An assembled array test pin holder

Abstract

This utility model discloses an assembled array test probe holder, characterized by: a probe holder base plate and a probe holder panel. The probe holder base plate has an integral rectangular frame with snap-fit ​​openings on both sides. A protruding retaining plate is fixed in the center of the snap-fit ​​opening, and an integral retaining rib is provided on the upper inner side of the protruding retaining plate. The probe holder panel has notches on both sides, and protruding ribs are fixed on both sides of the probe holder panel at the notches. The rectangular frame is snapped together with the protruding ribs of the probe holder panel through the protruding retaining plates. The upper surface of the probe holder panel has multiple pin holes arranged in an array for mounting probes. This utility model allows for quick installation and removal of the probe holder panel by snapping together the probe holder base plate and the protruding ribs, facilitating replacement in case of damage. It is also adaptable to chip testing with different array spacings, offering high compatibility, ease of use, and improved testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of chip testing equipment technology, and more specifically, to an assembled array test pin holder. Background Technology

[0002] With the development of science and technology, electronic chips have been widely used in various electronic products.

[0003] After mass production of chips is completed, the chips need to be tested for conformity in order to select out unqualified chips and retain qualified chips. The current test socket mainly includes the lower test socket body, test probes and lower test socket probe holding plate to complete the testing of pin array chips.

[0004] Most current test pin sockets are integrated structures, which have low compatibility. During batch testing, the test pin panel will continuously contact the chip pins, and the pin holes are easily damaged, resulting in a short service life. The entire test pin socket needs to be replaced, which increases the testing cost and also affects the testing efficiency. Utility Model Content

[0005] The purpose of this invention is to provide an assembly-type array test probe holder that is easy to install and disassemble and has high compatibility.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is as follows: an assembled array test probe holder, characterized in that: it includes a probe holder base plate and a probe holder panel. The probe holder base plate is provided with an integral rectangular frame. Both sides of the rectangular frame are provided with snap-fit ​​openings. A protruding snap-fit ​​plate is fixed in the middle of the snap-fit ​​opening. An integral snap-fit ​​rib is provided at the upper inner side of the protruding snap-fit ​​plate. Both sides of the probe holder panel are provided with notches and grooves. Protruding ribs are fixed at the notches and grooves on both sides of the probe holder panel. The rectangular frame is snap-fitted to the protruding ribs of the probe holder panel through the protruding snap-fit ​​plates. The upper surface of the probe holder panel is provided with multiple pin holes in an array. The pin holes are used to install probes.

[0007] Preferably, an integral top buckle plate is fixedly provided at the center of one side of the pin seat panel, and a protruding block is fixedly provided at the center of the outer side of the top buckle plate.

[0008] Preferably, a pair of guide blocks are fixedly provided on both sides of the needle seat panel.

[0009] Preferably, the pinholes are arranged in a 22x14 array with a spacing of 0.8mm on the pin holder panel.

[0010] Preferably, the pinholes are spaced 1mm apart and arranged in a 17x11 array on the pin holder panel.

[0011] Preferably, positioning grooves are provided at the center of both sides of the needle base plate.

[0012] Preferably, the upper surface of the needle base plate is provided with multiple weight-reducing grooves evenly distributed around the needle hole.

[0013] Compared with the prior art, the advantages of this utility model are: The pin holder base plate and pin holder panel of this utility model are connected by a protruding clip plate and a protruding rib plate, which enables quick installation and disassembly of the pin holder panel, facilitating replacement if damaged. At the same time, it can adapt to chip testing with different array spacing, has high compatibility, is convenient and quick to use, and improves testing efficiency. Attached Figure Description

[0014] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 This is a perspective view of an assembled array test probe holder according to the present invention; Figure 2 This is a cross-sectional view of an assembled array test pin holder according to the present invention; Figure 3 This is a top view of an assembled array test pin holder according to this utility model.

[0016] In the diagram: 1. Needle base plate; 11. Positioning groove; 2. Needle base panel; 21. Needle hole; 22. Top buckle plate; 23. Notch groove; 24. Guide block; 3. Rectangular frame; 31. Protruding rib plate; 32. Buckle opening; 33. Protruding clamping plate; 34. Weight reduction groove. Detailed Implementation

[0017] The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the scope of protection of the present invention.

[0018] See Figures 1-3As shown, this utility model provides an assembled array test probe holder, including a probe holder base plate 1 and a probe holder panel 2. It is produced by injection molding and has high compatibility. The probe holder base plate 1 is provided with an integral rectangular frame 3. Both sides of the rectangular frame 3 are provided with snap-fit ​​openings 32. A protruding retaining plate 33 is fixed in the middle of the snap-fit ​​opening 32. An integral retaining rib is provided at the upper inner side of the protruding retaining plate 33. Both sides of the probe holder panel 3 are provided with notches 23. Protruding ribs 31 are fixed at the notches 23 on both sides of the probe holder panel 3. The rectangular frame 3 is snapped to the protruding ribs 31 of the probe holder panel 3 through the protruding retaining plate 33. The upper surface of the probe holder panel 2 is provided with a plurality of pin holes 21 in an array. The pin holes 21 are used to install probes.

[0019] Furthermore, to facilitate the installation and removal of the needle seat panel 2 by the staff, in this embodiment, a top buckle plate 22 with an integral structure is fixedly provided at the middle position of one side of the needle seat panel 2, and a protruding block is fixedly provided at the middle position of the outer side of the top buckle plate 22. The staff can remove the needle seat panel 2 from the needle seat base plate 1 through the top buckle plate 22.

[0020] Furthermore, in order to ensure that the pin header panel 2 can accurately match the position of the chip pressing mechanism, in this embodiment, a pair of guide blocks 24 are fixedly provided on both sides of the pin header panel 2.

[0021] In this embodiment, the pinholes 21 are arranged in a 22x14 array with a spacing of 0.8mm on the pin seat panel 2.

[0022] In this embodiment, the pinholes 21 are arranged in a 17x11 array with a spacing of 1mm on the pin seat panel 2.

[0023] Furthermore, in order to improve the installation accuracy of the needle base plate 1, in this embodiment, positioning grooves 11 are provided at the middle positions of both sides of the needle base plate 1.

[0024] Furthermore, in order to reduce the material required for manufacturing the needle base plate 1, in this embodiment, a plurality of weight-reducing grooves 34 are evenly opened on the upper surface of the needle base plate 1 around the needle hole 21, thereby reducing manufacturing costs.

[0025] The specific operating steps are as follows: First, obtain the spacing between the contacts of the chip under test. Find the test row on the pin header panel 2 that roughly corresponds to the spacing. Then, insert the probe into the pin hole 21 on the test row. The contacts of the chip can be electrically connected one-to-one with the probes fixed on the pin header panel 2. It is suitable for 22x14 array chips with a spacing of 0.8mm and chips with a spacing of 1mm in a 17x11 array.

[0026] Although embodiments of the present invention have been described in conjunction with the accompanying drawings, the patent owner may make various modifications or alterations within the scope of the appended claims, as long as they do not exceed the protection scope described in the claims of the present invention, they shall all be within the protection scope of the present invention.

Claims

1. An assembled array test probe holder, characterized in that: The device includes a needle base plate and a needle base panel. The needle base plate has an integral rectangular frame with snap-fit ​​openings on both sides. A protruding retaining plate is fixed in the center of the snap-fit ​​opening, and an integral retaining rib is provided at the upper inner side of the protruding retaining plate. The needle base panel has notches on both sides, and protruding ribs are fixed at the notches on both sides. The rectangular frame is snapped to the protruding ribs of the needle base panel through the protruding retaining plate. The upper surface of the needle base panel has multiple pin holes arranged in an array for installing probes. An integral top buckle plate is fixedly provided at the center of one side of the pin seat panel, and a protruding block is fixedly provided at the center of the outer side of the top buckle plate.

2. The assembled array test probe holder according to claim 1, characterized in that: A pair of guide blocks are fixed on both sides of the needle seat panel.

3. The assembled array test probe holder according to claim 1, characterized in that: The pinholes are arranged in a 22x14 array with a spacing of 0.8mm on the pin base panel.

4. The assembled array test probe holder according to claim 1, characterized in that: The pinholes are spaced 1mm apart and arranged in a 17x11 array on the pin holder panel.

5. The assembled array test probe holder according to claim 1, characterized in that: Positioning grooves are provided at the center of both sides of the needle base plate.

6. The assembled array test probe holder according to claim 1, characterized in that: The upper surface of the needle base plate has multiple weight-reducing grooves evenly distributed around the needle hole.

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