A semiconductor conductive test device

Abstract

The utility model discloses a kind of semiconductor conductive test devices, it is related to semiconductor test technical field.The utility model includes transparent ball assembly, the inner cavity of transparent ball assembly is provided with planetary gear set, the bottom of transparent ball assembly is provided with bracket mechanism, the surface of transparent ball assembly is provided with marking assembly, transparent ball assembly includes upper sphere, the bottom of upper sphere is provided with first ring body, the bottom of first ring body is provided with lower sphere.The utility model is through the closed observation environment of transparent ball assembly and the mechanical transmission design of internal planetary gear set, discards the dependence of traditional electronic testing device to sensor and circuit, makes the movement of negative charge mark directly respond the effect of semiconductor carrier, lets the physical process of conductive type judgment be converted from abstract data into intuitive mechanical movement, it is convenient for user to understand the associated nature of charge interaction and conductive type, suitable for basic teaching scene.

Description

Technical Field

[0001] This utility model belongs to the field of semiconductor testing technology, and in particular relates to a testing device for semiconductor conductivity. Background Technology

[0002] In today's rapidly developing semiconductor technology, determining the conductivity type of semiconductor materials is a fundamental step in research and teaching in fields such as electronics and microelectronics. Whether it's the design and manufacturing of semiconductor devices or experimental teaching in related courses, it's essential to determine, intuitively and accurately, whether a semiconductor is N-type (electron-conducting) or P-type (hole-conducting). Furthermore, in the teaching of basic electromagnetism, the demonstration and understanding of fundamental laws such as the left-hand rule and the right-hand screw rule often require concrete demonstrations of specific conductivity phenomena.

[0003] A Chinese patent application with publication number CN211652952U discloses a semiconductor conductivity testing platform, including a platform support, a platform, a test lamp holder, a battery box inside the battery, and a set of contacts connected to the bottom of the left and right sides of the top of the power supply base plate; it also includes a voltmeter, an ammeter, a clamping plate support, a clamping plate, a movable clamping plate support, a shaft frame, and a clamping shaft, with the right side of the top of the clamping plate support connected to the outer end of the clamping plate.

[0004] The test bench of the aforementioned patent relies on electronic measuring components, and its function is limited to conductivity testing. It cannot determine the type of conductivity or demonstrate electromagnetic laws. Furthermore, it lacks a closed observation environment, which is not conducive to the visualization of charge movement. The planar structure and open environment of the simple demonstration device make the charge markers susceptible to external interference, resulting in unstable movement trajectories and affecting the accuracy of judgment. At the same time, since no marking system corresponding to electromagnetic laws is set up, it is impossible to associate the semiconductor conductivity phenomenon with basic laws such as the left-hand rule and the right-hand screw rule.

[0005] To address these issues, we provide a test apparatus for semiconductor conductivity. Utility Model Content

[0006] The purpose of this invention is to provide a test device for semiconductor conductivity. By combining a transparent ball assembly, a planetary gear set, and a marking assembly, it solves the problem that existing test devices rely on electronic measuring elements, are limited to conductivity testing, and cannot determine conductivity type or demonstrate electromagnetic laws.

[0007] To solve the above-mentioned technical problems, this utility model is achieved through the following technical solution.

[0008] This invention relates to a semiconductor conductivity testing device, comprising a transparent sphere assembly. The transparent sphere assembly has a planetary gear set inside its cavity, a support mechanism at its bottom, and a marking component on its surface. The transparent sphere assembly includes an upper sphere, a first ring at its bottom, and a lower sphere at its bottom. The surface of the first ring is marked with a positive charge. The planetary gear set includes a connecting shaft, with its top and bottom movably connected to the upper and lower spheres respectively via bearings. A connecting seat is fixedly connected to the surface of the connecting shaft, and a first gear is fixedly connected to the surface of the connecting seat. Second gears mesh with both sides of the first gear, and a third gear meshes with one side of the second gear. A connecting rod is fixedly connected to the surface of the third gear, and a second ring is fixedly connected to one side of the connecting rod. The surface of the second ring is marked with a negative charge. A support rod is fixedly connected to one side of the first ring, and one side of the support rod is connected to the connecting shaft. The upper and lower spheres are symmetrically distributed above and below the first ring, forming a closed spherical space. This effectively isolates the interference of stray electric fields from the outside, ensuring that the movement of internal components is not affected by the external environment. At the same time, the transparent material allows users to clearly observe the movement of the internal negative charge marks from various angles, providing excellent conditions for intuitive observation. The positive and negative charge marks correspond to each other, and the change in their positional relationship can intuitively demonstrate the interaction between charges, helping to understand the charge movement law when the semiconductor conducts electricity. When the connecting shaft rotates, the first gear rotates synchronously, which in turn drives the second and third gears that mesh with it to rotate. The third gear is connected to the second ring through a connecting rod, so that the second ring can move with the rotation of the third gear. The two rotate in opposite directions, thus realizing the reverse rotation of the second ring relative to the connecting shaft. This can stably transmit the rotation of the connecting shaft to the second ring, providing a reliable motion basis for accurately determining the semiconductor conductivity type. The surface of the connecting shaft is marked with a direction opposite to the external magnetic field lines.

[0009] The present invention is further configured such that the support mechanism includes a base, and a connecting column is fixedly connected to the top of the base. The top of the connecting column is provided with a groove that is adapted to the lower sphere. The groove is adapted to the lower sphere and can position the transparent ball assembly, so as to prevent the device from shifting or shaking due to external force during use and ensure the stable operation of the internal planetary gear set.

[0010] This invention is further configured such that the marking component includes marking lines, arrow symbols, and type markings. The marking lines, arrow symbols, and type markings are all printed on the surfaces of the upper and lower spheres. The marking lines simulate the direction of the magnetic field, the arrow symbols indicate the direction of the current, and the type markings indicate the semiconductor type. The surface of the connecting shaft is marked with markings opposite to the external magnetic field lines. The marking component directly prints the marking lines simulating the direction of the magnetic field and the arrow symbols indicating the direction of the current on the surface of the transparent sphere component, making the magnetic field and current appear in a concrete way. The type markings indicate the semiconductor type, allowing users to quickly distinguish semiconductor properties by observing the markings. When users observe the movement of negative charge markings, they can intuitively understand the relationship between charge movement and magnetic field and current by combining these markings, significantly improving the clarity and teaching efficiency of the demonstration of electromagnetic laws.

[0011] The present invention is further configured such that a negative pressure hole is provided at the bottom of the base, and a sealing gasket is provided on the surface of the negative pressure hole. The negative pressure hole and the sealing gasket fix the device on the smooth plane through negative pressure adsorption, effectively preventing the device from slipping. The sealing gasket ensures the airtightness of the negative pressure hole, ensuring that the adsorption effect is long-lasting and reliable.

[0012] The present invention is further configured such that there are four connecting rods, and one side of each connecting rod is fixedly connected to the second ring body by fasteners. The second ring body is fixed to the connecting rods by fasteners, which ensures the balance and stability of the second ring body when it rotates.

[0013] The present invention is further provided with a slot at the bottom of the upper sphere and at the top of the lower sphere. The slot provides positioning for the assembly of the transparent sphere assembly, ensuring that the axes of the upper sphere, the first ring body and the lower sphere coincide when they are spliced, and avoiding misalignment.

[0014] The present invention is further configured such that the first ring body is disposed between the upper sphere and the lower sphere, and the top and bottom of the upper sphere are provided with slide rails that slide with the slot. The first ring body slides between the upper sphere and the lower sphere, which can drive the internal gear to rotate.

[0015] The present invention is further configured such that the negative charge marks are evenly distributed along the circumference of the second ring body, the included angle between two adjacent negative charge marks is equal, and the negative charge marks are evenly distributed along the circumference of the second ring body, so that the motion state of the negative charge marks can more evenly reflect the rotation of the second ring body.

[0016] The present invention has the following beneficial effects.

[0017] 1. This utility model, through the enclosed observation environment of the transparent sphere assembly and the mechanical transmission design of the internal planetary gear set, eliminates the dependence of traditional electronic testing devices on sensors and circuits. It enables the movement of the negative charge marker to directly respond to the action of semiconductor charge carriers, transforming the physical process of determining the conductivity type from abstract data into intuitive mechanical motion. This makes it easier for users to understand the essential relationship between charge interaction and conductivity type, and is suitable for basic teaching scenarios.

[0018] 2. This utility model realizes the functions of semiconductor conductivity type determination and demonstration of left-hand rule and right-hand screw rule in a single device. The marking component directly simulates the direction of magnetic field and current. Combined with the motion state of negative charge mark, it can complete the linkage demonstration of multiple knowledge points without additional teaching aids, reduce the steps of switching experimental equipment, and improve the efficiency of teaching and experiment. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below.

[0020] Figure 1 This is a three-dimensional view of a test apparatus for semiconductor conductivity.

[0021] Figure 2 This is a bottom-view perspective view of a test apparatus for semiconductor conductivity.

[0022] Figure 3 This is a three-dimensional view of the lower sphere and its connecting structure in a semiconductor conductivity test device.

[0023] Figure 4 This is a perspective view of a planetary gear set in a semiconductor conductive test apparatus.

[0024] Figure 5 This is a bottom-view perspective view of a planetary gear set in a semiconductor conductive test apparatus.

[0025] Figure 6 This is a three-dimensional view of the connection structure between the upper and lower spheres in a semiconductor conductivity test device.

[0026] In the attached diagram: 1. Transparent sphere assembly; 11. Upper sphere; 12. First ring; 13. Lower sphere; 14. Positive charge marker; 2. Planetary gear set; 21. Connecting shaft; 22. Connecting seat; 23. First gear; 24. Second gear; 25. Third gear; 26. Connecting rod; 27. Second ring; 28. Negative charge marker; 29. ​​Support rod; 3. Support mechanism; 31. Base; 32. Connecting column; 33. Groove; 4. Marking assembly; 41. Marking line; 42. Arrow symbol; 43. Type marker; 5. Negative pressure hole; 6. Sealing gasket. Detailed Implementation

[0027] The technical solutions of the present utility model will be described below with reference to the accompanying drawings. The described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0028] Example 1 Please see Figure 1-6 This invention relates to a semiconductor conductivity testing device, comprising a transparent sphere assembly 1, a planetary gear set 2 disposed within the inner cavity of the transparent sphere assembly 1, a support mechanism 3 disposed at the bottom of the transparent sphere assembly 1, and a marking assembly 4 disposed on the surface of the transparent sphere assembly 1. The transparent sphere assembly 1 includes an upper sphere 11, a first ring 12 disposed at the bottom of the upper sphere 11, and a lower sphere 13 disposed at the bottom of the first ring 12. A positive charge mark 14 is disposed on the surface of the first ring 12. The planetary gear set 2 includes a connecting shaft 21, the top and bottom of which are respectively connected to the upper sphere via bearings. 11 and the lower sphere 13 are movably connected. A connecting seat 22 is fixedly connected to the surface of the connecting shaft 21. A first gear 23 is fixedly connected to the surface of the connecting seat 22. A second gear 24 meshes with both sides of the first gear 23. A third gear 25 meshes with one side of the second gear 24. A connecting rod 26 is fixedly connected to the surface of the third gear 25. A second ring 27 is fixedly connected to one side of the connecting rod 26. A negative charge mark 28 is provided on the surface of the second ring 27. A support rod 29 is fixedly connected to one side of the first ring 12. One side of the support rod 29 is fixedly connected to the connecting shaft 21.

[0029] Specifically: The upper sphere 11 and the lower sphere 13 are symmetrically distributed above and below the first ring 12, forming a closed spherical space. This effectively isolates the interference factors of external stray electric fields, ensuring that the movement of internal components is not affected by the external environment. At the same time, the transparent material allows users to clearly observe the movement state of the internal negative charge mark 28 from various angles, providing good conditions for intuitive observation. The positive charge mark 14 corresponds to the negative charge mark 28. Through the change in their positional relationship, the interaction between charges can be intuitively demonstrated, helping to understand the charge movement law when the semiconductor conducts electricity. When the connecting shaft 21 rotates, the first gear 23 rotates synchronously, thereby driving the second gear 24 and the third gear 25 that mesh with it to rotate. The third gear 25 is connected to the second ring 27 through the connecting rod 26, so that the second ring 27 can move with the rotation of the third gear 25. The two rotate in opposite directions, thereby realizing the reverse rotation of the second ring 27 relative to the connecting shaft 21. This can stably transmit the rotation of the connecting shaft 21 to the second ring 27, providing a reliable motion basis for accurately determining the semiconductor conductivity type.

[0030] Example 2 Please see Figure 1-6Based on Embodiment 1, the support mechanism 3 includes a base 31, with a connecting post 32 fixedly connected to the top of the base 31. The top of the connecting post 32 has a groove 33 adapted to the lower sphere 13. The marking component 4 includes a marking line 41, an arrow symbol 42, and a type mark 43. The marking line 41, arrow symbol 42, and type mark 43 are all printed on the surfaces of the upper sphere 11 and the lower sphere 13. The marking line 41 simulates the direction of a magnetic field, the arrow symbol 42 indicates the direction of current, and the type mark 43 indicates the semiconductor type. The surface of the connecting shaft 21 is provided with a groove for connecting to an external magnetic field. The base 31 has a negative pressure hole 5 at its bottom, and a sealing gasket 6 is provided on the surface of the negative pressure hole 5. There are four connecting rods 26. One side of the connecting rod 26 is fixedly connected to the second ring body 27 by fasteners. The bottom of the upper sphere 11 and the top of the lower sphere 13 are provided with slots. The first ring body 12 is located between the upper sphere 11 and the lower sphere 13. The top and bottom of the upper sphere 11 are provided with slide rails that slide with the slots. The negative charge marks 28 are evenly distributed along the circumference of the second ring body 27, and the included angle between two adjacent negative charge marks 28 is equal.

[0031] Specifically: the groove 33 fits into the lower sphere 13, positioning the transparent sphere assembly 1 and preventing displacement or shaking due to external force during use, thus ensuring stable operation of the internal planetary gear set 2. The marking component 4 directly prints the marking line 41 simulating the magnetic field direction and the arrow symbol 42 indicating the current direction on the surface of the transparent sphere assembly 1, making the magnetic field and current appear in a concrete way. The type marking 43 indicates the semiconductor type, allowing users to quickly distinguish semiconductor properties by observing the markings. When observing the movement of the negative charge marking 28, users can intuitively understand the relationship between charge movement and magnetic field and current by combining these markings, significantly improving the clarity and teaching efficiency of the electromagnetic law demonstration. The negative pressure hole 5 and the sealing gasket 6 pass through the negative pressure... The adsorption effect fixes the device on a smooth surface, effectively preventing it from slipping. The sealing gasket 6 ensures the airtightness of the negative pressure hole 5, ensuring a long-lasting and reliable adsorption effect. The second ring 27 is fixed to the connecting rod 26 by fasteners, ensuring the balance and stability of the second ring 27 during rotation. The slot provides positioning for the assembly of the transparent ball assembly 1, ensuring that the axes of the upper ball 11, the first ring 12, and the lower ball 13 coincide during splicing, avoiding misalignment. The first ring 12 slides between the upper ball 11 and the lower ball 13, driving the internal gear to rotate. The negative charge mark 28 is evenly distributed along the circumference of the second ring 27, so that the movement state of the negative charge mark 28 can more evenly reflect the rotation of the second ring 27.

[0032] The working principle of this utility model is as follows: When the first ring body 12 is rotated, the connecting shaft 21 and the first gear 23 are driven to rotate synchronously through the support rod 29. The first gear 23 drives the second gears 24 on both sides to rotate in the opposite direction. The second gears 24 then drive the third gear 25 to rotate. The second ring body 27 connected to the third gear 25 rotates accordingly. The negative charge mark 28 on its surface moves in the opposite direction to the positive charge mark 14 on the surface of the first ring body 12, which intuitively shows the interaction law between charges. At the same time, the reverse magnetic field line mark on the surface of the connecting shaft 21 rotates with the shaft, forming a linkage reference with the mark line 41 and arrow symbol 42 in the mark assembly 4. Users can clearly observe the spatial relationship between the trajectory of negative charge movement and the direction of magnetic field and current, and concretely understand the charge movement characteristics when semiconductor conduction.

[0033] When demonstrating the laws of electromagnetism, the marking line 41 and arrow symbol 42 are combined to show the relationship between the rotation direction of the negative charge mark 28 and the marking line 41 and arrow symbol 42 when simulating a magnetic field and current in a specific direction. This visually presents the relationship between the magnetic field, current and force in the left-hand rule. By simulating the direction of the current through the marking line 41, the rotation trajectory of the negative charge mark 28 around the direction of the current can be observed, demonstrating the relationship between the current and the magnetic field in the right-hand screw rule. The type mark 43 is printed on the surface of the sphere. Users do not need to rely on detection equipment and can clearly identify the semiconductor properties by visually observing the mark, which greatly shortens the time for type identification.

[0034] The preferred embodiments of the present utility model disclosed above are only used to help illustrate the present utility model. The preferred embodiments do not describe all the details in detail, nor do they limit the present utility model to the specific implementation methods described. The present specification selects and specifically describes these embodiments in order to better explain the principle and practical application of the present utility model, so that those skilled in the art can better understand and utilize the present utility model.

Claims

1. A test apparatus for semiconductor conductivity, comprising a transparent sphere assembly (1), characterized in that: The inner cavity of the transparent ball assembly (1) is provided with a planetary gear set (2), the bottom of the transparent ball assembly (1) is provided with a support mechanism (3), and the surface of the transparent ball assembly (1) is provided with a marking component (4). The transparent sphere assembly (1) includes an upper sphere (11), a first ring (12) is provided at the bottom of the upper sphere (11), a lower sphere (13) is provided at the bottom of the first ring (12), and a positive charge mark (14) is provided on the surface of the first ring (12). The planetary gear set (2) includes a connecting shaft (21). The top and bottom of the connecting shaft (21) are movably connected to the upper ball (11) and the lower ball (13) respectively via bearings. A connecting seat (22) is fixedly connected to the surface of the connecting shaft (21). A first gear (23) is fixedly connected to the surface of the connecting seat (22). A second gear (24) meshes with both sides of the first gear (23). A third gear (25) meshes with one side of the second gear (24). A connecting rod (26) is fixedly connected to the surface of the third gear (25). A second ring (27) is fixedly connected to one side of the connecting rod (26). A negative charge mark (28) is provided on the surface of the second ring (27). A support rod (29) is fixedly connected to one side of the first ring (12). One side of the support rod (29) is fixedly connected to the connecting shaft (21).

2. The semiconductor conductivity testing apparatus according to claim 1, characterized in that: The support mechanism (3) includes a base (31), and a connecting column (32) is fixedly connected to the top of the base (31). The top of the connecting column (32) is provided with a groove (33) that is adapted to the lower ball (13).

3. The semiconductor conductivity testing apparatus according to claim 1, characterized in that: The marking component (4) includes a marking line (41), an arrow symbol (42), and a type mark (43). The marking line (41), arrow symbol (42), and type mark (43) are all printed on the surfaces of the upper sphere (11) and the lower sphere (13). The marking line (41) simulates the direction of the magnetic field, the arrow symbol (42) indicates the direction of the current, and the type mark (43) is of semiconductor type. The surface of the connecting shaft (21) is provided with a mark that is opposite to the external magnetic field lines.

4. The semiconductor conductivity testing apparatus according to claim 2, characterized in that: The base (31) has a negative pressure hole (5) at its bottom, and a sealing gasket (6) is provided on the surface of the negative pressure hole (5).

5. The semiconductor conductivity testing apparatus according to claim 1, characterized in that: The number of connecting rods (26) is four, and one side of the connecting rod (26) is fixedly connected to the second ring body (27) by fasteners.

6. The semiconductor conductivity testing apparatus according to claim 1, characterized in that: The bottom of the upper sphere (11) and the top of the lower sphere (13) are both provided with slots.

7. The semiconductor conductivity testing apparatus according to claim 6, characterized in that: The first ring (12) is disposed between the upper sphere (11) and the lower sphere (13), and the top and bottom of the upper sphere (11) are provided with slide rails that slide with the slot.

8. The semiconductor conductivity testing apparatus according to claim 1, characterized in that: The negative charge markers (28) are evenly distributed along the circumference of the second ring (27), and the included angle between two adjacent negative charge markers (28) is equal.

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