Pogo pin connector for accelerated aging testing

Abstract

Disclosed is a pogo pin connector for accelerated aging test, wherein a pogo pin structure is arranged on a PCB circuit board, a pogo pin fixing seat is connected to the PCB circuit board, at least one set of spring large pins and at least one set of spring small pins are arranged at equal intervals on the upper end face and the lower end face of the pogo pin fixing seat, and the spring large pins for power supply and the spring small pins for communication are in one-to-one correspondence; a first permanent magnet and a second permanent magnet are symmetrically arranged on both sides of the pogo pin structure and fixed on the PCB circuit board; a fixing frame is fixedly connected to the bottom end of the PCB circuit board, and the fixing frame is provided with a groove for accommodating the lower end part of the pogo pin structure.

Description

Technical Field

[0001] This utility model relates to the field of high-current Pogopin connection technology, and in particular to a spring pin connector for accelerated aging testing. Background Technology

[0002] Currently used burn-in boards encounter issues with high-current connectors bending or shortening during oven aging tests, preventing proper power-on. Furthermore, vibrations from oven operation can loosen connectors, impacting the product testing quality across the 180 test points on the burn-in board.

[0003] The information disclosed in the background section is only intended to enhance the understanding of the background of this utility model, and therefore may contain information that does not constitute prior art known to those skilled in the art. Utility Model Content

[0004] To address the shortcomings or defects of the existing technology, a spring pin connector for accelerated aging testing is provided, which improves the test success rate of burn-in boards and reduces component wear and replacement costs.

[0005] The purpose of this utility model is achieved through the following technical solutions.

[0006] A spring pin connector for accelerated aging testing includes, PCB circuit board; A spring-loaded pin structure is disposed on the PCB circuit board. The spring-loaded pin structure includes... A spring pin holder connects to the PCB circuit board. At least one set of large spring pins and at least one set of small spring pins are arranged at equal intervals and disposed on the upper and lower end faces of the spring pin fixing seat, with the large spring pins for power supply and the small spring pins for communication corresponding one to one. The first permanent magnet and the second permanent magnet are symmetrically arranged on both sides of the spring pin structure and fixed on the PCB circuit board; A mounting bracket is fixedly connected to the bottom of the PCB circuit board, and the mounting bracket is provided with a groove to accommodate the lower end portion of the spring pin structure.

[0007] In the spring pin connector used for accelerated aging testing, the first and second permanent magnets generate an attractive force through a coil to enhance the stability of the spring pin connector.

[0008] In a spring pin connector used for accelerated aging testing, the groove size matches the spring pin holder, so that the spring pin holder is securely placed within the groove.

[0009] In the spring pin connector used for accelerated aging testing, multiple large spring pins are arranged at equal intervals on the left and right sides of the upper and lower end faces of the spring pin holder, and multiple small spring pins are arranged at equal intervals between the large spring pins on the left and right sides. The large spring pins and small spring pins on the upper and lower end faces of the spring pin holder correspond one-to-one.

[0010] In the spring pin connector used for accelerated aging testing, the number of large spring pins and small spring pins are the same.

[0011] In the spring pin connector used for accelerated aging tests, the retainer is fixedly connected to the PCB circuit board by screws.

[0012] In the spring pin connector used for accelerated aging testing, the lower end face of the spring pin holder is provided with spring pin pins, which are soldered into the corresponding holes on the PCB circuit board.

[0013] In the spring pin connector used for accelerated aging testing, the spring pin connector is detachably connected to the accelerated aging test board.

[0014] In the spring pin connector used for accelerated aging testing, the large spring pin and the small spring pin will not loosen or fall off without being subjected to a tensile force exceeding 30 kg.

[0015] In spring-loaded pin connectors used for accelerated aging tests, the spring-loaded pin connectors have a symmetrical structure.

[0016] Compared with the prior art, the beneficial effects of this utility model are as follows: This invention solves the problems of loose connections and misalignment of the mating positions. Even vibrations generated during equipment operation will not cause the burn-in plate to loosen or detach. The pogopin is connected by a spring pin and a metal point on the female base. This design effectively solves the problem of intermittent power loss caused by vibration. The electromagnet generates a strong attraction through the coil, and it will not loosen or detach unless subjected to a pulling force of more than 30 kg.

[0017] The description is merely an overview of the technical solution of this utility model. In order to make the technical means of this utility model clearer and more understandable, so that those skilled in the art can implement it according to the contents of the specification, and in order to make the described and other objects, features and advantages of this utility model more obvious and easy to understand, specific embodiments of this utility model are illustrated below. Attached Figure Description

[0018] Various other advantages and benefits of this invention will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiments below. The accompanying drawings are for illustrative purposes only and are not intended to limit the scope of this invention. Obviously, the drawings described below are merely some embodiments of this invention, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. Furthermore, the same reference numerals denote the same parts throughout the drawings.

[0019] In the attached diagram: Figure 1 A schematic diagram of a spring pin connector for accelerated aging testing provided in one embodiment; Figure 2 yes Figure 1 The diagram shows the disassembly of the spring pin connector used for accelerated aging testing. Figure 3 yes Figure 1 The diagram shows a schematic of the spring pin structure in a spring pin connector used for accelerated aging testing.

[0020] The present invention will be further explained below with reference to the accompanying drawings and embodiments. Detailed Implementation

[0021] Specific embodiments of the present invention will now be described in more detail with reference to the accompanying drawings. While specific embodiments of the present invention are shown in the drawings, it should be understood that the present invention can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of the present invention and to fully convey the scope of the present invention to those skilled in the art.

[0022] It should be noted that certain terms are used in the specification and claims to refer to specific components. Those skilled in the art will understand that different terms may be used to refer to the same component. This specification and claims do not distinguish components based on differences in terminology, but rather on differences in function. The terms "comprising" or "including" used throughout the specification and claims are open-ended and should be interpreted as "comprising but not limited to." The following descriptions of the preferred embodiments of the present invention are for the purpose of implementing the general principles of the specification and are not intended to limit the scope of the present invention. The scope of protection of this invention shall be determined by the appended claims.

[0023] To facilitate understanding of the embodiments of this utility model, the following will provide further explanation and description with reference to the accompanying drawings and several specific embodiments. The accompanying drawings do not constitute a limitation on the embodiments of this utility model.

[0024] To better understand, such as Figures 1 to 3 As shown, a spring pin connector for accelerated aging testing includes, PCB circuit board 3; A spring-loaded pin structure is disposed on the PCB circuit board 3. The spring-loaded pin structure includes... The spring pin holder 5 is connected to the PCB circuit board 3. At least one set of large spring pins 6 and at least one set of small spring pins 7 are arranged at equal intervals and disposed on the upper and lower end faces of the spring pin fixing seat, with the large spring pins for power supply and the small spring pins for communication corresponding one to one. The first permanent magnet 2-1 and the second permanent magnet 2-2 are symmetrically arranged on both sides of the spring pin structure and fixed on the PCB circuit board 3; The fixing bracket 4 is fixedly connected to the bottom end of the PCB circuit board 3, and the fixing bracket 4 is provided with a groove to accommodate the lower end of the spring pin structure.

[0025] In a preferred embodiment of the spring pin connector for accelerated aging testing, the first permanent magnet 2-1 and the second permanent magnet 2-2 generate attraction through a coil to enhance the stability of the spring pin connector.

[0026] In a preferred embodiment of the spring pin connector for accelerated aging testing, the groove size matches the spring pin retainer 5, so that the spring pin retainer is securely placed in the groove.

[0027] In a preferred embodiment of the spring pin connector for accelerated aging testing, multiple large spring pins are arranged at equal intervals on the left and right sides of the upper and lower end faces of the spring pin holder, and multiple small spring pins are arranged at equal intervals between the large spring pins on the left and right sides. The large spring pins and small spring pins on the upper and lower end faces of the spring pin holder correspond one-to-one.

[0028] In a preferred embodiment of the spring pin connector for accelerated aging testing, the number of large spring pins and small spring pins are the same.

[0029] In a preferred embodiment of the spring pin connector for accelerated aging testing, the mounting bracket is fixedly connected to the PCB circuit board by screws.

[0030] In a preferred embodiment of the spring pin connector for accelerated aging testing, the lower end face of the spring pin holder is provided with a spring pin pin 8, which is soldered into the corresponding hole on the PCB circuit board.

[0031] In a preferred embodiment of the spring pin connector for accelerated aging testing, the spring pin connector is detachably connected to the accelerated aging test board.

[0032] In a preferred embodiment of the spring pin connector for accelerated aging testing, the large spring pin and the small spring pin will not loosen or fall off unless subjected to a tensile force exceeding 30 kg.

[0033] In a preferred embodiment of the spring pin connector for accelerated aging testing, the spring pin connector has a symmetrical structure.

[0034] In one embodiment, such as Figure 1 As shown, the spring pin connector used for accelerated aging testing includes: a PCB circuit board 3, on which a spring pin structure is disposed; a first permanent magnet 2-1 and a second permanent magnet 2-2 are also disposed on the PCB circuit board; the first permanent magnet 2-1 and the second permanent magnet 2-2 are symmetrically disposed on both sides of the spring pin structure and fixed to the PCB circuit board by screws. The two rows of holes on the PCB circuit board 3 are for inserting the spring pin pins; the four large spring pins on the left are the positive power terminals, and the four large spring pins on the right are the negative power terminals.

[0035] In another exemplary embodiment, the spring needle structure includes: a spring needle holder 5, a large spring needle 6, and a small spring needle 7. The spacing between the large needles is 7mm, the spacing between the small needles is also 7mm, the horizontal spacing between the large and small needles is 7mm, and the vertical spacing between the large and small needles is 8mm.

[0036] In this embodiment, as Figure 3 As shown, four large spring pins are arranged at equal intervals on the left and right sides of the upper and lower end faces of the spring pin holder 5, and eight small spring pins are arranged at equal intervals between the large spring pins on the left and right sides. The large and small spring pins on the upper and lower end faces of the spring pin holder 5 correspond one-to-one.

[0037] In another exemplary embodiment, a mounting bracket is also included, which is located at the bottom end of the PCB circuit board and is fixedly connected to the PCB circuit board by screws.

[0038] In this embodiment, as shown in the figure, the fixing frame is provided with a groove, the groove is matched with the size of the spring pin fixing seat, and the spring pin tube foot located on the lower end face of the spring pin fixing seat is located in the groove.

[0039] Furthermore, this invention symmetrically arranges a first permanent magnet 2-1 and a second permanent magnet 2-2 on the PCB circuit board. By symmetrically arranging permanent magnets on both sides, a strong magnetic attraction is generated during connector mating, achieving automatic alignment and rapid positioning, effectively preventing connection misalignment or loosening caused by equipment vibration; simultaneously improving overall connection stability, avoiding accidental detachment during testing, and significantly improving the electrical connection reliability during burn-in testing. The spring pin structure includes a large spring pin 6, a small spring pin 7, and a spring pin fixing seat 5. It utilizes the elastic deformation of the spring to compensate for mechanical tolerances and minute displacements, ensuring stable electrical contact even with slight misalignment during mating. The large spring pin undertakes the main high-current conduction task, while the small spring pin assists in signal transmission or redundant conductive paths, jointly improving the connector's current-carrying capacity and electrical continuity, solving the problem of intermittent power outages caused by vibration in traditional connectors. The large and small spring pins are symmetrically arranged on the upper and lower ends of the spring pin holder and are corresponding to each other, realizing a double-sided contact design, enhancing connection compatibility and fault tolerance; the corresponding arrangement ensures symmetrical distribution of the current path, reduces the risk of local overheating, optimizes current balance, and improves overall heat dissipation performance and long-term working stability. The mounting bracket (4) is provided with a groove that matches the size of the spring pin holder, which physically limits and mechanically supports the spring pin structure, preventing it from lateral displacement or torsional deformation under vibration; the groove structure enhances assembly accuracy and structural rigidity, protects the spring pin pins (8) from external force damage, and extends the service life of the connector. The mounting bracket is fixedly connected to the PCB circuit board by screws, providing a firm mechanical anchor, enhancing the structural strength of the entire connector module, preventing internal components from loosening or desoldering due to continuous vibration during oven operation, and ensuring structural integrity during long-term high-temperature aging tests. The spring pin structure is integrated with the PCB circuit board and forms a modular unit with the permanent magnet, realizing a highly integrated integrated structure, which is convenient for mass production and maintenance replacement; the modular design is conducive to standardized application, adapting to different models of burn-in boards, and reducing production line adaptation costs. The overall structural design can withstand a tensile force of over 30kg without falling off, significantly improving the connector's pull-out resistance and ensuring a reliable connection even under severe vibration or unexpected external forces. This fundamentally eliminates test interruptions or data loss caused by connection failure, greatly improving the test success rate.

[0040] The basic principles of this application have been described above with reference to specific embodiments. However, it should be noted that the advantages, benefits, and effects mentioned in this application are merely examples and not limitations, and should not be considered as essential features of each embodiment of this application. Furthermore, the specific details disclosed above are for illustrative and facilitative purposes only, and are not limitations. These details do not limit the application to the necessity of employing the aforementioned specific details for implementation.

[0041] The above description has been given for purposes of illustration and description. Furthermore, this description is not intended to limit the embodiments of this application to the forms disclosed herein. Although numerous exemplary aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, alterations, additions, and sub-combinations thereof.

Claims

1. A spring pin connector for accelerated aging testing, characterized in that, It includes, PCB circuit board (3); A spring pin structure is disposed on the PCB circuit board (3). The spring pin structure includes, Spring pin holder (5) is connected to the PCB circuit board (3). At least one set of large spring pins (6) and at least one set of small spring pins (7) are arranged at equal intervals and disposed on the upper and lower end faces of the spring pin fixing seat. The large spring pins used for power supply and the small spring pins used for communication correspond one to one. The first permanent magnet (2-1) and the second permanent magnet (2-2) are symmetrically arranged on both sides of the spring pin structure and fixed on the PCB circuit board (3); The fixing bracket (4) is fixedly connected to the bottom end of the PCB circuit board (3), and the fixing bracket (4) is provided with a groove to accommodate the lower end of the spring pin structure.

2. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The first permanent magnet (2-1) and the second permanent magnet (2-2) generate attraction through the coil to enhance the stability of the spring pin connector.

3. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The groove size matches the spring pin holder (5), so that the spring pin holder is securely placed in the groove.

4. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The upper and lower ends of the spring pin holder are provided with multiple large spring pins arranged at equal intervals on the left and right sides, and multiple small spring pins arranged at equal intervals between the large spring pins on the left and right sides. The large spring pins and small spring pins on the upper and lower ends of the spring pin holder correspond one-to-one.

5. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The number of large spring needles and small spring needles is the same.

6. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The mounting bracket is fixedly connected to the PCB circuit board by screws.

7. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The lower end face of the spring pin holder is provided with a spring pin pin, which is soldered into the corresponding hole on the PCB circuit board.

8. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The spring pin connector can be detachably connected to the accelerated aging test board.

9. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The large and small spring needles will not loosen or fall off unless subjected to a pulling force exceeding 30 kg.

10. The spring pin connector for accelerated aging testing as described in claim 1, characterized in that, The spring pin connector has a symmetrical structure.

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