Eight-station automatic die testing and sorting machine
Patent Information
- Application Number
- CN202522222042.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-21
- Publication Date
- 2026-09-22
- Estimated Expiration
- 2035-10-21
AI Technical Summary
[0015]采用上述技术方案后,本实用新型有益效果为:通过设置可同时吸取四芯片的机械臂配合双检测固定机构,通过快速高效的在单检测工位上进行多个芯片的轮换检测,有效提升了检测分选效率,同时,采用分体式收集盒,能够方便对分类的芯片进行按需选用。
Smart Images

Figure CN224778706U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to an eight-station automatic die sorting machine, and belongs to the field of semiconductor manufacturing equipment technology. Background Technology
[0002] An automatic die sorter is a high-precision automated device used in the back-end processes of semiconductor manufacturing. It is mainly used for testing, sorting, and classifying chips (dies) on wafers.
[0003] Existing sorting and testing equipment uses a robotic arm to pick up chips and place them on a testing station for inspection. Based on the inspection results, the chips are sorted and arranged. However, existing sorting equipment typically only tests one chip at a time at a single testing station. To improve inspection efficiency, more testing stations are needed. In addition, the sorting and arrangement of chips is mostly done using an integrated container divided into multiple small compartments for zoned placement. While this facilitates unified collection and use, it is not convenient for sorting and selecting chips according to actual needs, which affects production efficiency to some extent. Therefore, an eight-station automatic die sorting machine is proposed to solve the problems existing in the current technology. Utility Model Content
[0004] The purpose of this invention is to address the deficiencies or shortcomings in the existing technology by providing an automatic die sorting machine. By setting up a robotic arm that can simultaneously pick up four chips in conjunction with a dual detection and fixing mechanism, it can quickly and efficiently perform rotational detection of multiple chips at a single detection station, effectively improving the detection and sorting efficiency. At the same time, the use of a split collection box allows for convenient selection of classified chips as needed.
[0005] To achieve the above objectives, the present invention adopts the following technical solution: It includes a machine base 1, the machine base 1 having a material area 5, the material area 5 being divided into a feeding area 51 and a collection area 52, both the feeding area 51 and the collection area 52 being provided with several waffle boxes 3, the front side of the material area 5 being provided with multiple dual-chip fixed detection stations 4, the front side of the dual-chip fixed detection stations 4 being provided with a microscope detection mechanism 2, the microscope detection mechanism 2 being slidably connected to the machine base 1, the rear side of the material area 5 being provided with a front-to-back linear drive mechanism 6, the front-to-back linear drive mechanism 6 being provided with a horizontal... The drive mechanism 7 is equipped with a gripping mechanism 8. The gripping mechanism 8 includes a gripping bracket 86, on which a fixed plate 87 is mounted. Four push plates 84 are slidably connected to the front end of the fixed plate 87. A dual lifting motor 82 is provided on the rear side of the fixed plate 87. The two output shaft ends of the dual lifting motor 82 are connected to a herringbone swing arm 821 with rollers. The rollers on the swing arm 821 are in contact with the top of the push plate 84. The bottom of the push plate 84 is provided with a suction nozzle connecting pipe 85 arranged in a staggered manner. A suction nozzle 851 is provided at the bottom front end of the suction nozzle connecting pipe 85.
[0006] Furthermore, a visual recognition camera 83 is also provided on the front side of the fixed plate 87, adjacent to the push plate 84, and the visual recognition camera 83 is connected to the main control system.
[0007] Furthermore, the top of the dual lifting motor 82 is provided with a control valve 81, which is connected to an external air pump and is connected to the suction nozzle connection pipe 85 through a pipeline.
[0008] Furthermore, the waffle box 3 has a rectangular structure, and a pressure block 31 is movably arranged on one side of the waffle box 3. A pressure spring 32 is provided at one end of the pressure block 31 so that the pressure block 31 presses against the waffle box 3. Several magnets are also provided on the top of the machine base 1 to attract the waffle box 3.
[0009] Furthermore, the dual-chip fixed detection station 4 is provided with eight sets, each set including a dual-chip fixing mechanism 9 and a detection mechanism 10. The dual-chip fixing mechanism 9 includes a fixed lifting motor 91, a lifting slider 92, and a lifting guide rail 93. The fixed lifting motor 91 is installed at the end of the lifting guide rail 93. The lifting guide rail 93 is provided with two guide rails that are slidably connected to the lifting slider 92. The output shaft of the fixed lifting motor 91 is connected to the lifting slider 92.
[0010] Furthermore, the lifting slider 92 is provided with a fixed seat mounting column 94, and a fixed seat 95 is installed on the top of the fixed seat mounting column 94. The top of the fixed seat 95 is provided with two vertical chip fixing slots 96. Fastening plates 97 are provided on adjacent sides of the fixed seat 95. The top of the fastening plate 97 is provided with a top plate 98 corresponding to the chip fixing slots 96. The bottom of the fastening plate 97 is provided with a fastening shaft 99 with a spring. The fastening shaft 99 constrains the fastening plate 97 to press it towards the chip fixing slots 96. A weight sensor is also provided inside the fixed seat 95.
[0011] Furthermore, the detection mechanism 10 includes a detection base plate 101, a first movable plate 102, a second movable plate 103, and a movable support column 104. The detection base plate 101 is mounted on the mounting panel 11 on the machine base 1. The first movable plate 102 is slidably connected to the detection base plate 101 in the front-to-back traveling direction, and the second movable plate 103 is slidably connected to the first movable plate 102 in the horizontal direction. The movable support column 104 is a nested movable connection, with a fixed section connected to the second movable plate 103. The movable section is slidably installed within the fixed section, and a nut seat is provided on one side of the fixed section. A third adjusting bolt 107 is provided inside, and the end of the third adjusting bolt 107 is connected to the movable section of the movable support 104 through a connecting block. A nut seat is provided on the outermost side of the detection base plate 101, and a first adjusting bolt 105 is provided inside the nut seat. The end of the first adjusting bolt 105 is connected to the first movable plate 102 through a connecting block. A nut seat is also provided on the vertical side of the first movable plate 102 adjacent to the first adjusting bolt 105. A second adjusting bolt 106 is provided inside the nut seat, and the second adjusting bolt 106 is connected to the second movable plate 103 through a connecting block.
[0012] Furthermore, the movable support 104 is provided with an adjustment plate 108 on the side facing the dual-chip fixing mechanism 9. A detection probe card 109 is slidably connected to the bottom of the adjustment plate 108. A micrometer 110 is provided on one side of the adjustment plate 108. The micrometer 110 includes a fixed part and a movable part. The fixed part is installed on the adjustment plate 108, and the movable part is connected to the detection probe card 109.
[0013] Furthermore, the front and rear linear drive mechanism 6 includes a front and rear linear drive motor 61 and a front and rear linear drive bracket 62. The front and rear linear drive bracket 62 is vertically arranged from the rear end to the front end of the machine base 1 and is located in the middle of the machine base 1. A guide groove is axially opened on the top of the front and rear linear drive bracket 62. The front and rear linear drive motor 61 is located at the rear end of the front and rear linear drive bracket 62. The horizontal drive mechanism 7 includes a horizontal linear drive motor 71 and a horizontal drive bracket 72. The horizontal drive bracket 72 is located on the top of the front and rear linear drive bracket 62 and is spatially perpendicular to the front and rear linear drive bracket 62. The horizontal linear drive motor 71 is located on one side of the horizontal drive bracket. A movable connecting plate 73 is provided at the bottom of the horizontal drive bracket 72 section. A drive nut is provided at the bottom of the movable connecting plate 73 and is located in the guide groove. The output end of the front and rear linear drive motor 61 is connected to a transmission screw and threadedly connected to the drive nut.
[0014] Furthermore, the microscope inspection mechanism 2 includes a microscope 21, a microscope support 22, and a microscope moving guide rail 23. The microscope 21 is connected to the microscope support 22, and the microscope support 22 is slidably connected to the microscope moving guide rail 23.
[0015] After adopting the above technical solution, the beneficial effects of this utility model are as follows: by setting up a robotic arm that can simultaneously pick up four chips in conjunction with a dual detection and fixing mechanism, multiple chips can be rotated and detected quickly and efficiently at a single detection station, which effectively improves the detection and sorting efficiency. At the same time, the use of a split collection box makes it convenient to select the classified chips as needed. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a schematic diagram of the structure of this utility model;
[0018] Figure 2 yes Figure 1 Second angle view;
[0019] Figure 3 This is a schematic diagram of the internal structure of this utility model;
[0020] Figure 4 yes Figure 3 Second angle view;
[0021] Figure 5 yes Figure 3Third-angle view;
[0022] Figure 6 yes Figure 2 Enlarged structural diagram at point A in the middle;
[0023] Figure 7 yes Figure 3 Enlarged structural diagram at point B.
[0024] Explanation of reference numerals in the attached diagram: 1. Machine base; 2. Microscope inspection mechanism; 3. Waffle box; 4. Dual-chip fixing and inspection station; 5. Material area; 6. Front and rear linear drive mechanism; 7. Horizontal drive mechanism; 8. Gripping mechanism; 9. Dual-chip fixing mechanism; 10. Inspection mechanism; 11. Mounting panel; 12. Button area; 31. Pressure block; 32. Pressure spring; 51. Feeding area; 52. Collection area; 61. Linear drive motor; 62. Front and rear linear drive bracket; 71. Horizontal linear drive motor; 72. Horizontal drive bracket; 81. Control valve; 82. Dual lifting motor; 83. Vision recognition camera. 3. Push plate 84, suction nozzle connecting pipe 85, gripping bracket 86, fixing plate 87, fixed lifting motor 91, lifting slider 92, lifting guide rail 93, fixed seat mounting column 94, fixed seat 95, chip fixing slot 96, fastening plate 97, top plate 98, fastening shaft 99, detection base plate 101, first movable plate 102, second movable plate 103, movable support column 104, first adjusting bolt 105, second adjusting bolt 106, third adjusting bolt 107, adjusting plate 108, detection probe card 109, fine adjustment micrometer 110. Detailed Implementation
[0025] See Figures 1-7As shown, the technical solution adopted in this specific embodiment is as follows: It includes a machine base 1, the machine base 1 contains a material area 5, the material area 5 is divided into a feeding area 51 and a collection area 52, both the feeding area 51 and the collection area 52 are provided with several waffle boxes 3, the front side of the material area 5 is provided with multiple dual-chip fixed detection stations 4, the front side of the dual-chip fixed detection stations 4 is provided with a microscope detection mechanism 2, the microscope detection mechanism 2 is slidably connected to the machine base 1, the rear side of the material area 5 is provided with a front-to-back linear drive mechanism 6, the front-to-back linear drive mechanism 6 is provided with a horizontal drive mechanism 7, the horizontal drive mechanism 7 is provided with a gripping mechanism 8, the gripping mechanism 8 includes a gripping bracket 86, the gripping bracket 86 is mounted with a fixing plate 87. Four push plates 84 are slidably connected to the front end of the fixed plate 87. A dual lifting motor 82 is provided on the rear side of the fixed plate 87. The two output shaft ends of the dual lifting motor 82 are connected to a herringbone swing arm 821 with rollers. The rollers on the swing arm 821 are in contact with the top of the push plate 84. A suction nozzle connecting pipe 85 is provided at the bottom of the push plate 84, which is arranged in a staggered manner. A suction nozzle 851 is provided at the bottom front end of the suction nozzle connecting pipe 85. In this embodiment, the dual chip fixing and detection station can fix and detect two chips at a time. The dual chip fixing and detection station 4 is provided with eight sets, each set including a dual chip fixing mechanism 9 and a detection mechanism 10. Therefore, it can detect sixteen chips at the same time, which effectively improves the detection efficiency.
[0026] The gripping mechanism is equipped with four chip gripping mechanisms, namely four push plates, a suction nozzle connecting tube, and a suction nozzle forming a gripping robotic arm. Each pair of push plates cooperates with a swing arm, and the two rollers on the swing arm contact the top of each push plate. The dual lifting motor includes two servo motors to ensure control precision. After the motors start, they control the swing arm to rotate, thereby driving the two push plates to lift and lower respectively. The two swing arms control the four push plates to lift and grip respectively. At the same time, since a visual recognition camera 83 is also set on the front side of the fixed plate 87 adjacent to the push plate 84, and the visual recognition camera 83 is connected to the main control system, it can grip the specific chips to be tested separately as needed and perform different detection and sorting operations. The classified material handling method can perform material loading and detection more efficiently.
[0027] After testing, the wafers are placed into different waffle boxes according to sorting requirements.
[0028] More specifically, the top of the dual lifting motor 82 is equipped with a control valve 81, which is connected to an external air pump and is connected to the suction nozzle connection pipe 85 through a pipeline. The control valve controls the air flow of the gripping mechanism.
[0029] More specifically, the waffle box 3 has a rectangular structure. A pressure block 31 is movably arranged on one side of the waffle box 3, and a compression spring 32 is provided at one end of the pressure block 31 so that the pressure block 31 presses against the waffle box 3. Several magnets are also provided on the top of the machine base 1 to attract the waffle box 3. In this embodiment, the placement and collection of chips are carried out in different waffle boxes, which can be classified according to specific needs and is more convenient for multiple testing items. The bottom of the waffle box is made of magnetic material and is attracted and fixed by magnets. At the same time, it is constrained by the pressure block and the compression spring provides a fastening force to ensure that the waffle box will not shift when grasped or placed.
[0030] More specifically, the dual-chip fixing mechanism 9 includes a fixed lifting motor 91, a lifting slider 92, and a lifting guide rail 93. The fixed lifting motor 91 is installed at the end of the lifting guide rail 93. The lifting guide rail 93 is provided with two guide rails that are slidably connected to the lifting slider 92. The output shaft of the fixed lifting motor 91 is connected to the lifting slider 92. The dual-chip fixing mechanism is a lifting mechanism that descends first when the chip is placed, making it easier to place the chip. The fixed lifting motor drives the lifting slider to move on the lifting guide rail. The lifting guide rail has a dual-guide rail structure, making the movement of the lifting slider on the dual guide rails more stable.
[0031] The lifting slider 92 is provided with a fixed seat mounting column 94, and a fixed seat 95 is installed on the top of the fixed seat mounting column 94. The lifting slider moves the fixed seat mounting column under the drive of the lifting drive motor, thereby driving the fixed seat to rise and fall.
[0032] The top of the mounting base 95 is provided with two vertical chip fixing slots 96. The two chip fixing slots can place and fix two chips. The chip fixing slots are provided with multiple suction holes (not shown). The mounting base is provided with a vacuum suction tube (not shown) corresponding to the suction holes. The vacuum suction tube is connected to an external air pump, so as to adsorb and fix the chips.
[0033] Fastening plates 97 are provided on both sides of the fixing base 95. A top plate 98 is provided on the top of the fastening plate 97, which corresponds to the chip fixing slot 96. A spring-loaded fastening shaft 99 is provided at the bottom of the fastening plate 97. The fastening shaft 99 constrains the fastening plate 97 to press it towards the chip fixing slot 96. In addition to fixing the chip by vacuum adsorption, a physical fixing structure is also provided, that is, the movable fastening plate cooperates with the top plate and keeps the chip pressed under the action of the fastening shaft. The dual fixing method can effectively fix the chip and ensure the accuracy of the test results.
[0034] The mounting base 95 is also equipped with a weight sensor, which can detect whether the chip has been placed.
[0035] More specifically, the detection mechanism 10 includes a detection base plate 101, a first movable plate 102, a second movable plate 103, and a movable support column 104. The detection base plate 101 is mounted on the mounting panel 11 on the machine base 1. The first movable plate 102 is slidably connected to the detection base plate 101 in the front-to-back direction, and the second movable plate 103 is slidably connected to the first movable plate 102 in the horizontal direction. The movable support column 104 is a nested movable connection, with a fixed section connected to the second movable plate 103 and a movable section slidably installed within the fixed section. A nut seat is provided on one side of the fixed section, and a third adjusting bolt 107 is provided inside the nut seat. The end of the third adjusting bolt 107 is connected to the movable section of the movable support column 104 through a connecting block. The outermost part of the detection base plate 101 is provided with a nut seat, and inside the nut seat... A first adjusting bolt 105 is provided, and the end of the first adjusting bolt 105 is connected to the first movable plate 102 via a connecting block. A nut seat is also provided on the vertical side of the first movable plate 102 adjacent to the first adjusting bolt 105. A second adjusting bolt 106 is provided in the nut seat. The second adjusting bolt 106 is connected to the second movable plate 103 via a connecting block. In this embodiment, the detection mechanism is a multi-directional adjustable structure. The first adjusting bolt drives the first movable plate to move horizontally on the detection base plate, the second bolt drives the second movable plate to move back and forth on the first movable plate, and the third adjusting bolt adjusts the lifting and lowering of the movable main column. The above adjustments are all fine-tuning operations, which are beneficial to improving the positional accuracy of the detection mechanism. Traditional detection mechanisms lack specific fine-tuning mechanisms, which are not conducive to improving detection accuracy.
[0036] More specifically, the movable support 104 is provided with an adjustment plate 108 on the side facing the dual-chip fixing mechanism 9. The bottom of the adjustment plate 108 is slidably connected to the detection probe card 109. A micrometer 110 is provided on one side of the adjustment plate 108. The micrometer 110 includes a fixed part and a movable part. The fixed part is installed on the adjustment plate 108, and the movable part is connected to the detection probe card 109. In this embodiment, by providing a micrometer on the adjustment plate, the position of the detection probe card can be further adjusted as the final detection step, thereby performing specific detection on the chip.
[0037] More specifically, the front and rear linear drive mechanism 6 includes a front and rear linear drive motor 61 and a front and rear linear drive bracket 62. The front and rear linear drive bracket 62 is vertically arranged from the rear end to the front end of the machine base 1 and is located in the middle of the machine base 1. A guide groove is axially opened on the top of the front and rear linear drive bracket 62. The front and rear linear drive motor 61 is located at the rear end of the front and rear linear drive bracket 62. The horizontal drive mechanism 7 includes a horizontal linear drive motor 71 and a horizontal drive bracket 72. The horizontal drive bracket 72 is located on top of the front and rear linear drive bracket 62 and is spatially perpendicular to the front and rear linear drive bracket 62. The horizontal linear drive motor 71 is located on one side of the horizontal drive bracket. A movable connecting plate 73 is provided at the bottom of the horizontal drive bracket 72. A drive nut is provided at the bottom of the movable connecting plate 73 and is located in the guide groove. The output end of the front and rear linear drive motor 61 is connected to a transmission screw and threadedly connected to the drive nut. In this embodiment, the horizontal and forward / backward movement of the gripping mechanism on the machine base is achieved by setting two linear drive motors.
[0038] More specifically, the microscope inspection mechanism 2 includes a microscope 21, a microscope support 22, and a microscope moving guide rail 23. The microscope 21 is connected to the microscope support 22, and the microscope support 22 is slidably connected to the microscope moving guide rail 23. In this embodiment, by setting up the microscope, the chip fixation and inspection results can be inspected, which is convenient for operators to review according to actual needs, thereby enabling the verification of inspection items and modification of specific operations, and also making it convenient for beginners to learn.
[0039] The working principle of this utility model is as follows: The material area 5 is symmetrically divided into a feeding area 51 and a collection area 52. The left side is the feeding area 51, and the right side is the collection area 52. The material to be tested is placed in the feeding area on the left. The main control system is integrated into the machine base 1 and is specifically controlled through the button area 12 on the front side of the machine base. The detection and sorting scheme is set in the main control system. After the equipment is started, the front and rear linear drive mechanisms 6 perform self-checks and return to the initial position, i.e., the end position. The horizontal drive mechanism 7 also performs self-checks and drives the gripping mechanism 8 to move to the leftmost position. Then, it starts working according to the settings of the main control system. The gripping mechanism 8 picks up the chip from the feeding area. After the gripping is completed, the front and rear linear drive mechanisms 6 and the horizontal drive mechanism 7 are restarted, driving the gripping mechanism 8 to move forward. Depending on the detection item, it moves to different dual-chip fixed detection stations 4 in front. Since the gripping mechanism 8 has four push plates 84, which are driven to lift by dual lifting motors 81, four suction nozzles can be used. The connecting tube 85 picks up and places materials, operating on four chips at a time. The fixing seat 95 is equipped with two fixing slots 96, fixing and testing two chips at a time. After placing one chip on the fixing seat 95, it moves to the next station to place the remaining two chips. The simultaneous picking up of four chips greatly improves the material handling efficiency. During testing, the detection mechanism 10 adjusts its specific position through multiple adjusting bolts to ensure accurate movement above the fixing slot 96. The visual recognition camera 83 takes pictures of the chip for recognition, ensuring accurate placement and comparing the test items. The detection probe card 109 performs specific tests on the chip. During and after the test, the chip can be observed through the moving microscope detection mechanism 2. The program can be corrected in real time based on the observation to obtain the specific sorting requirements. After the test, the gripping mechanism 8 picks up the chip and places it into the waffle box 3. Different waffle boxes 3 can be removed as needed.
[0040] The above description is only used to illustrate the technical solution of this utility model and is not intended to limit it. Any other modifications or equivalent substitutions made by those skilled in the art to the technical solution of this utility model, as long as they do not depart from the spirit and scope of the technical solution of this utility model, should be covered within the scope of the claims of this utility model.
Claims
1. An eight-station automatic die sorting machine, characterized in that: It includes a machine base (1), the machine base (1) contains a material area (5), the material area (5) is divided into a feeding area (51) and a collection area (52), both the feeding area (51) and the collection area (52) are provided with several waffle boxes (3), the front side of the material area (5) is provided with multiple dual-chip fixed detection stations (4), the front side of the dual-chip fixed detection station (4) is provided with a microscope detection mechanism (2), the microscope detection mechanism (2) is slidably connected to the machine base (1), the rear side of the material area (5) is provided with a front and rear linear drive mechanism (6), the front and rear linear drive mechanism (6) is provided with a horizontal drive mechanism (7), the horizontal drive mechanism... The structure (7) is provided with a gripping mechanism (8), which includes a gripping bracket (86). A fixed plate (87) is installed on the gripping bracket (86). Four push plates (84) are slidably connected to the front end of the fixed plate (87). A double lifting motor (82) is provided on the rear side of the fixed plate (87). The two output shaft ends of the double lifting motor (82) are connected to a herringbone swing arm (821) with rollers. The rollers on the swing arm (821) are in contact with the top of the push plate (84). A suction nozzle connecting pipe (85) is provided at the bottom of the push plate (84) with staggered front and rear. A suction nozzle (851) is provided at the bottom front end of the suction nozzle connecting pipe (85).
2. The eight-station automatic die sorting machine according to claim 1, characterized in that: A visual recognition camera (83) is also provided on the front side of the fixed plate (87) adjacent to the push plate (84), and the visual recognition camera (83) is connected to the main control system.
3. The eight-station automatic die sorting machine according to claim 1, characterized in that: The dual lifting motor (82) is equipped with a control valve (81) on top. The control valve (81) is connected to an external air pump and is connected to the suction nozzle connecting pipe (85) through a pipeline.
4. The eight-station automatic die sorting machine according to claim 1, characterized in that: The waffle box (3) is rectangular in shape. A pressure block (31) is movably arranged on one side of the waffle box (3). A pressure spring (32) is provided at one end of the pressure block (31) so that the pressure block (31) presses against the waffle box (3). Several magnets are also provided on the top of the machine base (1) to attract the waffle box (3).
5. An eight-station automatic die sorting machine according to claim 1, characterized in that: The dual-chip fixed detection station (4) is provided with eight sets, each set including a dual-chip fixing mechanism (9) and a detection mechanism (10). The dual-chip fixing mechanism (9) includes a fixed lifting motor (91), a lifting slider (92), and a lifting guide rail (93). The fixed lifting motor (91) is installed at the end of the lifting guide rail (93). The lifting guide rail (93) is provided with two guide rails that are slidably connected to the lifting slider (92). The output shaft of the fixed lifting motor (91) is connected to the lifting slider (92).
6. An eight-station automatic die sorting machine according to claim 5, characterized in that: The lifting slider (92) is provided with a fixed seat mounting column (94), a fixed seat (95) is installed on the top of the fixed seat mounting column (94), the top of the fixed seat (95) is provided with two vertical chip fixing slots (96), fastening plates (97) are provided on the adjacent sides of the fixed seat (95), the top of the fastening plate (97) is provided with a top plate (98) corresponding to the chip fixing slots (96), the bottom of the fastening plate (97) is provided with a fastening shaft (99) with a spring, the fastening shaft (99) constrains the fastening plate (97) to press it against the chip fixing slots (96), and a weight sensor is also provided inside the fixed seat (95).
7. An eight-station automatic die sorting machine according to claim 5, characterized in that: The testing mechanism (10) includes a testing base plate (101), a first movable plate (102), a second movable plate (103), and a movable support column (104). The testing base plate (101) is mounted on the mounting panel (11) on the machine base (1). The first movable plate (102) is slidably connected to the testing base plate (101) in the forward and backward travel direction. The second movable plate (103) is slidably connected to the first movable plate (102) in the horizontal direction. The movable support column (104) is a nested movable connection. The fixed section is connected to the second movable plate (103). The movable section is slidably installed in the fixed section. A nut seat is provided on one side of the fixed section. A third adjusting bolt (107) is provided, and the end of the third adjusting bolt (107) is connected to the movable section of the movable support (104) through a connecting block. A nut seat is provided on the outermost side of the detection base plate (101), and a first adjusting bolt (105) is provided in the nut seat. The end of the first adjusting bolt (105) is connected to the first movable plate (102) through a connecting block. A nut seat is also provided on the vertical side of the first movable plate (102) adjacent to the first adjusting bolt (105). A second adjusting bolt (106) is provided in the nut seat. The second adjusting bolt (106) is connected to the second movable plate (103) through a connecting block.
8. An eight-station automatic die sorting machine according to claim 7, characterized in that: The movable support (104) is provided with an adjustment plate (108) on the side facing the dual-chip fixing mechanism (9). The bottom of the adjustment plate (108) is slidably connected to a detection probe card (109). A micrometer (110) is provided on one side of the adjustment plate (108). The micrometer (110) includes a fixed part and a movable part. The fixed part is installed on the adjustment plate (108), and the movable part is connected to the detection probe card (109).
9. An eight-station automatic die sorting machine according to claim 1, characterized in that: The front and rear linear drive mechanism (6) includes a front and rear linear drive motor (61) and a front and rear linear drive bracket (62). The front and rear linear drive bracket (62) is vertically arranged from the rear end to the front end of the machine base (1) and is located in the middle of the machine base (1). The top of the front and rear linear drive bracket (62) is axially provided with a guide groove. The front and rear linear drive motor (61) is located at the rear end of the front and rear linear drive bracket (62). The horizontal drive mechanism (7) includes a horizontal linear drive motor (71) and a horizontal drive bracket (72). The horizontal drive bracket (72) is located at the top of the front and rear linear drive bracket (62) and is spatially perpendicular to the front and rear linear drive bracket (62). The horizontal linear drive motor (71) is located on one side of the horizontal drive bracket. A movable connecting plate (73) is provided at the bottom of the horizontal drive bracket (72). A drive nut is provided at the bottom of the movable connecting plate (73). The drive nut is located in the guide groove. The output end of the front and rear linear drive motor (61) is connected to a transmission screw and threadedly connected to the drive nut.
10. An eight-station automatic die sorting machine according to claim 1, characterized in that: The microscope inspection mechanism (2) includes a microscope (21), a microscope support (22), and a microscope moving guide rail (23). The microscope (21) is connected to the microscope support (22), and the microscope support (22) is slidably connected to the microscope moving guide rail (23).