A ballast lamp anti-electric shock testing device

Abstract

This utility model relates to the technical field of electric shock protection testing devices, and particularly to a bulb electric shock protection testing device. It facilitates quick and easy installation and testing of bulbs, improving the speed and convenience of testing whether a bulb is electric shock resistant. Its structure includes a housing, a probe module, and an electric shock protection testing module. The probe module is electrically connected to the electric shock protection testing module. The housing has a lamp fixing structure, which includes a lamp positioning plate, a first slide rail, a second slide rail, and a lamp fixing plate. The lamp positioning plate is slidably connected to the first and second slide rails on both sides. The lamp positioning plate has a mounting groove with a power-conducting spring, which is electrically connected to the electric shock protection testing module. The sliding direction of the lamp positioning plate faces the probe module. This improves the installation speed during bulb testing, enabling rapid installation and testing of bulbs, and significantly enhances the speed and convenience of testing whether a bulb is electric shock resistant. This utility model has strong practicality.

Description

Technical Field

[0001] This utility model relates to the technical field of electric shock protection testing devices, and in particular to an electric shock protection testing device for a bulb lamp. Background Technology

[0002] The bulb lamp electric shock protection testing device is a specialized piece of equipment used in R&D or quality inspection processes to test the electric shock protection safety of lamps. It simulates scenarios where a human body comes into contact with easily accessible parts of the lamp to evaluate its electric shock protection performance. During testing, the device checks whether each component of the lamp meets safety requirements, ensuring that users cannot come into contact with live parts under normal use or fault conditions. It is a key testing device for ensuring the electrical safety of bulb lamps.

[0003] However, in existing technologies, there is still a method where operators use handheld test pens to contact and test the exposed metal parts of the lamps one by one. When there are many lamps or the structure is complex, the efficiency is greatly reduced, and problems such as missed detections and false detections may occur due to human error. At the same time, although some testing equipment has achieved automated testing, it generally suffers from the defect of complex structural design. This not only increases the difficulty of learning and using the equipment for operators, making the daily testing operation process cumbersome, but also causes great inconvenience to maintenance when the equipment malfunctions. Utility Model Content

[0004] The main purpose of this utility model is to provide a bulb lamp anti-electric shock testing device, which facilitates quick and easy fixing and testing of bulb lamps, and improves the speed and convenience of testing whether a bulb lamp is anti-electric shock.

[0005] The technical solution of this utility model is as follows:

[0006] A bulb lamp anti-electric shock testing device includes a housing, a probe module, and an anti-electric shock testing module, wherein the probe module is electrically connected to the anti-electric shock testing module, and the housing is provided with a lamp fixing structure.

[0007] The lamp fixing structure includes a lamp positioning plate, a first slide rail, a second slide rail, and a lamp fixing plate. The lamp positioning plate is slidably connected to the first slide rail and the second slide rail on both sides. The lamp positioning plate is provided with a mounting groove, and the mounting groove is provided with an energized spring. The energized spring is electrically connected to the anti-electric shock test module. The sliding direction of the lamp positioning plate is towards the probe module.

[0008] In one possible implementation, the probe module is provided in two sets and is respectively located on both sides of the housing. The probe module includes a first test plate and a plurality of first spring probes. The first test plate is fixedly connected to the housing, and each of the first spring probes is arranged sequentially on the side of the first test plate facing the lamp positioning plate.

[0009] In one possible implementation, the lamp fixing structure further includes several support rods respectively disposed at the four corners of the lamp positioning plate, and the lamp fixing plate is slidably connected to each of the support rods.

[0010] In one possible implementation, the probe module includes a second test plate and a plurality of second spring probes disposed on the second test plate. The second test plate is located on the side of the housing facing the lamp positioning plate and towards itself, and the second spring probes are disposed on the side of the second test plate facing the lamp positioning plate.

[0011] Each of the first test plates has a sliding groove on both sides in the vertical direction, and the first slide rail and the second slide rail are slidably connected to each sliding groove.

[0012] In one possible implementation, the lamp positioning plate is provided with a lateral displacement structure;

[0013] The lateral displacement structure includes a lead screw, a sliding guide rod, a nut seat, and a driver for driving the lead screw to rotate. The sliding guide rod passes through the lamp positioning plate and is slidably connected to the lamp positioning plate. Both ends of the sliding guide rod are fixedly connected to the first test plate. The nut seat is located on the side of the lamp positioning plate away from the sliding guide rod. The nut seat is threadedly connected to the lead screw. The lead screw is parallel to the direction of movement of the lamp positioning plate toward the first test plate.

[0014] In one possible implementation, the lamp fixing structure further includes several support rods respectively disposed at the four corners of the lamp positioning plate. The lamp fixing plate is slidably connected to each of the support rods. A driver mounting bracket is provided on the side of the lamp fixing plate away from the housing. The driver mounting bracket is provided with a linear driver. The output shaft of the linear driver is connected to the lamp fixing plate.

[0015] In one possible implementation, the probe module includes a second test plate located on the side of the housing away from the ground, a second spring probe disposed on the side of the second test plate facing the lamp positioning plate, and a lifting driver for driving the second test plate to move toward the lamp positioning plate. The second test plate is slidably connected to the inner wall of the housing, and the output shaft of the lifting driver is detachably connected to the side of the second test plate away from the lamp positioning plate.

[0016] In one possible implementation, the longitudinal section of the inner wall of the mounting groove is an arc-shaped structure.

[0017] In one possible implementation, the inner wall of the mounting groove is provided with anti-slip texture, which is a linear structure.

[0018] The beneficial effects of this utility model are as follows:

[0019] This embodiment achieves stable lamp clamping through a sliding lamp fixing structure or the cooperation of a lead screw and driver. Combined with a multi-directionally adjustable spring probe array, it can contact multiple test points on the bulb lamp, enabling precise detection via an anti-electric shock test module. It allows for quick operation without tools, supports batch testing, and features elastic contact to compensate for errors, anti-slip and wear-resistant properties, and stable temperature resistance, significantly improving the accuracy, efficiency, and safety of the test. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of the structure of Example 1;

[0022] Figure 2 This is a schematic diagram of the structure of Example 1;

[0023] Figure 3 This is a cross-sectional view of Example 1;

[0024] Figure 4 This is a partial enlarged view of the mounting groove in Example 1;

[0025] Figure 5 This is a schematic diagram of the structure of the electric shock protection test module in Example 1;

[0026] Figure 6 This is a schematic diagram of the structure of Example 2;

[0027] Figure 7 This is a cross-sectional view of Example 2;

[0028] Figure 8 This is a schematic diagram of the structure of Example 2.

[0029] Explanation of icon numbers:

[0030] 1. Housing; 2. Lamp fixing structure; 21. Lamp positioning plate; 211. Mounting groove; 212. Anti-slip texture; 213. Power-conducting spring; 22. First slide rail; 23. Second slide rail; 24. Lamp fixing plate; 241. Driver mounting bracket; 242. Linear driver; 25. Support rod; 3. Probe module; 31. First test board; 32. First spring probe; 35. Second test board; 36. Second spring probe; 37. Lifting driver; 4. Anti-electric shock test module; 5. Lateral displacement structure; 51. Lead screw; 52. Sliding light rod; 53. Driver; 54. Nut seat.

[0031] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0032] The technical solutions of this utility model will be clearly and completely described below with reference to the embodiments of this utility model. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this utility model.

[0033] Example 1

[0034] like Figures 1-5 As shown, this embodiment proposes a bulb lamp anti-electric shock testing device, whose structure includes a housing 1, a probe module 3, and an anti-electric shock testing module 4. The probe module 3 and the anti-electric shock testing module 4 are electrically connected. This electrical connection enables signal transmission and power transfer between the two, allowing data transmission after the probe module 3 contacts the lamp under test to be transmitted to the anti-electric shock testing module 4. This is a necessary connection condition for realizing the anti-electric shock testing function. The housing 1 provides the installation foundation and protection for this embodiment. The probe module 3 is the test execution component that directly contacts the lamp. The anti-electric shock testing module 4 is the core functional module of this embodiment, enabling this embodiment to have the basic functions of physical support, test execution, and anti-electric shock detection.

[0035] The housing 1 is provided with a lamp fixing structure 2, which includes a lamp positioning plate 21, a first slide rail 22, a second slide rail 23, and a lamp fixing plate 24. The lamp positioning plate 21 is slidably connected to the first slide rail 22 and the second slide rail 23 on both sides. The sliding connection allows the lamp positioning plate 21 to move along the first slide rail 22 and the second slide rail 23, thereby adjusting its lateral position. This allows the side of the lamp to contact the probe module 3 through the lamp positioning plate 21. At the same time, the smoothness of the sliding connection reduces the resistance during adjustment and facilitates quick positioning.

[0036] The sliding direction of the lamp positioning plate 21 is towards the probe module 3. The lamp positioning plate 21 can move relative to the probe module 3 through the first slide rail 22 and the second slide rail 23, thereby testing the electric shock protection of each test point on the side of the lamp.

[0037] The lamp positioning plate 21 has a mounting slot 211, providing an installation position for the lamp and achieving initial fixation. Simultaneously, the mounting slot 211 contains a conductive spring 213, which is electrically connected to the anti-electric shock test module 4. When a bulb is placed, its bulb portion snaps into the mounting slot 211, and the power contacts of the lamp holder contact the conductive spring 213, thus putting the lamp in a conductive state. This design allows the lamp to connect to the anti-electric shock test module 4 via the conductive spring 213, achieving the closure of the test circuit. This not only provides basic power to the mounting slot 211 but also ensures circuit continuity during testing.

[0038] In this embodiment, the longitudinal section of the mounting groove 211 is an arc-shaped structure. Its arc-shaped structure can form a mutual fit with the curved surface (usually spherical or ellipsoidal) of the lamp being tested. Compared with a flat or right-angled groove, it greatly increases the contact area. It can not only enhance the lateral limiting effect on the bulb part through the interlocking of the curved surface, but also make the weight of the bulb part evenly distributed on the arc surface of the groove, reducing the possibility of bulb shell deformation caused by local stress concentration.

[0039] In this embodiment, the mounting groove 211 is provided with anti-slip texture 212. The anti-slip texture 212 increases the friction between the inner wall of the mounting groove 211 and the surface of the bulb, reducing the sliding of the lamp within the mounting groove 211. Especially in this embodiment, it can reduce the displacement of the lamp due to inertia during movement, enhancing the fixing effect. The anti-slip texture 212 is a linear structure, which is easy to process and can be evenly distributed on the inner wall of the mounting groove 211, avoiding stress concentration caused by excessively dense texture in some areas. This ensures the consistency of the anti-slip effect without affecting the fit between the mounting groove 211 and the bulb, further improving the stability of the bulb fixation.

[0040] The bulb lamp tested in this embodiment is usually axially symmetrical in shape, mainly spherical. Its arc structure fits into the mounting groove 211, and the bulb part can be inserted into the mounting groove 211. The part of the lamp head with the power contact naturally contacts the power contact spring 213 below the mounting groove 211, so that it remains powered during the test.

[0041] In this embodiment, the lamp fixing structure 2 also includes support rods 25. Several support rods 25 are respectively located at the four corners of the lamp positioning plate 21, ensuring structural stability. The lamp fixing plate 24 is slidably connected to each support rod 25, allowing the lamp fixing plate 24 to move longitudinally between the support rods 25. The placement of the support rods 25 at the four corners ensures stability during movement. After the lamp is placed in the mounting slot 211, the lamp fixing plate 24 slides downwards, allowing it to directly act on the top of the lamp, achieving vertical clamping of the lamp. This, combined with the lateral clamping of the mounting slot 211, further improves the stability of the lamp after fixing. Furthermore, it eliminates the need for complex locking components such as bolts and clips, greatly simplifying the clamping process for lamp testing.

[0042] The support rod 25 is traversed by the sliding groove, so that when placing the lamp fixture, the lamp fixture mounting plate 24 can be removed along the sliding groove. After the lamp fixture is placed, the lamp fixture mounting plate 24 can be installed. This eliminates the need to hold the lamp fixture mounting plate 24 with one hand and place the lamp fixture with the other, thus improving the convenience of lamp installation.

[0043] The support rod 25 is equipped with a handle for easy sliding of the lamp positioning plate 21, providing the inspection personnel with a point of leverage for sliding the lamp positioning plate 21, making the operation more convenient.

[0044] In this embodiment, the lamp fixing plate 24 is preferably made of silicone with a Shore hardness of 50-60. Its advantage lies in its moderate elasticity; when the lamp fixing plate 24 moves downwards to clamp the top of the lamp, it can conform to the curved surface of the lamp through its own deformation. Furthermore, the molecular structure of silicone has good energy absorption capacity, and the inertial impact force during downward movement can be well absorbed by the material. Moreover, the lamp may generate heat during testing; silicone can withstand a temperature range of -40℃ to 200℃, and its smooth surface is not easily worn by the lamp housing, maintaining stable clamping performance even after long-term use.

[0045] In this embodiment, two probe modules 3 are provided, respectively located at both ends of the housing 1. The probe module 3 includes a first test plate 31 and a first spring probe 32. The first test plate 31 provides a stable mounting carrier for the first spring probe 32, which is a test element that directly contacts the lamp. Together, they form a test execution unit, laying the structural foundation for subsequent contact and testing of the lamp and transmission of test signals. Several first spring probes 32 are provided and arranged sequentially on the first test plate 31, allowing each first spring probe 32 to simultaneously contact different parts of the lamp (such as multiple contacts in the lamp head, exposed metal parts of the lamp body, etc.), achieving multi-position synchronous testing, covering more electric shock detection points, and improving the comprehensiveness of the test. Simultaneously, the arrangement design facilitates the placement of probes according to the structural rules of the lamp, adapting to the standardized structure of the lamp.

[0046] In this embodiment, the first spring probe 32 in the first row from top to bottom mainly tests the electric shock protection performance of the bulb part of the lamp. The first spring probe 32 in the second row mainly tests the electric shock protection performance of the connection between the bulb and the lamp holder. The first spring probe 32 in the third row mainly tests the electric shock protection performance of the metal part of the lamp holder. During the testing process, the three rows of first spring probes 32 can test the lamp simultaneously.

[0047] The first test plate 31 is fixedly connected to the housing 1 to ensure the stability of the installation of the first test plate 31, reduce the possibility of the first spring probe 32 deviating from the contact point of the lamp due to the shaking of the first test plate 31 during the test, and reduce test errors. The first spring probe 32 is located on the side of the first test plate 31 facing the lamp positioning plate 21. When the lamp positioning plate 21 approaches the first test plate 31, the first spring probe 32 can accurately contact the test part of the lamp, reduce contact deviation, and improve the accuracy of the test.

[0048] In this embodiment, there are several mounting slots 211, which are arranged in two rows on the lamp positioning plate 21. This allows for the simultaneous installation and positioning of multiple lamps under test. The testing personnel can move the operating handle of the operating support rod 25 to achieve lateral displacement of the lamp positioning plate 21, so that the first spring probes 32 on both sides can contact the side of the lamp under test. This design enables the testing of multiple lamps to be completed in one operation, which greatly shortens the total time of batch testing and improves the testing efficiency.

[0049] In this embodiment, the probe module 3 includes a second test plate 35 and a plurality of second spring probes 36 disposed on the second test plate 35. The second test plate 35 is located on the side of the housing 1 facing the lamp positioning plate 21. The second spring probes 36 are disposed on the side of the second test plate 35 facing the lamp positioning plate 21. The second test plate 35 is provided with a plurality of second spring probes 36 for detecting the detection points at the bottom of the lamp. The second spring probes 36 can be adjusted and added or removed according to actual needs. The extra second spring probes 36 can be used for second test plates 35 of different specifications.

[0050] Each first test plate 31 has vertical sliding grooves on both sides. The first slide rail 22 and the second slide rail 23 are slidably connected to the sliding grooves, realizing the longitudinal movement of the lamp positioning plate 21. The longitudinal height of the lamp positioning plate 21 can be adjusted according to actual testing needs. In addition, the first slide rail 22 and the second slide rail 23 are equipped with handles for easy sliding operation. The testing personnel can manually push the sliding grooves to move longitudinally without the need for additional tools, simplifying the sliding operation process and improving the convenience of operation.

[0051] When the lamp positioning plate 21 slides longitudinally towards the second test plate 35 through each sliding groove, the second spring probe 36 can accurately align with the test point of the lamp (such as the lamp holder or exposed metal parts). The elastic deformation of the second spring probe 36 compensates for installation errors, ensuring that the second spring probe 36 remains in close contact with the test point, avoiding data distortion due to poor contact and improving test accuracy. Furthermore, using a spring-loaded probe protects the bulb from damage during testing, and the elastic contact also reduces hard friction between the probe and the test point, lowering the risk of wear on the lamp's metal parts.

[0052] The operation process in this embodiment is as follows:

[0053] 1. Place the bulb into the mounting groove 211 of the lamp positioning plate 21, ensuring that the bulb portion fits snugly against the arc-shaped structure of the mounting groove 211, while simultaneously ensuring that the power contacts on the lamp head are in contact with the energizing spring 213. After the initial lamp placement is completed, insert the lamp fixing plate 24 into the sliding groove of the support rod 25 and slide the lamp fixing plate 24 downwards. Once the lamp fixing plate 24 comes into contact with the lamp being tested, the longitudinal and lateral clamping of the lamp is complete.

[0054] 2. After clamping the lamp, turn on the switch of the anti-electric shock test module 4. At this time, the anti-electric shock test module 4 supplies power to the energized spring 213, forming a test circuit, and the lamp is in the energized state.

[0055] 3. Operate the operating handles on the first slide rail 22 and the second slide rail 23 to drive the lamp positioning plate 21 to move longitudinally along each sliding groove, so that the detection points at the bottom of the lamp (such as the lamp head and exposed metal parts) are in contact with the second spring probe 36. The second spring probe 36 transmits the detection data to the electric shock protection test module 4. The operator records the data of each detection point according to the test results analyzed and fed back by the electric shock protection test module 4, and completes the electric shock protection test at the bottom of each row of lamps and the screening of unqualified products.

[0056] 4. Operate the operating handle on the support rod 25 to move the lamp positioning plate 21 laterally along the first slide rail 22 and the second slide rail 23, so that the detection points on the side of the lamp (such as exposed metal parts, bulbs, and the connection between the lamp holder and the bulb) all contact the first spring probe 32. After completing the detection of the first row of lamps, operate the handle on the support rod 25 again to move the lamp positioning plate 21 laterally to the first spring probe 32 at the other end, so that the detection points on the side of the second row of lamps all contact the first spring probe 32. The first spring probe 32 transmits the monitoring data to the electric shock protection test module 4. The operator records the data of each detection point according to the test results analyzed and fed back by the electric shock protection test module 4, and completes the electric shock protection test of the bottom of each row of lamps and the screening of unqualified products.

[0057] 5. After completing the test, turn off the power to the electric shock protection test module 4 to stop supplying power to the lamps. Slide the lamp fixing plate 24 upwards and remove it. Then separate the lamps that fail the electric shock protection test from the qualified lamps.

[0058] Example 2

[0059] like Figures 6-8As shown, based on Embodiment 1, the lamp positioning plate 21 in this embodiment is provided with a lateral displacement structure 5. The lateral displacement structure 5 includes a lead screw 51, a sliding light rod 52, a driver 53, and a nut seat 54. The lead screw 51 is responsible for power transmission and motion conversion, the sliding light rod 52 is responsible for guidance, the driver 53 provides power, and the nut seat 54 realizes the transmission of force, realizing the automated detection of this embodiment, while ensuring the stability, controllability and effectiveness of the transmission process as a whole.

[0060] The sliding rod 52 passes through the lamp positioning plate 21 and is slidably connected to it, allowing the lamp positioning plate 21 to slide axially along the sliding rod 52 and also serving as a guide. Both ends of the sliding rod 52 are fixedly connected to the first test plate 31, forming a stable rigid support structure and preventing the lamp positioning plate 21 from shifting or tilting during movement. The nut seat 54 is located on the side of the lamp positioning plate 21 away from the sliding rod 52, avoiding interference with the lamp and improving structural compactness. The nut seat 54 is threadedly connected to the lead screw 51, converting the rotational motion of the lead screw 51 into the linear motion of the nut seat 54, thereby driving the lamp positioning plate 21 to move laterally along the sliding rod 52.

[0061] One end of the lead screw 51 is connected to the output shaft of the driver 53 via a coupling. The driver 53 provides a power source for the lead screw 51, realizing automated drive of the transmission process. Compared with manual adjustment, the driver 53 can precisely control the speed and direction of the lead screw 51, thereby precisely controlling the moving speed, direction and distance of the lamp positioning plate 21, greatly improving adjustment accuracy and efficiency. It is also easy to realize programmed control through an electronic control system, adapting to the needs of automated testing. Bearings and bearing seats are provided at both ends of the lead screw 51 where it connects to the first test plate 31. This not only reduces the friction when the lead screw 51 rotates, making the rotation of the lead screw 51 smoother, but also reduces the load on the driver 53 and the wear of its components, extending its service life.

[0062] In this embodiment, the lamp fixing structure 2 also includes several support rods 25 respectively located at the four corners of the lamp positioning plate 21, forming a symmetrically distributed multi-point support structure to provide balanced support force for the lamp fixing plate 24. The lamp fixing plate 24 is slidably connected to each support rod 25. A driver mounting bracket 241 is provided on the side of the lamp fixing plate 24 away from the housing 1, providing an independent mounting carrier for the subsequent linear driver 242. The driver mounting bracket 241 is equipped with a linear driver 242, and the output shaft of the linear driver 242 is connected to the lamp fixing plate 24. When the linear driver 242 rotates, it completes the lifting and lowering of the lamp fixing plate 24, thereby providing longitudinal clamping for the lamp.

[0063] In this embodiment, the probe module 3 also includes a second test plate 35 located on the side of the housing 1 away from the ground, a second spring probe 36 located on the side of the second test plate 35 facing the lamp positioning plate 21, and a lifting driver 37 for driving the second test plate 35 to move toward the lamp positioning plate 21. The above structure can realize the test of the anti-electric shock test point at the bottom of the lamp without adjusting the vertical height. The anti-electric shock test at the bottom of the lamp can be completed by simply lifting driver 37 driving the second test plate 35.

[0064] The second test plate 35 is slidably connected to the inner wall of the housing 1. The inner wall of the housing 1 provides a sliding guide for the second test plate 35, restricting its movement to the vertical direction only. This prevents the second test plate 35 from shifting or wobbling during lifting and lowering, ensuring the positional accuracy of the second spring probe 36 in contact with the lamp. The output shaft of the lifting driver 37 is detachably connected to the side of the second test plate 35 away from the lamp positioning plate 21. The lifting driver 37 can not only lift and lower the second test plate 35, but its detachable design also allows for quick replacement and maintenance of the probe module 3.

[0065] In this embodiment, each driver can preferably be a servo motor. Its advantage lies in the fact that the servo motor can achieve high-precision control, ensuring that the lamp positioning plate 21 and the second spring probe 36 are accurately connected. At the same time, its millisecond-level start and stop response can quickly complete the action switching, improve the detection efficiency, and can be seamlessly connected with the whole machine's electronic control system to achieve continuous action closed-loop control. In addition, the built-in fault diagnosis module reduces the risk of equipment damage, and the operation is stable and energy consumption is low, which can reduce mechanical wear and energy waste, thus improving the detection efficiency and reliability of this embodiment.

[0066] The operation process in this embodiment is as follows:

[0067] 1. The operator operates the corresponding button to drive the linear driver 242 to raise the lamp fixing plate 24 to the top. The operator then places the bulbs to be tested into the mounting slot 211 in sequence, ensuring that the lamp head is in contact with the energized spring 213. After placement, the linear driver 242 receives the descent control signal from the operator, causing the lamp fixing plate 24 to clamp the lamps downwards. At this point, the longitudinal and lateral clamping of the lamps is completed.

[0068] 2. After the lamp is fixed, the controller of the device automatically turns on the power of the anti-electric shock test module 4. At this time, the anti-electric shock test module 4 supplies power to the energized spring 213, forming a test circuit, and the lamp is in the energized state.

[0069] 3. After power is applied, the lifting driver 37 automatically rises, driving the second test plate 35 to move upward along the sliding guide rail on the inner wall of the housing 1, so that the second spring probe 36 contacts the test point at the bottom of the lamp. The second spring probe 36 transmits the collected information to the electric shock protection test module 4.

[0070] After the test is completed, the lifting driver 37 automatically descends, driving the second test plate 35 to move downward along the sliding guide rail on the inner wall of the housing 1 and return to the inside of the housing 1.

[0071] 4. After the lifting driver 37 automatically descends, the driver 53 begins to rotate. The lead screw 51 rotates, driving the lamp positioning plate 21 to move laterally. This ensures that the detection points on the side of the lamp (such as exposed metal parts, bulbs, and the connection between the lamp holder and the bulb) all contact the first spring probe 32. After completing the detection of one side of the lamp, the driver 53 is restarted, driving the lamp positioning plate 21 to move laterally to the first spring probe 32 on the other end, so that the detection points on the other side of the lamp all contact the first spring probe 32. At this point, the electric shock protection detection of the lamp is completed.

[0072] 5. After the test is completed, the driver 53 drives the lamp positioning plate 21 to reset, and the linear driver 242 drives the lamp fixing plate 24 to rise, and then automatically turns off the switch of the anti-electric shock test module 4, at which time the lamp is powered off.

[0073] 6. Based on the test results analyzed and fed back by the electric shock protection test module 4, the staff will separate the unqualified lamps from the qualified lamps.

[0074] In the accompanying drawings of this embodiment, the same or similar reference numerals correspond to the same or similar components. In the description of this application, it should be understood that if terms such as "upper," "lower," "left," and "right" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, they are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms used to describe positional relationships in the accompanying drawings are only for illustrative purposes and should not be construed as limiting this patent. For those skilled in the art, the specific meaning of the above terms can be understood according to the specific circumstances.

[0075] The above are merely preferred embodiments of this application and are not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A ballast lamp anti-touch test device, comprising a shell (1), a probe module (3), an anti-touch test module (4), the probe module (3) is electrically connected with the anti-touch test module (4), characterized in that, The housing (1) is provided with a lamp fixing structure (2); The lamp fixing structure (2) includes a lamp positioning plate (21), a first slide rail (22), a second slide rail (23), and a lamp fixing plate (24). The lamp positioning plate (21) is slidably connected to the first slide rail (22) and the second slide rail (23) on both sides respectively. The lamp positioning plate (21) is provided with a mounting groove (211). The mounting groove (211) is provided with an energized spring (213). The energized spring (213) is electrically connected to the anti-electric shock test module (4). The sliding direction of the lamp positioning plate (21) is towards the probe module (3).

2. The shock prevention test device for a ballast lamp according to claim 1, wherein The probe module (3) is provided in two sets and is respectively located on both sides of the housing (1). The probe module (3) includes a first test plate (31) and a number of first spring probes (32). The first test plate (31) is fixedly connected to the housing (1), and each of the first spring probes (32) is arranged sequentially on the side of the first test plate (31) facing the lamp positioning plate (21).

3. The shock prevention test device for a ballast lamp according to claim 2, wherein The lamp fixing structure (2) also includes several support rods (25) respectively located at the four corners of the lamp positioning plate (21), and the lamp fixing plate (24) is slidably connected to each of the support rods (25).

4. The shock prevention test device for a ballast lamp according to claim 3, wherein The probe module (3) includes a second test plate (35) and a plurality of second spring probes (36) disposed on the second test plate (35). The second test plate (35) is located on the side of the housing (1) facing the lamp positioning plate (21) and the second spring probes (36) are disposed on the side of the second test plate (35) facing the lamp positioning plate (21). Each of the first test plates (31) has a sliding groove on both sides in the vertical direction, and the first slide rail (22) and the second slide rail (23) are slidably connected to each sliding groove.

5. The shock prevention test device for a ballast lamp according to claim 2, wherein The lamp positioning plate (21) is provided with a lateral displacement structure (5); The lateral displacement structure (5) includes a lead screw (51), a sliding rod (52), a nut seat (54), and a driver (53) for driving the lead screw (51) to rotate. The sliding rod (52) passes through the lamp positioning plate (21) and is slidably connected to the lamp positioning plate (21). Both ends of the sliding rod (52) are fixedly connected to the first test plate (31). The nut seat (54) is located on the side of the lamp positioning plate (21) away from the sliding rod (52). The nut seat (54) is threadedly connected to the lead screw (51). The lead screw (51) is parallel to the direction of movement of the lamp positioning plate (21) toward the first test plate (31).

6. The shock prevention test device for a ballast lamp according to claim 5, wherein The lamp fixing structure (2) also includes several support rods (25) respectively located at the four corners of the lamp positioning plate (21). The lamp fixing plate (24) is slidably connected to each of the support rods (25). The lamp fixing plate (24) is provided with a driver mounting bracket (241) on the side away from the housing (1). The driver mounting bracket (241) is provided with a linear driver (242). The output shaft of the linear driver (242) is connected to the lamp fixing plate (24).

7. The shock prevention test device for a ballast lamp according to claim 6, wherein The probe module (3) includes a second test plate (35) located on the side of the housing (1) away from the ground, a second spring probe (36) located on the side of the second test plate (35) facing the lamp positioning plate (21), and a lifting driver (37) for driving the second test plate (35) to move towards the lamp positioning plate (21). The second test plate (35) is slidably connected to the inner wall of the housing (1), and the output shaft of the lifting driver (37) is detachably connected to the side of the second test plate (35) away from the lamp positioning plate (21).

8. The shock-free test device for a ballast lamp according to claim 4, wherein The longitudinal section of the inner wall of the mounting groove (211) is an arc-shaped structure.

9. The bulb lamp anti-electric shock testing device according to claim 8, characterized in that, The inner wall of the mounting groove (211) is provided with anti-slip texture (212), and the anti-slip texture (212) is a linear structure.

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