A multi-station temperature relay testing system

Abstract

This utility model belongs to the field of temperature relay testing technology and discloses a multi-station testing system for temperature relays. It includes: a test fixture placed in a high and low temperature test chamber; a temperature relay installed inside the test fixture; a temperature sensor connected to a measuring instrument; the temperature sensor collecting temperature changes from the temperature relay; a control unit connected to the temperature relay; and both the testing instrument and the control unit connected to a computer. The computer processes the data fed back from the measuring instrument and the control unit. This utility model uses a matrix-arranged test fixture to place multiple sets of temperature relays within the high and low temperature test chamber, achieving simultaneous multi-station testing and significantly improving testing efficiency. The high and low temperature test chamber simulates ambient temperature, heating, and cooling environments, and the control unit measures the temperature relays, covering the needs of various temperature relay usage scenarios. This utility model improves the accuracy, comprehensiveness, and convenience of temperature relay testing.

Description

Technical Field

[0001] This utility model belongs to the field of temperature relay testing technology, and relates to a multi-station temperature relay testing system. Background Technology

[0002] As a key component for temperature control in industrial and household settings, the accurate testing of temperature relays is fundamental to ensuring the safe and stable operation of related equipment. However, traditional temperature relay testing equipment has significant shortcomings and cannot meet actual testing needs: Firstly, traditional equipment has limited accuracy in temperature measurement and control. For high-precision temperature relays, it cannot accurately obtain core performance indicators such as operating temperature and reset temperature, which may lead to misjudgment of some high-performance temperature relays or inaccurate evaluation of their key performance parameters. Secondly, traditional equipment cannot effectively eliminate interference from environmental factors. Ambient temperature, humidity, and electromagnetic interference can all affect test results, resulting in poor repeatability and stability of test results, failing to accurately reflect the true performance of the temperature relay, and thus making it difficult to ensure the reliability of subsequent equipment operation. Utility Model Content

[0003] The purpose of this invention is to solve the problem that traditional temperature relay testing equipment in the prior art suffers from poor repeatability and stability of test results due to insufficient temperature measurement and control accuracy and difficulty in eliminating environmental interference, thus failing to meet actual testing needs. The invention provides a multi-station temperature relay testing system.

[0004] To achieve the above objectives, the present invention adopts the following technical solution: This utility model proposes a multi-station testing system for temperature relays, including a temperature relay, a test fixture, a control unit, a test instrument, a high and low temperature test chamber, and a temperature sensor; The test fixture and the temperature sensor are both mounted on a female base, which is located inside the high and low temperature test chamber. The test fixtures are arranged in an array, and the temperature relay is located inside the test fixture. The temperature sensor is connected to the measuring instrument. The temperature sensor collects the temperature changes of the temperature relay. The control unit is connected to the temperature relay. Both the test instrument and the control unit are connected to a computer.

[0005] Preferably, the test fixtures are arranged in an n*n matrix.

[0006] Preferably, the temperature sensor is positioned in the middle of the matrix.

[0007] Preferably, a contact resistance is provided between the temperature relay and the test fixture; the contact resistance is measured by a TH2515 low resistance tester; the TH2515 low resistance tester is connected to the control unit.

[0008] Preferably, the high and low temperature test chamber simulates ambient temperature, heating and cooling environments, and the control unit integrates a multi-station automatic switching system; the control unit automatically measures the operating temperature, recovery temperature, contact resistance, insulation resistance and dielectric withstand voltage data of the temperature relay under different temperature environments through the multi-station automatic switching system.

[0009] Preferably, the control unit is a Mega2560 microcontroller. Preferably, the test fixture is a TO-220 high-temperature gold-plated test fixture.

[0010] Preferably, the measuring instrument is connected to the computer via RS232.

[0011] Preferably, the control unit communicates with the computer via a COM serial port.

[0012] Compared with the prior art, the present invention has the following beneficial effects: This invention proposes a multi-station testing system for temperature relays. This system utilizes an array of test fixtures to simultaneously test multiple temperature relays, significantly shortening the batch testing cycle and reducing unit product testing costs compared to traditional single-station methods, thus meeting the screening needs of industrial mass production. The female connector integrates the test fixtures and temperature sensors within a high and low temperature test chamber, allowing the sensors to collect relay temperature changes at close range. This avoids interference from environmental temperature gradients and placement errors, laying the foundation for accurate measurement of key parameters and reducing the risk of misjudgment. The modular design of the female connector allows for easy replacement of different relay models by simply adapting the fixture, without adjusting the overall layout, improving compatibility with multiple models. Furthermore, since all components are within the test chamber, there is no need to move the relays, preventing temperature changes from interrupting the test and adapting to full-temperature performance testing. This invention also improves the accuracy, comprehensiveness, and convenience of temperature relay testing.

[0013] Furthermore, by using n*n matrix-arranged test fixtures in conjunction with the female connector, multiple sets of temperature relays are placed inside the high and low temperature test chamber, enabling multi-station synchronous testing and significantly improving testing efficiency.

[0014] Furthermore, the temperature sensor is positioned in the center of the matrix to ensure accurate temperature acquisition. The high and low temperature test chamber can simulate ambient temperature, heating, and cooling environments. The control unit automatically measures the data exhibited by the temperature relay under different temperature conditions through a multi-station automatic switching system, covering the multi-scenario application needs of the temperature relay. Attached Figure Description

[0015] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a connection diagram of the temperature relay multi-station testing system of this utility model; Figure 2 This is a structural diagram of the PT500 temperature sensor in the test fixture of this utility model ((a) is a left view of the PT500 temperature sensor in the test fixture; (b) is a front view of the PT500 temperature sensor in the test fixture).

[0017] Figure 3 This is a schematic diagram of the relay drive circuit of this utility model.

[0018] Figure 4 This is a schematic diagram of the relay test circuit of this utility model.

[0019] Among them, 1-computer, 2-temperature relay, 3-test fixture, 4-control unit, 5-test instrument, 6-high and low temperature test chamber, 7-temperature sensor. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0021] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0022] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0023] In the description of the embodiments of this utility model, it should be noted that if terms such as "upper," "lower," "horizontal," or "inner" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the utility model product is in use, they are only for the convenience of describing the utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the utility model. Furthermore, terms such as "first" and "second" are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0024] Furthermore, the use of the term "horizontal" does not imply that the component must be absolutely horizontal, but rather that it can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0025] In the description of the embodiments of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0026] The present invention will now be described in further detail with reference to the accompanying drawings: See Figure 1 This utility model discloses a multi-station temperature relay testing system, including a temperature relay 2, a test fixture 3, a control unit 4, a test instrument 5, a high and low temperature test chamber 6, and a temperature sensor 7; The test fixture 3 and the temperature sensor 7 are both mounted on a female base, which is located inside the high and low temperature test chamber 6. The test fixture 3 is arranged in an array, and the temperature relay 2 is located inside the test fixture 3. The temperature sensor 7 is connected to the measuring instrument 5. The temperature sensor 7 collects the temperature changes of the temperature relay 2. The control unit 4 is connected to the temperature relay 2. The test instrument 5 and the control unit 4 are both connected to the computer 1.

[0027] The test fixtures 3 are arranged in an n*n matrix; the temperature sensor 7 is positioned in the center of the matrix. (See also...) Figure 2 In (a) and (b), the temperature sensor 7 and the temperature relay 2 in the test fixture 3 are no more than 8 cm apart. The signal line of the temperature sensor 7 is connected to the test instrument 5 through a shielded cable to reduce electromagnetic interference.

[0028] There is contact resistance between the temperature relay 2 and the test fixture 3; the contact resistance is measured by a TH2515 low-resistance tester; the TH2515 low-resistance tester is connected to the control unit 4. The high and low temperature test chamber 6 simulates normal temperature, heating and cooling environments, and the control unit 4 integrates a multi-station automatic switching system; the control unit 4 automatically measures the operating temperature, recovery temperature, contact resistance, insulation resistance and dielectric withstand voltage data of the temperature relay 2 under different temperature environments through the multi-station automatic switching system.

[0029] The control unit 4 is a Mega2560 microcontroller; the test fixture 3 is a TO-220 high-temperature gold-plated test fixture. The control unit 4 communicates with the computer 1 via a COM serial port; the measuring instrument 5 is connected to the computer 1 via RS232.

[0030] The Mega2560 microcontroller includes an initialization module, a data acquisition module, a testing module, a data processing module, a type judgment module, and a communication module. The initialization module is used to initialize the external devices connected to the microcontroller; The data acquisition module acquires the electrical parameters of the temperature relay; and acquires the temperature change of the temperature relay 2 through the temperature sensor 7. The test module tests the temperature relay 2 while the tester adjusts the internal temperature of the high and low temperature test chamber 6; The data processing module processes the collected relay performance data; specifically, it performs amplitude limiting filtering on continuously collected temperature data to remove abnormal data; and it performs median value filtering on collected contact resistance values ​​to remove test errors caused by poor contact. The type determination module determines the type of relay by comparing the collected and processed performance data with preset type feature data. The communication module is responsible for data transmission with computer 1.

[0031] The process of performing median filtering on the collected contact resistance values ​​to remove test errors caused by poor contact also includes: comparing the median-filtered contact resistance values ​​with a preset threshold; if the detected contact resistance exceeds the preset threshold, an alarm is triggered to prompt the operator to check the connection.

[0032] The temperature relay 2 was tested while the tester adjusted the internal temperature of the high and low temperature test chamber 6. Specifically: Set the operating temperature range of temperature relay 2. Assuming the technical manual for the sample temperature relay specifies an operating temperature of 65℃ and a recovery temperature of 40℃, then the temperature of the high and low temperature test chamber should be set to rise from 20℃ to 80℃ and then cool down to 20℃. The entire heating and cooling process should maintain a consistent rate of temperature change to avoid large temperature fluctuations.

[0033] Throughout the test, when the temperature approaches 65℃, the system automatically measures and records the operating temperature, while simultaneously measuring the contact resistance data. When the temperature drops to approximately 40℃, the system automatically measures and records the recovery temperature, while simultaneously measuring the contact resistance data. Insulation resistance testing and dielectric withstand voltage testing are automatically performed and data is saved during either the heating or cooling phase, according to the test requirements in the technical manual.

[0034] The method of determining the type of relay by comparing the collected and processed performance data with preset type characteristic data is as follows: A feature database of different types of temperature relays is established in advance. The measured performance parameters of the temperature relays are compared and analyzed with the feature data in the database. Based on the comparison results, the type of temperature relay is determined.

[0035] The high and low temperature test chamber 6 is selected as the NT64-70A, which is a heating / cooling device with high-precision temperature control capabilities. The temperature sensor 7 uses a high-precision PT500 temperature sensor.

[0036] The temperature relay 2 is connected to an external drive circuit; the control unit 4 is directly connected to the relay's drive circuit via logic signals to control the transmission of control signals for corresponding functions. The drive circuit is as follows: Figure 3 As shown, in the relay drive circuit, the network tag signals of D2~D7 originate from the Mega2560. Resistors R33~R38 are pull-up resistors, mainly to improve the driving load capability of the microcontroller Mega2560. Capacitors C3 and C4 provide power supply filtering to ensure the normal and stable operation of the chip. The chip SN74LS04DR is an inverter, which reverses the signal sent by the Mega2560 and inputs it to the subsequent ULN2003A to drive the relay. Figure 3 The main description is of the low-voltage signal. Figure 4 This describes a controlled high-voltage signal. The low-voltage and high-voltage signals are physically isolated by a relay. Figure 4 It is a control principle diagram that the controlled relay should execute after receiving a control signal.

[0037] See Figure 4The circuit of the test temperature relay 2 includes: K1 relay, K2 relay, LED1, LED2, LED4, LED5, diode D1, diode D2, resistor R1, resistor R2 and test fixture H1; Relays K1 and K2 are simultaneously connected to relay control I / O port D11; relay control I / O port D11 is connected to LED1, LED2, the negative terminals of diodes D1 and D2; LED1 is connected to resistor R1, LED2 is connected to resistor R2, resistor R1, the positive terminal of diode D1, and relay K1 are grounded; resistor R2, the positive terminal of diode D2, and relay K2 are grounded. Both relays K1 and K2 are connected to test fixture H1; relay K1 is connected to terminal P1 of the measuring instrument, and relay K2 is connected to terminal P2 of the measuring instrument; relay K2 is connected to an external +5V power supply; relay K1 is connected to data acquisition point D12; data acquisition point D12 is connected to LED5; LED5 is connected to resistor R3, which is grounded; relay K1 is connected to indicator light control IO D13; indicator light control IO D13 is connected to LED4; LED4 is connected to resistor R4, which is grounded.

[0038] The measuring instrument terminals P1 and P2 are used to connect the measuring instrument to measure the contact resistance value.

[0039] Install the temperature relay 2 to be tested into the test fixture H1, which uses Kelvin wiring. LED1 and LED2 represent the working status of relay K1 and relay K2, respectively. LED4 being lit indicates that the test is complete, and LED5 flashing indicates that the temperature relay switching function has been successfully triggered.

[0040] At room temperature, when a normally closed temperature relay is installed in the test fixture, LED5 will automatically illuminate. This triggers the indicator light, and data acquisition point D12 detects a high level, controlling LED5 to illuminate. Control unit 4, via interface D11, controls relays K1 and K2 to switch the temperature relay awaiting testing to the instrument measurement circuit. The instrument measures the contact resistance of the temperature relay in this state. After the test is completed, D11 deactivates control over relays K1 and K2, returning the temperature relay to the indicator light circuit for continued monitoring of its status.

[0041] When the temperature rises, the internal switch of the temperature relay opens, LED5 turns off, and D12 detects a low level. Control unit 4, through the D11 interface, controls relays K1 and K2 to switch the temperature relay awaiting testing to the instrument measurement circuit. At this time, a contact resistance test is performed using the instrument. The test result approaches infinity, indicating that the internal switch of the temperature relay has successfully opened. Next, insulation resistance and dielectric withstand voltage tests are performed to further test the reliability and safety of the device. After all tests are completed, D11 closes its control over K1 and K2, returning the temperature relay to the indicator light circuit to continue monitoring its status.

[0042] When the ambient temperature begins to drop, the internal switch of the temperature relay returns to the closed state, and LED5 lights up. At this time, the D12 data acquisition point acquires a high level, and the control unit 4 controls the relays K1 and K2 to work through the D11 interface to switch the temperature relay waiting for testing to the instrument measurement circuit, and uses the instrument to measure the contact resistance of the temperature relay.

[0043] Throughout the test, any change in the high or low level of the D12 data acquisition point will trigger the temperature sensor to record the current temperature value. The test will also include contact resistance, insulation resistance, contact voltage drop, coil resistance, and recovery temperature tests on the temperature relay.

[0044] The above are merely preferred embodiments of this utility model and are not intended to limit the scope of this utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A temperature relay multi-station testing system, characterized by, It includes a temperature relay (2), a test fixture (3), a control unit (4), a test instrument (5), a high and low temperature test chamber (6), and a temperature sensor (7); The test fixture (3) and the temperature sensor (7) are both mounted on a female base, which is located inside the high and low temperature test chamber (6). The test fixture (3) is arranged in an array, and the temperature relay (2) is located inside the test fixture (3). The temperature sensor (7) is connected to the measuring instrument (5). The temperature sensor (7) collects the temperature change of the temperature relay (2). The control unit (4) is connected to the temperature relay (2). The test instrument (5) and the control unit (4) are both connected to the computer (1).

2. The multi-station temperature relay testing system according to claim 1, characterized in that, The test fixtures (3) are arranged in an n*n matrix.

3. The temperature relay multi-station testing system according to claim 2, characterized in that, The temperature sensor (7) is positioned in the middle of the matrix.

4. The temperature relay multi-station testing system according to claim 2, characterized in that, A contact resistance is provided between the temperature relay (2) and the test fixture (3); the contact resistance is measured by a tester; the tester is connected to the control unit (4).

5. The temperature relay multi-station testing system according to claim 4, characterized in that, The tester is the TH2515 low resistance tester.

6. The multi-station temperature relay testing system according to claim 1, characterized in that, The high and low temperature test chamber (6) simulates normal temperature, heating and cooling environments, and the control unit (4) integrates a multi-station automatic switching system; the control unit (4) automatically measures the temperature relay (2) through the multi-station automatic switching system.

7. The temperature relay multi-station testing system according to claim 1, characterized in that, The control unit (4) is a Mega2560 microcontroller.

8. The multi-station temperature relay testing system according to claim 1, characterized in that, The test fixture (3) is a TO-220 high-temperature gold-plated test fixture.

9. The multi-station temperature relay testing system according to claim 1, characterized in that, The measuring instrument (5) is connected to the computer (1) via RS232.

10. The multi-station temperature relay testing system according to claim 1, characterized in that, The control unit (4) communicates with the computer (1) via a COM serial port.

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