Wafer etching apparatus
Patent Information
- Application Number
- CN202521246012.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-17
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2035-06-17
AI Technical Summary
[0003]现有的晶圆对准方法需要先将晶圆放置在静电吸盘上进行刻蚀,根据预设函数和晶圆上多个采样点的刻蚀速率来确定机械和理想中心点的偏移量及方向,这意味着如果在刻蚀过程中发现位置偏差,已经刻蚀的部分无法调整,从而导致刻蚀缺陷的产生
[0015]本申请提供的晶圆刻蚀设备的有益效果在于:通过在刻蚀腔内设置激光检测组件测量晶圆边缘和环形承托组件侧壁的实际距离,以及控制器预设一个标准距离,该标准距离是晶圆与环形承托组件理想对齐时,晶圆边缘与环形承托组件的距离,控制器将实际距离与标准距离比较,如果实际距离与标准距离不一致,则判断晶圆未对齐,并根据实际距离与标准距离之间的差距控制传送组件调整晶圆与环形承托组件对齐,实现在晶圆刻蚀前进行精确对准,确保晶圆在刻蚀过程中能够精确对齐到环形承托组件上,从而提高刻蚀工艺的精度和均匀性。
Smart Images

Figure CN224698228U_ABST
Abstract
Claims
1. A wafer etching apparatus, characterized in that, include: Etching cavity; An annular support assembly is disposed within the etching cavity to support the wafer; A conveyor, disposed within the etching cavity, is used to convey the wafer to the annular support assembly; A laser detection component, disposed within the etching cavity, is used to detect the actual distance between the wafer edge and the sidewall of the annular support component; The controller is electrically connected to the annular support assembly, the laser detection assembly, and the conveyor. The controller has a preset standard distance and determines whether the wafer is aligned with the annular support assembly based on the actual distance and the standard distance. When it is determined that the wafer is not aligned, the controller controls the conveyor to adjust the position of the wafer.
2. The wafer etching equipment according to claim 1, characterized in that, The laser detection component includes; A first laser emitter is disposed on the sidewall of the etching cavity and is at the same horizontal plane as the conveying component. It is used to emit laser light toward the side of the wafer and generate first distance data between the wafer and the first laser emitter. The second laser emitter is disposed on the sidewall of the etching cavity, located below the first laser emitter and at the same level as the annular support assembly, for emitting laser light toward the sidewall of the annular support assembly and generating second distance data between the sidewall of the annular support assembly and the second laser emitter; A data processor, electrically connected to the controller, is used to receive the first distance data and the second distance data, and to calculate the actual distance between the wafer and the sidewall of the annular support assembly based on the first distance data and the second distance data.
3. The wafer etching equipment according to claim 2, characterized in that, The annular support assembly includes: A support stage, disposed within the etching cavity, is used to support the wafer; An edge ring is provided around the edge of the support platform, and the second laser emitter is on the same horizontal plane as the edge ring; A lifting pin, mounted on the support platform and electrically connected to the controller, is used to receive the wafer being transported by the conveyor and to drive the wafer to rise and fall.
4. The wafer etching equipment according to claim 3, characterized in that, The first laser emitter is slidably connected to the sidewall of the etching cavity. When the lifting pin moves the wafer up and down, the first laser emitter moves up and down synchronously.
5. The wafer etching equipment according to claim 3, characterized in that, The controller includes: A location determination unit; used to receive the actual distance and compare the actual distance with a preset standard distance; When the actual distance is equal to the standard distance, it is determined that the wafer is aligned with the annular support assembly; When the actual distance is not equal to the standard distance, it is determined that the wafer and the annular support assembly are not aligned.
6. The wafer etching apparatus according to claim 5, characterized in that, The controller also includes: A distance calculation unit is used to receive the actual distance and calculate the calibration value of the wafer based on the actual distance and the standard distance.
7. The wafer etching apparatus according to claim 6, characterized in that, The controller also includes: A control execution unit is configured to receive the calibration value, generate a control command based on the calibration value, and send the control command to the transmission component and the lifting pin. The rising pin raises the wafer to the conveyor according to the control command; The transporter adjusts the wafer position according to the control command.
8. The wafer etching apparatus according to any one of claims 1-7, characterized in that, It also includes an alarm component connected to the controller. When it is determined that the wafer is not aligned with the annular support component, the controller controls the alarm component to issue an alarm message.
9. The wafer etching apparatus according to claim 8, characterized in that, The alarm component includes: A buzzer is connected to the controller. When it is determined that the wafer is not aligned with the annular support assembly, the controller controls the buzzer to sound.
10. The wafer etching apparatus according to claim 8, characterized in that, The alarm component also includes: A warning light, connected to the controller, is used to flash when the controller determines that the wafer is not aligned with the annular support assembly.