High and low temperature airflow circulating impact machine

Abstract

The utility model belongs to the technical field of circulating impact machine, specifically is a high and low temperature airflow circulating impact machine, including high temperature box, through the cooperation of reciprocating mechanism and first heat insulating plate, can carry out the switching of low temperature and high temperature fast, it is convenient to simulate instantaneous temperature impact scene, improves test efficiency, rotates the limit piece, and the part of replacement board removes from high temperature box, places the electronic components to be detected to replacement board, pushes back replacement board in high temperature box, and limit piece falls automatically and carries out rotation limit to sealing plate, and the electronic components carry out high temperature test in high temperature box first, and start electric telescopic link and pass through second heat insulating plate and push the placement board removal, and replacement board enters low temperature box, and the electronic components carry out low temperature test, and start electric telescopic link and pass through second heat insulating plate and push the placement board removal, and replacement board returns to high temperature box, and carries out high temperature test again, and this circulation, instantaneous temperature impact test is carried out to the electronic components.

Description

Technical Field

[0001] This utility model belongs to the technical field of circulating impact machines, specifically a high and low temperature airflow circulating impact machine. Background Technology

[0002] The high and low temperature airflow circulation impact tester is a professional equipment used for reliability testing of electronic components, integrated circuits and other products. It achieves rapid temperature switching through high-speed airflow to simulate the impact of extreme temperature environments on material properties.

[0003] Traditional high and low temperature test chambers use an overall temperature control method, which is inefficient. Temperature conversion depends on the overall heating and cooling of the chamber. Switching from the lowest temperature to the highest temperature usually takes more than 10 minutes, which cannot simulate instantaneous temperature shock scenarios. Therefore, a high and low temperature airflow circulation shock machine is proposed to address the above problems. Utility Model Content

[0004] To overcome the shortcomings of existing technologies, a high and low temperature airflow circulation impact machine is proposed.

[0005] The technical solution adopted by this utility model to solve its technical problem is as follows: The high and low temperature airflow circulation impact machine of this utility model includes a high temperature box; a low temperature box is fixedly connected to one side of the high temperature box through a connecting box, a first heat insulation plate is slidably connected inside the connecting box, a replacement port is opened on one side of the high temperature box, a sealing plate is rotatably connected to one side of the high temperature box through a hinge, and a limit block is rotatably connected to one side of the high temperature box through a rotating shaft. The high-temperature chamber is equipped with a reciprocating mechanism, which includes an electric telescopic rod fixedly connected to one side of the high-temperature chamber. A through hole is provided on the side of the high-temperature chamber near the electric telescopic rod. The output end of the electric telescopic rod passes through the through hole and is fixedly connected to a second heat insulation plate. A placement plate is fixedly connected to the other end of the second heat insulation plate. A replacement plate is slidably connected to the top of the placement plate. The other end of the placement plate extends into the connecting box and is fixedly connected to a first heat insulation plate. Through the cooperation of the reciprocating mechanism and the first heat insulation plate, the switching between low temperature and high temperature can be performed quickly, which is convenient for simulating instantaneous temperature shock scenarios and improving testing efficiency.

[0006] Preferably, the inner wall of the high-temperature chamber is rotatably connected to a first auxiliary roller via a rotating shaft, and the inner wall of the low-temperature chamber is rotatably connected to a second auxiliary roller via a rotating shaft. The arrangement of the first and second auxiliary rollers can assist the movement of the first and second heat insulation plates and reduce the resistance to their movement.

[0007] Preferably, the inner wall of the high-temperature chamber is elastically connected to a push-out plate by a spring, and a limit frame is fixedly connected to one side of the high-temperature chamber. The push-out plate and spring facilitate the automatic ejection of the replacement plate when the sealing plate is opened, avoiding the need to repeatedly open and close the chamber door when changing samples, which can cause fluctuations in ambient temperature and require temperature re-stabilization, affecting the continuity of testing. The limit frame also limits the ejection distance of the replacement plate, preventing it from detaching from the high-temperature chamber.

[0008] Preferably, a fixing plate is fixedly connected to the inner wall of the high-temperature chamber, and a fitting groove adapted to the ejector plate is opened on one side of the fixing plate. The fixing plate and the fitting groove can facilitate the shielding and limiting of the ejector plate and the spring.

[0009] Preferably, the first heat insulation plate is fixedly connected to the second heat insulation plate by a limiting rod. There are two limiting rods, and the two limiting rods are symmetrically distributed. The setting of two limiting rods can facilitate the movement and positioning of the replacement plate when it is in the high temperature plate.

[0010] Preferably, a first observation port is provided on one side of the high-temperature chamber, and a second observation port is provided on one side of the low-temperature chamber. A transparent quartz glass is fixedly connected to the inner wall of the first observation port, and a transparent quartz glass is fixedly connected to the inner wall of the second observation port. With the setting of the first observation port, the second observation port and the transparent quartz glass, it is convenient to observe the chip sample in the high-temperature chamber and the low-temperature chamber at any time.

[0011] Preferably, the outer wall of the first heat insulation board is provided with a sealing gasket to improve the sealing performance, and the outer wall of the second heat insulation board is provided with a sealing gasket to improve the sealing performance.

[0012] The beneficial effects of this utility model are: This invention provides a high and low temperature airflow circulation impact tester. Through the cooperation of a reciprocating mechanism and a first heat insulation plate, it can quickly switch between low and high temperatures, facilitating the simulation of instantaneous temperature shock scenarios and improving testing efficiency. The limit block rotates, and the replacement plate is partially removed from the high-temperature chamber. The electronic component to be tested is placed on the replacement plate, and the replacement plate is pushed back into the high-temperature chamber. The limit block automatically falls and rotates the sealing plate to limit its movement. The electronic component first undergoes a high-temperature test in the high-temperature chamber. Then, the electric telescopic rod is activated, pushing the placement plate through the second heat insulation plate, and the replacement plate enters the low-temperature chamber for a low-temperature test. The electric telescopic rod is then activated again, pushing the placement plate through the second heat insulation plate, and the replacement plate returns to the high-temperature chamber for another high-temperature test. This cycle is repeated to perform instantaneous temperature shock tests on the electronic component. Attached Figure Description

[0013] The accompanying drawings, which are included to provide a further understanding of the present invention and form part of this application, illustrate exemplary embodiments of the present invention and, together with the description thereof, serve to explain the present invention and do not constitute an undue limitation thereof. In the drawings: Figure 1 This is a perspective view of the present invention; Figure 2 This is a cross-sectional structural diagram of the high-temperature chamber and the low-temperature chamber of this utility model; Figure 3 This is one of the exploded structural diagrams of the high-temperature chamber, low-temperature chamber, and connecting box in this utility model; Figure 4 This is the second exploded structural diagram of the high-temperature chamber, low-temperature chamber, and connecting box in this utility model.

[0014] Legend: 1. High-temperature chamber; 2. Low-temperature chamber; 3. Connecting box; 4. First heat insulation plate; 5. Sealing plate; 6. Limiting block; 7. Reciprocating mechanism; 71. Electric telescopic rod; 72. Through hole; 73. Replacement plate; 74. Placement plate; 75. Second heat insulation plate; 8. First auxiliary roller; 9. Second auxiliary roller; 10. Spring; 11. Limiting frame; 12. Fixing plate; 13. Limiting rod; 14. First observation port; 15. Second observation port; 16. Push-out plate. Detailed Implementation

[0015] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0016] Specific implementation examples are given below.

[0017] Please see Figures 1-4 This utility model provides a high and low temperature airflow circulation impact machine, including a rectangular high temperature box 1; a rectangular low temperature box 2 is fixedly connected to one side of the high temperature box 1 through a rectangular connecting box 3, wherein the opposite sides of the high temperature box 1 and the low temperature box 2 are provided with through slots, and one side of the low temperature box 2 is provided with a through slot of the same size as the through slot. It should be noted that the above structures combined constitute the high and low temperature airflow circulation impact machine in the prior art, which performs high temperature testing on the sample in the high temperature chamber 1 and low temperature testing on the sample in the low temperature chamber 2. A first observation port 14 is provided on one side of the high temperature chamber 1, and a second observation port 15 is provided on one side of the low temperature chamber 2. A transparent quartz glass is fixedly connected to the inner wall of the first observation port 14, and a transparent quartz glass is fixedly connected to the inner wall of the second observation port 15. The first observation port 14, the second observation port 15 and the transparent quartz glass make it easy to observe the chip sample in the high temperature chamber 1 and the low temperature chamber 2 at any time. For example, in high-temperature testing, an external fan is connected to the air inlet of high-temperature chamber 1 via a hose and to a spray plate inside the high-temperature chamber. The spray plate is equipped with nozzles. The fan pressurizes the 225°C hot air generated by the heater. The pressurized hot air flows through the nozzles and vertically impacts the chip surface. The real-time temperature curve shows that the heating rate reaches 150°C in about 8 seconds. A low-temperature test was then conducted, in which the high-temperature valve was closed and the liquid nitrogen / refrigerant passage installed on the low-temperature chamber 2 was opened. The switching was completed within 10 seconds, with -80°C cold air replacing the high-temperature gas, and frost formation on the chip surface was visually monitored. Then switch back to high-temperature testing and repeat this cycle. Note that airflow coverage verification is required: temperature uniformity calibration must be performed before the first test. Attach thermocouples to different positions on the sample and confirm that the temperature difference is < ±2℃. Reference standard: MIL-STD-883 Method 1010.9.

[0018] Condensation prevention: Before low-temperature testing, turn on the equipment in pre-cooling and dehumidification mode and run it at -40℃ without load for 30 minutes to prevent the sample from freezing; The above-mentioned heating and cooling technologies are all existing and mature technologies, so they will not be described in detail and are not shown in the diagram. A first heat insulation plate 4 is slidably connected inside the connecting box 3. A sealing gasket is provided on the outer wall of the first heat insulation plate 4 to improve the sealing performance. The first heat insulation plate 4 can facilitate the sealing of the connecting box 3 when the chip sample moves into the positioning slot. A replacement port is provided on one side of the high temperature chamber 1. A sealing plate 5 is rotatably connected to one side of the high temperature chamber 1 via a hinge. A limit block 6 is rotatably connected to one side of the high temperature chamber 1 via a rotating shaft. The chip sample is replaced through the replacement port. The replacement port is blocked and sealed by the sealing plate 5. The sealing plate 5 is rotated and limited by the limit block 6. A reciprocating mechanism 7 is provided on the high temperature chamber 1. The reciprocating mechanism 7 includes an electric telescopic rod 71 fixedly connected to one side of the high temperature chamber 1. A through hole 72 is opened on the side of the high temperature chamber 1 near the electric telescopic rod 71. The output end of the electric telescopic rod 71 passes through the through hole 72 and is fixedly connected to a second heat insulation plate 75. A sealing gasket is provided on the outer wall of the second heat insulation plate 75 to improve the sealing performance. The other end of the second heat insulation plate 75 is fixedly connected to the placement plate 74, the top of the placement plate 74 is slidably connected to the replacement plate 73, and the other end of the placement plate 74 extends into the connection box 3 and is fixedly connected to the first heat insulation plate 4. The reciprocating mechanism 7 and the first heat insulation plate 4 work together to quickly switch between low and high temperatures, which is convenient for simulating instantaneous temperature shock scenarios and improving testing efficiency.

[0019] The inner wall of the high-temperature chamber 1 is rotatably connected to a first auxiliary roller 8 via a rotating shaft, and the inner wall of the low-temperature chamber 2 is rotatably connected to a second auxiliary roller 9 via a rotating shaft. The first auxiliary roller 8 and the second auxiliary roller 9 can assist the movement of the first heat insulation plate 4 and the second heat insulation plate 75, reducing the resistance to their movement.

[0020] The inner wall of the high temperature chamber 1 is elastically connected to the push plate 16 by the spring 10, and the limit frame 11 is fixedly connected to one side of the high temperature chamber 1. By setting the ejector plate 16 and spring 10, the replacement plate 73 can be automatically ejected when the sealing plate 5 is opened. The outer wall of the replacement plate 73 is equipped with a sealing gasket, which seals the replacement port by itself. This avoids the need to repeatedly open and close the chamber door when changing samples, which would cause the ambient temperature to fluctuate and require temperature re-stabilization, affecting the continuity of the test. The limit frame 11 limits the ejection distance of the replacement plate 73 to prevent the replacement plate 73 from falling out of the high-temperature chamber 1.

[0021] A fixing plate 12 is fixedly connected to the inner wall of the high temperature chamber 1. A fitting groove adapted to the ejector plate 16 is opened on one side of the fixing plate 12. The fixing plate 12 and the fitting groove can be used to cover and limit the ejector plate 16 and the spring 10.

[0022] The first heat insulation plate 4 is fixedly connected to the second heat insulation plate 75 by a limiting rod 13. There are two limiting rods 13, and the two limiting rods 13 are symmetrically distributed. The setting of the two limiting rods 13 makes it easy to move and position the replacement plate 73 when it is in a high temperature plate.

[0023] Based on the above structure, the present invention includes the following implementation process: In the initial state, the second heat insulation plate 75 should be inside the connecting box 3. The connecting box 3 is sealed by the second heat insulation plate 75 to prevent the air in the high temperature box 1 and the low temperature box 2 from circulating randomly. The high temperature box 1 and the low temperature box 2 are started, so that the high temperature box 1 is in a continuous high temperature and the low temperature box 2 is in a continuous low temperature. Rotating the limit block 6 causes the ejector plate 16 to move under the pressure of the spring 10, pushing the replacement plate 73 to move. This removes part of the replacement plate 73 from the high-temperature chamber 1, allowing the electronic components to be tested, such as chips and optical modules, to be placed inside. Place it on the replacement board 73 and fix it in place. The specific fixing and placement methods are all existing mature technologies, so they will not be described in detail. Then, wearing heat-resistant gloves, manually push the replacement plate 73 back into the high-temperature chamber 1, while applying pressure to the push plate to push it back into the fixing groove of the fixing plate 12, rotate the flipped sealing plate 5 back into the replacement port, and release the rotation of the limiting block 6. The limiting block 6 automatically falls and limits the rotation of the sealing plate 5. The electric telescopic rod 71 is controlled by the second heat insulation plate 75 to drive the first heat insulation plate 4, the placement plate 74 and the replacement plate 73 to move back and forth at a time. It should be noted that the electric telescopic rod 71 is powered by an external power source, and the controller and timer for the timed reciprocating motion are existing mature technologies that are compatible with the electric telescopic rod 71, so they will not be described in detail or shown in the figure. The electronic components are first tested at high temperature in high temperature chamber 1. Then, the electric telescopic rod 71 is activated. The electric telescopic rod 71 pushes the placement plate 74 to move through the second heat insulation plate 75, so that the first heat insulation plate 4, the placement plate 74 and the replacement plate 73 enter the low temperature chamber 2, so that the electronic components are tested at low temperature. At the same time, the second heat insulation plate 75 enters the connection box 3 to seal the connection box 3, so that the high temperature air in the high temperature chamber 1 will not enter the low temperature chamber 2 during the low temperature test. Then, the electric telescopic rod 71 is activated to push the placement plate 74 to move through the second heat insulation plate 75, so that the second heat insulation plate 75, the placement plate 74 and the replacement plate 73 return to the high temperature chamber 1, and the high temperature test is carried out again. This cycle is repeated to carry out instantaneous temperature shock test on electronic components. After the test is completed, rotate the limit block 6, and push the ejector plate 16 under the pressure of the spring 10 and push the replacement plate 73 to move, so that part of the replacement plate 73 is moved out of the high temperature chamber 1 to replace the electronic components.

[0024] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claimed utility model.

Claims

1. A high and low temperature airflow circulation impactor, characterized by: Includes a high temperature chamber (1); a low temperature chamber (2) is fixedly connected to one side of the high temperature chamber (1) via a connecting box (3), a first heat insulation plate (4) is slidably connected inside the connecting box (3), a replacement port is opened on one side of the high temperature chamber (1), a sealing plate (5) is rotatably connected to one side of the high temperature chamber (1) via a hinge, and a limit block (6) is rotatably connected to one side of the high temperature chamber (1) via a rotating shaft. The high-temperature chamber (1) is provided with a reciprocating mechanism (7). The reciprocating mechanism (7) includes an electric telescopic rod (71) fixedly connected to one side of the high-temperature chamber (1). A through hole (72) is provided on one side of the high-temperature chamber (1) near the electric telescopic rod (71). The output end of the electric telescopic rod (71) passes through the through hole (72) and is fixedly connected to a second heat insulation plate (75). The other end of the second heat insulation plate (75) is fixedly connected to a placement plate (74). A replacement plate (73) is slidably connected to the top of the placement plate (74). The other end of the placement plate (74) extends into the connecting box (3) and is fixedly connected to the first heat insulation plate (4).

2. The high and low temperature airflow circulation impact machine according to claim 1, characterized in that: The inner wall of the high temperature chamber (1) is rotatably connected to a first auxiliary roller (8) via a rotating shaft, and the inner wall of the low temperature chamber (2) is rotatably connected to a second auxiliary roller (9) via a rotating shaft.

3. The high and low temperature airflow circulation impact machine according to claim 2, characterized in that: The inner wall of the high temperature chamber (1) is elastically connected to a push plate (16) by a spring (10), and a limit frame (11) is fixedly connected to one side of the high temperature chamber (1).

4. The high and low temperature airflow circulation impact machine according to claim 3, characterized in that: The inner wall of the high temperature chamber (1) is fixedly connected to a fixing plate (12), and one side of the fixing plate (12) is provided with a fitting groove that is compatible with the ejector plate.

5. A high and low temperature airflow circulation impact machine according to claim 4, characterized in that: The first heat insulation plate (4) is fixedly connected to the second heat insulation plate (75) by a limiting rod (13). There are two limiting rods (13), and the two limiting rods (13) are symmetrically distributed.

6. A high and low temperature airflow circulation impact machine according to claim 5, characterized in that: The high-temperature chamber (1) has a first observation port (14) on one side, and the low-temperature chamber (2) has a second observation port (15) on one side. The inner wall of the first observation port (14) is fixedly connected with transparent quartz glass, and the inner wall of the second observation port (15) is fixedly connected with transparent quartz glass.

7. A high and low temperature airflow circulation impact machine according to claim 6, characterized in that: The outer wall of the first heat insulation plate (4) is provided with a sealing gasket, and the outer wall of the second heat insulation plate (75) is provided with a sealing gasket.

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