Multi-channel capacitive implosion test system

Abstract

The utility model discloses a kind of multi-channel capacitor internal explosion test system, it is related to capacitor test technical field.Multi-channel capacitor internal explosion test system includes: test oven, for placing multiple capacitors to be measured, and provide test environment for multiple capacitors to be measured;Several multi-channel test board cards, each multi-channel test board card has multiple test channels, each test channel has constant-current circuit, voltage acquisition point and current acquisition point, constant-current circuit is electrically connected with corresponding capacitor to be measured, for setting the constant-current current flowing through corresponding capacitor to be measured;Master module, with multi-channel test board card electric connection;Power module, with master module and multi-channel test board card electric connection respectively;ADC module, with voltage acquisition point, current acquisition point and master module electric connection respectively.The multi-channel capacitor internal explosion test system of the utility model embodiment can simultaneously carry out ageing test and internal explosion test to multiple capacitors, improve test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of capacitance testing technology, and in particular to a multi-channel capacitor implosion testing system. Background Technology

[0002] As a core energy storage component in power electronic systems, the safety performance of capacitors directly impacts equipment reliability. In recent years, with the surge in demand for high-energy-density capacitors from new energy and electric vehicle sectors, the risk of capacitor failure under extreme conditions (such as overcurrent, high temperature, and mechanical vibration) has increased significantly. Implosion is one of the main forms of capacitor failure, and the instantaneous release of energy can trigger fires or damage to equipment. Therefore, developing a high-precision, high-safety capacitor implosion testing system is crucial for product design and safety certification. Utility Model Content

[0003] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a multi-channel capacitor implosion testing system, capable of simultaneously performing aging and implosion tests on multiple capacitors, thereby improving testing efficiency.

[0004] The multi-channel capacitor implosion test system according to an embodiment of the present invention includes: A test oven is used to place multiple capacitors under test and to provide a test environment for the multiple capacitors under test; Several multi-channel test boards, each of which has multiple test channels, each of which has a constant current circuit, a voltage acquisition point and a current acquisition point. The constant current circuit is electrically connected to the corresponding capacitor under test and is used to set the constant current flowing through the corresponding capacitor under test. The main control module is electrically connected to the multi-channel test board; The power supply module is electrically connected to both the main control module and the multi-channel test board. The ADC module is electrically connected to the voltage acquisition point, the current acquisition point and the main control module respectively. The ADC module is used to acquire the voltage and current information of each capacitor under test, and convert the voltage and current information into digital signals and send them to the main control module.

[0005] According to some embodiments of this utility model, the test oven is internally equipped with a heating module, a cooling module, an over-temperature protection module, and a product placement area. The heating module is used to increase the internal temperature of the test oven, the cooling module is used to decrease the internal temperature of the test oven, the over-temperature protection module is used to perform over-temperature protection when the internal temperature of the test oven exceeds a preset value, and the product placement area is used to place the capacitor to be tested.

[0006] According to some embodiments of this utility model, the multi-channel capacitor implosion test system further includes a DAC module, and the constant current circuit includes: The comparator has its first input terminal electrically connected to the output terminal of the DAC module, the input terminal of the DAC module electrically connected to the main control module, and the enable terminal of the comparator also electrically connected to the main control module. The MOS transistor has its gate electrically connected to the output terminal of the comparator, its drain electrically connected to one end of the corresponding capacitor under test, and the other end of the capacitor under test electrically connected to the positive terminal of the power supply module. The negative terminal of the power supply module is grounded. A first resistor, one end of which is electrically connected to the source of the MOS transistor, and the other end of which is grounded. The source of the MOS transistor is also electrically connected to the second input terminal of the comparator. The voltage acquisition point is electrically connected to the drain of the MOS transistor, and the current acquisition point is electrically connected to the source of the MOS transistor.

[0007] According to some embodiments of the present invention, a first diode is further provided between the drain of the MOS transistor and one end of the corresponding capacitor under test. The anode of the first diode is connected to one end of the corresponding capacitor under test, and the cathode of the first diode is electrically connected to the drain of the MOS transistor.

[0008] According to some embodiments of this utility model, a fuse is also provided between the positive terminal of the power module and the other end of the capacitor under test. One end of the fuse is electrically connected to the positive terminal of the power module, and the other end of the fuse is electrically connected to the other end of the capacitor under test.

[0009] According to some embodiments of the present invention, the positive terminal of the power supply module is also electrically connected to one end of the second resistor, the other end of the second resistor is electrically connected to one end of the control switch, the other end of the control switch is electrically connected to the anode of the second diode, and the cathode of the second diode is electrically connected to one end of the capacitor under test.

[0010] According to some embodiments of the present invention, the negative terminal of the power module is grounded through a third transistor, the anode of the third transistor is grounded, and the cathode of the third transistor is electrically connected to the negative terminal of the power module.

[0011] According to some embodiments of the present invention, the multi-channel capacitor implosion test system further includes a status display module, which is electrically connected to the main control module.

[0012] According to some embodiments of the present invention, the multi-channel capacitor implosion test system further includes an alarm module, which is electrically connected to the main control module.

[0013] According to some embodiments of this utility model, a switching switch is provided between the ADC module and the voltage acquisition point and the current acquisition point.

[0014] The multi-channel capacitor implosion test system according to this utility model embodiment has at least the following beneficial effects: When performing aging and implosion tests on the capacitors under test, multiple capacitors under test are placed in a test oven, which can provide the required temperature for the capacitors under test; during the test, the power module can provide the required aging power; each test channel of the multi-channel test board can be connected to a capacitor under test, and a constant current is provided to the capacitor under test through a constant current circuit, thereby reducing the test time and improving the test efficiency; then, the ADC module can collect the voltage information of the capacitor under test through the voltage acquisition point, collect the current information of the capacitor under test through the current acquisition point, and convert the voltage and current information from analog signals into digital signals, which are then sent to the main control module to obtain the test results. This system utilizes several multi-channel test boards, each with multiple test channels. Each test channel can test one capacitor under test, enabling parallel testing of multiple capacitors and improving testing efficiency. During testing, each test channel operates independently and can be controlled individually. Test channels that have triggered implosion short circuits can be shut down separately, allowing for better control of multi-channel testing failure risks. A constant current circuit ensures that the charging speed of the capacitors under test is consistent across all test channels, reducing aging time.

[0015] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0016] The above and / or additional aspects and advantages of this utility model will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is a schematic diagram of the structure of the multi-channel capacitor implosion test system according to an embodiment of the present invention; Figure 2 This is a circuit diagram of a multi-channel test board according to an embodiment of the present invention. Detailed Implementation

[0017] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application. The step numbers in the following embodiments are set only for ease of explanation, and there is no limitation on the order between the steps. The execution order of each step in the embodiments can be adaptively adjusted according to the understanding of those skilled in the art.

[0018] In the description of this utility model, it should be understood that the directional descriptions, such as up, down, front, back, left, right, etc., indicate the directional or positional relationship based on the directional or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0019] The terms "first," "second," "third," and "fourth," etc., used in the specification, claims, and accompanying drawings of this utility model are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0020] In this invention, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0021] As a core energy storage component in power electronic systems, the safety performance of capacitors directly impacts equipment reliability. In recent years, with the surge in demand for high-energy-density capacitors from new energy and electric vehicle sectors, the risk of capacitor failure under extreme conditions (such as overcurrent, high temperature, and mechanical vibration) has increased significantly. Implosion is one of the main forms of capacitor failure, and the instantaneous release of energy can trigger fires or damage to equipment. Therefore, developing a high-precision, high-safety capacitor implosion testing system is crucial for product design and safety certification.

[0022] The existing testing solutions mainly include: 1. Single-channel capacitor aging system: The capacitor is heated in a constant temperature chamber and a fixed voltage is applied for aging test. Its disadvantage is that it cannot simulate dynamic current load and only tests one capacitor at a time, which is inefficient.

[0023] 2. Multi-channel capacitor testing platform: It supports parallel testing of multiple capacitors, but the load mode is fixed voltage, the current control accuracy is low, the constant current is uneven, which can easily cause inconsistent charging speeds of capacitors in different channels, resulting in excessively long aging time; moreover, there is interference or failure between channels, which affects the function of adjacent channels.

[0024] To address this, this invention proposes a multi-channel capacitor implosion testing system. This system utilizes several multi-channel test boards, each with multiple test channels. Each test channel can test one capacitor under test, enabling parallel testing of multiple capacitors and improving testing efficiency. During testing, each test channel operates independently and can be controlled individually. Test channels that have triggered implosion short circuits can be shut down separately, allowing for better control of multi-channel testing failure risks. A constant current circuit ensures consistent charging speeds for the capacitors across all test channels, reducing aging time.

[0025] The multi-channel capacitor implosion test system of this utility model will now be described in detail with reference to the accompanying drawings.

[0026] like Figure 1 As shown in the figure, this utility model embodiment proposes a multi-channel capacitor implosion test system, which includes: Test oven 100 is used to place multiple capacitors under test 500 and to provide a test environment for the multiple capacitors under test 500. Several multi-channel test boards 200, each multi-channel test board 200 has multiple test channels, each test channel has a constant current circuit, a voltage acquisition point and a current acquisition point, the constant current circuit is electrically connected to the corresponding capacitor under test 500, and is used to set the constant current flowing through the corresponding capacitor under test 500; The main control module 300 is electrically connected to the multi-channel test board 200; The power supply module 400 is electrically connected to the main control module 300 and the multi-channel test board 200, respectively. The ADC module (not shown in the figure) is electrically connected to the voltage acquisition point, the current acquisition point and the main control module 300 respectively. The ADC module is used to acquire the voltage and current of each capacitor under test 500 and convert them into digital signals to be sent to the main control module 300.

[0027] Specifically, the main control module 300 includes a computer system and an MCU. The computer system's software testing platform integrates testing functions for communication control of the test oven 100, power supply module 400, and multi-channel test board 200. When aging and implosion tests are to be performed on the capacitors under test 500, multiple capacitors under test 500 are placed in the test oven 100, and then the computer system issues test commands, causing the test oven 100 to provide the required temperature for the capacitors under test 500. During the test, the power supply module 400 can provide a high-precision, high-voltage aging power supply with a power of up to 9KW. Each test channel of the multi-channel test board 200 can be connected to one capacitor under test 500, and a constant current is provided to the capacitor under test 500 through a constant current circuit. Then, the ADC module can collect the voltage information of the capacitor under test 500 through the voltage acquisition point and the current information of the capacitor under test 500 through the current acquisition point, and convert the voltage and current information from analog signals into digital signals, which are then sent to the MCU, so that the MCU can obtain the test results through the voltage and current information. In this system, several multi-channel test boards 200 are used, each with multiple test channels. Each test channel can test one capacitor under test 500, thus enabling parallel testing of multiple capacitors under test 500 and improving testing efficiency. During the testing process, each test channel is independent and can be controlled individually. Test channels that have triggered implosion short circuits can be shut down individually, allowing for better control of multi-channel testing failure risks. A constant current circuit ensures that the charging speed of the capacitors under test 500 is consistent across all test channels, reducing aging time.

[0028] like Figure 1As shown in some embodiments of this application, the test oven 100 is internally equipped with a heating module 110, a cooling module 120, an over-temperature protection module 130, and a product placement area 140. The heating module 110 is used to increase the internal temperature of the test oven 100, the cooling module 120 is used to decrease the internal temperature of the test oven 100, the over-temperature protection module 130 is used to provide over-temperature protection when the internal temperature of the test oven 100 exceeds a preset value, and the product placement area 140 is used to place the capacitors 500 to be tested. The product placement area can be divided into several layers of shelves, each shelf can hold multiple capacitors 500 to be tested. The heating module 110 can achieve heating through heating elements (such as heating tubes, heating plates, heating wires, etc.), the cooling module 120 can achieve cooling through a cooling fan, and the over-temperature protection module 130 can collect the temperature in real time through a temperature sensor, and when the temperature exceeds a preset value, it accelerates the removal of heat from the inside of the test oven 100 by activating the cooling fan and exhaust valve. When the capacitor under test 500 is placed inside the test oven 100, the temperature can be precisely controlled, allowing the capacitor under test 500 to age in a controllable, high-precision, and uniform temperature environment, with reliable over-temperature protection. When the capacitor under test 500 is boosted to the set voltage, high-temperature aging begins. At this time, the heating module 110 of the test oven 100 starts working, conducting three-phase electricity to the high-power heating wire to generate heat. The heat is then delivered to the test oven 100 through the hot air circulation system until the set temperature is reached. During the voltage boosting and aging process of the capacitor under test 500, the capacitor under test 500 generates heat during charging, which may cause it to exceed the set temperature. When the over-temperature protection is triggered, the cooling fan and exhaust valve are activated to allow external airflow into the oven to dissipate the heat.

[0029] In some embodiments of this application, the multi-channel capacitor implosion test system further includes a DAC module. It should be noted that both the DAC module and the ADC module can be integrated into the MCU or can be separate modules. Figure 2As shown, in this example, each multi-channel test board 200 includes 96 test channels (the number of test channels can be changed according to actual needs). Taking one test channel as an example, the constant current circuit of this test channel includes: comparator OPA1, MOSFET Q1-1, and first resistor R2-1. The first input terminal of comparator OPA1 is electrically connected to the output terminal of the DAC module through resistor R3-1. The input terminal of the DAC module is electrically connected to the main control module 300. The enable terminal (EN1) of comparator OPA1 is electrically connected to the main control module 300. The gate of MOSFET Q1-1 is connected to the gate of comparator OPA1. The output terminals are electrically connected. The drain of MOSFET Q1-1 is electrically connected to one end of the corresponding capacitor under test (C1), and the other end of the capacitor under test is electrically connected to the positive terminal of power supply module 400. The negative terminal of power supply module 400 is grounded. One end of the first resistor R2-1 is electrically connected to the source of MOSFET Q1-1, and the other end of the first resistor R2-1 is grounded. The source of MOSFET Q1-1 is also electrically connected to the second input terminal of comparator OPA1. Among them, the voltage acquisition point (ADC_V1) is electrically connected to the drain of MOSFET Q1-1, and the current acquisition point (ADC_I1) is electrically connected to the source of MOSFET Q1-1.

[0030] A negative feedback circuit is formed by comparing OPA1, MOSFET Q1-1, and the first resistor R2-1. The gate voltage of MOSFET Q1-1 is adjusted by the voltage feedback of OPA1, making the voltage of R2-1 relative to ground equal to the DAC voltage. This allows the current flowing through R2-1, i.e., the current flowing through the capacitor under test 500, to be controlled by setting the DAC voltage, achieving a constant current function. It should be noted that the circuit structure of other test channels is the same and will not be described in detail here. In this circuit, voltage signals ADC_V1~ADC_V96 and current signals ADC_I1~ADC_I96 are acquired by the ADC acquisition module, converted into digital signals, and then transmitted to the MCU at high speed via SPI. In some embodiments, a switch is provided between the ADC module and the voltage and current acquisition points to select which capacitor under test 500's voltage and current information to acquire. EN1~EN96 are MCU control enable signals; they are set to low level when a test channel malfunctions and needs to be shut down, and high level under normal conditions.

[0031] It should be noted that constant current circuits can also use digital potentiometers to adjust the current, but their accuracy will be reduced.

[0032] Furthermore, such as Figure 2As shown in some embodiments of this application, a first diode (D1-1~D1-96) is further disposed between the drain of the MOSFET (Q1-1~Q1-96) and one end of the corresponding capacitor under test 500. The anode of the first diode is connected to one end of the corresponding capacitor under test 500, and the cathode of the first diode is electrically connected to the drain of the MOSFET. The function of the first diode is to prevent reverse current. During the aging process, a negative current will be generated under the condition of a sudden voltage change in the capacitor under test 500. This negative current will affect the test and damage the circuit. By setting the first diode, the influence of this negative current can be avoided.

[0033] Furthermore, such as Figure 2 As shown, in some embodiments of this application, a fuse (F1~F96) is also provided between the positive terminal of the power module 400 and the other end of the capacitor under test 500. One end of the fuse is electrically connected to the positive terminal of the power module 400, and the other end of the fuse is electrically connected to the other end of the capacitor under test 500. The function of the fuse is to protect the capacitor under test 500 and the multi-channel test board 200 from the influence of high voltage and high current in the event of a short circuit caused by an abnormality in the capacitor under test 500 or other components.

[0034] Furthermore, such as Figure 2 As shown, in some embodiments of this application, the positive terminal of the power module 400 is also electrically connected to one end of the second resistor R1, the other end of the second resistor R1 is electrically connected to one end of the control switch K1, the other end of the control switch K1 is electrically connected to the anode of the second diode (D2-1~D2-96), and the cathode of the second diode is electrically connected to one end of the capacitor under test 500. The second resistor R1, the control switch K1, and the second diode constitute the discharge circuit of the capacitor under test 500. During normal charging, K1 is open and no discharge occurs. After the aging test is completed, K1 needs to be closed to allow the capacitor under test 500 to discharge.

[0035] Furthermore, such as Figure 2 As shown, in some embodiments of this application, the negative terminal of the power module 400 is grounded through the third transistor D3, the anode of the third transistor D3 is grounded, and the cathode of the third transistor D3 is electrically connected to the negative terminal of the power module 500. The third transistor D3 serves to prevent reverse connection of the power supply.

[0036] Furthermore, such as Figure 1 As shown in some embodiments of this application, the multi-channel capacitor implosion test system further includes a status display module 600, which is electrically connected to the main control module 300. The status display module 600 is used to display test information, making it convenient for users to understand the test status.

[0037] Furthermore, such as Figure 1As shown in some embodiments of this application, the multi-channel capacitor implosion test system further includes an alarm module 700, which is electrically connected to the main control module 300. By setting the alarm module 700, an alarm action can be triggered when an abnormality occurs during testing, reminding the user to conduct an inspection.

[0038] According to the multi-channel capacitor implosion test system of this application embodiment, all test channels can be controlled by the same DAC module, so that all test channels are synchronously set to constant current, reducing aging time. The voltage ADC_V1~ADC_V96 and the current ADC_I1~ADC_I96 data of each test channel are independently acquired, sent to the multi-channel ADC chip through a high-speed analog switching switch, and then transmitted to the MCU at high speed via SPI. When performing an implosion test on the capacitor under test 500, protection is triggered when the following two conditions are met simultaneously: the flashover of the capacitor under test 500 is less than 5V, triggering hardware flashover; the voltage implosion is less than a set value, triggering implosion. At this time, a fast isolation mechanism can be used to handle the situation, and the test channel that has triggered an implosion short circuit can be shut down separately; the hardware self-reset protection function of fuses F1~F96 prevents damage to the core current due to overcurrent and overtemperature. The testing system integrates a main control module 300, a power supply module 400, a test oven 100, and multiple multi-channel test boards 200 to form a complete testing device. It adopts multi-channel constant current technology, and achieves multi-channel high-precision constant current output through independent control, as well as single-channel controllable shutdown current and abnormal overcurrent protection functions.

[0039] There are N multi-channel test boards 200 (N is a positive integer). Assuming N is 16 and each multi-channel test board 200 has 96 test channels, 1536 capacitors 500 can be tested at once, greatly improving efficiency. This test system can accurately detect defective products with internal explosions and potential hazards. The channels are isolated and can be shut down individually, which better controls the risk of multi-channel test failures and enhances safety.

[0040] The above is a detailed description of the preferred embodiments of the present utility model. However, the present utility model is not limited to the above embodiments. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present utility model. All such equivalent modifications or substitutions are included within the scope defined by the claims of the present utility model.

Claims

1. A multi-channel capacitor implosion testing system, characterized in that, include: A test oven is used to place multiple capacitors under test and to provide a test environment for the multiple capacitors under test; Several multi-channel test boards, each of which has multiple test channels, each of which has a constant current circuit, a voltage acquisition point and a current acquisition point. The constant current circuit is electrically connected to the corresponding capacitor under test and is used to set the constant current flowing through the corresponding capacitor under test. The main control module is electrically connected to the multi-channel test board; The power supply module is electrically connected to both the main control module and the multi-channel test board. The ADC module is electrically connected to the voltage acquisition point, the current acquisition point and the main control module respectively. The ADC module is used to acquire the voltage and current information of each capacitor under test, and convert the voltage and current information into digital signals and send them to the main control module.

2. The multi-channel capacitor implosion test system according to claim 1, characterized in that, The test oven is equipped with a heating module, a cooling module, an over-temperature protection module, and a product placement area. The heating module is used to increase the temperature inside the test oven, the cooling module is used to decrease the temperature inside the test oven, the over-temperature protection module is used to provide over-temperature protection when the temperature inside the test oven exceeds a preset value, and the product placement area is used to place the capacitor under test.

3. The multi-channel capacitor implosion test system according to claim 1, characterized in that, The multi-channel capacitor implosion test system also includes a DAC module, and the constant current circuit includes: The comparator has its first input terminal electrically connected to the output terminal of the DAC module, the input terminal of the DAC module electrically connected to the main control module, and the enable terminal of the comparator electrically connected to the main control module. The MOS transistor has its gate electrically connected to the output terminal of the comparator, its drain electrically connected to one end of the corresponding capacitor under test, and the other end of the capacitor under test electrically connected to the positive terminal of the power supply module. The negative terminal of the power supply module is grounded. A first resistor, one end of which is electrically connected to the source of the MOS transistor, and the other end of which is grounded. The source of the MOS transistor is also electrically connected to the second input terminal of the comparator. The voltage acquisition point is electrically connected to the drain of the MOS transistor, and the current acquisition point is electrically connected to the source of the MOS transistor.

4. The multi-channel capacitor implosion test system according to claim 3, characterized in that, A first diode is also provided between the drain of the MOS transistor and one end of the corresponding capacitor under test. The anode of the first diode is connected to one end of the corresponding capacitor under test, and the cathode of the first diode is electrically connected to the drain of the MOS transistor.

5. The multi-channel capacitor implosion test system according to claim 3, characterized in that, A fuse is also provided between the positive terminal of the power module and the other end of the capacitor under test. One end of the fuse is electrically connected to the positive terminal of the power module, and the other end of the fuse is electrically connected to the other end of the capacitor under test.

6. The multi-channel capacitor implosion test system according to claim 3, characterized in that, The positive terminal of the power module is also electrically connected to one end of the second resistor, the other end of the second resistor is electrically connected to one end of the control switch, the other end of the control switch is electrically connected to the anode of the second diode, and the cathode of the second diode is electrically connected to one end of the capacitor under test.

7. The multi-channel capacitor implosion test system according to claim 3, characterized in that, The negative terminal of the power module is grounded through a third transistor, the anode of the third transistor is grounded, and the cathode of the third transistor is electrically connected to the negative terminal of the power module.

8. The multi-channel capacitor implosion test system according to claim 1, characterized in that, The multi-channel capacitor implosion test system also includes a status display module, which is electrically connected to the main control module.

9. The multi-channel capacitor implosion test system according to claim 1, characterized in that, The multi-channel capacitor implosion test system also includes an alarm module, which is electrically connected to the main control module.

10. The multi-channel capacitor implosion test system according to claim 1, characterized in that, A switching switch is provided between the ADC module and the voltage acquisition point and the current acquisition point.

Images