An adjustable integrated circuit chip test bench

Abstract

This utility model relates to the field of chip testing technology, specifically an adjustable integrated circuit chip testing platform, including a base plate. A ball screw and a matching nut are installed at the bottom of the base plate. A gantry frame is slidably connected to the base plate, and a testing window and a shelf are provided at the top of the gantry frame. In this adjustable integrated circuit chip testing platform, the chip is placed on the testing platform, and a pressure rod is pressed down to fix the chip's edge with a suction cup, ensuring stability during testing. After placement, a sliding plate is first pushed to adjust its position. After adjustment, the sliding plate is fixed to the corresponding through hole below using bolts. This fixes the front position of the testing platform. The gantry frame is then moved as a whole. During this process, the nut drives the ball screw to rotate, and the frame self-locks after movement to prevent further movement. The angle of the support frame also changes during this process.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically to an adjustable integrated circuit chip testing platform. Background Technology

[0002] CN202420411350.6 discloses an integrated circuit chip test bench with a positioning structure, including a fixed platform. Two sets of support plates are symmetrically installed on the bottom of the fixed platform, and four sets of positioning devices are symmetrically installed at the four corners of the top of the fixed platform. Each positioning device includes a U-shaped plate, a positioning plate, a threaded tube, a threaded rod, and a first slider. A slide rail is installed on both sides of the fixed platform, and a sliding sleeve is installed on the slide rail. This invention uses a lifting frame installed at the bottom of the mounting frame. A lead screw is installed on the inner side of the lifting frame, and a threaded sleeve is installed on the lead screw. A test rod is installed at the bottom of the threaded sleeve. The integrated circuit chip can be fixed to the top of the fixed platform using the four sets of positioning devices. Subsequently, the test rod can move in three dimensions by moving the mounting frame, driving with a cylinder, and rotating the lead screw, allowing for testing of various modules on the integrated circuit chip using the test rod.

[0003] Although this test stand can achieve stable clamping during chip testing, it can only test chips horizontally and cannot change the chip's position and angle during testing. When testing different parts of the chip's circuitry, the chip clamping angle needs to be changed, which is inconvenient to operate.

[0004] To address the aforementioned issues, we have made improvements by proposing an adjustable integrated circuit chip test bench. Utility Model Content

[0005] To solve the above-mentioned technical problems, this utility model provides the following technical solution:

[0006] This utility model provides an adjustable integrated circuit chip test bench, including a base plate, a ball screw and a matching nut at the bottom of the base plate, a gantry frame slidably connected to the base plate, a test window at the top of the gantry frame, and a shelf at the top of the gantry frame.

[0007] The base plate has a groove at the front, a slide plate is installed inside the groove, a support frame is installed on the upper part of the slide plate, and a test platform is hinged to the top of the support frame.

[0008] The bottom of the test bench is hinged with two connecting rods;

[0009] A side frame is hinged to the bottom edge of the test stand. The side frame is U-shaped, and a pressure rod is inserted through the top of the side frame. A suction cup is installed at the bottom of the pressure rod.

[0010] As a preferred technical solution of this utility model, the bottom of both ends of the portal frame are respectively connected to the clamps, the clamps are slidably connected to the two sides of the base plate, the two clamps are respectively connected to the two nuts, a bracket is connected between the two clamps, the bottom of the two connecting rods are respectively hinged to the bracket, and a through groove corresponding to the position of the connecting rod is opened on the base plate.

[0011] In a preferred embodiment of this invention, the pressure rod is slidably connected to the side frame, and the suction cup is made of rubber.

[0012] As a preferred technical solution of this utility model, the slide plate and the slide groove are slidably connected, the bottom of the slide groove is provided with several through holes, and bolts are threaded inside the through holes. The slide plate and the slide groove are fixedly connected by bolts.

[0013] As a preferred embodiment of this utility model, the top of the shelf is made of rubber, and the top of the shelf has an opening for holding utensils.

[0014] As a preferred embodiment of this invention, the test platform is a transparent sheet made of polyvinyl chloride.

[0015] The beneficial effects of this utility model are as follows: This adjustable integrated circuit chip test stand allows the chip to be placed on the test stand. Pressing down the pressure rod causes the suction cup to fix the edge of the chip, ensuring the chip remains stable during testing. After placement, the sliding plate is first pushed to adjust its position. After adjustment, the sliding plate is fixed to the corresponding through hole below using bolts. At this time, the front position of the test stand is fixed, and the gantry frame is moved as a whole. During this process, the nut drives the ball screw to rotate, and after movement, it can self-lock to prevent the gantry frame from moving. During this process, the angle of the support frame changes accordingly, causing the tilt angle of the test stand to change, which facilitates the adjustment of the chip testing angle. The testing instrument can be passed through the detection window to test the chip below. During the testing gap, the instrument can be clipped onto the shelf for easy retrieval. Attached Figure Description

[0016] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:

[0017] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0018] Figure 2 This is a schematic diagram of the lower structure of this utility model;

[0019] Figure 3 This is an enlarged schematic diagram of the side frame structure of this utility model;

[0020] Figure 4 This is an enlarged schematic diagram of the slide groove structure of this utility model;

[0021] In the diagram: 1. Base plate; 2. Portal frame; 3. Test bench; 4. Slide groove; 5. Inspection window; 6. Shelf; 7. Side frame; 8. Pressure rod; 9. Suction cup; 10. Support frame; 11. Slide plate; 12. Through hole; 13. Bolt; 14. Through groove; 15. Ball screw; 16. Clamp; 17. Bracket; 18. Connecting rod; 19. Nut. Detailed Implementation

[0022] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0023] Example: Figure 1 As shown, an adjustable integrated circuit chip test bench includes a base plate 1. The base plate 1 is characterized by having a ball screw 15 and a matching nut 19 at the bottom, a gantry frame 2 slidably connected to the base plate 1, a test window 5 at the top of the gantry frame 2, and a shelf 6 at the top of the gantry frame 2.

[0024] The base plate 1 has a groove 4 at the front, a slide plate 11 is installed inside the groove 4, a support frame 10 is installed on the upper part of the slide plate 11, and a test table 3 is hinged to the top of the support frame 10.

[0025] The bottom of the test bench 3 is hinged with two connecting rods 18;

[0026] A side frame 7 is hinged to the bottom edge of the test bench 3. The side frame 7 is shaped like a c. A pressure rod 8 is inserted through the top of the side frame 7, and a suction cup 9 is installed at the bottom of the pressure rod 8.

[0027] The bottom of both ends of the portal frame 2 are respectively connected to the clamps 16, which are slidably connected to the two sides of the base plate 1. The two clamps 16 are respectively connected to the two nuts 19. A bracket 17 is connected between the two clamps 16. The bottom of the two connecting rods 18 are respectively hinged to the bracket 17. A through groove 14 corresponding to the position of the connecting rod 18 is opened on the base plate 1.

[0028] The gantry frame 2 is moved as a whole. During this process, the nut 19 drives the ball screw 15 to rotate, and it can lock itself after moving to prevent the gantry frame 2 from moving. During this process, the angle of the support frame 10 changes accordingly, which causes the tilt angle of the test stage 3 to change, making it easier to adjust the test angle of the chip.

[0029] The pressure rod 8 is slidably connected to the side frame 7, and the suction cup 9 is made of rubber. Pressing down the pressure rod 8 causes the suction cup 9 to fix the edge of the chip, so that the chip remains stable during the test.

[0030] The slide plate 11 is slidably connected to the slide groove 4. Several through holes 12 are provided at the bottom of the slide groove 4. Bolts 13 are threaded inside the through holes 12. The slide plate 11 and the slide groove 4 are fixedly connected by the bolts 13. The slide plate 11 is pushed to adjust its position. After adjustment, the slide plate 11 is fixed to the corresponding through hole 12 below by the bolts 13.

[0031] The top of the shelf 6 is made of rubber, and the top of the shelf 6 has an opening for holding utensils.

[0032] Test station 3 is made of transparent polyvinyl chloride material, which makes it easy to observe the overall condition of the chip.

[0033] Working principle: In use, the chip is placed on the test platform 3, and the pressure rod 8 is pressed down so that the suction cup 9 fixes the edge of the chip, keeping the chip stable during the test. After placement, the slide plate 11 is pushed to adjust its position. After adjustment, the slide plate 11 is fixed to the corresponding through hole 12 below using the bolt 13. At this time, the front position of the test platform is fixed, and the gantry frame 2 is pushed to move as a whole. During this process, the nut 19 drives the ball screw 15 to rotate, and it can self-lock after movement to prevent the gantry frame 2 from moving. During this process, the angle of the support frame 10 changes accordingly, which drives the tilt angle of the test platform 3 to change, making it easy to adjust the test angle of the chip. The test instrument can be passed through the detection window 5 to test the chip below. During the test gap, the instrument can be clipped on the shelf 6 for easy access.

[0034] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. An adjustable integrated circuit chip test stand, comprising a base plate (1), characterized in that, The bottom of the base plate (1) is provided with a ball screw (15) and a matching nut (19). A gantry frame (2) is slidably connected to the base plate (1). A detection window (5) is opened on the top of the gantry frame (2). A shelf (6) is provided on the top of the gantry frame (2). The base plate (1) has a sliding groove (4) at the front, and a sliding plate (11) is provided inside the sliding groove (4). A support frame (10) is installed on the upper part of the sliding plate (11), and a test platform (3) is hinged to the top of the support frame (10). The bottom of the test bench (3) is hinged with two connecting rods (18). The test bench (3) has a side frame (7) hinged at the bottom edge. The side frame (7) is U-shaped. A pressure rod (8) is inserted through the top of the side frame (7). A suction cup (9) is installed at the bottom of the pressure rod (8).

2. The adjustable integrated circuit chip test bench according to claim 1, characterized in that, The bottom of both ends of the portal frame (2) are respectively connected to the clamps (16), the clamps (16) are slidably connected to the two sides of the base plate (1), the two clamps (16) are respectively connected to the two nuts (19), the two clamps (16) are connected to the bracket (17), the bottom of the two connecting rods (18) are respectively hinged to the bracket (17), and the base plate (1) is provided with a through groove (14) corresponding to the position of the connecting rod (18).

3. The adjustable integrated circuit chip test bench according to claim 1, characterized in that, The pressure rod (8) is slidably connected to the side frame (7), and the suction cup (9) is made of rubber.

4. The adjustable integrated circuit chip test bench according to claim 1, characterized in that, The slide plate (11) is slidably connected to the slide groove (4). The bottom of the slide groove (4) is provided with several through holes (12). The inside of the through holes (12) is threaded with bolts (13). The slide plate (11) and the slide groove (4) are fixedly connected by bolts (13).

5. An adjustable integrated circuit chip test bench according to claim 1, characterized in that, The top of the shelf (6) is made of rubber, and the top of the shelf (6) has an opening for holding utensils.

6. The adjustable integrated circuit chip test bench according to claim 1, characterized in that, The test stand (3) is made of transparent polyvinyl chloride material.

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