A power supply mainboard dual-path testing device

Abstract

The utility model discloses a kind of power supply mainboard double-path testing device, including test box, test frame, lifting assembly, floating positioning plate, contact pin adapter plate, circuit board, the test frame is connected with test box rear side, floating positioning plate is equipped on the test box, lifting assembly is equipped in test frame upper portion front side, lifting assembly is located just above floating positioning plate, contact pin adapter plate is equipped in test box top inner side, contact pin adapter plate is aligned with floating positioning plate, circuit board is equipped in test box inner bottom, the first test circuit, second test circuit are integrated in the circuit board.The utility model is integrated with first test circuit and second test circuit on circuit board, compatible with the multiple project needs of circuit test, simple operation, test efficient, test data is reliable, satisfy high-precision production detection demand.

Description

Technical Field

[0001] This utility model belongs to the field of power supply motherboard testing technology, specifically relating to a dual-channel power supply motherboard testing device. Background Technology

[0002] In the power supply motherboard production testing phase, its circuit functions need to be fully verified. Existing power supply motherboard testing equipment mostly adopts a single-channel testing mode, which can only test one set of functions of the power supply motherboard at a time. If full-function coverage testing of the power supply motherboard is required, multiple changes of test fixtures or adjustments of wiring are necessary. This is not only cumbersome and time-consuming, but also prone to causing positioning deviations of the power supply motherboard due to multiple clamping, affecting the consistency of test data. Moreover, single-channel testing cannot achieve synchronous parameter comparison between different functional circuits of the power supply motherboard, making it difficult to meet the requirements of high-precision production testing. Utility Model Content

[0003] (1) Technical problems to be solved To address the shortcomings of existing technologies, the purpose of this utility model is to provide a dual-channel test device for power supply motherboards. This device aims to solve the problems of existing test devices being single-channel testing devices, which involve cumbersome and time-consuming testing operations, multiple clamping and positioning deviations affecting the consistency and reliability of test data, and failing to meet the requirements of high-precision production testing.

[0004] (2) Technical solution To address the aforementioned technical problems, this utility model provides a dual-channel power supply motherboard testing device, comprising a test box, a test frame, a lifting assembly, a floating positioning plate, a pin adapter plate, and a circuit board. The test frame is connected to the rear of the test box, and a floating positioning plate is mounted on the test box. A lifting assembly is located on the upper front of the test frame, directly above the floating positioning plate. A pin adapter plate is located on the inner top of the test box, aligned with the floating positioning plate. A circuit board is located at the bottom of the test box, integrating a first test circuit and a second test circuit. The floating positioning plate has a first through-hole group and a second through-hole group. A first detection pin group and a second detection pin group are fixedly welded onto the pin adapter plate. The first detection pin group passes through the first through-hole group, and the second detection pin group passes through the second through-hole group. The circuit board is connected to the first detection pin group via the first test circuit and to the second detection pin group via the second test circuit.

[0005] Preferably, the circuit board is provided with a chip U4, the chip U4 is an STM8S005C6, pin 28 of the chip U4 is node LI-ION-21V, and pin 21 of the chip U4 is node ID.

[0006] Preferably, the first test circuit includes four battery interface BAT2s, a load resistor R17, a relay K8, a transistor Q3, a current-limiting resistor R22, a node ID, a diode D22, and a 4S node. One end of the four battery interface BAT2s is connected to the load resistor R17, and the other end is connected to the relay K8. The relay K8 is connected to the base of the transistor Q3, the emitter of the transistor Q3 is grounded, and the collector of the transistor Q3 is connected to the node ID through the current-limiting resistor R22. The two ends of the diode D22 are connected to the current-limiting resistor R22 and the 4S node, respectively.

[0007] Preferably, the second test circuit includes a 5-cell battery interface BAT1, a load resistor R37, a relay K7, a transistor Q8, a current-limiting resistor R38, a node LI-ION-21V, a diode D9, and a 5S node. One end of the 5-cell battery interface BAT1 is connected to the load resistor R37, and the other end is connected to the relay K7. The relay K7 is connected to the base of the transistor Q8, the emitter of the transistor Q8 is grounded, and the collector of the transistor Q8 is connected to the node LI-ION-21V through the current-limiting resistor R38. The two ends of the diode D9 are connected to the current-limiting resistor R38 and the 5S node, respectively.

[0008] Preferably, the test chamber includes a bottom shell and a cover plate hinged to the end of the bottom shell. A first display screen and a second display screen are fixedly installed inside the bottom shell. The circuit board is connected to the first display screen and the second display screen. The cover plate is a transparent cover plate made of acrylic material. The stylus adapter plate is located on the back of the cover plate.

[0009] Preferably, the lifting assembly includes a pressing handle, a fixed plate, an outer cylinder, a telescopic rod, a pressure plate, and pressure needles. The front side of the test frame is provided with a movable pressing handle. The test frame is provided with a fixed plate below the pressing handle. The test frame is fixedly connected to the outer cylinder below the fixed plate. The outer cylinder is provided with a movable telescopic rod. The top end of the telescopic rod is connected to the pressing handle. The bottom end of the telescopic rod is connected to the pressure plate. The bottom surface of the pressure plate is provided with several pressure needles.

[0010] Preferably, the floating positioning plate is provided with a plurality of positioning pins, and a plurality of floating columns are provided around the bottom surface of the floating positioning plate. A cylinder is movably connected to the outside of the floating column, the cylinder is fixed to the upper surface of the test box, and a spring is provided between the cylinder and the floating column.

[0011] (3) Beneficial effects Compared with the prior art, the beneficial effects of this utility model are as follows: This invention integrates a first test circuit and a second test circuit on a circuit board, which is compatible with multiple circuit testing requirements. It is simple to operate, efficient in testing, and provides reliable test data, thus meeting the needs of high-precision production testing. Attached Figure Description

[0012] Figure 1 This is a flowchart of the present invention; Figure 2 This is a three-dimensional structural diagram of the present invention; Figure 3 This is a schematic diagram of the test box structure of this utility model; Figure 4 This is a cross-sectional structural diagram of the cylinder and floating column of this utility model; Figure 5 This is the circuit diagram of the chip U4A of this utility model; Figure 6 This is a circuit diagram of the first test circuit of this utility model; Figure 7 This is a circuit diagram of the second test circuit of this utility model; Figure 8 This is a circuit diagram showing the connection of 4-series and 5-series circuits according to this utility model; Figure 9 This is the over-temperature protection circuit diagram of this utility model; Figure 10 This is the circuit diagram of the reverse current of this utility model; The labels in the attached diagram are as follows: 1. Test box; 2. Test frame; 3. Lifting assembly; 301. Press-down handle; 302. Fixing plate; 303. Outer cylinder; 304. Telescopic rod; 305. Pressure plate; 306. Pressure needle; 4. Floating positioning plate; 5. Contact pin adapter plate; 6. Circuit board; 7. First test circuit; 8. Second test circuit; 9. First detection pin group; 10. Second detection pin group; 12. Bottom shell; 13. Cover plate; 14. First display screen; 15. Second display screen; 16. Positioning pin; 17. Floating column; 18. Cylinder; 19. Spring; 20. First through hole group; 21. Second through hole group. Detailed Implementation

[0013] This specific embodiment is a dual-channel test device for a power supply motherboard, and its structural schematic diagram is shown below. Figures 1-10As shown, the test box includes a test chamber 1, a test frame 2, a lifting assembly 3, a floating positioning plate 4, a stylus adapter plate 5, and a circuit board 6. The test frame 2 is connected to the rear of the test chamber 1. The floating positioning plate 4 is mounted on the test chamber 1. The lifting assembly 3 is located on the upper front of the test frame 2, directly above the floating positioning plate 4. The stylus adapter plate 5 is located on the inner top of the test chamber 1, and is aligned with the floating positioning plate 4. The circuit board 6 is located at the bottom inside the test chamber 1. The circuit board 6 integrates a first test circuit 7 and a second test circuit 8. The floating positioning plate 4 has a first through-hole group 20 and a second through-hole group 21. The stylus adapter plate 5 is fixedly welded with a first detection pin group 9 and a second detection pin group 10. The first detection pin group 9 passes through the first through-hole group 20, and the second detection pin group 10 passes through the second through-hole group 21. The circuit board 6 is connected to the first detection pin group 9 through the first test circuit 7 and to the second detection pin group 10 through the second test circuit 8.

[0014] To address the need for testing various data parameters of circuit components on power supply motherboards during the production process, and considering the time-consuming and cumbersome nature of traditional single-channel testing and the unreliability of data due to manual operation, this embodiment designs a new testing device consisting of a test box 1, a test rack 2, a lifting assembly 3, a floating positioning plate 4, a contact pin adapter plate 5, and a circuit board 6. The circuit board 6 is redesigned to integrate a first test circuit 7 and a second test circuit 8, enabling the testing of various parameters of the power supply motherboard without the need for multiple disassembly, repositioning, and retesting, thus reducing tedious operations and increasing testing efficiency.

[0015] For example, the power supply motherboard under test includes power supply circuits with 4-cell and 5-cell lithium batteries. The nominal voltage of the 4-cell batteries is usually 14.8V, which verifies the power supply stability under low power and the reverse current protection when the batteries are removed and installed. The nominal voltage of the 5-cell batteries is usually 18.5V, which verifies the power supply stability under high power and the over-temperature safety protection when the batteries are heated under high load. Both circuits can be tested simultaneously, which is highly efficient.

[0016] Furthermore, the circuit board 6 has a chip U4, the model of which is STM8S005C6. Pin 28 of the chip U4 is node LI-ION-21V, and pin 21 of the chip U4 is node ID.

[0017] The first test circuit 7 includes four battery interfaces BAT2, a load resistor R17, a relay K8, a transistor Q3, a current-limiting resistor R22, a node ID, a diode D22, and a 4S node. One end of the four battery interfaces BAT2 is connected to the load resistor R17, and the other end is connected to the relay K8. The relay K8 is connected to the base of the transistor Q3, the emitter of the transistor Q3 is grounded, and the collector of the transistor Q3 is connected to the node ID through the current-limiting resistor R22. The two ends of the diode D22 are connected to the current-limiting resistor R22 and the 4S node, respectively.

[0018] In this embodiment, the first test circuit 7 is used to power the power supply motherboard under test, which needs to supply power to four battery cells during actual operation. The load resistor R17 simulates the electrical load of the four battery cells, putting the power supply motherboard under test in a real load-bearing state. This ensures that the detected voltage and current data match the actual usage scenario. If the power supply to the power supply motherboard under test is unstable, current may flow backward from the load resistor R17 into the power supply motherboard under test, which is called reverse current and can burn out the components of the power supply motherboard under test. Diode D22 is a unidirectional conductive diode that only allows current to flow from the power supply motherboard under test to the load, preventing reverse current flow. This protects the power supply motherboard under test and also verifies the effectiveness of the reverse current protection of the power supply motherboard under test by detecting whether diode D22 is conducting. The load resistor R17 simulates the load, and diode D22 protects against reverse current. Then, the first detection pin group 9 collects the voltage and current of the four battery cells of the power supply motherboard under test (for example, whether the voltage is stable at the standard value of the four battery cells, such as 14.8V±0.2V, and whether the current meets the design output), and at the same time determines whether the reverse current protection function is normal.

[0019] The second test circuit 8 includes a 5-cell battery interface BAT1, a load resistor R37, a relay K7, a transistor Q8, a current-limiting resistor R38, a node LI-ION-21V, a diode D9, and a 5S node. One end of the 5-cell battery interface BAT1 is connected to the load resistor R37, and the other end is connected to the relay K7. The relay K7 is connected to the base of the transistor Q8, the emitter of the transistor Q8 is grounded, and the collector of the transistor Q8 is connected to the node LI-ION-21V through the current-limiting resistor R38. The two ends of the diode D9 are connected to the current-limiting resistor R38 and the 5S node, respectively.

[0020] In this embodiment, the second test circuit 8 is the actual load when the power supply motherboard under test is powered by 5 series batteries. This puts the power supply motherboard under test in a loaded working state, ensuring that the detected voltage and current data are true and valid. More specifically, if the temperature of the power supply motherboard under test is too high during actual operation, it will trigger over-temperature protection (such as cutting off the power supply) to prevent burnout. In this case, chip U4 provides base signals to transistors Q7 and Q9 through resistors R40 and R95, turning on transistors Q7 and Q9, and then through the node TEMPE-PROTECT-EST. An over-temperature signal is sent to the motherboard of the power supply under test. The second detection pin group 10 then collects whether the motherboard triggers protection (e.g., whether the voltage is cut off) to verify whether the over-temperature protection function is normal. The load is applied through the load resistor R37, and transistors Q7 and Q9 are used for the over-temperature signal. The second detection pin group 10 collects the voltage and current of the 5-cell circuit of the motherboard under test (e.g., whether the voltage is stable at the standard value of the 5-cell battery adapter, such as 18.5V±0.2V, and whether the current meets the design output) to verify whether the over-temperature protection function is effective.

[0021] Furthermore, the test box 1 includes a bottom shell 12 and a cover plate 13 hinged to the end of the bottom shell 12. A first display screen 14 and a second display screen 15 are fixedly installed inside the bottom shell 12. The circuit board 6 is connected to the first display screen 14 and the second display screen 15. The cover plate 13 is a transparent cover plate made of acrylic material. The stylus adapter plate 5 is located on the back of the cover plate 13.

[0022] In this embodiment, the first display screen 14 is connected to the first test circuit 7 and the first detection pin group 9. If the first test circuit 7 passes the test, the first display screen 14 displays a test OK signal. The second display screen 15 is connected to the second test circuit 8 and the second detection pin group 10. If the second test circuit 8 passes the test, the second display screen 15 displays a test OK signal. The contents of the first display screen 14 and the second display screen 15 can be clearly seen through the acrylic transparent cover plate 13, which is convenient for testing and operation.

[0023] Furthermore, the lifting assembly 3 includes a pressing handle 301, a fixing plate 302, an outer cylinder 303, a telescopic rod 304, a pressure plate 305, and pressure needles 306. The front side of the test frame 2 is provided with a movable pressing handle 301. The test frame 2 is provided with a fixing plate 302 located below the pressing handle 301. The test frame 2 is fixedly connected to the outer cylinder 303 located below the fixing plate 302. The outer cylinder 303 is provided with a movable telescopic rod 304. The top of the telescopic rod 304 is connected to the pressing handle 301. The bottom of the telescopic rod 304 is connected to the pressure plate 305. The bottom surface of the pressure plate 305 is provided with several pressure needles 306. The floating positioning plate 4 is provided with several positioning pins 16. The bottom surface of the floating positioning plate 4 is provided with several floating columns 17. The outer side of the floating column 17 is movably connected to a cylinder 18. The cylinder 18 is fixed to the upper surface of the test box 1. A spring 19 is provided between the cylinder 18 and the floating column 17.

[0024] In this embodiment, the pressure plate 305 moves downward under the action of the pressing handle 301, and the bottom end of the pressing pin 306 is used to abut against the blank position around or inside the power supply motherboard under test, so that the power supply motherboard under test is pressed against the floating positioning plate 4. After the pressing handle 301 continues to press down, the floating positioning plate 4 sinks, the spring 19 contracts, and the top ends of the first detection pin group 9 and the second detection pin group 10 protrude from the upper surface of the floating positioning plate 4, and can make corresponding contact with the electronic components of the power supply motherboard under test. The first test circuit 7 and the second test circuit 8 perform corresponding parameter detection, and the test results are displayed through the first display screen 14 and the second display screen 15. By integrating the first test circuit 7 and the second test circuit 8 on the circuit board 6, it is compatible with multiple circuit testing requirements, is simple to operate, efficient in testing, and provides reliable test data, meeting the requirements of high-precision production testing.

[0025] All technical features in this embodiment can be freely combined according to actual needs.

[0026] The above embodiments are preferred implementations of this utility model. In addition, this utility model can also be implemented in other ways. Any obvious substitutions without departing from the concept of this technical solution are within the protection scope of this utility model.

Claims

1. A dual-channel test device for power supply motherboards, characterized in that: The device includes a test box, a test frame, a lifting assembly, a floating positioning plate, a stylus adapter plate, and a circuit board. The test frame is connected to the rear of the test box, and the floating positioning plate is mounted on the test box. The lifting assembly is located on the upper front of the test frame, directly above the floating positioning plate. The stylus adapter plate is located on the inner top of the test box and is aligned with the floating positioning plate. A circuit board is located at the bottom of the test box, integrating a first test circuit and a second test circuit. The floating positioning plate has a first through-hole group and a second through-hole group. A first detection pin group and a second detection pin group are fixedly welded to the stylus adapter plate. The first detection pin group passes through the first through-hole group, and the second detection pin group passes through the second through-hole group. The circuit board is connected to the first detection pin group through the first test circuit and to the second detection pin group through the second test circuit.

2. The power supply mainboard dual-path testing device according to claim 1, characterized in that: The circuit board is equipped with a chip U4, the model of which is STM8S005C6. Pin 28 of the chip U4 is node LI-ION-21V, and pin 21 of the chip U4 is node ID.

3. The power supply main board dual-path testing device according to claim 2, characterized in that: The first test circuit includes four battery interface BAT2s, a load resistor R17, a relay K8, a transistor Q3, a current-limiting resistor R22, a node ID, a diode D22, and a 4S node. One end of the four battery interface BAT2s is connected to the load resistor R17, and the other end is connected to the relay K8. The relay K8 is connected to the base of the transistor Q3, the emitter of the transistor Q3 is grounded, and the collector of the transistor Q3 is connected to the node ID through the current-limiting resistor R22. The two ends of the diode D22 are connected to the current-limiting resistor R22 and the 4S node, respectively.

4. The power supply main board dual-path testing device according to claim 2, characterized in that: The second test circuit includes a 5-cell battery interface BAT1, a load resistor R37, a relay K7, a transistor Q8, a current-limiting resistor R38, a node LI-ION-21V, a diode D9, and a 5S node. One end of the 5-cell battery interface BAT1 is connected to the load resistor R37, and the other end is connected to the relay K7. The relay K7 is connected to the base of the transistor Q8, the emitter of the transistor Q8 is grounded, and the collector of the transistor Q8 is connected to the node LI-ION-21V through the current-limiting resistor R38. The two ends of the diode D9 are connected to the current-limiting resistor R38 and the 5S node, respectively.

5. The power supply main board dual-path testing device according to claim 1, characterized in that: The test chamber includes a bottom shell and a cover plate hinged to the end of the bottom shell. A first display screen and a second display screen are fixedly installed inside the bottom shell. The circuit board is connected to the first display screen and the second display screen. The cover plate is a transparent cover plate made of acrylic material. The stylus adapter plate is located on the back of the cover plate.

6. The power supply main board dual-path testing device according to claim 1, characterized in that: The lifting assembly includes a pressing handle, a fixed plate, an outer cylinder, a telescopic rod, a pressure plate, and pressure needles. The front side of the test frame has a movable pressing handle. The test frame has a fixed plate below the pressing handle. The test frame has an outer cylinder fixedly connected below the fixed plate. The outer cylinder has a movable telescopic rod inside. The top end of the telescopic rod is connected to the pressing handle. The bottom end of the telescopic rod is connected to the pressure plate. The bottom surface of the pressure plate has several pressure needles.

7. The power supply main board dual-path testing device according to claim 1, characterized in that: The floating positioning plate is provided with several positioning pins, and several floating columns are provided around the bottom surface of the floating positioning plate. A cylinder is movably connected to the outside of the floating column. The cylinder is fixed to the upper surface of the test box, and a spring is provided between the cylinder and the floating column.

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