Insulation voltage test equipment for power semiconductor devices
Patent Information
- Application Number
- CN202521415701.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-07
- Publication Date
- 2026-08-18
- Estimated Expiration
- 2035-07-07
AI Technical Summary
利用原有的单面连接的测试设备,对于单面引脚电连接后进行绝缘耐压测试,需要人工将器件取出后重新放置,进行正反两面分别连接后测试,不仅测试效率低,还需要两台不同测试接口的测试设备,也增加了测试设备投资
[0043]本实用新型结构紧凑、合理,操作方便,通过在第一治具组件和第二治具组件之间设置托盘组件,托盘组件上设置可相对于第二治具组件移动的浮动件,用于放置器件,第一治具组件在第一线性驱动机构的驱动下与第二治具组件的相对移动过程中,实现器件的双面连接和分离,从而实现一次放置器件之后即可将器件的双面引脚均与测试设备电连接,提高测试效率,在一台设备上即全面对器件进行测试,采用单向驱动实现两个治具与器件的连接,也便于对原有测试设备的改造。
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Figure CN224651474U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of power semiconductor device testing technology, and in particular to an insulation withstand voltage testing device suitable for power semiconductor devices. Background Technology
[0002] Power semiconductor devices are typically single-sided structures with pins. Test equipment usually uses a single linear drive mechanism to move one of the upper and lower fixtures, so that the fixed power semiconductor device can be electrically connected to one of the test fixtures.
[0003] With the technological advancements in power semiconductor devices, double-sided power semiconductor devices have emerged. Using existing single-sided connection testing equipment, insulation withstand voltage testing after single-sided pin electrical connection requires manual removal and repositioning of the device for separate connection and testing on both sides. This is not only inefficient but also necessitates two testing devices with different test interfaces, increasing investment in testing equipment. Utility Model Content
[0004] In response to the shortcomings of the existing production technology, the applicant provides an insulation withstand voltage testing device suitable for power semiconductor devices, which enables the electrical connection of both sides of the device to the testing device after the device is placed once, thereby improving testing efficiency and allowing for comprehensive testing of the device on a single device.
[0005] The technical solution adopted in this utility model is as follows:
[0006] An insulation withstand voltage testing device suitable for power semiconductor devices, comprising:
[0007] A first linear drive mechanism includes a moving end that moves along a first linear direction;
[0008] The first fixture assembly includes a first connector mounted on the mobile terminal;
[0009] Tray assembly, including:
[0010] Support components
[0011] A floating component is used to place a device. The floating component has a through hole. The support component is elastically connected to the floating component, so that the floating component can move relative to the support component along the first linear direction. The device is adjacent to the first connector.
[0012] The second fixture assembly includes a second connector, which is fixedly disposed relative to the support member, and the device is located between the first connector and the second connector;
[0013] The mobile end moves toward the device and applies pressure to the device and the floating component, so that the first connector connects to the device while the device and the floating component move toward the second connector. After the second connector connects to the device, the test circuit is connected. The connection structure between the second connector and the device is located in the through hole. After the mobile end moves in the opposite direction, the second connector and the first connector separate from the device in sequence.
[0014] As a further improvement to the above technical solution:
[0015] The tray assembly also includes:
[0016] A first guide shaft is fixedly connected to one of the support member and the floating member, and slidably connected to the other one. The axial direction of the first guide shaft is consistent with the first straight line direction.
[0017] A first elastic element is disposed between the support element and the floating element, and both ends of the first elastic element are respectively connected to the support element and the floating element;
[0018] The first limiting member is fixed on the first guide shaft. The first limiting member is used to limit the maximum distance between the support member and the floating member, and to keep the first elastic member in a compressed state.
[0019] The first fixture assembly also includes:
[0020] The first fixing plate is fixedly connected to the mobile end;
[0021] Multiple second guide shafts are arranged axially with the first straight line direction. One end is fixedly connected to the substrate of the first connector, and the other end is slidably connected to the first fixing plate. The second guide shafts are evenly distributed around the device.
[0022] The second elastic element is located between the first fixing plate and the base plate of the first connector, and its two ends are respectively connected to the first fixing plate and the first connector.
[0023] The second limiting member is fixedly installed at the end of the second guide shaft, limiting the maximum distance between the first fixing plate and the first connector, and keeping the second elastic member in a compressed state;
[0024] A limiting post is fixedly installed on the side of the first connector facing the floating component. When the limiting post contacts the floating component, the first connector is connected to the device.
[0025] The first fixture assembly also includes a plurality of pressure shaft assemblies evenly distributed around the device. One end of each pressure shaft assembly is connected to the first fixing plate, and the other end of each pressure shaft assembly is a pressure end located on the side of the first connector facing the device.
[0026] Wherein, after the first connector is connected to the device, the moving end moves toward the floating component, and the ballast end drives the floating component to move after contacting the floating component or device, so that the device is connected to the second connector.
[0027] A single pressure bearing assembly includes:
[0028] The third guide shaft has an axial direction consistent with the first straight line direction. One end of the third guide shaft is slidably connected to the first fixed plate, and the other end is the ballast end.
[0029] The third limiting member is located at one end of the third guide shaft;
[0030] The fourth limiting member is located in the middle of the third guide shaft;
[0031] The third elastic element is located between the first fixed plate and the fourth limiting element, with its two ends connected to the first fixed plate and the fourth limiting element respectively. The third limiting element limits the maximum distance between the ballast end and the first fixed plate and keeps the third elastic element in a compressed state.
[0032] During the process of the moving end continuing to move toward the floating component after the ballast end comes into contact with the floating component, the third elastic element is further compressed until the device is connected to the second connector.
[0033] The first fixture assembly further includes a pair of first slide rails, the outer rail of the first slide rails is fixedly installed on the movable end, a first bracket is fixedly installed on the outer rail of the first slide rails, the first bracket is used to support the first fixed plate, the first fixed plate is provided with a first positioning hole, and a first positioning pin corresponding to the first positioning hole is installed on the movable end.
[0034] When the inner and outer rails of the first slide rail intersect, the first fixed plate moves to the outside of the moving end along a direction perpendicular to the first straight line. When the inner and outer rails of the first slide rail overlap, a slot matching the first fixed plate is formed between the first bracket and the moving end. The slot is used to limit the position of the first fixed plate along the first straight line. The first positioning hole is inserted into the first positioning pin to limit the position of the first fixed plate along a direction perpendicular to the first straight line.
[0035] The second fixture assembly also includes a second fixing plate connected to the second connector, and the second fixing plate is provided with a positioning groove;
[0036] It also includes a pair of second slide rails, the outer rail of the second slide rails being fixedly connected to the frame of the test equipment, and a second bracket being fixedly installed on the inner rail of the second slide rails. The second brackets are used to support the second fixing plate, and the second brackets are provided with positioning blocks corresponding to the positioning grooves for positioning and placing the second fixing plate.
[0037] A positioning support block is fixedly provided on the frame between the outer rails of the two second slide rails. The positioning support block is provided with a second positioning hole, and a second positioning pin is installed on the second fixed plate.
[0038] When the inner and outer rails of the second slide rail intersect, the second fixing plate moves to the outside of the support member along a direction perpendicular to the first straight line. When the inner and outer rails of the second slide rail coincide, the second positioning hole and the second positioning pin are inserted to restrict the position of the second fixing plate along a direction perpendicular to the first straight line.
[0039] The support member is slidably connected to the frame of the testing equipment, and further includes a second linear drive mechanism. The second linear drive mechanism is connected to the support member and is used to drive the support member to move along a second linear direction, which is perpendicular to the first linear direction.
[0040] It also includes attitude detection sensors for detecting the attitude of devices placed on floating components.
[0041] The floating component includes a floating support plate that is elastically connected to the support component. An insulating plate is fixedly installed on the floating support plate. The insulating plate is used to place the device. The through hole passes through both the support component and the insulating plate.
[0042] The beneficial effects of this utility model are as follows:
[0043] This utility model has a compact and reasonable structure and is easy to operate. By setting a tray assembly between the first fixture assembly and the second fixture assembly, and setting a floating component on the tray assembly that can move relative to the second fixture assembly for placing the device, the device can be connected and separated on both sides during the relative movement between the first fixture assembly and the second fixture assembly under the drive of the first linear drive mechanism. This allows the device to be electrically connected to the test equipment on both sides after placing the device once, improving testing efficiency. The device can be fully tested on a single device. The unidirectional drive is used to connect the two fixtures and the device, which also facilitates the modification of the original test equipment.
[0044] This utility model also has the following advantages:
[0045] (1) During the movement of the mobile end, after the first connector comes into contact with the device, the displacement of the mobile end is converted into pressure on the first connector through the second elastic element, ensuring that the force on the first connector is uniform and that the first connector and the device can be well connected. The first connector and the floating part are limited by the limiting post, which protects the device and transmits the driving force of the mobile end to the floating part to drive the floating part to move.
[0046] (2) A pressure shaft assembly that directly acts on the floating part or device is set on the first fixture assembly to reduce the load applied to the first connector and ensure the stability of the test circuit connection structure of the test equipment.
[0047] (3) During the movement of the mobile end, the displacement of the mobile end is converted into pressure on the floating part through the third elastic element, so as to ensure that the floating part is subjected to uniform force.
[0048] (4) The first fixed plate is telescopically connected to the mobile end by using the first slide rail, and the first fixed plate is positioned by the structure of the slot and the first positioning pin, which facilitates the replacement and positioning installation of the first connector. At the same time, the second fixed plate is relatively fixedly connected to the telescopic support by the second slide rail, and the second fixed plate is fixed by the positioning slot and the positioning pin, which improves the changeover efficiency of the test equipment. Attached Figure Description
[0049] Figure 1 This is a schematic diagram of the structure of this utility model.
[0050] Figure 2 for Figure 1 Enlarged view of a portion of point A in the middle.
[0051] Figure 3 This is a schematic diagram of the structure of the first fixture assembly and the tray assembly of this utility model.
[0052] Figure 4 for Figure 3 Enlarged view of section B in the middle.
[0053] Figure 5 This is a side view of the tray assembly of this utility model.
[0054] Figure 6 This is a side view of the present invention.
[0055] Figure 7 This is a perspective view (bottom view) of the present invention.
[0056] Figure 8 This is a perspective view of the present invention (excluding the first connector and the second connector).
[0057] Figure 9This is a schematic diagram of the first fixture component of this utility model (replaceable part).
[0058] Figure 10 This is a perspective view of the present invention (excluding the first connector and the second connector, another perspective).
[0059] Figure 11 This is a schematic diagram of the second fixture component of this utility model (replaceable part).
[0060] in:
[0061] 1. First linear drive mechanism; 11. First linear driver; 12. Moving end;
[0062] 2. First fixture assembly;
[0063] 21. First connector; 210. Clearance hole;
[0064] 22. First fixing plate; 220. First positioning hole;
[0065] 231. Second limiting element; 232. Second guide shaft; 233. Second elastic element;
[0066] 24. Limiting post;
[0067] 25. Pressure shaft assembly; 251. Third limiting component; 252. Third guide shaft; 253. Third elastic component; 254. Fourth limiting component;
[0068] 26. Spring hook and loop fastener;
[0069] 27. First bracket; 28. First slide rail; 29. First locating pin;
[0070] 3. Components;
[0071] 4. Second fixture assembly; 41. Second connector; 42. Second slide rail; 43. Second bracket; 44. Positioning block; 45. Positioning groove; 46. Second fixing plate; 47. Second positioning pin; 48. Support block;
[0072] 5. Pallet assembly; 51. Support member; 510. Channel; 52. Floating member; 520. Through hole; 521. Insulating plate; 522. Floating support plate; 53. First elastic member; 54. First guide shaft; 55. First limiting member;
[0073] 6. Second linear drive mechanism; 7. Frame; 8. Attitude detection sensor. Detailed Implementation
[0074] The specific embodiments of this utility model are described below with reference to the accompanying drawings.
[0075] like Figures 1-3 As shown, one embodiment of the present invention provides an insulation withstand voltage test device suitable for power semiconductor devices, including a first linear drive mechanism 1, a first fixture assembly 2, a tray assembly 5, and a second fixture assembly 4.
[0076] The first linear drive mechanism 1 includes a moving end 12 that moves along a first linear direction;
[0077] The first fixture assembly 2 includes a first connector 21 installed on the mobile end 12;
[0078] The tray assembly 5 includes a support 51 and a floating member 52. The floating member 52 is used to place the device 3. The floating member 52 is provided with a through hole 520. The support 51 and the floating member 52 are elastically connected, so that the floating member 52 can move relative to the support 51 along a first linear direction. The device 3 is adjacent to the first connector 21.
[0079] The second fixture assembly 4 includes a second connector 41, which is fixedly disposed relative to the support member 51, and the device 3 is located between the first connector 21 and the second connector 41.
[0080] The movable end 12 moves toward the device 3 and applies pressure to the device 3 and the floating part 52, so that the first connector 21 connects to the device 3 at the same time, the device 3 and the floating part 52 move toward the second connector 41. After the second connector 41 connects to the device 3, the test circuit is connected. The connection structure between the second connector 41 and the device 3 is located in the through hole 520. After the movable end 12 moves in the opposite direction, the second connector 41 and the first connector 21 separate from the device 3 in sequence.
[0081] Specifically, such as Figure 1 As shown, the first linear drive mechanism 1 includes a first linear driver 11, and a moving end 12 slidably mounted on the frame 7 of the testing equipment via a guide structure. The moving end 12 is plate-shaped, and the driving end of the first linear driver 11 is fixedly connected to the moving end 12. Typically, the first linear direction is vertical. Figure 1 In the Z direction, the first fixture assembly 2 is located above the second fixture assembly 4; the first connector 21 and the second connector 41 are provided with interfaces for connecting to the device 3, and the second connector 41 and the first connector 21 are connected to the device 3 from two sides respectively.
[0082] A tray assembly 5 is provided between the first fixture assembly 2 and the second fixture assembly 4. A floating component 52 that can move relative to the second fixture assembly 4 is provided on the tray assembly 5 for placing the device 3. During the relative movement between the first fixture assembly 2 and the second fixture assembly 4 under the drive of the first linear drive mechanism 1, the double-sided connection and separation of the device 3 are realized. This allows the device 3 to be electrically connected to the test equipment after placing it once, thereby improving the test efficiency. The device 3 can be fully tested on one device. The unidirectional drive is used to connect the two fixtures to the device 3, which also facilitates the modification of the original test equipment.
[0083] In this embodiment, as Figure 3 As shown, the tray assembly 5 also includes a first guide shaft 54, a first elastic element 53, and a first limiting element 55.
[0084] The first guide shaft 54 is fixedly connected to one of the support member 51 and the floating member 52, and slidably connected to the other one. The axial direction of the first guide shaft 54 is consistent with the first straight line direction.
[0085] The first elastic member 53 is disposed between the support member 51 and the floating member 52, and the two ends of the first elastic member 53 are respectively connected to the support member 51 and the floating member 52.
[0086] The first limiting member 55 is fixed on the first guide shaft 54. The first limiting member 55 is used to limit the maximum distance between the support member 51 and the floating member 52, and to keep the first elastic member 53 in a compressed state.
[0087] Specifically, the first guide shaft 54 is fixedly connected to the floating member 52, and the first guide shaft 54 is slidably connected to the support member 51. The first limiting member 55 is a protrusion installed on the first guide shaft 54. When the first limiting member 55 contacts the support member 51, the distance between the support member 51 and the floating member 52 is at its maximum. The first elastic member 53 is a spring, which is sleeved on the first guide shaft 54. The sliding direction of the first guide shaft 54 is consistent with the axial direction.
[0088] In one exemplary embodiment, such as Figure 4 As shown, the first fixture assembly 2 also includes a first fixing plate 22, a plurality of second guide shafts 232, a second elastic element 233, a second limiting element 231, and a limiting post 24.
[0089] The first fixed plate 22 is fixedly connected to the mobile end 12;
[0090] Multiple second guide shafts 232 are aligned with the first straight line direction. One end is fixedly connected to the substrate of the first connector 21, and the other end is slidably connected to the first fixing plate 22. The second guide shafts 232 are evenly distributed around the device 3.
[0091] The second elastic member 233 is located between the base plate of the first fixing plate 22 and the first connector 21, and its two ends are respectively connected to the first fixing plate 22 and the first connector 21;
[0092] The second limiting member 231 is fixedly installed at the end of the second guide shaft 232, limiting the maximum distance between the first fixing plate 22 and the first connector 21, and keeping the second elastic member 233 in a compressed state.
[0093] The limiting post 24 is fixedly installed on the side of the first connector 21 facing the floating member 52. When the limiting post 24 contacts the floating member 52, the first connector 21 is connected to the device 3.
[0094] Specifically, the second guide shaft 232 is evenly distributed around the device 3 to balance the force applied by the first connector 21 to the device 3. The second elastic element 233 is a spring and is sleeved on the second guide shaft 232. The first fixing plate 22 is provided with a sliding groove, and the second guide shaft 232 is slidably connected to the sliding groove. The sliding direction is along the axial direction. The second limiting element 231 is a block structure with a size larger than the second guide shaft 232. The number and installation position of the limiting posts 24 are the same as those of the second guide shaft 232. Specifically, the limiting posts 24 can be detachably installed on the base plate of the first connector 21.
[0095] During the movement of the mobile end 12, after the first connector 21 contacts the device 3, the displacement of the mobile end 12 is converted into pressure on the first connector 21 by the second elastic element 233, ensuring that the force on the first connector 21 is uniform and that the first connector 21 and the device 3 can be well connected. The first connector 21 and the floating element 52 are limited by the limiting post 24, which protects the device 3 and transmits the driving force of the mobile end 12 to the floating element 52 to drive the floating element 52 to move.
[0096] In another exemplary embodiment, such as Figures 3-4 As shown, the first fixture assembly 2 also includes a plurality of pressure shaft assemblies 25 evenly distributed around the device 3. One end of the pressure shaft assembly 25 is connected to the first fixing plate 22, and the other end of the pressure shaft assembly 25 is the pressure end, which is located on the side of the first connector 21 facing the device 3.
[0097] In this process, after the first connector 21 is connected to the device 3, the moving end 12 moves toward the floating part 52. After the ballast end comes into contact with the floating part 52 or the device 3, it drives the floating part 52 to move, so that the device 3 is connected to the second connector 41.
[0098] Specifically, a clearance hole 210 is provided on the first connector 21 to avoid the pressure shaft assembly 25. The number and position of the pressure shaft assemblies 25 are determined according to the specific pressure requirements, mainly to ensure that the force applied by the pressure shaft assembly 25 does not deviate from the center of the device 3.
[0099] A pressure shaft assembly 25 is provided on the first fixture assembly 2 to directly act on the floating part 52 or the device 3, thereby reducing the load applied to the first connector 21 and ensuring the stability of the test circuit connection structure of the test equipment.
[0100] For example, such as Figure 4 As shown, a single pressure shaft assembly 25 includes a third guide shaft 252, a third limiting member 251, a fourth limiting member 254, and a third elastic member 253.
[0101] The third guide shaft 252 is aligned with the first straight line direction. One end of the third guide shaft 252 is slidably connected to the first fixed plate 22, and the other end is the ballast end.
[0102] The third limiting member 251 is located at one end of the third guide shaft 252;
[0103] The fourth limiting member 254 is located in the middle of the third guide shaft 252;
[0104] The third elastic member 253 is located between the first fixed plate 22 and the fourth limiting member 254. Its two ends are connected to the first fixed plate 22 and the fourth limiting member 254 respectively. The third limiting member 251 limits the maximum distance between the ballast end and the first fixed plate 22 and puts the third elastic member 253 in a compressed state.
[0105] During the process of the moving end 12 continuing to move toward the floating part 52 after the ballast end comes into contact with the floating part 52 or the device 3, the third elastic part 253 is further compressed until the device 3 is connected to the second connector 41.
[0106] Specifically, the third elastic element 253 is a spring, which is sleeved on the third guide shaft 252; the first fixed plate 22 is provided with a sliding groove, the second guide shaft 232 is slidably connected to the sliding groove, and the third limiting element 251 and the fourth limiting element 254 are both block structures with a size larger than the second guide shaft 232.
[0107] During the movement of the mobile end 12, the displacement of the mobile end 12 is converted into pressure on the floating part 52 by the third elastic element 253, so as to ensure that the floating part 52 is subjected to uniform force.
[0108] For example, when the device 3 being tested has a pressure requirement, the ballast end contacts the device 3 and applies pressure directly to the device 3 through the first fixing plate 22; when the device 3 being tested does not have a pressure requirement, the ballast end contacts the floating member 52, so that the pressure acts directly on the floating member 52, reducing the load on the first connector 21.
[0109] In one exemplary embodiment, such as Figures 6-11As shown, in order to facilitate the replacement of the first connector 21 and the second connector 41 for different devices 3, the first fixture assembly 2 in this embodiment also includes a pair of first slide rails 28. The outer rail of the first slide rail 28 is fixedly installed on the moving end 12. A first bracket 27 is fixedly installed on the outer rail of the first slide rail 28. The first bracket 27 is used to support the first fixing plate 22. The first fixing plate 22 is provided with a first positioning hole 220. A first positioning pin 29 corresponding to the first positioning hole 220 is installed on the moving end 12.
[0110] When the inner and outer rails of the first slide rail 28 intersect, the first fixed plate 22 moves to the outside of the moving end 12 along a direction perpendicular to the first straight line. When the inner and outer rails of the first slide rail 28 overlap, a slot matching the first fixed plate 22 is formed between the first bracket 27 and the moving end 12. The slot is used to limit the position of the first fixed plate 22 along the first straight line. The first positioning hole 220 is inserted into the first positioning pin 29 to limit the position of the first fixed plate 22 along the direction perpendicular to the first straight line.
[0111] Specifically, the first bracket 27 is a C-shaped frame structure, used to avoid the first connector 21 while limiting the first fixed plate 22. The first slide rail 28 has a locking function. In order to ensure the reliability of the connection between the first fixed plate 22 and the moving end 12, a spring latch 26 is installed on the moving end 12, and a spring latch 26 is installed on the first fixed plate 22. After the inner rail and outer rail of the first slide rail 28 overlap, the latches are engaged, further fixing the first fixed plate 22 and the moving end 12. The first positioning pin 29 is a plug-in indexing pin.
[0112] The first fixture assembly 2 adopts a slide rail mounting and fixing method. After unlocking the spring latch 26 and the first slide rail 28, and pulling out the first positioning pin 29, the first fixing plate 22 can be directly pulled out for disassembly and replacement of the first connector 21. After the replacement operation is completed, the first fixing plate 22 is positioned and installed, the first slide rail 28 is locked again, and the first positioning pin 29 and the first positioning hole 220 are inserted. This allows for quick fixture replacement without complicated steps such as screw disassembly and installation, greatly saving time.
[0113] In the previous exemplary embodiment, such as Figures 6-11 As shown, the second fixture assembly 4 also includes a second fixing plate 46 connected to the second connector 41, and the second fixing plate 46 is provided with a positioning groove 45;
[0114] It also includes a pair of second slide rails 42. The outer rail of the second slide rail 42 is fixedly connected to the frame 7 of the test equipment. The inner rail of the second slide rail 42 is fixedly installed with a second bracket 43. The second bracket 43 is used to support the second fixed plate 46. The second bracket 43 is provided with a positioning block 44 corresponding to the positioning groove 45 for positioning and placing the second fixed plate 46.
[0115] A positioning support block 48 is fixedly provided on the frame 7 located between the outer rails of the two second slide rails 42. The positioning support block 48 is provided with a second positioning hole, and a second positioning pin 47 is installed on the second fixed plate 46.
[0116] When the inner and outer rails of the second slide rail 42 intersect, the second fixing plate 46 moves to the outside of the support member 51 along a direction perpendicular to the first straight line. When the inner and outer rails of the second slide rail 42 coincide, the second positioning hole and the second positioning pin 47 are inserted to restrict the position of the second fixing plate 46 along a direction perpendicular to the first straight line.
[0117] Specifically, the second slide rail 42 has a locking function; the support member 51 is plate-shaped, and has a channel 510 for avoiding the movement of the second connector 41. The support member 51 also has a channel 510 corresponding to the second connector 41, used to avoid the second connector 41 from intersecting with the second fixing plate 46, allowing the second slide rail 42 to be installed below the support member 51, reducing the overall height of the equipment; the second positioning pin 47 is a plug-in indexing pin; the inner rails of the first slide rail 28 and the second slide rail 42 move in the same direction, such as... Figure 6 As shown.
[0118] In addition, detection sensors, such as vision sensors or proximity switches, are set on the first fixture assembly 2 and the second fixture assembly 4 respectively to detect whether the first fixing plate 22 and the second fixing plate 46 have been replaced and installed in place, thus avoiding problems such as incorrect fixture replacement or fixture not being installed in place.
[0119] The first fixed plate 22 is retractably connected to the mobile end 12 by using the first slide rail 28, and the first fixed plate 22 is positioned by the structure of the slot and the first positioning pin 29, which facilitates the replacement and positioning installation of the first connector 21. At the same time, the second fixed plate 46 is relatively fixedly connected to the retractable support member 51 by using the second slide rail 42, and the second fixed plate 46 is fixed by the positioning groove and the positioning pin, which improves the changeover efficiency of the test equipment.
[0120] In another exemplary embodiment, such as Figures 1-2 , Figure 6 As shown, the support member 51 is slidably connected to the frame 7 of the test equipment, and also includes a second linear drive mechanism 6. The second linear drive mechanism 6 is connected to the support member 51 and is used to drive the support member 51 to move along a second linear direction, which is perpendicular to the first linear direction.
[0121] Specifically, the second linear drive mechanism 6 is a cylinder or a linear module, and the second linear direction (e.g.) Figure 1The X-direction of the inner rail is consistent with the pulling direction of the first slide rail 28 and the second slide rail 42. The direction of the support 51 moving out is opposite to the direction of the inner rail pulling out. After the second linear drive mechanism 6 moves the support 51 out from between the first fixture assembly 2 and the second fixture assembly 4, the device 3 is placed, which facilitates manual feeding operation.
[0122] Furthermore, such as Figure 1 , Figure 6 As shown, it also includes an attitude detection sensor 8, used to detect the attitude of the device 3 placed on the floating part 52.
[0123] The attitude detection sensor 8 can be a high-precision laser displacement sensor, which is connected to the PLC of the test equipment. The attitude detection sensor 8 detects whether the device 3 is tilted or tilted, thus ensuring the safety of the device 3 test.
[0124] Furthermore, such as Figure 3 , Figure 5 As shown, the floating component 52 includes a floating support plate 522 that is elastically connected to the support component 51. An insulating plate 521 is fixedly installed on the floating support plate 522. The insulating plate 521 is used to place the device 3. The through hole 520 passes through both the support component 51 and the insulating plate 521.
[0125] Specifically, the insulating board 521 is an FR4 epoxy board, which has good heat resistance, high mechanical strength, high insulation resistance, and high dielectric strength, providing a guarantee for the insulation withstand voltage test and greatly reducing interference to the test of device 3; the insulating board 521 is provided with a positioning structure that cooperates with device 3.
[0126] The above description is an explanation of the present utility model and not a limitation thereof. The scope of the present utility model is defined by the claims. Within the protection scope of the present utility model, any form of modification may be made.
Claims
1. An insulation withstand voltage testing device suitable for power semiconductor devices, characterized in that: include: The first linear drive mechanism (1) includes a moving end (12) that moves along a first linear direction; The first fixture assembly (2) includes a first connector (21) mounted on the mobile end (12); Tray assembly (5), including: Support component (51), A floating component (52) is used to place the device (3). The floating component (52) has a through hole (520). The support component (51) is elastically connected to the floating component (52), so that the floating component (52) can move relative to the support component (51) along the first straight line direction. The device (3) is adjacent to the first connector (21). The second fixture assembly (4) includes a second connector (41) which is fixedly disposed relative to the support member (51), and the device (3) is located between the first connector (21) and the second connector (41); The movable end (12) moves toward the device (3) and applies pressure to the device (3) and the floating part (52), so that the first connector (21) connects to the device (3) at the same time, the device (3) and the floating part (52) move toward the second connector (41). After the second connector (41) connects to the device (3), the test circuit is connected. The connection structure between the second connector (41) and the device (3) is located in the through hole (520). After the movable end (12) moves in the opposite direction, the second connector (41) and the first connector (21) separate from the device (3) in sequence.
2. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 1, characterized in that: The tray assembly (5) also includes: A first guide shaft (54) is fixedly connected to one of the support member (51) and the floating member (52), and slidably connected to the other one. The axial direction of the first guide shaft (54) is consistent with the first straight line direction. A first elastic element (53) is disposed between the support element (51) and the floating element (52), and the two ends of the first elastic element (53) are respectively connected to the support element (51) and the floating element (52); The first limiting member (55) is fixed on the first guide shaft (54). The first limiting member (55) is used to limit the maximum distance between the support member (51) and the floating member (52) and to keep the first elastic member (53) in a compressed state.
3. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 1, characterized in that: The first fixture assembly (2) further includes: The first fixed plate (22) is fixedly connected to the mobile end (12); Multiple second guide shafts (232) are axially aligned with the first straight line direction. One end is fixedly connected to the substrate of the first connector (21), and the other end is slidably connected to the first fixing plate (22). The second guide shafts (232) are evenly distributed around the device (3). The second elastic element (233) is located between the first fixing plate (22) and the base plate of the first connector (21), and its two ends are respectively connected to the first fixing plate (22) and the first connector (21); The second limiting member (231) is fixedly installed at the end of the second guide shaft (232), limiting the maximum distance between the first fixing plate (22) and the first connector (21), and keeping the second elastic member (233) in a compressed state; A limiting post (24) is fixedly installed on the side of the first connector (21) facing the floating member (52). When the limiting post (24) contacts the floating member (52), the first connector (21) is connected to the device (3).
4. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 3, characterized in that: The first fixture assembly (2) also includes a plurality of pressure shaft assemblies (25) evenly distributed around the device (3). One end of the pressure shaft assembly (25) is connected to the first fixing plate (22), and the other end of the pressure shaft assembly (25) is a pressure end. The pressure end is located on the side of the first connector (21) facing the device (3). Wherein, after the first connector (21) is connected to the device (3), the moving end (12) moves toward the floating part (52), and the ballast end drives the floating part (52) to move after contacting the floating part (52) or the device (3), so that the device (3) is connected to the second connector (41).
5. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 4, characterized in that: A single pressure shaft assembly (25) includes: The third guide shaft (252) is axially aligned with the first straight line direction. One end of the third guide shaft (252) is slidably connected to the first fixed plate (22), and the other end is the ballast end. The third limiting member (251) is located at one end of the third guide shaft (252); The fourth limiting member (254) is located in the middle of the third guide shaft (252); The third elastic element (253) is located between the first fixed plate (22) and the fourth limiting element (254), with its two ends connected to the first fixed plate (22) and the fourth limiting element (254) respectively. The third limiting element (251) limits the maximum distance between the ballast end and the first fixed plate (22) and puts the third elastic element (253) in a compressed state. During the process of the moving end (12) continuing to move toward the floating part (52) after the ballast end comes into contact with the floating part (52) or the device (3), the third elastic element (253) is further compressed until the device (3) is connected to the second connector (41).
6. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 3, characterized in that: The first fixture assembly (2) further includes a pair of first slide rails (28), the outer rail of the first slide rail (28) is fixedly installed on the moving end (12), a first bracket (27) is fixedly installed on the outer rail of the first slide rail (28), the first bracket (27) is used to support the first fixing plate (22), the first fixing plate (22) is provided with a first positioning hole (220), and the moving end (12) is provided with a first positioning pin (29) corresponding to the first positioning hole (220); When the inner rail and outer rail of the first slide rail (28) intersect, the first fixing plate (22) moves to the outside of the moving end (12) along a direction perpendicular to the first straight line. When the inner rail and outer rail of the first slide rail (28) overlap, a slot matching the first fixing plate (22) is formed between the first bracket (27) and the moving end (12). The slot is used to restrict the position of the first fixing plate (22) along the first straight line. The first positioning hole (220) is inserted into the first positioning pin (29) to restrict the position of the first fixing plate (22) along a direction perpendicular to the first straight line.
7. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 1, characterized in that: The second fixture assembly (4) further includes a second fixing plate (46) connected to the second connector (41), and the second fixing plate (46) is provided with a positioning groove (45); It also includes a pair of second slide rails (42), the outer rail of the second slide rail (42) is fixedly connected to the frame (7) of the test equipment, and a second bracket (43) is fixedly installed on the inner rail of the second slide rail (42). The second bracket (43) is used to support the second fixing plate (46). The second bracket (43) is provided with a positioning block (44) corresponding to the positioning groove (45) for positioning and placing the second fixing plate (46). A positioning support block (48) is fixedly provided on the frame (7) located between the outer rails of the two second slide rails (42). The positioning support block (48) is provided with a second positioning hole, and a second positioning pin (47) is installed on the second fixing plate (46). When the inner and outer rails of the second slide rail (42) intersect, the second fixing plate (46) moves to the outside of the support member (51) along a direction perpendicular to the first straight line. When the inner and outer rails of the second slide rail (42) coincide, the second positioning hole and the second positioning pin (47) are inserted to restrict the position of the second fixing plate (46) along the direction perpendicular to the first straight line.
8. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 1, characterized in that: The support member (51) is slidably connected to the frame (7) of the test equipment, and also includes a second linear drive mechanism (6). The second linear drive mechanism (6) is connected to the support member (51) to drive the support member (51) to move along a second linear direction, which is perpendicular to the first linear direction.
9. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 8, characterized in that: It also includes an attitude detection sensor (8) for detecting the attitude of the device (3) placed on the floating part (52).
10. The insulation withstand voltage testing equipment for power semiconductor devices as described in claim 1, characterized in that: The floating component (52) includes a floating support plate (522) elastically connected to the support component (51). An insulating plate (521) is fixedly installed on the floating support plate (522). The insulating plate (521) is used to place the device (3). The through hole (520) passes through both the support component (51) and the insulating plate (521).