An EFIS panel automatic test system

Abstract

The utility model relates to test system technical field discloses a kind of for EFIS panel automatic test system, including power unit, test circuit unit and host computer, the power unit with the test circuit unit and host computer electrically connected, the test circuit unit is connected with EFIS panel communication, for the digital signal required for simulation test, sending test instruction, receiving test data and the discrete signal of acquisition EFIS panel output;The host computer with the test circuit unit communication connection, for sending test control instruction, processing test data and display test result;Can realize the function detection to EFIS panel, compared with traditional ATEC6 test bench test, realize low cost, strong replicability;Maintenance cost is low, and conventional test equipment maintenance needs regular TPM and self-checking test, the potential maintenance cost of the present application is reduced from design, so that equipment operation is more efficient;Can be tested automatically by host computer, the overall test speed is fast, and efficiency is high.

Description

Technical Field

[0001] This utility model relates to the field of testing system technology, and specifically to an automatic testing system for EFIS panels. Background Technology

[0002] Existing EFIS panel testing methods all require the use of original equipment manufacturer (OEM) testing equipment, which involves cumbersome procedures and complex methods, and fails to effectively detect potential faults in the EFIS panel. During EFIS panel repair, a test bench is needed for troubleshooting and verification to confirm its functionality. This verification is typically performed on the ATEC6 equipment, which integrates numerous test instruments and resources, resulting in high investment costs, high equipment occupancy, and inconvenience in relocation. Therefore, there is a need for a simple, easy-to-use, and portable testing device specifically for EFIS panels. Currently, such equipment does not exist. Utility Model Content

[0003] In view of the shortcomings of the existing technology, the purpose of this utility model is to provide an automatic testing system for EFIS panels.

[0004] To achieve the above objectives, this utility model provides the following technical solution:

[0005] An automatic testing system for an EFIS panel includes a power supply unit, a test circuit unit, and a host computer. The power supply unit is electrically connected to the test circuit unit and the host computer. The test circuit unit is communicatively connected to the EFIS panel and is used to simulate digital signals required for testing, send test commands, receive test data, and acquire discrete signals output by the EFIS panel. The host computer is communicatively connected to the test circuit unit and is used to send test control commands, process test data, and display test results.

[0006] In this invention, preferably, the power supply unit includes an AC / DC conversion module and a DC-DC power supply module connected together. The AC / DC conversion module converts the input 220VAC AC power into 28VDC DC power required for testing. The DC-DC power supply module is used to convert the 28VDC DC power into a 5V DC power supply to power the EFIS panel.

[0007] In this utility model, preferably, the AC / DC conversion module includes an AC / DC converter (ACDC_PS), the input terminal of which is connected in series with a switch S1 and a fuse F1 and then connected to a 220VAC AC input interface P4, and the output is connected to the DC / DC power module, the output of which is connected to the EFIS panel.

[0008] In this invention, preferably, the input terminal of the DC-DC power module U1 is connected in series with a single-pole switch S1 and then connected to connector J3, which is an external power input port. Simultaneously, capacitors C3 and C5 are connected in series with the input terminal and then grounded to suppress power supply noise, stabilize the input voltage, and prevent interference with subsequent circuits. Its output terminals are connected to connectors J1, J2, and J4, and capacitors C1, C2, and C4 are connected in series with the output terminal and then grounded. Capacitors C1, C2, and C4 are used to stabilize the output voltage, further filtering out the ripple after conversion, making the output voltage purer, and meeting the power quality requirements of subsequent circuits. The output terminals of the DC-DC power module U1 are also connected in series with light-emitting diodes D1, D2, and D3 to indicate the power operating status of the corresponding output terminals.

[0009] In this invention, preferably, the test circuit unit includes an optocoupler chip group and a relay group, the optocoupler chip group is connected to the relay group, and the relay group is connected to the EFIS panel.

[0010] In this invention, preferably, the test circuit unit further includes a serial communication driver RS232 circuit, which is used to communicate with the EFIS panel and to send test commands and receive test data.

[0011] In this invention, preferably, the test circuit unit further includes a decoder HI8282J, which is connected to the EFIS panel and is used to receive ARINC429 information sent by the EFIS panel and decode the information.

[0012] In this invention, preferably, the test circuit further includes a control branch, which includes an optocoupler chip U1 and relays K1 and K2. The optocoupler chip U1 is connected to the relays K1 and K2, and the relays K1 and K2 are connected to the EFIS panel. Pins 1 and 7 of the relay K1 are connected in series with resistors R4 and R8, respectively, and then connected to a 5VAC power supply. The 5VAC power supply is the power supply for the front panel lights of the EFIS panel. Pins 1 and 7 of the relay K2 are connected in series with resistor R20 and then connected to a 28VDC power supply. The 28VDC power supply is the main power supply for the EFIS panel. Pin 8 of both the relays K1 and K2 is grounded.

[0013] In this invention, preferably, the test circuit further includes an extension branch, which includes extension chips U22-U26. The extension chips U22-U26 are respectively connected to resistor arrays RP1-RP10. Every two resistor arrays are connected to four dual-path optocouplers. The dual-path optocouplers are connected to the EFIS panel through dual-row pins JP2 to realize the control of various discrete quantities of the EFIS panel.

[0014] Compared with the prior art, the beneficial effects of this utility model are:

[0015] This invention's system is applicable to EFIS panel testing and can perform functional testing on EFIS panels. Compared with traditional ATEC6 test bench testing, it has lower implementation costs, stronger replicability, and lower maintenance costs. Traditional test equipment requires regular TPM and self-testing, while this invention reduces potential maintenance costs from the design perspective, making the equipment operate more efficiently. It can perform automatic testing through a host computer, resulting in fast overall testing speed and high efficiency. Attached Figure Description

[0016] Figure 1 This is a structural block diagram of an EFIS panel automatic testing system according to the present invention.

[0017] Figure 2 This is a schematic diagram of the circuit structure of the power supply unit described in this utility model.

[0018] Figure 3 This is a schematic diagram of the circuit structure of the DC-DC power module described in this utility model.

[0019] Figure 4 This is a schematic diagram of the test circuit described in this utility model. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] It should be noted that when a component is described as "fixed to" another component, it can be directly on the other component or may have a component in between. When a component is considered "connected to" another component, it can be directly connected to the other component or may have a component in between. When a component is considered "set on" another component, it can be directly set on the other component or may have a component in between. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0023] Please also see Figures 1 to 4 This utility model provides an automatic testing system for EFIS panels, offering a dedicated testing environment for EFIS panels to achieve more efficient and effective testing, improve the overall quality and reliability of EFIS panels, and ensure their safe and effective application in modern aviation. The system specifically includes a power supply unit, a test circuit unit, and a host computer. The power supply unit is electrically connected to the test circuit unit and the host computer. The test circuit unit is communicatively connected to the EFIS panel and is used to simulate the digital signals required for testing, send test commands, receive test data, and acquire discrete signals output by the EFIS panel. The host computer is communicatively connected to the test circuit unit and is used to send test control commands, process test data, and display test results.

[0024] Specifically, the power supply unit includes an AC / DC converter module and a DC-DC power module connected together. The AC / DC converter module converts the input 220VAC AC power into 28VDC DC power required for testing. The DC-DC power module converts the 28VDC DC power into a 5V DC power supply to power the EFIS panel. The system is directly connected to 220VAC / 50Hz AC mains power. The AC / DC converter module converts the 220VAC AC power into 28VDC DC power for the testing system, and the DC-DC power module converts the 28VDC DC power into a 5V DC power supply for the EFIS panel.

[0025] In this embodiment, the AC / DC conversion module includes an AC / DC converter (ACDC_PS). The input terminal of the AC / DC converter is connected in series with switch S1 and fuse F1, then connected to a 220VAC AC input interface P4. The output is connected to the DC / DC power module, and the output of the DC / DC power module is connected to the EFIS panel. The single-pole switch S1 is the system's main power switch.

[0026] In this embodiment, the input terminal of the DC-DC power module U1 is connected in series with a single-pole switch S1 and then connected to connector J3. Connector J3 is the external power input port. Simultaneously, capacitors C3 and C5 are connected in series with the input terminal and then grounded to suppress power noise, stabilize the input voltage, and prevent interference with subsequent circuits. Its output terminals are connected to connectors J1, J2, and J4, and capacitors C1, C2, and C4 are connected in series with the output terminal and then grounded. Capacitors C1, C2, and C4 stabilize the output voltage, making it purer and meeting the power quality requirements of subsequent circuits. The output terminals of the DC-DC power module U1 are also connected in series with LEDs D1, D2, and D3. LEDs D1, D2, and D3 are also connected in series with current-limiting resistors R1, R2, and R3. LEDs D1, D2, and D3 indicate the power operating status of the corresponding output terminals. The output terminals output voltages of +5V (VP5), +15V (VP15), and -15V (VN15), respectively, with LEDs D1, D2, and D3 indicating the states of the three different voltages.

[0027] In this embodiment, the test circuit unit includes an optocoupler chip group and a relay group, the optocoupler chip group is connected to the relay group, and the relay group is connected to the EFIS panel.

[0028] Specifically, the optocoupler chipset includes multiple optocoupler chips, which are AQ215 optocoupler chips. Each optocoupler chip is connected to two relay interfaces. The relay interfaces are connected to the corresponding relay groups. The relay groups use the ER134DM4-26B high-speed relay combination control test system to output the main power supply, auxiliary power supply, front panel power supply, and other discrete signals required for EFIS panel functional testing to the EFIS panel.

[0029] In this embodiment, the test circuit unit further includes a serial communication driver RS232 circuit. This RS232 circuit is used to communicate with the EFIS panel, sending test commands and receiving test data. It also communicates with the host computer. After the host computer sends test commands to the test circuit unit, the RS232 circuit controls the EFIS panel to perform the test. Furthermore, this part also has the function of receiving test data returned by the EFIS panel, ensuring that the EFIS panel receives the correct test commands and the correct test feedback information.

[0030] In this embodiment, the test circuit unit further includes a decoder HI8282J, which is connected to the EFIS panel and is used to receive ARINC429 information sent by the EFIS panel and decode the information.

[0031] In this embodiment, the test circuit further includes a control branch, which includes an optocoupler chip U1 and relays K1 and K2. The optocoupler chip U1 is connected to the relays K1 and K2, and the relays K1 and K2 are connected to the EFIS panel. Pins 1 and 7 of the relay K1 are connected in series with resistors R4 and R8, respectively, and then connected to a 5VAC power supply. The 5VAC power supply is the power supply for the front panel lights of the EFIS panel. Pins 1 and 7 of the relay K2 are connected in series with resistor R20 and then connected to a 28VDC power supply. The 28VDC power supply is the main operating power supply for the EFIS panel. Pin 8 of both the relays K1 and K2 is grounded.

[0032] In this embodiment, the test circuit further includes an extension branch, which includes extension chips U22-U26. The extension chips U22-U26 are respectively connected to resistor arrays RP1-RP10. Every two resistor arrays are connected to four dual-path optocouplers. The dual-path optocouplers are connected to the EFIS panel through dual-row pins JP2 to realize the control of various discrete quantities of the EFIS panel.

[0033] The above description is a detailed description of the preferred embodiments of the present utility model. However, the embodiments are not intended to limit the scope of the patent application of the present utility model. All equivalent changes or modifications made under the technical spirit of the present utility model should fall within the patent scope covered by the present utility model.

Claims

1. An automated testing system for EFIS panels, characterized in that, It includes a power supply unit, a test circuit unit, and a host computer. The power supply unit is electrically connected to the test circuit unit and the host computer. The test circuit unit is communicatively connected to the EFIS panel and is used to simulate the digital signals required for testing, send test commands, receive test data, and acquire discrete signals output by the EFIS panel. The host computer is communicatively connected to the test circuit unit and is used to send test control commands, process test data, and display test results. The test circuit unit includes an optocoupler chip group and a relay group.

2. The automatic testing system for EFIS panels according to claim 1, characterized in that, The power supply unit includes an AC / DC conversion module and a DC-DC power module connected together. The AC / DC conversion module converts the input 220VAC AC power into 28VDC DC power required for testing. The DC-DC power module is used to convert the 28VDC DC power into a 5V DC power supply to power the EFIS panel.

3. The automatic testing system for EFIS panels according to claim 2, characterized in that, The AC / DC conversion module includes an AC / DC converter (ACDC_PS). The input terminal of the AC / DC converter is connected in series with a switch S1 and a fuse F1, and then connected to a 220VAC AC input interface P4. The output is connected to the DC / DC power module, and the output of the DC / DC power module is connected to the EFIS panel.

4. The automatic testing system for EFIS panels according to claim 2, characterized in that, The input terminal of the DC-DC power module U1 is connected in series with a single-pole switch S1 and then connected to connector J3, which is the external power input port. At the same time, the input terminal is connected in series with capacitors C3 and C5 and then grounded. Its output terminal is connected to connectors J1, J2 and J4, and the output terminal is connected in series with capacitors C1, C2 and C4 and then grounded. The output terminal of the DC-DC power module U1 is also connected in series with light-emitting diodes D1, D2 and D3.

5. The automatic testing system for EFIS panels according to claim 1, characterized in that, The optocoupler chip group is connected to the relay group, and the relay group is connected to the EFIS panel.

6. The automatic testing system for EFIS panels according to claim 1, characterized in that, The test circuit unit also includes a serial communication driver RS232 circuit, which is used to communicate with the EFIS panel and to send test commands and receive test data.

7. The automatic testing system for EFIS panels according to claim 5, characterized in that, The test circuit unit also includes a decoder HI8282J, which is connected to the EFIS panel and is used to receive ARINC429 information sent by the EFIS panel and decode the information.

8. The automatic testing system for EFIS panels according to claim 5, characterized in that, The test circuit also includes a control branch, which includes an optocoupler chip U1 and relays K1 and K2. The optocoupler chip U1 is connected to the relays K1 and K2, and the relays K1 and K2 are connected to the EFIS panel. The 1st and 7th pins of the relay K1 are connected in series with resistors R4 and R8 respectively and then connected to a 5VAC power supply. The 5VAC power supply is the power supply for the front panel lights of the EFIS panel. The 1st and 7th pins of the relay K2 are connected in series with resistor R20 and then connected to a 28VDC power supply. The 28VDC power supply is the main operating power supply for the EFIS panel. The 8th pin of both the relays K1 and K2 is grounded.

9. The automatic testing system for EFIS panels according to claim 5, characterized in that, The test circuit also includes an extension branch, which includes extension chips U22-U26. The extension chips U22-U26 are respectively connected to resistor arrays RP1-RP10. Every two resistor arrays are connected to four dual-path optocouplers. The dual-path optocouplers are connected to the EFIS panel through a dual-row pin header JP2.

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