Adjustable pitch chip testing fixture

Abstract

This utility model discloses an adjustable-spacing chip test fixture, belonging to the technical field of chip testing equipment. It includes a chip lateral adjustment mechanism, a chip longitudinal adjustment mechanism, and a chip positioning mechanism. The lateral adjustment mechanism includes a crossbeam with a sliding groove on its upper surface. A sliding block is slidably connected inside the sliding groove. A motor drives a threaded rod to move the sliding component along the groove. Similarly, the longitudinal adjustment mechanism allows for longitudinal position adjustment. Bidirectional adjustment can precisely change the test spacing, adapting to chips of different sizes without changing the fixture, significantly improving fixture versatility and increasing chip testing efficiency while reducing equipment investment. The positioning mechanism's hydraulic cylinder drives a rod to stably clamp the chip using a clamping plate. Protective pads on the inner wall of the clamping plate buffer the clamping force, preventing scratches or damage to the chip surface and ensuring stable chip position during testing, reducing testing errors caused by clamping issues.

Description

Technical Field

[0001] This utility model relates to the field of chip testing equipment technology, specifically to an adjustable-spacing chip testing fixture. Background Technology

[0002] During the chip manufacturing process, rigorous testing procedures are required to ensure their performance and quality. In the chip testing stage, test fixtures serve as key auxiliary equipment, used to fix the chip in place and establish an electrical connection between the test equipment and the chip.

[0003] Existing chip test fixtures have a fixed spacing, which can only accommodate chips of specific sizes and specifications. They have poor compatibility with chips of different sizes. With the continuous development of chip technology, the size and pin spacing of chips are becoming more diverse. Fixtures with fixed spacing are difficult to meet actual testing needs, which leads to the need to frequently change fixtures when testing chips of different sizes, increasing testing costs and time. Therefore, those skilled in the art have provided chip test fixtures with adjustable spacing to solve the problems mentioned in the background art. Utility Model Content

[0004] The purpose of this invention is to provide an adjustable-spacing chip test fixture to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] An adjustable-spacing chip testing fixture includes a chip lateral adjustment mechanism, a chip longitudinal adjustment mechanism, and a chip positioning mechanism. The chip lateral adjustment mechanism includes a crossbeam with a sliding groove on its upper surface. A sliding block is slidably connected inside the sliding groove. Two first bearings are embedded in the inner wall of the sliding groove, and the inner rings of the two first bearings are connected to a threaded rod. A first servo motor is mounted on the right side of the crossbeam, and the output end of the first servo motor is connected to the threaded rod via a coupling. The outer surface of the threaded rod is threadedly connected to the sliding block. Two support plates are connected to the bottom surface of the crossbeam.

[0007] As a further improvement of this utility model: the chip longitudinal adjustment mechanism includes a support beam, the bottom surface of which is connected to a sliding block.

[0008] As a further improvement of this utility model: a groove is provided on the upper surface of the support beam, and a slider is slidably connected inside the groove.

[0009] As a further improvement of this utility model: the inner wall of the slide groove is inlaid with two second bearings, the inner rings of the two second bearings are connected to a lead screw, and the outer surface of the lead screw is threadedly connected to the slider.

[0010] As a further improvement of this utility model: a second servo motor is installed on the back of the support beam, and the output end of the second servo motor is connected to the lead screw through a coupling.

[0011] As a further improvement of this utility model: the chip positioning mechanism includes a fixing frame, the bottom surface of which is connected to the slider.

[0012] As a further improvement of this utility model: two hydraulic cylinders are installed on the inner wall of the fixing frame, and the output ends of the two hydraulic cylinders are connected to hydraulic rods.

[0013] As a further improvement of this utility model: the output ends of both hydraulic rods are connected to chip test clamps, and the inner walls of both chip test clamps are connected to protective pads.

[0014] Compared with the prior art, the beneficial effects of this utility model are:

[0015] This adjustable-spacing chip test fixture uses a motor-driven threaded rod to move a sliding component along the groove. Similarly, the longitudinal adjustment mechanism allows for vertical position adjustment. Bidirectional adjustment precisely changes the test spacing, adapting to chips of different sizes without requiring fixture replacement. This significantly improves fixture versatility and increases chip testing efficiency while reducing equipment investment. The hydraulic cylinder driving rod of the positioning mechanism drives the clamping plate to stably hold the chip. Protective pads on the inner wall of the clamping plate buffer the clamping force, preventing scratches or damage to the chip surface and ensuring stable chip position during testing. This reduces testing errors caused by clamping issues and guarantees testing accuracy. Attached Figure Description

[0016] Figure 1 A three-dimensional structural diagram of an adjustable-spacing chip testing fixture;

[0017] Figure 2 A three-dimensional structural schematic diagram of a side view of an adjustable-spacing chip test fixture;

[0018] Figure 3 A top view of the three-dimensional structure of an adjustable-spacing chip test fixture;

[0019] Figure 4 A cross-sectional view of an adjustable-pitch chip test fixture;

[0020] Figure 5 For adjustable pitch chip test fixtures Figure 4 A magnified structural diagram of part A in the middle.

[0021] In the diagram: 1. Chip lateral adjustment mechanism; 101. Crossbeam; 102. Sliding groove; 103. Sliding block; 104. First bearing; 105. Threaded rod; 106. First servo motor; 2. Chip longitudinal adjustment mechanism; 201. Support beam; 202. Sliding groove; 203. Sliding block; 204. Second bearing; 205. Lead screw; 206. Second servo motor; 3. Chip positioning mechanism; 301. Fixing frame; 302. Hydraulic cylinder; 303. Hydraulic rod; 304. Chip test clamp; 305. Protective pad; 4. Support plate. Detailed Implementation

[0022] Please see Figures 1-5 In this embodiment of the invention, a chip lateral adjustment mechanism 1, a chip longitudinal adjustment mechanism 2, and a chip positioning mechanism 3 are included. The chip lateral adjustment mechanism 1 includes a crossbeam 101, a sliding groove 102 is formed on the upper surface of the crossbeam 101, a sliding block 103 is slidably connected inside the sliding groove 102, two first bearings 104 are embedded in the inner wall of the sliding groove 102, and the inner rings of the two first bearings 104 are connected to a threaded rod 105. A first servo motor 106 is installed on the right side of the crossbeam 101, and the output end of the first servo motor 106 is connected to the threaded rod 105 through a coupling. The outer surface of the threaded rod 105 is threadedly connected to the sliding block 103. Two support plates 4 are connected to the bottom surface of the crossbeam 101. The adjustable spacing chip test fixture enables the equipment to achieve automated adjustment, reduces manual operation steps and errors, and shortens the test preparation time. It eliminates the need to equip different chips with separate fixtures, reduces material waste and equipment maintenance costs, and improves the overall chip testing efficiency.

[0023] The chip longitudinal adjustment mechanism 2 includes a support beam 201. The bottom surface of the support beam 201 is connected to the sliding block 103. A groove 202 is provided on the upper surface of the support beam 201. A slider 203 is slidably connected inside the groove 202. Two second bearings 204 are embedded in the inner wall of the groove 202. The inner rings of the two second bearings 204 are connected to a lead screw 205. The outer surface of the lead screw 205 is threadedly connected to the slider 203. A second servo motor 206 is installed on the back of the support beam 201. The output end of the second servo motor 206 is connected to the lead screw 205 through a coupling, which allows people to move the chip, thereby improving the chip detection effect of the equipment.

[0024] The chip positioning mechanism 3 includes a fixed frame 301, the bottom surface of which is connected to the slider 203. Two hydraulic cylinders 302 are installed on the inner wall of the fixed frame 301. The output ends of the two hydraulic cylinders 302 are connected to hydraulic rods 303. The output ends of the two hydraulic rods 303 are connected to chip test clamps 304. The inner walls of the two chip test clamps 304 are connected to protective pads 305. This not only enables the equipment to position chips of different sizes, thus greatly increasing the applicability of the equipment, but also protects the chips.

[0025] The working principle of this utility model is as follows: First, people can place the chip on the top of the fixing frame 301, and then start the two hydraulic cylinders 302. The hydraulic cylinders 302 drive the hydraulic rods 303 to extend, which drives the chip test clamps 304 to move towards the chip until the two chip test clamps 304 clamp the chip; the protective pads 305 on the inner wall of the clamps prevent damage to the chip surface.

[0026] Then the first servo motor 106 can be started, and its output end drives the threaded rod 105 to rotate in the inner ring of the two first bearings 104 through the coupling. Since the threaded rod 105 is threadedly connected to the sliding block 103 and the sliding block 103 is limited to the sliding groove 102, when the threaded rod 105 rotates, it will drive the sliding block 103 to move laterally along the sliding groove 102, thereby driving the chip longitudinal adjustment mechanism 2 connected to it to adjust laterally in sync, so as to realize the lateral adaptation of the test position.

[0027] Next, the second servo motor 206 is started. The output end of the second servo motor 206 drives the lead screw 205 to rotate in the inner ring of the two second bearings 204 through the coupling. The lead screw 205 is threadedly connected to the slider 203, and the slider 203 is limited to the slide groove 202. The rotation of the lead screw 205 drives the slider 203 to move longitudinally along the slide groove 202, which drives the chip positioning mechanism 3 to adjust longitudinally in sync, thus completing the bidirectional precise positioning of the test position. Finally, people can use auxiliary equipment to test the chip.

[0028] The above description is merely a preferred embodiment of this utility model, but the scope of protection of this utility model is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the technical scope disclosed in this utility model, based on the technical solution and inventive concept of this utility model, should be included within the scope of protection of this utility model. It is obvious to those skilled in the art that this utility model is not limited to the details of the above exemplary embodiments, and that it can be implemented in other specific forms without departing from the spirit or basic characteristics of this utility model. Therefore, the embodiments should be considered exemplary and non-limiting in all respects. The scope of this utility model is defined by the appended claims rather than the foregoing description, and thus all variations falling within the meaning and scope of equivalent elements of the claims are intended to be included within this utility model. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. An adjustable-pitch chip test fixture, characterized in that, The device includes a chip lateral adjustment mechanism (1), a chip longitudinal adjustment mechanism (2), and a chip positioning mechanism (3). The chip lateral adjustment mechanism (1) includes a crossbeam (101). A sliding groove (102) is provided on the upper surface of the crossbeam (101). A sliding block (103) is slidably connected inside the sliding groove (102). Two first bearings (104) are embedded in the inner wall of the sliding groove (102). The inner rings of the two first bearings (104) are connected to a threaded rod (105). A first servo motor (106) is installed on the right side of the crossbeam (101). The output end of the first servo motor (106) is connected to the threaded rod (105) through a coupling. The outer surface of the threaded rod (105) is threadedly connected to the sliding block (103). Two support plates (4) are connected to the bottom surface of the crossbeam (101).

2. The adjustable-pitch chip test fixture according to claim 1, characterized in that, The chip longitudinal adjustment mechanism (2) includes a support beam (201), the bottom surface of which is connected to a sliding block (103).

3. The adjustable-pitch chip test fixture according to claim 2, characterized in that, The upper surface of the support beam (201) is provided with a groove (202), and a slider (203) is slidably connected inside the groove (202).

4. The adjustable-pitch chip test fixture according to claim 3, characterized in that, The inner wall of the slide (202) is inlaid with two second bearings (204), and the inner rings of the two second bearings (204) are connected to a lead screw (205). The outer surface of the lead screw (205) is threadedly connected to the slider (203).

5. The adjustable-pitch chip test fixture according to claim 2, characterized in that, A second servo motor (206) is mounted on the back of the support beam (201), and the output end of the second servo motor (206) is connected to the lead screw (205) via a coupling.

6. The adjustable-pitch chip test fixture according to claim 1, characterized in that, The chip positioning mechanism (3) includes a fixing frame (301), the bottom surface of which is connected to the slider (203).

7. The adjustable-pitch chip test fixture according to claim 6, characterized in that, Two hydraulic cylinders (302) are installed on the inner wall of the fixed frame (301), and the output ends of the two hydraulic cylinders (302) are connected to hydraulic rods (303).

8. The adjustable-pitch chip test fixture according to claim 7, characterized in that, The output ends of the two hydraulic rods (303) are connected to chip test clamps (304), and the inner walls of the two chip test clamps (304) are connected to protective pads (305).

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