A test needle cover which is easily disassembled and reusable

Abstract

The utility model discloses an easily dismountable and reusable test needle cover, which comprises a test needle cover main body, a base for placing the test needle cover main body, wherein the base is of a rectangular structure, a dismounting assembly arranged at the connecting position of the test needle cover main body and the base, and the dismounting assembly comprises a positioning block fixedly connected to the outer side of the test needle cover main body, a jack opening at the upper end of the base, an auxiliary groove and a communication groove opened in the jack, and can solve the problem that the existing needle cover is generally fixedly connected with a test base (such as a PCB test fixture) through welding, bonding or integral molding. When a single needle cover is worn or damaged, the whole base module needs to be dismounted and replaced, and even the whole fixture plate needs to be scrapped. Although the dismountable needle cover with screw joint or pressure joint can be dismounted and mounted for a limited number of times, repeated screwing can cause thread slipping, oxidation of the contact surface, and the problem of forced replacement.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit testing technology, and in particular to a test pin sleeve that is easy to assemble, disassemble, and reuse. Background Technology

[0002] In the field of electronic testing, test probes serve as a crucial interface connecting the object under test (DUT) to the testing instrument; their reliability and maintenance efficiency directly impact testing costs and accuracy. Currently, mainstream technologies suffer from the following problems:

[0003] First, the fixed connection leads to maintenance difficulties: existing pin sleeves are generally fixedly connected to the test base (such as PCB test fixtures) by welding, bonding, or integral molding. When a single pin sleeve is worn or damaged, the entire base module needs to be disassembled for replacement, or even the entire fixture board needs to be scrapped, resulting in high maintenance costs and waste of resources.

[0004] Secondly, the lifespan of traditional detachable structures is insufficient: some detachable pin sleeves that use threaded or crimped connections (such as high-frequency test probes) can be disassembled and assembled a limited number of times, but repeated twisting will cause the threads to strip and the contact surface to oxidize. Typically, after 5,000 uses, the contact resistance will spike (>50mΩ), and forced replacement is required.

[0005] Finally, the operation is inefficient: in scenarios with densely packed multi-pin arrays (such as chip test sockets), existing disassembly tools are prone to accidental contact between adjacent pin sleeves, and replacing a single pin sleeve takes a long time on average, which seriously affects the efficiency of the production line. Utility Model Content

[0006] This invention provides an easy-to-disassemble and reusable test needle sleeve, which can solve the problems mentioned in the background art.

[0007] This utility model provides an easy-to-disassemble and reusable test needle sleeve, comprising:

[0008] Test needle sleeve body;

[0009] A base for placing the test needle sheath body, the base having a rectangular structure;

[0010] A disassembly / reassembly assembly is located at the connection between the test needle sleeve body and the base;

[0011] The assembly and disassembly assembly includes a positioning block fixedly connected to the outside of the test needle sleeve body, an insertion hole opened at the upper end of the base, an auxiliary groove and a connecting groove opened inside the insertion hole, a squeezing groove symmetrically opened inside the connecting groove, a positioning pin and a support spring set inside the squeezing groove, and a positioning groove opened at the bottom of the positioning block.

[0012] In a reusable test needle sleeve according to one embodiment of the present invention, the test needle sleeve body is in several groups and is evenly distributed in an array in the middle of the base. An mounting ear plate is integrally connected to the outer edge of the base, and the mounting ear plate is in four groups and is distributed in an array.

[0013] In a reusable test needle sleeve according to one embodiment of the present invention, anti-slip strips are arranged in an array on the outer side of the test needle sleeve body near the opening, a semiconductor test needle is disposed inside the test needle sleeve body, and an elastic metal clip is installed inside the test needle sleeve body, and the semiconductor test needle and the test needle sleeve body are clamped together by the elastic metal clip.

[0014] In a reusable test needle sleeve according to one embodiment of the present invention, the number of positioning blocks is two sets and they are symmetrically distributed. The positioning blocks and the squeezing groove are orthogonally distributed with respect to the center point of the insertion hole.

[0015] In a reusable test needle sleeve according to one embodiment of the present invention, the insertion hole, auxiliary groove and connecting groove are interconnected, wherein the connecting groove is connected to the squeezing groove, and the squeezing groove has a "convex" structure.

[0016] In a reusable test needle sleeve according to one embodiment of the present invention, the positioning pin is composed of an upper cylinder and a lower disk, wherein the top edge of the upper cylinder is provided with a rounded corner, and the diameter of the lower disk is larger than the diameter of the upper cylinder.

[0017] The technical solution provided in this application embodiment can include the following beneficial effects: This application designs an easy-to-disassemble and reusable test pin sleeve. By setting the disassembly and assembly components, it can solve the problem that existing pin sleeves are generally fixedly connected to the test base (such as PCB test fixtures) by welding, bonding or integral molding. When a single pin sleeve is worn or damaged, the entire base module needs to be disassembled for replacement, or even the entire fixture board needs to be scrapped; the lifespan of traditional detachable structures is insufficient: some detachable pin sleeves that use threaded or crimped connections can achieve a limited number of disassembly and assembly, but repeated twisting will cause the threads to strip and the contact surface to oxidize, requiring forced replacement; low operating efficiency: in scenarios with densely arranged multiple pins, existing disassembly tools are prone to causing accidental collisions between adjacent pin sleeves, and the average time required to replace a single pin sleeve is long, which seriously affects the efficiency of the production line.

[0018] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and do not limit this application. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of a reusable test needle sleeve that is easy to assemble and disassemble, according to an embodiment of this application.

[0021] Figure 2 yes Figure 1 A schematic diagram of a partially disassembled structure for an easily detachable and reusable test needle sleeve;

[0022] Figure 3 yes Figure 2 Enlarged view of point A in the middle;

[0023] Figure 4 yes Figure 1 A partial side-section diagram of a reusable test needle sheath that is easy to assemble and disassemble;

[0024] Figure 5 yes Figure 4 Enlarged diagram of point B in the middle.

[0025] Reference numerals: 10, Test probe sleeve body; 20, Base; 30, Assembly / disassembly assembly; 31, Positioning block; 32, Insertion hole; 33, Auxiliary groove; 34, Connecting groove; 35, Compression groove; 36, Positioning pin; 37, Support spring; 38, Positioning groove; 40, Semiconductor test probe. Detailed Implementation

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0027] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

[0028] The following detailed description of some embodiments of this application is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0029] Example:

[0030] like Figures 1 to 5 As shown, this application provides an easy-to-disassemble and reusable test needle sleeve, including: a test needle sleeve body 10; a base 20 for placing the test needle sleeve body 10, the base 20 having a rectangular structure; and a disassembly and assembly assembly 30 disposed at the connection between the test needle sleeve body 10 and the base 20. The disassembly and assembly assembly 30 includes a positioning block 31 fixedly connected to the outside of the test needle sleeve body 10, an insertion hole 32 opened at the upper end of the base 20, an auxiliary groove 33 and a connecting groove 34 opened inside the insertion hole 32, compression grooves 35 symmetrically opened inside the connecting groove 34, a positioning pin 36 and a support spring 37 disposed inside the compression groove 35, and a positioning groove 38 opened at the bottom of the positioning block 31.

[0031] After adopting the above technical solution, since the disassembly and assembly component 30 is located at the connection between the test pin sleeve body 10 and the base 20, when disassembling the test pin sleeve body 10, it is only necessary to rotate and pull the test pin sleeve body 10 along the inside of the base 20 to disassemble it. This solves the problem that existing pin sleeves are generally fixedly connected to the test base by welding, bonding or integral molding (such as PCB test fixtures). When a single pin sleeve is worn or damaged, the entire base module needs to be disassembled for replacement, or even the entire fixture board needs to be scrapped. The traditional detachable structure has insufficient lifespan: some detachable pin sleeves that use threaded or crimped connections can achieve a limited number of disassembly and assembly, but repeated twisting will cause the threads to strip and the contact surface to oxidize, requiring forced replacement. The operation efficiency is low: in scenarios with densely arranged multi-pins, existing disassembly tools are prone to causing accidental collisions between adjacent pin sleeves, and the average time to replace a single pin sleeve is long, which seriously affects the efficiency of the production line.

[0032] It should be noted that during the disassembly of the test needle sleeve body 10, the user holds the outside of the test needle sleeve body 10 and rotates the test needle sleeve body 10, causing the test needle sleeve body 10 to drive the positioning block 31 to rotate 90 degrees along the inside of the connecting groove 34. At the same time, the positioning groove 38 is squeezed along the top of the positioning pin 36, causing the positioning pin 36 to be compressed along the inside of the compression groove 35. Simultaneously, the support spring 37 is compressed, disengaging the positioning pin 36 from the inside of the positioning groove 38. When the positioning block 31 is aligned with the auxiliary groove 33, the test needle sleeve body 10 is pulled upward along the insertion hole 32, thereby driving the positioning block 31 to be pulled along the inside of the auxiliary groove 33 until the test needle sleeve body 10 is disengaged from the insertion hole 32, thus quickly disassembling the test needle sleeve body 10.

[0033] Similarly, during the installation of the test needle sleeve body 10, the above steps are reversed. The test needle sleeve body 10 is inserted along the insertion hole 32, causing the positioning block 31 to move along the auxiliary groove 33 and enter the interior of the connecting groove 34. Then, it is rotated 90 degrees in the opposite direction, causing the bottom of the positioning block 31 to press the positioning pin 36, and the positioning pin 36 to enter the interior of the pressing groove 35. When the positioning groove 38 and the positioning pin 36 are aligned, the positioning pin 36 is pushed into the interior of the positioning groove 38 by the elastic potential energy of the support spring 37. At this time, a "click" sound is heard, thus confirming that the positioning block 31 and the connecting groove 34 are positioned by the positioning pin 36, which facilitates the subsequent installation and use of the semiconductor test needle 40.

[0034] In one embodiment, the number of test needle sleeve bodies 10 is several groups, and they are evenly distributed in an array in the middle of the base 20. The outer edge of the base 20 is integrally connected with mounting ear plates, and the number of mounting ear plates is four groups, which are distributed in an array to facilitate the installation of the base 20.

[0035] In one embodiment, anti-slip strips are arrayed on the outer side of the test needle sleeve body 10 near the opening. These strips provide an anti-slip effect when the user holds the outer side of the test needle sleeve body 10 or operates it with a clamping tool, ensuring that the test needle sleeve body 10 can smoothly rotate along the inside of the insertion hole 32. This further ensures that the test needle sleeve body 10 can drive the positioning block 31 to rotate. A semiconductor test needle 40 is disposed inside the test needle sleeve body 10, and the interior of the test needle sleeve body 10 uses a cantilever beam type elastic metal clip (material: beryllium bronze, hardness HRC 38-42). Its V-shaped opening groove clamps the gold-plated section (diameter...) of the semiconductor test needle 40 in a three-point contact manner. The clamping force is controlled within the range of 8-12N, which ensures the reliability of electrical contact and allows for quick replacement of test probes through 45° angled insertion and removal.

[0036] In one embodiment, there are two sets of positioning blocks 31, which are symmetrically distributed. The positioning blocks 31 and the extrusion groove 35 are orthogonally distributed relative to the center point of the insertion hole 32, so that the positioning blocks 31 can correspond to the extrusion groove 35 after rotating 90 degrees, thereby ensuring that the positioning blocks 31 can be aligned with the positioning pin 36. The positioning pin 36 can be positioned in the positioning groove 38 at the bottom of the positioning block 31 to complete the positioning of the positioning block 31.

[0037] In one embodiment, the insertion hole 32, the auxiliary groove 33, and the connecting groove 34 are interconnected. During the positioning process of the positioning block 31, the positioning block 31 can enter the interior of the connecting groove 34 along the auxiliary groove 33. Then, by rotating the test needle sleeve body 10, the test needle sleeve body 10 rotates along the interior of the insertion hole 32, and at the same time, the positioning block 31 rotates along the interior of the connecting groove 34. The connecting groove 34 is connected to the extrusion groove 35. The extrusion groove 35 has a "convex" structure, which facilitates the positioning pin 36 to extend and retract along the interior of the extrusion groove 35, ensuring that the positioning pin 36 can be extruded with the positioning block 31.

[0038] In one embodiment, the locating pin 36 consists of an upper cylinder and a lower disk, wherein the upper cylinder has a diameter of... The top is machined with a radius of 0.5mm to reduce contact stress. Lower disc section: diameter... The end face flatness is 0.01mm, and it is clearance-fitted with the inner wall of the extrusion groove 35. The support spring 37 is a conical helical spring made of SWOSC-V material, with an initial preload of 18N±5% and a stiffness gradient of 2N / mm within the compression stroke. When the locating pin 36 is extruded and enters the compression stage, the disc section and the inner diameter of the groove form a mechanical hard limit.

[0039] When the positioning pin 36 is compressed inside the extrusion groove 35, it is pushed out by the support spring 37 when the positioning groove 38 is aligned with the positioning pin 36. The lower disc limits the stroke of the positioning pin 36 inside the extrusion groove 35, preventing the positioning pin 36 from being pushed out of the extrusion groove 35 and facilitating repeated extrusion and reset operations.

[0040] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection. They can refer to a mechanical connection or an electrical connection. They can refer to a direct connection or an indirect connection through an intermediate medium, and they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0041] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0042] The foregoing disclosure provides many different embodiments or examples for implementing different structures of this application. To simplify the disclosure, specific examples of components and arrangements are described above. Of course, these are merely examples and are not intended to limit the scope of this application. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, examples of various specific processes and materials are provided in this application, but those skilled in the art will recognize the application of other processes and / or the use of other materials.

[0043] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with an embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0044] Although embodiments of this application have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the claims and their equivalents.

Claims

1. A reusable test needle sleeve that is easy to assemble and disassemble, characterized in that, include: Test needle sleeve body; A base for placing the test needle sheath body, the base having a rectangular structure; A disassembly / reassembly assembly is located at the connection between the test needle sleeve body and the base; The assembly and disassembly assembly includes a positioning block fixedly connected to the outside of the test needle sleeve body, an insertion hole opened at the upper end of the base, an auxiliary groove and a connecting groove opened inside the insertion hole, a squeezing groove symmetrically opened inside the connecting groove, a positioning pin and a support spring set inside the squeezing groove, and a positioning groove opened at the bottom of the positioning block.

2. The easily detachable and reusable test needle sleeve according to claim 1, characterized in that, The test needle sleeve body is in several groups, and is evenly distributed in an array in the middle of the base. The outer edge of the base is integrally connected with a mounting ear plate, and there are four groups of mounting ear plates distributed in an array.

3. The easily detachable and reusable test needle sleeve according to claim 1, characterized in that, The outer side of the test needle sleeve body is provided with anti-slip strips near the opening. The test needle sleeve body is provided with a semiconductor test needle inside, and an elastic metal clip is installed inside the test needle sleeve body. The semiconductor test needle and the test needle sleeve body are clamped together by the elastic metal clip.

4. The easily detachable and reusable test needle sleeve according to claim 1, characterized in that, The number of positioning blocks is two sets and they are symmetrically distributed. The positioning blocks and the extrusion groove are orthogonally distributed relative to the center point of the insertion hole.

5. The easily detachable and reusable test needle sleeve according to claim 1, characterized in that, The insertion hole, auxiliary groove and connecting groove are interconnected, wherein the connecting groove is connected to the extrusion groove, and the extrusion groove has a "convex" structure.

6. The easily detachable and reusable test needle sleeve according to claim 1, characterized in that, The positioning pin consists of an upper cylinder and a lower disk, wherein the top edge of the upper cylinder is provided with a rounded corner, and the diameter of the lower disk is larger than the diameter of the upper cylinder.

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