A cold and hot shock test chamber for a multi-layer sample rack structure

CN224763108UActive Publication Date: 2026-09-18广州铭晟试验设备有限公司
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Patent Information

Application Number
CN202522121770.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-10-08
Publication Date
2026-09-18
Estimated Expiration
2035-10-08

AI Technical Summary

Technical Problem

[0004]上述的一种冷热冲击试验箱在使用过程中该专利通过定位环、定位柱等结构实现了样品架的灵活调节,但这种可调节的结构可能在一定程度上影响试验箱内部的密封性和保温性

Benefits of technology

1、本实用新型通过限位环,限制转轴的旋转范围或固定特定角度,避免调节过程中角度偏移,确保多层样品架调节后位置统一,提升试验重复性,通过弹簧,可在样品架受外力时产生弹性形变,吸收冲击能量,避免样品与架体刚性碰撞导致的样品损坏。

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Abstract

The utility model belongs to cold and hot impact test box technical field, and disclose a kind of cold and hot impact test box of multilayer sample holder structure, including connecting plate two, the front end surface of connecting plate two is fixed with pivot, the outside of pivot is fixed with locating ring, the outside of locating ring is fixed with fixed block, the rear end surface of fixed block is fixed with spring, by limiting ring, the rotation range of pivot or fixed specific angle is limited, avoid angle deviation in the adjustment process, ensure that the position of multilayer sample holder is uniform after adjustment, improve test repeatability, by spring, elastic deformation can be generated when sample holder is under external force, absorb impact energy, avoid sample damage caused by rigid collision between sample and frame.
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Description

Technical Field

[0001] This utility model belongs to the technical field of thermal shock test chambers, specifically a thermal shock test chamber with a multi-layer sample rack structure. Background Technology

[0002] In the electronics, automotive, and aerospace industries, products often face drastic temperature changes during actual use, necessitating thermal shock testing to verify their temperature resistance and reliability. Traditional thermal shock test chambers suffer from limitations such as limited sample rack layers, low space utilization, poor temperature uniformity, and slow heating and cooling rates, making them unsuitable for simultaneous testing of batch samples and high-precision experiments. With the increasing demands for testing efficiency and accuracy from various industries, developing a multi-layer sample rack thermal shock test chamber is of significant practical importance. This chamber must enable simultaneous thermal shock testing of multiple sample layers while ensuring temperature uniformity within each layer, and simultaneously improve heating and cooling rates to meet the testing standards of different industries, thereby enhancing testing efficiency and accuracy.

[0003] Meanwhile, a thermal shock test chamber with announcement number CN222490101U is disclosed, including a thermal shock test chamber body. A heating chamber is fixedly connected to the bottom of the thermal shock test chamber body, and a cooling chamber is fixedly connected to the top of the thermal shock test chamber body. Mounting boxes are fixedly connected to both outer walls of the thermal shock test chamber body. A second ventilation pipe is installed through the inner side of the mounting box. A second electric valve is provided on the outer wall of the second ventilation pipe. An exhaust fan is fixedly connected inside the mounting box. A support frame is fixedly connected to the inner wall of the thermal shock test chamber body.

[0004] The aforementioned thermal shock test chamber allows for flexible adjustment of the sample rack through structures such as positioning rings and positioning columns during use. However, this adjustable structure may affect the sealing and insulation of the test chamber to some extent. For example, gaps may exist in the sliding arrangement of the limiting plate and the limiting groove, leading to leakage of hot and cold airflow, which in turn affects the uniformity and control accuracy of the temperature inside the chamber, resulting in inaccurate temperature shock to the sample.

[0005] Therefore, a thermal shock test chamber with a multi-layer sample holder structure is proposed to address the above problems. Utility Model Content

[0006] To address the problems mentioned in the background art, this utility model provides a thermal shock test chamber with a multi-layer sample rack structure, which has the advantages of flexible sample rack adjustment, strong adaptability, unobstructed airflow circulation, and uniform temperature shock.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a thermal shock test chamber with a multi-layer sample rack structure, including a second connecting plate. A rotating shaft is fixedly provided on the front end face of the second connecting plate. A positioning ring is fixedly provided on the outer side of the rotating shaft. A fixing block is fixedly provided on the outer side of the positioning ring. A spring is fixedly provided on the rear end face of the fixing block. Through the spring, elastic deformation can be generated when the sample rack is subjected to external force, absorbing impact energy and avoiding sample damage caused by rigid collision between the sample and the rack.

[0008] Preferably, a positioning post is fitted inside the positioning ring, a connecting plate is fixedly provided on the front end face of the positioning post, and a limiting plate is fixedly provided on the outer side of the connecting plate.

[0009] By adopting the above technical solution, the positioning column and positioning ring can provide more accurate positioning for the sample holder, reducing the shaking and displacement of the sample holder during the test.

[0010] Preferably, the rear end face of the connecting plate two is fixedly provided with the device body, and the spring is fixedly provided with the device body, and the inside of the device body is fixedly provided with a fixing tube.

[0011] By adopting the above technical solution and using a fixed tube, direct contact between the components and the sample holder and sample can be avoided, and the aging of cables and conduits due to high and low temperatures can be prevented.

[0012] Preferably, a limiting groove is provided inside the fixed tube, and the limiting plate is slidably disposed with respect to the limiting groove.

[0013] By adopting the above technical solution, the interlayer spacing can be "quantitatively adjusted" through the limiting groove, avoiding uneven interlayer spacing caused by manual estimation, ensuring that all samples are in the temperature uniform zone inside the chamber, and improving the consistency of test results.

[0014] Preferably, a placement plate is fixedly provided on the left end face of the limiting plate, and a handle is fixedly provided on the front end face of the placement plate.

[0015] By adopting the above technical solution, the handle facilitates the operation of the placement board, reflecting the human-centered design and functionality.

[0016] Preferably, a control device is fixedly provided on the front end face of the device body, a hot air outlet is fixedly provided on the right side inside the device body, and a cold air outlet is fixedly provided on the left side inside the device body.

[0017] By adopting the above technical solution, the control device collects data in real time through the temperature sensor inside the box. If the detected temperature is higher than the target value, it can automatically reduce the power of the hot air outlet and increase the air volume of the cold air outlet; if the temperature is lower than the target value, it will adjust in the opposite direction to avoid the lag and error of manual adjustment and ensure the accuracy of temperature control.

[0018] Preferably, the device body has a fixing groove inside, a sealing plate is fitted inside the fixing groove, a fixing plate is fixedly mounted on the front end face of the sealing plate, and a sealing door is fixedly mounted on the front end face of the fixing plate.

[0019] By adopting the above technical solution, the sealing plate and fixing groove can prevent external dust, moisture and impurities from entering the device body, avoid failure of core components due to foreign object contamination, and reduce the frequency of equipment maintenance.

[0020] Compared with the prior art, the beneficial effects of this utility model are as follows: 1. This utility model uses a limiting ring to limit the rotation range of the rotating shaft or fix a specific angle, avoiding angle deviation during adjustment, ensuring uniform position of the multi-layer sample holder after adjustment, and improving test repeatability. Through the spring, the sample holder can generate elastic deformation when subjected to external force, absorbing impact energy and avoiding sample damage caused by rigid collision between the sample and the holder.

[0021] 2. This utility model provides a convenient connection interface for the installation of the sample rack through the connecting plate. The limiting plate can limit the movement range of the sample rack, preventing the sample rack from exceeding the normal range of movement during the test and avoiding collisions or interference with other components in the test chamber, thereby protecting the structural integrity of the sample rack and the test chamber. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the overall structure of this utility model; Figure 2 This is a schematic diagram of the installation structure of the fixing plate of this utility model; Figure 3 This is a schematic diagram of the installation structure of the cold air outlet of this utility model; Figure 4 This is a schematic diagram of the installation structure of the limiting plate of this utility model; Figure 5 This is a schematic diagram of the installation structure of the spring of this utility model.

[0023] In the diagram: 1. Device body; 2. Control device; 3. Sealing door; 4. Fixing plate; 5. Sealing plate; 6. Fixing groove; 7. Hot air outlet; 8. Cold air outlet; 9. Fixing pipe; 10. Limiting groove; 11. Limiting plate; 12. Placement plate; 13. Handle; 14. Connecting plate one; 15. Positioning column; 16. Connecting plate two; 17. Rotating shaft; 18. Positioning ring; 19. Fixing block; 20. Spring. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] The following describes an embodiment of this utility model based on its overall structure.

[0026] like Figures 1 to 5 As shown, this utility model provides a thermal shock test chamber with a multi-layer sample rack structure, including a second connecting plate 16. A rotating shaft 17 is fixedly provided on the front end face of the second connecting plate 16. A positioning ring 18 is fixedly provided on the outer side of the rotating shaft 17. A fixing block 19 is fixedly provided on the outer side of the positioning ring 18. A spring 20 is fixedly provided on the rear end face of the fixing block 19. The limiting ring restricts the rotation range of the rotating shaft 17 or fixes a specific angle to avoid angle deviation during adjustment, ensures uniform position of the multi-layer sample rack after adjustment, and improves test repeatability. The spring 20 can generate elastic deformation when the sample rack is subjected to external force, absorb impact energy, and avoid sample damage caused by rigid collision between the sample and the rack.

[0027] In this embodiment, a positioning post 15 is fitted inside the positioning ring 18, and a connecting plate 14 is fixedly provided on the front end face of the positioning post 15. A limiting plate 11 is fixedly provided on the outer side of the connecting plate 14. Through the positioning post 15 and the positioning ring 18, the sample holder can be positioned more accurately, reducing the shaking and displacement of the sample holder during the test.

[0028] The device body 1 is fixedly mounted on the rear end face of the connecting plate 2 16, and the spring 20 is fixedly mounted on the device body 1. The device body 1 is fixedly mounted with a fixing tube 9 inside. Through the fixing tube 9, the direct contact between the components and the sample holder and the sample can be avoided, and the aging of the cables and conduits can be prevented from being accelerated by high and low temperatures.

[0029] The fixed tube 9 has a limiting groove 10 inside, and the limiting plate 11 is slidably set with the limiting groove 10. Through the limiting groove 10, the interlayer spacing can be "quantitatively adjusted", avoiding the uneven interlayer spacing caused by manual estimation, ensuring that all samples can be in the temperature uniform zone inside the chamber, and improving the consistency of test results.

[0030] A placement plate 12 is fixedly provided on the left end face of the limiting plate 11, and a handle 13 is fixedly provided on the front end face of the placement plate 12. The handle 13 facilitates the operation of the placement plate 12 by the operator, reflecting the humanization and functionality of the design.

[0031] A control device 2 is fixedly installed on the front end of the device body 1. A hot air outlet 7 is fixedly installed on the right side inside the device body 1, and a cold air outlet 8 is fixedly installed on the left side inside the device body 1. Through the control device 2, the control device 2 collects data in real time through the temperature sensor inside the box. If the temperature is detected to be higher than the target value, it can automatically reduce the power of the hot air outlet 7 and increase the air volume of the cold air outlet 8. If the temperature is lower than the target value, it will adjust in the opposite direction to avoid the lag and error of manual adjustment and ensure the accuracy of temperature control.

[0032] The device body 1 has a fixing groove 6 inside, and a sealing plate 5 is fitted inside the fixing groove 6. A fixing plate 4 is fixed to the front end of the sealing plate 5, and a sealing door 3 is fixed to the front end of the fixing plate 4. Through the sealing plate 5 and the fixing groove 6, external dust, moisture and impurities can be blocked from entering the device body 1, avoiding failure of core components due to foreign object contamination and reducing the frequency of equipment maintenance.

[0033] Working principle and process of a multi-layer sample rack structure thermal shock test chamber: Holding the handle 13 on the front end of the placement plate 12, since the limiting plate 11 and the limiting groove 10 inside the fixing tube 9 are slidably set, pulling the handle 13 outward will cause the placement plate 12 to be pulled out of the device body 1 as the limiting plate 11 slides within the limiting groove 10. During the pulling process, the connecting plate 14 is engaged with the positioning ring 18 through the positioning post 15, and the spring 20 is stretched, so that the sample to be tested is placed stably on the placement plate 12. The placement plate 12 can be set in multiple layers to realize the function of testing multiple samples simultaneously, improving the testing efficiency. After placement, push the placement plate 12 back into the device body 1. The spring 20 will contract and return to its original state. Push the sealing door 3, and the sealing plate 5 will slide along the fixing groove 6 inside the device body 1 via the fixing plate 4 until the sealing door 3 is completely closed. This ensures that a relatively sealed test environment is formed inside the device body 1, preventing heat or cold loss during the thermal shock process. Operate the control device 2 on the front end of the device body 1 to set various parameters of the thermal shock test according to the test requirements, such as hot air temperature, cold air temperature, time interval between hot and cold alternations, and number of cycles. Once the control device 2 issues a command to start the test, hot air is first blown out from the hot air outlet 7 on the right side inside the device body 1 to heat the sample placed on the placement plate 12, simulating a high-temperature environment. After the set high-temperature time, the control device 2 stops the supply of hot air, and at the same time, cold air is blown out from the cold air outlet 8 on the left side inside the device body 1 to cool the sample, quickly bringing it to a low-temperature environment to simulate a low-temperature environment. The process of alternating hot and cold air supply is repeated according to the set number of cycles, allowing the sample to continuously switch between high and low temperature environments to detect the performance changes of the sample under different temperature environments. When the set number of cycles is reached, the control device 2 automatically stops the operation of the hot air outlet 7 and the cold air outlet 8, and the test ends. The sealing door 3 is opened, and the operation method is the reverse of the closing method. Pulling the sealing door 3 drives the sealing plate 5 to slide out along the fixing groove 6 through the fixing plate 4. Hold the handle 13 again to pull the placement plate 12 out from the device body 1 and take out the sample that has undergone the thermal shock test for subsequent performance testing and analysis.

[0034] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0035] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A cold-heat shock test chamber of a multi-layer sample rack structure including a connection plate two (16), characterized in that: The front end face of the connecting plate 2 (16) is fixedly provided with a rotating shaft (17), the outer side of the rotating shaft (17) is fixedly provided with a positioning ring (18), the outer side of the positioning ring (18) is fixedly provided with a fixing block (19), and the rear end face of the fixing block (19) is fixedly provided with a spring (20).

2. The cold-heat shock test chamber of a multi-layer sample shelf structure according to claim 1, characterized in that: The positioning ring (18) is fitted with a positioning post (15) inside, and a connecting plate (14) is fixedly provided on the front end face of the positioning post (15), and a limiting plate (11) is fixedly provided on the outer side of the connecting plate (14).

3. The cold-heat shock test chamber of a multi-layer sample shelf structure according to claim 1, characterized in that: The device body (1) is fixedly provided on the rear end face of the connecting plate 2 (16), and the spring (20) is fixedly provided with the device body (1). The device body (1) is fixedly provided with a fixing tube (9).

4. The cold-heat shock test chamber of a multi-layer sample shelf structure according to claim 3, characterized in that: The fixed tube (9) has a limiting groove (10) inside, and the limiting plate (11) is slidably disposed with the limiting groove (10).

5. The cold-heat shock test chamber of a multi-layer sample shelf structure according to claim 2, characterized in that: The left end face of the limiting plate (11) is fixedly provided with a placement plate (12), and the front end face of the placement plate (12) is fixedly provided with a handle (13).

6. The thermal shock test chamber with a multi-layer sample rack structure according to claim 3, characterized in that: A control device (2) is fixedly provided on the front end face of the device body (1), a hot air outlet (7) is fixedly provided on the right side inside the device body (1), and a cold air outlet (8) is fixedly provided on the left side inside the device body (1).

7. The thermal shock test chamber with a multi-layer sample rack structure according to claim 3, characterized in that: The device body (1) has a fixing groove (6) inside, a sealing plate (5) is attached inside the fixing groove (6), a fixing plate (4) is fixed on the front end face of the sealing plate (5), and a sealing door (3) is fixed on the front end face of the fixing plate (4).

Citation Information

Patent Citations

  • Cold and hot impact test box

    CN222490101U