Transmission structure of a connector

Abstract

The utility model relates to a transmission structure of connector, including detachable connection's probe subassembly and adapter, the probe subassembly has the pin section of cooperation adapter, the adapter has the fish eye end of cooperation probe subassembly's insertion slot part and cooperation PCB board, the insertion slot part includes two symmetrical clamping plates, the clamping plate includes the convergence section, the apex and the flared section that form in proper order along the extension direction, along the extension direction, the interval between two convergence sections gradually reduces, two apexes contact and form the bundle mouth, the interval between two flared sections gradually expands and forms the flared mouth, the utility model discloses through the detachable connection design of probe subassembly and adapter, the cooperation of pin section and insertion slot part is decomposed to signal transmission path, not only convenient for quick replacement damaged component, still realizes dynamic contact through elastic clamping plate structure.

Description

Technical Field

[0001] This utility model belongs to the field of chip testing technology, and specifically relates to the transmission structure of connectors. Background Technology

[0002] In the field of electronic chip testing, connectors, as core components for signal transmission between the substrate and the PCB, directly affect the stability and cost of the testing process due to their contact reliability, assembly efficiency, and structural compatibility. Traditional connectors generally suffer from the limitation of rigid connections in their transmission structure.

[0003] Traditional solutions often use soldering or fixed pins to directly connect the substrate and the PCB. Mechanical stress can easily cause the contact points to break or loosen. Especially in high-frequency testing scenarios, even a small displacement can cause signal attenuation or noise interference. In addition, the soldering process requires specialized equipment and is irreversible. Replacing damaged parts requires complete disassembly, resulting in high maintenance costs. Utility Model Content

[0004] This utility model addresses the problems of the prior art by providing a transmission structure for a connector, the specific technical solution of which is as follows:

[0005] The connector's transmission structure, installed within the connector base, is used for signal transmission during chip testing, and includes detachable probe assemblies and adapters.

[0006] The probe assembly has a pin portion that mates with an adapter;

[0007] The adapter has a slot portion for mating with the probe assembly and a fisheye end for mating with the PCB board. The slot portion includes two symmetrically arranged clamping plates. The clamping plates include a converging segment, a vertex, and a flared segment formed sequentially along the extension direction. Along the extension direction, the distance between the two converging segments gradually decreases, the two vertices contact each other and form a converging opening, and the distance between the two flared segments gradually increases and forms a flared opening.

[0008] As a further technical solution of this utility model, the cross-section of the pin portion is polygonal to avoid relative rotation after insertion.

[0009] As a further technical solution of this utility model, the free end of the insert has a pointed tip, which can open the pore formed by the two vertices when inserted.

[0010] As a further technical solution of this utility model, the slot part includes a lap plate, and the two sides of the lap plate have rolled-up upright plates to form a U-shaped structure, and two clamping plates are respectively connected to the upright plates.

[0011] The beneficial effects of this utility model are as follows:

[0012] (1) In this application, there is a detachable elastic contact structure;

[0013] By using a detachable connection design between the probe assembly and the adapter, the signal transmission path is decomposed into the cooperation between the pin section and the slot section. This not only facilitates the quick replacement of damaged parts, but also achieves dynamic contact through the elastic clamping plate structure. For example, the clamping plate of the slot section adopts a Venturi tube-shaped design of "contraction section-apex-flaring section". When the pin section is inserted, the tip opens the contraction opening, and the clamping plate clamps the pin through elastic restoring force, forming an adaptive elastic electrical connection, which solves the defect of easy loosening of traditional rigid connection.

[0014] (2) Anti-rotation positioning and guidance optimization;

[0015] The probe section features a polygonal cross-section, effectively preventing relative rotation between the probe assembly and the adapter after insertion, ensuring precise alignment of the signal transmission path. Simultaneously, the pointed tip design of the free end of the probe section, in conjunction with the flared section of the slot, forms a natural guiding structure, reducing alignment difficulty during manual insertion and improving assembly efficiency.

[0016] (3) Modular adaptation and convenient installation;

[0017] The fisheye end design at the tail of the adapter replaces the traditional soldering process, allowing direct insertion into the mounting holes on the PCB board. Combined with the U-shaped structure of the slot, it enables "plug-and-play" modular installation. This design not only simplifies the PCB board connection process but also facilitates adaptation to different test interfaces, significantly improving the device's versatility and maintainability. Attached Figure Description

[0018] Figure 1 A schematic diagram of the overall structure of the connector's transmission structure is shown;

[0019] Figure 2 A schematic diagram of the probe assembly is shown.

[0020] Figure 3 A schematic diagram of the adapter structure is shown;

[0021] Figure 4 A schematic diagram of the slot section is shown.

[0022] Legend:

[0023] 100, Probe assembly; 110, Insertion pin section; 111, Tip; 200, Adapter; 210, Slot section; 211, Overlap plate; 212, Stand plate; 213, Clamping plate; 213a, Converging section; 213b, Vertex; 213c, Flaring section; 220, Fisheye end. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments.

[0025] Figure 1 A schematic diagram of the overall structure of the connector's transmission structure is shown; Figure 2 A schematic diagram of the probe assembly 100 is shown; Figure 3 A schematic diagram of the adapter 200 is shown; Figure 4 A schematic diagram of the slot section 210 is shown.

[0026] Figure 1 The transmission structure of the connector is installed inside the connector base for signal transmission during chip testing. It includes a detachable probe assembly 100 and an adapter 200. The adapter 200, together with the probe assembly 100, forms a new transmission structure, which facilitates the insertion of the tail end into the PCB board, changes the traditional soldering method, and improves connection efficiency.

[0027] Figure 2 In the probe assembly 100, the connecting end of the adapter 200 has a pin portion 110. The pin portion 110 has a polygonal cross-section and a pointed tip 111 at its free end. The polygonal design of the pin portion 110 can prevent relative rotation after insertion. At the same time, the pointed tip 111 can facilitate insertion.

[0028] Figure 3 In the middle, the adapter 200 has a slot portion 210 that mates with the probe assembly 100 and a fisheye end 220 that mates with the PCB board; the slot portion 210 is used to realize the connection with the probe assembly 100, so that the tail of the entire transmission structure becomes the fisheye end 220, which facilitates the connection between the transmission structure and the PCB board.

[0029] Figure 4 In the middle, the slot portion 210 includes a lap plate 211, and the two sides of the lap plate 211 have rolled-up upright plates 212 to form a U-shaped structure; the U-shaped structure formed by the lap plate 211 and the upright plates 212 can form an inner space to accommodate the pin portion 110, thereby restricting the position of the pin portion 110, and the lap plate 211 serves as the lap surface of the pin portion 110, directly contacting the pin portion 110.

[0030] Both upright plates 212 have clamping plates 213 facing the probe assembly 100. The clamping plates 213 include a converging section 213a, a vertex 213b, and a flared section 213c formed sequentially along the extension direction. Along the extension direction, the distance between the two converging sections 213a gradually decreases, the two vertex 213b come into contact, and the distance between the two flared sections 213c gradually increases and forms a flare. That is, the two clamping plates 213 form a Venturi tube structure on the horizontal projection plane, with a converging part for clamping the insertion pin 110 to form a stable contact.

[0031] Installation steps of probe assembly 100 and adapter 200: Insert the pin part 110 of probe assembly 100 into the slot part 210 of adapter 200. The tip 111 of pin part 110 is pre-fitted with the flared section 213c to form a guide docking. As pin part 110 is further inserted, tip 111 pushes open the apex 213b to form the constriction and inserts into the inner space of the U-shaped structure. At this time, the inward restoring force of the two clamping plates 213 can clamp pin part 110 to ensure stable contact.

[0032] The above embodiments are only used to illustrate the technical solution of this utility model, and are not intended to limit it.

Claims

1. A connector transmission structure, installed within a connector base, for signal transmission during chip testing, characterized in that: Includes a detachably connected probe assembly (100) and an adapter (200); The probe assembly (100) has a pin portion (110) that mates with the adapter (200); The adapter (200) has a slot (210) for mating with the probe assembly (100) and a fisheye end (220) for mating with the PCB board. The slot (210) includes two symmetrically arranged clamps (213). The clamps (213) include a converging section (213a), a vertex (213b), and a flared section (213c) formed sequentially along the extension direction. Along the extension direction, the distance between the two converging sections (213a) gradually decreases, the two vertexes (213b) contact each other and form a converging opening, and the distance between the two flared sections (213c) gradually increases and forms a flared opening.

2. The transmission structure of the connector according to claim 1, characterized in that: The cross-section of the pin portion (110) is polygonal to avoid relative rotation after insertion.

3. The transmission structure of the connector according to claim 2, characterized in that: The free end of the insert (110) has a tip (111) that can open the opening formed by the two vertices (213b) when inserted.

4. The transmission structure of the connector according to claim 3, characterized in that: The slot portion (210) includes a lap plate (211), the lap plate (211) having rolled-up upright plates (212) on both sides to form a U-shaped structure, and two clamping plates (213) respectively connected to the upright plates (212).

Images