Nandflash testing equipment
CN224696504UActive Publication Date: 2026-08-28SHENZHEN JINGFENG SEMICON CO LTD
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Patent Information
- Application Number
- CN202522003043.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-17
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2035-09-17
AI Technical Summary
Technical Problem
[0004]本实用新型提供了Nand flash测试设备，能够解决操作人员必须通过狭窄的观察窗口将手臂伸入高温腔体内部取放芯片，人工取片耗时长，极易接触高温部件导致烫伤，其中安全隐患突出，同时影响测试效率的问题
Benefits of technology
[0016]本申请实施例提供的技术方案可以包括以下有益效果：本申请设计了Nand flash测试设备，能够解决操作人员必须通过狭窄的观察窗口将手臂伸入高温腔体内部取放芯片，人工取片耗时长，极易接触高温部件导致烫伤，其中安全隐患突出，同时影响测试效率的问题。
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Smart Images
Figure CN224696504U_ABST
Abstract
The utility model discloses a nand flash testing device, include: equipment main part, including equipment shell, cabinet door, control panel and bearing plate, the cabinet door is located equipment shell one side, bearing plate is located equipment shell's inside, and the upper end mounting of bearing plate has nand flash chip depositing bin, feeding assembly is set up in the junction of equipment shell and bearing plate, including the inner chamber of being set up in the inside of equipment shell, and the inside installation of inner chamber has drive motor, the output of drive motor is connected with the threaded rod, can solve the operator and must be through the narrow observation window and stretch the arm into the high temperature cavity inside and take the chip, and the manual slice takes the long time, and it is extremely easy to contact the high temperature part and lead to scald, wherein the security hidden danger is outstanding, and the problem of simultaneously influence test efficiency.
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