A radio frequency test assembly
Patent Information
- Application Number
- CN202521866711.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-29
- Publication Date
- 2026-09-15
- Estimated Expiration
- 2035-08-29
AI Technical Summary
[0003]现有的测试夹具中,射频测试线路内置于测试夹具中,在测试不同型号参数的射频芯片时,需要更换内部的射频测试线路,要把整个夹具拆开后,才能更换内部的射频测试线路,对于后期维护和测试性能指标统一配置的效率上存在影响
[0020] The RF test component designed in this application is a single-port RF tester. The test interface becomes an independent test component, which can directly and elastically contact the device under test (DUT) for testing, or be adapted to existing test fixtures and installed in the test fixtures to connect with the DUT for testing, making the testing method simpler and more flexible.
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Figure CN224758574U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip testing technology, and in particular to a radio frequency testing component. Background Technology
[0002] In chip testing, especially in RF chip testing, the contact between the RF pads and the test system needs to be non-destructive and reliable to ensure the stability and consistency of signal transmission.
[0003] In existing test fixtures, the RF test circuitry is built into the fixture. When testing RF chips with different parameters, the internal RF test circuitry needs to be replaced. The entire fixture must be disassembled before the internal RF test circuitry can be replaced, which affects the efficiency of later maintenance and the unified configuration of test performance indicators. Utility Model Content
[0004] The purpose of this invention is to address the shortcomings of existing technologies by proposing a radio frequency testing component.
[0005] To achieve the above objectives, the present invention adopts the following technical solution: an radio frequency test component, comprising:
[0006] Test cables;
[0007] A test interface is provided on one side of the test cable;
[0008] RF testing is performed directly by making elastic contact with the device under test (DUT) through the test interface; or...
[0009] The test cable and the test interface are set inside the test fixture to perform radio frequency testing on the device under test.
[0010] As a further description of the above technical solution: the test interface includes a first housing and a second housing, one end of the second housing is sleeved on the outside of the first housing, forming a receiving cavity with the first housing.
[0011] As a further description of the above technical solution: a first insulator is provided on the side of the first housing away from the second housing.
[0012] As a further description of the above technical solution: an elastic probe is also provided on the inner side of the first housing, one end of the elastic probe is inserted into the inner side of the first insulator and extends to the outer side of the first insulator and the first housing.
[0013] As a further description of the above technical solution: a second insulator is provided on the inner side of the second housing, and the outer diameter of the second insulator is adapted to the inner diameter of the second housing.
[0014] As a further description of the above technical solution: one end face of the second insulator abuts against the end face of the first housing, thereby limiting the position of the first housing.
[0015] As a further description of the above technical solution: a first inner conductor is provided on the inner side of the second insulator, and one end of the first inner conductor extends out of the second insulator and into the inner side of the first housing.
[0016] As a further description of the above technical solution: the two end faces of the first inner conductor are respectively provided with a first socket and a second socket. The first socket is close to one end of the elastic probe and has several slots opened in the circumferential direction for insertion into the elastic probe; the second socket is connected to the test cable.
[0017] As a further description of the above technical solution: a third insulator is also provided on the inner side of the second housing, and the end face of the third insulator abuts against the end face of the second insulator and the first inner conductor away from the first housing, thereby limiting the second insulator and the first inner conductor.
[0018] As a further description of the above technical solution: the test cable includes a protective layer, a fourth insulator, and a second inner conductor, which are sequentially inserted from the outside to the inside. The test cable extends into the inside of the second housing. The outer diameter of the protective layer is adapted to the inner diameter of the second housing. The second inner conductor is inserted into the inside of the second socket for electrical connection.
[0019] The above technical solution has the following advantages or beneficial effects:
[0020] The RF test component designed in this application is a single-port RF tester. The test interface becomes an independent test component, which can directly and elastically contact the device under test (DUT) for testing, or be adapted to existing test fixtures and installed in the test fixtures to connect with the DUT for testing, making the testing method simpler and more flexible. Attached Figure Description
[0021] Figure 1 This is a perspective view of the radio frequency test assembly proposed in this utility model;
[0022] Figure 2 This is a schematic diagram showing the connection between the radio frequency test component and the adapter proposed in this utility model;
[0023] Figure 3 This is a cross-sectional view of the connection between the radio frequency test component and the adapter proposed in this utility model;
[0024] Figure 4 This is an exploded view of the radio frequency test component proposed in this utility model;
[0025] Figure 5This is a cross-sectional view of the radio frequency test assembly proposed in this utility model;
[0026] Figure 6 This is an assembly diagram of the radio frequency test assembly and test fixture proposed in this utility model;
[0027] Figure 7 for Figure 6 A magnified view of a portion of point A in the middle.
[0028] Legend:
[0029] 1. Test cable; 11. Protective layer; 12. Fourth insulator; 13. Second inner conductor; 2. Test interface; 21. First housing; 22. Second housing; 23. First insulator; 24. Elastic probe; 25. Second insulator; 26. First inner conductor; 261. First socket; 262. Second socket; 27. Third insulator; 3. Test fixture; 31. Base; 32. Cover plate. Detailed Implementation
[0030] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0031] Reference Figures 1-5 One embodiment of this utility model is a radio frequency (RF) test assembly, comprising: a test cable 1; a test interface 2 is provided on one side of the test cable 1; the test interface 2 is in elastic contact with the device under test (DUT) for direct RF testing; or, the test cable 1 and the test interface 2 are disposed in a test fixture 3 for RF testing of the DUT.
[0032] In this embodiment, test cable 1 is connected to test interface 2 to form an RF test assembly. The other end of test cable 1 is connected to an RF port to form a single-port RF test. Test interface 2 becomes an independent test component that can directly and elastically contact the device under test (DUT) for testing. The DUT can be an adapter that connects to an RF chip, allowing for direct RF testing, or it can be adapted to an existing test fixture. The RF test assembly is installed in the test fixture, and the DUT is an RF chip. After the RF chip is placed in the test fixture and clamped and limited, the RF test assembly is connected to the DUT for testing. The testing method is simpler and more flexible.
[0033] Furthermore, to facilitate matching and alignment with the adapter, a matching threaded hole is provided on the second housing 22 of the test interface 2 for connection with the adapter (e.g., Figures 1-3When the second housing 22 is set inside the test fixture 3, it is configured to conform to the shape of the coaxial cable inside the test fixture 3 (e.g., ...). Figures 4-5 ).
[0034] The test interface 2 includes a first housing 21 and a second housing 22. One end of the second housing 22 is sleeved on the outside of the first housing 21, forming a receiving cavity with the first housing 21.
[0035] In this embodiment, the first housing 21 and the second housing 22 are nested together. The second housing 22 is fitted onto the outside of the first housing 21. The inner wall of the second housing 22 engages with the outer wall of the first housing 21, limiting their relative displacement and forming precise axial and radial positioning to prevent components from becoming loose or shifting. This protects internal components and shields against electromagnetic interference. When maintenance or replacement is required, the first housing 21 and the second housing 22 can be separated to directly disassemble and replace the components within the cavity.
[0036] A first insulator 23 is provided on the side of the first housing 21 away from the second housing 22; an elastic probe 24 is also provided on the inner side of the first housing 21, one end of the elastic probe 24 is inserted into the inner side of the first insulator 23 and extends to the outer side of the first insulator 23 and the first housing 21.
[0037] In this embodiment, the first insulator 23 is disposed inside the first housing 21 on the side away from the second housing 22 and is connected to the elastic probe 24. This ensures that the elastic probe 24 is arranged along the axial direction of the first housing 21, ensuring coaxiality and preventing poor contact with the device under test due to misalignment of the elastic probe 24. The first insulator 23 is made of high-temperature resistant, insulating material, such as polytetrafluoroethylene, to isolate the elastic probe 24 from the metal first housing 21, ensuring that the radio frequency signal is transmitted only through the elastic probe 24 and reducing signal interference. One end of the elastic probe 24 is inserted into the inside of the first insulator 23, and the other end extends to the outside of the first insulator 23 and the first housing 21 for electrical connection with the external device under test.
[0038] A second insulator 25 is provided on the inner side of the second housing 22. The outer diameter of the second insulator 25 is adapted to the inner diameter of the second housing 22. One end face of the second insulator 25 abuts against the end face of the first housing 21 to limit the first housing 21.
[0039] In this embodiment, the outer diameter of the second insulator 25 is adapted to the inner diameter of the second housing 22, limiting the radial displacement of the second insulator 25 within the housing 22. The end face of the second insulator 25 abuts against the end face of the first housing 21, further limiting the axial movement of the first housing 21, making the structure of the test interface 1 more stable. The material of the second insulator 25 is the same as that of the first insulator 23, isolating the metallic second housing 22 from the first inner conductor 26, reducing signal interference to the radio frequency test.
[0040] A first inner conductor 26 is provided on the inner side of the second insulator 25. One end of the first inner conductor 26 extends out of the second insulator 25 and into the inner side of the first housing 21. A first socket 261 and a second socket 262 are respectively provided on the two end faces of the first inner conductor 26. The first socket 261 is close to one end of the elastic probe 24 and has several slots opened in the circumferential direction for insertion into the elastic probe 24. The second socket 262 is connected to the test cable 1.
[0041] In this embodiment, a first inner conductor 26 is disposed inside the second insulator 25 for insertion into the elastic probe 24. The inner diameter of the second insulator 25 matches the outer diameter of the first inner conductor 26 to prevent radial wobble of the first inner conductor 26 from causing poor signal contact. One end of the first inner conductor 26 extends out of the second insulator 25 and into the inner side of the first housing 21, forming an electrical connection with the elastic probe 24. The end of the elastic probe 24 is inserted into the first socket 261 to form a mating fit. The first socket 261 has several slots along its circumference to compensate for axial errors in the assembly of the first socket 261 and the elastic probe 24. The second socket 262 connects to the test cable to ensure continuous signal transmission. By replacing the first inner conductor 26 with different specifications, elastic probes 24 or test cables 1 of different diameters can be adapted, improving compatibility. When the elastic probe or inner conductor is worn, the components can be replaced individually, facilitating quick disassembly and maintenance.
[0042] A third insulator 27 is also provided on the inner side of the second housing 22. The end face of the third insulator 27 abuts against the end faces of the second insulator 25 and the first inner conductor 26 away from the first housing 21, thereby limiting the second insulator 25 and the first inner conductor 26.
[0043] In this embodiment, the end face of the third insulator 27 directly abuts against the end faces of the second insulator 25 and the first inner conductor 26 to form a rigid support, restricting the axial displacement of the two, preventing the second insulator 25 from axially moving within the second housing 22, fixing the axial position of the first inner conductor 26, ensuring that the insertion depth of the first socket 261 and the elastic probe 24 is constant, and avoiding poor signal contact or increased reflection loss. The third insulator 27 uses the same or compatible insulating material as the second insulator 25.
[0044] The test cable 1 includes a protective layer 11, a fourth insulator 12, and a second inner conductor 13, which are connected sequentially from the outside to the inside. The test cable 1 extends into the inside of the second housing 22. The outer diameter of the protective layer 11 is adapted to the inner diameter of the second housing 22. The second inner conductor 13 is inserted into the inside of the second socket 262 for electrical connection.
[0045] In this embodiment, the outer diameter of the protective layer 11 is adapted to the inner diameter of the second housing 22, and after insertion, it forms a tight fixation to prevent poor signal contact caused by cable loosening. The fourth insulator 12 wraps around the outside of the second inner conductor 13 to reduce signal reflection and attenuation during transmission and ensure that the second inner conductor 13 will not be radially offset. The first inner conductor 26, the second inner conductor 13 and the elastic probe 24 are made of high conductivity materials, such as oxygen-free copper wire plated with gold, to ensure effective conduction of radio frequency signals.
[0046] Reference Figures 4-7 In another embodiment, the radio frequency test assembly is disposed in the test fixture 3, which includes a base 31 and a cover plate 32. The radio frequency test assembly is disposed in the base 31 and contacts the placed test piece. If the radio frequency spacing is small, the mounting position can be milled and filled with conductive adhesive to replace the contact point of the elastic probe 24.
[0047] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A radio frequency test assembly, characterized in that, include: Test cable (1); A test interface (2) is provided on one side of the test cable (1); Radio frequency testing is performed directly by making elastic contact with the device under test through the test interface (2); or, The test cable (1) and the test interface (2) are set in the test fixture (3) to perform radio frequency testing on the device under test.
2. The radio frequency test assembly according to claim 1, characterized in that: The test interface (2) includes a first housing (21) and a second housing (22), one end of the second housing (22) is sleeved on the outside of the first housing (21) to form a receiving cavity with the first housing (21).
3. The radio frequency test assembly according to claim 2, characterized in that: A first insulator (23) is provided on the side of the first housing (21) away from the second housing (22).
4. The radio frequency test assembly according to claim 3, characterized in that: An elastic probe (24) is also provided on the inner side of the first housing (21). One end of the elastic probe (24) is inserted into the inner side of the first insulator (23) and extends to the outer side of the first insulator (23) and the first housing (21).
5. The radio frequency test assembly according to claim 4, characterized in that: A second insulator (25) is provided on the inner side of the second housing (22), and the outer diameter of the second insulator (25) is adapted to the inner diameter of the second housing (22).
6. The radio frequency test assembly according to claim 5, characterized in that: One end face of the second insulator (25) abuts against the end face of the first housing (21) to limit the first housing (21).
7. The radio frequency test assembly according to claim 5, characterized in that: A first inner conductor (26) is provided on the inner side of the second insulator (25), one end of the first inner conductor (26) extends out of the second insulator (25) and into the inner side of the first housing (21).
8. The radio frequency test assembly according to claim 7, characterized in that: The first inner conductor (26) has a first socket (261) and a second socket (262) on its two end faces respectively. The first socket (261) is close to one end of the elastic probe (24) and has several slots opened along the circumferential direction to be inserted into the elastic probe (24). The second socket (262) is connected to the test cable (1).
9. The radio frequency test assembly according to claim 7, characterized in that: The inner side of the second housing (22) is also provided with a third insulator (27), the end face of the third insulator (27) abuts against the end face of the second insulator (25) and the first inner conductor (26) away from the first housing (21), thereby limiting the second insulator (25) and the first inner conductor (26).
10. The radio frequency test assembly according to claim 8, characterized in that: The test cable (1) includes a protective layer (11), a fourth insulator (12), and a second inner conductor (13), which are sequentially inserted from the outside to the inside. The test cable (1) extends into the inside of the second housing (22). The outer diameter of the protective layer (11) is adapted to the inner diameter of the second housing (22). The second inner conductor (13) is inserted into the inside of the second socket (262) for electrical connection.