High-frequency potting test fixture for coaxial probes

Abstract

This utility model discloses a high-frequency potting test holder for a coaxial probe, including a base. A recessed receiving groove is provided at the top of the base, and several limiting holes are arranged at the bottom of the receiving groove. A receiving hole is located at the bottom of the limiting holes, penetrating the bottom of the limiting holes. A coaxial probe is placed within the receiving hole. The coaxial probe includes a tube body, with a first needle body and a second needle body coaxially mounted at both ends of the tube body. The diameters of the first and second needle bodies are smaller than the diameter of the tube body. An insulating sleeve is fitted onto the outer wall of the tube body, contacting the inner wall of the receiving hole and being limited by the two ends of the receiving hole. This application, by fitting an insulating sleeve onto the outer wall of the tube body, and having the insulating sleeve contact the inner wall of the receiving hole, prevents the probe from directly contacting the metal base, effectively achieving insulation. Combined with the signal shielding properties of metal, high-frequency signal transmission can be achieved during the testing process.

Description

Technical Field

[0001] This utility model relates to the field of chip testing devices, and more specifically to a high-frequency potting test socket for coaxial probes. Background Technology

[0002] In current chip testing, the commonly used chip testing equipment typically mounts test probes directly (usually soldered or pressed) to the inside bottom of a metal base (also known as a "probe board" or "base board"). For high-frequency testing (such as RF chips and high-speed digital chips), where impedance control of the signal path is crucial, directly soldering the probes to the base introduces discontinuous impedance points, causing severe signal reflection and degrading signal quality. Furthermore, the metal base is often used as a ground plane. Directly connecting the probes to it can easily cause ground bounce and other problems when processing high-speed signals. Simultaneously, the lack of effective shielding between densely packed probes can easily lead to signal crosstalk. Utility Model Content

[0003] To address the aforementioned problems, this utility model provides a high-frequency potting test socket for a coaxial probe, comprising a base, an inwardly recessed receiving groove at the top of the base, and a plurality of limiting holes arranged at preset intervals at the bottom of the receiving groove. The receiving groove is used to prevent the chip from shifting within the receiving groove. A receiving hole is located at the bottom of the limiting hole, penetrating through the bottom of the limiting hole. A coaxial probe is disposed within the receiving hole. The coaxial probe comprises a tube body, with a first needle body and a second needle body coaxially mounted at both ends of the tube body, respectively. The diameters of the first and second needle bodies are smaller than that of the tube body. An insulating sleeve is fitted onto the outer wall of the tube body, and the insulating sleeve contacts the inner wall of the receiving hole and is limited by the two ends of the receiving hole.

[0004] Furthermore, the insulating sleeve includes a first adhesive and a second adhesive, which are located at the two ends of the tube, respectively. The first adhesive is located on one side of the first needle body, and the second adhesive is located on one side of the second needle body.

[0005] Furthermore, shrink rings are provided at both ends of the receiving hole, and the inner diameter of the shrink rings is smaller than the inner diameter of the receiving hole. When the coaxial probe is inside the receiving hole, the shrink rings obstruct the movement of the first and second colloids. Furthermore, the first needle body and the tube body are fixed to each other and extend out of the limiting hole, while the second needle body can move along the inner wall of the tube body inside the tube body. The first needle body and the second needle body are connected by a spring.

[0006] Furthermore, one end of the first needle body is provided with several tapered portions.

[0007] Furthermore, an insulating rubber ring is provided inside the limiting hole, with the inner ring of the insulating rubber ring fitting against the outer wall of the first needle body, and the outer ring of the insulating rubber ring being engaged with the inner wall of the limiting hole.

[0008] Furthermore, a protrusion is provided on the outer ring of the insulating rubber ring, and a recess is provided on the inner wall of the limiting hole to cooperate with the protrusion. When the insulating rubber ring covers the limiting hole, the protrusion is engaged in the recess.

[0009] Compared with the prior art, the beneficial effects of this utility model are: This application achieves insulation by attaching an insulating sleeve to the outer wall of the tube body, with the insulating sleeve contacting the inner wall of the receiving hole, so that the probe does not directly contact the metal base, effectively achieving an insulation effect. In addition, the metal's signal shielding properties enable high-frequency signal transmission during the testing process.

[0010] Additional aspects and advantages of this invention will be set forth in the description which follows, and some will be obvious from the description or may be learned by practice of the invention. Attached Figure Description

[0011] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0012] Figure 1 A schematic diagram of the overall structure of this utility model; Figure 2 This is a partially enlarged view of part A of the present invention; Figure 3 This is a schematic diagram of the coaxial probe of this utility model; Figure 4 This is a cross-sectional view of the overall structure of this utility model; Figure 5 This is a partial enlarged view of part B of the present invention; Figure 6 This is a schematic diagram of the structure of the second embodiment of the present invention; Figure 7 This is a partial enlarged view of part C of this utility model.

[0013] The reference numerals and names in the figure are as follows: Base 100, receiving groove 110, limiting hole 120, receiving hole 130, coaxial probe 200, tube body 210, first needle body 220, second needle body 230, insulating sleeve 240, first adhesive 241, second adhesive 242, conical part 221, insulating ring 300, inner ring 310, outer ring 320, protrusion 321, recess 121, shrink ring 131. Detailed Implementation

[0014] The technical solutions in the embodiments of this utility model will be clearly and completely described below. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0015] The present invention will now be described in more detail. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as being "connected to" another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them.

[0016] In the description of this utility model, it should be noted that directional terms such as "front, back, up, down, left, right," "horizontal, vertical, horizontal," and "top, bottom," indicating directions or positional relationships, are generally based on the directions or positional relationships shown in the accompanying drawings. They are used only for the convenience of describing this utility model and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or component referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as limiting the scope of protection of this utility model. The directional terms "inner" and "outer" refer to the inner and outer contours of each component itself. In the description of this utility model, it should be noted that the use of terms such as "first" and "second" to define components is merely for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this utility model. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0017] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the invention.

[0018] Furthermore, the technical features involved in the different embodiments of this application described below can be combined with each other as long as they do not conflict with each other.

[0019] The preferred embodiments of this utility model will now be further described with reference to the accompanying drawings. Figures 1 to 5 As shown, a high-frequency potting test socket for a coaxial probe 200 includes a base 100. A recessed receiving groove 110 is provided on the top of the base 100. Several limiting holes 120 are arranged at preset intervals at the bottom of the receiving groove 110. The receiving groove 110 is used to prevent chip displacement within the receiving groove 110. A receiving hole 130 is located at the bottom of the limiting holes 120, penetrating the bottom of the limiting holes 120. A coaxial probe 200 is disposed within the receiving hole 130. The coaxial probe 200 includes a tube 210. A first needle body 220 and a second needle body 230 are respectively installed at both ends of the tube 210. The diameters of the first needle body 220 and the second needle body 230 are smaller than that of the tube 210. An insulating sleeve 240 is fitted onto the outer wall of the tube 210. The insulating sleeve 240 contacts the inner wall of the receiving hole 130 and is limited by both ends of the receiving hole 130.

[0020] In the working state of this embodiment, the coaxial probe 200 is first installed into the receiving hole 130. Since the diameter of the first needle body 220 and the second needle body 230 is smaller than that of the tube body 210, and since the insulating sleeve 240 is in contact with the inner wall of the receiving hole 130 and is limited by both ends of the receiving hole 130, the inner wall of the receiving hole 130 does not contact the tube body 210, the first needle body 220 and the second needle body 230. Then, the chip to be tested is placed into the receiving hole 130 so that the chip to be tested is in contact with the coaxial probe 200. When testing is required, the pressure block of the testing equipment is pressed into the receiving groove 110 so that it presses the chip to be tested from the top, thereby ensuring the contact between the chip to be tested and the coaxial probe 200.

[0021] Compared with the prior art, this application achieves an insulation effect by attaching an insulating sleeve 240 to the outer wall of the tube body 210, with the insulating sleeve 240 contacting the inner wall of the receiving hole 130, so that the probe does not directly contact the metal base 100. In addition, the metal shielding signal characteristics enable the transmission of high-frequency signals during the testing process.

[0022] Further, based on the above embodiments, such as Figure 3As shown, the insulating sleeve 240 includes a first adhesive body 241 and a second adhesive body 242. The first adhesive body 241 and the second adhesive body 242 are located at both ends of the tube body 210, respectively. The first adhesive body 241 is located on one side of the first needle body 220, and the second adhesive body 242 is located on one side of the second needle body 230. Thus, when the first adhesive body 241 and the second adhesive body 242 are limited by the two ends of the receiving hole 130, the travel of the tube body 210 within the receiving hole 130 is restricted. This makes it less likely for the coaxial probe 200 to detach from the receiving hole 130 when it comes into contact with the object to be tested, thereby improving the stability of the coaxial probe 200 within the receiving hole 130.

[0023] Further, based on the above embodiment, shrink rings 131 are provided at both ends of the receiving hole 130. The inner diameter of the shrink rings 131 is smaller than the inner diameter of the receiving hole 130. When the coaxial probe 200 is in the receiving hole 130, the shrink rings 131 block the movement of the first colloid 241 and the second colloid 242, thereby limiting the insulating sleeve 240 by the two ends of the receiving hole 130.

[0024] Further, based on the above embodiment, the first needle body 220 and the tube body 210 are fixed to each other and extend beyond the limiting hole 120. The second needle body 230 can move along the inner wall of the tube body 210 inside the tube body 210. A spring is provided between the first needle body 220 and the second needle body 230. During testing, the first needle body 220 contacts the chip under test, and the second needle body 230 is connected to the circuit board. When the first needle body 220 contacts the chip under test, since the first needle body 220 is fixedly connected to the tube body 210, the second needle body 230 is compressed and moves upward, causing the spring inside the tube body 210 to be compressed, thereby providing a reverse elastic force to the second needle body 230, so that the second needle body 230 remains on the circuit board.

[0025] Further, based on the above embodiments, such as Figure 3 As shown, one end of the first needle body 220 is provided with a plurality of tapered portions 221, which allow the first needle body 220 to make more precise contact with the contact points of the product being tested.

[0026] Furthermore, based on the above embodiments, and combining Figure 5 , Figure 6 and Figure 7As shown, an insulating rubber ring 300 covers the limiting hole 120. The inner ring 310 of the insulating rubber ring 300 is attached to the outer wall of the first needle body 220, and the outer ring 320 of the insulating rubber ring 300 is engaged with the inner wall of the limiting hole 120. In this way, the insulating rubber ring 300 seals the receiving hole 130, thereby preventing foreign objects from falling into the receiving hole 130 and causing abnormalities during testing. At the same time, since the insulating rubber ring 300 is made of insulating material, it also prevents the first needle body 220 from directly contacting the metal base 100.

[0027] Further, based on the above embodiments, such as Figure 7 As shown, a protrusion 321 is provided on the outer ring 320 of the insulating rubber ring 300, and a recess 121 that cooperates with the protrusion 321 is provided on the inner wall of the limiting hole 120. When the insulating rubber ring 300 covers the limiting hole 120, the protrusion 321 is engaged in the recess 121, so that the insulating rubber ring 300 and the limiting hole 120 are engaged and fixed.

[0028] The details of the above exemplary embodiments are provided, and the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. Therefore, the embodiments should be regarded as exemplary and non-limiting in all respects, and the scope of the present invention is defined by the appended claims rather than the foregoing description. Therefore, it is intended that all changes falling within the meaning and scope of equivalents of the claims be included within the present invention.

Claims

1. A high-frequency potting test fixture for coaxial probes, characterized in that, The device includes a base (100), on the top of which is a recessed receiving groove (110). At the bottom of the receiving groove (110) are a plurality of limiting holes (120) arranged at predetermined intervals. The receiving groove (110) is used to prevent the chip from shifting within it. At the bottom of the limiting holes (120) is a receiving hole (130) that extends through the bottom of the limiting holes (120). A coaxial [device / structure] is provided within the receiving hole (130). The probe (200) includes a tube (210), and a first needle body (220) and a second needle body (230) are coaxially mounted at both ends of the tube (210). The diameters of the first needle body (220) and the second needle body (230) are smaller than those of the tube (210). An insulating sleeve (240) is fitted on the outer wall of the tube (210). The insulating sleeve (240) contacts the inner wall of the receiving hole (130) and is limited by both ends of the receiving hole (130).

2. The high-frequency potting test fixture for coaxial probes according to claim 1, characterized in that, The insulating sleeve (240) includes a first adhesive (241) and a second adhesive (242), the first adhesive (241) and the second adhesive (242) being located at the two ends of the tube (210), the first adhesive (241) being located on one side of the first needle body (220), and the second adhesive (242) being located on one side of the second needle body (230).

3. The high-frequency potting test fixture for coaxial probes according to claim 2, characterized in that, Shrink rings (131) are provided at both ends of the receiving hole (130). The inner diameter of the shrink rings (131) is smaller than the inner diameter of the receiving hole (130). When the coaxial probe (200) is in the receiving hole (130), the shrink rings (131) block the up and down movement of the first colloid (241) and the second colloid (242).

4. The high-frequency potting test fixture for coaxial probes according to claim 3, characterized in that, The first needle body (220) and the tube body (210) are fixed to each other and extend out of the limiting hole (120). The second needle body (230) can move along the inner wall of the tube body (210) inside the tube body (210). The first needle body (220) and the second needle body (230) are connected by a spring.

5. The high-frequency potting test fixture for coaxial probes according to claim 2, characterized in that, The first needle body (220) has several tapered portions (221) at one end.

6. The high-frequency potting test fixture for coaxial probes according to claim 1, characterized in that, An insulating rubber ring (300) is covered inside the limiting hole (120). The inner ring (310) of the insulating rubber ring (300) is attached to the outer wall of the first needle body (220), and the outer ring (320) of the insulating rubber ring (300) is engaged with the inner wall of the limiting hole (120).

7. The high-frequency potting test fixture for coaxial probes according to claim 6, characterized in that, A protrusion (321) is provided on the outer ring (320) of the insulating rubber ring (300), and a recess (121) is provided on the inner wall of the limiting hole (120) to cooperate with the protrusion (321). When the insulating rubber ring (300) covers the limiting hole (120), the protrusion (321) is engaged in the recess (121).

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