A signal testing device suitable for multiple interfaces

Abstract

This utility model discloses a signal testing device applicable to multiple interfaces, relating to the field of signal testing technology. The device includes a test motherboard with a slot for an adjustable adapter module. The adjustable adapter module has a slide groove for a slide rail, which in turn holds a connecting shaft. A knob is fixedly connected to one end of the connecting shaft, and a threaded screw is connected to the other end. A slide block is threaded onto the threaded screw, and a probe mounting base is fixedly connected to the slide block. A probe guide sleeve is fixedly mounted on the probe mounting base. Through the adjustable adapter module's knob and the threaded screw, the spacing between the elastic probes can be flexibly adjusted to adapt to interfaces with different pitch values. This eliminates the need for separate testing devices for each interface, greatly improving the device's applicability.

Description

Technical Field

[0001] This utility model relates to the field of signal testing technology, and in particular to a signal testing device suitable for multiple interfaces. Background Technology

[0002] Against the backdrop of rapid development in electronic information technology, the types of interfaces of electronic devices are becoming increasingly diverse, and there are significant differences in the pitch value, number of pins, and other aspects of the interfaces of different devices. Traditional signal testing devices are often designed for specific interfaces, and one device can only test one or a few interfaces. When facing multiple interface testing needs, multiple different testing devices need to be equipped, which not only increases the equipment procurement cost, but also leads to a large number of devices at the testing site and inconvenience in management.

[0003] Meanwhile, the protection performance of traditional testing devices varies, with some devices lacking effective protective structures. Internal core components are easily damaged by dust, water droplets, and external forces, shortening the equipment's lifespan. In addition, some testing devices are complex to operate and require professional personnel for operation and maintenance, which is not conducive to improving testing efficiency.

[0004] With the increasing demands for testing efficiency and cost control in the production and maintenance of electronic equipment, the market urgently needs a signal testing device that can adapt to multiple interfaces, has good protection performance, and is easy to operate, in order to solve the problems of poor versatility, high cost, and complex operation of traditional testing devices. Utility Model Content

[0005] The purpose of this invention is to at least solve one of the technical problems existing in the prior art, and to provide a signal testing device suitable for multiple interfaces, which can solve the above-mentioned problems.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a signal testing device suitable for multiple interfaces, including a test motherboard, on which a protective shell is fixedly installed, and a processor is installed in the center of the test motherboard;

[0007] A power management module is fixedly installed on the test motherboard. The power management module is located in the lower right corner of the test motherboard. The power management module includes a power chip, an inductor and a capacitor array. An external power interface is provided in the middle of the right edge of the test motherboard. A data transmission interface is fixedly installed on the test motherboard.

[0008] A control board is fixedly mounted on the test motherboard, and buttons and a display screen are mounted on the control board;

[0009] The test motherboard has a card slot, an adjustable adapter module is attached to the card slot, the adjustable adapter module has a sliding groove, and a slide rail is attached to the sliding groove.

[0010] A connecting shaft is snapped onto the slide rail. A knob is fixedly connected to one end of the connecting shaft, and a positive and negative threaded screw is connected to the other end of the connecting shaft. A slide block is threaded onto the positive and negative threaded screw, and a probe mounting base is fixedly connected to the slide block. A probe guide sleeve is fixedly installed on the probe mounting base.

[0011] Preferably, the test motherboard uses an epoxy resin substrate with a solder resist layer covering its surface.

[0012] Preferably, the outer shell of the protective shell is in the shape of a cuboid with rounded corners at the edges. The top of the protective shell is a flat plane and the rest of the shell is a closed structure except for the reserved operating area.

[0013] Preferably, the processor is surrounded by surface-mount resistors and capacitors.

[0014] Preferably, the buttons are circular and arranged in a straight line on the lower left corner of the front of the test motherboard, with the display screen located to the right of the buttons.

[0015] Preferably, the adjustable adapter module is rectangular.

[0016] Preferably, the positive and negative threaded screws are rotatably connected to the slide rail.

[0017] Preferably, the data transmission interface is rectangular and located on the upper left edge of the test motherboard, with the interface end face flush with the edge of the test motherboard.

[0018] Compared with the prior art, the beneficial effects of this utility model are:

[0019] (1) This signal testing device applicable to multiple interfaces can flexibly adjust the elastic probe spacing through the adjustable adapter module knob, positive and negative threaded screw and other structures, adapting to a variety of interfaces with different pitch values. There is no need to equip each interface with a separate testing device, which greatly improves the applicability of the device. The protective shell is made of engineering plastic material, integrally molded and with rounded corners, which can effectively resist dust, water droplets and external impact, providing good protection for the internal core components and extending the service life of the device.

[0020] (2) The signal testing device applicable to multiple interfaces has a reasonable layout of buttons and display screen on the control board. Users can easily operate it by pressing the buttons and the display screen can intuitively display test information, making it easy to grasp the test status in real time and reduce the difficulty of operation. The processor is surrounded by dense surface-mount components, forming a compact signal processing core area. The modules are reasonably laid out on the test motherboard, saving space and making the overall structure of the device compact.

[0021] (3) The signal testing device applicable to multiple interfaces has a data transmission interface face flush with the edge of the test motherboard, making it easy to plug and unplug cables and ensuring a stable connection; the adjustable adapter module is connected to the test motherboard through a slot, making installation and disassembly convenient and ensuring stable signal transmission during the test; the power management module contains a variety of surface-mount components, which can provide stable voltage output and has good circuit connection, ensuring stable power supply during the test and reducing test errors caused by power supply problems. Attached Figure Description

[0022] The present invention will be further described below with reference to the accompanying drawings and embodiments:

[0023] Figure 1 This is a schematic diagram of a signal testing device applicable to multiple interfaces according to the present invention;

[0024] Figure 2 This is a schematic diagram of a signal testing device applicable to multiple interfaces according to the present invention;

[0025] Figure 3 This is a cross-sectional schematic diagram of a signal testing device applicable to multiple interfaces according to the present invention;

[0026] Figure 4 This is a cross-sectional schematic diagram of a signal testing device applicable to multiple interfaces according to this utility model.

[0027] Reference numerals: 1. Test motherboard; 2. Protective shell; 3. Processor; 4. Power management module; 5. Data transmission interface; 6. Control board; 7. Button; 8. Display screen; 9. Card slot; 10. Adjustable adapter module; 11. Slide groove; 12. Slide rail; 13. Connecting shaft; 14. Knob; 15. Positive and negative threaded screw; 16. Slide base; 17. Probe mounting base; 18. Probe guide sleeve. Detailed Implementation

[0028] This section will describe in detail the specific embodiments of the present utility model. The preferred embodiments of the present utility model are shown in the accompanying drawings. The purpose of the drawings is to supplement the textual description with graphics, so that people can intuitively and vividly understand each technical feature and the overall technical solution of the present utility model, but they should not be construed as limiting the scope of protection of the present utility model.

[0029] In the description of this utility model, it should be understood that the directional descriptions, such as up, down, front, back, left, right, etc., indicate the directional or positional relationship based on the directional or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0030] In the description of this utility model, terms such as greater than, less than, and exceeding are understood to exclude the stated number, while terms such as above, below, and within are understood to include the stated number. The use of terms like "first" and "second" is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the quantity or sequence of the indicated technical features.

[0031] In the description of this utility model, unless otherwise explicitly defined, terms such as "setting," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this utility model in conjunction with the specific content of the technical solution.

[0032] Please see Figure 1-4 This utility model provides a technical solution: a signal testing device suitable for multiple interfaces, a test motherboard 1, the test motherboard 1 is made of epoxy resin substrate, the surface is covered with solder resist layer, a protective shell 2 is fixedly installed on the test motherboard 1, the protective shell 2 is generally rectangular in shape, adapted to the size of the basic test motherboard 1, the edges are designed with rounded corners, the protective shell 2 is made of engineering plastic material, integrally molded by injection molding process, with good mechanical strength and impact resistance, its top is a flat plane, except for the reserved operation area, the rest is a closed structure, which can effectively protect the internal core signal processing circuit, calibration and matching module and other components from the influence of dust, water droplets and external impact;

[0033] The test motherboard 1 has a processor 3 installed in the center. The processor 3 is an ARM Cortex-M4 processor. The processor 3 is surrounded by densely packed surface mount resistors, capacitors and other components, forming a compact signal processing core area.

[0034] A power management module 4 is fixedly installed on the test motherboard 1. The power management module 4 is located in the lower right corner of the test motherboard 1 and consists of multiple rectangular surface-mount components, including power chips, inductors and capacitor arrays. The external power interface is located in the middle of the right edge of the test board and is connected to the power management module 4 through copper foil lines.

[0035] A data transmission interface 5 is fixedly installed on the test motherboard 1. The data transmission interface 5 is rectangular and located on the upper left edge of the test motherboard 1. The interface end face is flush with the edge of the test motherboard 1 to facilitate cable plugging and unplugging.

[0036] A control board 6 is fixedly installed on the test motherboard 1. A button 7 and a display screen 8 are installed on the control board 6. The button 7 is round and arranged in a row in the lower left corner of the front of the test motherboard 1. The display screen 8 is rectangular and located to the right of the button 7. It is connected to the main circuit of the test motherboard 1 through a ribbon cable interface and can display the test status and parameters.

[0037] The test motherboard 1 has a slot 9, on which an adjustable adapter module 10 is attached. The adjustable adapter module 10 is rectangular and has a slide groove 11. A slide rail 12 is attached to the slide groove 11, and a connecting shaft 13 is attached to the slide rail 12. A knob 14 is fixedly connected to one end of the connecting shaft 13, and the other end of the connecting shaft 13 is rotatably connected to the slide rail 12. A positive and negative threaded screw 15 is connected to the other end of the connecting shaft 13, and the positive and negative threaded screw 15 is rotatably connected to the slide rail 12. A slide block 16 is threaded onto the positive and negative threaded screw 15. A probe mounting base 17 is fixedly connected to the slide block 16. The probe mounting base 17 fixes the elastic probe, so that it moves synchronously with the slide rail 12, ensuring that the probe spacing is consistent with the spacing adjusted by the slide rail 12. A probe guide sleeve 18 is fixedly installed on the probe mounting base 17. The probe guide sleeve 18 guides and limits the probe, ensuring that the probe remains perpendicular when in contact with the interface being tested, and preventing the probe from bending or deviating, which would affect the contact effect.

[0038] Working principle: The adjustable adapter module 10 is installed on the test motherboard 1 through the card slot 9. The external power supply is connected, and the power is processed by the power management module 4 to supply power to the entire device.

[0039] When different interfaces need to be tested, rotate the knob 14 on the adjustable adapter module 10. The knob 14 drives the connecting shaft 13 to rotate, and the connecting shaft 13 causes the positive and negative threaded screws 15 to rotate. Since the slide 16 is threadedly connected to the positive and negative threaded screws 15, the rotation of the positive and negative threaded screws 15 will cause the slide 16 to move relative to or towards each other on the slide rail 12 along the slide groove 11, thereby driving the probe mounting seat 17 to move, realizing the adjustment of the elastic probe spacing to adapt to interfaces with different pitch values.

[0040] After adjustment, the interface under test is connected to the elastic probe. The processor 3, as the core control component, collects and analyzes the signal of the interface under test through the signal processing core area composed of surrounding surface mount resistors, capacitors and other components. The data transmission interface 5 is responsible for transmitting the processed test data to external devices or receiving external control commands.

[0041] Users can operate the device via buttons 7 on the control panel 6, such as starting the test and switching test modes. After the operation command is transmitted to the processor 3, the processor 3 controls the relevant modules to perform corresponding actions. At the same time, the display screen 8 displays the test status, parameters and results in real time. The protective shell 2 protects the internal components throughout the test process to ensure stable operation of the device.

[0042] The adjustable adapter module 10 has a knob 14, a positive and negative threaded screw 15 and other structures, which can flexibly adjust the elastic probe spacing and adapt to a variety of interfaces with different pitch values. There is no need to equip each interface with a separate test device, which greatly improves the applicability of the device.

[0043] The protective shell 2 is made of engineering plastic material, molded in one piece with rounded corners, which can effectively resist dust, water droplets and external impacts, providing good protection for internal core components and extending the service life of the device.

[0044] The buttons 7 and display screen 8 on the control panel 6 are arranged in a reasonable manner. Users can operate the control panel easily through the buttons 7, and the display screen 8 can intuitively display test information, making it easy to monitor the test status in real time and reducing the difficulty of operation.

[0045] The processor 3 is surrounded by densely packed surface-mount components, forming a compact signal processing core area. The modules are arranged reasonably on the test motherboard 1, saving space and making the overall structure of the device compact.

[0046] The data transmission interface 5 is flush with the edge of the test motherboard 1, making it easy to plug and unplug cables and ensuring a stable connection; the adjustable adapter module 10 is connected to the test motherboard 1 via the slot 9, making it easy to install and remove, and ensuring stable signal transmission during the test.

[0047] The power management module 4 contains a variety of surface-mount components, which can provide a stable voltage output and have good circuit connections to ensure stable power supply during the test and reduce test errors caused by power supply problems.

[0048] Structural Description:

[0049] Test Mainboard 1: Utilizing an epoxy resin substrate, it is a rectangular thin plate covered with a solder mask layer. As the fundamental load-bearing component of the entire device, all functional modules are mounted on its surface, providing a stable mounting platform and circuit connection carrier for each component, ensuring smooth signal transmission between modules.

[0050] Protective Shell 2: Fixedly mounted on the test motherboard 1, the shell is rectangular in shape, matching the size of the test motherboard 1, with rounded corners. Made of engineering plastic, it is integrally molded using injection molding. The top is a flat plane, and the rest is a closed structure except for the reserved operating area. Its function is to effectively protect the internal core signal processing circuits, calibration and matching modules, and other components from dust, water droplets, and external impacts. The engineering plastic material and integral molding process ensure its good mechanical strength and impact resistance.

[0051] Processor 3: Installed in the center of the test motherboard 1, it uses an ARM Cortex-M4 processor 3 and is surrounded by densely packed surface-mount resistors, capacitors, and other components, forming a compact signal processing core area. As the core control component of the device, it is responsible for acquiring, analyzing, and processing signals from the interface under test, coordinating the work of various modules, and ensuring the orderly progress of the test process.

[0052] Power Management Module 4: Fixedly mounted in the lower right corner of the test motherboard 1, it consists of multiple rectangular surface-mount components, including power chips, inductors, and capacitor arrays. The external power interface is located in the middle of the right edge of the test board and is connected to Power Management Module 4 via copper foil traces. Its function is to process and convert the external power supply, providing a stable voltage output for all modules of the entire device, ensuring normal operation of the device, and reducing test errors caused by power supply problems.

[0053] Data transmission interface 5: Fixedly installed on the upper left edge of the test motherboard 1, the interface is rectangular, with its end face flush with the edge of the test motherboard 1. It is mainly used to transmit processed test data to external devices, and can also receive external control commands, facilitating data interaction with external devices. The flush end face design makes cable plugging and unplugging easy.

[0054] Control board 6: Fixedly mounted on the test motherboard 1, it has buttons 7 and a display screen 8 installed on it. Serving as a bridge for user interaction with the device, it carries buttons 7 and the display screen 8, ensuring smooth input of user operation commands and display of test information.

[0055] Button 7: Mounted on the control board 6, it is circular and arranged in a straight line on the lower left corner of the front of the test motherboard 1. By pressing button 7, the user can start the test, switch test modes, and perform other operations, transmitting operation commands to the processor 3 to control the device. The circular design and straight line arrangement facilitate user operation.

[0056] Display screen 8: Mounted on control board 6, it is rectangular and located to the right of button 7. It is connected to the main circuit of test motherboard 1 via a ribbon cable interface. Its function is to display the test status, parameters, and results in real time, allowing users to intuitively grasp the test situation and easily understand the test progress and results.

[0057] Slot 9: Located on the test motherboard 1, it is used to attach the adjustable adapter module 10. It provides an installation position for the adjustable adapter module 10, allowing it to be securely mounted on the test motherboard 1, while facilitating installation and removal, and ensuring a good connection between the adjustable adapter module 10 and the test motherboard 1.

[0058] Adjustable adapter module 10: Rectangular in shape, it is snapped onto the test motherboard 1 via slot 9. It is a key component for realizing various interface tests, integrating structures such as slide groove 11 and slide rail 12, which can adjust the spacing of elastic probes to adapt to interfaces with different pitch values.

[0059] Slide groove 11: Formed on the adjustable adapter module 10, used to engage slide rail 12. Provides a sliding track for slide rail 12, restricts the movement direction of slide rail 12, ensures that slide rail 12 can slide stably in a preset direction, and provides guidance for adjusting the elastic probe spacing.

[0060] Slide rail 12: It is snapped onto slide groove 11 and cooperates with components such as connecting shaft 13 and positive and negative threaded screw 15. As the moving carrier of slide base 16, slide base 16 slides on it, driving probe mounting base 17 to move, thereby realizing the adjustment of elastic probe spacing. The smoothness of its sliding directly affects the accuracy of probe spacing adjustment.

[0061] Connecting shaft 13: It is snapped onto slide rail 12, with a knob 14 fixedly connected to one end and a threaded screw 15 connected to the other end, and is rotatably connected to slide rail 12. It serves to transmit power, transmitting the rotational movement of knob 14 to threaded screw 15, so that threaded screw 15 rotates synchronously with knob 14, providing power transmission for adjusting the elastic probe spacing.

[0062] Knob 14: Fixedly connected to one end of the connecting shaft 13. By rotating the knob 14, the user can drive the connecting shaft 13 and the forward and reverse threaded screws 15 to rotate. This is the operating component for adjusting the spacing of the elastic probes, allowing the user to adjust as needed.

[0063] The forward and reverse threaded screw 15 is connected to the connecting shaft 13 and rotatably connected to the slide rail 12, with a slide block 16 connected to its upper thread. It rotates under the drive of the connecting shaft 13. Since the threads at both ends of the screw are in opposite directions, the slide block 16 can move relative to or towards each other when it rotates, thereby realizing the adjustment of the elastic probe spacing.

[0064] Slide 16: Threadedly connected to the positive and negative threaded screws 15, and fixedly connected to the probe mounting base 17. Under the rotation of the positive and negative threaded screws 15, it slides along the slide rail 12, driving the probe mounting base 17 to move, and is the intermediate component for realizing the adjustment of the elastic probe spacing.

[0065] Probe mounting base 17: Fixedly connected to the slide 16, used to fix the elastic probe. It moves together with the slide 16, causing the elastic probe to move synchronously, ensuring that the probe spacing is consistent with the spacing adjusted by the slide rail 12, and ensuring that the elastic probe can accurately contact the interface being tested.

[0066] Probe guide sleeve 18: Fixedly mounted on probe mounting base 17. It guides and limits the elastic probe, ensuring that the probe remains perpendicular when in contact with the interface under test, preventing the probe from bending or deviating and affecting the contact effect, and ensuring the accuracy and stability of signal testing.

[0067] The embodiments of the present utility model have been described in detail above with reference to the accompanying drawings. However, the present utility model is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of the present utility model.

Claims

1. A signal testing device suitable for multiple interfaces, comprising a test motherboard (1), characterized in that: A protective shell (2) is fixedly installed on the test motherboard (1), and a processor (3) is installed in the center of the test motherboard (1); A power management module (4) is fixedly installed on the test motherboard (1). The power management module (4) is located at the lower right corner of the test motherboard (1). The power management module (4) includes a power chip, an inductor and a capacitor array. An external power interface is provided in the middle of the right edge of the test motherboard (1). A data transmission interface (5) is fixedly installed on the test motherboard (1). A control board (6) is fixedly installed on the test motherboard (1), and buttons (7) and a display screen (8) are installed on the control board (6); The test motherboard (1) has a slot (9) and an adjustable adapter module (10) is attached to the slot (9). The adjustable adapter module (10) has a slide groove (11) and a slide rail (12) is attached to the slide groove (11). A connecting shaft (13) is snapped onto the slide rail (12). A knob (14) is fixedly connected to one end of the connecting shaft (13). A positive and negative threaded screw (15) is connected to the other end of the connecting shaft (13). A slide block (16) is threaded onto the positive and negative threaded screw (15). A probe mounting seat (17) is fixedly connected to the slide block (16). A probe guide sleeve (18) is fixedly installed on the probe mounting seat (17).

2. The signal testing device suitable for multiple interfaces according to claim 1, characterized in that: The test motherboard (1) is made of epoxy resin substrate with a solder resist layer covering the surface.

3. The signal testing device suitable for multiple interfaces according to claim 2, characterized in that: The protective shell (2) is rectangular in shape with rounded corners. The top of the protective shell (2) is a flat plane and the rest of the shell is a closed structure except for the reserved operating area.

4. A signal testing device suitable for multiple interfaces according to claim 3, characterized in that: The processor (3) is surrounded by surface-mount resistors and capacitors.

5. A signal testing device suitable for multiple interfaces according to claim 4, characterized in that: The button (7) is circular and arranged in a line on the lower left corner of the front of the test motherboard (1), and the display screen (8) is located to the right of the button (7).

6. A signal testing device suitable for multiple interfaces according to claim 5, characterized in that: The adjustable adapter module (10) is rectangular.

7. A signal testing device suitable for multiple interfaces according to claim 6, characterized in that: The positive and negative threaded screws (15) are rotatably connected to the slide rail (12).

8. A signal testing device suitable for multiple interfaces according to claim 7, characterized in that: The data transmission interface (5) is rectangular and located on the upper left edge of the test motherboard (1), with the interface end face flush with the edge of the test motherboard (1).

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