore it must also be horizontal. Therefore, the horizontality of the stage 2 can actually be fine-tuned. Specifically, the adjusting bolts can be loosened, and a level can be placed on the stage 2. The level can be fine-tuned according to the level's indication. After fine-tuning, the corresponding adjusting bolts can be retightened.

[0013] In this embodiment, the platform 2 is used to place the variability 4 to be tested. The platform 2 has a through hole 21 and a positioning component 22 is provided in the through hole 21. The positioning component 22 moves in the through hole 21. When the positioning component 22 moves to the upper end of the through hole 21, one end of the positioning component 22 protrudes from the upper end surface of the platform 2. When the positioning component 22 moves to the lower end of the through hole 21, the other end of the positioning component 22 protrudes from the lower end surface of the platform 2. The variability 4 to be tested has a positioning hole that matches the positioning component 22. When the variability 4 to be tested is placed on the platform 2, the positioning component 22 is inserted into the corresponding positioning hole. Specifically, the perforation 21 needs to be specially constructed. The perforation 21 includes a straight section 224 and two gradually expanding sections 223. The two gradually expanding sections 223 are respectively located at both ends of the straight section 224 and are connected to the straight section 224. The gradually expanding sections 223 gradually expand from the end of the perforation 21 to the straight section 224 to facilitate the movement and limiting of the positioning component 22.

[0014] Corresponding to the shape of the perforation 21, the positioning component 22 includes a sliding shaft 221, with a positioning post 222 fixed at each end of the sliding shaft 221. The sliding shaft 221 is inserted into the perforation 21 and slides within it. Specifically, the positioning post 222 reciprocates within the expanding section 223, and the sliding shaft 221 is inserted into the straight section 224 and moves within it. A limiting ball 225 is provided on the sliding shaft 221, and the diameter of the limiting ball 225 is larger than the diameter of the sliding shaft 221. During the sliding of the sliding shaft 221, the limiting ball 225 also slides within the expanding section 223. When it reaches the desired position, the limiting ball 225 is locked inside the corresponding expanding section 223, which serves both as a limiting function and provides some support through the friction between the expanding section 223 and the limiting ball 225, allowing the positioning post 222 to remain in a protruding state for easy positioning.

[0015] In this embodiment, the mutant 4 to be tested needs to remain stable during the test. Therefore, several fixing holes 24 can be made around the test hole 23. When the mutant 4 to be tested is placed on the platform 2, fixing bolts pass through the fixing holes 24 to fix the mutant 4 to the platform 2. This reduces the possibility of the mutant 4 to be tested moving on the platform 2 during the test.

[0016] In this embodiment, the base 1 has a light-passing hole 12, and the stage 2 has a test hole 23. The light-passing hole 12 and the test hole 23 are coaxial. A collimator 13 is installed inside the light-passing hole 12. One end of the lens of the zoom lens is inserted into the test hole 23 and faces the collimator 13. The test stage 3 is equipped with a data acquisition camera 31. The lens of the data acquisition camera 31 faces the other end of the zoom lens 4 under test. The collimator 13 emits a light beam that passes through the zoom lens 4 under test and is acquired by the data acquisition camera 31. The data acquisition camera 31 is connected to the test computer 32 and transmits the acquired image to the test computer 32. The image is processed by the test computer 32 and output to the screen of the test computer 32 for easy observation by the staff. Compared to existing technologies, this invention allows for convenient and accurate fixing of the varistor of a microscope onto the stage 2 regardless of whether the varistor's horizontal reference plane is above or below it. Specifically, when the reference plane of the varistor to be tested is above, it needs to be fixed to the lower end of the stage 2. In this case, one protruding end of the positioning post 222 can be manually pushed to slide it, causing the other end of the sliding shaft 221 to protrude beyond the lower end of the stage 2, thus providing positioning for placing and fixing the varistor 4. When testing a varistor with its horizontal reference plane below, it is similarly pushed back to allow the other end of the positioning post 222 to protrude again from the upper end of the stage 2. In other words, only one testing device is needed to conveniently and quickly test different varistor types.

[0017] The above embodiments are merely preferred embodiments of this utility model and should not be construed as limiting the scope of protection of this utility model. Any non-substantial changes and substitutions made by those skilled in the art based on this utility model shall fall within the scope of protection claimed by this utility model.

Claims

1. A microscope eyepiece inspection stage, comprising a base, a stage, and a testing stage, wherein the base, stage, and testing stage are placed from bottom to top along the height direction and are supported by a support column; characterized in that The platform is used to place the varistor to be tested. A perforation is formed on the platform, and a positioning component is provided in the perforation. The positioning component moves within the perforation. When the positioning component moves to the upper end of the perforation, one end of the positioning component protrudes from the upper surface of the platform. When the positioning component moves to the lower end of the perforation, the other end of the positioning component protrudes from the lower surface of the platform. The varistor to be tested has a positioning hole that matches the positioning component. When the varistor to be tested is placed on the platform, the positioning component is inserted into the corresponding positioning hole.

2. A microscope eyepiece testing stage according to claim 1, wherein: The positioning component includes a sliding shaft, with a positioning post fixed at each end of the sliding shaft, and the sliding shaft is inserted into the through hole and slides within the through hole; The perforation includes a straight section and two gradually expanding sections. The two gradually expanding sections are respectively located at both ends of the straight section and are connected to the straight section. The gradually expanding sections gradually expand from the end of the perforation towards the straight section. The positioning post slides back and forth within the gradually expanding sections. The sliding shaft is inserted into the straight section and moves within the straight section. The sliding shaft is provided with a limiting ball, and the diameter of the limiting ball is larger than the diameter of the sliding shaft.

3. A microscope eyepiece testing stage according to claim 1, wherein: The base is provided with a light-passing hole, and the platform is provided with a test hole. The light-passing hole and the test hole are coaxial. A collimator is provided in the light-passing hole. One end of the lens of the zoom lens is inserted into the test hole and faces the collimator. The test bench is equipped with a camera, the lens of which faces the other end of the varistor under test. A collimator emits a light beam that passes through the varistor under test and is captured by the camera. The camera is connected to a test computer and transmits the captured image to the test computer.

4. The microscope eyepiece inspection stage according to claim 3, characterized in that: Several fixing holes are made around the test hole. When the variable magnification body to be tested is placed on the platform, fixing bolts pass through the fixing holes to fix the variable magnification body to be tested on the platform.

5. The microscope eyepiece testing stage of claim 1, wherein: The support column includes studs and adjusting bolts. Adjustment holes are provided around the platform and the test platform. The studs pass through the adjustment holes and the adjusting bolts are sleeved on the studs and abut against the end faces of the test platform and the platform.

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