A multi-chip parallel test carrier board

Abstract

The utility model discloses a kind of multi-chip parallel test with carrier plate, specifically related to chip testing field, including the carrier plate with air cavity being internally provided, the carrier plate upper surface is provided with several recessed test slots, test slot inside is provided with the chip support of lifting activity, chip support bottom is connected with piston rod, piston rod is extended to the inside of air cavity and is penetrated in test slot bottom, several pneumatic mechanism corresponding to test slot one to one is installed in air cavity inside, pneumatic mechanism is connected with the piston rod of penetration test slot, the carrier plate outer wall is installed with the air pipe of communication with air cavity. The utility model is through multiple test slots to realize multi-chip parallel test to improve efficiency, pneumatic drive is combined with reset spring to make chip support lift smoothly, rubber washer and gap design avoid chip hard contact to protect chip, air pressure sensor guarantees lifting accurate control, light supplement lamp bead and reflector optimize test observation environment, overall structure is reliable and convenient to operate.

Description

Technical Field

[0001] This utility model relates to the field of chip testing, and more specifically, to a carrier board for multi-chip parallel testing. Background Technology

[0002] In the field of multi-chip testing, efficiency in batch testing and chip protection are core requirements. Existing test carriers have significant limitations: most can only test a small number of chips at a time, making it difficult to achieve parallel operation of multiple chips and resulting in low testing efficiency; when placing and positioning chips, there is a lack of effective buffer protection structures, which can easily cause damage to contacts and pins due to hard contact with the carrier; therefore, there is an urgent need for a carrier for multi-chip parallel testing that can solve the above problems. Utility Model Content

[0003] To solve the above-mentioned technical problems, this utility model provides a carrier board for multi-chip parallel testing, including a carrier board with an internal air cavity. The upper surface of the carrier board has several recessed test slots. A chip support that can be raised and lowered is arranged inside the test slot. A piston rod is connected to the bottom of the chip support. The piston rod passes through the bottom of the test slot and extends into the air cavity. Several pneumatic mechanisms corresponding to the test slots are installed inside the air cavity. The pneumatic mechanisms are connected to the piston rod that passes through the test slot. An air pipe communicating with the air cavity is installed on the outer wall of the carrier board. By adjusting the air pressure change in the air cavity, the pneumatic mechanisms are raised and lowered, which drives the piston rod and the chip support to move up and down in the test slot.

[0004] In a preferred embodiment, the upper surface of the chip holder is provided with a recessed work station groove, and the lower surface of the chip holder is fitted with a ring-shaped rubber gasket.

[0005] In a preferred embodiment, a through channel is provided at the bottom of the test slot, through which the piston rod extends into the interior of the air chamber, and the connection between the piston rod and the chip holder is located inside the rubber gasket.

[0006] In a preferred embodiment, the pneumatic mechanism includes a piston sleeve located inside the air chamber. The piston sleeves of several pneumatic mechanisms are respectively located directly below the test slot. The top end of the piston sleeve is fixed to the top of the inner cavity of the air chamber, and a gap is left between the bottom end of the piston sleeve and the bottom of the inner cavity of the air chamber. A movable rubber piston block is attached to the inner wall of the piston sleeve.

[0007] In a preferred embodiment, the bottom end of the piston rod is fixedly connected to the top of the rubber piston block, and a return spring is connected to the bottom end of the rubber piston block. The bottom end of the return spring is fixed to the bottom of the air chamber.

[0008] In a preferred embodiment, a pressure sensor is installed inside the air cavity.

[0009] In a preferred embodiment, supplementary lighting beads are installed on the inner wall of the test tank, and a ring of reflective sheets is also attached to the inner wall of the test tank.

[0010] The technical effects and advantages of this utility model are as follows:

[0011] This device enables parallel testing of multiple chips through multiple test slots to improve efficiency. Pneumatic drive combined with a reset spring ensures smooth lifting and lowering of the chip holder. Rubber gaskets and gap design prevent hard contact between the chips to protect them. A pressure sensor ensures precise lifting and lowering control. Supplemental lighting and reflectors optimize the testing and observation environment. The overall structure is reliable and easy to operate. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0013] Figure 2 This is a schematic diagram of the internal structure of the present invention;

[0014] Figure 3 This is a schematic diagram of the interior of this utility model from another angle.

[0015] Explanation of reference numerals in the attached diagram: 1 Carrier board, 2 Test slot, 3 Chip holder, 4 Piston rod, 5 Air pipe, 6 Station slot, 7 Rubber gasket, 8 Channel, 9 Piston sleeve, 10 Rubber piston block, 11 Reset spring, 12 Air pressure sensor, 13 Fill light bead, 14 Reflector. Detailed Implementation

[0016] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments. The embodiments of the present invention are given for illustrative and descriptive purposes only, and are not intended to be exhaustive or to limit the present invention to the disclosed forms. Many modifications and variations will be apparent to those skilled in the art. The embodiments were chosen and described to better illustrate the principles and practical applications of the present invention, and to enable those skilled in the art to understand the present invention and design various embodiments with various modifications suitable for a particular purpose.

[0017] like Figure 1-3 The carrier board shown includes a carrier board with an internal air cavity. The upper surface of the carrier board has several recessed test slots. A chip support that can be raised and lowered is set inside the test slot. A piston rod is connected to the bottom of the chip support. The piston rod extends through the bottom of the test slot and into the air cavity. Several pneumatic mechanisms corresponding to the test slots are installed inside the air cavity. The pneumatic mechanisms are connected to the piston rod that extends through the test slot. An air pipe communicating with the air cavity is installed on the outer wall of the carrier board. By adjusting the air pressure change in the air cavity, the pneumatic mechanisms are raised and lowered, which pushes the piston rod and the chip support to move up and down in the test slot.

[0018] Based on the above, before testing, air is injected into the air chamber through the trachea, increasing the air pressure inside the chamber. This pressure acts on the pneumatic mechanism, causing it to move upwards, which in turn pushes the piston rod to lift the chip holder from the test slot, making it easier to place the chip to be tested onto the chip holder. During testing, air is released through the trachea to reduce the air pressure inside the air chamber. The pneumatic mechanism then drives the piston rod and chip holder downwards, causing the chip holder to retract into the test slot and complete the positioning. Multiple test slots can perform the above operations simultaneously, enabling parallel testing of multiple chips.

[0019] The upper surface of the chip holder has a recessed work station groove to prevent the chip contact part from making hard contact with the chip holder. A ring-shaped rubber gasket is installed on the lower surface of the chip holder. When the chip holder moves into the test slot, a gap is left between the edge of the chip holder and the inner wall of the test slot to prevent hard contact damage to the chip pin bonding part.

[0020] Based on the above, the chip is placed on the chip holder, and the chip contacts do not directly contact the bottom of the test slot, avoiding contact wear caused by hard contact. During the lifting and lowering of the chip holder, the annular rubber gasket first contacts the bottom of the test slot to buffer the impact force of the holder descending. At the same time, the gap between the edge of the holder and the inner wall of the test slot prevents the chip pin bonding part from colliding with the slot wall, further protecting the chip. The design of the test slot, rubber gasket and gap forms multiple protections, effectively avoiding hard contact between the chip contacts and pins and structural components, reducing the risk of chip damage during the testing process, and improving chip safety.

[0021] The bottom of the test slot has a through channel, through which the piston rod extends into the air chamber. The connection between the piston rod and the chip holder is located inside the rubber gasket.

[0022] Based on the above, the piston rod passes through the channel to connect the chip holder with the pneumatic mechanism in the air chamber, ensuring that the pneumatic drive can be accurately transmitted to the holder. Since the connection is located inside the rubber gasket, when the holder descends, the rubber gasket contacts the bottom of the test slot before the connection, avoiding direct force on the connection and preventing gas leakage in the air chamber through the channel, thus ensuring air pressure stability.

[0023] The pneumatic mechanism includes a piston sleeve located inside the air chamber. Several piston sleeves of the pneumatic mechanism are located directly below the test slot. The top end of the piston sleeve is fixed to the top of the air chamber, and there is a gap between the bottom end of the piston sleeve and the bottom of the air chamber. A rubber piston block that can move up and down is attached to the inner wall of the piston sleeve.

[0024] Based on the above, when the air pressure in the air chamber increases, the gas enters the inside of the sleeve through the gap at the bottom of the piston sleeve, pushing the rubber piston block to slide upward along the inner wall of the sleeve; when the air pressure decreases, the rubber piston block slides downward under the action of external force, and the gas is discharged from the gap; the fixed position of the piston sleeve ensures that the lifting direction of the rubber piston block corresponds to the test slot, ensuring that the chip bracket is lifted vertically.

[0025] Furthermore, the fit design between the piston sleeve and the rubber piston block enhances the sealing performance, ensuring that the air pressure can effectively drive the piston block to move; the gap design facilitates gas flow, and together with the positioning function of the sleeve, it enables the pneumatic mechanism of each test chamber to work independently and precisely, improving the overall structural stability.

[0026] The bottom end of the piston rod is fixedly connected to the top of the rubber piston block. A return spring is connected to the bottom end of the rubber piston block. The bottom end of the return spring is fixed to the bottom of the air chamber. When the air pressure in the air chamber increases, the rubber piston block is pushed upward by the air pressure, stretching the return spring. At the same time, the piston rod drives the chip holder to rise. When the air pressure decreases, the return spring, in conjunction with the air pressure, causes the rubber piston block to return downward, driving the piston rod and chip holder to descend until the holder returns to the test slot. The spring force and the air pressure are balanced to ensure that the holder rises and falls smoothly.

[0027] Furthermore, the reset spring and air pressure work together to achieve automatic reset of the bracket, eliminating the need for additional drive components and simplifying the structure; the spring's buffering effect makes the bracket's lifting and lowering more stable, avoiding violent movements that could impact the chip.

[0028] An air pressure sensor is installed inside the air chamber. During the test, the air pressure sensor monitors the air pressure value inside the air chamber in real time and feeds the data back to the control system. When the air pressure reaches the preset value, the system stops inflating or deflating, and precisely controls the lifting height of the rubber piston block, thereby ensuring that the chip holder stays in the required position.

[0029] The inner wall of the test slot is equipped with supplementary lighting beads, and a ring of reflective sheets is also attached to the inner wall of the test slot. When the chip is being tested, the supplementary lighting beads are powered on and emit light, which directly illuminates the chip surface; at the same time, the reflective sheets reflect the scattered light back into the test slot, enhancing the overall brightness of the slot. This allows operators or testing equipment to clearly observe details such as the pin status and contact connection of the chip, facilitating accurate judgment of the chip's test status and reducing testing errors caused by insufficient light.

[0030] Obviously, the described embodiments are only a part of the embodiments of this utility model, and not all of them. All other embodiments obtained by those skilled in the art and related fields based on the embodiments of this utility model without creative effort should fall within the protection scope of this utility model. Structures, devices, and operating methods not specifically described and explained in this utility model, unless otherwise specified or limited, shall be implemented according to conventional means in the art.

Claims

1. A board for use in parallel testing of multiple chips, characterized by The device includes a carrier plate with an internal air cavity. The upper surface of the carrier plate has several recessed test slots. A chip holder that can be raised and lowered is installed inside the test slot. A piston rod is connected to the bottom of the chip holder and extends through the bottom of the test slot into the air cavity. Several pneumatic mechanisms corresponding to the test slots are installed inside the air cavity. The pneumatic mechanisms are connected to the piston rods that pass through the test slots. An air pipe communicating with the air cavity is installed on the outer wall of the carrier plate. By adjusting the air pressure changes in the air cavity, the pneumatic mechanisms are raised and lowered, which in turn drives the piston rod and the chip holder to move up and down within the test slot.

2. The multi-chip parallel test board according to claim 1, wherein: The upper surface of the chip holder has a recessed work station groove, and the lower surface of the chip holder is fitted with a ring-shaped rubber gasket.

3. The multi-chip parallel test board of claim 2, wherein: The bottom of the test slot has a through channel, through which the piston rod extends into the air chamber. The connection between the piston rod and the chip holder is located inside the rubber gasket.

4. The multi-chip parallel test board of claim 2, wherein: The pneumatic mechanism includes a piston sleeve located inside the air chamber. Several piston sleeves of the pneumatic mechanism are located directly below the test slot. The top end of the piston sleeve is fixed to the top of the air chamber cavity, and a gap is left between the bottom end of the piston sleeve and the bottom of the air chamber cavity. A movable rubber piston block is attached to the inner wall of the piston sleeve.

5. The multi-chip parallel test board of claim 4, wherein: The bottom end of the piston rod is fixedly connected to the top of the rubber piston block, and a return spring is connected to the bottom end of the rubber piston block. The bottom end of the return spring is fixed to the bottom of the air chamber.

6. The multi-chip parallel test board of claim 1, wherein: A pressure sensor is installed inside the air chamber.

7. The multi-chip parallel test board of claim 1, wherein: The inner wall of the test chamber is equipped with supplementary lighting beads, and a ring of reflective sheets is also attached to the inner wall of the test chamber.

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