Chip high-accelerated aging test box cable line pressure-resistant penetrating plate structure

Abstract

The utility model relates to chip testing equipment technical field, and disclose a kind of high acceleration ageing test box cable line pressure penetration plate structure for chip, including elastic inner core, penetration plate body and inner core pressure pipe, penetration plate body is set in the below of inner core pressure pipe, the elastic inner core is set in the inside of penetration plate body, the lower end inner wall of penetration plate body is equipped with tapered groove, the both sides of the elastic inner core are all set to taper, the surface of the elastic inner core is equipped with a plurality of threading hole, the surface of the elastic inner core and tapered groove is in abutment, the lower end of inner core pressure pipe extends to the inside of penetration plate body, the upper side of the elastic inner core is equipped with tapered metal gasket.This high acceleration ageing test box cable line pressure penetration plate structure for chip, directly penetrates plate by cable line, eliminates the uncertain factor of traditional connection, improves the accuracy and scientific nature of chip test result, satisfies multiple test standard requirement.

Description

Technical Field

[0001] This utility model relates to the field of chip testing equipment technology, specifically to a high-acceleration aging test chamber for chips with a cable pressure-resistant through-plate structure. Background Technology

[0002] In the use of high-acceleration aging test chambers for chips, it is necessary to achieve through-board connections for internal and external cables. Traditionally, when connecting internal and external wires in pressure vessel equipment, sintered ceramic copper wire terminals are installed, and cables are soldered to both sides of the ceramic terminals to complete the through-board connection. However, this traditional structure has many problems in chip accelerated aging testing scenarios: 1. Welding affects test accuracy: The chip under test needs to be tested with power on, and the voltage and current accuracy requirements are extremely high. However, after the traditional structure is welded twice, on the inner and outer sides, the welding method and the size of the solder joints will change the circuit resistance, increasing the uncertainty of the test results.

[0003] 2. Risk of contamination: Different solder materials may release heavy metals under high temperature, high humidity and high pressure environments, which may contaminate the test chamber and affect the accuracy of the test.

[0004] 3. Difficulty in maintenance and replacement: The connecting cables of high-acceleration aging equipment deteriorate after about 500 hours and need to be replaced regularly. However, traditional ceramic sintered terminals are difficult to disassemble and cannot be reused. Due to differences in batch, material, and process, the newly replaced terminals cannot be guaranteed to be consistent with the original products, resulting in inconsistent test results.

[0005] 4. Insufficient adaptability: Chip testing requirements are constantly changing, and the demand for test cables is becoming increasingly diversified. However, ceramic sintered terminals have limited styles and are cumbersome to replace, making them unable to meet the current diverse testing requirements. Utility Model Content

[0006] In view of the problems existing in the prior art, this utility model is proposed.

[0007] Therefore, the purpose of this utility model is to provide a high-acceleration aging test chamber cable pressure-resistant through-plate structure for chips, which solves the problems mentioned in the background art.

[0008] To achieve the above objectives, this utility model provides the following technical solution: A high-accelerated aging test chamber cable voltage withstand through-plate structure for chips is disclosed. The structure includes an elastic inner core, a through-plate body, and an inner core pressure tube. The through-plate body is located below the inner core pressure tube. The elastic inner core is disposed inside the through-plate body. A tapered groove is formed on the lower inner wall of the through-plate body. Both sides of the elastic inner core are tapered. Multiple wire-passing holes are formed on the surface of the elastic inner core. The elastic inner core abuts against the surface of the tapered groove. The lower end of the inner core pressure tube extends into the interior of the through-plate body. A tapered metal sleeve is fitted on the upper side of the elastic inner core. The inner core pressure tube has its lower end abutting against the side of the tapered metal gasket away from the elastic inner core. The outer wall of the through-plate body has a first external thread, and the inside of the through-plate body has an internal thread. The lower end of the inner core pressure tube has a second external thread, which is threadedly connected to the internal thread. Polygonal blocks are fitted abutting against each other on both sides of the upper end of the inner core pressure tube. The upper end of the inner core pressure tube is provided with a first limiting mechanism to restrict the movement of the two polygonal blocks. A polygonal sleeve is fitted on the upper outer wall of the through-plate body, and the upper end of the through-plate body is provided with a second limiting mechanism to restrict the movement of the polygonal sleeve.

[0009] Preferably, the first limiting mechanism includes a wedge block and a first bolt. The two wedge blocks are fixedly disposed on the outer walls of the upper ends of the inner core pressure tube. The two polygonal blocks are provided with wedge grooves at positions corresponding to the wedge blocks. The wedge blocks are engaged with the corresponding wedge grooves. A through hole is provided on the side of the polygonal block away from the inner core pressure tube. The first bolt is inserted into the through hole. A first threaded hole is provided on the side wall of the wedge block at a position corresponding to the first bolt. The first bolt is threadedly connected to the corresponding first threaded hole. One outer end of the first bolt abuts against the side of the polygonal block away from the inner core pressure tube.

[0010] Preferably, the second limiting mechanism includes a limiting plate and a second bolt. Both sides of the polygonal sleeve are provided with through slots. The limiting plate is engaged with the interior of the corresponding through slot. The side of the limiting plate away from the polygonal sleeve abuts against the outer wall of the through plate body. The upper and lower side walls of the limiting plate are provided with second threaded holes. The second bolt is threaded into the interior of the second threaded hole. The outer wall of the through plate body is provided with a third threaded hole at a position corresponding to the second threaded hole. One end of the second bolt is threadedly connected to the third threaded hole.

[0011] Preferably, the surfaces of the polygonal block and the polygonal sleeve are coated with a wear-resistant coating.

[0012] Preferably, the longitudinal section of both the limiting plate and the through groove is rectangular, and the side wall of the limiting plate abuts against the inner wall of the through groove.

[0013] Preferably, the conical metal gasket is a copper gasket.

[0014] Preferably, the elastic inner core is a Teflon inner core.

[0015] Preferably, the inner walls of the plurality of threading holes are provided with rubber sleeves.

[0016] The technical effects and advantages provided by this utility model in the above technical solution are as follows: 1. This utility model allows the cable to pass directly through the cavity, avoiding uncertainties such as resistance changes caused by welding, reducing test result errors, and making the chip test results more accurate and scientific.

[0017] 2. This utility model reduces the possibility of heavy metal contamination and cross-contamination by eliminating the need for welding and allowing for the disassembly and washing of components, thus meeting the cleanliness requirements of the test chamber.

[0018] 3. This utility model, through its threaded detachable structure, makes the components easy to disassemble and reuse, facilitates the replacement of cables and components, and avoids inconsistencies in testing caused by differences in new terminals.

[0019] 4. This utility model, with its customizable elastic inner core, can adapt to the needs of different test cables, meet diverse test standards, and overcome the limitations of the single style of traditional terminals.

[0020] 5. This utility model allows for the disassembly and replacement of polygonal blocks and polygonal sleeves, facilitating direct replacement after wear and tear, and ensuring stable loosening and tightening of the through-plate body and inner core pressure tube. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this utility model. For those skilled in the art, other drawings can be obtained based on these drawings.

[0022] Figure 1 This is a schematic diagram of the cable withstand voltage through-plate structure for a high-acceleration aging test chamber for chips proposed in this utility model. Figure 2 for Figure 1 Internal structure diagram; Figure 3 This is a perspective view of the inner core pressure tube in this utility model; Figure 4 This is a perspective view of the connection structure between the elastic inner core and the conical metal gasket in this utility model.

[0023] Figure 5 This is a perspective view of the elastic inner core in this utility model.

[0024] Explanation of reference numerals in the attached figures: 1. Through plate main body; 2. Inner core pressure tube; 3. Elastic inner core; 4. Conical metal gasket; 5. Thread hole; 6. Wedge block; 7. First bolt; 8. Polygonal sleeve; 9. Second bolt; 10. Internal thread; 11. First external thread; 12. Limiting plate; 13. Second external thread; 14. Polygonal block. Detailed Implementation

[0025] To enable those skilled in the art to better understand the technical solution of this utility model, the present utility model will be further described in detail below with reference to the accompanying drawings.

[0026] This utility model discloses a high-acceleration aging test chamber cable pressure-resistant through-plate structure for chips.

[0027] Reference Figure 1-5 A high-acceleration aging test chamber for chips includes a cable withstand voltage through-plate structure comprising an elastic inner core 3, a through-plate body 1, and an inner core pressure tube 2. The through-plate body 1 is located below the inner core pressure tube 2, and the elastic inner core 3 is located inside the through-plate body 1. The elastic inner core 3 is a Teflon inner core. A tapered groove is formed on the lower inner wall of the through-plate body 1. Both sides of the elastic inner core 3 are tapered. Multiple wire holes 5 are formed on the surface of the elastic inner core 3. The inner walls of the multiple wire holes 5 are provided with rubber sleeves to reduce wear on the cable. The elastic inner core 3 abuts against the surface of the tapered groove. The lower end of the inner core pressure tube 2 extends into the interior of the through-plate body 1. A tapered metal gasket 4, which is a copper gasket, is fitted on the upper side of the elastic inner core 3. The end of the conical metal gasket 4 abuts against the side away from the elastic inner core 3. The outer wall of the through plate body 1 is provided with a first external thread 11, and the inside of the through plate body 1 is provided with an internal thread 10. The lower end of the inner core pressure tube 2 is provided with a second external thread 13, which is threadedly connected to the internal thread 10. Polygonal blocks 14 are fitted on both sides of the upper end of the inner core pressure tube 2. A first limiting mechanism is provided at the upper end of the inner core pressure tube 2 to restrict the movement of the two polygonal blocks 14. A polygonal sleeve 8 is fitted on the upper outer wall of the through plate body 1. A second limiting mechanism is provided at the upper end of the through plate body 1 to restrict the movement of the polygonal sleeve 8. The surfaces of the polygonal blocks 14 and the polygonal sleeve 8 are coated with a wear-resistant coating to improve the wear resistance of the polygonal blocks 14 and the polygonal sleeve 8.

[0028] Reference Figure 1-5The first limiting mechanism includes a wedge block 6 and a first bolt 7. Two wedge blocks 6 are fixedly installed on the outer walls of the upper ends of the inner core pressure tube 2. Two polygonal blocks 14 are provided with wedge grooves at positions corresponding to the wedge blocks 6. The wedge blocks 6 are engaged with the corresponding wedge grooves. A through hole is provided on the side of the polygonal block 14 away from the inner core pressure tube 2. The first bolt 7 is inserted into the through hole. A first threaded hole is provided on the side wall of the wedge block 6 at a position corresponding to the first bolt 7. The first bolt 7 is threadedly connected to the corresponding first threaded hole. One outer end of the first bolt 7 abuts against the side of the polygonal block 14 away from the inner core pressure tube 2.

[0029] Reference Figure 1-5 The second limiting mechanism includes a limiting plate 12 and a second bolt 9. Both sides of the polygonal sleeve 8 are provided with through slots. The limiting plate 12 is engaged with the inside of the corresponding through slot. The side of the limiting plate 12 away from the polygonal sleeve 8 abuts against the outer wall of the through plate body 1. The upper and lower side walls of the limiting plate 12 are provided with second threaded holes. The second bolt 9 is threaded into the inside of the second threaded hole. The outer wall of the through plate body 1 and the position corresponding to the second threaded hole are provided with a third threaded hole. One end of the second bolt 9 is threadedly connected to the third threaded hole. The longitudinal section of the limiting plate 12 and the through slot is rectangular. The side wall of the limiting plate 12 abuts against the inner wall of the through slot.

[0030] In summary, this chip utilizes a high-acceleration aging test chamber cable pressure-resistant through-plate structure. During use, the cable is first passed through the through-hole 5 on the elastic inner core 3. The rubber sleeve on the inner wall of the through-hole prevents cable abrasion. Then, the elastic inner core 3 is placed into the conical groove of the through-plate body 1, ensuring its conical side fits against the groove wall. Using a wrench, the polygonal sleeve 8 is rotated, and the through-plate body 1 is fixed in the test chamber position via the first external thread 11. Next, the conical metal gasket 4 is fitted onto the elastic inner core 3. The lower end of the inner core pressure tube 2 is aligned with the internal thread 10 of the through-plate body 1. Using a wrench, the polygonal block 14 is rotated to screw the inner core pressure tube 2 into the through-plate body 1 until the lower end presses against the conical metal gasket 4. The deformation of the metal gasket pushes the elastic inner core 3 tightly against the conical groove, achieving a sealed pressure-resistant seal. When replacing cables or components, disassembly is performed in reverse, eliminating the need for soldering and avoiding resistance changes and contamination. Furthermore, the elastic inner core 3... It can be customized according to cable specifications. Polygonal block 14 and polygonal sleeve 8 can be replaced separately after wear to ensure long-term stable use. When polygonal sleeve 8 and polygonal block 14 are worn and cannot be properly loosened or tightened, the through plate body 1 and inner core pressure tube 2 can be replaced by loosening the first bolt 7 and removing the limiting plate 12. Then, the polygonal sleeve 8 can be replaced by loosening the second bolt 9 and moving the wedge block 6 longitudinally to separate the wedge block 6 from the wedge groove. Then, the polygonal block 14 can be disassembled and replaced.

[0031] The foregoing description only illustrates certain exemplary embodiments of the present invention. Undoubtedly, those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A high-acceleration aging test chamber cable withstand voltage through-plate structure for chips, comprising an elastic inner core (3), a through-plate body (1), and an inner core pressure tube (2), characterized in that: The through-plate body (1) is located below the inner core pressure tube (2), and the elastic inner core (3) is located inside the through-plate body (1). A conical groove is provided on the lower inner wall of the through-plate body (1). Both sides of the elastic inner core (3) are conical. Multiple through-holes (5) are provided on the surface of the elastic inner core (3). The elastic inner core (3) abuts against the surface of the conical groove. The lower end of the inner core pressure tube (2) extends into the interior of the through-plate body (1). A conical metal gasket (4) is fitted on the upper side of the elastic inner core (3). The lower end of the inner core pressure tube (2) abuts against the side of the conical metal gasket (4) away from the elastic inner core (3). The outer wall of the plate body (1) is provided with a first external thread (11), the inside of the plate body (1) is provided with an internal thread (10), the lower end of the inner core pressure tube (2) is provided with a second external thread (13), the second external thread (13) is threadedly connected to the internal thread (10), the upper end of the inner core pressure tube (2) is provided with polygonal blocks (14) on both sides, the upper end of the inner core pressure tube (2) is provided with a first limiting mechanism to restrict the movement of the two polygonal blocks (14), the upper end of the plate body (1) is provided with a polygonal sleeve (8), the upper end of the plate body (1) is provided with a second limiting mechanism to restrict the movement of the polygonal sleeve (8).

2. The high-acceleration aging test chamber cable withstand voltage through-plate structure for chips according to claim 1, characterized in that: The first limiting mechanism includes a wedge block (6) and a first bolt (7). The two wedge blocks (6) are fixedly disposed on the outer walls of the upper ends of the inner core pressure tube (2). The two polygonal blocks (14) are provided with wedge grooves at positions corresponding to the wedge blocks (6). The wedge blocks (6) are engaged with the corresponding wedge grooves. A through hole is provided on the side of the polygonal block (14) away from the inner core pressure tube (2). The first bolt (7) is inserted into the inside of the through hole. A first threaded hole is provided on the side wall of the wedge block (6) at a position corresponding to the first bolt (7). The first bolt (7) is threadedly connected to the corresponding first threaded hole. One outer end of the first bolt (7) abuts against the side of the polygonal block (14) away from the inner core pressure tube (2).

3. The high-acceleration aging test chamber cable withstand voltage through-plate structure for chips according to claim 1, characterized in that: The second limiting mechanism includes a limiting plate (12) and a second bolt (9). Both sides of the polygonal sleeve (8) are provided with through slots. The limiting plate (12) is engaged in the interior of the corresponding through slot. The side of the limiting plate (12) away from the polygonal sleeve (8) abuts against the outer wall of the through plate body (1). The upper and lower side walls of the limiting plate (12) are provided with second threaded holes. The second bolt (9) is threaded into the interior of the second threaded hole. The outer wall of the through plate body (1) and the position corresponding to the second threaded hole are provided with a third threaded hole. One end of the second bolt (9) is threadedly connected to the third threaded hole.

4. The high-acceleration aging test chamber cable withstand voltage through-plate structure for chips according to claim 1, characterized in that: The surfaces of the polygonal block (14) and the polygonal sleeve (8) are coated with a wear-resistant coating.

5. The high-acceleration aging test chamber cable withstand voltage through-plate structure for chips according to claim 1, characterized in that: The longitudinal section of the limiting plate (12) and the through groove is rectangular, and the side wall of the limiting plate (12) abuts against the inner wall of the through groove.

6. The high-acceleration aging test chamber cable withstand voltage through-plate structure for chips according to claim 1, characterized in that: The conical metal gasket (4) is a copper gasket.

7. The high-acceleration aging test chamber cable withstand voltage through-plate structure for chips according to claim 1, characterized in that: The elastic inner core (3) is a Teflon inner core.

8. The high-acceleration aging test chamber cable withstand voltage through-plate structure for chips according to claim 1, characterized in that: The inner walls of the multiple threading holes (5) are provided with rubber sleeves.

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