A probe test tool and test system for surface resistance experiments

Abstract

This application provides a probe testing fixture and system for surface resistance experiments. The probe testing fixture includes: a support plate with a test position for placing a sample to be tested on its upper surface; a test plate with a probe group at one end, the probe group facing the support plate and its projection in the direction facing the support plate at least partially coinciding with the test position; and a telescopic module disposed at the other end of the test plate for driving the test plate to switch between a first state and a second state. When the test plate is in the first state, it is close to the support plate so that the probe group contacts the sample to be tested placed at the test position; when the test plate is in the second state, it is away from the support plate. This application avoids direct contact between the operator and the high-voltage test pen tip, reducing the risk of electric shock due to improper operation.

Description

Technical Field

[0001] This application relates to the technical field of testing fixtures, and more particularly to a probe testing fixture and testing system for surface resistance experiments. Background Technology

[0002] Accurate measurement of surface resistance is crucial for evaluating the electrical properties and safety of materials during surface resistance experiments. Traditional methods typically rely on manual handling using a test pen or clamp to contact the sample, which has several limitations. When using high-voltage testing equipment (such as AC / DC withstand voltage insulation analyzers with output voltages up to 500V±10V), operators must use two test pens to hold the conductive paint electrodes in place for 65s±5s at a DC voltage of 500V±10V. In this situation, operators must wear insulated gloves and take all necessary precautions to prevent accidental contact with the test pen tips due to improper grip, which could result in exposure to high voltage. However, when the test voltage far exceeds the human safety voltage of 36V, any operational error could lead to a serious safety accident.

[0003] Based on this, this application provides a probe testing fixture and testing system for surface resistance experiments. Utility Model Content

[0004] The purpose of this application is to provide a probe testing fixture and system for surface resistance experiments, thereby solving the aforementioned technical problems. This purpose is achieved through the following technical solution:

[0005] This application provides a probe testing fixture for surface resistance experiments, including:

[0006] A support plate, the upper surface of which is provided with a test position for placing the sample to be tested;

[0007] A test board, one end of which is provided with a probe group, the probe group facing the support plate and the projection of the test board in the direction facing the support plate at least partially coincides with the test position;

[0008] A telescopic module is disposed at the other end of the test board and is used to drive the test board to switch between a first state and a second state. When the test board is in the first state, the test board is close to the support plate so that the probe group contacts the sample to be tested placed at the test position. When the test board is in the second state, the test board is away from the support plate.

[0009] In some alternative embodiments, the probe group includes two needle-shaped probes, namely a positive electrode probe and a negative electrode probe.

[0010] In some optional embodiments, the test plate is provided with at least one through hole located between the probe group and the telescopic module; the probe testing fixture also includes a number of support rods equal to the number of through holes, one end of which is fixed to the carrier plate and passes through its corresponding through hole to provide support when the test plate switches between a first state and a second state.

[0011] In some optional embodiments, there are two through holes and two support rods. The line connecting the center point of the two needle-shaped probes and the telescopic module is perpendicular to the line connecting the two through holes, and the line connecting the center point of the two needle-shaped probes and the telescopic module passes through the center of the line connecting the two through holes.

[0012] In some optional embodiments, the support rod is a cylindrical support rod, and the inner wall of the through hole is provided with a rubber ring that matches the support rod.

[0013] In some optional embodiments, the distance between the positive electrode probe and the negative electrode probe is 10 ± 0.5 mm.

[0014] In some alternative embodiments, multiple rubber pads are symmetrically arranged along the edge of the lower surface of the support plate.

[0015] In some alternative embodiments, the telescopic module includes a link and a handle. The link passes between the support plate and the test plate and is capable of moving the test plate toward or away from the support plate under external force. The handle is hinged to the end of the link away from the support plate and is used to apply external force to the link.

[0016] In some alternative embodiments, the test board is a transparent acrylic sheet.

[0017] This application also provides a testing system, including the probe testing fixture described in any of the above claims, and further including an AC / DC withstand voltage insulation analyzer, wherein the positive clamp of the AC / DC withstand voltage insulation analyzer is electrically connected to the positive electrode probe of the probe testing fixture, and the negative clamp is electrically connected to the negative electrode probe of the probe testing fixture.

[0018] Based on the above technical solutions and the technical problems solved, the technical solution to be protected in this application has the following advantages and positive effects: Compared with traditional manual handheld testing, this probe testing fixture avoids direct contact between the operator and the high-voltage pen tip, reducing the risk of electric shock due to improper operation. The position of the probe group on the test plate is fixed, and its projection at least partially overlaps with the test position, ensuring that the probe accurately contacts the designated test area of ​​the sample under test, reducing the contact position deviation that may occur due to manual handheld testing, thereby improving the accuracy and reliability of surface resistance testing. Attached Figure Description

[0019] The present application will be further described below with reference to the accompanying drawings and embodiments.

[0020] Figure 1 This is a side view of a probe testing fixture provided in an embodiment of this application;

[0021] Figure 2 This is a top view of a probe testing fixture provided in an embodiment of this application;

[0022] Figure 3 This is a rear view of a probe testing fixture provided in an embodiment of this application.

[0023] Illustration: 10, bearing plate; 20, test plate; 30, probe group; 40, telescopic module; 50, support rod; 60, rubber ring; 70, rubber pad; 41, connecting rod; 42, handle. Detailed Implementation

[0024] The present application will now be further described in conjunction with the accompanying drawings and specific embodiments. It should be noted that, without conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0025] See Figures 1 to 3 This application provides a probe testing fixture for surface resistance experiments, comprising:

[0026] The support plate 10 has a test position on its upper surface for placing the sample to be tested.

[0027] The test board 20 has a probe group 30 at one end, and the probe group 30 faces the support plate 10 and its projection in the direction of the test board 20 toward the support plate 10 at least partially coincides with the test position.

[0028] A telescopic module 40 is disposed at the other end of the test plate 20 and is used to drive the test plate 20 to switch between a first state and a second state. When the test plate 20 is in the first state, the test plate 20 is close to the support plate 10 so that the probe group 30 contacts the sample to be tested placed at the test position. When the test plate 20 is in the second state, the test plate 20 is away from the support plate 10.

[0029] In practical applications, the sample to be tested is first placed on the test position of the support plate 10, ensuring that the test surface of the sample faces upwards and is accurately positioned. Then, by operating the telescopic module 40, the test plate 20 is driven to move towards the support plate 10 until the probe assembly 30 contacts the surface of the sample. During this process, the projection of the probe assembly 30 at least partially overlaps with the test position, ensuring that the probes can accurately contact the sample. After the probe assembly 30 contacts the sample, a voltage is applied to the sample using professional surface resistance testing equipment (such as an AC / DC withstand voltage insulation analyzer), and the surface resistance value of the sample is measured. The testing equipment will automatically perform the test according to preset test parameters (such as voltage value, test time, etc.) and record the test results. After the test is completed, the telescopic module 40 is operated again to switch the test plate 20 from the first state to the second state, the test plate 20 moves away from the support plate 10, the probe assembly 30 separates from the sample, and the sample is removed, completing the test.

[0030] Compared to traditional manual handheld testing, this probe testing fixture avoids direct contact between the operator and the high-voltage pen tip, reducing the risk of electric shock due to improper operation. The probe group 30 is fixed in position on the test plate 20, and its projection at least partially overlaps with the test position, ensuring that the probe accurately contacts the designated test area of ​​the sample under test. This reduces contact position deviations that may occur with manual handheld testing, thereby improving the accuracy and reliability of surface resistance testing.

[0031] The probe group 30 includes two needle-shaped probes, namely a positive electrode probe and a negative electrode probe.

[0032] The probes, acting as positive and negative electrodes, ensure that the current flows through the surface of the sample under test along a predetermined path, thereby accurately measuring the surface resistance of the sample and improving the accuracy and reliability of the test results. The probes are fixed to the test board 20, avoiding human error from handling the electrodes manually, reducing the risk of electric shock, and preventing interference from human contact with the test circuit.

[0033] In some embodiments, the test plate 20 is provided with at least one through hole located between the probe group 30 and the telescopic module 40; the probe testing fixture also includes a number of support rods 50 equal to the number of through holes, one end of the support rod 50 being fixed to the carrier plate 10 and passing through its corresponding through hole to provide support when the test plate 20 switches between a first state and a second state.

[0034] It can be assumed that during surface resistance testing, the sample to be tested is placed on the test position of the support plate 10. Driven by the telescopic module 40, the test plate 20 can switch between a first state (close to the support plate 10, allowing the probe assembly 30 to contact the sample) and a second state (away from the support plate 10). During the switching process of the test plate 20, the support rod 50 slides within the through hole, providing stable support for the test plate 20 and ensuring smooth and accurate movement. Simultaneously, the support rod 50 restricts the direction of movement of the test plate 20, preventing it from deviating, thereby ensuring that the probe assembly 30 can accurately contact the sample to be tested and ensuring the reliability of the test results.

[0035] In some embodiments, there are two through holes and two support rods 50. The line connecting the center point between the two needle probes and the telescopic module 40 is perpendicular to the line connecting the two through holes, and the line connecting the center point between the two needle probes and the telescopic module 40 passes through the midpoint of the line connecting the two through holes.

[0036] The line connecting the midpoint between the two needle-like probes and the telescopic module 40 is not only perpendicular to the line connecting the two through holes, but also passes through the midpoint of the line connecting the center points of the two through holes. When the test plate 20 switches between the first and second states under the drive of the telescopic module 40, the support rod 50 slides within the through holes, providing stable support for the test plate 20. This geometric layout ensures that the test plate 20 maintains its balance and stability during movement, avoiding measurement errors caused by structural offset or uneven force.

[0037] In some embodiments, the support rod 50 is a cylindrical support rod 50, and the inner wall of the through hole is provided with a rubber ring 60 that matches the support rod 50. The rubber ring 60 effectively reduces the gap between the support rod 50 and the through hole, making the support rod 50 more stable when sliding within the through hole, thereby enhancing the stability of the test plate 20 during movement, ensuring that the probe assembly 30 can accurately contact the sample to be tested, and improving the reliability of the test results. The distance between the positive electrode probe and the negative electrode probe is 10 ± 0.5 mm.

[0038] In some embodiments, a plurality of rubber pads 70 are symmetrically arranged along the edge of the lower surface of the support plate 10.

[0039] When the probe testing fixture is placed on the workbench or other supporting surface, the rubber pad 70 first contacts the supporting surface, reducing the tilting or shaking of the bearing plate 10 caused by unevenness of the supporting surface. During the test, the rubber pad 70 can also effectively absorb external vibrations and impacts, preventing external factors from interfering with the test process and ensuring stable contact between the probe assembly 30 and the sample to be tested, thereby improving the accuracy and reliability of the test.

[0040] In some embodiments, the telescopic module 40 includes a connecting rod 41 and a handle 42. The connecting rod 41 passes between the support plate 10 and the test plate 20 and can move the test plate 20 toward or away from the support plate 10 under the drive of an external force. The handle 42 is hinged to the end of the connecting rod 41 away from the support plate 10 and is used to apply an external force to the connecting rod 41.

[0041] The telescopic module 40 moves the test plate 20 through the cooperation of the connecting rod 41 and the handle 42. The connecting rod 41 passes through the support plate 10 and the test plate 20. When an external force is applied to the handle 42, the connecting rod 41 drives the test plate 20 to move relative to the support plate 10. Specifically, the handle 42 is hinged to the end of the connecting rod 41 away from the support plate 10. Through the hinge, the swing of the handle 42 can be converted into the linear motion of the connecting rod 41, thereby driving the test plate 20 to move toward or away from the support plate 10, realizing the switching of the test plate 20 between the first state and the second state.

[0042] In some embodiments, the test plate 20 is a transparent acrylic plate.

[0043] The test plate 20 is made of transparent acrylic sheet, allowing light to pass through. During the test, the operator can observe the contact between the probe assembly 30 and the sample through the transparent test plate 20. Simultaneously, the acrylic sheet has high strength and toughness, while being lightweight, facilitating installation and relocation, reducing the overall weight of the device and improving portability. The support plate 10 can also be a transparent acrylic sheet.

[0044] This application also provides a testing system, including the probe testing fixture described in any of the above embodiments, and further including an AC / DC withstand voltage insulation analyzer, wherein the positive clamp of the AC / DC withstand voltage insulation analyzer is electrically connected to the positive electrode probe of the probe testing fixture, and the negative clamp is electrically connected to the negative electrode probe of the probe testing fixture.

[0045] The positive and negative electrode probes of the probe testing fixture are electrically connected to the positive and negative clamps of the AC / DC withstand voltage insulation analyzer via wires. During testing, the probes of the fixture contact the sample, the analyzer outputs a set voltage, and current flows into the sample through the positive electrode probe and out of the negative electrode probe, returning to the analyzer, forming a closed loop.

[0046] As an example, the test steps for withstand voltage insulation analysis of the sample under test corresponding to the test system are as follows:

[0047] P1. Apply a layer of conductive paint to the sample to be tested, which is the same as that used for the positive and negative electrode probes. The spacing between the conductive paints is the same as the spacing between the positive and negative electrode probes of the probe testing fixture (e.g., 10 mm). Place the sample to be tested with the conductive paint facing upwards at the test position.

[0048] P2, connect the positive electrode probe of the probe test fixture to the positive clamp of the AC / DC withstand voltage insulation analyzer, and the negative electrode probe to the negative clamp of the AC / DC withstand voltage insulation analyzer. Then control the telescopic module to make the probe group contact the conductive adhesive of the sample to be tested placed at the test position.

[0049] P3 uses an AC / DC withstand voltage insulation analyzer to analyze the sample under test.

[0050] It should be noted that in the embodiments of this application, "at least one" refers to one or more, and "more than one" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can represent: a, b, c, a and b, a and c, b and c, or a and b and c, where a, b, and c can be single or multiple. It is worth noting that "at least one" can also be interpreted as "one or more".

[0051] The terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this application are configured to distinguish similar objects and are not necessarily configured to describe a particular order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0052] This application describes the invention from the perspectives of purpose, performance, progress, and novelty, and it meets the functional enhancement and use requirements emphasized by the Patent Law. The above description and drawings are merely preferred embodiments of this application and are not intended to limit this application. Therefore, all structures, devices, features, etc., that are similar to or identical to those of this application, i.e., all equivalent substitutions or modifications made in accordance with the scope of this patent application, shall fall within the scope of protection of this patent application.

Claims

1. A probe testing fixture for surface resistance experiments, characterized in that, include: A support plate, the upper surface of which is provided with a test position for placing the sample to be tested; A test board, one end of which is provided with a probe group, the probe group facing the support plate and the projection of the test board in the direction facing the support plate at least partially coincides with the test position; A telescopic module is provided at the other end of the test board, which is used to drive the test board to switch between a first state and a second state; When the test plate is in the first state, the test plate is close to the support plate so that the probe group contacts the sample to be tested placed at the test position; when the test plate is in the second state, the test plate is away from the support plate.

2. The probe testing fixture according to claim 1, characterized in that, The probe group includes two needle-shaped probes, namely a positive electrode probe and a negative electrode probe.

3. The probe testing fixture according to claim 2, characterized in that, The test plate is provided with at least one through hole, which is located between the probe group and the telescopic module; the probe test fixture also includes a number of support rods equal to the number of through holes, one end of which is fixed to the carrier plate and passes through its corresponding through hole to provide support when the test plate switches between a first state and a second state.

4. The probe testing fixture according to claim 3, characterized in that, The number of through holes and the number of support rods are both two. The line connecting the center point between the two needle-shaped probes and the telescopic module is perpendicular to the line connecting the two through holes, and the line connecting the center point between the two needle-shaped probes and the telescopic module passes through the midpoint of the line connecting the two through holes.

5. The probe testing fixture according to claim 3, characterized in that, The support rod is a cylindrical support rod, and the inner wall of the through hole is provided with a rubber ring that matches the support rod.

6. The probe testing fixture according to claim 2, characterized in that, The distance between the positive electrode probe and the negative electrode probe is 10±0.5mm.

7. The probe testing fixture according to claim 1, characterized in that, Multiple rubber pads are symmetrically arranged along the edge of the lower surface of the support plate.

8. The probe testing fixture according to claim 1, characterized in that, The telescopic module includes a connecting rod and a handle. The connecting rod passes between the support plate and the test plate and can move the test plate toward or away from the support plate under the drive of an external force. The handle is hinged to the end of the connecting rod away from the support plate and is used to apply an external force to the connecting rod.

9. The probe testing fixture according to claim 1, characterized in that, The test board is a transparent acrylic sheet.

10. A testing system, characterized in that, The probe testing fixture according to any one of claims 1-9 further includes an AC / DC withstand voltage insulation analyzer, wherein the positive clamp of the AC / DC withstand voltage insulation analyzer is electrically connected to the positive electrode probe of the probe testing fixture, and the negative clamp is electrically connected to the negative electrode probe of the probe testing fixture.

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