DDR timing test fixture

Abstract

The utility model discloses a kind of DDR timing test fixed clamp, it is related to DDR chip test technical field, including fixedly connected single board fixed clamping mechanism and probe support base, probe support base is provided with sliding track and probe support, single board fixed clamping mechanism realizes the clamping and limit adjustment of single board.Probe support includes slider, height adjusting mechanism, angle adjusting mechanism and probe slot, the height and angle adjustment of probe are realized.The utility model will single board fixed clamping mechanism of fixed single board and probe support base of fixed test probe as a whole, avoid the problem of test wiring harness falling off.Probe support of the utility model can clamp differential probe, can consider two groups of differential signal probe fixed measurement simultaneously.It can adapt to different sizes and special-shaped single board, need not hand-held adjustment angle position, solve the problem that hand-held adjustment angle cannot well keep the stability of measured signal.

Description

Technical Field

[0001] This utility model relates to the field of DDR chip testing technology, specifically, it is a DDR timing test fixture. Background Technology

[0002] Currently, DDR SDRAM is widely used in various communication products on the market, such as computers, switches, optical modems, set-top boxes, etc. With the continuous innovation of memory modules, high-speed, large-capacity, and low-power technologies are becoming increasingly mature. Against this backdrop, the industry's testing requirements for this field are also becoming increasingly stringent. Potential problems in DDR signal testing mainly include signal crosstalk, reflection, and timing issues. Adopting an accurate and stable method to perform DDR timing tests can effectively improve the efficiency of related work in the hardware testing field. Current timing tests for DDR chips mounted on PCBs typically involve using two differential probes and one active single-ended probe with the oscilloscope's built-in DDR testing software for automated testing. The differential probes connect the signals to the DQS and CLK differential pairs via terminals. The connection method generally involves soldering the terminal wires to the DUT trace copper foil or vias, and then manually connecting the ADDR, DQ, RAS, and CAS signals to the nearest ground point using the active probe. The current DDR timing tests have the following problems:

[0003] 1) When the test board and probe are not fixed during the test, slight movement of the test board and probe can easily cause the terminal wires to fall off or even tear off the copper foil of the board wires or damage the terminals. Repeated soldering during the test leads to low test efficiency. Moreover, since there are generally various types of wire harnesses with different properties in the test environment, such as power cords, oscilloscope probe wires, and ground wires, the lack of fixation of the test board and probe can cause interference between different wire harnesses, which can easily interfere with the high-speed signal being acquired, resulting in inaccurate test results.

[0004] 2) While some existing technologies also use fixed fixtures, the differential probe test fixtures commonly used in the industry are mainly for measuring a single signal. Therefore, the fixture design is relatively simple, and the purpose is only to fix the probe on the table to free up the hands. This method cannot simultaneously fix and measure two sets of differential signal probes. In addition, the test board is separated from the test fixture, which also has problems such as wires falling off or poor contact due to operation problems during the test. Utility Model Content

[0005] This utility model provides a DDR timing test fixture to solve the problems in existing technologies, such as the terminal wires falling off or even tearing off the copper foil of the board wires or damaging the terminals due to the lack of fixation between the board and the probe; low testing efficiency caused by repeated soldering during the testing process; and interference between different wire harnesses affecting the accuracy of test results. Furthermore, existing differential probe test fixtures are mainly designed for single signal measurements and cannot simultaneously fix and measure two sets of differential signal probes. Also, the separation of the board under test from the test fixture can lead to wire falling off or poor contact due to operational issues during testing. Additionally, this invention further solves the problem that adjusting the angle and position of the test probe by hand during timing testing cannot effectively maintain the stability of the measured signal.

[0006] The present invention solves the above problems through the following technical solution:

[0007] A DDR timing test fixture includes a fixedly connected single-board fixing and clamping mechanism and a probe support base. The probe support base is provided with a sliding rail and a probe bracket for clamping a differential probe that is slidably connected to the sliding rail.

[0008] Furthermore, the single-board fixing and clamping mechanism includes a platform for placing the single board and a single-board clamping component disposed on the platform.

[0009] Furthermore, the single-board clamping component includes at least two limiting stops and multiple threaded holes formed on the platform. The limiting stops cooperate with the threaded holes to achieve clamping and limiting adjustment of the single board.

[0010] Furthermore, the probe bracket includes a slider slidably connected to the sliding rail, a height adjustment mechanism connected to the slider, an angle adjustment mechanism connected to the height adjustment mechanism, and a probe slot connected to the angle adjustment mechanism.

[0011] Furthermore, the height adjustment mechanism includes a first connector, the first end of which is connected to the slider, and the second end of which is connected to a height adjustment shaft.

[0012] Furthermore, the angle adjustment mechanism includes a second connector, the first end of which is connected to the height adjustment shaft, and the second end of which is connected to the angle adjustment shaft, which is connected to the probe slot.

[0013] Compared with the prior art, this utility model has the following advantages and beneficial effects:

[0014] (1) This utility model integrates the single-board fixing clamping mechanism for fixing the single board and the probe support base for fixing the test probe as a whole, thus avoiding the problem of test wire harness falling off. The probe bracket of this utility model can clamp differential probes and can simultaneously fix and measure two sets of differential signal probes.

[0015] (2) The limiting strip and threaded hole provided on the single board fixing clamping mechanism of this utility model realize the position adjustment and fixing of the single board and the platform, and can adapt to the fixing of PCB boards of different sizes, including irregularly shaped boards.

[0016] (3) The probe support base of this utility model has a three-axis rotating and slider design that can realize the adjustment of probe height and angle, and can also slide left and right to realize the adjustment of test distance with single board. The structure is simple and does not require hand adjustment of angle position, thus solving the problem that hand adjustment of angle cannot maintain the stability of the measured signal. Attached Figure Description

[0017] Figure 1 This is a top view of the present invention;

[0018] Figure 2 This is the front view of the present invention;

[0019] Figure 3 This is a schematic diagram of the probe bracket of this utility model;

[0020] Figure 4 This is a schematic diagram showing the interaction between this utility model and a test board, probe, and oscilloscope;

[0021] Among them, 1-single board fixing and clamping mechanism; 2-probe support base; 3-probe; 4-oscilloscope; 11-limiting stop bar; 12-threaded hole; 21-sliding rail; 22-probe bracket; 221-probe slot; 222-slider; 223-first connecting piece; 224-height adjustment shaft; 225-second connecting piece; 226-angle adjustment shaft. Detailed Implementation

[0022] The present invention will be further described in detail below with reference to the embodiments, but the implementation of the present invention is not limited thereto.

[0023] Example:

[0024] Combined with appendix Figures 1-3 As shown, a DDR timing test fixture includes a single-board fixing and clamping mechanism 1 and a probe support base 2 that are fixedly connected. The probe support base 2 is provided with a sliding rail 21 and a probe bracket 22 for clamping differential probes that is slidably connected to the sliding rail 21.

[0025] This invention integrates the single-board fixing clamping mechanism 1 and the probe support base 2 for fixing the test probe into a single unit, avoiding the problem of test wiring harness detachment. After the single board and test probe are fixed, the surrounding wiring harness can be neatly arranged as required, and the test probe wiring harness is kept away from power lines and grounding wires, significantly reducing interference sources on the target acquisition signal and avoiding test failures due to environmental issues. The probe bracket 22 of this invention can hold differential probes, allowing simultaneous fixing and measurement of two sets of differential signal probes. After deployment, only manual operation of the single-ended active probe with the fixture is required to test ADDR, DQ, RAS, and other signals. Before switching the DQS signal of DDR, the differential signal does not need to be adjusted separately, thus improving the connection stability of the signal under test.

[0026] Furthermore, the single-board fixing and clamping mechanism 1 includes a platform for placing single boards and a single-board clamping component disposed on the platform.

[0027] Furthermore, the single-board clamping component includes at least two limiting stops 11 and a plurality of threaded holes 12 formed on the platform. The limiting stops 11 cooperate with the threaded holes 12 to achieve clamping and limiting adjustment of the single board.

[0028] The single-board fixing clamping mechanism 1 can be adjusted by the limit stop 11 to fit the single board size to adapt to the single board being tested and to fix the single board being tested. It can be applied to various irregularly shaped single boards.

[0029] Furthermore, such as Figure 3 As shown, the probe bracket 22 includes a slider 222 slidably connected to the sliding rail 21, a height adjustment mechanism connected to the slider 222, an angle adjustment mechanism connected to the height adjustment mechanism, and a probe slot 221 connected to the angle adjustment mechanism.

[0030] The probe bracket 22 can be adjusted left and right in the probe support base 2 via the sliding rail 21 to suit the distance between the single board and the probe 3. The probe bracket 22 is designed with a slider 222 and a height adjustment mechanism, a height adjustment mechanism and an angle adjustment structure, an angle adjustment structure and a probe slot 221, and three rotating shafts between them, which can realize height adjustment and probe angle adjustment.

[0031] Furthermore, the height adjustment mechanism includes a first connector 223, the first end of which is connected to the slider 222, and the second end of which is connected to a height adjustment shaft 224.

[0032] Furthermore, the angle adjustment mechanism includes a second connector 225, the first end of which is connected to the height adjustment shaft 224, and the second end of which is connected to an angle adjustment shaft 226. The angle adjustment shaft 226 is connected to the probe slot 221, and the probes 3 are connected together through the probe slot 221.

[0033] like Figure 3 and Figure 4 As shown, the board with the differential probe terminals soldered on is placed in the board fixing and clamping mechanism 1. The limiting stop 11 in the board fixing and clamping mechanism 1 is adjusted and fixed with the threaded hole 12 to complete the fixing of the test board. Then, the differential probe 3 used to test DQS and CLK signals is placed in the probe slot 221 position above the probe support base 2. First, the horizontal adjustment of the probe bracket 22 is made by the slider 222. Then, the height of the probe 3 is adjusted by the rotation between the first connecting rod 223, the second connecting rod 225 and the height adjustment shaft 224. Then, the angle of the probe 3 is adjusted by the rotation between the probe slot 221 and the angle adjustment shaft 226, so that the probe terminals and the probe bracket 22 are in a suitable position. After fixing, the terminals are connected to the probe 3 and can be used with the oscilloscope 4 for testing.

[0034] This invention transmits the actual, stable signal of the single board to an oscilloscope for display via a differential probe. Once the system is successfully set up, it does not require relocation. During testing, other operations by the test personnel will not easily interrupt the stable signal output of the system, and moving the sample under test will not cause the soldered terminals to detach. This greatly improves the efficiency of DDR timing testing and reduces interference from environmental factors, providing a more objective presentation of the actual test results of the tested single board.

[0035] Although the present invention has been described herein with reference to illustrative embodiments, the above embodiments are merely preferred embodiments of the present invention, and the implementation of the present invention is not limited to the above embodiments. It should be understood that those skilled in the art can design many other modifications and implementations, which will fall within the scope and spirit of the principles disclosed in this application.

Claims

1. A DDR timing test fixture, comprising: It includes a single-board fixing clamping mechanism (1) and a probe support base (2) that are fixedly connected. The probe support base (2) is provided with a sliding rail (21) and a probe bracket (22) for clamping the differential probe that is slidably connected to the sliding rail (21).

2. The DDR timing test fixture of claim 1, wherein, The single-board fixing and clamping mechanism (1) includes a platform for placing single boards and a single-board clamping component disposed on the platform.

3. The DDR timing test fixture of claim 2, wherein, The single-board clamping component includes at least two limiting stops (11) and multiple threaded holes (12) opened on the platform. The limiting stops (11) cooperate with the threaded holes (12) to achieve clamping and limiting adjustment of the single board.

4. The DDR timing test fixture of claim 1, wherein, The probe bracket (22) includes a slider (222) slidably connected to the sliding rail (21), a height adjustment mechanism connected to the slider (222), an angle adjustment mechanism connected to the height adjustment mechanism, and a probe slot (221) connected to the angle adjustment mechanism.

5. The DDR timing test fixture of claim 4, wherein, The height adjustment mechanism includes a first connector (223), the first end of which is connected to the slider (222), and the second end of which is connected to a height adjustment shaft (224).

6. The DDR timing test fixture of claim 5, wherein, The angle adjustment mechanism includes a second connector (225), the first end of which is connected to the height adjustment shaft (224), and the second end of which is connected to the angle adjustment shaft (226), which is connected to the probe slot (221).

Images