Electronic circuit board signal testing tool
Patent Information
- Application Number
- CN202521906524.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-05
- Publication Date
- 2026-08-18
- Estimated Expiration
- 2035-09-05
AI Technical Summary
[0005]本实用新型的目的在于:解决现有电子线路板信号测试工装结构复杂、制造成本较高、操作不便以及适应性不足的问题
通过设置的信号检测模块和定位调节模块,信号检测模块中的测试探针组通过弹性接触头与电子线路板的测试点接触,弹性接触头的导电涂层能够有效提高信号传输的稳定性;同时,定位调节模块中的滑动调节组件和固定压紧组件协同作用,滑动调节组件通过滑块和滚珠在滑轨上的移动实现位置调整,固定压紧组件通过压紧板和缓冲垫将电子线路板固定在测试位置,缓冲垫的防滑纹理能够防止线路板在测试过程中发生位移。此外,测试探针组通过滑槽与横向调节臂滑动连接,并通过锁紧螺栓固定,使得测试探针组的位置可根据不同尺寸或布局的线路板灵活调整,从而提高了工装的适应性和便捷性。
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Figure CN224651498U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of electronic testing technology, specifically an electronic circuit board signal testing fixture. Background Technology
[0002] In the production and testing of electronic circuit boards, signal transmission performance is one of the important indicators for measuring product quality. Currently, some test fixtures based on probe contact, signal acquisition and analysis technologies have appeared on the market. However, these devices are often complex in structure, have high manufacturing costs, and require highly skilled operators. In addition, these devices may require frequent replacement of adapters or adjustment of test positions during the testing process, resulting in low efficiency.
[0003] For example, some existing electronic circuit board testing devices typically include a base, a mounting bracket, and a test probe assembly. The base has positioning slots, the mounting bracket is bolted to the base, and the test probe assembly is mounted on top of the bracket and connected to an external testing instrument via wires. While such devices can perform basic signal testing functions, their adaptability and convenience are limited when dealing with circuit boards of different sizes or layouts. The above situation illustrates the shortcomings of the existing technology.
[0004] Therefore, we have made improvements to this and proposed a signal testing fixture for electronic circuit boards. Utility Model Content
[0005] The purpose of this utility model is to solve the problems of existing electronic circuit board signal testing fixtures, such as complex structure, high manufacturing cost, inconvenient operation, and insufficient adaptability.
[0006] To achieve the above-mentioned objectives and improve the above-mentioned problems, this utility model provides an electronic circuit board signal testing fixture, including a signal detection module and a positioning adjustment module. The top of the signal detection module is provided with a connecting bracket, and the positioning adjustment module is located on both sides of the signal detection module. The signal detection module and the positioning adjustment module are used in conjunction to perform signal testing on the electronic circuit board. The positioning adjustment module is provided with a sliding adjustment component inside, and the end of the sliding adjustment component is provided with a fixing and clamping component.
[0007] The signal detection module includes a test probe group. The bottom of the test probe group is provided with several elastic contact heads. The surface of the elastic contact heads is provided with a conductive coating. The top of the test probe group is connected to a signal acquisition device through wires. The signal acquisition device is fixedly installed on the top of the connecting bracket. The bottom of the connecting bracket is provided with a support base. The bottom of the support base is provided with an anti-slip pad.
[0008] As a preferred technical solution of this application, the connecting bracket includes a vertical support rod, the top of which has two mounting holes communicating with the bottom of the vertical support rod. The two mounting holes are used to fix the two ends of the signal acquisition device, and the bottom end of the vertical support rod is fixedly connected to the support base by a threaded connection.
[0009] As a preferred technical solution of this application, the signal detection module further includes two horizontal adjustment arms fixedly connected to the side of the vertical support rod. The two horizontal adjustment arms are respectively located on both sides of the test probe group. The test probe group is slidably connected to the two horizontal adjustment arms through a sliding groove. The top of the test probe group is provided with a locking bolt, which is used to fix the test probe group on the horizontal adjustment arm.
[0010] As a preferred technical solution of this application, the positioning adjustment module includes a sliding frame, and the sliding frame is provided with a slide rail inside, which is used to cooperate with the sliding adjustment component.
[0011] As a preferred technical solution of this application, the sliding adjustment component includes a slider, the bottom of which is provided with a ball bearing, the ball bearing being rotatably connected to a slide rail, and the top of the slider being fixedly connected to a fixing and clamping component by bolts. The fixing and clamping component includes a clamping plate, the bottom of which is provided with a buffer pad, and the surface of the buffer pad is provided with an anti-slip texture.
[0012] As a preferred technical solution of this application, the sliding frame is provided with a return spring inside, and the two ends of the return spring are fixedly connected to the slider and the inner wall of the sliding frame, respectively. The return spring is used to provide a return force after the slider moves.
[0013] As a preferred technical solution of this application, a through hole communicating with the lower part of the vertical support rod is provided in the middle of the vertical support rod. The through hole is located between two mounting holes and is used to pass through wires to connect the signal acquisition device and the test probe group.
[0014] Compared with the prior art, the beneficial effects of this utility model are as follows: Through the established signal detection and positioning adjustment modules, the test probe group in the signal detection module contacts the test points of the electronic circuit board via elastic contact heads. The conductive coating of the elastic contact heads effectively improves the stability of signal transmission. Simultaneously, the sliding adjustment component and the fixing clamping component in the positioning adjustment module work together. The sliding adjustment component adjusts the position by moving a slider and ball on a slide rail, while the fixing clamping component secures the electronic circuit board in the test position using a clamping plate and a buffer pad. The anti-slip texture of the buffer pad prevents displacement of the circuit board during testing. Furthermore, the test probe group is slidably connected to the lateral adjustment arm via a slide groove and fixed with locking bolts, allowing the position of the test probe group to be flexibly adjusted according to circuit boards of different sizes or layouts, thereby improving the adaptability and convenience of the tooling.
[0015] Through the above-described specific structural design, this utility model solves the problems of complex structure, high manufacturing cost, inconvenient operation, and insufficient adaptability of existing electronic circuit board signal testing fixtures. It reduces production costs, simplifies operation procedures, and improves testing efficiency, providing a more efficient and reliable solution for the production and testing of electronic circuit boards. Attached Figure Description
[0016] Figure 1 This is a schematic diagram of the overall structure of the present invention, showing the layout relationship between the signal detection module and the positioning adjustment module, as well as the positions of the test probe group and the sliding adjustment component.
[0017] Figure 2 This is a schematic diagram of the signal detection module, which highlights the test probe group, the elastic contact head and its connection with the lateral adjustment arm, and marks the position of the locking bolt.
[0018] Figure 3 This is a structural diagram of the positioning adjustment module, showing the structural relationship between the slide rail, slider, and return spring inside the sliding frame, and also showing the installation position of the fixing and clamping components.
[0019] Figure 4 The detailed diagram of the clamping assembly shows the design of the clamping plate, the cushioning pad, and the anti-slip texture on its surface.
[0020] Figure 5 This is a structural diagram of a vertical support rod, with the specific locations of mounting holes, through holes, and threaded connections marked.
[0021] The attached figures are labeled as follows: 1. Signal detection module; 2. Positioning adjustment module; 3. Test probe group; 4. Elastic contact head; 5. Connecting bracket; 6. Sliding adjustment assembly; 7. Fixing and clamping assembly; 8. Lateral adjustment arm; 9. Locking bolt; 10. Sliding frame; 11. Slide rail; 12. Slider; 13. Ball bearing; 14. Pressure plate; 15. Buffer pad; 16. Return spring; 17. Vertical support rod; 18. Mounting hole; 19. Through hole; 20. Support base. Detailed Implementation
[0022] This utility model provides an electronic circuit board signal testing fixture, the structure of which is as follows: Figures 1 to 5 As shown in the accompanying drawings, the specific embodiments of this utility model will be described in detail below.
[0023] The signal detection module 1 includes a test probe assembly 3 and a connecting bracket 5. The bottom of the test probe assembly 3 has several elastic contact heads 4, which are fixedly connected to the test probe assembly 3. The test probe assembly 3 is slidably connected to two horizontal adjusting arms 8 via sliding grooves. The horizontal adjusting arms 8 are located on both sides of the test probe assembly 3, and are fixedly connected to the side of a vertical support rod 17 by bolts. A locking bolt 9 is provided at the top of the test probe assembly 3, passing through the test probe assembly 3 and abutting against the surface of the horizontal adjusting arm 8, for fixing the test probe assembly 3 to the horizontal adjusting arm 8. The top of the test probe assembly 3 is connected to the signal acquisition unit via a wire. The signal acquisition unit is mounted on the top of the connecting bracket 5. The connecting bracket 5 includes a vertical support rod 17. The top of the vertical support rod 17 has two mounting holes 18, which are used to fix the two ends of the signal acquisition unit. The bottom of the vertical support rod 17 is fixedly connected to the support base 20 via a threaded connection. The bottom of the support base 20 is provided with an anti-slip pad. The middle of the vertical support rod 17 has a through hole 19, which is located between the two mounting holes 18, and is used to pass wires through to connect the signal acquisition unit and the test probe assembly 3.
[0024] The positioning adjustment module 2 is located on both sides of the signal detection module 1. The positioning adjustment module 2 includes a sliding frame 10, inside which is a slide rail 11. The slide rail 11 is connected to the sliding adjustment component 6. The sliding adjustment component 6 includes a slider 12, with a ball bearing 13 at the bottom of the slider 12. The ball bearing 13 is in rolling connection with the slide rail 11. The top of the slider 12 is fixedly connected to the fixing and clamping component 7 by bolts. The fixing and clamping component 7 includes a clamping plate 14, with a buffer pad 15 at the bottom of the clamping plate 14. The surface of the buffer pad 15 has an anti-slip texture. The sliding frame 10 also has a return spring 16 inside. The two ends of the return spring 16 are fixedly connected to the slider 12 and the inner wall of the sliding frame 10, respectively. When the slider 12 moves along the slide rail 11, the return spring 16 can provide a restoring force to make the slider 12 return to the initial position.
[0025] In actual operation, the electronic circuit board to be tested is first placed above the support base 20, and the position of the test probe group 3 is adjusted to align it with the test points on the electronic circuit board. The test probe group 3 is slidably connected to the horizontal adjustment arm 8 via a slide groove, allowing the test probe group 3 to move freely in the horizontal direction. After the position of the test probe group 3 is adjusted, the test probe group 3 is fixed to the horizontal adjustment arm 8 by rotating the locking bolt 9. Subsequently, the position of the fixing and clamping component 7 is adjusted by the sliding adjustment component 6, and the slider 12 moves on the slide rail 11 and slides smoothly through the ball bearing 13. After the position of the fixing and clamping component 7 is adjusted, the clamping plate 14 presses the electronic circuit board onto the support base 20 through the buffer pad 15. The anti-slip texture of the buffer pad 15 can prevent the electronic circuit board from shifting during the test.
[0026] The elastic contact head 4 of the test probe assembly 3 contacts the test point on the electronic circuit board. The elastic contact head 4 forms a stable electrical connection with the test point through a conductive coating. The signal is transmitted to the signal acquisition unit for acquisition and analysis via a wire. The through hole 19 of the vertical support rod 17 is used to pass a wire through. One end of the wire is connected to the test probe assembly 3, and the other end is connected to the signal acquisition unit to ensure the stability of the signal transmission path. The vertical support rod 17 is fixedly connected to the support base 20 by a threaded connection. The bottom of the support base 20 is equipped with an anti-slip pad to enhance the stability of the entire fixture.
[0027] After the test is completed, loosen the locking bolt 9 and slide the test probe group 3 along the horizontal adjusting arm 8 to the initial position. At the same time, through the action of the reset spring 16, the slider 12 drives the fixed clamping assembly 7 to return to the initial position, thus completing one test operation.
[0028] In the above structural design, the test probe group 3 is slidably connected to the horizontal adjusting arm 8 via a sliding groove and fixed by the locking bolt 9, enabling flexible adjustment of the position of the test probe group 3. The sliding adjustment component 6 adjusts its position by moving the slider 12 and the ball bearing 13 on the slide rail 11. The fixing and clamping component 7 fixes the electronic circuit board in the test position by the clamping plate 14 and the buffer pad 15, ensuring the stability of the test process. The vertical support rod 17 is fixedly connected to the support base 20 by a threaded connection and its stability is enhanced by anti-slip pads. The design of the through hole 19 simplifies the wiring path and improves the overall structural simplicity.
[0029] The above description fully discloses the technical solution of this utility model, enabling those skilled in the art to implement the technology according to the contents of the specification. It solves the problems of complex structure, high manufacturing cost, inconvenient operation and insufficient adaptability of the existing electronic circuit board signal testing fixtures, and provides a more efficient and reliable solution for the production and testing of electronic circuit boards.
[0030] To enable those skilled in the art to fully understand and implement this utility model, the following supplementary explanation of the specific implementation principle of this utility model is provided in conjunction with a specific application scenario.
[0031] First, place the electronic circuit board to be tested on top of the support base 20. The support base 20 is fixedly connected to the vertical support rod 17 via a threaded connection, and its bottom is equipped with anti-slip pads to ensure the stability of the entire fixture during testing. The operator needs to adjust the lateral position of the test probe assembly 3 according to the size of the electronic circuit board and the position of the test points. The test probe assembly 3 is slidably connected to two lateral adjustment arms 8 via sliding grooves. The lateral adjustment arms 8 are located on both sides of the test probe assembly 3 and are fixedly connected to the sides of the vertical support rod 17 by bolts. After the position of the test probe assembly 3 is adjusted, rotate the locking bolt 9 to make it abut against the surface of the lateral adjustment arm 8, thereby fixing the test probe assembly 3 in the desired position. This design allows the test probe assembly 3 to move flexibly in the lateral direction and achieve quick positioning through the locking bolt 9, improving its ability to adapt to circuit boards of different sizes.
[0032] Subsequently, the electronic circuit board is clamped and fixed. The positioning adjustment module 2 is located on both sides of the signal detection module 1, and its interior contains a sliding frame 10 with a slide rail 11. The sliding adjustment assembly 6 includes a slider 12, with a ball bearing 13 at its bottom. The ball bearing 13 is in rolling connection with the slide rail 11, ensuring smooth movement of the slider 12 along the slide rail 11. The top of the slider 12 is fixedly connected to the fixing and clamping assembly 7 by bolts. The fixing and clamping assembly 7 includes a clamping plate 14, with a buffer pad 15 at its bottom. The surface of the buffer pad 15 has an anti-slip texture. The operator manually pushes the slider 12 to move it to the appropriate position along the slide rail 11, and then the fixing and clamping assembly 7 clamps the electronic circuit board onto the support base 20. The anti-slip texture of the buffer pad 15 effectively prevents displacement of the electronic circuit board during testing, thus ensuring the stability of the test. In addition, a return spring 16 is provided inside the sliding frame 10, with its two ends fixedly connected to the slider 12 and the inner wall of the sliding frame 10, respectively. After the test is completed, the fixing and clamping assembly 7 is released, and the return spring 16 provides a restoring force, causing the slider 12 to automatically return to its initial position, simplifying the operation process.
[0033] After completing the above preparations, the elastic contact head 4 of the test probe group 3 contacts the test point of the electronic circuit board. The surface of the elastic contact head 4 is coated with a conductive coating, which forms a stable electrical connection upon contact, thus ensuring the reliability of signal transmission. The top of the test probe group 3 is connected to a signal acquisition unit via a wire, which is mounted on top of the connecting bracket 5. A through hole 19 is provided in the middle of the vertical support rod 17, located between two mounting holes 18, for threading wires to connect the signal acquisition unit and the test probe group 3. This design not only simplifies the wire arrangement path but also prevents external interference from affecting the stability of signal transmission. The signal acquisition unit receives signals from the test probe group 3 via the wires, and then collects and analyzes them to complete the test of the electronic circuit board's signal performance.
[0034] After the test is completed, the operator loosens the locking bolt 9 and slides the test probe assembly 3 along the horizontal adjusting arm 8 to its initial position. Simultaneously, the return spring 16 causes the slider 12 to move the fixing clamping assembly 7 back to its initial position, thus completing one test operation. The entire testing process, through the coordinated action of the signal detection module 1 and the positioning adjustment module 2, achieves efficient and stable testing of the electronic circuit board.
[0035] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. An electronic circuit board signal testing tool, characterized by, The system includes a signal detection module (1) and a positioning adjustment module (2). The top of the signal detection module (1) is provided with a connecting bracket (5). The positioning adjustment module (2) is located on both sides of the signal detection module (1). The signal detection module (1) includes a test probe group (3). The bottom of the test probe group (3) is provided with several elastic contact heads (4). The top of the test probe group (3) is connected to a signal collector via a wire. The signal collector is fixedly installed on the top of the connecting bracket (5). The positioning adjustment module (2) is provided with a sliding adjustment component (6). The end of the sliding adjustment component (6) is provided with a fixing clamping component (7).
2. The electronic circuit board signal testing tool according to claim 1, wherein The connecting bracket (5) includes a vertical support rod (17). The top of the vertical support rod (17) has two mounting holes (18) that communicate with the bottom of the vertical support rod (17). The two mounting holes (18) are used to fix the two ends of the signal collector. The bottom end of the vertical support rod (17) is fixedly connected to the support base (20) by a threaded connection.
3. The electronic circuit board signal testing tool of claim 2, wherein, The signal detection module (1) also includes two horizontal adjustment arms (8) fixedly connected to the side of the vertical support rod (17). The two horizontal adjustment arms (8) are located on both sides of the test probe group (3). The test probe group (3) is slidably connected to the two horizontal adjustment arms (8) through a sliding groove. The top of the test probe group (3) is provided with a locking bolt (9). The locking bolt (9) is used to fix the test probe group (3) on the horizontal adjustment arm (8).
4. The electronic circuit board signal testing tool of claim 1, wherein, The positioning adjustment module (2) includes a sliding frame (10), and the sliding frame (10) is provided with a slide rail (11) inside. The slide rail (11) is used to cooperate with the sliding adjustment component (6).
5. The electronic circuit board signal testing tool of claim 4, wherein, The sliding adjustment assembly (6) includes a slider (12), the bottom of which is provided with a ball (13), the ball (13) is tumblingly connected to the slide rail (11), the top of which is fixedly connected to the fixing and clamping assembly (7) by bolts, the fixing and clamping assembly (7) includes a clamping plate (14), the bottom of which is provided with a buffer pad (15).
6. The electronic circuit board signal testing tool of claim 5, wherein, The sliding frame (10) is provided with a return spring (16) inside, and the two ends of the return spring (16) are fixedly connected to the slider (12) and the inner wall of the sliding frame (10), respectively.
7. The electronic circuit board signal testing tool of claim 2, wherein, The vertical support rod (17) has a through hole (19) in the middle that communicates with the bottom of the vertical support rod (17). The through hole (19) is located between two mounting holes (18). The through hole (19) is used to pass wires through to connect the signal acquisition device and the test probe group (3).
8. The electronic circuit board signal testing tool of claim 5, wherein, The surface of the cushioning pad (15) is provided with an anti-slip texture.