A test tool of a mobile high-voltage pulse source

Abstract

The utility model discloses a movable high -voltage pulse source's test frock, including oscillograph and mobile frame, install high -voltage probe and current probe on the mobile frame, be equipped with the wire on high -voltage probe and current probe, and the other end of wire is connected with oscillograph, is used for the test of high -voltage pulse source, fixed component, the fixed component includes two groups of installation slot that open on the mobile frame, and two groups of installation slot are equipped with arc friction plate, are used for the dismounting of high -voltage probe, current probe, limiting structure, the limiting structure includes the rotation cover plate that rotates in the mobile frame, is used for the limiting arc friction plate. The utility model discloses through mobile frame and can conveniently high -voltage pulse source's test frock moves, need not staff to hold test, through work efficiency, fixed component is convenient for the dismounting of mobile frame and high -voltage probe, current probe, and limiting structure improves the stability of high -voltage probe, current probe when testing.

Description

Technical Field

[0001] This utility model relates to the field of high voltage pulse source testing technology, and in particular to a test fixture for a portable high voltage pulse source. Background Technology

[0002] High-voltage pulse source testing requires a high-voltage non-inductive load, a high-bandwidth differential voltage probe, and a Rogowski coil, with the pulse waveform precisely captured using an oscilloscope. Key measurement parameters include pulse amplitude, leading edge, width, and drop-off, to evaluate its output characteristics, stability, and load-carrying capacity.

[0003] The existing high-voltage pulse source test fixtures have the following shortcomings when in use: the high-voltage probe and current probe of the test fixture are not easy to disassemble and fix, which means that the staff has to hold the high-voltage probe and current probe by hand during each test. Holding the high-voltage probe and current probe by hand is troublesome and will affect the accuracy of the test results, resulting in poor performance.

[0004] Therefore, those skilled in the art have proposed a test fixture for a portable high-voltage pulse source to solve the problems mentioned above. Utility Model Content

[0005] The purpose of this section is to outline some aspects of embodiments of the present invention and to briefly describe some preferred embodiments. Simplifications or omissions may be made in this section, as well as in the abstract and title of this application, to avoid obscuring the purpose of these documents; however, such simplifications or omissions should not be construed as limiting the scope of the present invention.

[0006] In view of the above-mentioned test fixture for a portable high-voltage pulse source, this utility model is proposed.

[0007] Therefore, the purpose of this utility model is to provide a test fixture for a portable high-voltage pulse source, which solves the problem of cumbersome handheld testing operation of the test fixture.

[0008] To solve the above-mentioned technical problems, this utility model provides the following technical solution: a test fixture for a portable high-voltage pulse source, comprising:

[0009] An oscilloscope and a movable stand, on which a high-voltage probe and a current probe are mounted, both of which have wires connected to the oscilloscope at the other end for testing high-voltage pulse sources.

[0010] The fixing component includes two sets of mounting slots opened on the movable frame, and each set of mounting slots is provided with an arc-shaped friction plate for the assembly and disassembly of the high voltage probe and the current probe.

[0011] A limiting structure, the limiting structure including a rotating cover plate rotatably mounted on a movable frame, for limiting the arc-shaped friction plate.

[0012] As a preferred embodiment of the test fixture for the movable high-voltage pulse source of this utility model, the fixing component further includes an inner groove opened in the movable frame, an elastic element is fixedly connected in the inner groove, and a movable plate is fixedly connected on the elastic element.

[0013] As a preferred embodiment of the test fixture for the movable high-voltage pulse source of this utility model, the movable frame is provided with two sets of receiving slots with connected mounting slots, and each of the arc-shaped friction plates is fixedly connected with a connecting rod, with the end of the connecting rod away from the mounting slot being fixedly connected to the movable plate.

[0014] As a preferred embodiment of the test fixture for the movable high-voltage pulse source of this utility model, the limiting structure further includes a telescopic rod fixed to the movable frame, and the telescopic rod is rotatably connected to the rotating cover plate through a bearing.

[0015] As a preferred embodiment of the test fixture for the movable high-voltage pulse source of this utility model, the outer wall of the telescopic rod is fitted with a spring, and the spring is located between the movable frame and the rotating cover plate.

[0016] As a preferred embodiment of the test fixture for the movable high-voltage pulse source described in this utility model, two sets of guide rods are fixedly connected to the movable frame, and both sets of guide rods penetrate the movable plate.

[0017] As a preferred embodiment of the test fixture for the movable high-voltage pulse source described in this utility model, a handle is fixedly connected to the rotating cover plate for rotating the cover plate.

[0018] As a preferred embodiment of the test fixture for the movable high-voltage pulse source of this utility model, a pull ring is fixedly connected to the movable plate, and an anti-slip pad is fixedly connected to the bottom of the movable frame.

[0019] The beneficial effects of this utility model are as follows: This utility model allows for convenient movement of the testing fixture for the high-voltage pulse source via a movable frame. Both the high-voltage probe and the current probe are mounted on the movable frame, eliminating the need for handheld testing and improving work efficiency. The elasticity of the elastic element on the fixed component allows the arc-shaped friction plate on the connecting rod to move, facilitating the assembly and disassembly of the movable frame with the high-voltage probe and the current probe. Through the rotation of the rotating cover plate on the limiting structure and the elasticity of the spring, the rotating cover plate can always press the movable plate, making the arc-shaped friction plate more tightly contact the high-voltage probe and the current probe, thus improving the stability of the high-voltage probe and the current probe during testing. Attached Figure Description

[0020] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Wherein:

[0021] Figure 1 This is a schematic diagram of the overall structure of a test fixture for a portable high-voltage pulse source according to this utility model.

[0022] Figure 2 This is a schematic diagram of the movable frame structure of a test fixture for a movable high-voltage pulse source according to this utility model.

[0023] Figure 3 This invention relates to a test fixture for a portable high-voltage pulse source. Figure 2 Enlarged structural diagram at point A in the middle.

[0024] Figure 4 This is a cross-sectional view of the side structure of the movable frame of the test fixture for a movable high-voltage pulse source according to this utility model.

[0025] Figure descriptions: 100, Oscilloscope; 101, Movable frame; 102, Anti-slip base; 103, High voltage probe; 104, Current probe; 105, Wire; 200, Fixing assembly; 201, Mounting slot; 202, Guide rod; 203, Movable plate; 204, Connecting rod; 205, Pull ring; 206, Inner groove; 207, Elastic element; 208, Receiving groove; 209, Arc-shaped friction plate; 300, Limiting structure; 301, Telescopic rod; 302, Spring; 303, Rotating cover plate; 304, Handle. Detailed Implementation

[0026] To make the above-mentioned objectives, features and advantages of this utility model more apparent and understandable, the specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings.

[0027] Many specific details are set forth in the following description in order to provide a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Those skilled in the art can make similar extensions without departing from the spirit of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0028] Secondly, the term "an embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in different places in this specification does not necessarily refer to the same embodiment, nor is it a single or selective embodiment that excludes other embodiments.

[0029] Secondly, this utility model is described in detail with reference to the schematic diagrams. When describing the embodiments of this utility model, for ease of explanation, the cross-sectional views illustrating the device structure may be partially enlarged, not adhering to the usual scale. Furthermore, the schematic diagrams are merely examples and should not limit the scope of protection of this utility model. In addition, actual manufacturing should include the three-dimensional spatial dimensions of length, width, and depth.

[0030] Example 1

[0031] Reference Figures 1 to 3 This is the first embodiment of the present invention, which provides a test fixture for a portable high-voltage pulse source, enabling testing without manual handheld operation, including:

[0032] The oscilloscope 100 and the movable stand 101 are equipped with a high voltage probe 103 and a current probe 104. Both the high voltage probe 103 and the current probe 104 are provided with wires 105, and the other end of the wires 105 is connected to the oscilloscope 100 for testing high voltage pulse sources.

[0033] It should be noted that the oscilloscope 100 is used to receive the results of testing the high voltage pulse source. Using the high voltage probe 103 and the current probe 104 to test the high voltage pulse source is a commonly used technical method in existing testing. The principle of the test is: based on the principle of voltage division and current-to-voltage conversion, the high voltage and high current signal is linearly and without distortion converted into a low voltage and low current signal according to a known ratio, so that the oscilloscope can safely measure and analyze it.

[0034] The fixing component 200 includes two sets of mounting slots 201 opened on the movable frame 101. Each set of mounting slots 201 is provided with an arc-shaped friction plate 209 for the installation and removal of the high voltage probe 103 and the current probe 104.

[0035] The limiting structure 300 includes a rotating cover plate 303 rotatably mounted on the movable frame 101, which is used to limit the arc-shaped friction plate 209.

[0036] In use, the high-voltage probe 103 and the current probe 104 are respectively installed in the mounting slots 201 on the movable frame 101. The movable frame 101 is easy to move, making it convenient to adjust the position of the high-voltage probe 103 and the current probe 104 on the testing fixture. Then, the high-voltage probe 103 and the current probe 104 are connected to the corresponding interfaces on the oscilloscope 100 through the wires 105. The operator does not need to hold the test, which improves the test effect. The arc-shaped friction plate 209 of the fixing component 200 can make close contact with the high-voltage probe 103 and the current probe 104, which plays a fixing role. The limiting structure 300 can reinforce the position of the arc-shaped friction plate 209, which improves the stability of the high-voltage probe 103 and the current probe 104 during the test.

[0037] Example 2

[0038] Reference Figures 1 to 4 This is the second embodiment of the present invention. Unlike the previous embodiment, the fixing component 200 also includes an inner groove 206 formed in the movable frame 101. An elastic element 207 is fixedly connected in the inner groove 206, and a movable plate 203 is fixedly connected to the elastic element 207. The elastic element 207 is composed of a telescopic rod and a spring sleeved on its outer wall. The elastic element 207 can keep the movable plate 203 moving towards one end of the mounting groove 201, so that the arc-shaped friction plate 209 is in close contact with the high voltage probe 103 and the current probe 104, thereby improving the stability of the installation of the high voltage probe 103 and the current probe 104.

[0039] The movable frame 101 has two sets of receiving slots 208 that connect to the mounting slots 201. Each arc-shaped friction plate 209 is fixedly connected to a connecting rod 204, and the end of the connecting rod 204 away from the mounting slot 201 is fixedly connected to the movable plate 203. When disassembling, the movable plate 203 is pulled up, and the connecting rod 204 drives the arc-shaped friction plate 209 to move up and be stored in the receiving slot 208. After the position of the high voltage probe 103 and the current probe 104 is no longer restricted, they can be quickly taken out from the mounting slot 201, realizing the rapid disassembly and assembly of the high voltage probe 103 and the current probe 104.

[0040] The limiting structure 300 also includes a telescopic rod 301 fixed to the movable frame 101, and the telescopic rod 301 is rotatably connected to the rotating cover plate 303 through a bearing.

[0041] The telescopic rod 301 has a spring 302 fitted on its outer wall. The spring 302 is located between the movable frame 101 and the rotating cover plate 303. The elasticity of the telescopic rod 301 and the spring 302 ensures that the rotating cover plate 303 always presses against the movable plate 203, which improves the tightness of the contact between the arc-shaped friction plate 209 and the high-voltage probe 103 and the current probe 104, and further improves the stability of the installation of the high-voltage probe 103 and the current probe 104. When disassembling, the rotating cover plate 303 rotates so that it is not in contact with the movable plate 203. Once the movable plate 203 is unrestricted, it can be pulled up.

[0042] Two sets of guide rods 202 are fixedly connected to the movable frame 101, and both sets of guide rods 202 penetrate the movable plate 203; the movement of the two sets of guide rods 202 and the movable plate 203 plays a guiding role.

[0043] The rotating cover plate 303 is fixedly connected to a handle 304 for rotating the cover plate 303; the handle 304 facilitates the rotation of the rotating cover plate 303.

[0044] Among them, a pull ring 205 is fixedly connected to the movable plate 203, and an anti-slip pad 102 is fixedly connected to the bottom of the movable frame 101; the pull ring 205 facilitates the upward pulling of the movable plate 203, and the anti-slip pad 102 increases the friction between the movable frame 101 and the workbench surface, thereby improving the stability of the testing fixture during testing.

[0045] In use, the pull ring 205 on the hand-held fixing component 200 moves the moving plate 203 upward. At this time, the elastic element 207 is in a stretched state, and the arc-shaped friction plate 209 is housed in the receiving groove 208. Then, the high-voltage probe 103 and the current probe 104 are installed in the two sets of mounting grooves 201 respectively. After releasing the pull ring 205, the stretched elastic element 207 automatically resets, causing the arc-shaped friction plate 209 to move downward and fit tightly against the high-voltage probe 103 and the current probe 104. Then, the handle 304 of the limiting structure 300 is held to rotate the rotating cover plate 303, so that it fits against the surface of the moving plate 203. The elasticity of the telescopic rod 301 and the spring 302 ensures that the rotating cover plate 303 always presses against the moving plate 203, which improves the stability of the installation of the high-voltage probe 103 and the current probe 104.

[0046] The movable frame 101 facilitates the adjustment of the position of the high voltage probe 103 and current probe 104 on the test fixture. Then, the high voltage probe 103 and current probe 104 are connected to the corresponding interface on the oscilloscope 100 through the wire 105. This eliminates the need for staff to hold the test by hand, thus improving the test results.

[0047] It should be understood that numerous specific implementation decisions can be made during the development of any practical implementation, such as in any engineering or design project. Such development efforts may be complex and time-consuming, but for those skilled in the art who benefit from this disclosure, the development effort will be a routine work of design, manufacturing, and production without requiring much experimentation.

[0048] It should be noted that the above embodiments are only used to illustrate the technical solution of this utility model and are not intended to limit it. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solution of this utility model without departing from the spirit and scope of the technical solution of this utility model, and all such modifications or substitutions should be covered within the scope of the claims of this utility model.

Claims

1. A test fixture for a portable high-voltage pulse source, characterized in that, include: An oscilloscope (100) and a movable stand (101) are provided. A high-voltage probe (103) and a current probe (104) are mounted on the movable stand (101). Both the high-voltage probe (103) and the current probe (104) are provided with wires (105), and the other end of the wires (105) is connected to the oscilloscope (100) for testing high-voltage pulse sources. The fixing component (200) includes two sets of mounting slots (201) opened on the movable frame (101), and each set of mounting slots (201) is provided with an arc-shaped friction plate (209) for the assembly and disassembly of the high voltage probe (103) and the current probe (104). The limiting structure (300) includes a rotating cover plate (303) rotatably mounted on the movable frame (101) for limiting the arc-shaped friction plate (209).

2. The test fixture for the portable high-voltage pulse source according to claim 1, characterized in that: The fixing component (200) further includes an inner groove (206) formed in the movable frame (101), an elastic element (207) is fixedly connected in the inner groove (206), and a movable plate (203) is fixedly connected on the elastic element (207).

3. The test fixture for the portable high-voltage pulse source according to claim 2, characterized in that: The movable frame (101) has two sets of receiving slots (208) for connecting mounting slots (201). Each of the arc-shaped friction plates (209) is fixedly connected to a connecting rod (204), and the end of the connecting rod (204) away from the mounting slot (201) is fixedly connected to the movable plate (203).

4. The test fixture for the portable high-voltage pulse source according to claim 1, characterized in that: The limiting structure (300) also includes a telescopic rod (301) fixed to the movable frame (101), and the telescopic rod (301) is rotatably connected to the rotating cover plate (303) via a bearing.

5. The test fixture for the portable high-voltage pulse source according to claim 4, characterized in that: The outer wall of the telescopic rod (301) is fitted with a spring (302), which is located between the movable frame (101) and the rotating cover plate (303).

6. The test fixture for the portable high-voltage pulse source according to claim 2, characterized in that: Two sets of guide rods (202) are fixedly connected to the movable frame (101), and both sets of guide rods (202) penetrate the movable plate (203).

7. The test fixture for the portable high-voltage pulse source according to claim 1, characterized in that: A handle (304) is fixedly connected to the rotating cover plate (303) for rotating the cover plate (303).

8. The test fixture for the portable high-voltage pulse source according to claim 2, characterized in that: A pull ring (205) is fixedly connected to the movable plate (203), and an anti-slip pad (102) is fixedly connected to the bottom of the movable frame (101).

Images