Novel clamps for scanning electron microscope samples

Abstract

This utility model discloses a novel clamp for scanning electron microscope (SEM) samples, including a base and a connecting seat disposed above the base. A base is rotatably connected to the surface of the connecting seat, and a clamping block is symmetrically slidably connected to the surface of the base. A slider is fixedly connected to the lower surface of the clamping block, and the slider and the clamping block are slidably connected. This clamp can accommodate samples of various sizes, firmly fixing samples of different sizes, improving its versatility, and making it easier to adjust the sample to the ideal observation angle, thus improving detection efficiency and observation quality. Simultaneously, the transmission structure has high stability, ensuring the stability of the base during rotation and avoiding the impact of unstable rotation on sample observation. Furthermore, it allows for height adjustment, enabling smooth adjustment of the clamp's height to adapt to different working height requirements of the SEM.

Description

Technical Field

[0001] This utility model relates to the technical field of scanning electron microscope auxiliary equipment, specifically a novel clamp suitable for scanning electron microscope samples. Background Technology

[0002] Scanning electron microscopy (SEM) is a method for observing microscopic morphology that lies between transmission electron microscopy (TEM) and optical microscopy. It can directly utilize the material properties of the sample surface to perform microscopic imaging. It consists of an electron optical system, a signal collection and display system, a vacuum system, and a power supply system. It is used in fields such as biology, medicine, materials, and chemistry. When using existing SEMs, they are mostly used in conjunction with their own stages, but some existing SEM sample stages still have certain shortcomings in use. According to the public announcement (CN222719269U), a novel clamp suitable for scanning electron microscope samples is disclosed. This technology discloses a "sample stage base, wherein a placement groove is provided through the sample stage base from front to back, and several slots are symmetrically provided on the two inner side walls of the placement groove, etc., which has the technical effect of ensuring that the sample to be tested does not leave adhesive residue and remains fixed during the test". Although the above-mentioned applications meet the user's needs to a certain extent, there are still some defects in the use process. The specific problems are as follows: the existing devices have poor sample fixation stability and are usually only suitable for samples of a single size or shape, with poor versatility. For detection needs at different angles, the sample placement structure lacks flexible adjustment, which in turn affects the device's detection efficiency. Based on this, this utility model designs a new type of clamp suitable for scanning electron microscope samples to solve the above problems. Utility Model Content

[0003] This invention provides a novel clamp suitable for scanning electron microscope samples, which can effectively solve the problems mentioned in the background art.

[0004] To achieve the above objectives, the present invention provides the following technical solution: a novel clamp for scanning electron microscope samples, comprising a base and a connecting seat disposed above the base, wherein a base is rotatably connected to the surface of the connecting seat, and a clamping block is symmetrically slidably connected to the surface of the base, and a slider is fixedly connected to the lower surface of the clamping block, and the slider and the clamping block are slidably connected.

[0005] As a preferred novel fixture of this utility model applicable to scanning electron microscope samples, the inner surface of the base is rotatably connected to a bidirectional threaded rod, the slider and the bidirectional threaded rod are threadedly connected, one end of the bidirectional threaded rod passes through the surface of the base and is fixedly connected to a rocker arm.

[0006] As a preferred novel fixture of this utility model applicable to scanning electron microscope samples, the inner surface of the connecting seat is rotatably connected to a rotating shaft, the rotating shaft and the base are fixedly connected, the surface of the rotating shaft is fixedly connected to a gear disk, the surface of the gear disk is meshed with a bevel gear, and one end of the bevel gear is fixedly connected to a knob.

[0007] As a preferred novel fixture of this invention for use with scanning electron microscope samples, the lower end of the rotating shaft is fixedly connected to a limiting disk, and the limiting disk and the connecting seat are rotatably connected.

[0008] As a preferred novel fixture for scanning electron microscope samples according to this utility model, a worm gear is rotatably connected to the inner surface of the base, and a threaded rod is threadedly connected to the surface of the worm gear, and the threaded rod is fixedly connected to the connecting seat.

[0009] As a preferred novel fixture for scanning electron microscope samples according to this utility model, the surface of the worm gear is engaged with a worm, the worm and the base are rotatably connected, and one end of the worm passes through the surface of the base and is fixedly connected to a knob.

[0010] As a preferred novel fixture for scanning electron microscope samples according to this utility model, a limiting rod is fixedly connected to the inner surface of the base, and the limiting rod and the threaded rod are slidably connected.

[0011] Compared with the prior art, the beneficial effects of this utility model are as follows: The distance between the clamping blocks can be precisely adjusted by shaking the rocker arm. When the bidirectional threaded rod rotates, a slider is fixedly connected to the lower surface of the clamping block, and the slider and the clamping block are slidably connected. Due to the characteristics of its bidirectional thread, it will drive the two sliders connected to it to move synchronously in opposite directions, making the clamping block more stable during the sliding process. It can adapt to samples of various sizes. By adjusting the position of the clamping block, samples of different sizes can be firmly fixed, improving the versatility of the fixture. When knob one is turned, bevel gear one rotates accordingly. Through meshing with the gear plate, it drives the gear plate to rotate, which in turn causes the shaft and base to rotate together. This makes it easier to adjust the sample to the ideal observation angle, improving detection efficiency and observation quality. At the same time, the transmission structure has high stability, which can ensure the stability of the base during rotation and avoid affecting the observation effect of the sample due to unstable rotation. By rotating knob two, the worm gear is driven to rotate. The worm gear then drives the worm wheel to rotate through meshing with the worm wheel, thereby adjusting the height of the threaded rod and the connecting seat. This allows for smooth adjustment of the fixture height to adapt to different working height requirements of the scanning electron microscope. This utility model has a scientific and reasonable structure and is safe and convenient to use. Attached Figure Description

[0012] The accompanying drawings are provided to further understand the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention and do not constitute a limitation thereof.

[0013] In the attached diagram: Figure 1 This is a schematic diagram of the structure of this utility model; Figure 2 This is a schematic diagram of the structure of the clamping block of this utility model; Figure 3 This is a schematic diagram of the structure of the toothed disc of this utility model; Figure 4 This is a schematic diagram of the structure of the limiting rod of this utility model; Figure 5 This is a schematic diagram of the worm gear of this utility model; Numbering on the map: 1. Base; 2. Connecting seat; 3. Base; 4. Clamping block; 5. Slider; 6. Two-way threaded rod; 7. Rocker arm; 8. Rotating shaft; 9. Gear plate; 10. Bevel gear one; 11. Knob one; 12. Limiting plate; 13. Threaded rod; 14. Worm gear; 15. Worm; 16. Knob two; 17. Limiting rod. Detailed Implementation

[0014] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0015] Example: Figure 1-5 As shown, this utility model provides a technical solution. Based on the above, a novel clamp suitable for scanning electron microscope samples includes a base 1 and a connecting seat 2 disposed above the base 1. A base 3 is rotatably connected to the surface of the connecting seat 2. A clamping block 4 is symmetrically slidably connected to the surface of the base 3. A slider 5 is fixedly connected to the lower surface of the clamping block 4. The slider 5 and the clamping block 4 are slidably connected.

[0016] In this implementation scheme: clamping blocks 4 are symmetrically slidably connected to the surface of the base 3. This symmetrical arrangement allows for stable clamping of the sample from both sides. A slider 5 is fixedly connected to the lower surface of the clamping block 4, and the slider 5 and the clamping block 4 are slidably connected, making the clamping block 4 more stable during sliding and ensuring the stability of the sample clamping. The rotating base 3 allows the user to flexibly adjust the angle of the sample according to the observation needs of the scanning electron microscope, which helps to obtain microscopic information of the sample from different perspectives.

[0017] Furthermore: like Figures 1 to 5 As shown: In an optional embodiment, a bidirectional threaded rod 6 is rotatably connected to the inner surface of the base 3, and the slider 5 and the bidirectional threaded rod 6 are threaded together. One end of the bidirectional threaded rod 6 passes through the surface of the base 3 and is fixedly connected to a rocker arm 7.

[0018] In this embodiment, the user can easily drive the bidirectional threaded rod 6 to rotate by shaking the rocker arm 7. When the bidirectional threaded rod 6 rotates, due to the characteristics of its bidirectional thread, it will drive the two sliders 5 connected to it to move synchronously in opposite directions, thereby realizing the synchronous opening and closing action of the two clamping blocks 4. By shaking the rocker arm 7, the distance between the clamping blocks 4 can be precisely adjusted to achieve stable clamping of the sample. Compared with other complex driving methods, this structure is simple in design, easy to manufacture and maintain, and can provide reliable clamping force to ensure that the sample will not be displaced due to insecure clamping during the scanning electron microscope inspection process.

[0019] Furthermore: like Figures 1 to 5 As shown: In an optional embodiment, a rotating shaft 8 is rotatably connected to the inner surface of the connecting seat 2, the rotating shaft 8 is fixedly connected to the base 3, a gear 9 is fixedly connected to the surface of the rotating shaft 8, a bevel gear 10 is meshed with the surface of the gear 9, and a knob 11 is fixedly connected to one end of the bevel gear 10.

[0020] In this embodiment: a rotating shaft 8 is rotatably connected to the inner surface of the connecting seat 2, and the rotating shaft 8 is fixedly connected to the base 3, which allows the base 3 to rotate around the rotating shaft 8. A gear 9 is fixedly connected to the surface of the rotating shaft 8, and a bevel gear 10 is meshed with the surface of the gear 9. A knob 11 is fixedly connected to one end of the bevel gear 10. When the knob 11 is rotated, the bevel gear 10 rotates accordingly. Through meshing with the gear 9, the gear 9 is driven to rotate, thereby causing the rotating shaft 8 and the base 3 to rotate together.

[0021] Furthermore: like Figures 1 to 5 As shown: In an optional embodiment, the lower end of the rotating shaft 8 is fixedly connected to a limiting disk 12, and the limiting disk 12 and the connecting seat 2 are rotatably connected.

[0022] In this embodiment: the lower end of the rotating shaft 8 is fixedly connected to the limiting disk 12, and the limiting disk 12 and the connecting seat 2 are rotatably connected. The existence of the limiting disk 12 is mainly to restrict the rotating shaft 8, preventing the rotating shaft 8 from sliding out of the connecting seat 2, which would damage its internal structure or affect the normal use of the fixture.

[0023] Furthermore: like Figures 1 to 5 As shown: In an optional embodiment, a worm gear 14 is rotatably connected to the inner surface of the base 1, and a threaded rod 13 is threadedly connected to the surface of the worm gear 14. The threaded rod 13 is fixedly connected to the connecting seat 2.

[0024] In this implementation scheme: when the worm gear 14 rotates, due to its threaded connection with the threaded rod 13, it will drive the threaded rod 13 to move axially, thereby realizing the up and down movement of the connecting seat 2 and the upper structure connected thereto. The height of the fixture can be smoothly adjusted to adapt to different working height requirements of the scanning electron microscope. After adjusting to the appropriate height, the fixture can be stably maintained in that position and will not easily change height due to external force.

[0025] Furthermore: like Figures 1 to 5 As shown: In an optional embodiment, the worm gear 14 is surface-engaged with a worm 15, the worm 15 is rotatably connected to the base 1, and one end of the worm 15 passes through the surface of the base 1 and is fixedly connected to a knob 16.

[0026] In this embodiment, the user rotates knob 16 to drive the worm gear 15 to rotate. The worm gear 15 then drives the worm wheel 14 to rotate through meshing with the worm wheel 14, thereby adjusting the height of the threaded rod 13 and the connecting seat 2. This allows the clamp to be adjusted to a suitable height conveniently and quickly, improving work efficiency.

[0027] Furthermore: like Figures 1 to 5 As shown: In an optional embodiment, a limiting rod 17 is fixedly connected to the inner surface of the base 1, and the limiting rod 17 and the threaded rod 13 are slidably connected.

[0028] In this embodiment, the limiting rod 17 guides and limits the movement of the threaded rod 13, ensuring that the threaded rod 13 maintains a straight line during its up-and-down movement without deviation or shaking, preventing the threaded rod 13 from moving excessively and detaching from the base 1, thereby further improving the overall stability and reliability of the fixture and providing more stable working conditions for the detection of scanning electron microscope samples.

[0029] Working principle: A clamping block 4 is symmetrically slidably connected to the surface of the base 3. This symmetrical arrangement allows for stable clamping of the sample from both sides. A slider 5 is fixedly connected to the lower surface of the clamping block 4, and the slider 5 and the clamping block 4 are slidably connected, making the clamping block 4 more stable during sliding and ensuring the stability of sample clamping. The rotating base 3 allows the user to flexibly adjust the angle of the sample according to the observation needs of the scanning electron microscope, which helps to obtain microscopic information of the sample from different perspectives. The user can easily drive the bidirectional threaded rod 6 to rotate by shaking the rocker arm 7. When the bidirectional threaded rod 6 rotates, due to the characteristics of its bidirectional thread, it will drive the two sliders 5 threaded with it to move synchronously in opposite directions, thereby... The synchronous opening and closing of the two clamping blocks 4 is achieved by precisely adjusting the distance between the clamping blocks 4 by shaking the rocker arm 7, thus ensuring stable clamping of the sample. Compared to other complex driving methods, this structure is simple in design, easy to manufacture and maintain, and provides reliable clamping force, ensuring that the sample will not shift due to insecure clamping during scanning electron microscopy. A rotating shaft 8 is rotatably connected to the inner surface of the connecting base 2, and the rotating shaft 8 is fixedly connected to the base 3, allowing the base 3 to rotate around the rotating shaft 8. A gear disk 9 is fixedly connected to the surface of the rotating shaft 8, and a bevel gear 10 is meshed with the surface of the gear disk 9. A knob 11 is fixedly connected to one end of the bevel gear 10. When the knob 11 is rotated, the bevel gear 10 moves accordingly. The rotation, through meshing with the gear disk 9, drives the gear disk 9 to rotate, thereby causing the rotating shaft 8 and the base 3 to rotate together. The lower end of the rotating shaft 8 is fixedly connected to the limiting disk 12, which is rotatably connected to the connecting seat 2. The existence of the limiting disk 12 is mainly to restrict the rotating shaft 8, preventing it from slipping out of the connecting seat 2, thus avoiding damage to its internal structure or affecting the normal use of the fixture. When the worm gear 14 rotates, due to its threaded connection with the threaded rod 13, it drives the threaded rod 13 to move axially, thereby realizing the up and down movement of the connecting seat 2 and the upper structure connected to it. This allows for smooth adjustment of the fixture's height to adapt to different working height requirements of the scanning electron microscope. After adjusting to the appropriate height, the fixture can be stably maintained at that position. The height of the fixture is not easily changed by external forces. The user can rotate the knob 16 to drive the worm gear 15 to rotate. The worm gear 15 then drives the worm wheel 14 to rotate through meshing, thereby adjusting the height of the threaded rod 13 and the connecting seat 2. This allows the fixture to be adjusted to a suitable height quickly and easily, improving work efficiency. The limiting rod 17 guides and limits the movement of the threaded rod 13, ensuring that the threaded rod 13 always maintains a straight line during up and down movement, without deviation or shaking. This prevents the threaded rod 13 from moving excessively and detaching from the base 1, further improving the overall stability and reliability of the fixture and providing more stable working conditions for the inspection of scanning electron microscope samples.

[0030] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A novel clamp for scanning electron microscope samples, comprising a base (1), characterized in that: It also includes a connecting seat (2) disposed above the base (1), a base (3) is rotatably connected to the surface of the connecting seat (2), a clamping block (4) is symmetrically slidably connected to the surface of the base (3), a slider (5) is fixedly connected to the lower surface of the clamping block (4), and the slider (5) and the clamping block (4) are slidably connected.

2. The novel clamp for scanning electron microscope samples according to claim 1, characterized in that, The inner surface of the base (3) is rotatably connected to a bidirectional threaded rod (6), the slider (5) and the bidirectional threaded rod (6) are threadedly connected, one end of the bidirectional threaded rod (6) passes through the surface of the base (3) and is fixedly connected to a rocker arm (7).

3. The novel clamp for scanning electron microscope samples according to claim 2, characterized in that, The inner surface of the connecting seat (2) is rotatably connected to a rotating shaft (8), the rotating shaft (8) and the base (3) are fixedly connected, the surface of the rotating shaft (8) is fixedly connected to a gear plate (9), the surface of the gear plate (9) is meshed with a bevel gear (10), and one end of the bevel gear (10) is fixedly connected to a knob (11).

4. The novel clamp for scanning electron microscope samples according to claim 3, characterized in that, The lower end of the rotating shaft (8) is fixedly connected to a limiting disk (12), and the limiting disk (12) and the connecting seat (2) are rotatably connected.

5. The novel clamp for scanning electron microscope samples according to claim 4, characterized in that, The inner surface of the base (1) is rotatably connected to a worm gear (14), and the surface of the worm gear (14) is threadedly connected to a threaded rod (13). The threaded rod (13) and the connecting seat (2) are fixedly connected.

6. The novel clamp for scanning electron microscope samples according to claim 5, characterized in that, The worm gear (14) is meshed with a worm (15), which is rotatably connected to the base (1). One end of the worm (15) passes through the surface of the base (1) and is fixedly connected to a knob (16).

7. The novel clamp for scanning electron microscope samples according to claim 6, characterized in that, A limiting rod (17) is fixedly connected to the inner surface of the base (1), and the limiting rod (17) and the threaded rod (13) are slidably connected.

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