Automated test apparatus

CN224788854UActive Publication Date: 2026-09-22ZHEJIANG LINGAI FUTURE TECHNOLOGY CO LTD +1
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Patent Information

Application Number
CN202522025640.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-09-19
Publication Date
2026-09-22
Estimated Expiration
2035-09-19

AI Technical Summary

Technical Problem

[0003]本申请提供一种自动化测试装置,其解决了相关技术在对汽车整机的多种功能进行测试时存在局限,难以满足整机功能的测试需求的技术问题,提出了一种能适用于多种信号并集合有多种通讯总线接口的自动化测试装置,可满足汽车整机的多功能测试需求,并显著降低测试复杂度与成本,减少不同功能整机测试时的方案调整工作量,同时提升测试效率与准确性

Benefits of technology

[0009]本申请实施例提出的自动化测试装置,通过设置开关模块的不同开关通道,能分别为第一控制模块和测量模块提供与待测设备的连接路径,实现不同模块对待测设备不同待测信号的分别测试。通过第一控制模块驱动第一开关通道和第二开关通道的连通状态,使得自动化测试装置能针对待测设备的不同功能测试需求切换至合适的开关通道以传输相应的待测信号,从而提高了测试过程的针对性和灵活性,减少了频繁更换外接电路或调整线路带来的时间成本与操作复杂性,进而提升了整体测试效率,同时保障测试的准确性,能够适配不同型号、不同功能需求的待测设备,增强了自动化测试装置的通用性和实用性。

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Abstract

The application relates to the technical field of automobile testing, and discloses an automatic testing device, wherein the automatic testing device comprises a switching module, a first control module and a measuring module; the switching module comprises a first switching channel and a second switching channel; the first control module is used for driving the communication state of the first switching channel and the second switching channel; the first control module is connected with a device under test through the first switching channel, so as to test a first signal under test of the device under test; and the measuring module is connected with the device under test through the second switching channel, so as to measure a second signal under test of the device under test. The automatic testing device can meet the multifunctional testing requirements of an automobile complete machine, significantly reduce the testing complexity and cost, reduce the scheme adjustment workload during testing of different functional complete machines, and improve the testing efficiency and accuracy.
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Description

Technical Field

[0001] This application relates to the field of automotive testing technology, and more particularly to an automated testing device. Background Technology

[0002] In the development and production of automotive electronics, Functional Circuit Testing (FCT) is an essential step, aiming to verify whether the electronic functions of the entire vehicle meet design requirements. With the increasing intelligence and digitalization of new energy intelligent vehicles, product functions are becoming more numerous and diverse. Therefore, when testing different products and functions, the test schemes and circuits in related technologies need significant adjustments. This presents limitations when testing multiple functions of the entire vehicle, making it difficult to meet the testing requirements of the entire system. Utility Model Content

[0003] This application provides an automated testing device that solves the technical problem that related technologies have limitations in testing multiple functions of a complete vehicle and are unable to meet the testing requirements of the complete vehicle's functions. It proposes an automated testing device that can be applied to multiple signals and integrates multiple communication bus interfaces, which can meet the multi-functional testing requirements of a complete vehicle, significantly reduce testing complexity and cost, reduce the workload of scheme adjustment when testing different functions of the complete vehicle, and improve testing efficiency and accuracy.

[0004] To achieve the above objectives, the main technical solutions adopted in this application include:

[0005] In a first aspect, embodiments of this application provide an automated testing apparatus, the automated testing apparatus comprising:

[0006] The switching module includes a first switching channel and a second switching channel;

[0007] A first control module is used to drive the connection state of the first switch channel and the second switch channel, and the first control module is connected to the device under test through the first switch channel to test the first test signal of the device under test.

[0008] The measurement module is connected to the device under test (DUT) via the second switch channel to measure the second test signal of the DUT.

[0009] The automated testing device proposed in this application provides connection paths between the first control module and the measurement module and the device under test (DUT) by setting different switching channels of the switching module, enabling different modules to test different DUT signals separately. By driving the connection state of the first and second switching channels through the first control module, the automated testing device can switch to the appropriate switching channel to transmit the corresponding DUT signals according to the different functional testing requirements of the DUT. This improves the targeting and flexibility of the testing process, reduces the time cost and operational complexity caused by frequent replacement of external circuits or adjustment of wiring, thereby improving overall testing efficiency while ensuring testing accuracy. It can adapt to different models and functional requirements of DUTs, enhancing the versatility and practicality of the automated testing device.

[0010] Optionally, in some embodiments of this application, the switching module includes a first relay unit, which corresponds to the first switching channel;

[0011] The control terminal and normally open terminal of the first relay unit are respectively connected to the first control module, and the common terminal of the first relay unit is connected to the first test port of the device under test. The first test port is adapted to output the first test signal, which includes a CAN signal and a LIN signal.

[0012] By establishing a test connection between the first control module and the first port under test of the device under test through the first relay unit, the first signal under test, including CAN and LIN signals, can be accurately tested, realizing the testing of communication functions such as CAN and LIN communication. This better meets the testing needs of automotive electronic devices for CAN and LIN communication functions. Furthermore, the first control module can flexibly control the on / off state of the designated first relay unit, and can accurately realize the functional testing of specific communication ports according to testing requirements, enhancing the adaptability and efficiency of the automated testing device to different testing needs.

[0013] Optionally, in some embodiments of this application, the first port to be tested includes at least one of a CAN port and a LIN port.

[0014] Optionally, in some embodiments of this application, the first control module includes a microcontroller, a CAN signal processing unit, and a LIN signal processing unit;

[0015] The microcontroller has a first terminal adapted to connect to the control terminal of the first relay unit, and a second terminal connected to the CAN signal processing unit and the LIN signal processing unit, respectively. The CAN signal processing unit and the LIN signal processing unit are respectively connected to the normally open terminal of the first relay unit.

[0016] The first control module uses a microcontroller to control the on / off state of each relay unit in the switching module, and combines it with a CAN signal processing unit and a LIN signal processing unit to transmit and receive corresponding CAN and LIN signals, thereby enabling communication function testing of the device under test and meeting the high-efficiency testing requirements of automotive electronics and other equipment for CAN and LIN communication signals.

[0017] Optionally, in some embodiments of this application, the switching module includes a second relay unit, which corresponds to the second switching channel;

[0018] The control terminal of the second relay unit is connected to the first control module, the normally open terminal of the second relay unit is connected to the measurement module, the common terminal of the second relay unit is connected to the second test port of the device under test, and the second test port is adapted to output the second test signal.

[0019] By establishing a test connection between the measurement module and the second test port of the device under test through the second relay unit, the signal characteristics such as voltage, frequency, and duty cycle of the second test signal containing power signals can be accurately tested, thereby realizing the power function test of the device under test. Furthermore, the first control module can flexibly control the on / off state of the designated second relay unit, and can accurately realize the functional test of a specific power port according to the test requirements, thus enhancing the adaptability and efficiency of the automated test device to different test requirements.

[0020] Optionally, in some embodiments of this application, the second port to be tested includes a power port.

[0021] Optionally, in some embodiments of this application, the device under test further includes a third test port, which is connected to the first control module, wherein the third test port is adapted to output a third test signal.

[0022] The third test port is directly connected to the first control module without going through the switching module. This avoids the problem of contact heating caused by the relay unit being on for a long time, which affects the stability of signal transmission and increases energy consumption. It also prevents contact wear caused by frequent switching or long-term conduction, thereby improving the stability of signal transmission and the reliability of the path, and meeting the stability and reliability requirements of the third test signal that needs to be sampled and detected for a long time.

[0023] Optionally, in some embodiments of this application, the third port to be tested includes at least one of a digital output port, an analog output port, a PWM port, and a network port.

[0024] Optionally, in some embodiments of this application, the automated testing device further includes a second control module connected to the first control module to send test commands to the device under test through the first control module.

[0025] The second control module enables overall control and data analysis of the testing process of the device under test, while the first control module forwards test commands to the device under test, enabling it to perform corresponding communication and network function tests in response to the test commands, thus improving the applicability of the automated testing device.

[0026] Optionally, in some embodiments of this application, the automated testing device further includes a power supply, and the switching module further includes a third switching channel. The power supply is connected to the device under test through the third switching channel to supply power to the device under test.

[0027] The switching module includes a third relay unit, which corresponds to the third switching channel. The control terminal of the third relay unit is connected to the third output terminal of the first control module, the common terminal of the third relay unit is connected to the power supply, and the normally open terminal of the third relay unit is connected to the power port of the device under test.

[0028] The third switch channel enables a controllable connection between the power supply and the device under test (DUT). The first control module controls the on / off state of the third relay unit corresponding to the third switch channel, allowing for flexible power supply control of the DUT. This accurately meets the automation process requirements of power-on, testing, and power-off during the testing process, effectively improving testing efficiency and accuracy. It also enhances the adaptability of the automated testing device to different testing processes. Attached Figure Description

[0029] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0030] Figure 1 This is a schematic diagram of the structure of an automated testing device proposed in an embodiment of this application;

[0031] Figure 2 This is a schematic diagram showing the connection between the switch module and other modules according to an embodiment of this application;

[0032] Figure 3 This is a schematic diagram showing the connection between the switch module and other modules according to another embodiment of this application;

[0033] Figure 4 This is a schematic diagram showing the connection between the switch module and other modules according to another embodiment of this application;

[0034] Figure 5 This is a schematic diagram showing the connection between the first control module and other modules according to an embodiment of this application;

[0035] Figure 6 This is a schematic diagram of the structure of the first control module proposed in an embodiment of this application. Detailed Implementation

[0036] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0037] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used in the description of this application is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms "comprising" and "having," and any variations thereof, in the description, claims, and accompanying drawings of this application are intended to cover non-exclusive inclusion. The terms "first," "second," etc., in the description, claims, or accompanying drawings of this application are used to distinguish different objects, not to describe a specific order or hierarchy.

[0038] In this application, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described in this application can be combined with other embodiments.

[0039] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "connected" and "linked" should be interpreted broadly, for example, they can refer to a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0040] Functional testing is an essential step in the development and production of automotive electronics, aiming to verify whether the electronic functions of the entire vehicle meet design requirements. With the increasing intelligence and digitalization of new energy intelligent vehicles, product functions are becoming more numerous and varied. Therefore, the test schemes and circuits in related technologies need significant adjustments when testing different products and functions. For example, testing the body domain controller requires testing high and low side signals to ensure the normal operation of the vehicle's lighting system, measuring PWM output to ensure the normal operation of the windshield wiper system, and measuring CAN communication, etc. Testing the cockpit domain controller requires testing the high-side level output, the vehicle's Ethernet port, etc.

[0041] However, current technologies typically rely on industrial programmable logic controllers (PLCs) for circuit testing. While PLCs are widely used in industrial automation, their limitations in high-voltage acquisition capabilities and communication bus interfaces mean that standard voltage acquisition capabilities of PLCs are usually limited to 10V, which cannot fully meet the needs of automotive electronics testing. Furthermore, PLCs can only perform limited testing functions and cannot directly test various functions of automotive systems, such as communication. In addition, since different complete products have different functions, different test schemes need to be configured for each test of different complete products, which increases the complexity of testing and reduces testing efficiency.

[0042] Therefore, the relevant technologies have limitations when testing multiple functions of a complete vehicle, and cannot meet the testing requirements of the complete vehicle's functions.

[0043] This application provides an automated testing device 10, such as... Figure 1 As shown, the automated testing device 10 includes a switch module 11, a first control module 12, and a measurement module 13. The switch module 11 includes a first switch channel and a second switch channel. The first control module 12 is used to drive the connection state of the first switch channel and the second switch channel. The first control module 12 is connected to the device under test 20 through the first switch channel to test the first test signal of the device under test 20. The measurement module 13 is connected to the device under test 20 through the second switch channel to measure the second test signal of the device under test 20.

[0044] Specifically, the switch module 11 includes a multi-channel relay unit, with different relay units forming a first switch channel and a second switch channel. The first control module 12 controls the connection between the first and second switch channels by driving the different relay units. Furthermore, for each port of the device under test 20, some ports are connected to the first control module 12 via the first switch channel, and some ports are connected to the measurement module 13 via the second switch channel, to test the signals output from different ports.

[0045] In some embodiments of this application, the first control module 12 may include a lower-level controller, and the measurement module 13 may include test instruments such as an oscilloscope and a digital multimeter. When testing the device under test (DUT) 20, the first control module 12 forms a signal interaction path with the DUT 20 through a first switching channel, thereby enabling the testing of the first test signal output by the DUT 20 in this path, which can be used to test the communication function of the DUT 20. The measurement module 13 forms a signal interaction path with the DUT 20 through a second switching channel, thereby enabling the testing of the voltage and frequency of the second test signal output by the DUT 20 in this path, which can be used to test the power supply function of the DUT 20. Through the independent control of the two switching channels, the testing and measurement functions of different types of test signals of the DUT 20 are realized respectively.

[0046] The automated testing device 10 proposed in this application provides connection paths between the first control module 12 and the measurement module 13 and the device under test 20 by setting different switching channels of the switching module 11, enabling different modules to test different signals of the device under test 20 separately. By driving the connection state of the first and second switching channels through the first control module, the automated testing device 10 can switch to the appropriate switching channel to transmit the corresponding test signals according to the different functional test requirements of the device under test 20. This improves the pertinence and flexibility of the testing process, reduces the time cost and operational complexity caused by frequent replacement of external circuits or adjustment of lines, thereby improving the overall testing efficiency and ensuring the accuracy of the test. It can adapt to different models and different functional requirements of the device under test 20, enhancing the versatility and practicality of the automated testing device 10.

[0047] In some embodiments of this application, the switch module 11 includes a first relay unit 111, which corresponds to a first switch channel. The control terminal and normally open terminal of the first relay unit 111 are respectively connected to the first control module 12, and the common terminal of the first relay unit 111 is connected to the first test port of the device under test 20. The first test port is adapted to output a first test signal, which includes a CAN signal and a LIN signal.

[0048] Specifically, Figure 2 A schematic diagram showing the connection between the first relay unit 111, the device under test 20, and the first control module 12 is shown, as follows: Figure 2 As shown, in some embodiments of this application, the switch module 11 includes at least one first relay unit 111. The control terminal of each first relay unit 111 receives a first drive signal from the first control module 12. The first control module 12 can select the coil of the first relay unit 111 to be energized by the first drive signal. When the coil of the first relay unit 111 is energized, its normally open terminal (NO) closes with the contact, thereby forming a conduction path between the (COM) terminal and the normally open terminal (NO) of the first relay unit 111. At this time, the first test signal output by the device under test 20 corresponding to the first test port can be transmitted to the first control module 12 through the conduction path, thereby realizing the signal interaction between the first control module 12 and the designated port of the device under test 20, and realizing the functional test of the CAN communication or LIN communication of the device under test 20.

[0049] The first relay unit 111 establishes a test connection between the first control module 12 and the first test port of the device under test 20, which can accurately test the first test signal including CAN signal and LIN signal, realize the testing of communication functions such as CAN communication and LIN communication, better meet the testing needs of automotive electronic devices for CAN and LIN communication functions, and the first control module 12 can flexibly control the on and off of the designated first relay unit 111, and can accurately realize the functional testing of specific communication ports according to the test requirements, thus enhancing the adaptability and efficiency of the automated testing device 10 to different test requirements.

[0050] In some embodiments of this application, the switch module 11 includes a second relay unit 112, which corresponds to a second switch channel. The control terminal of the second relay unit 112 is connected to the first control module 12, the normally open terminal of the second relay unit 112 is connected to the measurement module 13, and the common terminal of the second relay unit 112 is connected to the second test port of the device under test, which is adapted to output a second test signal.

[0051] Specifically, Figure 3 A schematic diagram showing the connection between the second relay unit 112 and the device under test 20, the first control module 12, and the measurement module 13 is shown, as follows. Figure 3As shown, in some embodiments of this application, the switch module 11 includes at least one second relay unit 112. The control terminal of each second relay unit 112 receives a second drive signal from the first control module 12. The first control module 12 can select the coil of the second relay unit 112 to be energized by the second drive signal. When the coil of the second relay unit 112 is energized, its normally open terminal (NO) closes with the contact, thereby forming a conduction path between the common terminal (COM) and the normally open terminal (NO) of the second relay unit 112. At this time, the second test signal output by the device under test 20 corresponding to the second test port can be transmitted to the measurement module 13 through the conduction path, thereby realizing the signal interaction between the measurement module 13 and the designated port of the device under test 20, so as to use the measurement module 13 to measure the signal voltage, frequency, etc. of the second test signal and verify whether the relevant functions of the device under test 20 are normal.

[0052] In one example of an embodiment of this application, the measurement module 13 includes a digital multimeter and an oscilloscope. The digital multimeter is used to perform voltage testing on the second signal under test, and the oscilloscope is used to test the signal characteristics of the second signal under test, such as signal frequency, voltage, and duty cycle. The second signal under test can be various power signals of the device under test. If the test results of the power signal's frequency, voltage, duty cycle, etc., meet expectations, the power function of the device under test can be verified to be normal.

[0053] The second relay unit 112 establishes a test connection between the measurement module 13 and the second test port of the device under test 20, which can accurately test the signal characteristics such as voltage, frequency and duty cycle of the second test signal containing power signals, thereby realizing the test of the power function of the device under test 20. Furthermore, the first control module can flexibly control the on and off of the designated second relay unit, and can accurately realize the functional test of a specific power port according to the test requirements, thereby enhancing the adaptability and efficiency of the automated test device 10 to different test requirements.

[0054] In some embodiments of this application, the automated testing device 10 further includes a power supply 14, and the switching module 11 further includes a third switching channel. The power supply 14 is connected to the device under test 20 through the third switching channel to supply power to the device under test 20. The switching module 11 includes a third relay unit 113, which corresponds to the third switching channel. The control terminal of the third relay unit 113 is connected to the third output terminal of the first control module, the common terminal of the third relay unit 113 is connected to the power supply 14, and the normally open terminal of the third relay unit 113 is connected to the power port of the device under test 20.

[0055] Specifically, in some embodiments of this application, a third relay unit 113 is connected between the power supply 14 and the device under test 20 to realize power supply control of the device under test 20.

[0056] Figure 4 A schematic diagram showing the connection between the third relay unit 113, the device under test 20, and the power supply 14 is shown, as follows: Figure 4 As shown, the switch module 11 includes at least one third relay unit 113. The control terminal of each third relay unit 113 receives a third drive signal from the first control module 12. The first control module 12 can select the coil of the third relay unit 113 to be energized by the third drive signal. When the coil of the third relay unit 113 is energized, its normally open terminal (NO) closes with the contact, thereby forming a conduction path between the common terminal (COM) and the normally open terminal (NO) of the third relay unit 113. At this time, the power supply 14 supplies power to the device under test 20, so that the device under test 20 is powered on.

[0057] The third switch channel enables a controllable connection between the power supply 14 and the device under test 20. The first control module 12 controls the on / off state of the third relay unit 113 corresponding to the third switch channel, so as to flexibly control the power supply to the device under test 20. This can accurately meet the needs of automated processes such as power-on, testing and power-off during the test, effectively improve the test efficiency and accuracy, and also enhance the adaptability of the automated test device 10 to different test processes.

[0058] It should be noted that the first drive signal, the second drive signal, and the third drive signal output by the first control module 12 in this embodiment are generated based on a pre-set automated test program to control the switching state of the corresponding relay unit. The automated test program can be determined by those skilled in the art through conventional means, and will not be described in detail here.

[0059] In some embodiments of this application, the device under test 20 further includes a third test port, which is connected to the first control module 12, wherein the third test port is adapted to output a third test signal.

[0060] Specifically, for some third-party signals that require long-term sampling and detection, such as digital output signals, analog output signals, PWM signals, and Ethernet port data of the device under test 20, on the one hand, when the relay unit remains in the conducting state for a long time, its contacts may generate heat due to continuous current flow, affecting the stability of signal transmission and increasing energy consumption. In addition, frequent switching operations or long-term conduction can easily lead to contact wear, reducing the reliability of the switching channel and making it difficult to meet the requirements of long-term continuous sampling for signal stability and path reliability. On the other hand, for analog signals such as analog output signals and PWM signals, the signal processing capability of the test instrument is limited, and the test accuracy for PWM signals is not high enough.

[0061] Therefore, in this embodiment, the third test ports, such as the digital output port, analog output port, PWM port, and network port of the device under test 20, are directly connected to the corresponding ports of the first control module 12, without going through the relay unit, to continuously test the third test signal, so as to use the third test signal to test the analog signal processing function, digital signal processing function, PWM signal processing function, and network function of the device under test 20.

[0062] Therefore, the third test port is directly connected to the first control module 12 without going through the switch module 11, which avoids the problem of contact heating caused by the relay unit being on for a long time, affecting the stability of signal transmission and increasing energy consumption. It also prevents contact wear caused by frequent switching or long-term conduction, thereby improving the stability of signal transmission and the reliability of the path, and meeting the requirements of stability and reliability for the third test signal that needs to be sampled and detected for a long time.

[0063] Furthermore, in some embodiments of this application, the first port under test includes at least one of a CAN port and a LIN port, the second port under test includes a power port, and the third port under test includes at least one of a digital output port (DO), an analog output port (AO), a PWM port, and a network port.

[0064] The CAN and LIN ports are used to enable communication functions of the device under test (DUT). The power port provides a test port for the power signal of the DUT. The digital output port is used to output corresponding control signals to external devices such as sensors and switches. The analog output port is used to output analog signals such as voltage or current to drive or control the corresponding functions of external devices, such as motor speed control.

[0065] Specifically, Figure 5The connection relationships between the first control module 12, the various ports of the device under test 20, and the measurement module 13 are shown. The first control module 12 may be a lower-level controller, and the measurement module 13 includes a digital multimeter and an oscilloscope.

[0066] Depend on Figure 5 As can be seen, in one example of this application embodiment, the device under test 20 includes two CAN ports and one LIN port, namely CAN1, CAN2, and LIN. CAN1 and CAN2 are used to implement the Controller Area Network (CAN) serial communication protocol, which is widely used in network communication in the automotive and other industrial fields. The LIN port is used to implement the Local Interconnect Network (LIN) serial communication protocol, typically used to connect components such as door controls, windows, and seat adjusters within a vehicle. The CAN and LIN protocols are used for communication between various components in a vehicle, possessing high reliability and strong anti-interference capabilities, enabling real-time data interaction between the device under test 20 and other electronic modules.

[0067] It should be noted that, Figure 5 This application uses two CAN ports and one LIN port as an example of port settings. The number of first relay units 111 can correspond one-to-one with the CAN ports and LIN ports, and can also be flexibly set according to actual test requirements. This application is not limited to this application.

[0068] Each functional module in the device under test 20 requires different power signals during operation. Therefore, the device under test 20 is equipped with corresponding power ports to sample the power signals. Specifically, the second test signal, containing the power signal, output from the power port is sent to the digital multimeter and oscilloscope in the measurement module 13 via the second relay unit 112. The first control module 12 switches the test path by controlling the on / off state of the corresponding second relay unit 112, enabling the test instruments to test the required second test signal and improving the testing efficiency of the power function of the device under test 20.

[0069] The digital output port of the device under test (DUT) 20 is directly connected to the digital signal acquisition unit of the first control module 12, the analog output port of the DUT 20 is directly connected to the analog signal acquisition unit of the first control module 12, the PWM port of the DUT 20 is directly connected to the PWM signal acquisition unit of the first control module 12, and the network port of the DUT 20 is directly connected to the network port of the first control module 12. This enables continuous testing of the third test signal, including the digital output signal, analog output signal, PWM signal, and Ethernet port data of the DUT 20. Furthermore, the first control module 12 also includes a control port, which outputs digital control signals, analog control signals, and PWM control signals to control the DUT 20 and trigger it to output the third test signal in response to the aforementioned control signals.

[0070] like Figure 5 As shown, the automated testing device 10 also includes a second control module 15, which is connected to the first control module 12 to send test commands to the device under test through the first control module 12.

[0071] Specifically, in some embodiments of this application, the second control module 15 may be a host computer controller. The second control module 15 is connected to the first control module 12 via a USB port. The second control module 15 sends a test message to the first control module 12 via the USB port, and then the first control module 12 sends the test message to the device under test 20 via the CAN port or LIN port. Subsequently, the device under test 20 responds to the test message by sending a response message to the first control module 12 via the CAN port or LIN port. The response message includes the aforementioned first test signal. The first control module 12 then sends the response message to the second control module 15 via the USB port, so that the second control module 15 uses the response message to perform CAN communication function or LIN communication function testing on the device under test 20.

[0072] In addition, the second control module 15 is also connected to the first control module 12 via an Ethernet port. The second control module 15 sends network test commands to the first control module 12 via the Ethernet port, and then the output control unit of the first control module 12 sends the network test commands to the device under test 20. Subsequently, the device under test 20 responds to the network test commands and begins to perform continuous PING network tests and Ethernet performance parameter tests, and sends the corresponding third test signal to the first control module 12. The first control module 12 then sends the third test signal to the second control module 15 via the Ethernet port, so that the second control module 15 uses the third test signal to perform network function tests on the device under test 20.

[0073] The second control module 15 realizes the overall control and data analysis of the testing process of the device under test 20, and uses the first control module 12 to forward the test instructions to the device under test 20, so that the device under test 20 responds to the test instructions to perform corresponding communication and network function tests, thereby improving the applicability of the automated testing device 10.

[0074] Furthermore, in some embodiments of this application, the first control module 12 includes a microcontroller unit (MCU), a CAN signal processing unit, and a LIN signal processing unit. The first terminal of the microcontroller is adapted to connect to the control terminal of the first relay unit 111, and the second terminal of the microcontroller is connected to both the CAN signal processing unit and the LIN signal processing unit. The CAN signal processing unit and the LIN signal processing unit are respectively connected to the normally open terminals of the first relay unit 111.

[0075] Specifically, Figure 6 The internal functional unit structure of the first control module 12 is shown. For example... Figure 6 As shown, the CAN signal processing unit is a CAN transceiver, the LIN signal processing unit is a LIN transceiver, the microcontroller is connected to the CAN signal processing unit and the LIN signal processing unit respectively, and the CAN signal processing unit and the LIN signal processing unit are respectively connected to the corresponding relay units in the switch module 11 to realize the transmission of CAN signals and LIN signals.

[0076] The microcontroller also includes an IO output port, which serves as one of the control ports. The IO output port passes through a multiplexer (DEMUX) and an optocoupler to connect to the switch module 11 in sequence, thereby driving the first relay unit 111, the second relay unit 112, and the third relay unit 113 in the switch module 11.

[0077] In one example of the embodiments of this application, the microcontroller can be a single-chip microcomputer. The IO output port of the single-chip microcomputer passes through a multiplexer and an optocoupler to connect to the gate of a Metal-Oxide-Semiconductor Field-Effect Transistor (MOS). The MOS transistor is connected in series with the coil of the corresponding relay unit, thereby using the single-chip microcomputer to control the conduction and turn-off of the MOS transistor, and thus control the coil current. When current flows through the coil, the normally open terminal and the contact will close.

[0078] In addition, the microcontroller's I / O output ports also output digital control signals sequentially through a multiplexer (DEMUX) and an optocoupler to control the device under test (DUT) 20, triggering the activation of the corresponding test function of the DUT 20. Furthermore, the I / O output ports also output analog control signals through a digital-to-analog converter (DAC) to control the DUT 20, triggering the activation of the corresponding test function of the DUT 20.

[0079] The microcontroller also includes an SPI port, which serves as one of the control ports to trigger a signal generator to generate a PWM control signal. The PWM control signal is then used to control the device under test 20, triggering the activation of the corresponding function to be tested in the device under test 20.

[0080] The microcontroller also includes network ports such as PFE_MAC0 and MDC / MDIO, and exchanges data with the device under test 20 and the second control module 15 through the PORT1 port and MDC / MDIO port of the Ethernet switch SWITCH. The Ethernet switch is connected to the network ports of the device under test 20 through 100 Mbps port PORT2 and 1 Gigabit Ethernet port PORT3. In addition, the Ethernet switch SWITCH is also connected to the Ethernet port of the second control module 15 through another 100 Mbps port PORT4 and an RJ45 connector. Meanwhile, the second control module 15 is connected to the microcontroller through a USB port.

[0081] Since the input ports of a microcontroller are limited, a multiplexer (MUX) can be used for expansion in this embodiment. Specifically, the digital output port of the device under test (DUT) 20 is connected to the digital signal acquisition unit of the microcontroller via a multiplexer; the analog output port of the DUT 20 is connected to the analog signal acquisition unit of the microcontroller via another multiplexer; and the PWM port of the DUT 20 is connected to the PWM signal acquisition unit of the microcontroller via yet another multiplexer.

[0082] The first control module 12 proposed in this application embodiment can drive and control each relay unit in the switch module 11 through a microcontroller. It can also control the triggering of the digital signal and analog signal processing functions, digital signal processing functions, PWM signal processing functions, and network functions of the device under test 20 through the microcontroller's IO output port, SPI port, PFE_MAC0 port, and MDC / MDIO port. Furthermore, it can receive a third test signal, including digital output signals, analog output signals, PWM signals, and Ethernet port data, through the corresponding input ports of the microcontroller. In addition, the first control module 12 can receive test commands from the second control module 15 through the microcontroller, and then forward the test commands to the device under test 20 through corresponding ports. It can also receive the first test signal sent by the device under test 20, thereby realizing the testing of the CAN, LIN, and other communication functions of the device under test 20.

[0083] Therefore, the automated testing device 10 proposed in this application embodiment can integrate functions such as analog signal acquisition, digital signal acquisition, PWM signal acquisition, communication signal acquisition and network data acquisition, and has built-in multiple communication bus interfaces, thereby meeting the multi-functional testing of various complete products, which is conducive to improving testing efficiency and accuracy, and thus solving the current limitations of automotive electronic complete product testing in terms of functional implementation and expansion.

[0084] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0085] The various embodiments in this specification are described in a progressive manner. The same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on describing the differences from other embodiments.

[0086] The above description is merely an embodiment of this application and is not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

[0087] Although embodiments of this application have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of this application, and such modifications and variations all fall within the scope defined by the appended claims.

Claims

1. An automated testing device, characterized in that, The automated testing device includes: A switch module (11) includes a first switch channel and a second switch channel; The first control module (12) is used to drive the connection state of the first switch channel and the second switch channel, and the first control module (12) is connected to the device under test (20) through the first switch channel to test the first test signal of the device under test (20); Measurement module (13) is connected to the device under test (20) through the second switch channel to measure the second test signal of the device under test (20).

2. The automated testing device according to claim 1, characterized in that, The switching module (11) includes a first relay unit (111), which corresponds to the first switching channel; The control terminal and normally open terminal of the first relay unit (111) are respectively connected to the first control module (12), and the common terminal of the first relay unit (111) is connected to the first test port of the device under test (20). The first test port is adapted to output the first test signal, which includes a CAN signal and a LIN signal.

3. The automated testing device according to claim 2, characterized in that, The first port under test includes at least one of a CAN port and a LIN port.

4. The automated testing device according to claim 2, characterized in that, The first control module (12) includes a microcontroller, a CAN signal processing unit, and a LIN signal processing unit; The first terminal of the microcontroller is adapted to be connected to the control terminal of the first relay unit (111), and the second terminal of the microcontroller is connected to the CAN signal processing unit and the LIN signal processing unit respectively. The CAN signal processing unit and the LIN signal processing unit are respectively connected to the normally open terminal of the first relay unit (111).

5. The automated testing device according to claim 1, characterized in that, The switching module (11) includes a second relay unit (112), which corresponds to the second switching channel; The control terminal of the second relay unit (112) is connected to the first control module (12), the normally open terminal of the second relay unit (112) is connected to the measurement module (13), the common terminal of the second relay unit (112) is connected to the second test port of the device under test (20), and the second test port is adapted to output the second test signal.

6. The automated testing device according to claim 5, characterized in that, The second port to be tested includes a power port.

7. The automated testing device according to claim 1, characterized in that, The device under test (20) further includes a third test port, which is connected to the first control module (12), wherein the third test port is adapted to output a third test signal.

8. The automated testing device according to claim 7, characterized in that, The third port to be tested includes at least one of a digital output port, an analog output port, a PWM port, and a network port.

9. The automated testing device according to claim 1, characterized in that, The automated testing device further includes a second control module (15), which is connected to the first control module (12) to send test commands to the device under test (20) through the first control module (12).

10. The automated testing device according to claim 1, characterized in that, The automated testing device also includes a power supply (14), and the switch module (11) also includes a third switch channel. The power supply (14) is connected to the device under test (20) through the third switch channel to supply power to the device under test (20). The switching module (11) includes a third relay unit (113), which corresponds to the third switching channel. The control terminal of the third relay unit (113) is connected to the third output terminal of the first control module (12). The common terminal of the third relay unit (113) is connected to the power supply (14), and the normally open terminal of the third relay unit (113) is connected to the power port of the device under test (20).