Strobe light decay detection device

Abstract

The utility model provides a flash light decay detection device, it includes first sampling circuit, second sampling circuit and processing module, first sampling circuit keeps first voltage sampling signal before flash, second sampling circuit can acquire voltage information before and after the flash of flash lamp tube respectively, correspond respectively second voltage sampling signal and third voltage sampling signal, processing module is used for calculating first voltage difference between first voltage sampling signal and second voltage sampling signal and second voltage difference between first voltage sampling signal and third voltage sampling signal, determines the light decay state of flash lamp through comparing first voltage difference and second voltage difference. This can determine the light decay state of flash lamp without additional photosensitive device, avoids the measurement error of traditional photosensitive detection method light decay, temperature drift and high light intensity. At the same time, the scheme can real -time, continuous monitoring flash lamp tube state, effectively prolongs the life of flash lamp and saves resources.

Description

Technical Field

[0001] This utility model relates to the field of strobe light technology, and in particular to a strobe light decay detection device. Background Technology

[0002] Currently, strobe lights (such as xenon strobe lights) used for capturing vehicle images on roads are widely used in traffic monitoring and violation detection. However, strobe lights suffer from light decay with prolonged use, meaning their flash lifespan decreases. If the local power grid voltage is unstable, the flash lifespan may be further shortened. In some critical monitoring situations, it is necessary to ensure the luminous efficiency of the strobe lights at all times. Therefore, it is essential to monitor the light decay of the strobe lights in real time. Light decay reflects the luminous efficiency of the strobe lights to ensure the quality of captured images.

[0003] It should be noted that the information disclosed in the background section above is only used to enhance the understanding of the background of this utility model, and therefore may include information that does not constitute prior art known to those skilled in the art. Utility Model Content

[0004] In view of the problems in the prior art, the purpose of this utility model is to provide a strobe light decay detection device, which overcomes the difficulties of the prior art and can accurately detect the light decay state of strobe lights.

[0005] This disclosure provides a strobe light decay detection device, which includes:

[0006] The first sampling circuit is coupled between the anode of the strobe lamp and the first output terminal, and is used to collect the first voltage sampling signal of the anode of the lamp before the strobe lamp flashes, and to maintain the first voltage sampling signal after the strobe flashes.

[0007] The second sampling circuit is coupled between the lamp anode and the second output terminal. It is used to collect the second voltage sampling signal of the lamp anode before the strobe light flashes and to collect the third voltage sampling signal of the lamp anode after the strobe light flashes.

[0008] Processing module, used for:

[0009] Before the strobe light flashes, a first voltage sampling signal and a second voltage sampling signal are received, and a first voltage difference between the first voltage sampling signal and the second voltage sampling signal is calculated.

[0010] After the strobe light flashes, the third voltage sampling signal and the first voltage sampling signal are received, and the second voltage difference between the first voltage sampling signal and the third voltage sampling signal is calculated.

[0011] Compare the first voltage difference with the second voltage difference, and determine the light decay state of the strobe lamp based on the comparison result.

[0012] Optionally, the first sampling circuit includes:

[0013] The first diode has its positive terminal connected to the anode of the lamp tube and its negative terminal connected to the first node.

[0014] The first capacitor is coupled between the first node and the reference voltage terminal;

[0015] The first voltage divider circuit is connected in parallel with the first capacitor and coupled between the first node and the reference voltage terminal. The output terminal of the first voltage divider circuit serves as the first output terminal.

[0016] Optionally, the first voltage divider circuit includes at least two first voltage divider resistors connected in series, and the output terminal of the first voltage divider circuit is located between any two adjacent first voltage divider resistors.

[0017] Optionally, the first sampling circuit further includes:

[0018] The first Zener diode has its anode connected to the reference voltage terminal and its cathode connected to the first output terminal.

[0019] Optionally, the second sampling circuit includes:

[0020] A charging resistor is coupled between the lamp anode and the second node;

[0021] The second diode has its negative terminal connected to the anode of the lamp tube and its positive terminal connected to the second node.

[0022] The second capacitor is coupled between the second node and the reference voltage terminal;

[0023] The second voltage divider circuit is connected in parallel with the second capacitor and coupled between the second node and the reference voltage terminal. The output terminal of the second voltage divider circuit serves as the second output terminal.

[0024] Optionally, the second voltage divider circuit includes at least two second voltage divider resistors connected in series, and the output terminal of the second voltage divider circuit is located between any two adjacent second voltage divider resistors.

[0025] Optionally, the second sampling circuit further includes:

[0026] The second Zener diode has its anode connected to the reference voltage terminal and its cathode connected to the second output terminal.

[0027] Optionally, the processing module includes:

[0028] The differential operation unit is connected to the first output terminal and the second output terminal. It is used to receive the first voltage sampling signal and the second voltage sampling signal and perform differential operation to output the first voltage difference, and to receive the first voltage sampling signal and the third voltage sampling signal and perform differential operation to output the second voltage difference.

[0029] The determination unit, connected to the differential operation unit, is used to compare the first voltage difference with the second voltage difference and determine the light decay state of the strobe lamp based on the comparison result.

[0030] Optionally, the differential operation unit includes a differential circuit composed of operational amplifiers.

[0031] Optionally, the strobe light decay detection device also includes:

[0032] The display module, connected to the processing module, is used to display the light decay status of the strobe light.

[0033] The strobe light decay detection device provided in this disclosure has the following beneficial effects:

[0034] This embodiment maintains the first voltage sampling signal before the strobe light flashes through a first sampling circuit. This first voltage sampling signal serves as a reference voltage before and after the strobe light flashes, used for subsequent light decay determination, avoiding measurement errors caused by instantaneous voltage fluctuations. The second sampling circuit is designed to acquire voltage information of the strobe light tube before and after the strobe light flashes, corresponding to the second and third voltage sampling signals respectively. This provides a data basis for calculating the first and second voltage differences, while ensuring that the actual voltage change can still be collected after the strobe light flashes, facilitating the analysis of light decay. Therefore, by comparing the first and second voltage differences, the light decay state of the strobe light is determined. Based on the strobe light decay detection device provided in this embodiment, the light decay state of the strobe light tube can be determined without additional photosensitive devices, avoiding measurement errors caused by light decay, temperature drift, and high light intensity in traditional photosensitive detection methods. Simultaneously, this solution can monitor the status of the strobe light tube in real time and continuously, providing a basis for the maintenance and replacement of the strobe light, effectively extending the lifespan of the strobe light and saving resources.

[0035] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0036] Other features, objects, and advantages of this invention will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings.

[0037] Figure 1 This diagram illustrates the architecture of a strobe light decay detection device according to an embodiment of the present disclosure.

[0038] Figure 2 exhibit Figure 1 The circuit topology diagram of the strobe light decay detection device is shown below;

[0039] Figure 3 A schematic diagram of a strobe light decay detection device according to another embodiment of the present disclosure is shown. Detailed Implementation

[0040] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, they are provided so that this disclosure will be more comprehensive and complete, and will fully convey the concept of the exemplary embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0041] Furthermore, the accompanying drawings are merely illustrative of this disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and therefore repeated descriptions of them will be omitted. Some block diagrams shown in the drawings are functional entities and do not necessarily correspond to physically or logically independent entities. These functional entities may be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller devices.

[0042] Furthermore, the concepts of "first" and "second" mentioned in this disclosure are used only to distinguish different devices, modules or units, and are not used to define the order of functions performed by these devices, modules or units or their interdependencies.

[0043] In related technologies, most ordinary strobe lights do not have luminous efficiency detection capabilities and are generally replaced only when the quality of the captured image deteriorates to the point that it can no longer meet the requirements of backend processing. This method has the problem of untimely replacement and is suitable for some ordinary, non-critical capture points. However, at important capture points, if a periodic replacement method is adopted, it may result in the strobe light being replaced before the end of its lifespan, thus wasting resources.

[0044] To address the light decay issue in strobe lights, some technologies have attempted to detect it by adding photosensitive devices. However, photosensitive devices themselves also suffer from light decay, and strobe lights, being strong light sources, require atomizing filters to attenuate the light intensity. Furthermore, the high temperatures generated during strobe light operation cause temperature drift in the photosensitive device's detection results; the photosensitive device also typically requires a minimum duration to collect light intensity, all of which affect detection accuracy.

[0045] Therefore, in order to improve the accuracy of optical decay detection, related technologies often require the addition of complex hardware and measurement systems, which significantly increases costs.

[0046] Therefore, the existing technologies for detecting strobe light decay still suffer from problems such as low detection accuracy, high cost, and untimely replacement or waste of resources. There is an urgent need to provide a high-precision, low-cost, and real-time reliable strobe light decay detection solution.

[0047] Figure 1 This invention discloses an architectural diagram of a strobe light decay detection device according to an embodiment of the present invention, such as... Figure 1 As shown, the strobe light decay detection device includes the following structure:

[0048] The first sampling circuit 1 is coupled between the anode IN+ of the strobe lamp and the first output terminal OUT1. It is used to collect the first voltage sampling signal FLASH_FRONT_V of the anode IN+ of the strobe lamp before the strobe lamp flashes and to retain the first voltage sampling signal FLASH_FRONT_V after the strobe lamp flashes.

[0049] The second sampling circuit 2 is coupled between the lamp anode IN+ and the second output terminal OUT2. It is used to collect the second voltage sampling signal FLASH_BACK_V1 of the lamp anode IN+ before the strobe light flashes, and to collect the third voltage sampling signal FLASH_BACK_V2 of the lamp anode IN+ after the strobe light flashes.

[0050] Processing module 3 is used for:

[0051] Before the strobe light flashes, the first voltage sampling signal FLASH_FRONT_V and the second voltage sampling signal FLASH_BACK_V1 are received, and the first voltage difference ΔVfront between the first voltage sampling signal FLASH_FRONT_V and the second voltage sampling signal FLASH_BACK_V1 is calculated.

[0052] After the strobe light flashes, the third voltage sampling signal FLASH_BACK_V2 and the first voltage sampling signal FLASH_FRONT_V are received, and the second voltage difference ΔVback between the first voltage sampling signal FLASH_FRONT_V and the third voltage sampling signal FLASH_BACK_V2 is calculated.

[0053] The first voltage difference ΔVfront and the second voltage difference ΔVback are compared, and the light decay state of the strobe lamp is determined based on the comparison result.

[0054] During the strobe light's flashing process, the voltage FLASHLED_V at the anode IN+ of the lamp tube undergoes drastic changes. This embodiment uses a first sampling circuit 1 to maintain a first voltage sampling signal FLASH_FRONT_V before the strobe flash. This signal can serve as a reference voltage before and after the strobe flash for subsequent light decay determination, avoiding measurement errors caused by instantaneous voltage fluctuations.

[0055] The second sampling circuit 2 is designed to acquire the voltage information of the strobe lamp tube before and after strobeing, corresponding to FLASH_BACK_V1 and FLASH_BACK_V2 respectively. This provides a data basis for calculating the first voltage difference ΔVfront and the second voltage difference ΔVback, while ensuring that the real voltage change can still be collected after strobeing, which is convenient for analyzing the light decay.

[0056] If a strobe lamp tube experiences significant light decay, its output luminous flux will decrease under the same input conditions, thus affecting the lamp tube's current-voltage characteristics. By comparing the voltage difference (ΔVfront and ΔVback) before and after the strobe flash, the light output decay of the strobe lamp tube can be indirectly reflected.

[0057] Therefore, by comparing ΔVfront and ΔVback, if the difference between the two changes significantly, it is determined that the strobe lamp tube has experienced light decay. Based on the strobe lamp light decay detection device provided in this embodiment, the light decay state of the strobe lamp tube can be determined without additional photosensitive devices, avoiding measurement errors caused by light decay, temperature drift, and high light intensity in traditional photosensitive detection methods. Simultaneously, this solution can monitor the status of the strobe lamp tube in real time and continuously, providing a basis for the maintenance and replacement of the strobe lamp, effectively extending the lifespan of the strobe lamp and saving resources.

[0058] like Figure 2 As shown, the first sampling circuit 1 includes:

[0059] The first diode D1 has its positive terminal connected to the lamp anode IN+ and its negative terminal connected to the first node N1.

[0060] The first capacitor C1 is coupled between the first node N1 and the reference voltage terminal AC_N;

[0061] The first voltage divider circuit 10 is connected in parallel with the first capacitor C1 and coupled between the first node N1 and the reference voltage terminal AC_N. The output terminal N0 of the first voltage divider circuit 10 serves as the first output terminal OUT1.

[0062] In this embodiment, before the strobe light flashes, D1 allows the anode IN+ of the lamp tube to charge C1, causing the voltage VFRONT at the first node N1 to reach FLASHLED_V minus the forward conduction voltage of D1. During the strobe flash, D1 reverses and cuts off, isolating C1 from the transient voltage of the strobe light tube, thereby maintaining VFRONT stable.

[0063] After the strobe effect, D1 reverses and cuts off, preventing the voltage VFRONT at the first node N1 from being pulled low by the lamp voltage FLASHLED_V after the strobe effect, thus maintaining the voltage signal before the strobe effect. Simultaneously, C1 maintains the VFRONT voltage at the moment the strobe lamp flashes, thereby providing a stable reference voltage to the processing module 3.

[0064] The first voltage divider circuit 10 is connected in parallel with C1. It is used to reduce the high voltage of the first node N1 to a voltage range that the processing module 3 can safely sample, and finally output FLASH_FRONT_V.

[0065] In this embodiment, the reference voltage terminal AC_N provides a stable potential reference, allowing the first voltage sampling signal to be measured and divided relative to a fixed point. For high-voltage sampling, the reference voltage terminal AC_N provides a stable zero potential, ensuring that the divided voltage is sent to the processing module 3 within a safe range, preventing overvoltage damage to the processing module 3. When C1 stores energy, its voltage is maintained relative to the reference voltage terminal AC_N. When the anode voltage changes during the instant the strobe light flashes, the reference voltage terminal AC_N serves as a zero-point reference, ensuring that the FLASH_FRONT_V voltage signal is maintained stably.

[0066] Therefore, in this embodiment, the reference voltage terminal AC_N is the zero potential reference point of the entire first sampling circuit 1, which can usually be the ground terminal (GND) (such as the mains neutral line). It is the basic potential node for realizing voltage regulation and voltage maintenance.

[0067] Based on the specific structure of the first sampling circuit 1 as described above, the first output terminal OUT1 can maintain a basically unchanged voltage signal before and after the strobe light flashes, providing the required reference potential.

[0068] In this embodiment of the disclosure, the first voltage divider circuit 10 includes at least two first voltage divider resistors connected in series. Figure 2 The diagram shows two first voltage divider resistors, R1 and R2. In another embodiment, the number of first voltage divider resistors can be selected according to the actual situation. The output terminal N0 of the first voltage divider circuit 10 is located between any two adjacent first voltage divider resistors R1 and R2.

[0069] In this embodiment, the voltage divider points (corresponding to N0) are formed by the series-connected first voltage divider resistors R1 and R2, which reduces the high voltage of the first node N1, so that the voltage of the first output terminal OUT1 is within the acceptable range of the processing module 3, thus ensuring the safety and accuracy of voltage sampling.

[0070] In this way, processing module 3 can safely acquire the FLASH_FRONT_V voltage signal without changing the normal operating conditions of the lamp.

[0071] like Figure 2 As shown, the first sampling circuit 1 further includes:

[0072] The first Zener diode D2 has its anode connected to the reference voltage terminal AC_N and its cathode connected to the first output terminal OUT1.

[0073] In this embodiment, when the FLASH_FRONT_V voltage signal at the first output terminal OUT1 exceeds the input voltage allowed by the processing module 3, D2 is turned on (i.e., D2 enters the voltage regulation operating range), limiting the FLASH_FRONT_V voltage within an acceptable range, providing voltage regulation protection, and preventing interface overvoltage damage. This ensures that the FLASH_FRONT_V voltage signal remains within the acceptable voltage range of the processing module 3 before and after the strobe light flashes, improving sampling accuracy and system reliability.

[0074] In one embodiment, the first voltage divider circuit 10 and the first Zener diode D2 cooperate to keep FLASH_FRONT_V within the allowable range of the processing module 3, thereby ensuring the reliability of the first voltage sampling signal FLASH_FRONT_V.

[0075] In this disclosure, such as Figure 2 As shown, the second sampling circuit 2 includes:

[0076] The charging resistor R3 has one end coupled to the anode IN+ of the strobe lamp tube and the other end connected to the second node N2, which is used to transfer the voltage of FLASHLED_V to the second node N2 through current limiting.

[0077] The second diode D3 has its negative terminal connected to the lamp anode IN+ and its positive terminal connected to the second node N2. It is used to prevent reverse current backflow during strobe and to ensure that the second capacitor C2 stores energy.

[0078] The second capacitor C2 is connected in parallel between the second node N2 and the reference voltage terminal AC_N. It is used to maintain the voltage of the second node N2 after the strobe light flashes, and temporarily maintain the voltage before the strobe light for the processing module 3 to sample.

[0079] The second voltage divider circuit 20 is connected in parallel with the second capacitor C2 and coupled between the second node N2 and the reference voltage terminal AC_N. The output terminal N3 of the second voltage divider circuit 20 serves as the second output terminal OUT2.

[0080] In this embodiment, charging resistor R3 is used to slowly charge C2 before the strobe light flashes, causing the voltage at the second node N2 to increase with the change in the anode IN+ voltage of the lamp tube. D3 is reverse-biased and cut off before the strobe light flashes to prevent C2 from discharging prematurely; after the strobe light flashes, D3 is turned on to form a discharge path, causing the voltage VBACK at the second node N2 to drop rapidly to the level of FLASHLED_V plus the forward voltage drop of D3, generating a stable second voltage sampling signal FLASH_BACK_V2.

[0081] The second capacitor C2 stores energy before the strobe effect to keep the voltage VBACK of the second node N2 stable. After the strobe effect, it works with D3 to control the voltage of the second node N2 to drop rapidly, providing a reliable second voltage sampling signal after the strobe effect for the processing module 3.

[0082] The second voltage divider circuit 20 is connected in parallel with C2 to reduce the high voltage of the second node N2 to a voltage range that the processing module 3 can safely sample, and output the final FLASH_BACK_V1 (before strobe) or FLASH_BACK_V2 (after strobe) signal.

[0083] Through this structure, the processing module 3 can receive the second voltage sampling signal before the strobe and the third voltage sampling signal after the strobe, and calculate the voltage difference ΔVfront and ΔVback in conjunction with the FLASH_FRONT_V signal output by the first sampling circuit 1, thereby accurately determining the light decay state of the strobe lamp.

[0084] In this embodiment, the strobe light decay detection device further includes a current-limiting resistor R4, which is connected in series with D3 and coupled between D3 and the lamp anode IN+, or can be coupled between D3 and the second node N2, to provide a controlled discharge path for C2 after the strobe light flashes. After the strobe light flashes, the voltage VBACK of the second node N2 is pulled down to FLASHLED_V plus the forward conduction voltage drop of D3 due to the path formed by R4 and D3. R4 can limit the discharge current of C2 from being too large and causing damage to the device, while realizing the rapid discharge of C2, so that the second output terminal OUT2 can reflect the voltage change in a timely manner after the strobe light flashes and maintain signal stability.

[0085] In this embodiment of the disclosure, the second voltage divider circuit 20 includes at least two second voltage divider resistors connected in series. Figure 2 An example is shown with two second voltage divider resistors R5 and R6, and the output terminal N3 of the second voltage divider circuit 20 is located between any two adjacent second voltage divider resistors R5 and R6.

[0086] In this embodiment, the voltage divider point (corresponding to N3) is formed by the series-connected second voltage divider resistors R5 and R6, which reduces the high voltage of the second node N2, so that the voltage of the second output terminal OUT2 is within the acceptable range of the processing module 3, thus ensuring the safety and accuracy of voltage sampling.

[0087] In this embodiment of the disclosure, the second sampling circuit 2 further includes:

[0088] The second Zener diode D4 has its anode connected to the reference voltage terminal AC_N and its cathode connected to the second output terminal OUT2.

[0089] In this embodiment, the second voltage divider circuit 20 has reduced the voltage VBACK of the second node N2 to a range acceptable to the processing module 3. However, under certain operating conditions, the output voltage of the second voltage divider circuit 20 may still exceed the upper limit of the processing module 3's withstand voltage due to power grid fluctuations, device deviations, or transient shocks, posing a risk of damage. Therefore, a Zener diode D4 is connected in parallel between the second output terminal OUT2 and the reference voltage terminal AC_N. When the voltage of OUT2 exceeds the Zener value of D4, D4 conducts and clamps the excessive voltage to the set Zener level, thereby further protecting the input port of the processing module 3 for safe operation.

[0090] Thus, D4 works synergistically with the second voltage divider circuit 20. The second voltage divider circuit 20 achieves primary voltage reduction, while D4 provides secondary protection against voltage overshoot, ensuring that the FLASH_BACK_V1 and FLASH_BACK_V2 signals remain stable within the safe range that the processing module 3 can withstand for a long time, thereby improving the reliability and anti-interference capability of the entire strobe light decay detection device.

[0091] like Figure 3 As shown, in this embodiment of the disclosure, the processing module 3 includes:

[0092] The differential operation unit 31 has two input terminals connected to the first output terminal OUT1 of the first sampling circuit 1 and the second output terminal OUT2 of the second sampling circuit 2, respectively, for:

[0093] Before the strobe light flashes, the first voltage sampling signal FLASH_FRONT_V and the second voltage sampling signal FLASH_BACK_V1 are received and differential operations are performed to obtain the first voltage difference ΔVfront.

[0094] After the strobe light flashes, the system receives the first voltage sampling signal FLASH_FRONT_V and the third voltage sampling signal FLASH_BACK_V2, and performs differential calculations to obtain the second voltage difference ΔVback.

[0095] The determination unit 32, whose input terminal is connected to the output terminal of the differential operation unit 31, is used to compare the first voltage difference ΔVfront with the second voltage difference ΔVback, and determine the light decay state of the strobe lamp based on the comparison result.

[0096] In this embodiment, the differential calculation unit 31 can output two sets of differential results at different time points before and after the flash, fully reflecting the changes in the lamp voltage before and after the flash.

[0097] In one implementation, for the determination unit 32, when the difference between ΔVfront and ΔVback exceeds a preset threshold (which can be determined by experimental calibration or system settings), it is determined that the strobe lamp has experienced light decay; conversely, when the difference is less than or equal to the preset threshold, the strobe lamp is determined to be in a normal state. This allows for real-time reflection of the degree of light decay during the strobe process without relying on photosensitive devices for detection, thus avoiding errors caused by light decay and temperature drift of photosensitive elements.

[0098] In an alternative implementation, the differential operation unit 31 can be implemented using an operational amplifier differential circuit to output an analog voltage difference signal (first voltage difference and second voltage difference), which is then sent to the determination unit 32.

[0099] In another alternative implementation, the differential operation unit 31 can also be implemented using an analog-to-digital converter (ADC) + digital processor. That is, after digitizing FLASH_FRONT_V, FLASH_BACK_V1, and FLASH_BACK_V2, the processor software calculates ΔVfront and ΔVback, and then the determination unit 32 compares the two and gives the light decay state.

[0100] Optionally, the determination unit 32 can be either a hardware logic circuit (such as a voltage comparator combined with a gate circuit) or a microcontroller (MCU). It can flexibly set preset thresholds and determination strategies through software algorithms and has configurability.

[0101] In this embodiment, the strobe light decay detection device may further include a display module connected to the processing module 3 for displaying the light decay status. Optionally, the display module may be an indicator light, illuminating a red light when light decay is detected and a green light when normal operation is achieved.

[0102] Optionally, the display module can also be a display screen or a light-emitting diode digital tube, used to display the percentage of light decay level or the "normal / light decay" status.

[0103] In addition, the display module can be omitted, and the optical decay status can be transmitted to the external controller through the communication interface (such as CAN bus, UART, etc.) for unified display by the external controller.

[0104] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the utility models disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the appended claims.

Claims

1. A strobe light decay detection device, characterized in that, include: The first sampling circuit is coupled between the anode of the strobe lamp and the first output terminal, and is used to collect the first voltage sampling signal of the anode of the lamp before the strobe lamp flashes, and to maintain the first voltage sampling signal after the strobe flashes. The second sampling circuit is coupled between the anode of the lamp tube and the second output terminal, and is used to collect the second voltage sampling signal of the anode of the lamp tube before the strobe light flashes, and to collect the third voltage sampling signal of the anode of the lamp tube after the strobe light flashes. Processing module, used for: Before the strobe light flashes, the first voltage sampling signal and the second voltage sampling signal are received, and the first voltage difference between the first voltage sampling signal and the second voltage sampling signal is calculated; After the strobe light flashes, the third voltage sampling signal and the first voltage sampling signal are received, and the second voltage difference between the first voltage sampling signal and the third voltage sampling signal is calculated. The first voltage difference is compared with the second voltage difference, and the light decay state of the strobe lamp is determined based on the comparison result.

2. The stroboscopic light decay detection device of claim 1, wherein, The first sampling circuit includes: A first diode, the positive terminal of which is connected to the anode of the lamp tube, and the negative terminal of which is connected to the first node; The first capacitor is coupled between the first node and the reference voltage terminal; A first voltage divider circuit is connected in parallel with the first capacitor and coupled between the first node and the reference voltage terminal. The output terminal of the first voltage divider circuit serves as the first output terminal.

3. The device according to claim 2, wherein The first voltage divider circuit includes at least two first voltage divider resistors connected in series, and the output terminal of the first voltage divider circuit is located between any two adjacent first voltage divider resistors.

4. The device according to claim 2, wherein The first sampling circuit further includes: A first Zener diode, the anode of which is connected to the reference voltage terminal, and the cathode of which is connected to the first output terminal.

5. The device of claim 1, wherein, The second sampling circuit includes: A charging resistor is coupled between the anode of the lamp tube and the second node; The second diode has its negative terminal connected to the anode of the lamp tube and its positive terminal connected to the second node. The second capacitor is coupled between the second node and the reference voltage terminal; The second voltage divider circuit is connected in parallel with the second capacitor and coupled between the second node and the reference voltage terminal. The output terminal of the second voltage divider circuit serves as the second output terminal.

6. The device according to claim 5, wherein The second voltage divider circuit includes at least two second voltage divider resistors connected in series, and the output terminal of the second voltage divider circuit is located between any two adjacent second voltage divider resistors.

7. The stroboscopic light decay detection apparatus of claim 6, wherein, The second sampling circuit also includes: The second Zener diode has its anode connected to the reference voltage terminal and its cathode connected to the second output terminal.

8. The device of claim 1, wherein, The processing module includes: The differential operation unit is connected to the first output terminal and the second output terminal, and is used to receive the first voltage sampling signal and the second voltage sampling signal and perform differential operation to output the first voltage difference, and to receive the first voltage sampling signal and the third voltage sampling signal and perform differential operation to output the second voltage difference; The determination unit, connected to the differential operation unit, is used to compare the first voltage difference with the second voltage difference and determine the light decay state of the strobe lamp based on the comparison result.

9. The device according to claim 8, wherein The differential operation unit includes a differential circuit composed of operational amplifiers.

10. The device of claim 1, wherein, The strobe light decay detection device also includes: The display module, connected to the processing module, is used to display the light decay state of the strobe light.

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