A probe assembly
CN224695957UActive Publication Date: 2026-08-28杭州辛想科技有限公司
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Patent Information
- Application Number
- CN202521696227.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-11
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2035-08-11
AI Technical Summary
Technical Problem
在现有技术中，现有的探针组件包括探针主体和压头，压头连接于探针主体，电流依次通过探针主体和压头，传递至被测试工件；但是，交变电流场景下，因趋肤效应的影响，电流集中分布在探针主体的表层，而探针主体的中心区域无电流通过，导致现有的探针组件的过流能力较低
Benefits of technology
本实用新型提供一种探针组件，探针主体设有容纳槽；压头一体连接或者分体连接于探针主体；压头的周侧壁设有多个第一凹槽，多个第一凹槽间隔布置，并沿着压头的周侧壁的环形方向布置；导电件包括多股铜丝线，多股铜丝线相缠绕，并相互绝缘；多股铜丝线均容纳于容纳槽；多股铜丝线的两端分别连接压头的侧壁和探针主体的内侧壁，以便于多股铜丝线充分利用容纳槽的空间，从而实现了探针主体和压头的电导通，不仅适用于常规的直流电，还适用于交流电，尤其是高频交变电流，避免了电流集中分布在探针主体的表层而探针主体的中心区域无电流通过，提高了探针组件的过流能力。同时，降低表面趋肤效应对过流能力的影响，减少探针组件的发热，保证了探针组件的电流的传输效果，降低能量损耗。通过布置多股铜丝线代替单根铜柱，增大了导电件的表面积，降低了趋肤效应的影响，提升了探针组件的过流能力。
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Abstract
The application provides a probe assembly, which comprises a probe body, a pressure head and a conductive part; the probe body is provided with a containing groove; the pressure head is integrally connected or separately connected to the probe body; the circumferential wall of the pressure head is provided with a plurality of first grooves, which are arranged at intervals and along the annular direction of the circumferential wall of the pressure head; the conductive part comprises a plurality of copper wire strands, which are wound and insulated with each other; the plurality of copper wire strands are contained in the containing groove; the two ends of the plurality of copper wire strands are respectively connected to the side wall of the pressure head and the inner side wall of the probe body, so that the plurality of copper wire strands make full use of the space of the containing groove, thereby realizing the electric conduction of the probe body and the pressure head, which is not only suitable for conventional direct current but also suitable for alternating current, especially high-frequency alternating current, thereby avoiding the current concentrated distribution on the surface layer of the probe body and no current passing through the central region of the probe body, and improving the current carrying capacity of the probe assembly.
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