GaN chip surge current protection test fixture

Abstract

The utility model relates to GaN chip surge test technical field, and disclose GaN chip surge current protection test fixture, including support platform, the support platform top is provided with lifting mechanism, the lifting mechanism front is provided with connecting mechanism, the connecting mechanism front is provided with test fixture body, the support platform top is provided with transparent box, the lifting mechanism includes support arm, support arm fixed connection in support platform top, support arm inboard fixed connection has fixed groove no. 1. This GaN chip surge current protection test fixture, through setting lifting mechanism, motor drive screw rod drives protruding piece linear motion all the time, linkage fixed arm and test fixture body realize the automatic immersion of GaN chip in fluorination liquid and remove, completely avoid artificial operation electric shock and chemical exposure risk. This mechanical lifting structure replaces traditional manual operation, ensures that chip test whole process does not need to contact high -voltage component or liquid medium, significantly improves test environment security.

Description

Technical Field

[0001] This utility model relates to the field of GaN chip surge testing technology, specifically a GaN chip surge current protection test fixture. Background Technology

[0002] GaN (Gallium Nitride) chips are power electronic devices made from gallium nitride, a third-generation semiconductor material. By replacing traditional silicon-based chips (Si), they achieve a core breakthrough in higher efficiency, smaller size, and higher power density in high-frequency, high-voltage, and high-temperature scenarios.

[0003] After GaN chips are fabricated, they need to undergo surge current protection testing to assess their lifespan and reliability. However, the extremely high test voltage (usually several kilovolts) can easily cause air dielectric breakdown, leading to current bypass discharge and distorted test results. To address this, the industry uses the electronic fluoride immersion method—completely immersing the chip and test fixture in a highly insulating fluoride solution to suppress breakdown and ensure accurate current flow through the chip. However, this process relies on manual operation of the fixture to immerse and remove it, posing a dual safety hazard of electric shock (contact with high-voltage components) and chemical exposure (inhalation of vapors / skin contact) to the operator. Utility Model Content

[0004] The purpose of this invention is to provide a GaN chip surge current protection test fixture to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a GaN chip surge current protection test fixture, including a support platform, a lifting mechanism on the top of the support platform, a connecting mechanism on the front of the lifting mechanism, a test fixture body on the front of the connecting mechanism, and a transparent box on the top of the support platform.

[0006] The lifting mechanism includes a support arm, which is fixedly connected to the top of the support platform. A fixing groove is fixedly connected to the inner side of the support arm. A motor is fixedly connected to the top of the support platform. A threaded rod is fixedly connected to the output end of the motor. A protrusion is slidably connected to the inner wall of the fixing groove. A fixing arm is fixedly connected to the front of the protrusion. A fixing groove is fixedly connected to the front of the fixing arm. A protrusion is slidably connected to the inner wall of the fixing groove. A support block is fixedly connected to the front of the protrusion.

[0007] Preferably, the first protrusion has a threaded hole inside, and the first protrusion is threaded to the outer wall of the threaded rod through the threaded hole, so that the rotational motion of the threaded rod can be converted into the linear motion of the first protrusion.

[0008] Preferably, the top end of the threaded rod is rotatably connected to the top of the inner wall of the fixed groove, and the threaded rod passes through the bottom of the fixed groove and rotates to provide stable support for the threaded rod.

[0009] Preferably, the connecting mechanism includes an arc-shaped shaft, which is fixedly connected to the inside of the support block. A spring is fixedly connected to the top of the support block, and an arc-shaped sleeve is fixedly connected to the end of the spring away from the support block. A connecting shaft is movably connected to the outer wall of the arc-shaped shaft, and a fixing shaft is fixedly connected to the front of the connecting shaft, which facilitates the installation and connection of the test fixture body.

[0010] Preferably, the inner wall shape of the arc-shaped sleeve matches the outer wall shape of the arc-shaped shaft, and the arc-shaped sleeve is slidably connected to the outer wall of the arc-shaped shaft, so that the arc-shaped sleeve can move along the outer wall of the arc-shaped shaft.

[0011] Preferably, the spring is sleeved on the outer wall of the arc-shaped shaft, and the outer wall of the arc-shaped sleeve is fixedly connected with a protrusion, which facilitates the movement of the arc-shaped sleeve by pushing it through the protrusion.

[0012] Preferably, the bottom of the arc-shaped sleeve is in close contact with one end of the arc-shaped shaft, and the fixed shaft is fixedly connected to the outer wall of the test fixture body to provide stable support for the test fixture body.

[0013] Compared with the prior art, this utility model provides a GaN chip surge current protection test fixture, which has the following advantages:

[0014] 1. This GaN chip surge current protection test fixture, through a lifting mechanism, uses a motor-driven threaded rod to move a protrusion in a straight line, linking the fixing arm and the test fixture body to automatically immerse and remove the GaN chip in fluoride solution, completely avoiding the risks of electric shock and chemical exposure from manual operation. This mechanical lifting structure replaces traditional manual operation, ensuring that the chip test does not require contact with high-voltage components or liquid media, significantly improving the safety of the testing environment.

[0015] 2. This GaN chip surge current protection test fixture features a connection mechanism that allows for quick disassembly and assembly of the fixture body by pressing the arc-shaped sleeve compression spring, enabling millisecond-level assembly and disassembly. The second protrusion slides within the second fixing slot to adjust the fixture position, flexibly adapting to the clamping requirements of GaN chips of different sizes. This design balances assembly and disassembly efficiency with fixture versatility, avoiding the time wasted by frequently changing specialized tooling. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a front view of the structure of this utility model;

[0018] Figure 2 This is a rear view of the structure of this utility model;

[0019] Figure 3 This is a schematic diagram of the structure of the test fixture body;

[0020] Figure 4 for Figure 1 Enlarged structural diagram at point A in the middle.

[0021] In the diagram: 1. Support platform; 2. Transparent box; 3. Test fixture body; 4. Lifting mechanism; 41. Support arm; 42. Fixing groove one; 43. Motor; 44. Threaded rod; 45. Protrusion one; 46. Fixing arm; 47. Fixing groove two; 48. Protrusion two; 49. Support block; 5. Connecting mechanism; 51. Arc-shaped shaft; 52. Spring; 53. Arc-shaped sleeve; 54. Connecting shaft; 55. Fixing shaft. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0023] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0024] This utility model provides the following technical solution:

[0025] Example 1

[0026] Combination Figures 1 to 4 A GaN chip surge current protection test fixture includes a support platform 1, a lifting mechanism 4 on the top of the support platform 1, a connecting mechanism 5 on the front of the lifting mechanism 4, a test fixture body 3 on the front of the connecting mechanism 5, and a transparent box 2 on the top of the support platform 1. This fixture integrates chip testing, liquid immersion, and fixture adjustment, improving the continuity and safety of the testing process.

[0027] The lifting mechanism 4 includes a support arm 41, which is fixedly connected to the top of the support platform 1. A fixing groove 42 is fixedly connected to the inner side of the support arm 41. A motor 43 is fixedly connected to the top of the support platform 1. A threaded rod 44 is fixedly connected to the output end of the motor 43. A protrusion 45 is slidably connected to the inner wall of the fixing groove 42. A fixing arm 46 is fixedly connected to the front of the protrusion 45. A fixing groove 47 is fixedly connected to the front of the fixing arm 46. A protrusion 48 is slidably connected to the inner wall of the fixing groove 47. A support block 49 is fixedly connected to the front of the protrusion 48. The mechanical transmission structure of the motor 43 driving the threaded rod 44 enables automatic lifting and lowering of the test fixture, avoiding manual contact with high-pressure liquids. The sliding design of the protrusion 48 facilitates adaptation to chips of different sizes.

[0028] Furthermore, the bump 45 has a threaded hole inside, and the bump 45 is threaded to the outer wall of the threaded rod 44 through the threaded hole. The threaded transmission converts linear motion smoothly and reliably; the double-end support structure ensures no deviation during the lifting process and maintains the stability of chip testing.

[0029] Furthermore, the top of the threaded rod 44 is rotatably connected to the top of the inner wall of the fixed groove 42. The through-type support design enhances the rigidity of the threaded rod 44, prevents shaking during high-speed operation, and extends the service life of the mechanism.

[0030] Example 2

[0031] See Figures 1 to 4 Furthermore, based on Embodiment 1, the connecting mechanism 5 includes an arc-shaped shaft 51, which is fixedly connected to the inside of the support block 49. A spring 52 is fixedly connected to the top of the support block 49, and an arc-shaped sleeve 53 is fixedly connected to the end of the spring 52 away from the support block 49. A connecting shaft 54 ​​is movably connected to the outer wall of the arc-shaped shaft 51, and a fixed shaft 55 is fixedly connected to the front of the connecting shaft 54. The quick-release structure can be released by pressing the arc-shaped sleeve 53, simplifying the replacement process. The spring reset design ensures tight locking.

[0032] Furthermore, the inner wall shape of the arc sleeve 53 matches the outer wall shape of the arc shaft 51, and the arc sleeve 53 is slidably connected to the outer wall of the arc shaft 51, so that the arc sleeve 53 can move along the outer wall of the arc shaft 51.

[0033] Furthermore, the spring 52 is sleeved on the outer wall of the arc-shaped shaft 51, and the outer wall of the arc-shaped sleeve 53 is fixedly connected with a protrusion. The arc-shaped contact surface makes the sliding smoother and reduces the operating resistance. The protrusion on the outer wall provides a fulcrum for applying force, which facilitates disassembly and reassembly with one hand.

[0034] Furthermore, the bottom of the arc-shaped sleeve 53 is in contact with one end of the arc-shaped shaft 51, and the fixed shaft 55 is fixedly connected to the outer wall of the test fixture body 3 to provide stable support for the test fixture body 3.

[0035] In actual operation, when this device is used, the test fixture body 3 can be connected to the surge device, and then the test fixture body 3 can clamp the GaN chip. The motor 43 is started and the output end of the motor 43 can drive the threaded rod 44 to rotate. Since the threaded rod 44 and the first protrusion 45 are threadedly connected, and the first protrusion 45 can slide and limit its movement on the inner wall of the first fixed groove 42, the rotational motion of the threaded rod 44 is converted into the linear motion of the first protrusion 45. The first protrusion 45 can drive the second fixed groove 47 to move through the fixed arm 46, thereby allowing the test fixture body 3 to move. The GaN chip can be removed from the inside of the transparent box 2. Similarly, the GaN chip can be immersed in the inside of the transparent box 2 without manual operation, ensuring the stability of the GaN chip during the surge test. The second protrusion 48 can slide inside the second fixed groove 47, which can adjust the position of the test fixture body 3, and thus adjust the position of the test fixture body 3 according to the GaN chip of different sizes.

[0036] Pushing the protrusion on the outer wall of the arc sleeve 53 allows the arc sleeve 53 to compress the spring 52, and the arc sleeve 53 can slide along the outer wall of the arc shaft 51, thereby allowing the connecting shaft 54 ​​to be pulled out from the inside of the arc shaft 51, thus realizing the disassembly of the test fixture body 3. Similarly, the test fixture body 3 can also be installed, achieving good disassembly and assembly efficiency.

[0037] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

Claims

1. A GaN chip surge current protection test fixture, comprising a support platform (1), characterized in that: The support platform (1) is provided with a lifting mechanism (4) on the top, a connecting mechanism (5) is provided on the front of the lifting mechanism (4), a test fixture body (3) is provided on the front of the connecting mechanism (5), and a transparent box (2) is provided on the top of the support platform (1). The lifting mechanism (4) includes a support arm (41), which is fixedly connected to the top of the support platform (1). A fixing groove (42) is fixedly connected to the inner side of the support arm (41). A motor (43) is fixedly connected to the top of the support platform (1). A threaded rod (44) is fixedly connected to the output end of the motor (43). A protrusion (45) is slidably connected to the inner wall of the fixing groove (42). A fixing arm (46) is fixedly connected to the front of the protrusion (45). A fixing groove (47) is fixedly connected to the front of the fixing arm (46). A protrusion (48) is slidably connected to the inner wall of the fixing groove (47). A support block (49) is fixedly connected to the front of the protrusion (48).

2. The GaN chip surge current protection test fixture according to claim 1, characterized in that: The protrusion (45) has a threaded hole inside, and the protrusion (45) is threadedly connected to the outer wall of the threaded rod (44) through the threaded hole.

3. The GaN chip surge current protection test fixture according to claim 1, characterized in that: The top end of the threaded rod (44) is rotatably connected to the top of the inner wall of the first fixed groove (42), and the threaded rod (44) passes through the bottom of the first fixed groove (42) and rotates.

4. The GaN chip surge current protection test fixture according to claim 1, characterized in that: The connecting mechanism (5) includes an arc-shaped shaft (51), which is fixedly connected to the inside of the support block (49). A spring (52) is fixedly connected to the top of the support block (49). An arc-shaped sleeve (53) is fixedly connected to one end of the spring (52) away from the support block (49). A connecting shaft (54) is movably connected to the outer wall of the arc-shaped shaft (51). A fixed shaft (55) is fixedly connected to the front of the connecting shaft (54).

5. The GaN chip surge current protection test fixture according to claim 4, characterized in that: The inner wall shape of the arc sleeve (53) matches the outer wall shape of the arc shaft (51), and the arc sleeve (53) is slidably connected to the outer wall of the arc shaft (51).

6. The GaN chip surge current protection test fixture according to claim 4, characterized in that: The spring (52) is sleeved on the outer wall of the arc-shaped shaft (51), and the outer wall of the arc-shaped sleeve (53) is fixedly connected with a protrusion.

7. The GaN chip surge current protection test fixture according to claim 4, characterized in that: The bottom of the arc-shaped sleeve (53) is in contact with one end of the arc-shaped shaft (51), and the fixed shaft (55) is fixedly connected to the outer wall of the test fixture body (3).

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