Probe for a digital oscilloscope, digital oscilloscope and signal processing system

Abstract

The application provides a probe for a digital oscilloscope, a digital oscilloscope and a signal processing system. By arranging and serially converting units in the probe, one or more input signals collected by the probe are converted into high-speed serial input signals, and the signals are transmitted to the digital oscilloscope by replacing traditional multiple or multiple pairs of transmission media with a single transmission medium or a single pair of differential transmission media, so that the complexity and cost of the transmission media are significantly reduced, the timing deviation problem caused by the difficulty in line length matching of multiple parallel signals is avoided, and the anti-interference ability of signal transmission between the probe and the main body of the digital oscilloscope is improved. The matched digital oscilloscope is provided with serial-to-parallel conversion units, which convert and restore the serial input signals received from the probe through the transmission medium into original one or more input signals, so that the accuracy of signal processing and feature extraction is ensured.

Description

Technical Field

[0001] This utility model relates to the field of oscilloscope technology, specifically to a probe for a digital oscilloscope, a digital oscilloscope, and a signal processing system. Background Technology

[0002] Oscilloscopes are indispensable time-domain testing tools for electronic engineers and researchers. They convert electrical signals into visual waveforms through high-speed sampling, displaying voltage changes over time in real time. They can accurately measure parameters such as signal frequency, amplitude, rise time, and jitter, and are widely used in circuit debugging, fault diagnosis, and signal integrity analysis.

[0003] As a "bridge" connecting the circuit under test and the oscilloscope, the core function of the oscilloscope probe is to transmit high-impedance signals to the oscilloscope input without distortion, while providing an appropriate attenuation ratio to match different range requirements, and having sufficient bandwidth and low load effect to ensure that the true signal is captured in high-speed or sensitive circuits, and to avoid interference with the measurement results due to the characteristics of the probe itself.

[0004] The signals transmitted from the probe to the main body of a digital oscilloscope are all parallel data. There are two common forms: one is directly detecting the unprocessed raw signal, and the other is a differential signal processed by a comparator. When transmitting signals through a dedicated transmission medium (such as a transmission cable or fiber optic cable) connected between the oscilloscope probe and the oscilloscope, the amount of transmission medium required for the raw signal transmission is the same as the number of input signals, but it places special impedance requirements on the cable. While differential signal transmission reduces the requirements for the cable, it requires twice the amount of transmission medium as the input signal, resulting in a larger and more expensive transmission medium.

[0005] It is evident that the transmission of oscilloscope probe output signals currently places high demands on the transmission medium. Therefore, it is worthwhile to explore how to change the form of oscilloscope probe output signals to reduce the requirements for the transmission medium. Utility Model Content

[0006] This invention provides a probe for a digital oscilloscope, a digital oscilloscope, and a signal processing system, which can convert the probe output signal for a digital oscilloscope from parallel data to serial data, thereby solving the technical problem of high requirements for transmission media for parallel data.

[0007] In a first aspect, embodiments of this application provide a probe for a digital oscilloscope, comprising: an input module, an output module, and a first signal conversion module connected between the input module and the output module;

[0008] The input module has multiple input ports for acquiring one or multiple input signals in parallel;

[0009] The first signal conversion module includes at least a parallel-to-serial conversion unit; the parallel-to-serial conversion unit is used to receive the input signal acquired by the input module and to perform serialization processing on the input signal to convert it into a serial input signal;

[0010] The output module is used to output the serial input signal to the main body of the digital oscilloscope connected through the transmission medium.

[0011] In some embodiments, the first signal conversion module further includes a comparator unit; the comparator unit includes comparators corresponding one-to-one with the input ports, each comparator is connected between its corresponding input port and the parallel-to-serial conversion unit, the first end of the comparator is connected to its corresponding input port for acquiring an input signal, the second input end is used to acquire a preset threshold voltage, and the output end is connected to the parallel-to-serial conversion unit, each comparator is used to compare its acquired input signal with the acquired threshold voltage and output a logic level signal.

[0012] In some embodiments, the first signal conversion module further includes at least one digital-to-analog converter; the output terminal of the digital-to-analog converter is connected to the second input terminal of each comparator in the comparator unit to form the threshold voltage of each comparator.

[0013] In some embodiments, the probe for the digital oscilloscope further includes a first control module; a first output terminal of the first control module is connected to the output terminal of at least one of the digital-to-analog converters for outputting the threshold voltage value to the digital-to-analog converter.

[0014] In some embodiments, the second output terminal of the first control module is connected to the control terminal of the parallel-to-serial conversion unit, and is used to generate control instructions for controlling the working state of the parallel-to-serial conversion unit according to external input instructions.

[0015] In some embodiments, the preset threshold voltage is set by the user according to the test scenario.

[0016] In some embodiments, the output module includes a first high-speed transceiver; the parallel-to-serial conversion unit is further configured to convert the serial input signal into a format that can be received by the first high-speed transceiver.

[0017] In some embodiments, the first signal conversion module and / or the output module are integrated into the first microprocessor; the parallel-to-serial conversion unit is a serializer module built into the first microprocessor, and the first high-speed transceiver is a transceiver module built into the first microprocessor.

[0018] Secondly, embodiments of this application provide a digital oscilloscope, including: a receiving module, a second signal conversion module, a signal processing module, and a display module;

[0019] The receiving module is used to receive serial input signals transmitted by the matching probe through the transmission medium;

[0020] The second signal conversion module includes at least a serial-to-parallel conversion unit, which is used to receive the serial input signal and deserialize the serial input signal to convert it into a parallel input signal;

[0021] The signal processing module is used to receive the recovered parallel input signal, and perform signal processing and feature extraction on the parallel input signal according to preset measurement items to generate waveforms and / or measurement results corresponding to the parallel input signal;

[0022] The display module is used to display the waveform and / or measurement results.

[0023] In some embodiments, the receiving module includes a second high-speed transceiver; the serial-to-parallel conversion unit is used to convert the serial input signal received through the second high-speed transceiver into a format that can be received by the signal processing module;

[0024] And / or, the digital oscilloscope further includes a second control module; the second control module is used to generate a first control command for controlling the working state of the serial-to-parallel conversion unit and a second control command for controlling the operation of the matched probe according to an external input command; wherein, the second control command includes a threshold voltage value corresponding to the output signal of the probe set by the user through the digital oscilloscope.

[0025] In some embodiments, the receiving module and / or the second signal conversion module are integrated into the second microprocessor, the serial-to-parallel conversion unit is a deserializer module built into the second microprocessor, and the second high-speed transceiver is a transceiver module built into the second microprocessor.

[0026] Thirdly, embodiments of this application provide a signal processing system, including: a probe for a digital oscilloscope as described in any embodiment of the first aspect, a digital oscilloscope as described in any embodiment of the second aspect, and a transmission medium respectively connecting the probe for the digital oscilloscope and the digital oscilloscope.

[0027] In some embodiments, the transmission medium includes transmission cables or optical fibers.

[0028] The probe, digital oscilloscope, and signal processing system provided in this application embodiment convert one or more input signals acquired by the probe into high-speed serial input signals by setting a parallel-to-serial conversion unit in the probe. This allows the transmission of signals to the digital oscilloscope using a single transmission medium or a single pair of differential transmission media instead of the traditional multiple transmission media, significantly reducing the complexity and cost of the transmission medium. Similarly, by setting a parallel-to-serial conversion unit in the digital oscilloscope, the serial input signals received from the probe via the transmission medium are converted back to the original one or more input signals. Compared to directly receiving parallel signals transmitted from the probe, serial signals offer superior performance in terms of interference resistance and long-distance transmission, reducing signal distortion during transmission and ensuring stable signal transmission over long distances or in complex environments. Attached Figure Description

[0029] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0030] Figure 1 This is a schematic diagram of the structure of a signal processing system provided in one embodiment of this application.

[0031] Figure 2 This is a schematic diagram of the structure of a probe for a digital oscilloscope provided in one embodiment of this application.

[0032] Figure 3 This is a schematic diagram of a serialization process provided in one embodiment of this application.

[0033] Figure 4 This is a schematic diagram of the structure of a probe for a digital oscilloscope provided in another embodiment of this application.

[0034] Figure 5 This is a schematic diagram of the structure of a probe for a digital oscilloscope provided in another embodiment of this application.

[0035] Figure 6 This is a schematic diagram of the structure of a digital oscilloscope provided in one embodiment of this application.

[0036] Figure 7 This is a schematic diagram of the deserialization process provided in one embodiment of this application.

[0037] Figure 8 This is a schematic diagram of the structure of a digital oscilloscope provided in another embodiment of this application.

[0038] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0039] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments. Similar elements in different embodiments are referred to by related similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of the present application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to the present application are not shown or described in the specification. This is to avoid obscuring the core parts of the present application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0040] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0041] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class, without limiting the number of objects; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship. Unless otherwise specified, the terms "connection" and "linkage" used in this application include both direct and indirect connections (linkages).

[0042] Figure 1 This is a schematic diagram of the structure of a signal processing system provided in one embodiment of this application. Figure 1As shown, the signal processing system provided in this embodiment includes at least a probe 100 for a digital oscilloscope, a digital oscilloscope 200, and a transmission medium 300 with its two ends connected to the probe 100 and the digital oscilloscope 200, respectively.

[0043] In this embodiment, the signal processing system is a precision electronic system that integrates signal acquisition, transmission, processing and display, with the digital oscilloscope 200 as its core. It consists of a probe 100, a dedicated transmission medium 300 and the main body of the digital oscilloscope 200 working together to form a complete signal link.

[0044] Probe 100, acting as the system's "sensing antennae," directly contacts the circuit under test. Its input employs a differential or single-ended structure, and the probe incorporates a high-speed comparator or threshold detection circuit to accurately capture the edges (rising / falling edges) of digital signals. It also supports adjustable thresholds to accommodate different level standards. Furthermore, some probes are equipped with overvoltage protection and isolation circuits to prevent high-voltage signals from damaging the oscilloscope body, ensuring operational safety.

[0045] The transmission medium 300 is the "transmission nerve" connecting the probe 100 and the digital oscilloscope 200. It usually adopts a coaxial cable or differential pair structure, with strictly matched characteristic impedance and ultra-low attenuation characteristics to ensure that high-frequency signals are not distorted during long-distance transmission. It can ensure that the original electrical signals captured by the probe 100 are not distorted and have low loss during long-distance transmission. Some high-end transmission media also integrate an electromagnetic shielding layer to cope with complex electromagnetic environments.

[0046] As the "analysis center" of the system, the digital oscilloscope 200 is a high-performance test instrument designed specifically for capturing and analyzing digital signals. After receiving the signal transmitted through the transmission medium 300 via a high-speed front-end circuit, it achieves long-term, high-resolution waveform capture by relying on deep memory. With deep memory and real-time sampling technology, it can capture signal details spanning from microseconds to seconds, such as signal transient anomalies. Subsequently, the digital signal processing (DSP, FPGA+DSP architecture) real-time processing engine completes in-depth processing such as waveform filtering, mathematical operations, parameter measurement (such as rise time and frequency), and spectrum analysis. Finally, the processed signal is presented on the display screen in the form of a high-resolution waveform. Some digital oscilloscopes 200 also support intelligent interactive functions such as multi-channel comparison, cursor annotation / measurement, automatic parameter testing, report generation, and analysis result output, forming a closed loop from signal acquisition and transmission to analysis and display.

[0047] In this embodiment, the signal processing system begins with the probe 100 making close contact with the circuit under test using a high-impedance or precise impedance matching method. The dedicated digital probe first acquires the target digital signal non-destructively through a low-load input structure. The signal edge features are then precisely extracted using a high-speed comparator and an adjustable threshold circuit. Subsequently, the signal is transmitted to the digital oscilloscope 200 in a low-loss and anti-interference manner through a dedicated transmission medium 300 with strictly matched characteristic impedance. After the high-speed receiving circuit at the front end of the digital oscilloscope 200 performs impedance matching and level adaptation on the input signal, the processing engine immediately performs real-time analysis on the data. Through multi-level trigger logic, the target event (such as a specific edge, pulse width, or logic combination) is precisely located, and in-depth processing such as waveform filtering and mathematical operations is performed. Finally, the processed signal is dynamically displayed on the screen in the form of a high-resolution waveform, forming a complete closed loop from signal acquisition and transmission to intelligent analysis.

[0048] As described in the background section, the signals transmitted from the probe 100 to the digital oscilloscope 200 are currently all parallel data, commonly in two forms: one is the direct detection of the unprocessed raw signal, and the other is a differential signal processed by a comparator. When transmitting signals through the transmission medium 300 connected between the probe 100 and the digital oscilloscope 200, the number of transmission medium 300s required for the transmission of the raw signal is the same as the number of input signals, but it places special impedance requirements on the wiring. While the transmission of differential signals reduces the requirements on the wiring, it requires twice the number of transmission medium 300s as the number of input signals, resulting in a large volume and high cost for the transmission medium 300.

[0049] It is evident that the current transmission of the output signal from probe 100 places high demands on the transmission medium 300. This application upgrades and optimizes the structure of probe 100 by adding a signal converter to convert the parallel data of probe 100's output signal into serial data, which is then transmitted to the main body of the digital oscilloscope via the transmission medium 300. Simultaneously, a signal converter is added to the digital oscilloscope 200 to convert the serial data transmitted through the transmission medium 300 back into parallel data, thereby reducing the requirements on the transmission medium 300.

[0050] The structure of the improved probe 100 and digital oscilloscope 200 will be described in detail below.

[0051] Figure 2 This is a schematic diagram of the structure of a probe for a digital oscilloscope provided in one embodiment of this application. Figure 2 As shown, the probe 100 for a digital oscilloscope provided in this embodiment includes at least an input module 110, an output module 120, and a first signal conversion module 130 connected between the input module 110 and the output module 120.

[0052] In this embodiment, the input module 110 has multiple input ports for acquiring one or multiple input signals in parallel. The input module 110 serves as the signal input front end of the probe 100. To cooperate with the multi-channel digital oscilloscope 200, multiple independent input ports are typically provided at the probe 100 end. Each input port can be directly connected to the circuit under test. These multiple independent input ports can support single-ended signal input or differential signal input. During use, they can flexibly adapt to one independent signal or multiple parallel signals to suit scenarios of single-signal acquisition or multi-channel synchronous acquisition.

[0053] In some embodiments, the input module 110 further includes at least one of a signal adaptation unit, a signal protection unit, and a signal preprocessing unit. The signal adaptation unit has a built-in impedance matching network, such as a 50Ω or high-impedance mode, for matching the impedance of the source under test and reducing signal reflection; the signal protection unit includes overvoltage protection circuits, current limiting circuits, etc., for preventing high voltage or high current from damaging subsequent circuits; the signal preprocessing unit is used to perform preliminary conditioning on the input signal (such as DC bias adjustment, amplitude attenuation / amplification) to ensure that the signal amplitude is within the dynamic range of subsequent modules.

[0054] In this embodiment, the first signal conversion module 130 includes at least a parallel-to-serial conversion unit 1301. The parallel-to-serial conversion unit 1301 receives the input signal acquired by the input module 110 and converts the input signal into a serial input signal after parallel-to-serial processing. The parallel-to-serial conversion unit 1301 receives a single-channel signal or multiple parallel signals output by the input module 110 through a high-speed parallel interface, and reassembles the parallel data stream into a high-speed serial data stream bit by bit or byte by byte through a high-speed serializer. For example, it converts eight 1Gbps parallel signals into a single 8Gbps serial signal. The converted serial signal is transmitted to the output module 120 through the transmission medium 300.

[0055] Traditional multi-channel signal transmission uses a multi-line parallel transmission mode, including single-ended signal transmission and differential signal transmission. Single-ended signal transmission uses an independent transmission line for each signal, i.e., N signals use N single-ended lines, isolated by ground wires, to complete multi-channel signal transmission. Differential signal transmission uses a pair of differential lines for each signal, i.e., N signals use N / 2 pairs of differential lines, improving anti-interference capability through common-mode noise suppression, to complete multi-channel signal transmission. It is evident that in the traditional method, the number of lines increases linearly with the number of signal channels, leading to a surge in the diameter, weight, and cost of the transmission medium. Furthermore, it requires high timing synchronization; to avoid data errors caused by timing deviations, equal-length wiring is necessary, undoubtedly increasing wiring complexity. Simultaneously, to avoid crosstalk and electromagnetic interference from multi-line parallel transmission, additional shielding layers or increased line spacing compensation are required, further exacerbating cost and size.

[0056] In this embodiment, the parallel-to-serial conversion unit 1301 enables the conversion of multiple signals to a single signal, significantly reducing the complexity and cost of the transmission medium. For single-ended serial signal transmission, the frequency clock multiplexes multiple parallel data streams into a single high-speed serial stream, requiring only a single transmission line to transmit the original probe signal. For differential serial signal transmission, only a single pair of differential lines is needed to complete the signal transmission. Through the common-mode rejection characteristics of differential signals, longer transmission distances and higher anti-interference capabilities can also be achieved.

[0057] Figure 3 This is a schematic diagram illustrating a serialization process according to one embodiment of this application. Figure 3 As shown, multiple input ports in the input module 110 of probe 100 are connected to multiple data streams, forming multi-channel parallel data. Each channel carries an independent signal data stream; for example, channel 1 contains data 1, data 2, ..., data n, and other channels store data in a similar manner. The parallel data is then transmitted to the parallel-to-serial conversion unit 1301, where it undergoes a serialization process. The data, originally distributed in parallel across different channels, is reassembled bit by bit or byte by byte and output sequentially according to the channel order, thereby converting the multi-channel parallel data into a single-channel serial data stream for subsequent unified transmission, storage, or further processing.

[0058] In this embodiment, the output module 120 is used to output a serial input signal to the digital oscilloscope 200 connected via the transmission medium 300. After the parallel-to-serial conversion unit 1301 converts the multiple input signals acquired by the multi-port capture into parallel input signals, the output module 120 transmits them to the connected digital oscilloscope 200 via the transmission medium 300. The output module 120 serves as the signal output interface of the probe 100 and undertakes the driving and transmission functions of the serial signal.

[0059] In some implementations, the output module 120 includes at least one of an impedance matching unit and an auxiliary unit. The impedance matching unit is used to match the impedance of the output signal with the characteristic impedance of the transmission medium 300 through an integrated terminating resistor, thereby eliminating output signal reflection. The auxiliary unit includes a clock recovery circuit or eye diagram monitoring function integrated in the output module 120 for real-time evaluation of signal quality and feedback to the digital oscilloscope 200 for dynamic calibration.

[0060] In summary, the probe for digital oscilloscopes provided in this embodiment, through its integrated input module, parallel-to-serial conversion unit, and output module architecture, enables the conversion and transmission of multiple parallel input signals into high-speed serial input signals. By replacing traditional multiple or multiple pairs of transmission media with a single transmission medium or a single pair of differential transmission media, the complexity and cost of the transmission medium are significantly reduced. This also overcomes transmission bandwidth limitations and greatly improves signal transmission rate. Simultaneously, it avoids timing deviations caused by difficulties in matching line lengths for multiple parallel signals, improving the anti-interference capability of signal transmission between the probe and the digital oscilloscope body. Furthermore, the standardized serial interface enables serial signal transmission compatible with different transmission media, enhancing system flexibility and scalability.

[0061] Figure 4 This is a schematic diagram of the structure of a probe for a digital oscilloscope, provided as another embodiment of this application. Figure 4 As shown, the probe 100 provided in this embodiment is based on any of the above embodiments, and the first signal conversion module 130 includes a comparator unit 1302, or may further include a digital-to-analog converter 1303.

[0062] In this embodiment, the first signal conversion module 130 includes a comparator unit 1302. The comparator unit 1302 includes comparators of the same number and one-to-one correspondence as the multiple input ports in the input module 110. Each comparator is connected between its corresponding input port and the parallel-to-serial conversion unit 1301 in the first signal conversion module 130. Specifically, the first terminal of each comparator is connected to its corresponding input port to acquire the input signal transmitted through the port. The second terminal of the comparator is used to acquire a preset threshold voltage. The output terminals of all comparators are connected to the input terminals of the parallel-to-serial conversion unit 1301. Each comparator compares its acquired input signal with the acquired threshold voltage and outputs a logic level signal.

[0063] From a signal processing perspective, the signals received by the input module 110 of probe 100 are often complex and diverse, potentially containing noise, and may also exhibit differences in amplitude and level states. This can affect subsequent comparative analysis by the digital oscilloscope 200, such as determining signal voltage levels and logic states. By setting a comparator to accurately compare the input signal based on a predefined threshold voltage, the continuously changing input signal is converted into a discrete digital signal or a logic level signal with clearly defined states. This process shapes and identifies the input signal, removing some noise interference and improving signal quality. Simultaneously, signal conditioning by the comparator ensures that the signal input to the parallel-to-serial conversion unit 1301 conforms to the specified format, guaranteeing stable and accurate parallel-to-serial processing by the unit. Ultimately, this allows the output module 120 to transmit a reliable and clear serial input signal to the digital oscilloscope 200, ensuring accurate measurement and analysis of the measured signal by the digital oscilloscope 200.

[0064] In some embodiments, the threshold voltage is set by the user according to the test scenario. Specifically, the user can set it at probe 100 or at the digital oscilloscope 200. In different test scenarios, signal characteristics such as amplitude range and noise level vary. By setting an appropriate threshold voltage according to these actual conditions, the user can enable the comparator to more accurately compare and judge the input signal and effectively identify the key features of the signal.

[0065] In some embodiments, the threshold voltage set for each comparator can be either kept the same or set differently according to actual needs. When multiple input signals in a test scenario have similar characteristics, such as similar amplitude ranges and consistent critical levels, setting the threshold voltage of the comparators to be the same can simplify the setup process and allow for signal comparison and processing using a unified standard. However, when different input signals have significantly different characteristics, such as some signals having high-level amplitudes while others have different critical transition points, setting different threshold voltages allows each comparator to more accurately adapt to the characteristics of the corresponding signal, accurately identify the signal state, and thus improve the overall probe 100's ability to process complex signals and its testing accuracy.

[0066] In this embodiment, the first signal conversion module 130 further includes at least one digital-to-analog converter 1303. The output terminal of the digital-to-analog converter 1303 is connected to the second input terminal of each comparator in the comparator unit 1302, and provides a threshold voltage to each comparator.

[0067] The digital-to-analog converter 1303 converts digital signals into analog signals. Its output is connected to each comparator in the comparator unit 1302, and the output analog voltage sets the corresponding threshold voltage for each comparator. Users can configure the digital-to-analog converter 1303 to output specific analog voltages according to different testing requirements, thereby flexibly adjusting the threshold voltages of each comparator and allowing the comparators to compare and judge the input signals according to preset standards. This method avoids the errors and instabilities that may arise from traditional methods such as manually adjusting potentiometers in analog circuits, improves the accuracy and repeatability of threshold voltage settings, and better adapts to the diverse needs of signal comparison standards in different testing scenarios, thus improving the testing performance and reliability of the probe 100. In other words, if multiple comparators have the same threshold voltage, only one digital-to-analog converter 1303 needs to be configured to output the same threshold voltage to multiple comparators for signal comparison; if the threshold voltages of multiple comparators are different according to actual needs, multiple digital-to-analog converters 1303 need to be configured, each corresponding to a comparator, to provide its respective threshold voltage to the corresponding comparator.

[0068] Figure 5 This is a schematic diagram of the structure of a probe for a digital oscilloscope provided in another embodiment of this application. Figure 5 As shown, the probe 100 for a numerical oscilloscope provided in this embodiment, based on any of the above embodiments, further includes a first control module 140. The first output terminal of the first control module 140 is connected to the output terminal of at least one digital-to-analog converter 1303, and is used to output a threshold voltage value to the digital-to-analog converter 1303. The second output terminal of the first control module 140 is connected to the control terminal of the parallel-to-serial conversion unit 1301, and is used to generate control commands for controlling the working state of the parallel-to-serial conversion unit 1301 according to external input commands.

[0069] As mentioned earlier, the threshold voltage is set by the user according to the test scenario. Specifically, the user can set it at probe 100 or at the digital oscilloscope 200. When setting it at probe 100, the user inputs a command to the first control module 140, which generates a command representing the threshold voltage value and sends it to the digital-to-analog converter 1303. The digital-to-analog converter 1303 then converts the received voltage value into a corresponding analog voltage, thereby setting an accurate operating threshold for the comparator.

[0070] The first control module 140 is also used to flexibly control the working state of the parallel-to-serial conversion unit 1301 according to external input commands. When the user inputs a specific command through an external device, the first control module 140 can quickly parse the command and generate corresponding control signals to adjust the working mode of the parallel-to-serial conversion unit 1301, such as starting or stopping the parallel-to-serial conversion, adjusting the conversion rate, etc. The flexible control method enables the parallel-to-serial conversion unit 1301 to better adapt to different test requirements and signal characteristics, optimize the data conversion process, and improve the overall performance and response speed of the probe 100.

[0071] In some embodiments, the input commands received by the first control module 140 from the user may be inputs set by the user at the probe 100 end, or they may be set by the user at the digital oscilloscope 200 end through the interaction module of the digital oscilloscope 200, and then transmitted by the digital oscilloscope 200 to the first control module 140 through the transmission medium 300 or the communication module.

[0072] like Figure 5 As shown, in some embodiments, the output module 120 of the probe 100 is equipped with a first high-speed transceiver for transmitting the serial input signal converted by the parallel-to-serial conversion unit 1301 to the connected digital oscilloscope 200 via the transmission medium 300. During this process, the parallel-to-serial conversion unit 1301 not only converts the parallel input signal to a serial input signal, but also converts the serial input signal into a format that can be received by the first high-speed transceiver.

[0073] In some embodiments, the first signal conversion module 130 and / or output module 120 in probe 100 are both integrated in the first microprocessor. The parallel-to-serial conversion unit 1301 in the first signal conversion module 130 is a serializer module built into the first microprocessor, and the first high-speed transceiver in the output module 120 is a transceiver module built into the first microprocessor.

[0074] In probe 100, considering its size and power consumption, a microprocessor integrating multiple functional modules is typically used. This highly integrates various functions such as signal processing, control logic, and communication into a single chip, significantly reducing the area of ​​the internal circuit board and the number of components, lowering hardware costs and power consumption, while improving the stability and reliability of probe 100. The integrated design facilitates flexible adjustment of module parameters and functions through software programming, enabling rapid adaptation to different test scenarios and signal characteristics, enhancing the versatility and scalability of probe 100, and meeting diverse measurement needs.

[0075] Some microprocessors, such as FPGA (Field Programmable Gate Array), DSP (Digital Signal Processor), and ARM processor, have powerful digital processing capabilities, which can efficiently handle the complex electrical signals acquired by probe 100. They have abundant interface resources, which can easily interact and communicate with other modules in probe 100 and digital oscilloscope 200. Furthermore, through hardware architecture design or software programming configuration, key functional modules such as signal acquisition, preprocessing, data conversion, logic control, and communication can be highly integrated into a single chip, effectively reducing the number of internal components and circuit complexity of probe 100.

[0076] Therefore, in the above embodiments, the signal conversion module and the output module 120 can be integrated into the microprocessor. The specific parallel-to-serial conversion unit 1301 uses the serializer module built into the microprocessor to realize its function, which can efficiently convert parallel data into serial data; the high-speed transceiver uses the transceiver module built into the microprocessor to ensure high-speed and stable data transmission.

[0077] It should be noted that the structure of the probe 100 for a digital oscilloscope provided in any of the above embodiments can be used in any kind of probe 100 for a digital oscilloscope. Other structures of the probe 100 for a digital oscilloscope (such as conditioning circuits, signal processing, etc.) are not specifically limited, and other structures of the probe 100 for a digital oscilloscope provided in this application will not be described in detail here.

[0078] Figure 6 This is a schematic diagram of the structure of a digital oscilloscope provided in one embodiment of this application. Figure 6 As shown, for the probe 100 provided in any of the above embodiments for use with a digital oscilloscope, the digital oscilloscope 200 provided in this embodiment needs to receive the serial input signal transmitted by the probe 100, and needs to deserialize the received serial input signal before signal measurement and analysis to restore the original parallel data, and then measure and analyze the multiple signals separately. The digital oscilloscope 200 provided in this embodiment includes at least a receiving module 210, a second signal conversion module 220, a signal processing module 230, and a display module 240.

[0079] In this embodiment, the receiving module 210 is used to receive the serial input signal transmitted by the matching probe 100 through the transmission medium 300. The receiving module 210 is the module for signal interaction between the digital oscilloscope 200 and the external probe 100, used to accurately receive the serial input signal transmitted from the matching probe 100 through the transmission medium 300. In some embodiments, to reduce the various interferences and attenuations that may occur to the signal during transmission, the receiving module 210 needs to have high sensitivity and good anti-interference capability to ensure that it can completely and accurately capture the signal transmitted from the probe 100, providing reliable basic data for subsequent signal processing.

[0080] In this embodiment, the second signal conversion module 220 includes at least a serial-to-parallel conversion unit 2201, which is used to receive a serial input signal and convert the serial input signal into a parallel input signal after deserialization.

[0081] The serial-to-parallel conversion unit 2201 in the second signal conversion module 220 is used to receive the serial input signal from the receiving module 210. Using a specific deserialization processing technique, the serial signal that was originally transmitted bit by bit in sequence is recombined into a multi-bit parallel input signal that can be processed simultaneously. For example, the single 8Gbps serial signal from the probe 100 is converted into eight 1Gbps parallel signals. The converted parallel signal is more convenient for other modules inside the digital oscilloscope 200 to process quickly and efficiently.

[0082] Figure 7 This is a schematic diagram illustrating the deserialization process provided in one embodiment of this application. Figure 7 As shown, the receiving module 210 of the digital oscilloscope 200 receives serial data output from the probe 100 via the transmission medium 300, including multiple sets of data from channel 1 to channel 4, such as channel 1 data 1, channel 1 data 2, ..., channel 4 data 2, etc. (more channel cases can be understood for further explanation). It is then transmitted to the serial-to-parallel conversion unit 2201, where it is deserialized. The originally serially transmitted data is converted into parallel data. After conversion, the data of each channel is presented in parallel. For example, channels 1-4 correspond to data 1, data 2, up to data n, etc., realizing the transformation of data transmission format for further processing and analysis.

[0083] In this embodiment, the signal processing module 230 is used to receive the recovered parallel input signal, and perform signal processing and feature extraction on the parallel input signal according to preset measurement items to generate waveform diagrams and / or measurement results corresponding to the parallel input signal.

[0084] The signal processing module 230 is the core "brain" of the digital oscilloscope 200. It receives the parallel input signal recovered by the serial-to-parallel conversion unit 2201, and performs in-depth processing and feature extraction on the signal based on the user-preset measurement items, using various complex algorithms and techniques. For example, it analyzes key parameters such as the signal's frequency, amplitude, and phase, accurately identifies various feature information in the signal, and generates waveforms corresponding to the parallel input signal, intuitively displaying the signal's changing shape. It also provides detailed measurement results, offering strong data support for engineers and technicians to analyze circuit performance and troubleshoot faults.

[0085] In this embodiment, the display module 240 is used to display waveforms and / or measurement results. The display module 240 serves as the window for information interaction between the digital oscilloscope 200 and the user, primarily responsible for presenting the waveforms and / or measurement results generated by the signal processing module 230 in a clear and intuitive manner. Through the high-resolution display screen, the user can observe the dynamic changes of the signal in real time, accurately acquire measurement data, and thus make accurate judgments about the state and performance of the circuit under test.

[0086] Figure 8 This is a schematic diagram of the structure of a digital oscilloscope provided in another embodiment of this application. Figure 8 As shown, based on the digital oscilloscope 200 provided in any of the above embodiments, the receiving module 210 includes a second high-speed transceiver 2101, used to ensure that the signal transmitted from the probe 100 can be captured completely and without error, and transmitted to the subsequent serial-to-parallel conversion unit 2201. The serial-to-parallel conversion unit 2201 converts the serial input signal into a parallel input signal, and also converts the serial input signal into a format that can be recognized and received by the signal processing module 230, laying the foundation for the subsequent signal processing module 230 to perform in-depth analysis and feature extraction of the signal.

[0087] In some embodiments, the receiving module 210 and / or the second signal conversion module 220 in the digital oscilloscope 200 are integrated into the second microprocessor, the serial-to-parallel conversion unit 2201 is a deserializer module built into the second microprocessor, and the second high-speed transceiver 2101 is a transceiver module built into the second microprocessor.

[0088] like Figure 8 As shown, in some embodiments, the digital oscilloscope 200 further includes a second control module. The second control module is used to generate a first control command for controlling the working state of the serial-to-parallel conversion unit 2201 and a second control command for controlling the operation of the probe 100, based on external input commands. The second control command includes a threshold voltage value corresponding to the output signal of the probe 100 set by the user through the digital oscilloscope 200.

[0089] In the digital oscilloscope 200, the control module acts as the central brain of the entire system, primarily responsible for coordinating the collaborative work among the various modules of the digital oscilloscope 200. This includes, for example, rationally allocating system resources to ensure the orderly operation of the receiving module 210, signal conversion module, signal processing module 230, and display module 240; flexibly adjusting system parameters according to different test modes and user habits to optimize the performance of the digital oscilloscope 200; and in some embodiments, the control module also has fault detection and early warning functions, monitoring the system's operating status in real time, and taking timely measures to ensure the stable and reliable operation of the digital oscilloscope 200 once an anomaly is detected.

[0090] In this embodiment, the control module is at least used to generate a first control command to flexibly adjust the working state of the serial-to-parallel conversion unit 2201, ensuring that it can operate efficiently and stably according to test requirements; and to generate a second control command specifically for controlling the operation of the matching probe 100. This includes, in particular, the threshold voltage value corresponding to the output signal of the probe 100 set by the user through the digital oscilloscope 200, and controlling the control module that transmits the value to the probe 100 through the transmission medium 300 or the communication module, so as to meet diverse test scenarios and accurate measurement requirements, and ensure the realization and optimization of the overall function of the digital oscilloscope 200.

[0091] In some embodiments, for example, Figure 1 The signal processing system shown includes a data signal transmission medium 300 connecting the probe 100 and the digital oscilloscope 200, comprising a data signal transmission medium and a control signal transmission medium. The two ends of the data signal transmission medium are respectively connected to a first high-speed transceiver at the probe 100 end and a second high-speed transceiver 2101 at the digital oscilloscope 200 end, for transmitting the parallel input signal output from the first high-speed transceiver to the second high-speed transceiver 2101. The two ends of the control signal transmission medium are respectively connected to a first control module 140 at the probe 100 end and a second control module at the digital oscilloscope 200 end, for transmitting the second control command output from the second control module to the first control module 140.

[0092] In summary, the digital oscilloscopes provided in any of the above embodiments differ from traditional digital oscilloscopes that directly receive parallel signals. Instead, they first acquire the serial input signal transmitted from the probe via a transmission medium through a receiving module. Then, the serial-to-parallel conversion unit of the signal conversion module deserializes this signal into a parallel signal. Furthermore, the signal processing module processes the signal according to preset parameters, extracts features to generate waveforms and results, and the display module clearly presents the output. Compared to directly receiving parallel signals transmitted from the probe, serial signals offer superior performance in terms of interference resistance and long-distance transmission, reducing signal distortion during transmission and ensuring stable signal transmission over long distances or in complex environments. This improves the overall reliability and effectiveness of the digital oscilloscope's measurements.

[0093] It should be noted that the structure of the digital oscilloscope 200 provided in any of the above embodiments can be used in any kind of digital oscilloscope 200. Other structures of the digital oscilloscope 200 (such as the specific circuits of the signal processing module and the display module) are not specifically limited, and other structures of the digital oscilloscope 200 provided in this application will not be described in detail here.

[0094] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art, under the guidance of this application, can make several simple deductions, modifications or substitutions based on the spirit of this application and the scope of protection of the claims without departing from the spirit of this application and the claims. All of these are within the protection scope of this application.

Claims

1. A probe for a digital oscilloscope, characterized in that, include: An input module, an output module, and a first signal conversion module connected between the input module and the output module; The input module has multiple input ports for acquiring one or multiple input signals in parallel; The first signal conversion module includes at least a parallel-to-serial conversion unit; the parallel-to-serial conversion unit is used to receive the input signal acquired by the input module and to perform serialization processing on the input signal to convert it into a serial input signal; The output module is used to output the serial input signal to the main body of the digital oscilloscope connected through the transmission medium.

2. The probe for a digital oscilloscope according to claim 1, characterized in that, The first signal conversion module further includes a comparator unit; The comparator unit includes comparators that correspond one-to-one with the input ports. Each comparator is connected between its corresponding input port and the parallel-to-serial conversion unit. The first end of the comparator is connected to its corresponding input port to acquire the input signal, the second input end is used to acquire a preset threshold voltage, and the output end is connected to the parallel-to-serial conversion unit. Each comparator is used to compare its acquired input signal with the acquired threshold voltage and then output a logic level signal.

3. The probe for a digital oscilloscope according to claim 2, characterized in that, The first signal conversion module further includes at least one digital-to-analog converter; the output terminal of the digital-to-analog converter is connected to the second input terminal of each comparator in the comparator unit, and provides a threshold voltage to each comparator.

4. The probe for a digital oscilloscope according to claim 3, characterized in that, It also includes a first control module; the first output terminal of the first control module is connected to the output terminal of at least one of the digital-to-analog converters, and is used to output the threshold voltage value to the digital-to-analog converter.

5. The probe for a digital oscilloscope according to claim 4, characterized in that, The second output terminal of the first control module is connected to the control terminal of the parallel-to-serial conversion unit, and is used to generate control instructions for controlling the working state of the parallel-to-serial conversion unit according to external input instructions.

6. The probe for a digital oscilloscope according to claim 1, characterized in that, The output module includes a first high-speed transceiver; the parallel-to-serial conversion unit is further configured to convert the serial input signal into a format that can be received by the first high-speed transceiver.

7. The probe for a digital oscilloscope according to claim 6, characterized in that, The first signal conversion module and / or the output module are integrated into the first microprocessor; The parallel-to-serial conversion unit is a serializer module built into the first microprocessor, and the first high-speed transceiver is a transceiver module built into the first microprocessor.

8. A digital oscilloscope, characterized in that, include: The system comprises a receiving module, a second signal conversion module, a signal processing module, and a display module. The receiving module is used to receive serial input signals transmitted by the matching probe through the transmission medium; The second signal conversion module includes at least a serial-to-parallel conversion unit, which is used to receive the serial input signal and deserialize the serial input signal to convert it into a parallel input signal; The signal processing module is used to receive the recovered parallel input signal, and perform signal processing and feature extraction on the parallel input signal according to preset measurement items to generate waveforms and / or measurement results corresponding to the parallel input signal; The display module is used to display the waveform and / or measurement results.

9. The digital oscilloscope according to claim 8, characterized in that, The receiving module includes a second high-speed transceiver; the serial-to-parallel conversion unit is used to convert the serial input signal received through the second high-speed transceiver into a format that can be received by the signal processing module; And / or, the digital oscilloscope further includes a second control module; The second control module is used to generate a first control command for controlling the working state of the serial-to-parallel conversion unit and a second control command for controlling the operation of the matching probe, based on external input instructions; wherein, the second control command includes the threshold voltage value corresponding to the probe output signal set by the user through a digital oscilloscope.

10. The digital oscilloscope according to claim 9, characterized in that, The receiving module and / or the second signal conversion module are integrated in the second microprocessor. The serial-to-parallel conversion unit is a deserializer module built into the second microprocessor, and the second high-speed transceiver is a transceiver module built into the second microprocessor.

11. A signal processing system, characterized in that, include: The probe for a digital oscilloscope as described in any one of claims 1-7, the digital oscilloscope as described in any one of claims 8-10, and the transmission medium connecting the probe for the digital oscilloscope and the digital oscilloscope respectively.

12. The signal processing system according to claim 11, characterized in that, The transmission medium includes transmission cables or optical fibers.

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