An integrated circuit testing apparatus

Abstract

The utility model discloses an integrated circuit testing arrangement, include: test seat, the inside installation of test seat has the clamp, the inside installation of clamp has integrated circuit board, the outside slide installation of test seat has moving frame no.

Description

Technical Field

[0001] This utility model relates to the technical field of integrated circuit board testing devices, specifically an integrated circuit testing device. Background Technology

[0002] An integrated circuit board is a miniature electronic device or component. Using specific processes, transistors, resistors, capacitors, inductors, and other components required for a circuit, along with interconnecting wiring, are fabricated on one or several small pieces of semiconductor wafers or dielectric substrates. These are then packaged in a housing to form a miniature structure with the required circuit function. All components are structurally integrated, representing a significant step forward in the miniaturization, low power consumption, intelligence, and high reliability of electronic components.

[0003] The existing publication CN217181134U discloses an integrated circuit testing device based on an RF test head, belonging to the technical field of integrated circuit board testing devices. This integrated circuit testing device based on an RF test head includes a test box, with a cover hinged to one side of the top of the test box. A tester is fixedly connected to the top of the cover. This invention, by setting a clamping mechanism, can stably clamp and fix integrated circuit boards of different sizes through two adjustable L-shaped clamping plates. Simultaneously, two clamping plates further fix the integrated circuit boards, solving the problem of inconvenient and rapid fixing of existing integrated circuit boards during testing. This avoids inaccurate test results due to board displacement during testing. Furthermore, a pressure sensor is set on one side of the L-shaped clamping plate to facilitate monitoring the clamping force of the clamping plates on the integrated circuit board during clamping, preventing damage to the integrated circuit board due to excessive force.

[0004] Existing integrated circuit boards are divided into contact surfaces and non-contact surfaces. Components and wiring are distributed on the contact surfaces, and testing is performed on the components on the contact surfaces. The non-contact surfaces are insulated to improve the safety of the integrated circuit boards. However, in the current integrated circuit board testing process, only the contact surfaces are tested, and the non-contact surfaces are not tested simultaneously. As a result, the safety and insulation of the non-contact surfaces are not well tested. Therefore, the testing of integrated circuit boards is not comprehensive enough and the testing direction is relatively singular, which reduces the test quality.

[0005] Therefore, those skilled in the art have provided an integrated circuit testing apparatus to solve the problems mentioned in the background art. Utility Model Content

[0006] The purpose of this invention is to provide an integrated circuit testing device to solve the problem mentioned in the background art that existing integrated circuit board testing cannot achieve double-sided testing of both the contact surface and the non-contact surface.

[0007] To achieve the above objectives, this utility model provides the following technical solution: An integrated circuit testing device includes: a test stand, a fixture installed inside the test stand, an integrated circuit board installed on the inner side of the fixture, a movable frame slidably installed on the outer side of the test stand, a movable frame 2 installed on one side of the movable frame 1, a lifting screw vertically installed inside the movable frame 1, a lifting seat installed on the surface of the lifting screw via a nut, a movable screw horizontally inserted inside the lifting seat, a movable seat installed on the surface of the movable screw via a nut, a test head fixedly installed on the surface of the movable seat, and the movable frame 2 having the same structure as the movable frame 1, with an energized test pen installed on the movable seat of the movable frame 2.

[0008] As a further improvement of this utility model: guide rods are installed on the left and right sides of the lifting screw, and the lifting seat and the guide rods are slidably connected.

[0009] As a further improvement of this utility model: the moving lead screw and the lifting lead screw are perpendicular to each other, and the lifting lead screw and the moving lead screw are staggered front and back.

[0010] As a further embodiment of this utility model: the surfaces of the first and second movable frames are equipped with adjusting screws, and the surfaces of the adjusting screws are interconnected with the first and second movable frames through a set of screw bearings.

[0011] As a further improvement of this utility model: a push screw is threaded on the middle of the surface of the clamp, and a card seat is fixedly installed at the front end of the push screw.

[0012] As a further improvement of this utility model: both the upper and lower ends of the clamp are threaded with clamping screws, and the ends of the clamping screws are fixedly mounted with clamping seats.

[0013] Compared with the prior art, the beneficial effects of this utility model are: Movable frames are installed on both the left and right sides of the test stand, divided into movable frame one and movable frame two. Movable frame one and movable frame two have the same structure, both equipped with lifting screws, lifting seats, and movable screws and movable seats. The difference between the two sets of movable frames is that the movable seat on movable frame one is equipped with a detection head, while the movable seat on movable frame two is equipped with a power-on test pen. The detection head is used to detect the contact surface of the integrated circuit board. The detection head is an RF test head. The RF test head works in conjunction with the tester to detect the parameters of components such as chips on the contact surface of the integrated circuit board. The power-on test pen on movable frame two is used to perform insulation testing on the non-contact surface of the integrated circuit board to avoid leakage on the non-contact surface of the integrated circuit board. In this way, the dual-sided synchronous testing of the contact and non-contact surfaces is realized, which improves both testing efficiency and testing quality. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the structure of an integrated circuit testing device.

[0015] Figure 2 This is a schematic diagram of a fixture structure for an integrated circuit testing device.

[0016] Figure 3 This is a schematic diagram of the second-view structure of an integrated circuit testing device.

[0017] Figure 4 An integrated circuit testing device Figure 3 Enlarged schematic diagram of part A in the middle.

[0018] In the diagram: 1. Test base; 2. Fixture; 201. Push screw; 202. Card holder; 203. Clamping screw; 204. Clamping seat; 3. Moving frame one; 4. Lifting screw; 5. Lifting seat; 6. Moving screw; 7. Moving seat; 8. Detection head; 9. Moving frame two; 10. Power-on test pen; 11. Integrated circuit board; 12. Adjusting screw; 13. Guide rod. Detailed Implementation

[0019] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0020] Please see Figures 1-4 This utility model provides an integrated circuit testing device, including: a test base 1, a clamp 2 installed inside the test base 1, an integrated circuit board 11 installed on the inner side of the clamp 2, a push screw 201 threadedly installed in the middle of the surface of the clamp 2, and a card seat 202 fixedly installed at the front end of the push screw 201; clamping screws 203 are threadedly installed at both the upper and lower ends of the clamp 2, and a clamp seat 204 is fixedly installed at the end of the clamping screw 203. Specifically, the clamp 2 is set on the left and right sides inside the test base 1, and push screws 201 and clamping screws 203 are installed at the upper and lower ends and the middle of the clamp 2. The clamping screws 203 are arranged vertically opposite each other to achieve vertical clamping, while the push screws 201 achieve horizontal clamping. Using the threaded connection structure of the push screws 201, the card holder 202 is pushed towards the center of the test base 1 until the integrated circuit board 11 is clamped from the left and right sides. Then, the threads of the upper and lower clamping screws 203 are adjusted so that the clamp 204 clamps the integrated circuit board 11 vertically. This improves the clamping stability of the integrated circuit board 11 and makes it easier to expose both the contact surface and the non-contact surface of the integrated circuit board 11 to the power-on test pen 10 and the detection head 8, so as to perform double-sided testing on the contact surface and the non-contact surface. In addition, the contact surfaces of the card holder 202 and the clamp 204 are provided with insulating soft rubber pads to protect the edges of the integrated circuit board 11 and increase resistance to prevent slippage during clamping.

[0021] A movable frame 1 3 is slidably installed on the outside of the test base 1. A movable frame 2 9 is installed on one side of the movable frame 1 3. A lifting screw 4 is vertically installed inside the movable frame 1 3. A lifting seat 5 is installed on the surface of the lifting screw 4 through a nut. A movable screw 6 is horizontally inserted inside the lifting seat 5. A movable seat 7 is installed on the surface of the movable screw 6 through a nut. A test head 8 is fixedly installed on the surface of the movable seat 7. The movable frame 2 9 has the same structure as the movable frame 1 3. An energized test pen 10 is installed on the movable seat 7 of the movable frame 2 9. Guide rods 13 are installed on the left and right sides of the lifting screw 4. The lifting seat 5 and the guide rods 13 form a sliding connection. The movable screw 6 is perpendicular to the lifting screw. The lifting screw 4 and the movable screw 6 are staggered. Specifically, the lifting screw 4 moves the lifting seat 5 up and down via a set of bearings. The lifting seat 5 moves up and down using the guide rod 13 to achieve precise guided movement. After the lifting seat 5 moves, it moves synchronously with the moving screw 6. After adjusting the height of the moving screw 6, a moving seat 7 is installed on the moving screw 6. The moving seat 7 works in conjunction with the lifting seat 5, and the position of the moving seat 7 is adjusted using the moving screw 6. In this way, the height of the moving seat 7 is adjusted by the lifting screw, and the distance between the detection head 8 on the moving seat 7 and the integrated circuit board 11 is adjusted by the moving screw 6, which facilitates the testing of the contact surface of the integrated circuit board 11. At the same time, the moving frame 9 on the other side moves... The structure of frame 13 is the same, and the movable seat 7 on movable frame 29 is operated in the same way. Movable seat 7 on movable frame 29 is equipped with a power-on test pen 10 to perform leakage current testing on the back of integrated circuit board 11. The power-on test pen 10 is existing technology. Its principle is to determine whether the circuit is energized by the light of a neon bulb. If the neon bulb does not light up, it means that the circuit is not energized. The principle of this technology has been disclosed in publication number CN102419391A. We will not go into too much detail about the existing mature technology here. In addition, the detection head 8 on movable frame 13 is an RF test head. The RF test head is used in conjunction with the tester to perform parameter testing on the chip and other components on the contact surface of integrated circuit board 11.

[0022] Adjusting screws 12 are mounted on the surfaces of movable frame 3 and movable frame 9, and the surfaces of adjusting screws 12 are connected to movable frame 3 and movable frame 9 through a set of screw bearings; Specifically, movable frame 3 and movable frame 9 are respectively set on the left and right sides of test base 1. Movable frame 3 and movable frame 9 have the same structure, both equipped with lifting screw 4, lifting seat 5, movable screw 6 and movable seat 7. The difference between the two sets of movable frames is that the movable seat 7 on movable frame 3 is equipped with a detection head 8, while the movable seat 7 on movable frame 9 is equipped with an energized test pen 10. Movable frame 3 and movable frame 9 cooperate with adjusting screw 12. The surface of adjusting screw 12 is equipped with a screw bearing, and a set of supports is set on the outside of the screw bearing. The screw bearing moves in cooperation with adjusting screw 12. The supports are used to connect movable frame 3 and movable frame 9 at the same time, and then move linearly in cooperation with adjusting screw 12. Movable frame 3 and movable frame 9 are slidably connected to test base 1. Movable frame 3 and movable frame 2 are moved horizontally to realize the position movement of the movable frame, which facilitates the testing of integrated circuit board 11.

[0023] Working principle: When using this invention, firstly, the integrated circuit board 11 is placed in the clamp 2 of the test seat 1. The integrated circuit board 11 is stably clamped by the pushing screw 201 on the surface of the clamp 2 and the clamping screws 203 at both ends, ensuring that the integrated circuit board 11 will not shake during the test. Then, the lifting screw 4 is operated, which drives the lifting seat 5 to move up and down through the bearing. The lifting seat 5 moves precisely under the guidance of the guide rod 13. While the lifting seat 5 moves, it also moves the moving screw 6 and the moving seat 7 synchronously. At this time, the height of the moving seat 7 is adjusted according to the height of the integrated circuit board 11, so that the detection head on the moving seat 7 can move smoothly. 8 can accurately align with the contact surface of the integrated circuit board 11. Then, operate the moving screw 6 to drive the moving seat 7 to move horizontally on the lifting seat 5 through the nut, adjust the relative position of the detection head 8 and the contact surface of the integrated circuit board 11 so that the detection head 8 can make close contact with the contact surface of the integrated circuit board 11. At this time, start the tester. The tester uses the radio frequency test head to perform parameter detection on the chip and other components on the contact surface of the integrated circuit board 11 and obtain the performance data of the integrated circuit board 11. At the same time, repeat the above operation on the moving seat 7 on the moving frame 2 9. The moving seat 7 on the moving frame 2 9 is equipped with a power-on test pen 10 to perform leakage current test on the back of the integrated circuit board 11.

[0024] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. An integrated circuit testing device, characterized in that, include: Test stand (1), the test stand (1) is equipped with a clamp (2) inside, the clamp (2) is equipped with an integrated circuit board (11) inside, the test stand (1) is slidably equipped with a moving frame one (3) on the outside, the moving frame one (3) is equipped with a moving frame two (9) on one side, the moving frame one (3) is equipped with a lifting screw (4) vertically inside, the lifting screw (4) is equipped with a lifting seat (5) by a nut on the surface of the lifting screw (4), the moving screw (6) is installed horizontally inside the lifting seat (5), the moving screw (6) is equipped with a moving seat (7) by a nut on the surface of the moving screw (6), the detection head (8) is fixedly installed on the surface of the moving seat (7), the moving frame two (9) has the same structure as the moving frame one (3), and the moving seat (7) of the moving frame two (9) is equipped with an energized test pen (10).

2. The integrated circuit testing device according to claim 1, characterized in that, Guide rods (13) are installed on the left and right sides of the lifting screw (4), and the lifting seat (5) and the guide rods (13) form a sliding connection.

3. The integrated circuit testing device according to claim 1, characterized in that, The movable lead screw (6) is perpendicular to the lifting lead screw, and the lifting lead screw (4) and the movable lead screw (6) are staggered.

4. The integrated circuit testing apparatus according to claim 1, characterized in that, Adjusting screws (12) are installed on the surfaces of the first (3) and the second (9) of the movable frame, and the surfaces of the adjusting screws (12) are connected to the first (3) and the second (9) of the movable frame through a set of screw bearings.

5. The integrated circuit testing apparatus according to claim 1, characterized in that, The clamp (2) has a push screw (201) threaded in the middle of its surface, and a card holder (202) is fixedly installed at the front end of the push screw (201).

6. The integrated circuit testing apparatus according to claim 1, characterized in that, The clamp (2) has a clamping screw (203) threaded on both the upper and lower ends, and a clamping seat (204) is fixedly installed on the end of the clamping screw (203).

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