A voltage monitoring system for a multi-chip electronic system

Abstract

The utility model relates to a kind of voltage monitoring system for multi-chip electronic system.System includes: analog input interface module, for receiving measured voltage signal, its inside configuration has voltage dividing resistor network to the measured voltage signal performs voltage division;Filter module, for performing filter processing to voltage signal after voltage division;ADC conversion module, for converting analog voltage signal after filtering into digital voltage signal;MCU host module, for parsing the digital voltage signal and executing abnormal monitoring, when voltage anomaly is monitored, at least one way DAC channel output abnormal voltage by the MCU host module;Analog output module, for outputting the abnormal voltage provided by the DAC channel.This system provided by the utility model can realize complex global voltage monitoring, with the characteristics of high measurement accuracy, multiple voltage measurement channels.

Description

Technical Field

[0001] This utility model relates to the field of electronic technology, and in particular to a voltage monitoring system for multi-chip electronic systems. Background Technology

[0002] Modern high-performance electronic systems, such as communication equipment, industrial controllers, and autonomous driving domain controllers, commonly employ multi-chip processing architectures. The CPU primarily handles main control computation, the FPGA implements high-speed logic processing, and the MCU manages real-time peripherals. These chips cooperate to achieve complex system engineering. However, the operating voltage requirements of main control chips such as CPUs and FPGAs differ, such as 0.8V, 1.0V, 1.2V, 1.8V, and 3.3V. Furthermore, chip manufacturers have strict requirements for power supply timing; timing abnormalities can lead to latch-up effects, bus contention, or functional failure.

[0003] Typically, multiple dedicated power management ICs are used to monitor the power supply voltage of chips on the board in different areas. However, this method has high BOM costs, complex PCB layout, and cannot be directly monitored from outside the board. External monitoring requires flying wires on the PCB and capturing the waveforms of relevant core voltages with an oscilloscope. Due to the limited number of channels on a single oscilloscope and the actual chip package size, this method is time-consuming, labor-intensive, and cumbersome during the debugging and troubleshooting phases, resulting in long debugging cycles and poor performance. Utility Model Content

[0004] The objective of this invention is to provide a voltage monitoring system for multi-chip electronic systems. This system solves the problem of difficult voltage monitoring in multi-chip systems in the prior art, and can monitor voltage anomalies in multiple channels of a single chip or multiple channels of multiple chips.

[0005] The aforementioned task is solved by a voltage monitoring system for a multi-chip electronic system, wherein the multi-chip electronic system comprises multiple chips, and the system includes:

[0006] An ADC conversion module having multiple input ADC channels configured to convert analog voltage signals into digital voltage signals, wherein the analog voltage signals include multiple analog voltage signals input from the multiple chips respectively, or multiple analog voltage signals input from a single chip; and

[0007] The MCU main control module is configured to monitor the voltage of the plurality of digital voltage signals and output an abnormal voltage value when the voltage is abnormal.

[0008] Furthermore, the voltage monitoring system for multi-chip electronic systems also includes:

[0009] An analog input interface module is configured to receive measured voltage signals from multiple chips and has a voltage divider resistor network configured to perform voltage division on the measured voltage signals; and / or

[0010] A filtering module, configured to perform filtering processing on the measured voltage signal; and / or

[0011] The analog output module is configured to output an analog voltage signal converted from the digital voltage signal by the MCU main control module.

[0012] The voltage signal under test includes multiple voltage signals from the CPU, FPGA, or MCU main control module chip in the system under test.

[0013] Furthermore, the plurality of chips includes one or more of the following: CPU, FPGA, MCU main control module, and ASIC; and / or

[0014] Voltage anomalies include one or more of the following: voltage exceeding the upper voltage limit, voltage falling below the lower voltage limit, and voltage fluctuations exceeding the permissible fluctuation value; and / or

[0015] The voltage divider resistor network switches to the appropriate voltage divider level according to the voltage range of the measured voltage signal to meet different voltage monitoring requirements.

[0016] Furthermore, the voltage divider resistor network of the analog input interface module supports a voltage input range of 0.8V to 3.3V.

[0017] Furthermore, the MCU main control module has multiple output DAC channels respectively connected to the multiple input ADC channels, wherein each DAC channel is configured to convert a digital voltage signal into an analog voltage signal, wherein:

[0018] When the voltages of multiple input ADC channels of the ADC conversion module are all normal, at least one DAC channel of the MCU main control module outputs 0V voltage; and / or

[0019] When a voltage anomaly is detected in a single input ADC channel of the ADC conversion module, a preset anomaly characterization voltage value is output by at least one DAC channel of the MCU main control module; and / or

[0020] When an abnormal voltage is detected in multiple input ADC channels of the ADC conversion module, the multiple DAC channels of the MCU main control module cyclically output multiple abnormal voltage values ​​according to a preset pulse width; and / or

[0021] When the same analog voltage signal is input to multiple input ADC channels and the voltage values ​​in multiple input ADC channels are abnormal, a different custom characterization voltage value is assigned to each abnormal channel.

[0022] Furthermore, the preset pulse width is 100ms.

[0023] Furthermore, the ADC conversion module uses a combination of multiple ADC chips to expand the number of synchronous sampling channels.

[0024] Furthermore, the ADC conversion module uses a 24-bit synchronous sampling ADC chip, supporting at least 24 channels for synchronous sampling of voltage signals.

[0025] Furthermore, the voltage monitoring system for multi-chip electronic systems also includes a power supply module, which is connected to the ADC conversion module and the MCU main control module.

[0026] Furthermore, the voltage monitoring system for the multi-chip electronic system is set up independently of the multi-chip electronic system under test, and the voltage monitoring system for the multi-chip electronic system is connected to the system under test through the analog input interface module.

[0027] The technical solution provided by this utility model has the following advantages:

[0028] 1. The voltage monitoring system for multi-chip electronic systems proposed in this utility model is independent of the multi-chip electronic system being measured and does not affect the operation of the original system. It can realize complex full-domain and cross-domain voltage monitoring and has the characteristics of high measurement accuracy, multiple voltage measurement channels, no monitoring blind spots, and wide applicability.

[0029] 2. The voltage monitoring system for multi-chip electronic systems proposed in this utility model can effectively reduce debugging complexity, improve debugging efficiency, and shorten the debugging cycle during the board-level circuit debugging or troubleshooting stage, thereby reducing R&D costs.

[0030] 3. The voltage monitoring system for multi-chip electronic systems proposed in this utility model uses different voltage values ​​output by a DAC to represent abnormalities in different channels, eliminating the need for complex communication protocols and providing intuitive diagnosis.

[0031] 4. The voltage monitoring system for multi-chip electronic systems proposed in this utility model has an expandable number of ADC channels and programmable abnormal output rules, making it suitable for different application scenarios. Attached Figure Description

[0032] To further illustrate the above and other advantages and features of the various embodiments of the present invention, a more specific description of the various embodiments of the present invention will be presented with reference to the accompanying drawings. It is to be understood that these drawings depict only typical embodiments of the present invention and are therefore not intended to limit its scope. In the drawings, for clarity, the same or corresponding parts will be indicated by the same or similar reference numerals.

[0033] Figure 1 This invention provides a schematic diagram of the structure of a voltage monitoring system for a multi-chip electronic system according to an embodiment of the present invention.

[0034] Figure 2 A schematic diagram of a voltage monitoring system for a multi-chip electronic system according to another embodiment of the present invention is shown; and

[0035] Figure 3 A schematic diagram of the structure of a voltage monitoring system for a multi-chip electronic system according to another embodiment of the present invention is shown. Detailed Implementation

[0036] In the following description, the present invention is described with reference to various embodiments. However, those skilled in the art will recognize that the embodiments may be implemented without one or more specific details or with other alternatives and / or additional methods or components. In other instances, well-known structures or operations are not shown or described in detail so as not to obscure the inventive aspects of the present invention. Similarly, for illustrative purposes, specific numbers and configurations are set forth to provide a comprehensive understanding of embodiments of the present invention. However, the present invention is not limited to these specific details.

[0037] In this specification, references to "an embodiment" or "this embodiment" mean that a particular feature, structure, or characteristic described in connection with that embodiment is included in at least one embodiment of the present invention. The phrase "in one embodiment" appearing throughout this specification does not necessarily refer to all of the same embodiment.

[0038] In this invention, the modules of the system according to this invention can be implemented using software, hardware, firmware, or a combination thereof. When a module is implemented using software, its function can be achieved through computer program flow. For example, the module can be implemented using code segments (such as code segments in languages ​​like C and C++) stored in a storage device (such as a hard disk or memory). When the code segments are executed by a processor, the corresponding function of the module can be achieved. When a module is implemented using hardware, its function can be achieved by setting up a corresponding hardware structure. For example, the module's function can be achieved by hardware programming a programmable device such as a Field-Programmable Gate Array (FPGA), or by designing an Application-Specific Integrated Circuit (ASIC) that includes multiple transistors, resistors, and capacitors. When a module is implemented using firmware, the module's function can be written into a read-only memory such as an EPROM or EEPROM in the form of program code, and the corresponding function of the module can be achieved when the program code is executed by a processor. In addition, some functions of the module may need to be implemented by separate hardware or by working in cooperation with the hardware. For example, the detection function is implemented by the corresponding sensor (such as a proximity sensor, accelerometer, gyroscope, etc.), the signal transmission function is implemented by the corresponding communication device (such as a Bluetooth device, infrared communication device, baseband communication device, Wi-Fi communication device, etc.), the output function is implemented by the corresponding output device (such as a display, speaker, etc.), and so on.

[0039] This invention aims to solve the problems of difficult voltage monitoring and inability to quickly locate and output faults in multi-chip systems in existing technologies. By constructing a hardware-level multi-channel high-speed acquisition network, this invention can achieve full-domain voltage monitoring of a single complex system or cross-domain voltage collaborative monitoring of different tested systems, eliminating monitoring blind spots, improving response speed, and reducing system debugging cycle and maintenance costs.

[0040] Figure 1 A schematic diagram of a voltage monitoring system for a multi-chip electronic system according to an embodiment of the present invention is shown below. Figure 1 This invention provides a description of the voltage monitoring system for multi-chip electronic systems proposed in this utility model. For example... Figure 1 As shown, the voltage monitoring system for a multi-chip electronic system includes an analog input interface module 101, a filtering module 102, an ADC conversion module 103, an MCU main control module 104, an analog output module 105, and a power supply module 106.

[0041] A multi-chip electronic system includes multiple chips. In one embodiment of this invention, the multiple chips include one or more of the following: CPU, FPGA, MCU main control module, and ASIC.

[0042] The analog input interface module 101 receives measured voltage signals from multiple chips. Internally, it includes a voltage divider resistor network configured to divide the measured voltage signals. This network switches to an appropriate voltage divider level based on the voltage range of the measured voltage signal to meet different voltage monitoring requirements. In one embodiment, the voltage divider resistor network of the analog input interface module supports a voltage input range of 0.8V to 3.3V. In another embodiment, the voltage divider resistor network acquires data via an ADC chip. When the chip's VREF reference voltage is 5V, the acquired voltage range is ±5V, adaptable to the power supply voltages of FPGAs and CPUs.

[0043] The filtering module 102 is connected to the analog input interface module 101. The filtering module 102 is used to perform filtering processing on the voltage signal after voltage division, filter out noise interference and further improve the quality of the voltage signal.

[0044] The ADC conversion module 103 is connected to the filtering module 102. The ADC conversion module 103 has multiple input ADC channels, which are configured to convert analog voltage signals into digital voltage signals and output them to the MCU main control module for processing. The analog voltage signals include multiple analog voltage signals input from the multiple chips or multiple analog voltage signals input from a single chip. In one embodiment of this invention, the ADC conversion module 103 can be a high-precision ADC conversion module. Compared to ordinary ADC conversion modules, high-precision ADC conversion modules have higher resolution and sampling rate, making them suitable for scenarios with high precision requirements. In one embodiment of this invention, the ADC conversion module can use multiple ADC chips combined to expand the number of synchronous sampling channels, which can be expanded to more than 24 channels depending on the actual situation. In one embodiment of this invention, the ADC conversion module uses a 24-bit synchronous sampling ADC chip, supporting at least 24 high-precision voltage signal synchronous sampling channels. For example, an 8-channel, 24-bit synchronous sampling ADC chip from Analog Devices (ADI), such as the AD7768, can be used. In one embodiment of this invention, the measured voltage acquisition function can be achieved by replacing the ADC conversion chip with one of different precision. In one embodiment of this invention, different numbers of voltage acquisition functions can be achieved by reducing or increasing the number of ADC conversion chips. In another embodiment of this invention, the voltage divider resistor network or the ADC chip can perform noise suppression through a built-in filter circuit.

[0045] The MCU main control module 104 is connected to the ADC conversion module 103. The MCU main control module 104 is used to analyze digital voltage signals and perform anomaly monitoring. When a voltage anomaly is detected, at least one DAC channel of the MCU main control module outputs the abnormal voltage. In one embodiment of this invention, the MCU main control module can be an STMicroelectronics STM32H743VIT6 processor, which directly analyzes the voltage data from the AD7768. Voltage anomalies include one or more of the following: voltage exceeding the upper voltage limit, voltage falling below the lower voltage limit, and voltage fluctuation exceeding the allowable fluctuation value. In one embodiment of this invention, the upper voltage limit can be 105% to 110% of the rated value of the supply voltage to be detected, the lower voltage limit can be 90% to 95% of the rated value of the supply voltage to be detected, and the allowable fluctuation value can be ±2% to ±5% of the rated value of the supply voltage to be detected.

[0046] The analog output module 105 is connected to the MCU main control module 104. The analog output module 105 is used to output the analog voltage signal converted from the digital voltage signal by the MCU main control module. That is, the output of the analog output module is generated by the DAC channel inside the MCU main control module.

[0047] It should be noted that the health status of multiple measured voltages of the CPU and FPGA is independently characterized by the output voltage of one on-chip DAC channel of the MCU main control module. The MCU main control module has multiple output DAC channels, each connected to multiple input ADC channels, wherein each DAC channel is configured to convert a digital voltage signal into an analog voltage signal. Taking the FPGA as an example, when the voltages of multiple input ADC channels of the ADC conversion module are all detected to be normal, at least one DAC channel of the MCU main control module outputs a 0V voltage; and / or

[0048] When a voltage anomaly is detected in a single input ADC channel of the ADC conversion module, at least one DAC channel of the MCU main control module outputs a preset anomaly characterization voltage value; and / or when voltage anomalies are detected in multiple input ADC channels of the ADC conversion module, multiple DAC channels of the MCU main control module cyclically output multiple anomaly characterization voltage values ​​according to a preset pulse width; and / or when the same analog voltage signal is input to multiple input ADC channels and the voltage values ​​in multiple input ADC channels are abnormal, a different custom characterization voltage value is assigned to each anomaly. In one embodiment of this utility model, the preset pulse width can be 100ms or other values.

[0049] It should be noted that the timing of the cyclic pulse width output is configurable. First, based on the selected FPGA and CPU models, the specific quantity and type of power supply voltage must be confirmed. There may be identical voltages; for example, an FPGA may have two 1.8V power supplies, and both may be indicated by the same DAC output for anomalies. In this case, differentiation is necessary. 1V and 1.5V can be used to represent anomalies in the first and second 1.8V power supplies, respectively, as shown in Table 1. The voltage monitoring system for multi-chip electronic systems provided by this invention can monitor abnormal power supply voltages of complex chips such as FPGAs or CPUs with minimal DAC resources, even when MCU main control module resources are limited.

[0050] Table 1. Output voltage of DAC channel during voltage abnormalities.

[0051]

[0052]

[0053] The power module 106 is connected to the ADC conversion module 103 and the MCU main control module 104. The power module 106 provides independent power for the voltage monitoring system used in multi-chip electronic systems, and can support a wide voltage input from 60V to 460V.

[0054] It should be noted that the voltage monitoring system for multi-chip electronic systems is independent of the settings of the multi-chip electronic system under test, and there is no risk of mutual dependence or interference. The voltage monitoring system for multi-chip electronic systems is connected to the system under test through an analog input interface module.

[0055] Figure 2 A schematic diagram of a voltage monitoring system for a multi-chip electronic system according to another embodiment of the present invention is shown. Figure 2 As shown, the multi-chip electronic system includes multiple chips 201. The voltage monitoring system for the multi-chip electronic system includes an ADC conversion module 202 and an MCU main control module 203. The multiple chips 201 respectively input multiple analog voltage signals to the ADC conversion module 202. The ADC conversion module 202 has multiple input ADC channels, which convert the multiple input analog voltage signals into digital voltage signals and output them to the MCU main control module 203 for processing.

[0056] Figure 3 A schematic diagram of a voltage monitoring system for a multi-chip electronic system, according to another embodiment of the present invention, is shown. Figure 3As shown, the multi-chip electronic system includes a single chip 301, and the voltage monitoring system for the multi-chip electronic system includes an ADC conversion module 302 and an MCU main control module 303. The single chip 301 inputs multiple analog voltage signals to the ADC conversion module 302. The ADC conversion module 302 has multiple input ADC channels, which convert the multiple input analog voltage signals into digital voltage signals and output them to the MCU main control module 303 for processing.

[0057] The voltage monitoring system for multi-chip electronic systems provided by this invention uses a preset abnormal voltage output by the MCU main control module to characterize the health status of the system under test based on the real-time monitoring of the health status of various voltages. In one embodiment of this invention, the voltage monitoring system for multi-chip electronic systems can be supplemented with an analog display module to display the abnormal voltage in a real-time dynamic form.

[0058] Traditional solutions using multiple oscilloscopes can only measure signals on the PCB using probes, which is inconvenient and difficult to operate when monitoring multiple voltages. The voltage monitoring system for multi-chip electronic systems provided by this invention can significantly reduce fault location time.

[0059] The voltage monitoring system for multi-chip electronic systems proposed in this invention is independent of the multi-chip electronic system under test and does not affect the original system's operation. It can achieve complex full-domain and cross-domain voltage monitoring, and features high measurement accuracy, multiple voltage measurement channels, no monitoring blind spots, and wide applicability. During the board-level circuit debugging or troubleshooting stage, it can effectively reduce debugging complexity, improve debugging efficiency, and shorten the debugging cycle, thereby reducing R&D costs. Different voltage values ​​are output by the DAC to represent anomalies in different channels, eliminating the need for complex communication protocols and making diagnosis intuitive. The number of ADC channels is expandable, and the anomaly output rules are programmable to adapt to different application scenarios.

[0060] In one embodiment of this utility model, a method for monitoring voltage in a multi-chip electronic system is also provided, the method comprising the following steps:

[0061] The analog input interface module receives multiple measured voltage signals and performs voltage division adaptation through a voltage divider resistor network.

[0062] The voltage-divided signal is filtered by the filtering module.

[0063] The filtered analog voltage signal is converted into a digital signal using an ADC conversion module.

[0064] The MCU main control module analyzes digital signals to determine if the voltage of each channel is abnormal; and

[0065] If a voltage anomaly is detected, the analog output module is controlled via the DAC channel of the MCU main control module to output a specific voltage value corresponding to the abnormal channel for fault indication. When multiple voltage anomalies occur simultaneously, the MCU main control module controls the DAC channel to cyclically output the voltage value corresponding to each abnormal channel according to a preset cycle.

[0066] Although various embodiments of the present invention have been described above, it should be understood that they are presented by way of example only and not as limitations. It will be apparent to those skilled in the art that various combinations, modifications, and alterations can be made without departing from the spirit and scope of the present invention. Therefore, the breadth and scope of the present invention disclosed herein should not be limited by the exemplary embodiments disclosed above, but should be defined according to the technical solutions of the present invention and their equivalents.

Claims

1. A voltage monitoring system for a multi-chip electronic system, wherein the multi-chip electronic system comprises multiple chips, characterized in that, include: An ADC conversion module having multiple input ADC channels configured to convert analog voltage signals into digital voltage signals, wherein the analog voltage signals include multiple analog voltage signals input from the multiple chips respectively, or multiple analog voltage signals input from a single chip; and The MCU main control module is configured to monitor the voltage of the plurality of digital voltage signals and output an abnormal voltage value when the voltage is abnormal.

2. The voltage monitoring system for a multi-chip electronic system according to claim 1, characterized in that, Also includes: An analog input interface module is configured to receive measured voltage signals from multiple chips and has a voltage divider resistor network configured to perform voltage division on the measured voltage signals; and / or A filtering module, configured to perform filtering processing on the measured voltage signal; and / or The analog output module is configured to output an analog voltage signal converted from the digital voltage signal by the MCU main control module; The voltage signal under test includes multiple voltage signals from the CPU, FPGA, or MCU main control module chip in the system under test.

3. The voltage monitoring system for a multi-chip electronic system according to claim 2, characterized in that, The plurality of chips includes one or more of the following: CPU, FPGA, MCU main control module, and ASIC; and / or Voltage anomalies include one or more of the following: voltage exceeding the upper voltage limit, voltage falling below the lower voltage limit, and voltage fluctuations exceeding the permissible fluctuation value; and / or The voltage divider resistor network switches to the appropriate voltage divider level according to the voltage range of the measured voltage signal to meet different voltage monitoring requirements.

4. The voltage monitoring system for a multi-chip electronic system according to claim 2, characterized in that, The voltage divider resistor network of the analog input interface module supports a voltage input range of 0.8V to 3.3V.

5. The voltage monitoring system for a multi-chip electronic system according to claim 1, characterized in that, The MCU main control module has multiple output DAC channels respectively connected to the multiple input ADC channels, wherein each DAC channel is configured to convert a digital voltage signal into an analog voltage signal, wherein: When the voltages of multiple input ADC channels of the ADC conversion module are all normal, at least one DAC channel of the MCU main control module outputs 0V voltage; and / or When a voltage anomaly is detected in a single input ADC channel of the ADC conversion module, a preset anomaly characterization voltage value is output by at least one DAC channel of the MCU main control module; and / or When an abnormal voltage is detected in multiple input ADC channels of the ADC conversion module, the multiple DAC channels of the MCU main control module cyclically output multiple abnormal voltage values ​​according to a preset pulse width; and / or When the same analog voltage signal is input to multiple input ADC channels and the voltage values ​​in multiple input ADC channels are abnormal, a different custom characterization voltage value is assigned to each abnormal channel.

6. The voltage monitoring system for a multi-chip electronic system according to claim 5, characterized in that, The preset pulse width is 100ms.

7. The voltage monitoring system for a multi-chip electronic system according to claim 1, characterized in that, The ADC conversion module uses a combination of multiple ADC chips to expand the number of synchronous sampling channels.

8. The voltage monitoring system for a multi-chip electronic system according to claim 1, characterized in that, The ADC conversion module uses a 24-bit synchronous sampling ADC chip, which supports at least 24 channels of synchronous sampling of voltage signals.

9. The voltage monitoring system for a multi-chip electronic system according to claim 1, characterized in that, It also includes a power module, which is connected to the ADC conversion module and the MCU main control module.

10. The voltage monitoring system for a multi-chip electronic system according to claim 2, characterized in that, The voltage monitoring system for the multi-chip electronic system is set up independently of the multi-chip electronic system under test, and the voltage monitoring system for the multi-chip electronic system is connected to the system under test through the analog input interface module.

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