A conditioning device for testing semiconductors

Abstract

The utility model relates to the technical field of semiconductor test, concretely is a kind of adjusting device for testing semiconductor, including workstation, the outside of stand is provided with driving mechanism and adjusting mechanism, and the driving mechanism is used to drive the adjusting mechanism to run, the adjusting mechanism is used to adjust the circumferential angle position of the stand and the electric pen, the driving mechanism, the output end of electric push rod starts to carry out the telescopic movement of shaft, when its output end extends, push and fixedly connected with the moving block forward (towards the direction of orientation block) movement together, on the contrary, when electric push rod retracts, then drive moving block to move back, and the linear motion of moving block drives adjusting mechanism to run;The adjusting mechanism makes the dial of rotating state drive stand to rotate, the rotation of stand drives the synchronous rotation of electric pen on it, and each angle adjustment of electric pen is fixed and accurate, avoids the error caused by artificial shaking.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, specifically to an adjustment device for testing semiconductors. Background Technology

[0002] Semiconductors are materials whose conductivity lies between that of conductors (such as metals) and insulators (such as rubber). Their core characteristic is that their conductivity can be precisely controlled by adding impurities, applying an electric field, irradiating light, heating, and so on.

[0003] For example, in the patent with publication number CN211603436U, a control handle is fixedly connected to one side of the outer wall of the fixing block, and a handle is fixedly connected to one side of the outer wall of the fixing column. Then, according to the position of the semiconductor distribution, the operator can hold the handle with one hand and the control handle with the other hand to adjust the angle between the fixing column and the test pen.

[0004] However, with this adjustment method, the operator needs to pay attention to the control of both grips at the same time, and cannot fully concentrate on the precise alignment of the pen tip and the test point, which increases the risk of accidentally touching other pins and causing a short circuit. Therefore, an adjustment device for testing semiconductors is proposed. Utility Model Content

[0005] The purpose of this invention is to provide an adjustment device for testing semiconductors, so as to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, the present invention provides the following technical solution: an adjustment device for testing semiconductors, comprising a worktable, a column rotatably connected to the top of the worktable, an electric pen disposed on the surface of the column, a driving mechanism and an adjustment mechanism disposed on the outer side of the column, wherein the driving mechanism is used to drive the adjustment mechanism to operate, and the adjustment mechanism is used to adjust the circumferential angle position of the column and the electric pen.

[0007] The adjustment mechanism includes a dial, a lever and a positioning block, and multiple lever blocks;

[0008] Multiple dial blocks are arranged in a circular structure on the top of the dial. The lever in motion is used to drive the dial to rotate by passing through the dial blocks and along the trajectory of the outer wall of the positioning block.

[0009] Preferably, the inner side of the workbench is provided with a clamping mechanism for clamping a circuit board carrying semiconductors.

[0010] Preferably, the drive mechanism includes a fixed frame, an electric push rod, a connecting rod, and a moving block;

[0011] The fixed frame is fixedly connected to the top of the workbench, the electric push rod is fixedly installed on the outside of the fixed frame, the moving block is fixedly connected to the output end of the electric push rod, and one end of the connecting rod is rotatably connected to the top of the moving block.

[0012] Preferably, the output end of the electric push rod after being energized is used to drive the moving block to move axially, and the moving block in the moving state is used to drive the connecting rod to swing.

[0013] Preferably, the dial is rotatably connected to the top center of the fixed frame, and the dial is fixedly connected to the column.

[0014] Preferably, the positioning block is fixedly connected to the top edge of the fixing frame, and the positioning block and the movable block in an axially movable state are located on the same horizontal line.

[0015] Preferably, the other end of the connecting rod is rotatably connected to the top of the lever, and the lever has a Z-shaped structure.

[0016] Preferably, one side of the lever is slidably connected to the positioning block, and the other side of the lever is slidably connected to the lever block.

[0017] Compared with the prior art, the beneficial effects of this utility model are: the drive mechanism causes the output end of the electric push rod to begin axial extension and retraction. When the output end extends, it pushes the moving block fixedly connected to it to move forward (towards the positioning block). Conversely, when the electric push rod retracts, it drives the moving block to move backward, and the linear motion of the moving block drives the adjustment mechanism to operate.

[0018] This adjustment mechanism causes the rotating dial to drive the column to rotate, and the rotation of the column causes the test pen on it to rotate synchronously, realizing the adjustment of the circumferential angle position of the test pen. Furthermore, through the mechanical indexing structure (dial block, positioning block), each angle adjustment of the test pen is fixed and precise, avoiding errors caused by human jitter and effectively reducing the risk of short circuit caused by accidental contact with adjacent pins. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the main structure of the present utility model;

[0020] Figure 2 This is a side view of the structure of this utility model;

[0021] Figure 3 This is a schematic diagram of the drive mechanism structure of this utility model;

[0022] Figure 4 This is a schematic diagram of the adjustment mechanism of this utility model.

[0023] In the diagram: 1. Workbench; 2. Clamping mechanism; 3. Column; 4. Electric pen; 5. Drive mechanism; 501. Fixing frame; 502. Electric push rod; 503. Connecting rod; 504. Moving block; 6. Adjustment mechanism; 601. Dial; 602. Lever; 603. Pulley; 604. Positioning block. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Please see Figures 1-4 This utility model provides a technical solution for an adjustment device for testing semiconductors: an adjustment device for testing semiconductors includes a worktable 1, a column 3 rotatably connected to the top of the worktable 1, an electric pen 4 disposed on the surface of the column 3, a drive mechanism 5 and an adjustment mechanism 6 disposed on the outer side of the column 3, and the drive mechanism 5 is used to drive the adjustment mechanism 6 to operate, and the adjustment mechanism 6 is used to adjust the circumferential angle position of the column 3 and the electric pen 4.

[0026] The adjustment mechanism 6 includes a dial 601, a lever 602, a positioning block 604, and multiple lever blocks 603;

[0027] Multiple levers 603 are arranged in a circular structure on the top of the dial 601. The lever 602 in motion is used to drive the dial 601 to rotate by passing through the levers 603 and along the outer wall trajectory of the positioning block 604.

[0028] Please refer to this carefully. Figure 1 The inner side of the workbench 1 is provided with a clamping mechanism 2, which is used to clamp the circuit board containing semiconductors.

[0029] In this embodiment, the circuit board carrying the semiconductor to be tested is fixed by the clamping mechanism 2 inside the workbench 1 to ensure that it will not move during the test.

[0030] Please refer to this carefully. Figure 2 The drive mechanism 5 includes a fixed frame 501, an electric push rod 502, a connecting rod 503, and a moving block 504;

[0031] The fixed frame 501 is fixedly connected to the top of the workbench 1, the electric push rod 502 is fixedly installed on the outside of the fixed frame 501, the moving block 504 is fixedly connected to the output end of the electric push rod 502, and one end of the connecting rod 503 is rotatably connected to the top of the moving block 504.

[0032] In this embodiment: when the electric push rod 502 pushes the moving block 504 to move, the lever 602 generates a specific movement under the trajectory constraint of the positioning block 604. This movement causes the lever 602 to slide into the groove of a lever block 603. As the moving block 504 continues to move, the lever 602 moves along the trajectory of the positioning block 604. The part of the lever that contacts the lever block 603 will generate a tangential force. This force pushes the current lever block 603, thereby causing the entire dial 601 to rotate by a specific angle.

[0033] Please refer to this carefully. Figure 3 The output end of the electric push rod 502 after being powered on is used to drive the moving block 504 to move axially, and the moving block 504 in the moving state is used to drive the connecting rod 503 to swing.

[0034] In this embodiment: the output end of the electric push rod 502 in operation begins to perform axial extension and retraction. The output end of the electric push rod 502 drives the moving block 504 to perform linear motion together. The linear motion of the moving block 504 pushes one end of the connecting rod 503 that is rotatably connected to it.

[0035] Please refer to this carefully. Figure 4 The dial 601 is rotatably connected to the top center of the fixed frame 501, and the dial 601 is fixedly connected to the column 3.

[0036] In this embodiment: the rotating dial 601 drives the column 3 to rotate, and the rotation of the column 3 drives the electric pen 4 on it to rotate synchronously, so as to achieve precise adjustment of the circumferential angle position of the electric pen 4.

[0037] Please refer to this carefully. Figure 4 The positioning block 604 is fixedly connected to the top edge of the fixing frame 501, and the positioning block 604 and the movable block 504 in an axially movable state are located on the same horizontal line.

[0038] In this embodiment: Since the sliding groove on one side of the lever 602 is slidably connected to the fixed positioning block 604, the positioning block 604 acts as a cam guide rail, limiting the geometric path of the movement trajectory of the lever 602.

[0039] Please refer to this carefully. Figure 4 The other end of the connecting rod 503 is rotatably connected to the top of the lever 602, and the lever 602 has a Z-shaped structure.

[0040] In this embodiment: Since the lever 602 is designed with a "Z" shaped structure, and has grooves on both the upper and lower sides, it plays a key role in constraining and guiding its movement trajectory.

[0041] Please refer to this carefully. Figure 4One side of the lever 602 is slidably connected to the positioning block 604, and the other side of the lever 602 is slidably connected to the lever block 603.

[0042] In this embodiment: multiple dial blocks 603 are evenly distributed on the dial 601 in a circular pattern. Each dial block 603 corresponds to a division position. Whenever the lever 602 completes a full advance and return stroke (usually completed by one extension and retraction cycle of the electric push rod 502), it pushes the dial 601 forward by one division (i.e., moves from one dial block 603 position to the next dial block 603 position).

[0043] Working principle: First, the operator fixes the circuit board on the workbench 1 using the clamping mechanism 2 (two sets of springs, telescopic rods and clamping plates work together to clamp the two sides of the circuit board). Then, the electric push rod 502 is started, so that the output end of the electric push rod 502 in operation begins to perform axial telescopic movement. The output end of the electric push rod 502 drives the moving block 504 to move linearly together. The linear movement of the moving block 504 pushes one end of the connecting rod 503 that is rotatably connected to it. Since the other end of the connecting rod 503 is connected to the lever 602 of the adjusting mechanism 6, and there is a fulcrum in the middle (the rotation connection point of the moving block 504), the connecting rod 503 converts the linear movement into a fan-shaped swinging motion. The swinging of the connecting rod 503 drives the lever 602 at its other end to produce a compound motion.

[0044] One side of the lever 602 slides in a groove and is slidably connected to the fixed positioning block 604. The positioning block 604 acts as a cam guide, limiting the geometric path of the lever 602's movement trajectory. When the electric push rod 502 pushes the moving block 504 to move, the lever 602 generates a specific movement under the trajectory constraint of the positioning block 604. This movement causes the lever 602 to slide into the groove of a dial 603. As the moving block 504 continues to move, the lever 602 moves along the trajectory of the positioning block 604. The part of the lever that contacts the dial 603 generates a tangential force. This force pushes the current dial 603, thereby causing the entire dial 601 to rotate by a specific angle. The rotating dial 601 then causes the column 3 to rotate. The rotation of the column 3 causes the test pen 4 on it to rotate synchronously, realizing the adjustment of the circumferential angle position of the test pen 4, so that the test pen 4 can be accurately switched from one test point to the next adjacent test point.

[0045] It should be noted that the number of toggle blocks 603 on the dial 601 directly determines the rotation angle of the dial 601 each time the electric push rod 502 is activated. If there are 10 evenly distributed toggle blocks 603, then the dial 601 will rotate precisely 36° after each "push" or "pull" cycle. More toggle blocks 603 mean that the circumference can be divided into more equal parts, thus allowing the test pen 4 to have more stopping positions on the circumference, and more and denser test points can be tested. Furthermore, after the lever 602 disengages from the current toggle block 603, the contour of the next toggle block 603 will align with the track of the positioning block 604. The mechanism works in conjunction with the dial to form a locking arc, which firmly fixes the dial 601 in place, preventing it from wobbling freely during the interval and ensuring accuracy when stopped. The pushing distance of the moving block 504 (i.e., the stroke of the electric push rod 502) is decoupled from the indexing angle, meaning they do not affect each other. Thus, a relatively small pushing force from the electric push rod 502 can drive and lock a rotating component with a large load (such as the column 3 or the test pen 4). Furthermore, the mechanism itself has excellent self-locking properties at the stop position, allowing it to remain stably in the current position without being misaligned due to minor external forces or vibrations, thus ensuring the stability of the test.

[0046] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An adjustment device for testing semiconductors, comprising a worktable (1), wherein a column (3) is rotatably connected to the top of the worktable (1), and an electric pen (4) is disposed on the surface of the column (3), characterized in that: A drive mechanism (5) and an adjustment mechanism (6) are provided on the outside of the column (3), and the drive mechanism (5) is used to drive the adjustment mechanism (6) to operate, and the adjustment mechanism (6) is used to adjust the circumferential angle position of the column (3) and the electric pen (4); The adjustment mechanism (6) includes a dial (601), a lever (602), a positioning block (604), and multiple lever blocks (603); Multiple dial blocks (603) are arranged in a circumferential structure on the top of the dial (601). The lever (602) in motion is used to drive the dial (601) to rotate by passing through the dial blocks (603) and along the outer wall trajectory of the positioning block (604).

2. The conditioning apparatus for testing semiconductors of claim 1, wherein: The workbench (1) is provided with a clamping mechanism (2) on its inner side, which is used to clamp the circuit board containing semiconductors.

3. The conditioning apparatus for testing semiconductors of claim 1, wherein: The drive mechanism (5) includes a fixed frame (501), an electric push rod (502), a connecting rod (503), and a moving block (504); The fixed frame (501) is fixedly connected to the top of the workbench (1), the electric push rod (502) is fixedly installed on the outside of the fixed frame (501), the moving block (504) is fixedly connected to the output end of the electric push rod (502), and one end of the connecting rod (503) is rotatably connected to the top of the moving block (504).

4. The conditioning apparatus for testing semiconductors of claim 3, wherein: The output end of the electric push rod (502) after being powered on is used to drive the moving block (504) to move axially, and the moving block (504) in the moving state is used to drive the connecting rod (503) to swing.

5. The conditioning apparatus for testing semiconductors of claim 3, wherein: The dial (601) is rotatably connected to the top center of the fixed frame (501), and the dial (601) is fixedly connected to the column (3).

6. The conditioning apparatus for testing semiconductors of claim 3, wherein: The positioning block (604) is fixedly connected to the top edge of the fixing frame (501), and the positioning block (604) and the movable block (504) in an axially movable state are located on the same horizontal line.

7. The conditioning apparatus for testing semiconductors of claim 3, wherein: The other end of the connecting rod (503) is rotatably connected to the top of the lever (602), and the lever (602) has a Z-shaped structure.

8. The conditioning apparatus for testing semiconductors of claim 1, wherein: One side of the lever (602) is slidably connected to the positioning block (604), and the other side of the lever (602) is slidably connected to the lever block (603).

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