Chip testing machine and chip testing device
CN224696027UActive Publication Date: 2026-08-28STELIGHT INSTR CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202521857853.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-29
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2035-08-29
AI Technical Summary
Technical Problem
[0003]本实用新型的一个目的是要提供一种芯片测试机，解决现有技术中芯片测试效率低的技术问题
Benefits of technology
[0016]本实用新型中输送盘具有第一区域和第二区域，且用于承载被测芯片，测试基座设置成受控地朝向探针座移动至测试位，并使得被测芯片与探针卡接触。输送机构的中转通道的一端布置于探测座与芯片上下料机之间，中转通道的另一端与吸附组件对接，输送盘能够在中转通道上移动。吸附组件用于将测试基座上完成测试的被测芯片搬运至第二区域，并将第一区域上待测试的被测芯片搬运至测试基座。上述技术方案中被测芯片的上料和下料均采用同一个输送盘，输送盘输送一次就可以完成芯片测试机的上料和下料，可以减少输送次数，提高芯片的测试效率。
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN224696027U_ABST
Abstract
The utility model provides a kind of chip testing machine and chip testing equipment, it is related to chip testing technical field.The utility model discloses conveying disc has first area and second area, and for bearing measured chip, test pedestal is set to controlledly move to test site towards probe base, and make test chip and probe card contact.One end of transfer channel of conveying mechanism is arranged between detection seat and chip feeding and discharging machine, the other end of transfer channel and adsorption component butt joint, conveying disc can move on transfer channel.Adsorption component is used to carry measured chip on test pedestal to second area after completing test, and measured chip on first area is carried to test pedestal before test.In the above technical scheme, feeding and discharging of measured chip are all used same conveying disc, and feeding and discharging of chip testing machine can be completed by conveying disc once, so that conveying frequency can be reduced, and the test efficiency of chip can be improved.
Need to check novelty before this filing date? Find Prior Art