Test device
CN224695464UActive Publication Date: 2026-08-28HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO LTD +1
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Patent Information
- Application Number
- CN202521653580.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-05
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2035-08-05
AI Technical Summary
Technical Problem
[0003]然而，物理按键在长期使用过程中，会受到频繁按压、摩擦、磨损等多种因素的影响，导致按键性能下降，甚至出现故障
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Figure CN224695464U_ABST
Abstract
A test device for testing the use frequency of a key of a workpiece comprises a base plate provided with a loading position, a driving assembly including a test driving member, a first rotating shaft and a first eccentric wheel, the test driving member being arranged on a side of the base plate away from the loading position, the first rotating shaft being connected to the base plate and connected to the test driving member, and the first eccentric wheel being connected to the first rotating shaft, a first sliding mechanism including a first sliding assembly and a first elastic member, the first sliding assembly being slidingly connected to the base plate and arranged between the loading position and the first eccentric wheel, and the first elastic member being configured to drive the first sliding assembly to move away from the loading position, a pressing assembly connected to the first sliding assembly and arranged corresponding to the key, and a counting assembly including a sensing member and a counting sensor, the sensing member being connected to the first rotating shaft, and the counting sensor being arranged close to the first rotating shaft and configured to sense the sensing member. The test device can detect the use frequency of the key of the workpiece.
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