Test apparatus and system

Abstract

This application relates to a testing apparatus and system. The testing apparatus includes a machine base, a support component, and a testing component. The support component is movably mounted on the machine base to support the product under test (DUT). The testing component includes an optical test piece, a spectrometer, and a light source. The optical test piece is movably mounted on the machine base to test the response time, chromaticity, and brightness of the DUT. The spectrometer is mounted on the machine base and can rotate around the support component to test the viewing angle and reflectivity of the DUT. The light source is detachably mounted on the machine base to project a test beam onto the DUT. The testing apparatus provided in this application integrates the optical test piece, spectrometer, and light source into the testing apparatus, enabling the testing of various types of photoelectric properties of the DUT, including response time, chromaticity, brightness, viewing angle, and reflectivity. This shortens the testing cycle and reduces the testing cost of the DUT.

Description

Technical Field

[0001] This application relates to the field of product testing technology, and in particular to a testing device and system. Background Technology

[0002] Silicon-based OLED (OLED-on-Silicon, or OLEDoS or Micro OLED for short) is a display technology that directly integrates organic light-emitting diodes (OLEDs) onto a single-crystal silicon substrate. It combines the self-emissive characteristics of OLEDs with the advantages of silicon-based CMOS driving, and features high resolution, high contrast, and fast response. It is widely used in AR / VR, near-eye displays and other fields.

[0003] In the research and development and production of silicon-based OLEDs, it is necessary to test and analyze their photoelectric properties (such as dynamic response time, reflectivity, viewing angle, chromaticity, and brightness). Currently, when testing various photoelectric properties of silicon-based OLEDs, it is usually necessary to move the silicon-based OLED to different testing equipment for specific photoelectric performance testing and analysis, which significantly increases the testing cycle and testing cost of silicon-based OLEDs. Utility Model Content

[0004] Therefore, it is necessary to provide a testing device and system to address the problems of excessively high testing cycles and costs associated with existing silicon-based OLED photoelectric performance testing.

[0005] A testing apparatus, the testing apparatus comprising:

[0006] Machine tool;

[0007] A carrier component, which is movably disposed on the machine base, is used to carry the product to be tested;

[0008] The testing assembly includes an optical test piece, a spectrometer, and a light source. The optical test piece is movably mounted on the machine platform and is used to test the response time, chromaticity, and brightness of the product under test. The spectrometer is mounted on the machine platform and can rotate around the support assembly to test the viewing angle and reflectivity of the product under test. The light source is detachably mounted on the machine platform and is used to project a test beam onto the product under test.

[0009] In one embodiment, the carrier assembly includes a cavity and a carrier platform. The cavity is movably disposed on the machine tool, and the carrier platform is movably disposed within the cavity. The carrier platform is rotatable relative to the cavity and is used to carry the product to be tested.

[0010] In one embodiment, the testing device further includes a first multi-axis module and a second multi-axis module. The cavity is disposed in the first multi-axis module, which is used to adjust the X-axis and Y-axis positions of the cavity. The second multi-axis module is disposed in the cavity, and the bearing platform is disposed in the second multi-axis module, which is used to adjust the X-axis, Y-axis, and Z-axis positions of the bearing platform.

[0011] In one embodiment, the testing assembly further includes an integrating sphere detachably disposed in the cavity for collecting test beams from the surface of the product under test and for connecting to the spectrometer.

[0012] In one embodiment, the testing device further includes a rotating shaft assembly, a first rotating frame, and a second rotating frame. The rotating shaft assembly is disposed on the machine base. One end of the first rotating frame is rotatably connected to the rotating shaft assembly, and the other end is connected to the spectrometer. One end of the second rotating frame is rotatably connected to the rotating shaft assembly, and the other end is detachably connected to the light source.

[0013] In one embodiment, the rotating shaft assembly includes a drive source, a gear set, a first rotating shaft, and a second rotating shaft rotatably sleeved on the first rotating shaft. The first rotating shaft is rotatably disposed on the machine base. The drive source is drivenly connected to the gear set, and the gear set is simultaneously drivenly connected to both the first rotating shaft and the second rotating shaft for driving the first rotating shaft and the second rotating shaft to rotate in opposite directions. The first rotating frame is rotatably connected to the first rotating shaft, and the second rotating frame is rotatably connected to the second rotating shaft.

[0014] In one embodiment, the gear set includes a first bevel gear and a second bevel gear and a third bevel gear respectively meshing on opposite sides of the first bevel gear. The first bevel gear is driven to the output end of the drive source, the second bevel gear is driven to the first rotating shaft, and the third bevel gear is driven to the second rotating shaft.

[0015] In one embodiment, the testing device further includes a temperature control module and a temperature acquisition element. Both the temperature control module and the temperature acquisition element are disposed on the support component, and the temperature control module and the temperature acquisition element are communicatively connected. The temperature control module is used to control the temperature of the support component, and the temperature acquisition element is used to acquire the temperature of the support component.

[0016] In one embodiment, the testing apparatus further includes a position sensing element movably disposed on the machine tool for sensing the position information of the carrier component.

[0017] A testing system, the testing system comprising:

[0018] The testing device as described in any of the above technical solutions.

[0019] The aforementioned testing apparatus and system place the product under test (DUT) on a support component. The movement of the support component and the optical test piece aligns the DUT with the optical test piece. The optical test piece then tests the DUT's response time, chromaticity, and luminance. The support component continues to move until it aligns with the spectrometer. The spectrometer rotates around the support component to test the DUT's viewing angle from multiple different angles. A light source is positioned on the test platform and projects a test beam onto the DUT. The DUT reflects the test beam, which is captured by the spectrometer, which then measures the DUT's reflectivity. This testing apparatus integrates the optical test piece, spectrometer, and light source, enabling the testing of various photoelectric properties of the DUT, including response time, chromaticity, luminance, viewing angle, and reflectivity. This shortens the testing cycle and reduces the testing cost of the DUT. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the test apparatus provided in some embodiments.

[0021] Figure 2 This is a schematic diagram of the test apparatus provided in some embodiments.

[0022] Figure 3 This is an exploded view of the carrier component provided in some embodiments.

[0023] Figure 4 A schematic diagram of the structure of the load-bearing component and the second multi-axis module provided in some embodiments.

[0024] Figure 5 This is a schematic diagram of the structure of the test component and the rotating shaft component as a module in some embodiments.

[0025] Figure 6 This is a cross-sectional view of the shaft assembly provided in some embodiments.

[0026] Figure 7 This is a front view of the test apparatus provided in some embodiments.

[0027] Figure 8 This is a side view of the test apparatus provided in some embodiments.

[0028] Figure label:

[0029] 100. Testing equipment;

[0030] 110. Machine base; 120. Support assembly; 121. Cavity; 122. Support platform; 123. Turntable; 130. Test assembly; 131. Optical test piece; 132. Spectrometer; 133. Light source; 134. Integrating sphere; 135. First rotating frame; 136. Second rotating frame; 137. Position sensing element; 140. First multi-axis module; 141. First X-axis sliding module; 142. First Y-axis sliding module; 150. Second multi-axis module; 151. Second X-axis sliding module Modules; 152, Second Y-axis sliding module; 153, Z-axis sliding module; 160, Rotating shaft assembly; 161, Drive source; 162, Gear set; 1621, First bevel gear; 1622, Second bevel gear; 1623, Third bevel gear; 163, First rotating shaft; 164, Second rotating shaft; 165, Coupling; 170, Temperature control module; 171, Temperature acquisition element; 180, Outer cover; 181, Material inlet; 182, Safety light curtain; 183, Lifting door; 190, Cleaning component. Detailed Implementation

[0031] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0032] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0033] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0034] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0035] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0036] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0037] The technical solutions provided by the embodiments of this application are described below with reference to the accompanying drawings.

[0038] See Figure 1 and Figure 2 As shown, this application provides a testing apparatus 100, which includes a machine base 110, a support component 120, and a testing component 130. The support component 120 is movably disposed on the machine base 110 and is used to support the product under test. The testing apparatus 100 is used to perform various types of optoelectronic characteristic tests on the product under test, including response time, color, brightness, viewing angle, and reflectivity. In this embodiment, the product under test is a silicon-based OLED (OLED-on-Silicon). Of course, in other feasible embodiments, the product under test can also be a TN (Twisted Nematic), IPS (In-Plane Switching), or other types of display panels, wearable devices, etc.

[0039] The test assembly 130 includes an optical test element 131, a spectrometer 132, and a light source 133. The optical test element 131 is movably mounted on the machine base 110 and is used to test the response time, chromaticity, and luminance of the product under test. For example, if the optical test element 131 is a response chromaticity meter, the support assembly 120 moves the product under test directly below the optical test element 131, and the optical test element 131 adjusts its relative position to the product under test. The optical test element 131 is used to test the photoelectric properties of the product under test, including response time, chromaticity, and luminance. The spectrometer 132 is mounted on the machine base 110 and can rotate around the support assembly 120. The spectrometer 132 is used to test the viewing angle and reflectivity of the product under test. The light source 133 is detachably mounted on the machine base 110 and is used to project a test beam onto the product under test. For example, when testing the photoelectric properties of the product under test (VAT) by viewing angle, the spectrometer 132 rotates around the support assembly 120 to test the VDT from multiple different viewing angles, ensuring that users can obtain an accurate, consistent, and comfortable visual experience when observing the VDT (such as a silicon-based OLED) from different angles. Alternatively, when testing the photoelectric properties of the VDT by reflectivity, the light source 133 is mounted on the instrument 110. The light source 133 projects a test beam onto the VDT, which reflects the test beam and is captured by the spectrometer 132. The spectrometer analyzes the quantity and quality of the reflected test beam and tests the reflectivity of the VDT. Furthermore, when the reflectivity test of the VDT is not required, the light source 133 can be removed from the instrument 110 to avoid interference with the movement of other components (such as the optical test piece 131, the spectrometer 132, etc.).

[0040] The aforementioned testing device 100 places the product under test (DUT) on the support component 120. Through the movement of the support component 120 and the optical test piece 131, alignment operations are performed between the optical test piece 131 and the DUT. The optical test piece 131 then tests the response time, chromaticity, and brightness of the DUT. The support component 120 continues to move until it aligns with the spectrometer 132. The spectrometer 132 rotates around the support component 120 to test the viewing angle of the DUT from multiple different angles. A light source 133 is placed on the platform 110 and projects a test beam onto the DUT. The DUT reflects the test beam and is captured by the spectrometer 132, which then tests the reflectivity of the DUT. Thus, by integrating the optical test piece 131, the spectrometer 132, and the light source 133 into the testing device 100, multiple types of photoelectric characteristic tests, including response time, chromaticity, brightness, viewing angle, and reflectivity, can be performed on the DUT, shortening the testing cycle and reducing the testing cost.

[0041] In one embodiment, see Figures 1-3 As shown, the support assembly 120 includes a cavity 121 and a support platform 122. The cavity 121 is movably disposed on the machine base 110, and the support platform 122 is movably disposed within the cavity 121. The support platform 122 is rotatable relative to the cavity 121. The support platform 122 is used to support the product under test. For example, the support platform 122 fixes the product under test by vacuum adsorption, ensuring the stability and reliability of the product under test during the testing process. If the cavity 121 has a chamber inside, the support platform 122 is housed inside the chamber of the cavity 121, and a turntable 123 is disposed inside the cavity 121, with the support platform 122 disposed on the turntable 123.

[0042] The aforementioned testing device 100, through the movement of the cavity 121 and the support platform 122, and the rotation of the support platform 122 relative to the cavity 121, can adjust the relative position between the product under test and the optical test piece 131, the spectrometer 132, and the light source 133. This allows the product under test to be positioned directly below the optical test piece 131 for photoelectric characteristic testing of response time, chromaticity, and brightness, or to be positioned directly below the spectrometer 132, ensuring that the measurement centerline of the spectrometer 132 is collinear with the rotation axis of the support platform 122. This guarantees that the rotation center of the spectrometer 132 remains constant, allowing for testing of the product under test from multiple different perspectives without any adverse phenomenon of test result deviation due to changes in the test points of the spectrometer 132 on the surface of the product under test.

[0043] Specifically, see Figures 1-4 As shown, the testing device 100 also includes a first multi-axis module 140 and a second multi-axis module 150. A cavity 121 is disposed in the first multi-axis module 140, which is used to adjust the X-axis and Y-axis positions of the cavity 121. For example, see [reference needed]. Figure 1 As shown, the first multi-axis module 140 includes a first X-axis sliding module 141 and a first Y-axis sliding module 142. The first X-axis sliding module 141 is disposed on the machine base 110, and the first Y-axis sliding module 142 is slidably disposed on the first X-axis sliding module 141 along the X-axis. The cavity 121 is slidably disposed on the first Y-axis sliding module 142 along the Y-axis. Thus, the X-axis and Y-axis positions of the cavity 121 can be adjusted by the first X-axis sliding module 141 and the first Y-axis sliding module 142. The second multi-axis module 150 is disposed on the cavity 121, and the support platform 122 is disposed on the second multi-axis module 150. The second multi-axis module 150 is used to adjust the X-axis, Y-axis, and Z-axis positions of the support platform 122. For example, see [reference needed]. Figure 4As shown, the second multi-axis module 150 includes a second X-axis sliding module 151, a second Y-axis sliding module 152, and a Z-axis sliding module 153. The second X-axis sliding module 151 is disposed in the cavity 121. The second Y-axis sliding module 152 is slidably disposed in the second X-axis sliding module 151 along the X-axis. The Z-axis sliding module 153 is slidably disposed in the second Y-axis sliding module 152 along the Y-axis. The support platform 122 is slidably disposed in the Z-axis sliding module 153 along the Z-axis. Thus, the X-axis, Y-axis, and Z-axis positions of the support platform 122 can be adjusted by the second X-axis sliding module 151, the second Y-axis sliding module 152, and the Z-axis sliding module 153.

[0044] The aforementioned testing device 100, through the first multi-axis module 140 adjusting the X and Y positions of the cavity 121 and the second multi-axis module 150 adjusting the X, Y, and Z positions of the support platform 122, can adjust the relative position between the support component 120 and the testing component 130 from multiple different degrees of freedom. This allows the product under test to be positioned directly below the optical test piece 131 for photoelectric characteristic testing of response time, color, and brightness, or the product under test to be positioned directly below the spectrometer 132, ensuring that the measurement centerline of the spectrometer 132 coincides with the rotation axis of the support platform 122. This guarantees that the rotation center of the spectrometer 132 remains constant, allowing for testing of the product under test from multiple different perspectives without any adverse phenomenon of test result deviation due to changes in the test points of the spectrometer 132 on the surface of the product under test.

[0045] In one embodiment, see Figures 1-4 As shown, the test assembly 130 also includes an integrating sphere 134. The integrating sphere 134 is detachably disposed in the cavity 121, such as by screwing or snapping. The integrating sphere 134 is used to collect the test beam from the surface of the product under test, and is connected to the spectrometer 132. For example, the integrating sphere 134 may be connected to the spectrometer 132 via an optical fiber. Thus, when performing a reflectivity test on the product under test, the light source 133 projects a test beam onto the product under test. After the product under test reflects the test beam and it is collected by the integrating sphere 134, the test beam is uniformly diffusely reflected within the highly reflective inner wall of the integrating sphere 134 due to the diffuse reflection material on its inner wall. This homogenization process is performed on the collected test beam, and the spectrometer 132 analyzes the quantity, quality, etc., of the homogenized test beam to test the reflectivity of the product under test.

[0046] It should be noted that when the reflectivity test of the product under test is required, the integrating sphere 134 is connected to the cavity 121. When the reflectivity test of the product under test is not required, the integrating sphere 134 is removed from the cavity 121 to avoid interference of the integrating sphere 134 with the movement of other components (such as the optical test piece 131, the spectrometer 132, etc.).

[0047] In one embodiment, see further. Figure 5 and Figure 6 As shown, the testing device 100 also includes a rotating shaft assembly 160, a first rotating frame 135, and a second rotating frame 136. The rotating shaft assembly 160 is mounted on the machine base 110. One end of the first rotating frame 135 is rotatably connected to the rotating shaft assembly 160, and the other end of the first rotating frame 135 is connected to a spectrometer 132. One end of the second rotating frame 136 is rotatably connected to the rotating shaft assembly 160, and the other end of the second rotating frame 136 is detachably connected to a light source 133, such as by screwing, snap-fitting, or other means.

[0048] The aforementioned testing device 100, since both the first rotating frame 135 and the second rotating frame 136 are rotatably connected to the rotating shaft assembly 160, the rotating shaft assembly 160 can drive the first rotating frame 135 and the second rotating frame 136 to rotate synchronously around the test point of the product under test, so that the light source 133 can project a test beam onto the test point of the product under test, and the spectrometer 132 can capture the test beam reflected from the test point of the product under test, so as to test the viewing angle of the product under test from multiple different perspectives. Since the spectrometer 132 and the light source 133 perform reflectivity testing with the test point of the product under test as the center, it can ensure that the product under test can be observed from different angles to obtain an accurate, consistent and comfortable visual experience.

[0049] Specifically, see Figure 2 , Figure 5 and Figure 6As shown, the rotating shaft assembly 160 includes a drive source 161, a gear set 162, a first rotating shaft 163, and a second rotating shaft 164. The first rotating shaft 163 is rotatably mounted on the machine base 110, and the second rotating shaft 164 is sleeved on the first rotating shaft 163. If the second rotating shaft 164 is a hollow shaft, the first rotating shaft 163 is housed within the hollow area of ​​the second rotating shaft 164. The drive source 161 is driveably connected to the gear set 162, which is simultaneously driveably connected to both the first rotating shaft 163 and the second rotating shaft 164. The gear set 162 drives the first rotating shaft 163 and the second rotating shaft 164 to rotate in opposite directions. A first rotating frame 135 is rotatably connected to the first rotating shaft 163, and a second rotating frame 136 is rotatably connected to the second rotating shaft 164. Thus, the drive source 161 drives the gear set 162 to move, and the gear set 162 drives the first rotating shaft 163 and the second rotating shaft 164 to rotate in opposite directions. Since the first rotating shaft 163 is connected to the first rotating frame 135 and the first rotating frame 135 is equipped with a spectrometer 132, and the second rotating shaft 164 is connected to the second rotating frame 136 and the second rotating frame 136 is equipped with a light source 133, the first rotating shaft 163 and the second rotating shaft 164 respectively drive the spectrometer 132 and the light source 133 to rotate in opposite directions, so as to ensure that the incident angle of the test beam projected by the light source 133 onto the product under test is the same as the reflection angle of the test beam reflected by the product under test to the spectrometer 132, so that the spectrometer 132 can test the reflectivity of the product under test from multiple different perspectives.

[0050] Specifically, see Figure 2 , Figure 5 and Figure 6 As shown, the gear set 162 includes a first bevel gear 1621, a second bevel gear 1622, and a third bevel gear 1623. The second bevel gear 1622 and the third bevel gear 1623 are respectively meshed on opposite sides of the first bevel gear 1621. The first bevel gear 1621 is driven to the output end of the drive source 161. The second bevel gear 1622 is driven to the first rotating shaft 163, such as when the second bevel gear 1622 is fitted onto the first rotating shaft 163. The third bevel gear 1623 is driven to the second rotating shaft 164, such as when the third bevel gear 1623 is fitted onto the second rotating shaft 164. Thus, the drive source 161 outputs power to the first bevel gear 1621, which rotates and drives the second bevel gear 1622 and the third bevel gear 1623 meshing with it to rotate in the opposite direction. The second bevel gear 1622 and the third bevel gear 1623 respectively drive the first rotating frame 135 and the second rotating frame 136 to rotate in the opposite direction, so that the spectrometer 132 and the light source 133 rotate in the opposite direction. This ensures that the incident angle of the test beam projected by the light source 133 onto the product under test is the same as the reflection angle of the test beam reflected by the product under test to the spectrometer 132, so that the spectrometer 132 can test the reflectivity of the product under test from multiple different perspectives.

[0051] It should be noted that in this embodiment, the drive source 161 has an output shaft, and a coupling 165 is connected between the output shaft of the drive source 161 and the first bevel gear 1621 to ensure the stability and reliability of the power output of the drive source 161. Furthermore, the drive source 161 can be a drive motor, drive cylinder, or other power output components; this application does not limit the specific type of component used in the drive source 161.

[0052] In one embodiment, see Figure 1 , Figure 2 and Figure 4 As shown, the testing device 100 also includes a temperature control module 170 and a temperature acquisition element 171. Both the temperature control module 170 and the temperature acquisition element 171 are mounted on the support component 120. The temperature control module 170 and the temperature acquisition element 171 are communicatively connected, such as via wires, Wi-Fi, or Bluetooth. The temperature control module 170 controls the temperature of the support component 120, and the temperature acquisition element 171 acquires the temperature of the support component 120. Thus, the temperature of the support component 120 can be obtained through the temperature acquisition element 171, and the temperature signal can be fed back to the temperature control module 170 in real time. The temperature control module 170 adjusts and compensates for the temperature of the support component 120 to ensure that the temperature environment of the support component 120 is consistent with the preset temperature environment, creating a suitable temperature testing environment for the product under test.

[0053] In this embodiment, the temperature control module 170 can be a temperature control element such as a cooling chip or a microcontroller unit (MCU). This application does not limit the specific type of element in the temperature control module 170. Similarly, the temperature acquisition element 171 can be a temperature sensor such as an infrared thermometer or an IC sensor. This application does not limit the specific type of element in the temperature acquisition element 171.

[0054] In one embodiment, see Figure 1 and Figure 2 As shown, the testing apparatus 100 also includes a position sensing element 137. The position sensing element 137 is movably disposed on the machine base 110 and is used to sense the position information of the support assembly 120. In this way, by sensing the position information of the support assembly 120 through the position sensing element 137, the relative positional accuracy between the product under test and the testing assembly 130 is ensured, thereby improving the accuracy of the test results of the product under test.

[0055] In this embodiment, the position sensing element 137 can be a position detection element such as an infrared sensor, a displacement sensor, or a proximity sensor. This application does not limit the specific element type of the position sensing element 137.

[0056] In one embodiment, see Figure 1 and Figure 2 As shown, the testing device 100 also includes an outer cover 180. The outer cover 180 is disposed on the machine base 110 and covers the outside of the testing component 130 to ensure the stability of the testing environment of the testing component 130. The outer cover 180 is provided with a material inlet 181, a safety light curtain 182, and a lifting door 183. The material inlet 181 allows for the loading and unloading of the product under test, and the safety light curtain 182 is disposed at the material inlet 181 to ensure the safety of loading and unloading the product under test. The lifting door 183 is movably disposed on the outer cover 180 and is used to open or close the material inlet 181. When loading and unloading of the product under test is required, the lifting door 183 opens the material inlet 181 to complete the loading and unloading operation. When the product under test is loaded and testing is required, the lifting door 183 closes the material inlet 181 to ensure the stability of the testing environment of the product under test.

[0057] Further, see Figure 1 and Figure 2 As shown, the testing device 100 also includes a cleaning component 190. The cleaning component 190 is disposed on the outer cover 180 and is located at the material inlet 181. If the cleaning component 190 is an ion air component, the product to be tested fed into the material inlet 181 can be cleaned by the cleaning component 190 to ensure the cleanliness of the product to be tested and improve the reliability of the test results of the product to be tested.

[0058] Additionally, see Figures 1-6 As shown, this application also provides a testing system, which includes the testing device 100 as described above. The testing system is used to perform various types of photoelectric characteristic tests on the product under test, including response time, chromaticity, brightness, viewing angle, and reflectivity.

[0059] The aforementioned testing system places the product under test (DUT) on the support assembly 120. The movement of the support assembly 120 and the optical test piece 131 aligns the optical test piece 131 with the DUT. The optical test piece 131 then tests the DUT's response time, chromaticity, and brightness. The support assembly 120 continues to move until it aligns with the spectrometer 132. The spectrometer 132 rotates around the support assembly 120 to test the DUT's viewing angle from multiple different perspectives. A light source 133 is positioned on the platform 110 and projects a test beam onto the DUT. The DUT reflects the test beam, which is captured by the spectrometer 132, which then tests the DUT's reflectivity. Thus, by integrating the optical test piece 131, spectrometer 132, and light source 133 into the testing device 100, the system can perform various photoelectric characteristic tests on the DUT, including response time, chromaticity, brightness, viewing angle, and reflectivity, shortening the testing cycle and reducing testing costs.

[0060] The following combination Figures 1-8 A detailed analysis is conducted on the photoelectric characteristic testing of the product under test using the testing device 100 in this application.

[0061] When performing photoelectric characteristic analysis on the response time, chromaticity, and brightness of the product under test, the first multi-axis module 140 adjusts the position of the carrier component 120 along the X and Y directions to position the product under test directly below the optical test piece 131. The optical test piece 131 moves to adjust the relative position between itself and the test point of the product under test. The optical test piece 131 then performs photoelectric characteristic tests on the response time, chromaticity, and brightness of the product under test.

[0062] For example, when conducting a perspective analysis of the product under test, refer to... Figure 7 and Figure 8 As shown, the measurement centerline of spectrometer 132 is defined as the α-axis, the rotation axis of the support platform 122 is defined as the θ-axis, the rotation axis of spectrometer 132 is defined as the β-axis, and the test point of the product under test is defined as point O. The position of the support component 120 is adjusted along the X and Y directions by the first multi-axis module 140 to position the product under test directly below the spectrometer 132. The position of the support platform 122 is adjusted along the X, Y, and Z directions by the second multi-axis module 150 so that the measurement centerline α-axis of spectrometer 132 and the rotation axis θ-axis of support platform 122 are collinear and both pass through the test point O of the product under test. The measurement centerline α-axis of spectrometer 132 and the rotation axis β-axis of spectrometer 132 intersect at the test point O of the product under test. Thus, when the spectrometer 132 rotates around the product under test, the spectrometer 132 always rotates in a circle with the test point O as the center, ensuring that the rotation center of the spectrometer 132 remains unchanged, so as to test the product under test from multiple different perspectives, and there will be no adverse phenomenon of test result deviation due to the change of the test point of the spectrometer 132 on the surface of the product under test.

[0063] For example, when performing reflectance analysis on the product under test, the light source 133 and the integrating sphere 134 are connected to the instrument 110. The rotating shaft assembly 160 drives the spectrometer 132 and the light source 133 to rotate in opposite directions to ensure that the incident angle of the test beam projected by the light source 133 onto the product under test is the same as the reflection angle of the test beam reflected by the product under test onto the spectrometer 132. The light source projects the test beam onto the test point of the product under test, and the integrating sphere 134 homogenizes the test beam so that the spectrometer 132 can test the reflectance of the product under test from multiple different angles.

[0064] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0065] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A testing device, characterized in that, The testing apparatus includes: Machine tool; A carrier component, which is movably disposed on the machine base, is used to carry the product to be tested; The testing assembly includes an optical test piece, a spectrometer, and a light source. The optical test piece is movably mounted on the machine platform and is used to test the response time, chromaticity, and brightness of the product under test. The spectrometer is mounted on the machine platform and can rotate around the support assembly to test the viewing angle and reflectivity of the product under test. The light source is detachably mounted on the machine platform and is used to project a test beam onto the product under test.

2. The testing apparatus according to claim 1, characterized in that, The support assembly includes a cavity and a support platform. The cavity is movably disposed on the machine tool, and the support platform is movably disposed within the cavity. The support platform is rotatable relative to the cavity and is used to support the product to be tested.

3. The testing apparatus according to claim 2, characterized in that, The testing device further includes a first multi-axis module and a second multi-axis module. The cavity is disposed in the first multi-axis module, which is used to adjust the X and Y positions of the cavity. The second multi-axis module is disposed in the cavity, and the bearing platform is disposed in the second multi-axis module, which is used to adjust the X, Y, and Z positions of the bearing platform.

4. The testing apparatus according to claim 2, characterized in that, The testing assembly also includes an integrating sphere, which is detachably disposed in the cavity for collecting the test beam from the surface of the product under test and is connected to the spectrometer.

5. The testing apparatus according to claim 1, characterized in that, The testing device further includes a rotating shaft assembly, a first rotating frame, and a second rotating frame. The rotating shaft assembly is disposed on the machine base. One end of the first rotating frame is rotatably connected to the rotating shaft assembly, and the other end is connected to the spectrometer. One end of the second rotating frame is rotatably connected to the rotating shaft assembly, and the other end is detachably connected to the light source.

6. The testing apparatus according to claim 5, characterized in that, The rotating shaft assembly includes a drive source, a gear set, a first rotating shaft, and a second rotating shaft rotatably mounted on the first rotating shaft. The first rotating shaft is rotatably mounted on the machine base. The drive source is connected to the gear set, which is simultaneously connected to both the first rotating shaft and the second rotating shaft to drive the first rotating shaft and the second rotating shaft to rotate in opposite directions. The first rotating frame is rotatably connected to the first rotating shaft, and the second rotating frame is rotatably connected to the second rotating shaft.

7. The testing apparatus according to claim 6, characterized in that, The gear set includes a first bevel gear and a second bevel gear and a third bevel gear meshing on opposite sides of the first bevel gear. The first bevel gear is driven to the output end of the drive source, the second bevel gear is driven to the first rotating shaft, and the third bevel gear is driven to the second rotating shaft.

8. The testing apparatus according to any one of claims 1 or 2, characterized in that, The testing device further includes a temperature control module and a temperature acquisition element. Both the temperature control module and the temperature acquisition element are disposed on the support component, and the temperature control module and the temperature acquisition element are communicatively connected. The temperature control module is used to control the temperature of the support component, and the temperature acquisition element is used to acquire the temperature of the support component.

9. The testing apparatus according to claim 1, characterized in that, The testing device also includes a position sensing element, which is movably disposed on the machine platform to sense the position information of the bearing component.

10. A testing system, characterized in that, The testing system includes: The testing apparatus as described in any one of claims 1-9.

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