Chip detection clamp and detection tool
Patent Information
- Application Number
- CN202521877346.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-02
- Publication Date
- 2026-08-18
- Estimated Expiration
- 2035-09-02
AI Technical Summary
[0003]目前，这类检测夹具在使用时，在芯片放入到底座的定位槽中后，还需要盖上夹持壳，并需要调节夹持壳作用在芯片上的力度，从而使芯片能与底座上的触点紧密的接触，以确保检测效果，这样的方式较为麻烦，操作步骤较多，并且后续在取出芯片时，由与底座内部的空间较小，造成不易将芯片从内部取出的技术问题，从而影响芯片检测效率
[0015]本实用新型的有益效果是：本实用新型结构简单，芯片两端能插入到夹具中，并通过驱动机构能自动的带动夹具和芯片的下降，直至进入到测试台的定位槽中，并通过夹具的下压能直接的使芯片上的引脚与定位槽中的触点紧密抵触，无需在使用到夹持壳，增加了效率，并且后续能自动的上抬，方便了对芯片的拆装。
Smart Images
Figure CN224651405U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip testing technology, specifically to a chip testing fixture and testing tooling. Background Technology
[0002] The chip manufacturing industry needs to test a large number of chips produced to ensure that the chips are in good working order. During the chip research and development process, it is also necessary to test the performance indicators of the chips, such as the degree of aging. This test usually requires fixing the chip in a chip testing fixture, using a number of probes on the chip testing fixture that correspond one-to-one with the chip's pins to contact the chip's pins, and then connecting the probes to the circuit to test the chip's performance through the circuit.
[0003] Currently, when using this type of testing fixture, after the chip is placed into the positioning slot of the base, it is necessary to cover it with a clamping shell and adjust the force of the clamping shell on the chip so that the chip can make tight contact with the contacts on the base to ensure the testing effect. This method is relatively troublesome and involves many steps. Furthermore, when removing the chip later, the small space inside the base makes it difficult to remove the chip from the inside, thus affecting the chip testing efficiency. Utility Model Content
[0004] The technical problem to be solved by this utility model is to provide a chip testing fixture that can automatically descend and move the chip into the positioning slot, and directly press the chip to be tested against the contact point on the base without the need for an external clamping shell, thereby improving the chip testing speed and thus improving chip testing efficiency.
[0005] To achieve the above objectives, the technical solution of this utility model is as follows:
[0006] A chip testing fixture includes a testing platform. The bottom of the testing platform is provided with a positioning groove that matches the chip. The positioning groove has contacts corresponding to the pins of the chip. The testing platform has a rectangular enclosure structure. Grooves are provided on the two width sides of the testing platform. A fixture is movably installed in each groove. A clamping groove is provided on the side of the fixture near the chip. The width of the clamping groove matches the thickness of the chip. A lifting plate is fixedly connected to the outer side of the fixture away from the chip. A limiting plate is installed on one length side of the testing platform. The limiting plate is perpendicular to the positioning groove. The inner side of the limiting plate near the chip is flush with the side of the positioning groove. A driving mechanism is installed on the back of the limiting plate away from the chip. The driving mechanism drives the lifting plate and the fixture to move up and down through a connecting rod. One end of the connecting rod is fixedly connected to the lifting plate, and the other end is fixedly connected to the driving mechanism on the back of the limiting plate.
[0007] As a preferred embodiment, the limiting plate has vertically arranged sliding grooves on both sides, and the connecting rod is equipped with a fixing rod at the position opposite the sliding groove. One end of the fixing rod is fixedly connected to the connecting rod, and the other end is fixedly connected to the slider. The slider is slidably disposed in the sliding groove.
[0008] As a preferred embodiment, both the slider and the groove have a "T" shaped cross-section.
[0009] In a preferred embodiment, the driving mechanism includes an electric push rod and a connecting block. The electric push rod is externally fitted with a fixed seat, which is fixed to a limiting plate. The piston rod of the electric push rod is perpendicular to the positioning groove. The driving end of the piston rod is fixedly connected to a connecting block, and the end of the connecting rod that is not connected to the lifting plate is fixedly connected to the connecting block.
[0010] As a preferred embodiment, the clamping groove of the fixture has a "U" shaped structure with its opening facing the chip, the bottom surface of the clamping groove is flush with the bottom surface of the positioning groove, and the distance between the two clamping grooves matches the length of the chip.
[0011] As a preferred method, the clamps are all made of insulating plastic material.
[0012] As a preferred method, the electric actuator is electrically connected to both the controller and the power supply.
[0013] As a preferred embodiment, the width of the clamp and the lifting plate is matched with the width of the groove.
[0014] The second objective of this invention is to provide a chip testing fixture, including the aforementioned chip testing jig.
[0015] The beneficial effects of this utility model are: the utility model has a simple structure, both ends of the chip can be inserted into the fixture, and the driving mechanism can automatically drive the fixture and the chip to descend until they enter the positioning slot of the test bench. The downward pressure of the fixture can directly make the pins on the chip make close contact with the contacts in the positioning slot, eliminating the need for a clamping shell, thus increasing efficiency. Furthermore, it can be automatically lifted afterward, facilitating the disassembly and assembly of the chip. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a schematic diagram of the overall structure of this utility model;
[0018] Figure 2This is a side view of the present invention;
[0019] Figure 3 This is a schematic diagram of the structure of this utility model after the detection table is removed;
[0020] Figure 4 This is a schematic diagram of the structure of the testing station of this utility model.
[0021] The components include: 1. Testing table; 2. Fixture; 3. Lifting plate; 4. Connecting rod; 5. Fixing rod; 6. Sliding block; 7. Slide groove; 8. Limiting plate; 9. Electric push rod; 10. Connecting block; 11. Groove. Detailed Implementation
[0022] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.
[0023] like Figure 1 , Figure 2 , Figure 3 and Figure 4 As shown, a chip testing fixture of this utility model includes a testing platform 1. The bottom of the testing platform 1 is provided with a positioning groove that matches the chip. The positioning groove is provided with contacts corresponding to the pins of the chip. The testing platform 1 is a rectangular enclosure structure. The two width sides of the testing platform are respectively provided with grooves 11. A fixture 2 is movably arranged in each groove 11. The side of the fixture 2 near the chip is provided with a clamping groove. The width of the clamping groove matches the thickness of the chip. A lifting plate 3 is fixedly connected to the outer side of the fixture 2 away from the chip. A limiting plate 8 is installed on one length side of the testing platform. The limiting plate 8 is perpendicular to the positioning groove. The inner side of the limiting plate 8 near the chip is flush with the side of the positioning groove. A driving mechanism is installed on the back of the limiting plate 8 away from the chip. The driving mechanism drives the lifting plate 3 and the fixture 2 to move up and down through a connecting rod 4. One end of the connecting rod 4 is fixedly connected to the lifting plate 3, and the other end is fixedly connected to the driving mechanism on the back of the limiting plate 8.
[0024] Preferably, the limiting plate 8 has vertically arranged sliding grooves 7 on both sides, and the connecting rod 4 is equipped with a fixing rod 5 opposite to the sliding groove 7. One end of the fixing rod 5 is fixedly connected to the connecting rod 4, and the other end is fixedly connected to the slider 6. The slider 6 is slidably disposed in the sliding groove 7. The slider and the sliding groove can provide a guiding function for the telescopic rod of the connecting rod and the electric push rod, so as to ensure the stability of the movement of the connecting rod and the piston rod.
[0025] Preferably, the cross-sections of both the slider 6 and the groove 7 are T-shaped.
[0026] Preferably, the driving mechanism includes an electric push rod 9 and a connecting block 10. The electric push rod 9 is externally fitted with a fixed seat, which is fixed to the limiting plate 8. The piston rod of the electric push rod 9 is perpendicular to the positioning groove. The driving end of the piston rod is fixedly connected to the connecting block 10, and the end of the connecting rod 4 not connected to the lifting plate 3 is fixedly connected to the connecting block 10. Thus, the electric push rod can synchronously drive the connecting rods on both sides and the clamp to move up and down synchronously, ensuring that the clamp remains horizontal at all times.
[0027] Preferably, the clamping groove of the clamp 2 has a "U" shaped structure and the opening faces the chip. The bottom surface of the clamping groove is flush with the bottom surface of the positioning groove. The distance between the two clamping grooves matches the length of the chip, so that the chip can be positioned after insertion, increasing the stability of the chip.
[0028] Preferably, all clamps 2 are made of insulating plastic material, which avoids the possibility of electrical contact between the clamps and the testing table and increases safety.
[0029] Preferably, the electric actuator 9 is electrically connected to both the controller and the power supply, so that the controller can control the extension, retraction, and start / stop of the electric actuator.
[0030] Preferably, the width of the clamp 2 and the lifting plate 3 matches the width of the groove 11, which increases stability and avoids swaying.
[0031] The second objective of this invention is to provide a chip testing fixture, including the aforementioned chip testing jig.
[0032] In use, the electric push rod is activated by the controller, which causes the piston rod of the electric push rod to retract. The movement of the piston rod drives the connecting block and the connecting rod, which in turn drives the lifting plate and the clamp, causing the clamp to move out of the groove and lift up.
[0033] At this point, the chip can be inserted into the clamps on both sides and abut against the limiting plate. The controller then reverses the operation of the electric push rod, causing the piston rod of the electric push rod to extend and push the connecting rod and clamp downward. The movement of the clamp moves the chip, allowing it to enter the positioning slot. The downward pressure of the clamp ensures that the pins on the chip make tight contact with the contacts in the positioning slot, eliminating the need for a clamping shell and ensuring the stability of the test.
[0034] After the test is completed, the piston rod of the electric push rod can retract again, driving the connecting rod and the clamp to rise. The upward movement of the clamp can drive the chip, allowing the chip to be removed from the positioning slot. After the test stage is removed, the chip can be quickly removed from the clamp, facilitating disassembly and assembly.
[0035] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any changes or substitutions conceived without inventive effort should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope defined in the claims.
Claims
1. A chip testing fixture, characterized in that: The device includes a testing platform (1), the bottom of which is provided with a positioning groove that matches the chip. The positioning groove is provided with contacts corresponding to the pins of the chip. The testing platform (1) is a rectangular enclosure structure. The two width sides of the testing platform are respectively provided with grooves (11). A clamp (2) is movably arranged in each groove (11). The clamp (2) is provided with a clamping groove on the side near the chip. The width of the clamping groove matches the thickness of the chip. A lifting plate (3) is fixedly connected to the outer side of the clamp (2) away from the chip. A limiting plate (8) is installed on one length side of the testing platform. The limiting plate (8) is perpendicular to the positioning groove. The inner side of the limiting plate (8) near the chip is flush with the side of the positioning groove. A driving mechanism is installed on the back of the limiting plate (8) away from the chip. The driving mechanism drives the lifting plate (3) and the clamp (2) to move up and down through a connecting rod (4). One end of the connecting rod (4) is fixedly connected to the lifting plate (3), and the other end is fixedly connected to the driving mechanism on the back of the limiting plate (8).
2. The chip testing fixture according to claim 1, characterized in that: The two sides of the limiting plate (8) are vertically provided with sliding grooves (7). The connecting rod (4) is equipped with a fixing rod (5) at the position opposite to the sliding groove (7). One end of the fixing rod (5) is fixedly connected to the connecting rod (4), and the other end is fixedly connected to the slider (6). The slider (6) is slidably disposed in the sliding groove (7).
3. A chip testing fixture according to claim 2, characterized in that: The cross-sections of both the slider (6) and the groove (7) are "T" shaped.
4. A chip testing fixture according to claim 1, characterized in that: The driving mechanism includes an electric push rod (9) and a connecting block (10). The electric push rod (9) is externally fitted with a fixed seat, which is fixed on the limiting plate (8). The piston rod of the electric push rod (9) is perpendicular to the positioning groove. The driving end of the piston rod is fixedly connected to a connecting block (10). The end of the connecting rod (4) that is not connected to the lifting plate (3) is fixedly connected to the connecting block (10).
5. A chip testing fixture according to claim 1, characterized in that: The clamping groove of the fixture (2) has a "U" shaped structure and the opening faces the chip. The bottom surface of the clamping groove is flush with the bottom surface of the positioning groove, and the distance between the two clamping grooves matches the length of the chip.
6. A chip testing fixture according to claim 4, characterized in that: The electric push rod (9) is electrically connected to the controller and the power supply respectively.
7. A chip testing fixture according to claim 1, characterized in that: The width of the clamp (2) and the lifting plate (3) matches the width of the groove (11).
8. A chip testing fixture, characterized in that: Includes the chip testing fixture as described in any one of claims 1-7.