Detection tool for chip automatic production

CN224657439UActive Publication Date: 2026-08-21CHONGQING HANA ELECTRONICS CO LTD
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Patent Information

Application Number
CN202521903189.5
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-09-04
Publication Date
2026-08-21
Estimated Expiration
2035-09-04

AI Technical Summary

Technical Problem

随着自动化生产技术的广泛应用,芯片生产逐渐向高效率、大规模方向发展,在芯片自动化生产过程中,现有的检测手段和方法仍然存在一定局限性,当检测到不合格产品后,需要及时将其分拣出来,以防止混入合格产品中造成进一步的质量问题

Benefits of technology

该用于芯片自动化生产的检测工装,通过CCD对芯片检测是否有线包或者是否为空壳,再通过探针对芯片进行通断检测,PLC能根据检测结果快速调节定位块间距,当检测到不合格的芯片时调节两个定位块之间的间距大于芯片自身的直径,使不合格的芯片从两个定位块中间的空隙落在下方的导流滑道上进行收集,有效提升了整体的分拣效率,满足大规模生产需求,保障生产线的高效运行。

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Abstract

The utility model relates to a kind of detection tool for chip automation production, including workbench, workbench is provided with fixed base, fixed base top end is fixedly connected with mounting plate, mounting plate is connected with multiple clamping components, workbench is also provided with two fixed plates of symmetrical distribution, two fixed plate top surface is connected with support plate, support plate top surface is relative to one end and is provided with CCD, another end is provided with recess, recess is slidably provided with two positioning blocks.This technical scheme, through CCD, whether there is wire package or whether it is empty shell is detected to chip, then pass through probe and carry out on-off detection to chip, PLC can be adjusted positioning block spacing according to detection result, when detecting unqualified chip, the spacing between two positioning blocks is adjusted to be greater than the diameter of chip itself, so that unqualified chip falls on the flow guide slide below from the gap between two positioning blocks and is collected, effectively improve the overall sorting efficiency, satisfy mass production demand, guarantee the efficient operation of production line.
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Description

Technical Field

[0001] This utility model relates to the field of chip testing equipment technology, specifically to a testing fixture for automated chip production. Background Technology

[0002] Against the backdrop of rapid development in modern electronic information technology, chips, as the core component of modern electronic devices, are produced on a massive scale with extremely stringent quality requirements. Chip manufacturing involves numerous complex processes, from wafer lithography, etching, and doping to chip packaging and testing. Precise control and quality inspection are crucial at each stage to ensure the performance, reliability, and stability of the final product. With the widespread application of automated production technology, chip manufacturing is gradually moving towards higher efficiency and larger scale. However, existing detection methods and techniques still have limitations in automated chip production. When defective products are detected, they need to be promptly sorted out to prevent them from mixing with qualified products and causing further quality problems. Traditional mechanical sorting devices primarily sort chips based on simple physical characteristics (such as chip size and shape). However, the limited speed and processing capacity of these devices cannot meet the demands of large-scale production, resulting in low sorting efficiency and impacting the overall production line efficiency. Utility Model Content

[0003] In view of this, the purpose of this utility model is to provide a testing fixture for automated chip production, so as to solve the technical problems mentioned in the background art.

[0004] This utility model is achieved through the following technical solution: A testing fixture for automated chip production includes a worktable with a fixed base on the worktable. A mounting plate is fixedly connected to the top of the fixed base. Multiple clamping components are connected to one side of the mounting plate, and a driving component is installed on the other side. The driving component is used to drive the multiple clamping components to reciprocate simultaneously along the length of the mounting plate. The workbench is also equipped with two symmetrically distributed fixed plates. The top surfaces of the two fixed plates are connected to support plates. A CCD is set on one end of the top surface of the support plate, and a notch is opened on the other end. Two symmetrically distributed positioning blocks are slidably set in the notch. Probe seats are slidably installed on the top surfaces of the support plates on both sides of the notch. Several probes are installed in the probe seats. A flow guide slide is fixedly connected to one side of the two fixed plates, and the flow guide slide corresponds to the two positioning blocks.

[0005] Furthermore, the top surfaces of the support plates on both sides of the notch are each equipped with a first guide rail, and the bottom surface of the probe seat is fixedly connected with a first slider that is compatible with the first guide rail.

[0006] Furthermore, a connecting seat is provided on the bottom surface of the support plate corresponding to one of the probe seats, and a second guide rail is provided at one end of the connecting seat. A second slider that slides and engages with the second guide rail is fixedly connected to the bottom ends of both positioning blocks.

[0007] Furthermore, a third guide rail is installed on one side of the mounting plate, extending along the length of the mounting plate. A third slider is slidably connected to the third guide rail, and a movable plate is connected to the outside of the third slider. A fourth slider is provided on the side of the movable plate away from the third slider, and a fourth guide rail is slidably connected to the fourth slider. The fourth guide rail and the third guide rail form a cross shape. A first fixing block is connected to the upper end of the fourth guide rail, and the first fixing block is connected to the drive assembly. A second fixing block is connected to the lower end of the fourth guide rail, and multiple clamping assemblies are installed on the second fixing block.

[0008] Furthermore, the drive assembly includes a motor and a drive block. The motor is mounted on one side of the mounting plate, and the output shaft of the motor is connected to a rotating rod. One end of the drive block is fixedly connected to the rotating rod, and the other end has a guide hole. A limit hole is provided on the reinforcing plate, and the limit hole corresponds to the guide hole. A movable rod is fixedly connected to the first fixed block. The end of the movable rod away from the fixed block passes through the limit hole and the guide hole. A slip ring is fixedly fitted on the part of the movable rod located in the limit hole and the guide hole. The two slip rings slide and engage with the limit hole and the guide hole respectively.

[0009] Furthermore, the clamping assembly includes an L-plate, a robotic arm, and an end effector. The L-plate is mounted on the outside of the second fixed block, one end of the robotic arm is connected to the bottom surface of the L-plate, and the other end is connected to the end effector.

[0010] The beneficial effects of this utility model are as follows: This inspection fixture for automated chip production uses a CCD to detect whether the chip has a coil or is empty, and then uses a probe to detect continuity. The PLC can quickly adjust the spacing between the positioning blocks based on the detection results. When a defective chip is detected, the spacing between the two positioning blocks is adjusted to be greater than the diameter of the chip itself, so that the defective chip falls from the gap between the two positioning blocks onto the guide slide below for collection. This effectively improves the overall sorting efficiency, meets the needs of large-scale production, and ensures the efficient operation of the production line.

[0011] Other advantages, objectives, and features of this invention will be set forth in part in the description which follows, and in part will be apparent to those skilled in the art from the following examination and study, or may be learned from practice of this invention. The objectives and other advantages of this invention can be realized and obtained through the following description. Attached Figure Description

[0012] Figure 1 This is a perspective view of the present utility model; Figure 2 This is a schematic diagram of the CCD and probe structure of this utility model; Figure 3 For the present utility model Figure 2 A partial exploded view; Figure 4 This is a schematic diagram of the drive component and clamping component structure of this utility model (first perspective). Figure 5 This is a schematic diagram of the drive component and clamping component structure of this utility model (first perspective).

[0013] In the diagram: 1. Workbench; 2. Fixed base; 3. Mounting plate; 4. Third guide rail; 5. Movable plate; 6. Third slider; 7. Fourth slider; 8. Fourth guide rail; 9. First fixed block; 10. Second fixed block; 11. Clamping assembly; 111. L-plate; 112. Robotic arm; 113. End effector; 12. Drive assembly; 121. Motor; 122. Drive block; 123. Guide hole; 124. Limiting hole; 125. Movable rod; 126. Slip ring; 13. Fixed plate; 14. Support plate; 15. CCD; 16. Notch; 17. Positioning block; 18. Probe holder; 19. First guide rail; 20. First slider; 21. Connecting seat; 22. Second guide rail; 23. Second slider; 24. Guide slide. Detailed Implementation

[0014] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0015] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0016] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0017] In the above description of this utility model, it should be noted that the terms "one side," "the other side," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the utility model product is in use. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first," "second," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0018] Furthermore, terms such as "identical" do not imply that components must be absolutely identical; minor differences are permissible. The term "perpendicular" simply means that the positional relationship between components is more perpendicular than "parallel," not that the structure must be perfectly perpendicular; a slight tilt is acceptable.

[0019] Please see Figure 1-5 This utility model provides a technical solution: a testing fixture for automated chip production, including a workbench 1, a fixed base 2 on the workbench 1, a mounting plate 3 fixedly connected to the top of the fixed base 2, a plurality of clamping components 11 connected to one side of the mounting plate 3, and a driving component 12 installed on the other side. The driving component 12 is used to drive the plurality of clamping components 11 to reciprocate simultaneously along the length direction of the mounting plate 3. The workbench 1 is also provided with two symmetrically distributed fixed plates 13. The top surfaces of the two fixed plates 13 are connected to support plates 14. A CCD 15 is provided on one end of the top surface of the support plate 14, and a notch 16 is opened on the other end. Two symmetrically distributed positioning blocks 17 are slidably arranged in the notch 16. Probe seats 18 are slidably installed on the top surfaces of the support plates 14 on both sides of the notch 16. Several probes are installed in the probe seats 18. A flow guide slide 24 is fixedly connected to one side of the two fixed plates 13. The flow guide slide 24 corresponds to the two positioning blocks 17.

[0020] In this technical solution, the number of clamping components 11 is 3, and the 3 clamping components 11 are arranged from left to right along the same horizontal line. The first clamping component 11 is used to clamp the chip on the conveyor belt corresponding to the previous process onto the CCD 15. The second clamping component 11 is used to clamp the chip on the CCD 15 onto the two positioning blocks 17. The third clamping component 11 is used to clamp the chip on the positioning block 17 onto the conveyor belt corresponding to the next process. The spacing between the clamping components 11, the driving component 12 and the two symmetrically distributed positioning blocks 17 is precisely controlled by a programmable logic controller (PLC). The programmable logic controller (PLC) is a mature technology in the prior art, so it is not shown in the accompanying drawings of this application.

[0021] Step 1: Start driver component 12: The driving component 12 drives the three clamping components 11 to slide back and forth along the length of the mounting plate 3 simultaneously, preparing for the subsequent transmission and processing of the chip. Step Two: Chip Transfer and Preliminary Testing Stage (1) Chip gripping and transfer: The left clamping component 11 grips the chip from the conveyor belt corresponding to the previous process, moves it above the CCD15 and places the chip on the top surface of the CCD15.

[0022] (2) CCD15 inspection: The CCD15 inspects the chip to determine whether it has a coil or is an empty shell. If the chip has no coil or is an empty shell, it is marked as unqualified and the data is transmitted to the PLC for recording. Step 3: Handling of Defective Chips (1) Adjustment of the spacing between the positioning blocks 17 (for unqualified cases): When the clamping assembly 11 clamps a chip that is detected as unqualified by the CCD 15 and recorded by the PLC, the PLC adjusts the spacing between the two positioning blocks 17 to make it larger than the diameter of the chip.

[0023] (2) Collection of defective chips: Because the distance between the two positioning blocks 17 is greater than its own diameter, the defective chips fall directly onto the guide slide 24 below for collection.

[0024] Step 3: Processing of Qualified Chips (1) Adjustment of the spacing between the positioning blocks 17 (qualified condition): When the clamping component 11 clamps the chip that has been detected as qualified by the CCD 15, the PLC adjusts the spacing between the two positioning blocks 17 to make it smaller than the diameter of the chip so that the chip can be placed on the top surface of the two positioning blocks 17.

[0025] (2) Continuity detection: The PLC controls the two probe holders 18 to slide, so that the probes of the probe holders 18 abut against the coils on both sides of the chip to perform continuity detection on the chip and determine whether the chip can conduct current normally.

[0026] (3) Handling of unqualified chips (failure of continuity test): If there is an open circuit problem in the continuity test, the chip is determined to be unqualified. The PLC controls the distance between the two positioning blocks 17 to increase, so that the unqualified chip falls on the guide slide 24.

[0027] (4) Transfer of qualified chips: If the continuity test determines that the chip is qualified, the clamping component 11 on the right will clamp the chip on the top surface of the two positioning blocks 17 and place it on the conveyor belt corresponding to the next process.

[0028] The system uses a CCD15 to detect whether the chip has a coil or is empty, and a probe to detect the continuity of the chip. The PLC can quickly adjust the spacing of the positioning blocks 17 based on the detection results. When a defective chip is detected, the spacing between the two positioning blocks 17 is adjusted to be greater than the diameter of the chip itself, so that the defective chip falls from the gap between the two positioning blocks 17 onto the guide slide 24 below for collection. This effectively improves the overall sorting efficiency, meets the needs of large-scale production, and ensures the efficient operation of the production line.

[0029] In this embodiment: the top surfaces of the support plates 14 on both sides of the notch 16 are equipped with first guide rails 19, and the bottom surface of the probe seat 18 is fixedly connected with a first slider 20 that is adapted to the first guide rails 19.

[0030] In practical use, the PLC controls the two first sliders 20 to move back and forth along the two first guide rails 19 respectively. The two first sliders 20 drive the two probe seats 18 to move, so that the probes on the probe seats 18 abut against the chips on the positioning block 17 to perform continuity detection.

[0031] In this embodiment: a connecting seat 21 is provided on the bottom surface of the support plate 14 corresponding to one of the probe seats 18, a second guide rail 22 is provided at one end of the connecting seat 21, and a second slider 23 that slides and cooperates with the second guide rail 22 is fixedly connected to the bottom ends of the two positioning blocks 17.

[0032] In practical use, the PLC controls the two second sliders 23 to move synchronously towards each other or synchronously away from each other along the first guide rail 19. The synchronous movement of the two second sliders 23 towards each other or synchronously away from each other adjusts the distance between the two positioning blocks 17, so that the chips marked as unqualified can fall from the gap between the two positioning blocks 17 onto the guide slide 24.

[0033] In this embodiment: a third guide rail 4 is installed on one side of the mounting plate 3. The third guide rail 4 extends along the length of the mounting plate 3. A third slider 6 is slidably connected to the third guide rail 4. A movable plate 5 is connected to the outside of the third slider 6. A fourth slider 7 is provided on the side of the movable plate 5 away from the third slider 6. A fourth guide rail 8 is slidably connected to the fourth slider 7. The fourth guide rail 8 and the third guide rail 4 form a cross shape. A first fixing block 9 is connected to the upper end of the fourth guide rail 8. The first fixing block 9 is connected to the drive assembly 12. A second fixing block 10 is connected to the lower end of the fourth guide rail 8. Multiple clamping assemblies 11 are all installed on the second fixing block 10.

[0034] After the drive component 12 is started, it can drive the first fixed block 9 to rise or fall. The rise or fall of the first fixed block 9 will drive the fourth guide rail 8 to slide up or down on the fourth slider 7. The fourth guide rail 8 will drive the second fixed block 10 and multiple clamping components 11 to rise or fall synchronously, so that the clamping components 11 can clamp and put down the chip. At the same time, after the drive component 12 is started, it will also drive the third slider 6 to slide laterally back and forth on the third guide rail 4. The third slider 6 will drive the movable plate 5 and the third slider 6 to move laterally synchronously, so that the clamping components 11 can easily transfer the chip.

[0035] In this embodiment: the drive assembly 12 includes a motor 121 and a drive block 122. The motor 121 is mounted on one side of the mounting plate 3. The output shaft of the motor 121 is connected to a rotating rod. One end of the drive block 122 is fixedly connected to the rotating rod, and the other end is provided with a guide hole 123. The mounting plate 3 is provided with a limiting hole 124, which corresponds to the guide hole 123. A movable rod 125 is fixedly connected to the first fixed block 9. The end of the movable rod 125 away from the fixed block passes through the limiting hole 124 and the guide hole 123. A slip ring 126 is fixedly sleeved on the part of the movable rod 125 located in the limiting hole 124 and the guide hole 123. The two slip rings 126 are slidably engaged in the limiting hole 124 and the guide hole 123, respectively.

[0036] In this technical solution, the limiting hole 124 is n-shaped.

[0037] In practical use, the motor 121 is started, and the motor 121 drives the rotating rod and the drive block 122 to rotate. The rotation of the drive block 122 causes the movable rod 125 to slide simultaneously in the guide hole 123 and the limiting hole 124. The limiting hole 124 can restrict the movable rod 125 to drive the drive block 122 to only perform 180° reciprocating movements. By rotating the drive block 122, multiple clamping components 11 can be driven to move longitudinally and laterally at the same time.

[0038] In this embodiment, the clamping assembly 11 includes an L-plate 111, a robotic arm 112, and an end effector 113. The L-plate 111 is mounted on the outside of the second fixing block 10. One end of the robotic arm 112 is connected to the bottom surface of the L-plate 111, and the other end is connected to the end effector 113.

[0039] In practical use, the PLC controls the robotic arm 112 and the end effector 113 to grip and transfer the chip, thereby improving the production efficiency of the production line.

[0040] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model and are not intended to limit it. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this utility model without departing from the spirit and scope of the technical solutions of this utility model, and all such modifications or substitutions should be covered within the scope of the claims of this utility model.

Claims

1. A testing fixture for automated chip production, comprising a worktable (1), characterized in that: The workbench (1) is provided with a fixed seat (2), and a mounting plate (3) is fixedly connected to the top of the fixed seat (2). One side of the mounting plate (3) is connected to a plurality of clamping components (11), and the other side is equipped with a driving component (12). The driving component (12) is used to drive the plurality of clamping components (11) to reciprocate simultaneously along the length direction of the mounting plate. The workbench (1) is also provided with two symmetrically distributed fixed plates (13). The top surfaces of the two fixed plates (13) are connected to support plates (14). A CCD (15) is provided on one end of the top surface of the support plate (14), and a notch (16) is provided on the other end. Two symmetrically distributed positioning blocks (17) are slidably arranged in the notch (16). Probe seats (18) are slidably installed on the top surfaces of the support plates (14) on both sides of the notch (16). Several probes are installed in the probe seats (18). A flow guide slide (24) is fixedly connected to one side of the two fixed plates (13). The flow guide slide (24) corresponds to the two positioning blocks (17).

2. The testing fixture for automated chip production according to claim 1, characterized in that: The top surfaces of the support plates (14) on both sides of the notch (16) are each equipped with a first guide rail (19), and the bottom surface of the probe seat (18) is fixedly connected with a first slider (20) that is compatible with the first guide rail (19).

3. The testing fixture for automated chip production according to claim 1, characterized in that: One of the probe holders (18) has a connecting seat (21) on its bottom surface corresponding to the support plate (14). One end of the connecting seat (21) is provided with a second guide rail (22). The bottom ends of the two positioning blocks (17) are fixedly connected with a second slider (23) that slides with the second guide rail (22).

4. The testing fixture for automated chip production according to claim 1, characterized in that: A third guide rail (4) is installed on one side of the mounting plate (3). The third guide rail (4) extends along the length of the mounting plate (3). A third slider (6) is slidably connected to the third guide rail (4). A movable plate (5) is connected to the outside of the third slider (6). A fourth slider (7) is provided on the side of the movable plate (5) away from the third slider (6). A fourth guide rail (8) is slidably connected to the fourth slider (7). The fourth guide rail (8) and the third guide rail (4) form a cross shape. A first fixing block (9) is connected to the upper end of the fourth guide rail (8). The first fixing block (9) is connected to the drive assembly (12). A second fixing block (10) is connected to the lower end of the fourth guide rail (8). Multiple clamping assemblies (11) are installed on the second fixing block (10).

5. The testing fixture for automated chip production according to claim 4, characterized in that: The drive assembly (12) includes a motor (121) and a drive block (122). The motor (121) is mounted on one side of the mounting plate (3). The output shaft of the motor (121) is connected to a rotating rod. One end of the drive block (122) is fixedly connected to the rotating rod, and the other end is provided with a guide hole (123). The mounting plate (3) is provided with a limiting hole (124). The limiting hole (124) corresponds to the guide hole (123). A movable rod (125) is fixedly connected to the first fixed block (9). The end of the movable rod (125) away from the fixed block passes through the limiting hole (124) and the guide hole (123). A slip ring (126) is fixedly sleeved on the part of the movable rod (125) located in the limiting hole (124) and the guide hole (123). The two slip rings (126) slide and cooperate with the limiting hole (124) and the guide hole (123) respectively.

6. The testing fixture for automated chip production according to claim 4, characterized in that: The clamping assembly (11) includes an L-plate (111), a robotic arm (112), and an end effector (113). The L-plate (111) is mounted on the outside of the second fixing block (10). One end of the robotic arm (112) is connected to the bottom surface of the L-plate (111), and the other end is connected to the end effector (113).