A stimulator implant circuit board burn-in test fixture

Abstract

The utility model provides a kind of stimulator implant body circuit board aging test tool, it is related to aging test technical field, including stimulator implant body circuit board, fixture assembly, test adapter plate and bottom plate;Stimulator implant body circuit board is equipped with test hole site;Fixture assembly includes clamping mechanism, probe group and energy supply device, clamping assembly is used to clamp stimulator implant body circuit board, probe group is fixedly arranged on clamping mechanism and is matched with test hole site, and energy supply device is used to supply energy for stimulator implant body circuit board;Test adapter plate includes probe interface part, test circuit part and energy supply docking part;Bottom plate includes at least two installation sites and power supply interface group, each installation site is matched with fixture assembly, and power supply interface group is connected each test adapter plate.The utility model synchronously achieves the technical breakthrough of equipment miniaturization, high-throughput test and full-parameter real-time monitoring under the premise of ensuring zero physical damage in testing process.

Description

Technical Field

[0001] This utility model relates to the field of aging test technology, and more specifically, to an aging test fixture for a stimulator implant circuit board. Background Technology

[0002] In the field of implantable medical devices, long-term reliability verification of precision electronic components such as neurostimulators is crucial. Circuit board aging testing, as a core step in simulating long-term operating conditions, directly impacts the safety and effectiveness of the final product. Especially for stimulator implants used to treat nystagmus, the circuit boards need to operate stably in complex environments. Traditional testing methods typically rely on manual, piece-by-piece manipulation using individual fixtures. An external power supply powers the implant's circuit boards, periodically recording status parameters. However, this approach has significant limitations: firstly, the large size and high cost of the external power supply result in a bulky and cumbersome testing platform, making it difficult to support the parallel aging of multiple boards; secondly, the repeated disassembly and reassembly of the circuit boards during testing to observe internal changes is not only tedious and time-consuming, but also prone to damaging delicate interfaces due to frequent plugging and unplugging, further restricting testing efficiency and data reliability.

[0003] Based on the shortcomings of the existing technology, there is an urgent need for a aging test fixture for stimulator implant circuit boards. Utility Model Content

[0004] The purpose of this invention is to provide a aging test fixture for stimulator implant circuit boards to improve the aforementioned problems. To achieve this purpose, the technical solution adopted by this invention is as follows:

[0005] This application provides a fixture for aging testing of a stimulator implant circuit board, comprising: a stimulator implant circuit board, a clamping assembly, a test adapter plate, and a base plate; the stimulator implant circuit board has test holes; the clamping assembly includes a clamping mechanism, a probe group, and a power supply device, the clamping assembly is used to clamp the stimulator implant circuit board, the probe group is fixedly mounted on the clamping mechanism and matches the test holes, and the power supply device is used to supply power to the stimulator implant circuit board; the test adapter plate includes a probe interface section, a test circuit section, and a power supply docking section, the probe interface section is electrically connected to the probe group, the test circuit section is electrically connected to the test holes through the probe interface section, and the power supply docking section is electrically connected to the test holes and the power supply device respectively; the base plate includes at least two mounting positions and a power supply interface group, each mounting position matches the clamping assembly, and the power supply interface group connects to each of the power supply devices.

[0006] Furthermore, the clamping mechanism includes a fixed clamping arm, a movable clamping arm, and a probe mounting plate. The movable clamping arm is rotatably connected to the fixed clamping arm via a hinge shaft. The probe mounting plate is disposed at one end of the movable clamping arm and close to the test hole. The probe assembly penetrates vertically through the probe mounting plate.

[0007] Furthermore, the probe group includes eight cylindrical conductive probes, and the test holes are eight metallized through holes. The arrangement of all the test holes is mirror-symmetrical to the arrangement of the probe group, and the diameter of the through holes and the diameter of the probes form a clearance fit.

[0008] Furthermore, the power supply device is a transmission coil circuit board, which is fixedly mounted on the movable clamping arm.

[0009] Furthermore, the probe interface is provided with eight circular welding points, which are welded one-to-one with the ends of the eight probes of the probe group to form an electrical connection.

[0010] Furthermore, the test circuit includes a resistor and a test probe, both of which are electrically connected to the stimulator implant circuit board via the probe group.

[0011] Furthermore, the power supply docking part includes two solder joints, which are connected to the power output terminal of the power supply device, and the power supply docking part is electrically connected to the wireless power supply interface of the test port.

[0012] Furthermore, the mounting position is a groove structure, the size of each mounting position matches the outer contour of the fixed clamping arm, the fixed clamping arm is provided with bolt through holes, and the bottom of each mounting position is provided with threaded holes corresponding to the bolt through holes.

[0013] Furthermore, the mounting positions are arranged in an array on the surface of the base plate.

[0014] Furthermore, the power supply interface group includes an independent power supply interface and a main power supply interface, the same number as the number of installation positions. All the independent power supply interfaces and the main power supply interface are electrically connected. Each independent power supply interface is located on the side corresponding to the installation position. Each independent power supply interface is connected to the power supply input terminal of the power supply device via a wire.

[0015] The beneficial effects of this utility model are as follows:

[0016] This invention achieves precise positioning and non-contact power supply of the stimulator implant circuit board through a clamping assembly, integrates and processes multiple signals and transfers power supply through a test adapter board, and combines a multi-module parallel architecture on the base plate. Under the premise of ensuring zero physical damage during the testing process, it simultaneously achieves technological breakthroughs in equipment miniaturization, high-throughput testing and real-time monitoring of all parameters.

[0017] Other features and advantages of this invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing embodiments of the invention. The objects and other advantages of this invention can be realized and obtained by means of the structures particularly pointed out in the written description, claims, and drawings. Attached Figure Description

[0018] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of the aging test fixture for the stimulator implant circuit board described in this application;

[0020] Figure 2 This is a schematic diagram of the structure of the clamp assembly;

[0021] Figure 3 This is a schematic diagram of the structure of the base plate;

[0022] Figure 4 This is a schematic diagram of the structure of the test adapter board.

[0023] The diagram shows the following markings: 1. Stimulator implant circuit board; 2. Clamp assembly; 21. Clamping mechanism; 211. Fixed clamping arm; 212. Movable clamping arm; 213. Probe mounting plate; 22. Probe assembly; 23. Power supply device; 3. Test adapter plate; 31. Probe interface section; 32. Test circuit section; 321. Resistor; 322. Test probe; 33. Power supply docking section; 4. Base plate; 41. Mounting position; 42. Power supply interface group; 421. Independent power supply interface; 422. Main power supply interface. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. The components of the embodiments of this utility model described and shown in the accompanying drawings can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of this utility model provided in the accompanying drawings is not intended to limit the scope of the claimed utility model, but merely to illustrate selected embodiments of the utility model. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without inventive effort are within the scope of protection of this utility model.

[0025] It should be noted that similar reference numerals and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. Furthermore, in the description of this utility model, terms such as "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0026] like Figure 1 and Figure 3 As shown, this application provides a stimulator implant circuit board aging test fixture, including a stimulator implant circuit board 1, a clamping assembly 2, a test adapter plate 3, and a base plate 4. The stimulator implant circuit board 1 has test holes. The clamping assembly 2 includes a clamping mechanism 21, a probe group 22, and a power supply device 23. The clamping assembly is used to clamp the stimulator implant circuit board 1, fixing the circuit board with mechanical clamping force to eliminate the risk of displacement during the test. The clamping arm opening and closing design is compatible with circuit boards of different thicknesses, ensuring quick assembly and disassembly. The probe group 22 is fixedly mounted on the clamping mechanism 21 and matches the test holes, geometrically matching the circuit board holes to achieve lossless signal transmission. The power supply device 23 is fixedly mounted above the clamping mechanism 21 to supply power to the stimulator implant circuit board 1, simulating the normal working state of the implant, replacing the bulky external power supply device, and reducing the complexity of the fixture. The test adapter plate 3 includes a probe interface part 31, a test circuit part 32, and a power supply docking part 33. The probe interface part 31 is welded to the probe group 22 to form an electrical connection, and the probe signal is introduced into the adapter plate through welding. The test circuit section 32 is electrically connected to the test port via the probe interface section 31, meeting the requirements for monitoring four waveforms. The power supply docking section 33 is electrically connected to both the test port and the power supply device 23. The base plate 4 includes at least two mounting positions 41 and a power supply interface group 42. Each mounting position 41 matches the clamp assembly 2, enabling the one-time aging of multiple circuit boards. The power supply interface group 42 connects to each power supply device 23, providing individual power to each stimulator implant circuit board 1.

[0027] Preferably, such as Figure 2 As shown, the clamping mechanism 21 includes a fixed clamping arm 211, a movable clamping arm 212, and a probe mounting plate 213. The fixed clamping arm 211 serves as a reference support and is rigidly connected to the base plate 4 by bolts. The movable clamping arm 212 is rotatably connected to the fixed clamping arm 211 via a hinge shaft, and the hinge shaft has a built-in torsion spring that provides a self-resetting clamping force. The probe mounting plate 213 is located at one end of the movable clamping arm 212 and close to the test hole. The probe assembly 22 penetrates the probe mounting plate 213 vertically, ensuring coaxial alignment with the circuit board hole. The configuration of the probe mounting plate 213 provides a precise positioning reference for the probe assembly 22.

[0028] Preferably, the probe group 22 includes eight cylindrical conductive probes, and the test holes are eight metallized through-holes. The arrangement of all test holes is mirror-symmetrical to the arrangement of the probe group 22, and the diameter of the through-holes and the diameter of the probes form a clearance fit. This design ensures that the eight PIN signals of the implant circuit board can be reliably extracted by establishing an electrical signal transmission channel.

[0029] Preferably, the power supply device 23 is a transmission coil circuit board, which is fixedly mounted on the movable clamping arm 212. The transmission coil circuit board directly replaces the traditional external power supply, avoiding the use of a bulky and costly external power supply.

[0030] Preferably, the probe interface 31 is provided with eight circular welding points, which are welded one-to-one with the ends of the eight probes of the probe group 22 to form an electrical connection.

[0031] Preferably, such as Figure 4 As shown, the test circuit section 32 includes a resistor 321 and a test probe 322, both of which are electrically connected to the stimulator implant circuit board 1 via the probe group 22. The resistor 321 is used for signal conditioning and is connected in series in the signal path; the test probe 322 serves as an external monitoring interface, facilitating connection to devices such as oscilloscopes to achieve real-time waveform and impedance acquisition. These components are directly mounted on the surface of the test adapter board 3, with a compact layout to optimize space utilization, enabling waveform monitoring and impedance testing functions.

[0032] Preferably, the power supply connector 33 includes two solder joints connected to the power output terminal of the power supply device 23, and the power supply connector 33 is electrically connected to the wireless power supply interface of the test port. The solder joints are directly connected to the two PINs of the wireless power supply of the test port.

[0033] Preferably, such as Figure 3As shown, the mounting position 41 is a groove structure. To ensure the stability of the testing fixture and to maximize the use of the rectangular base plate area, the outer contour of the fixed clamping arm 211 in this embodiment is designed as a rectangle, and correspondingly, the mounting position 41 is a rectangular groove structure. The size of each mounting position 41 matches the outer contour of the fixed clamping arm 211. The fixed clamping arm 211 is provided with bolt through holes, and the bottom of each mounting position 41 is provided with threaded holes corresponding to the bolt through holes. The mounting position 41 serves as a modular load-bearing unit, providing precise positioning and vibration-proof support for the fixture assembly 2.

[0034] Preferably, there are fifteen mounting positions 41 arranged in a 5×3 rectangular array on the surface of the base plate 4.

[0035] Preferably, the power supply interface group 42 includes fifteen independent power supply interfaces 421 and one main power supply interface 422. The fifteen independent power supply interfaces 421 and the main power supply interface 422 are electrically connected. Each independent power supply interface 421 is located on the side of the corresponding mounting position 41, and each independent power supply interface 421 is connected to the power input terminal of the power supply device 23 via a wire. This design optimizes the space utilization of the base plate 4 and minimizes signal interference paths.

[0036] Based on the aforementioned aging test fixture for a stimulator implant circuit board, this application further discloses an aging test method for a stimulator implant circuit board 1, comprising:

[0037] This testing method uses a clamp assembly 2 to hold the stimulator implant circuit board 1, allowing the probe group 22 to match the test holes and form an electrical connection. Simultaneously, the power supply device 23 is fixed above the movable clamping arm 212 to simulate wireless power supply. The probe interface section 31 of the test adapter board 3 is welded with the probe group 22 to capture signals from the stimulator implant circuit board 1. The test circuit section 32 processes and monitors parameters through resistors 321 and test probes 322. The power supply docking section 33 connects the power supply device 23 and the wireless power supply PIN to form an energy closed loop. The base plate 4 uses 15 mounting positions 41 to support multiple clamp assemblies 2 and test adapter boards 3. The power supply interface group 42 supplies power to each power supply device 23 through independent interfaces. The overall interface integrated circuit enables parallel aging of multiple boards. During the process, four waveforms and impedance data can be acquired in real time through the test probes 322 without disassembly, ultimately achieving high-throughput, zero-damage accelerated aging verification. The above description is only a preferred embodiment of this utility model and is not intended to limit the utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of this utility model shall be included within the protection scope of this utility model.

[0038] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.

Claims

1. A fixture for aging test of a stimulator implant circuit board, characterized in that, include: Stimulator implant circuit board (1), wherein the stimulator implant circuit board (1) is provided with test holes; The clamp assembly (2) includes a clamping mechanism (21), a probe group (22), and a power supply device (23). The clamp assembly (2) is used to clamp the stimulator implant circuit board (1). The probe group (22) is fixedly mounted on the clamping mechanism (21) and matches the test hole position. The power supply device (23) is used to supply power to the stimulator implant circuit board (1). The test adapter board (3) includes a probe interface section (31), a test circuit section (32), and a power supply docking section (33). The probe interface section (31) is electrically connected to the probe group (22). The test circuit section (32) is electrically connected to the test hole through the probe interface section (31). The power supply docking section (33) is electrically connected to the test hole and the power supply device (23) respectively. The base plate (4) includes at least two mounting positions (41) and a power supply interface group (42), each mounting position (41) being matched with the clamp assembly (2), and the power supply interface group (42) being connected to each of the power supply devices (23).

2. The aging test fixture for the stimulator implant circuit board according to claim 1, characterized in that: The clamping mechanism (21) includes a fixed clamping arm (211), a movable clamping arm (212), and a probe mounting plate (213). The movable clamping arm (212) is rotatably connected to the fixed clamping arm (211) via a hinge shaft. The probe mounting plate (213) is disposed at one end of the movable clamping arm (212) and close to the test hole. The probe assembly (22) passes vertically through the probe mounting plate (213).

3. The aging test fixture for the stimulator implant circuit board according to claim 1, characterized in that: The probe group (22) includes eight cylindrical conductive probes. The test holes are eight metallized through holes. The arrangement of all the test holes is mirror-symmetrical to the arrangement of the probe group (22), and the diameter of the through holes and the diameter of the probes form a gap fit.

4. The aging test fixture for the stimulator implant circuit board according to claim 2, characterized in that: The power supply device (23) is a transmission coil circuit board, which is fixedly mounted on the movable clamping arm (212).

5. The aging test fixture for the stimulator implant circuit board according to claim 1, characterized in that: The probe interface (31) is provided with eight circular welding points, which are welded one by one to the ends of the eight probes of the probe group (22) to form an electrical connection.

6. The aging test fixture for stimulator implant circuit board according to claim 1, characterized in that: The test circuit section (32) includes a resistor (321) and a test probe (322), both of which are electrically connected to the stimulator implant circuit board (1) via the probe group (22).

7. The aging test fixture for stimulator implant circuit board according to claim 1, characterized in that: The power supply docking part (33) includes two solder joints, which are connected to the power output terminal of the power supply device (23), and the power supply docking part (33) is electrically connected to the wireless power supply interface of the test hole.

8. The aging test fixture for stimulator implant circuit board according to claim 2, characterized in that: The mounting position (41) is a groove structure. The size of each mounting position (41) matches the outer contour of the fixed clamping arm (211). The fixed clamping arm (211) is provided with bolt through holes. The bottom of each mounting position (41) is provided with threaded holes corresponding to the bolt through holes.

9. The aging test fixture for stimulator implant circuit board according to claim 8, characterized in that: The mounting positions (41) are arranged in an array on the surface of the base plate (4).

10. The aging test fixture for the stimulator implant circuit board according to claim 9, characterized in that: The power supply interface group (42) includes an independent power supply interface (421) with the same number as the mounting positions and a main power supply interface (422). All the independent power supply interfaces (421) and the main power supply interface (422) are electrically connected. Each independent power supply interface (421) is located on the side of the corresponding mounting position (41). Each independent power supply interface (421) is connected to the power supply input terminal of the power supply device (23) via a wire.

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