A low-voltage circuit measurement and control terminal test fixture facilitating positioning and guiding

Abstract

The utility model discloses a kind of low voltage loop measurement and control terminal test fixture convenient to position guide, it is related to test fixture technical field, including test table, the side of test table is provided with handle, test table top is provided test component, the middle position of test table top is provided with the guiding mechanism that the compression of to be measured piece is compressed, the compression plate that can move up and down is provided on the mounting bracket, the compression plate is guided by guiding mechanism, one end of test table top is provided with mounting bracket. The utility model is compressed by setting test component, through the reaction force generated by second spring, in turn through test plate and terminal, continuously act on elastic probe. This provides stable, reliable and vertical positive pressure for probe, ensure that every probe is in good electrical contact with test point, ensure that all probes contact simultaneously, prevent poor contact caused by insufficient pressure, or probe or test point damage problem caused by excessive pressure.

Description

Technical Field

[0001] This utility model relates to the field of test fixture technology, specifically a low-voltage loop measurement and control terminal test fixture that is easy to position and guide. Background Technology

[0002] Low-voltage circuit monitoring and control terminals are key equipment in intelligent power distribution networks, widely used in low-voltage distribution boxes. They are responsible for real-time monitoring, measurement, and control of electrical parameters (such as voltage, current, and power) of the lines. After leaving the factory or undergoing maintenance, they must undergo rigorous performance testing and functional verification to ensure that their measurement accuracy, communication functions, and reliability meet the standards.

[0003] An existing patent (authorization announcement number: CN223078353U) discloses a fixture positioning component for a testing mechanism. The key technical point of this solution is: the rear end of the top frame is hinged to the rear end of the support frame, and a support block is provided at the front end of the support frame. The front end of the top frame is supported by the support block, and a snap-fit ​​structure is provided between the front end of the top frame and the support block. Thus, when it is necessary to install or replace the upper or lower mold fixture, the snap-fit ​​structure is unlocked, and the top frame is lifted upwards relative to the support frame. This creates an open operating opening between the top frame and the support frame, exposing the upper and lower mold fixtures, as well as other auxiliary mechanisms. This facilitates the installation and replacement of the upper and lower mold fixtures and also facilitates the maintenance of other auxiliary mechanisms.

[0004] However, the above-mentioned technical solutions still have certain drawbacks. The simple pressing method cannot guarantee that each probe is subjected to uniform and stable pressure. Uneven pressure may lead to excessive contact resistance of some probes, unstable signal transmission, and thus test errors or misjudgments, making it difficult to guarantee the reliability of the test results. Therefore, a low-voltage loop measurement and control terminal test fixture that is easy to position and guide is proposed. Utility Model Content

[0005] The purpose of this invention is to provide a low-voltage loop measurement and control terminal test fixture that is easy to position and guide, so as to solve the problems in the background art.

[0006] To achieve the above objectives, this utility model provides the following technical solution:

[0007] A test fixture for a low-voltage loop measurement and control terminal that is easy to position and guide includes a test bench, a handle is provided on the side of the test bench, a test component is provided on the top of the test bench, and a pressing component for pressing the test piece is provided in the middle of the top of the test bench.

[0008] The mounting frame is equipped with a pressing plate that can move up and down, and the pressing plate is guided by a guiding mechanism;

[0009] A mounting bracket is provided at one end of the top of the test bench; a testing machine is fixedly installed at the bottom of the pressing plate, and an elastic probe is provided at the bottom of the testing machine; at least one mounting column is installed on the top of the test bench, and a test plate is fixedly installed on the top of the mounting column; a second spring is provided between the test plate and the test bench; and multiple sets of clamping blocks for holding the terminal under test are provided on the top of the test plate.

[0010] Based on the above technical solutions, this utility model also provides the following optional technical solutions:

[0011] As a further embodiment of this utility model: the guiding mechanism includes at least one guide rod fixedly installed on the mounting frame, the guide rod is vertically arranged and passes through the pressing plate, a limiting ring is fixedly arranged on the pressing plate, and the limiting ring is sleeved on the guide rod; the middle part of the mounting frame is also provided with a driving mechanism for driving the pressing plate to move up and down.

[0012] As a further embodiment of this utility model: the driving mechanism includes a mounting base, a rotating handle, a connecting arm, and a pressing arm; the mounting base is fixed on the mounting frame; one end of the rotating handle is rotatably disposed on the side of the mounting base; one end of the connecting arm is hinged to the middle of the rotating handle, and the other end is hinged to one end of the pressing arm; the pressing arm slides through a guide cylinder fixed on the mounting base, and its other end is provided with a driving head that can slide relative to it; the driving head and the pressing arm are connected by a first spring; the lower surface of the driving head is connected to the upper surface of the pressing plate.

[0013] As a further improvement of this utility model, a switch and a charging plug are also provided on the side of the test platform.

[0014] As a further improvement of this invention, the side of the drive head closest to the pressing plate is made of a flexible material.

[0015] As a further improvement of this utility model, the test components are arranged in two sets mirror images along the midline of the long side of the test platform.

[0016] As a further improvement of this utility model, the end of the rotating handle is provided with anti-slip texture.

[0017] As a further improvement of this utility model, the clamping block is made of rubber.

[0018] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0019] 1. This utility model, by setting up a test component, utilizes the reaction force generated by the compression of the second spring, which, in turn, acts continuously on the elastic probe through the test plate and the terminal. This provides the probe with stable, reliable, and vertical positive pressure, ensuring that each probe forms good electrical contact with the test point, ensuring that all probes make contact simultaneously, and preventing poor contact due to insufficient pressure or damage to the probe or test point due to excessive pressure.

[0020] 2. By setting up a guiding mechanism and pressing the pressing plate vertically downward, this utility model ensures that the pressing force on each product is uniform and consistent, thereby guaranteeing the consistency and reliability of the test results. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the structure of this utility model;

[0022] Figure 2 This is a schematic diagram of the pressing assembly of this utility model;

[0023] Figure 3 This is a schematic diagram of the fixture of this utility model;

[0024] Figure 4 For the present utility model Figure 3 Enlarged view of point A in the middle;

[0025] Figure 5 This is a schematic diagram of the structure of the test component of this utility model.

[0026] Figure label annotations: 1. Test stand; 2. Handle; 3. Guide mechanism; 4. Test component;

[0027] 31. Mounting bracket; 32. Guide rod; 33. Pressing plate; 34. Limiting ring; 35. Drive mechanism;

[0028] 351. Mounting base; 352. Rotating handle; 353. Connecting arm; 354. Pressing arm; 355. Guide cylinder; 356. Drive head; 357. First spring;

[0029] 41. Testing machine; 42. Fixing column; 43. Elastic probe; 44. Test plate; 45. Clamping block; 46. Second spring; 47. Mounting column. Detailed Implementation

[0030] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments.

[0031] In one embodiment, such as Figures 1-5As shown, a test fixture for a low-voltage loop measurement and control terminal that is easy to position and guide includes a test bench 1, a handle 2 on the side of the test bench 1, a test component 4 on the top of the test bench 1, a guide mechanism 3 for pressing the test piece in the middle of the top of the test bench 1, and a switch and a charging plug on the side of the test bench 1.

[0032] In this embodiment, the operator places the low-voltage circuit control terminal to be tested on the test assembly 4. The clamp 45 initially restricts the position of the terminal to complete the coarse positioning. At the same time, the operator activates the guide mechanism 3, which can guide and press the test board 44, and contact the test point of the terminal through the probe, and open and close the charging plug through the switch.

[0033] In one embodiment, such as Figure 5 As shown, a mounting frame 31 is provided at one end of the top of the test bench 1; a pressing plate 33 that can move up and down is provided on the mounting frame 31, and the pressing plate 33 is guided by a guide mechanism 3; a testing machine 41 is fixedly installed at the bottom of the pressing plate 33, and an elastic probe 43 is provided at the bottom of the testing machine 41; at least one mounting post 47 is installed on the top of the test bench 1, and a test plate 44 is fixedly installed on the top of the mounting post 47; a second spring 46 is provided between the test plate 44 and the test bench 1; multiple sets of clamping blocks 45 for holding the terminal under test are provided on the top of the test plate 44, and the clamping blocks 45 are made of rubber; the operator places the terminal under test on the rubber clamping blocks 45 on the top of the test plate 44, and the rubber clamping blocks 45 rely on the friction of their material and Slight deformation gently clamps the terminal, achieving initial coarse positioning. The entire test plate 44 is mounted on the test table 1 via the mounting post 47, with the second spring 46 underneath in its normal extended state. The guide mechanism 3 pushes the pressing plate 33 downward, and the test machine 41 and elastic probe 43, fixed to the bottom of the pressing plate 33, descend smoothly together. When the elastic probe 43 contacts the test point on the terminal, the pressing plate 33 continues to move downward. Since the terminal is supported by the test plate 44 below, the probe can no longer descend. This downward force will compress the second spring 46, causing the entire test plate 44 to move slightly downward along with the terminal. The reaction force generated by the compression of the second spring 46, in turn, acts on the elastic probe 43 continuously through the test plate 44 and the terminal. This provides stable, reliable, and vertical positive pressure to the probes, ensuring that each probe makes good electrical contact with the test point. The elastic probe 43 can also extend and retract to further compensate for slight height differences between different test points, ensuring that all probes make contact simultaneously and preventing poor contact due to insufficient pressure or damage to the probes or test points due to excessive pressure.

[0034] In one embodiment, such as Figure 2As shown, the guiding mechanism 3 includes at least one guide rod 32 fixedly mounted on the mounting frame 31. The guide rod 32 is vertically arranged and passes through the pressing plate 33. A limiting ring 34 is fixedly arranged on the pressing plate 33, and the limiting ring 34 is sleeved on the guide rod 32. The middle part of the mounting frame 31 is also provided with a driving mechanism 35 for driving the pressing plate 33 to move up and down. The pressing plate 33 is driven by the driving mechanism 35 to press down, and the pressing plate 33 can move along the axial direction of the guide rod 32, thereby stably pressing down the terminal to be tested.

[0035] In one embodiment, such as Figure 3 and Figure 4 As shown, the drive mechanism 35 includes a mounting base 351, a rotating handle 352, a connecting arm 353, and a pressing arm 354. The mounting base 351 is fixed to the mounting frame 31. One end of the rotating handle 352 is rotatably disposed on the side of the mounting base 351, and the end of the rotating handle 352 is provided with anti-slip texture. One end of the connecting arm 353 is hinged to the middle of the rotating handle 352, and the other end is hinged to one end of the pressing arm 354. The pressing arm 354 slides through a guide cylinder 355 fixed on the mounting base 351, and its other end is provided with a drive head 356 that can slide relative to it. The drive head 356 and the pressing arm 354 are connected by a first spring 357. The lower surface of the drive head 356 is flush with the guide cylinder 355. The upper surface of the pressing plate 33 is connected to the drive head 356, which is made of a flexible material on the side near the pressing plate 33. The operator grips the anti-slip texture of the rotating handle 352 and applies a downward force. The rotating handle 352 acts as a first-stage lever, rotating around its connection point with the mounting base 351. The connecting arm 353 transmits the motion and force from the middle of the rotating handle 352 to the pressing arm 354. Under the constraint of the guide cylinder 355, the pressing arm 354 converts the combined motion transmitted from the connecting arm 353 into a vertical linear motion. The drive head 356 is connected to the pressing arm 354 via a first spring 357. When the lower surface of the drive head 356 contacts the pressing plate 33, the pressing plate 33 begins to move. When the probe contacts the product being tested, the resistance increases. As the pressing arm 354 continues to move downward, it compresses the first spring 357. The reaction force generated by the compression of the spring is exactly the actual pressure applied to the pressing plate 33. The bottom of the drive head 356 is made of flexible material (such as rubber or polyurethane), which increases the friction with the surface of the pressing plate 33, ensuring that the force can be effectively transmitted. At the same time, it can also absorb small vibrations and impacts, playing a buffering and protective role. The spring buffer design can automatically compensate for the small differences in the size of different products, probe wear, and fixture parts, ensuring that the pressing force on each product is uniform and consistent, thereby ensuring the consistency and reliability of the test results.

[0036] In one embodiment, such as Figure 5 As shown, two sets of test components 4 are mirrored along the center line of the long side of the test bench 1; the two sets of test components 4 are used to test the terminal simultaneously through two workstations, which facilitates the comparison experiment with the control group.

[0037] The above embodiment discloses a low-voltage circuit measurement and control terminal test fixture that facilitates positioning and guidance. The operator moves the fixture to a suitable workstation using handle 2. The low-voltage circuit measurement and control terminal to be tested is placed on the test plate 44, where it is initially clamped and positioned by rubber clamps 45. The operator grips the rotating handle 352 and presses down, the downward pressure being transmitted to the pressing arm 354 via the connecting arm 353. Under the constraint of the guide cylinder 355, the pressing arm 354 moves vertically downwards, pushing its end drive head 356. The drive head 356 contacts and presses down on the pressing plate 33. The pressing plate 33, under the guidance mechanism 3 composed of the guide rod 32 and the limiting ring 34, moves strictly vertically downwards, causing the test machine 41 and its elastic probe 43, fixed on the pressing plate 33, to descend accordingly. When the probe contacts the product test point, resistance is generated, performing a contact test on the terminal.

[0038] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A test fixture for a low-voltage loop measurement and control terminal that is easy to position and guide, comprising a test bench (1), wherein a handle (2) is provided on the side of the test bench (1), characterized in that, The test bench (1) is equipped with a test component (4) on top, and a guide mechanism (3) for pressing the test piece is provided in the middle of the top of the test bench (1). The test bench (1) is provided with a mounting frame (31) at one end of its top; the mounting frame (31) is provided with a pressing plate (33) that can move up and down, and the pressing plate (33) is guided by a guiding mechanism (3); The test assembly (4) includes a test machine (41) fixedly mounted on the bottom of the pressing plate (33), an elastic probe (43) is provided on the bottom of the test machine (41), at least one mounting post (47) is mounted on the top of the test platform (1), a test plate (44) is fixedly mounted on the top of the mounting post (47), a second spring (46) is provided between the test plate (44) and the test platform (1), and multiple sets of clamping blocks (45) for clamping the terminal under test are provided on the top of the test plate (44).

2. The low-voltage loop measurement and control terminal test fixture for easy positioning and guidance according to claim 1, characterized in that, The guiding mechanism (3) includes at least one guide rod (32) fixedly installed on the mounting frame (31). The guide rod (32) is vertically arranged and passes through the pressing plate (33). A limiting ring (34) is fixedly arranged on the pressing plate (33) and the limiting ring (34) is sleeved on the guide rod (32). The middle part of the mounting frame (31) is also provided with a driving mechanism (35) for driving the pressing plate (33) to move up and down.

3. The low-voltage loop measurement and control terminal test fixture for easy positioning and guidance according to claim 2, characterized in that, The drive mechanism (35) includes a mounting base (351), a rotating handle (352), a connecting arm (353), and a pressing arm (354); the mounting base (351) is fixed on the mounting frame (31); one end of the rotating handle (352) is rotatably disposed on the side of the mounting base (351); one end of the connecting arm (353) is hinged to the middle of the rotating handle (352), and the other end is hinged to one end of the pressing arm (354); the pressing arm (354) slides through the guide tube (355) fixed on the mounting base (351), and its other end is provided with a drive head (356) that can slide relative to it; the drive head (356) and the pressing arm (354) are connected by a first spring (357); the lower surface of the drive head (356) is connected to the upper surface of the pressing plate (33).

4. The low-voltage loop measurement and control terminal test fixture for easy positioning and guidance according to claim 1, characterized in that, The test bench (1) is also equipped with a switch and a charging plug on its side.

5. A low-voltage loop measurement and control terminal test fixture for easy positioning and guidance according to claim 3, characterized in that, The drive head (356) is made of a flexible material on the side near the pressing plate (33).

6. A low-voltage loop measurement and control terminal test fixture for easy positioning and guidance according to claim 1, characterized in that, The test components (4) are set in two sets mirrored along the midline of the long side of the test bench (1).

7. A low-voltage loop measurement and control terminal test fixture for easy positioning and guidance according to claim 3, characterized in that, The end of the rotating handle (352) is provided with anti-slip texture.

8. A low-voltage loop measurement and control terminal test fixture for easy positioning and guidance according to claim 1, characterized in that, The clamp (45) is made of rubber.

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