Chip detection tooling

Abstract

The utility model provides a kind of chip detection tool, it includes: limiting component, setting in bearing surface, limiting component includes limit plate, and limit groove is set in the middle area of limit plate;Probe module, including substrate, needle library and probe, substrate is set below limit plate, and substrate is distributed with limit plate and is opened with multiple mounting holes, needle library is installed in mounting hole, and probe is detachably installed in needle library and extends;Positioning structure, set between horizontal workbench and limiting component, positioning structure includes positioning piece and with the first positioning hole of positioning piece cooperation, positioning piece is installed on the bearing surface of horizontal workbench, and first positioning hole is set in the bottom of limit plate, and positioning piece has telescopic positioning part, and positioning part can be inserted into first positioning hole to limit the displacement of limit plate.The detection tool improves chip detection effect.

Description

Technical Field

[0001] This invention relates to a chip testing fixture. Background Technology

[0002] For ultra-thin chips, where the chip body is too thin, pressure must not be applied to the chip's motherboard during testing, as this could cause deformation and breakage. The chip's testing points and corresponding testing equipment points must remain stationary; otherwise, a short circuit may occur. However, existing chip testing fixtures place the chip in a fixed slot on the worktable. This can easily lead to uneven pressure on the chip's motherboard during testing, resulting in deformation and breakage. Furthermore, the lack of sufficient chip restraint often results in slight displacement and inaccurate chip positioning, affecting testing results.

[0003] In view of this, this application has made a special effort to study and apply theoretical principles to address the shortcomings of the prior art, and strives to solve the above-mentioned problems, which is the goal of this application. Utility Model Content

[0004] One objective of this invention is to provide a chip testing fixture that improves the testing effect of ultra-thin chips.

[0005] A chip testing fixture includes a limiting fixture, the limiting fixture comprising a horizontal worktable having a bearing surface, and the chip testing fixture further comprising:

[0006] A limiting component is disposed on the bearing surface, the limiting component including a limiting plate, and a limiting groove is formed in the middle area of ​​the limiting plate;

[0007] The probe module includes a substrate, a needle magazine, and probes. The substrate is disposed below the limiting plate, and the substrate and the limiting plate are provided with a plurality of mounting holes arranged in an array. The needle magazine is installed in the mounting holes, and the probes are detachably installed in the needle magazine and extend out.

[0008] A positioning structure is disposed between the horizontal worktable and the limiting component. The positioning structure includes a positioning element and a first positioning hole that cooperates with the positioning element. The positioning element is installed on the bearing surface of the horizontal worktable. The first positioning hole is opened at the bottom of the limiting plate. The positioning element has a retractable positioning part that can be inserted into the first positioning hole to limit the displacement of the limiting plate.

[0009] In one embodiment of this invention, at least one opening is provided on the outer side of the limiting groove along the extending direction;

[0010] The inner side of the limiting groove is provided with at least one protruding post and at least one edge limiting part around the edge;

[0011] The middle area of ​​the limiting groove is provided with several protrusions at intervals.

[0012] In one embodiment of this invention, the bearing surface is provided with a mounting groove, and the positioning member is installed in the mounting groove.

[0013] In one embodiment of the present invention, the positioning part includes an umbrella-shaped tip and an elastic telescopic part. The elastic telescopic part is inserted into the mounting groove and can extend and retract along the mounting groove. The umbrella-shaped tip is inserted into the first positioning hole as the elastic telescopic part extends.

[0014] In one embodiment of the present invention, the needle magazine includes an open end and a tip, the tip extending from one side of the mounting hole and the open end partially extending from the other side of the mounting hole; the probe includes a limiting end and a concave end, the limiting end being detachably inserted into the open end and the concave end extending from the open end to connect with a detection line.

[0015] In one embodiment of this invention, the limiting fixture further includes a lifting drive mechanism, which includes a pressure plate and a guide drive structure. The pressure plate is located above the bearing surface, and the guide drive structure is connected to the pressure plate and drives the pressure plate to move in a direction perpendicular to the bearing surface.

[0016] In one embodiment of this invention, the pressure plate includes a limiting end, and a first driving member is mounted on the limiting end. The first driving member includes a rotating shaft and a guide rail mounted on the rotating shaft.

[0017] In one embodiment of this invention, the limiting plate is provided with a second positioning hole that cooperates with the guide rail.

[0018] In one embodiment of this novel invention, the guide drive structure includes a second drive member, a guide post, a stroke adjustment block, and a clamping head;

[0019] One end of the guide post is connected to the output end of the second driving component, and the other end is fixedly connected to the pressure plate;

[0020] The stroke adjustment block has a sliding groove along the vertical direction and a clamping head is connected to the bottom. The clamping head is fixedly connected to the guide post, and the guide post drives the clamping head to move along the sliding groove.

[0021] In one embodiment of this invention, a display is provided on the horizontal worktable, and a plurality of through holes are provided on the side surface of the horizontal worktable and the upper surface of the bearing surface, through which the detection line passes and is connected to the display.

[0022] This new invention also has the following advantages.

[0023] This novel chip testing fixture includes a limiting component, a probe module, and a positioning structure. The limiting plate of the limiting component has a limiting groove to accommodate the chip under test and limit its horizontal displacement. The probes of the probe module are detachably installed in a probe magazine. The positioning component of the positioning structure is installed on the bearing surface of the horizontal worktable. The positioning component has a retractable positioning part that can be inserted into the first positioning hole of the limiting plate. The retractable positioning part has an elastic restoring force, which effectively reduces the instantaneous pressure during the pressing process of the chip under test and avoids damage to the chip under test due to excessive pressure.

[0024] To gain a deeper understanding of the techniques, means, and effects employed in achieving the intended purpose of this application, please refer to the following detailed description and accompanying drawings. It is believed that the purpose, features, and characteristics of this application can be understood in a thorough and concrete manner from these drawings. However, the accompanying drawings are provided for reference and illustration only and are not intended to limit this application. Attached Figure Description

[0025] Figure 1 A schematic diagram of the overall structure of a chip testing fixture provided in one embodiment of the present invention;

[0026] Figure 2 A schematic diagram of the limiting component is shown;

[0027] Figure 3 A schematic diagram of the limiting plate is shown;

[0028] Figure 4 A schematic diagram of the probe module is shown.

[0029] Figure 5 An explosion diagram showing the contact between the probe module and the chip under test is shown;

[0030] Figure 6 A schematic diagram of the needle magazine and probes is shown;

[0031] Figure 7 A schematic diagram of the overall structure of the chip under test, limiting components, probe module, and positioning structure assembly is shown.

[0032] Figure 8 A schematic diagram of the positioning component is shown;

[0033] Figure 9 A schematic diagram of the positioning structure installed on a horizontal worktable is shown.

[0034] Figure 10 An exploded view of the structure of the chip testing fixture is shown.

[0035] In the attached figures, the following labels are used:

[0036] 10: Limiting fixture;

[0037] 11: Horizontal worktable;

[0038] 111: Bearing surface;

[0039] 1111: Mounting slot;

[0040] 112: Through hole;

[0041] 113: Base plate;

[0042] 12: Lifting drive mechanism;

[0043] 121: Pressure plate;

[0044] 1211: Limiting end;

[0045] 1212: First driving component;

[0046] 12121: Rotation shaft;

[0047] 12122: Guide rail;

[0048] 122: Guided drive structure;

[0049] 1221: Second drive component;

[0050] 1222: Guide post;

[0051] 1223: Stroke adjustment block;

[0052] 1224: Clamping head;

[0053] 1225: Slide groove;

[0054] 20: Limiting components;

[0055] 21: Limit plate;

[0056] 211: Limiting groove;

[0057] 212: First positioning hole;

[0058] 213: Second positioning hole;

[0059] 214: Opening;

[0060] 2111: Convex column;

[0061] 2112: protrusion;

[0062] 2113: Edge;

[0063] 2114: Mounting hole;

[0064] 30: Probe module;

[0065] 31:Substrate;

[0066] 32: Needle bank;

[0067] 321: Open end;

[0068] 322: Tip;

[0069] 33: Probe;

[0070] 331: Limiting end;

[0071] 332: Concave end;

[0072] 40: Positioning structure;

[0073] 41: Positioning component;

[0074] 411: Umbrella-shaped tip;

[0075] 412: Elastic telescopic part;

[0076] 50: Chip under test;

[0077] 60: Monitor;

[0078] 61: Testing line. Detailed Implementation

[0079] The technical content and detailed description of this application are illustrated below with reference to the drawings:

[0080] Please see Figures 1 to 10 As shown, this invention provides a chip testing fixture. Figure 1 A schematic diagram of the overall structure of the chip testing fixture is shown.

[0081] The chip testing fixture includes a limiting fixture 10, a limiting component 20, a probe module 30, and a positioning structure 40, wherein the limiting fixture 10 includes a horizontal worktable 11, and the horizontal worktable has a bearing surface 111.

[0082] See Figure 2 and Figure 3 As shown, Figure 2 A schematic diagram of the limiting component is shown. Figure 3 A schematic diagram of the limiting plate is shown. The limiting component 20 is disposed on the bearing surface 111. The limiting component 20 includes a limiting plate 21, with a limiting groove 211 formed in the middle region of the limiting plate 21. The limiting groove 211 is adapted to the shape of the chip under test 50 and is used to accommodate the chip under test 50 and restrict its horizontal displacement. In this embodiment, the limiting groove 211 of the limiting component 20 is adapted to the shape of the chip under test 50. By accommodating the chip under test 50 and restricting its horizontal displacement, the physical constraint of the chip under test 50 in the planar direction is achieved, ensuring that the chip under test 50 has no horizontal offset during the testing process, significantly improving the planar positioning accuracy.

[0083] See Figures 3 to 6 As shown, Figure 4 A schematic diagram of the probe module is shown. Figure 5 An explosion diagram showing the contact between the probe module and the chip under test is shown. Figure 6 A schematic diagram of the probe magazine and probes is shown. The probe module 30 includes a substrate 31, a probe magazine 32, and probes 33. The substrate 31 is disposed below the limiting plate 21. Multiple mounting holes 2114 are arranged in an array on the substrate 31 and the limiting plate 21. The probe magazine 32 is installed within the mounting holes 2114. The probes 33 are detachably installed in the probe magazine 32 and extend out to contact the bottom of the chip under test 50. In this embodiment, the probe module 30 adopts an array-distributed mounting hole design. The probe magazine 32 and probes 33 are mounted in an array on the substrate 31 and the limiting plate 21. Combined with the detachable nature of the probes, the position of the probes 33 can be flexibly adjusted according to the insertion point of the chip under test 50, achieving precise alignment between the probes 33 and the bottom insertion point of the chip under test 50, ensuring accurate detection contact.

[0084] refer to Figures 7-9 As shown, Figure 7 This diagram shows the overall structure of the chip under test, limiting components, probe module, and positioning structure assembly. Figure 8 A schematic diagram of the positioning component is shown. Figure 9 A schematic diagram of a positioning structure installed on a horizontal worktable is shown. The positioning structure 40 is disposed between the horizontal worktable 11 and the limiting component 20. The positioning structure 40 includes a positioning element 41, which is installed on the bearing surface 111 of the horizontal worktable 11. A first positioning hole 212 is provided at the bottom of the limiting plate 21. The positioning element 41 has a retractable positioning part that can be inserted into the first positioning hole 212 to limit the displacement of the limiting plate 21. In this embodiment, the positioning structure 40, through the retractable positioning part inserted into the first positioning hole 212 at the bottom of the limiting plate 21, limits the horizontal displacement of the limiting plate 21 while, combined with the fixed installation of the positioning element 41 and the horizontal worktable 11, achieves precise vertical positioning of the limiting plate 21. This assists in the stable placement of the chip under test 50 in three-dimensional space and improves the overall spatial positioning capability of the fixture. Furthermore, the retractable positioning part in the positioning structure 40 has elastic restoring force, which effectively reduces the instantaneous pressure during the pressing process of the chip under test 50, and avoids damage to the chip under test 50 due to excessive pressure.

[0085] In addition, in one embodiment, the probe 33 may be configured as an elastic structure or an elastic structure may be installed inside the probe magazine 32, with the probe 33 and the probe magazine 32 being detachably elastically mounted. When the probe 33 contacts the chip under test 50, the probe magazine 32 and the probe 33 elastically cooperate, and with the elastic restoring force of the positioning part of the positioning structure 40, the dynamic balance of the contact pressure is further increased, reducing the instantaneous pressure during the pressing process of the chip under test 50, and preventing damage to the chip under test 50 due to excessive pressure.

[0086] Further reference Figure 3 As shown, Figure 3 A schematic diagram of the limiting plate is shown. The limiting plate 21 has a limiting groove 211 in its middle region that matches the shape of the chip under test 50. The limiting groove 211 is used to accommodate the chip under test 50 and restrict its horizontal displacement. At least one opening 214 is provided on the outer side of the limiting groove 211 along its extending direction, and the limiting groove 211 also has an outwardly flared edge 2113. The opening along the outer extending direction of the limiting groove 211 provides operating space during the handling of the chip under test 50, facilitating easy removal or placement of the chip under test 50 by applying force through tools or fingers inserted into the opening, avoiding difficulties caused by a tight fit between the limiting groove 211 and the chip under test 50. Simultaneously, the opening 214 reduces the rigid constraint of the edge of the limiting groove 211 on the chip under test 50, providing a slight deformation buffer when the chip under test 50 is subjected to force during installation or testing, preventing damage caused by compression. In addition, the extended edge portion 2113 of the limiting groove 211 guides the chip under test 50 into the limiting groove 211 through the inclined surface, ensuring that the chip under test 50 falls accurately into the limiting groove 211 and fits against the inner wall of the limiting groove 211, thereby improving the installation and alignment accuracy of the chip under test 50.

[0087] Further reference Figure 3 As shown, at least one protrusion 2111 is provided around the inner edge of the limiting groove 211. The protrusion 2111 and the chip under test 50 have corresponding holes. After the chip under test 50 is installed in the limiting groove 211, the protrusion 2111 is embedded in the corresponding hole of the chip under test 50, thus limiting the chip under test 50. Furthermore, a plurality of protrusions 2112 are provided at intervals in the middle area of ​​the limiting groove 211. The protrusions 2112 provide local support to the surface of the chip under test 50, ensuring that the chip under test 50 does not deform under force.

[0088] Further reference Figure 8 , Figure 9As shown, the bearing surface 111 has a mounting groove 1111, and the positioning member 41 is installed in the mounting groove 1111. The positioning member 41 has a retractable positioning part. In one embodiment, the positioning part includes an umbrella-shaped tip 411 and an elastic telescopic part 412. The elastic telescopic part 412 is inserted into the mounting groove 1111 and can extend and retract along the mounting groove 1111. The umbrella-shaped tip 411 is inserted into the first positioning hole 212 at the bottom of the limiting plate 21 as the elastic telescopic part 412 extends. In this embodiment, the positioning member 41 is fixed to the bearing surface 111 via the mounting groove 1111. The umbrella-shaped tip 411 of the telescopic positioning part can guide and align itself when inserted into the first positioning hole 212 at the bottom of the limiting plate 21. Even if there is a slight deviation in the placement of the limiting plate 21, the umbrella-shaped tip 411 can guide the positioning part to be accurately inserted into the hole, improving the positioning accuracy. At the same time, when the elastic telescopic part 412 extends and retracts, it causes the umbrella-shaped tip 411 to fit tightly with the first positioning hole 212, forming a mechanical lock, which effectively restricts the displacement of the limiting plate 21 in the horizontal and vertical directions and ensures the overall tooling positioning stability. In addition, during the installation or testing process of the limiting plate 21, the elastic telescopic part 412 can absorb the instantaneous impact force through elastic deformation, avoiding damage to the chip under test 50 caused by rigid contact. The combined design of the umbrella-shaped tip 411 and the elastic telescopic part 412 can automatically adjust the extension length of the positioning part by utilizing the elastic restoring force to adapt to the small height deviation during the installation of the limiting plate and achieve dynamic pressure balance.

[0089] In one embodiment, further reference is made to... Figures 3 to 6 As shown, the substrate 31 is disposed below the limiting plate 21. Multiple mounting holes 2114 are arrayed on the substrate 31 and the limiting plate 21. The probe magazine 32 is installed within the mounting holes 2114. The probe 33 is detachably installed in the probe magazine 32 and extends out to contact the bottom of the chip under test 50. Specifically, the probe magazine 32 includes an open end 321 and a tip 322. The tip 322 extends from one side of the mounting hole 2114 and connects to the bottom terminal pin of the chip under test 50. The open end 321 extends partially from the other side of the mounting hole 2114. The probe 33 includes a limiting end 331 and a concave end 332. The limiting end 331 is detachably inserted into the open end 321, and the concave end 332 extends out from the open end 321 to connect with a detection line.

[0090] Further reference Figure 1 , Figure 10 As shown, Figure 10An exploded view of the chip testing fixture structure is shown. In one embodiment, the limiting fixture 10 further includes a lifting drive mechanism 12, which includes a pressure plate 121 and a guide drive structure 122. The pressure plate 12 is located above the bearing surface 111 of the horizontal worktable 11. The guide drive structure 122 is connected to the pressure plate 121 and drives the pressure plate 121 to move in a direction perpendicular to the bearing surface 111 to contact or move away from the chip 50 under test. In one embodiment, the pressure plate 121 includes two limiting ends 1211, which are symmetrically arranged. A first drive member 1212 is installed on the limiting ends 1211. The first drive member 1212 includes a rotating shaft 12121 and a guide rail 12122 installed on the rotating shaft 12121. The first drive member 1212 drives the pressure plate 121 to move in a vertical direction. Correspondingly, the limiting plate 21 is provided with a second positioning hole 213 that cooperates with the guide rail 12121. The guide rail 121 controls the pressure plate 121 to move to the accurate position, and the pressure plate 121 cooperates with the second positioning hole 213 of the limiting plate through the guide rail 12121 of the first driving member 1212, forming a mechanical guiding constraint to ensure that the pressure plate has no horizontal deviation during vertical movement, which significantly improves the positioning accuracy of the contact position between the pressure plate 121 and the chip under test 50; and the two limiting ends 1211 and the two first driving members 1212 are symmetrically distributed, so that the pressure plate 21 and the chip under test 50 are subjected to uniform force during vertical movement.

[0091] Further reference Figure 1 As shown, the guide drive structure 122 includes a second drive member 1221, a guide post 1222, a stroke adjustment block 1223, and a clamping head 1224. One end of the guide post 1222 is connected to the output end of the second drive member 1221, and the other end is fixedly connected to the pressure plate 121. The stroke adjustment block 1223 has a vertically oriented groove 1225, and its bottom is connected to the clamping head 1224. The clamping head 1224 is fixedly connected to the guide post 1222, and the guide post 1222 drives the clamping head 1224 to move along the groove 1225. In this embodiment, the guide post 1222 and the clamping head 1224 in the guide drive structure 122 move along the slide groove 1225. By adjusting the movement range of the clamping head 1224 in the slide groove 1225, the vertical movement stroke of the guide post 1222 and the pressure plate 121 can be flexibly limited, thereby accurately controlling the pressing distance of the pressure plate 121 on the chip 50 under test. In coordination with the second drive component 1221, the pressing speed and force can be dynamically adjusted to avoid damage to the chip 50 under test due to excessive stroke or excessive pressure.

[0092] Further reference Figure 1As shown, in one embodiment, the horizontal worktable 11 is provided with a display 60, and the side surface of the horizontal worktable 10 and the upper surface of the bearing surface 111 are provided with a plurality of through holes 112, through which the detection line 61 passes and is connected to the display 60.

[0093] Further reference Figure 1 As shown, the horizontal worktable 11 also includes a base plate 113 located below the bearing surface 111, and the side of the base plate 12 is provided with several through holes 112.

[0094] The chip testing fixture provided by this utility model works on the following principle:

[0095] Initially, the guide drive structure 122 pulls upward, causing the pressure plate 121 to move vertically away from the bearing surface 111. At this time, the limiting plate 21 is pre-positioned with the bearing surface 111 of the horizontal worktable 11 through the positioning part of the positioning structure 40. The umbrella-shaped tip 411 of the positioning part is inserted into the first positioning hole 42 at the bottom of the limiting plate 21. The elastic telescopic part 412 is in a slightly compressed state, applying a pre-tightening thrust upward to the limiting plate 21, so that the limiting plate 21 and the probe module 30 maintain a certain gap, preventing the probe 33 from contacting foreign objects prematurely. At the same time, the display 60 is powered on and in standby mode. The detection line 61 completes its internal wiring through the through hole 112 on the side surface of the horizontal worktable and the bearing surface 111. One end is connected to the probe concave end 332 of the probe module 30, and the other end is connected to the signal interface of the display 60, forming a signal transmission path.

[0096] The operator aligns the chip under test 50 with the limiting groove 211 of the limiting plate 21 and waits for the pressure test. The guide drive structure 122 pulls down, causing the pressure plate 121 to move vertically towards the bearing surface 111. During this process, the first drive member 1212 of the limiting end 1211 of the pressure plate 121 actuates, the rotating shaft 12121 rotates, causing the guide rail 12122 to gradually extend from the rotating shaft. The other end of the guide rail 12122 is inserted into the second positioning hole 213 of the limiting plate 21. Through the rigid cooperation between the guide rail 12122 and the second positioning hole 213, the horizontal deviation of the pressure plate 121 during the downward movement is eliminated, and the pressure plate 121 is moved to the accurate position by controlling the guide rail. After the pressure plate 121 contacts the upper surface of the limiting plate 21, it continues to apply downward pressure, causing the limiting plate 21 to overcome the pre-tightening thrust of the elastic telescopic part 412 in the positioning structure 40 and move downward as a whole. At this time, the positioning component 41 further compresses the elastic telescopic part 412 as the limiting plate 21 descends, and the umbrella-shaped tip 411 remains inserted into the first positioning hole 42, which not only restricts the horizontal displacement of the limiting plate 21, but also forms a buffer through the elastic restoring force to avoid rigid collision between the limiting plate 21 and the horizontal worktable 11. During the downward movement of the limiting plate 21, its bottom contacts the probe 33 of the probe module 30, and the probe 33 is compressed as the limiting plate 21 presses down. Due to the synergistic effect of the elastic telescopic part 412 of the positioning structure 40 and the telescopic part of the probe 33, the positioning component 41 descends and releases thrust to the upper limiting plate 21, ensuring that the probe 33 is in close contact with the bottom terminal pin of the chip under test 50, and avoiding overpressure that could damage the chip under test or the probe. Finally, after reaching the preset stroke, the lifting drive mechanism 12 locks the position of the pressure plate 121, and the limiting plate 21 and the probe module 30 maintain stable contact. The operator activates the power button on the horizontal worktable 10, turning on the detection circuit. The chip pins transmit electrical signals to the display 60 via probe 33 and detection line 61. The display 60 displays the detection data of different modules of the chip under test 50 in real time. Furthermore, during the testing process, if the chip under test 50 has a short circuit, open circuit, or poor pin contact, the display 60 will provide feedback through abnormal data or alarm prompts.

[0097] Furthermore, the chip testing fixture can simultaneously test various modules of the chip under test 50, such as the hardware communication module (including UART, WiFi, Bluetooth, Hall effect sensors, etc.), the audio module (including audio output, recording function, voice system, etc.), the video module (including video output, USB camera, etc.), input devices (including USB mouse / keyboard, etc.), power management (including voltage monitoring, etc.), and the display system (including backlight detection, etc.). This equipment adopts an integrated design, enabling parallel testing of multiple modules and significantly improving testing efficiency.

[0098] The above description is merely a preferred embodiment of this application and should not be construed as limiting the scope of this application. All equivalent variations and modifications made in accordance with this application should still fall within the scope of protection intended by this application. This application may also have other various embodiments. Without departing from the spirit and essence of this application, those skilled in the art can make various corresponding changes and modifications based on this application, but all such corresponding changes and modifications should fall within the protection scope of the appended claims.

Claims

1. A chip testing fixture, comprising a limiting fixture, the limiting fixture including a horizontal worktable, the horizontal worktable having a bearing surface, characterized in that, The chip testing fixture also includes: A limiting component is disposed on the bearing surface, the limiting component including a limiting plate, and a limiting groove is formed in the middle area of ​​the limiting plate; The probe module includes a substrate, a needle magazine, and probes. The substrate is disposed below the limiting plate, and the substrate and the limiting plate are provided with a plurality of mounting holes arranged in an array. The needle magazine is installed in the mounting holes, and the probes are detachably installed in the needle magazine and extend out. A positioning structure is disposed between the horizontal worktable and the limiting component. The positioning structure includes a positioning element and a first positioning hole that cooperates with the positioning element. The positioning element is installed on the bearing surface of the horizontal worktable. The first positioning hole is opened at the bottom of the limiting plate. The positioning element has a retractable positioning part that can be inserted into the first positioning hole to limit the displacement of the limiting plate.

2. The chip testing fixture according to claim 1, characterized in that, The outer side of the limiting groove is provided with at least one opening along the extending direction; The inner side of the limiting groove is provided with at least one protruding post and at least one edge limiting part around the edge; The middle area of ​​the limiting groove is provided with several protrusions at intervals.

3. The chip testing fixture according to claim 1, characterized in that, The bearing surface has an installation groove, and the positioning element is installed in the installation groove.

4. The chip testing fixture according to claim 3, characterized in that, The positioning part includes an umbrella-shaped tip and an elastic telescopic part. The elastic telescopic part is inserted into the mounting groove and can extend and retract along the mounting groove. The umbrella-shaped tip is inserted into the first positioning hole as the elastic telescopic part extends.

5. The chip testing fixture according to claim 1, characterized in that, The needle magazine includes an open end and a tip, the tip extending from one side of the mounting hole and the open end partially extending from the other side of the mounting hole; the probe includes a limiting end and a concave end, the limiting end being detachably inserted into the open end and the concave end extending from the open end to connect with a detection line.

6. The chip testing fixture according to claim 1, characterized in that, The limiting fixture also includes a lifting drive mechanism, which includes a pressure plate and a guide drive structure. The pressure plate is located above the bearing surface, and the guide drive structure is connected to the pressure plate and drives the pressure plate to move in a direction perpendicular to the bearing surface.

7. The chip testing fixture according to claim 6, characterized in that, The pressure plate includes a limiting end, and a first driving member is installed on the limiting end. The first driving member includes a rotating shaft and a guide rail installed on the rotating shaft.

8. The chip testing fixture according to claim 7, characterized in that, The limiting plate is provided with a second positioning hole that mates with the guide rail.

9. The chip testing fixture according to claim 6, characterized in that, The guide drive structure includes a second drive component, a guide post, a stroke adjustment block, and a clamping head; One end of the guide post is connected to the output end of the second driving component, and the other end is fixedly connected to the pressure plate; The stroke adjustment block has a sliding groove along the vertical direction and a clamping head is connected to the bottom. The clamping head is fixedly connected to the guide post, and the guide post drives the clamping head to move along the sliding groove.

10. The chip testing fixture according to claim 5, characterized in that, The horizontal worktable is equipped with a display, and the side surface of the horizontal worktable and the upper surface of the bearing surface are provided with several through holes, through which the detection line passes and connects to the display.

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